HATTORI Ken 服部賢

Researcher Number	00222216
Affiliation *help	2013 – 2015 : 奈良先端科学技術大学院大学, 物質創成科学研究科, 准教授 2009 – 2011 : Nara Institute of Science and Technology, 物質創成科学研究科, 准教授 2009 : 奈良先端科技大, 物質創成科学研究科, 准教授 2007 : 奈良先端科学技術大学院大学, 物質創成科学研究科, 准教授 1998 – 2001 : 奈良先端科学技術大学院大学, 物質創成科学研究科, 助教授 … More
Review Section/Research Field	Principal Investigator 固体物性I(光物性・半導体・誘電体) / Condensed matter physics I / Thin film/Surface and interfacial physical properties Except Principal Investigator 固体物性I(光物性・半導体・誘電体) / Physics
Keywords	Principal Investigator 走査トンネル顕微鏡 / 電子励起 / シリコン表面 / 銀 / Thermal desorption / X線光電子分光 / シリコン / 薄膜 / 窒素 / nitrogen … More Except Principal Investigator バンド構造 / フェルミ面 / 光電子分光 / Electron energy band / 表面構造 / 二次元表示型分析器 / 走査トンネル分光 / 極低温走査トンネル顕微鏡 / magnetic amall particle / Photoelectron Spectroscopy / near field microscope / Band structure / scanning microscope / 円偏光 / 集束イオンビーム / 低温高磁場抵抗測定 / 表面電気伝導度 / scanning tunneling spectroscopy / focused ion beam / 磁性微粒子 / エネルギーバンド / superconductivity / Angle resolved photoelectron spectroscopy / 1次元物質 / トンネル顕微鏡 / 立体写真 / 清浄表面 / 抵抗測定 / 近接場顕微鏡 / 表面合金 / 走査型顕微鏡 / 高分解能分析器 / Energy Band / 走査顕微鏡 / One Dimensional Materials / Two Dimensional Materials / Circularly polarized light / 表面 / New Surface Materials / 超高真空クライオスタット / Surface conductivity / surface alloy / tunneling microscope / 超伝導 / Stereo photograph / Synchrotron Radiation / Fermi Surface / Surface / 放射光 / 角度分解光電子分光 / バンドマッピング / 電子エネルギー分析器 / 表面新物質 / 二次元バンド分散 / オージェ分析 / Two-dimensional photoelectron spectroscopy / 電子エネルギーバンド / very low temperature scanning tunneling microscope / Auger analysis / 2次元物質 / 二次元光電子分光 Less

Study of desorption from MIS/MIM-structure devices induced by gate-voltage application toward catalysis reaction controlPrincipal Investigator
- Principal Investigator
  
  HATTORI KEN
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Nara Institute of Science and Technology
Cross-sectional scanning tunneling microscopy observations for interface structures of ultra-thin films on Si surfaces using cleavage methodsPrincipal Investigator
- Principal Investigator
  
  HATTORI Ken
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Condensed matter physics I
- Research Institution
  Nara Institute of Science and Technology
Adsorption and desorption of active gases on Si(111) surfaces with ultra-thin Ag filmsPrincipal Investigator
- Principal Investigator
  
  HATTORI Ken
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  NARA INSTITUTE OF SCIENCE AND TECHNOLOGY
Development of Small-Sized Scanning Tunneling Microscope with Auger-Electron Analyzer
- Principal Investigator
  
  KANEMITSU Yoshihiko
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for University and Society Collaboration
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (NAIST)
Development of a high-performance display-analyzer
- Principal Investigator
  
  DAIMON Hiroshi
- Project Period (FY)
  1998 – 2001
- Research Category
  
  Grant-in-Aid for Specially Promoted Research
- Review Section
  
  Physics
- Research Institution
  NARA INSTITUTE OF SCIENCE AND TECHNOLOGY
Electron Energy Bands Studied by 2-Dimensional and Polarization Dependent Photoelectron Spectroscopy Using Synchrotron Radiation
- Principal Investigator
  
  NAMBA Hidetoshi, 大門寛
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (A).
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  Ritsumeikan University
超高真空極低温微小領域抵抗測定装置の開発
- Principal Investigator
  
  小森文夫
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  The University of Tokyo
レーザー刺激脱離した塩素吸着シリコン表面の光電子分光Principal Investigator
- Principal Investigator
  
