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ASAKAWA TAKESHI  浅川 毅

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ASAKAWA Takeshi  浅川 毅

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Researcher Number 00384850
Other IDs
Affiliation (Current) 2026: 東海大学, 情報理工学部, 特任教授
Affiliation (based on the past Project Information) *help 2013: 東海大学, 情報理工学部, 教授
2011 – 2012: 東海大学, 情報理工学部, 准教授
Review Section/Research Field
Principal Investigator
Computer system/Network
Keywords
Principal Investigator
テスト / LSIテスター / テストパターン生成 / 高速テスト / VLSI
  • Research Projects

    (1 results)
  • Research Products

    (8 results)
  •  Research on the test pattern generation method which realizes the high-speed testing for LSIPrincipal Investigator

    • Principal Investigator
      ASAKAWA Takeshi
    • Project Period (FY)
      2011 – 2013
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Computer system/Network
    • Research Institution
      Tokai University

All 2013 2012 Other

All Presentation

  • [Presentation] Development of the High-speed Test Pattern Genetator for LSI2013

    • Author(s)
      Tomokatsu Yoshinari, Hokuto Ogihara, Aizuddin bin Shaali Masri, Yuki Takebayashi, Asakawa Takeshi(CA)
    • Organizer
      IEEE,14th Workshop on RTL and High Level Testing
    • Place of Presentation
      Jiaosi, Taiwan
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] Development of the High-Speed Processor for LSI Functional Test2013

    • Author(s)
      Tomokatsu Yoshinari, Yuki Takebayashi, Aizuddin bin Shaali Masri, Satoshi Matsuno, Asakawa Takeshi
    • Organizer
      JICA : MJIIT-JUC Joint International Symposium 2013
    • Place of Presentation
      Kanagawa/JAPAN
    • Year and Date
      2013-11-08
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] LSI機能テスト向け高速プロセッサの開発2013

    • Author(s)
      浅川毅, 荻原帆斗, 吉成朝雄, 松埜智
    • Organizer
      電子情報通信学会 : 第69回 FTC 研究会
    • Place of Presentation
      山口
    • Year and Date
      2013-07-19
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] Development of the high-speed test pattern generator for LSI2013

    • Author(s)
      Tomokatsu Yoshinari, Hokuto Ogihara, Aizuddin bin Shaali Masri, Yuki Takebayashi, Asakawa Takeshi
    • Organizer
      IEEE : 14th Workshop on RTL and High Level Testing
    • Place of Presentation
      Yilan/Taiwan
    • Year and Date
      2013-11-22
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] LSI機能テスト向け高速プロセッサの開発2013

    • Author(s)
      浅川毅(CA), 荻原帆斗, 吉成朝雄, 松埜智
    • Organizer
      電子情報通信学会第69回FTC研究会
    • Place of Presentation
      山口県湯田
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] LSIテスタを用いたテスト検証手法に関する一考察2012

    • Author(s)
      関根 司, 松埜 智, 浅川 毅
    • Organizer
      電子情報通信学会(講演論文集東京支部学生会研究発表会第17回)
    • Place of Presentation
      東京都品川区
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] BOST 手法を用いた LSI テスタの高速化技術に関する検討2012

    • Author(s)
      浅川毅, 大森直樹, 荻原帆斗, 吉成朝雄, 松埜智
    • Organizer
      電子情報通信学会 : 第67回 FTC 研究会
    • Place of Presentation
      滋賀
    • Year and Date
      2012-07-13
    • Data Source
      KAKENHI-PROJECT-23500068
  • [Presentation] BOST手法を用いたLSIテスタの高速化技術に関する検討

    • Author(s)
      浅川 毅 大森 直樹 荻原 帆斗 吉成 朝雄 松埜 智
    • Organizer
      電子情報通信学会 第67回FTC研究会
    • Place of Presentation
      滋賀県大津市
    • Data Source
      KAKENHI-PROJECT-23500068

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