SUGIYAMA Setuko 杉山せつ子

… Alternative Names

Researcher Number	00115586
Other IDs
Affiliation (based on the past Project Information) *help	1995 : Nagoya Industrial Science Research Institute, Associate Professor, 専任助教授 1994 – 1995 : 財団法人名古屋産業科学研究所, 専任助教授 1993 : Nagoya Industrial Science Research Institute, Associate Professor, 名古屋産業科学研究所, 専任助教授 1992 – 1993 : 財団法人名古屋産業科学研究所, 専任助教授 1986 – 1989 : 名古屋大学, 工学部, 助手
Review Section/Research Field	Except Principal Investigator 電子機器工学 / 物理計測・光学 / 電子デバイス・機器工学
Keywords	Except Principal Investigator 走査透過電子顕微鏡 / 球面収差補正 / 薄膜レンズ / 電子プローブ / 信号演算処理 / ノイズ除去 / 球面収差 / Electron Probe / 収差補正 / 電子レンズ … More

Research Projects
(5results)
Co-Researchers
(6People)

Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1993 – 1995
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Nagoya University
Observation of high resolution elemental mapping images using a high sensitivity detector
- Principal Investigator
  
  HIBINO Michio
- Project Period (FY)
  1992 – 1993
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  物理計測・光学
- Research Institution
  Nagoya University
On line digital manipulation process of elastically and inelastically scattered electron signals in scanning transmission electron microscopy
- Principal Investigator
  
  HIBINO Michio
- Project Period (FY)
  1988 – 1989
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  電子機器工学
- Research Institution
  Nagoya University
Research on High Resolution Electron Microscope Observations without Specimen Damage
- Principal Investigator
  
  HIBINO Michio
- Project Period (FY)
  1987 – 1989
- Research Category
  
  Grant-in-Aid for General Scientific Research (A)
- Research Field
  
  物理計測・光学
- Research Institution
  Nagoya University
Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil Lens
- Principal Investigator
  
  HIBINO Michio
- Project Period (FY)
  1986 – 1987
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  電子機器工学
- Research Institution
  Nagoya University

1. HIBINO Michio (40023139)

# of Collaborated Projects : 5results

# of Collaborated Products : 0results
2. HANAI Takaaki (00156366)

# of Collaborated Projects : 5results

# of Collaborated Products : 0results
3. SHIMOYAMA Hiroshi (30023261)

# of Collaborated Projects : 3results

# of Collaborated Products : 0results
4. TANAKA Shigeyasu (70217032)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results
5. UCHIKAWA Yoshiki (20023260)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results
6. MARUSE Susumu (20022981)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results

SUGIYAMA Setuko 杉山 せつ子

SUGIYAMA Setsuko 杉山 せつ子

Research Projects

Co-Researchers

Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Observation of high resolution elemental mapping images using a high sensitivity detector

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

On line digital manipulation process of elastically and inelastically scattered electron signals in scanning transmission electron microscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Research on High Resolution Electron Microscope Observations without Specimen Damage

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil Lens

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

SUGIYAMA Setuko 杉山せつ子

SUGIYAMA Setsuko 杉山せつ子