  服部賢
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  The University of Tokyo
Study of electronic states of surface material by using variable temperature scanning tunneling microscopy
- Principal Investigator
  
  KOMORI Fumio
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  The University of Tokyo
光照射シリコン表面の走査トンネル顕微鏡による電子励起格子緩和の研究Principal Investigator
- Principal Investigator
  
  服部賢
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  固体物性I(光物性・半導体・誘電体)
- Research Institution
  The University of Tokyo

All 2016 2014 2013 2012 2011 2010 2009 Other

All Journal Article Presentation

[Journal Article] Molecule desorption induced by gate-voltage application in MOS structure2016
- Author(s)
  Nozomu Hirota, Ken Hattori, Hiroshi Daimon, Azusa N. Hattori,Hidekazu Tanaka
- Journal Title
  
  Applied Physics Express
  
  Volume : 9
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25600100
[Journal Article] シリコンウェハー薄膜界面領域の断面走査トンネル顕微観察を目指したへき開手法の開発2012
- Author(s)
  服部賢、立花和也、大門寛
- Journal Title
  
  化学工業
  
  Volume : 3月号 Pages : 58-63
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] 散乱・脱離ガス種測定によるFe/SiO2/p-Si触媒デバイス上の吸着脱離種の同定2016
- Author(s)
  川北修平, 広田望, 服部賢, 大門寛
- Organizer
  日本物理学会
- Place of Presentation
  東北学院大学泉キャンパス（宮城県仙台市）
- Year and Date
  2016-03-19
- Data Source
  KAKENHI-PROJECT-25600100
[Presentation] Analysis of desorption species from MOS structure surfaces induced by gate voltages2014
- Author(s)
  Nozomu Hirota, Ken Hattori, Hiroshi Daimon
- Organizer
  American Physical Society
- Place of Presentation
  米国コロラド州デンバー市、Colorado Convention Center
- Data Source
  KAKENHI-PROJECT-25600100
[Presentation] 電圧印加によるMOS構造表面からの脱離種の解析2013
- Author(s)
  広田望、加藤直也、廣田政人、中家佑吾、服部賢、大門寛
- Organizer
  日本物理学会
- Place of Presentation
  徳島県徳島市、徳島大学常三島キャンパス
- Data Source
  KAKENHI-PROJECT-25600100
[Presentation] 電圧印加によるMOS構造表面からの脱離種の解析2013
- Author(s)
  広田望、加藤直也、廣田政人、中家佑吾、服部賢、大門寛
- Organizer
  表面科学学術講演会
- Place of Presentation
  茨木県つくば市、つくば国際会議場
- Data Source
  KAKENHI-PROJECT-25600100
[Presentation] Siウェハー上の薄膜界面領域観察を目指した断面STMシステムの開発2012
- Author(s)
  立花和也、太田啓介、服部賢、上田一之、大門寛
- Organizer
  日本物理学会(第67回年次大会)
- Place of Presentation
  関西学院大学(西宮)
- Year and Date
  2012-03-26
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] Siウェハー上の薄膜界面領域観察を目指した断面STMシステムの開発2012
- Author(s)
  立花和也、太田啓介、服部賢、上田一之、大門寛
- Organizer
  日本物理学会第67回年次大会
- Place of Presentation
  西宮市
- Year and Date
  2012-03-26
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] Siウェハー上の薄膜界面領域観察を目指した断面STMシステムの開発2011
- Author(s)
  立花和也、太田啓介、服部賢、上田一之、大門寛
- Organizer
  日本表面科学会(第31回表面科学学術講演会)
- Place of Presentation
  タワーホール船堀(東京)
- Year and Date
  2011-12-15
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] Siウェハー上の薄膜界面領域観察を目指した断面STMシステムの開発2011
- Author(s)
  立花和也、太田啓介、服部賢、上田一之、大門寛
- Organizer
  第31回表面科学学術講演会
- Place of Presentation
  東京都
- Year and Date
  2011-12-15
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] 薄膜基板界面観察用の断面STMシステムの開発2010
- Author(s)
  米井仁志、服部賢、上田一之、大門寛
- Organizer
  日本物理学会
- Place of Presentation
  岡山大学
- Year and Date
  2010-03-22
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] 薄膜基板界面観察用の断面STMシステムの開発2010
- Author(s)
  米井仁志、服部賢、上田一之、大門寛
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山市
- Year and Date
  2010-03-21
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] 薄膜基板界面観察用の断面STMシステムの開発2009
- Author(s)
  米井仁志、服部賢、上田一之、大門寛
- Organizer
  第29回表面科学学術講演会
- Place of Presentation
  東京都
- Year and Date
  2009-10-27
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] 薄膜基板界面観察用の断面STMシステムの開発2009
- Author(s)
  米井仁志、服部賢、上田一之、大門寛
- Organizer
  日本表面科学会
- Place of Presentation
  タワーホール船堀
- Year and Date
  2009-10-27
- Data Source
  KAKENHI-PROJECT-21540322
[Presentation] Desorption from metal surface in MOS structure with applied gate-voltage
- Author(s)
  Nozomu Hirota, Ken Hattori, Hiroshi Daimon
- Organizer
  The 30th European Conference on Surface Science
- Place of Presentation
  トルコ共和国アンタルヤ市
- Year and Date
  2014-08-31 – 2014-09-05
- Data Source
  KAKENHI-PROJECT-25600100
[Presentation] Desorption from metal surface in MOS with applied gate-voltage
- Author(s)
  Nozomu Hirota, Ken Hattori, Hiroshi Daimon
- Organizer
  The 7th International Symposium on Surface Science
- Place of Presentation
  くにびきメッセ（島根県松江市）
- Year and Date
  2014-11-02 – 2014-11-06
- Data Source
  KAKENHI-PROJECT-25600100

1. DAIMON Hiroshi (20126121)

# of Collaborated Projects : 4results

# of Collaborated Products : 16results
2. KOMORI Fumio (60170388)

# of Collaborated Projects : 2results

# of Collaborated Products : 0results
3. MATSUI Fumihiko (60324977)

# of Collaborated Projects : 2results

# of Collaborated Products : 0results
4. TAKEDA Sakura (30314537)

# of Collaborated Projects : 2results

# of Collaborated Products : 0results
5. NAMBA Hidetoshi (40118766)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results
6. KANEMITSU Yoshihiko (30185954)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results
7. KUSHIDA Takashi (00013516)

# of Collaborated Projects : 1results

# of Collaborated Products : 0results
8. UEDA Kazuyuki

# of Collaborated Projects : 1results

# of Collaborated Products : 8results
9. YONEI Hitoshi

# of Collaborated Projects : 1results

# of Collaborated Products : 4results
10. TACHIBANA Kazuya

# of Collaborated Projects : 1results

# of Collaborated Products : 5results
11. HIROTA Nozomu

# of Collaborated Projects : 1results

# of Collaborated Products : 7results
12. NAGAMURA Toshihiko

# of Collaborated Projects : 1results

# of Collaborated Products : 0results

HATTORI Ken 服部 賢

Research Projects

Research Products

Co-Researchers

Study of desorption from MIS/MIM-structure devices induced by gate-voltage application toward catalysis reaction controlPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Cross-sectional scanning tunneling microscopy observations for interface structures of ultra-thin films on Si surfaces using cleavage methodsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Adsorption and desorption of active gases on Si(111) surfaces with ultra-thin Ag filmsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Small-Sized Scanning Tunneling Microscope with Auger-Electron Analyzer

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a high-performance display-analyzer

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Electron Energy Bands Studied by 2-Dimensional and Polarization Dependent Photoelectron Spectroscopy Using Synchrotron Radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

超高真空極低温微小領域抵抗測定装置の開発

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

レーザー刺激脱離した塩素吸着シリコン表面の光電子分光Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study of electronic states of surface material by using variable temperature scanning tunneling microscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

光照射シリコン表面の走査トンネル顕微鏡による電子励起格子緩和の研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Molecule desorption induced by gate-voltage application in MOS structure2016

Author(s)

Journal Title

Data Source

[Journal Article] シリコンウェハー薄膜界面領域の断面走査トンネル顕微観察を目指したへき開手法の開発2012

Author(s)

Journal Title

Data Source

[Presentation] 散乱・脱離ガス種測定によるFe/SiO2/p-Si触媒デバイス上の吸着脱離種の同定2016

Author(s)

Organizer

Place of Presentation

Year and Date

Data Source

[Presentation] Analysis of desorption species from MOS structure surfaces induced by gate voltages2014

Author(s)

HATTORI Ken 服部賢