MATSUI Junji 松井純爾

Researcher Number	10295751
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2002 – 2003: 姫路工業大学, 大学院・理学研究科, 教授 1998 – 2002: HIMEJI INSTITUTE OF TECHNOLOGY,PHYSICS,PROF., 理学部, 教授
Review Section/Research Field	Principal Investigator Electronic materials/Electric materials Except Principal Investigator Radiation science
Keywords	Principal Investigator LED / Silicon-on-Insulator Crystal / Semiconductor Laser / Device Characteristics / Synchrotron Radiation / X-ray Microbeam / Lattice Strain / Semiconductor Substrate / その場測定 / マイクロビーム … More / X線 / 電子デバイス / 局所歪み / 薄膜 / SOI / ゾーンプレート / 円筒ミラー / 非対称ブラッグ反射 / SOI結晶 / 半導体レーザー / デバイス特性 / 放射光 / X線マイクロビーム / 格子歪み / 半導体基板 … More Except Principal Investigator 放射光 / 位相画像 / Synchrotron Radiation / Super High Resolution CT / Refraction contrast imaging / Microfocus X-ray / Ray Tracing method / 拡大イメージング / 拡大撮像 / 微小点光源 / 屈折コントラスト画像 / 微小焦点X線 / レイトレーシング法 / Hard X-rays / imaging / collimator / 形態測定 / X線天文学 / SPring-8 / X線 / フーリエ変換法 / 生体測定 / スダレコリメーター / 硬X線 / イメージング / コリメータ / phase image / refraction contrast X-ray image / synchrotron radiation / 屈折コントラスト法 / X-ray Spectroscopy / Phase Contrast Image / Supper high Spatiial Resolution / 肺のCT / 超高空間分解能CT / Cd-Te検出器 / X線スペクトロスコピー / 超高空間分解能 Less

Study of medical imaging of X-ray minute point source using synchrotron radiation
- Principal Investigator
  
  YAMASAKI Katsuhito
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Radiation science
- Research Institution
  Japan Synchrotron Radiation Research institute
In-Situ Measurement of Local Crystal Strain Under Device Operation by Highly Parallel X-ray Microbeam.Principal Investigator
- Principal Investigator
  
  MATSUI Junji
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Himeji Institute of Technology
Sudare Collimator Imaging Using Synchrotron Radiation
- Principal Investigator
  
  SUGIMURA Kazuro
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Radiation science
- Research Institution
  Kobe University
Research on the refraction-enhanced imaging using synchrotron radiation
- Principal Investigator
  
  YAMASAKI Katsuhito
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Radiation science
- Research Institution
  Kobe University
Research for Super High Resolution CT using CdTe Detector and X-ray Spectroscopy
- Principal Investigator
  
  YAMASAKI Katsuhito, 河野通雄
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Radiation science
- Research Institution
  KOBE UNIVERSITY

All 2003 2002 2001

All Journal Article Book

[Book] 放射光の威力-X線マイクロビーム測定を中心に-2003
- Author(s)
  松井純爾
- Publisher
  応用物理学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] イオン工学ハンドブック(分筆;シンクロトロン放射光利用結晶評価技術)2003
- Author(s)
  松井純爾
- Publisher
  イオン工学研究所
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 薄膜作製応用ハンドブック(分筆;薄膜のX線評価)2003
- Author(s)
  松井純爾
- Publisher
  エヌ・ティー・エス
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] X線マイクロビームを用いた局所領域微量ひずみの検出2003
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 木村滋
- Publisher
  応用物理学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 高分解能マイクロビームX線回折法による半導体レーザー素子の評価2002
- Author(s)
  木村滋, 津坂佳幸, 松井純爾
- Publisher
  (株)アグネ技術センター
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] SPring-^8 シンクロトロンX線源2002
- Author(s)
  松井純爾
- Publisher
  日本写真学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 第145回委員会研究会資料2001
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 横山和司
- Publisher
  日本学術振興会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 第135回 X線材料強度部門委員会資料2001
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 横山和司
- Publisher
  日本材料学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003
- Author(s)
  Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl. Instrum. & Methods B199
  
  Pages: 19-22
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Minute Local Strain in Semiconductor Material and Electronic Devices by Using a Highly-Parallel X-ray Microbeam2003
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
- Journal Title
  
  Nucl. Instrum. & Methods B199
  
  Pages: 15-18
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003
- Author(s)
  Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl.Instrum.& Methods B199
  
  Pages: 19-22
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Minute Local Strain in Semiconductor Materials and Electronic Devices by Using a Highly Parallel X-ray Microbeam2003
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
- Journal Title
  
  Nucl.Instrum.& Methods B199
  
  Pages: 15-18
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002
- Author(s)
  S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
- Journal Title
  
  Japan.J.Appl.Phys. 41
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Evaluation of Lattice Strain in Silicon Substrate Beneath Alminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry2002
- Author(s)
  K.Yokoyama, H.Kurihara, S.Takeda, M.Yrakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Japan.J.Appl.Phys. 41
  
  Pages: 6094-6097
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Microscopic Strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
- Journal Title
  
  J.Crystal Growth 237-239
  
  Pages: 317-323
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Evaluation of Lattice Strain In Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffactometry2002
- Author(s)
  K.Yokoyama, H.Kurihara, S.Takeda, M.Urakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Japan. J. Appl. Phys. 41
  
  Pages: 6094-6097
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002
- Author(s)
  S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
- Journal Title
  
  Japan. J. Appl. Phys. 41
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Microscopic strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
- Journal Title
  
  J. Crystal Growth 237-239
  
  Pages: 317-323
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001
- Author(s)
  S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, Y.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
- Journal Title
  
  Nucl. Instrum & Methods A467-468
  
  Pages: 974-977
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] X-ray Phase-Contrast Imaging with submicron Resolution by Using Extremel Asymmetric Bragg Diffractions2001
- Author(s)
  K.Kobayashi, K.Izumi, H.Kimura, S.Kimura, T.Ibuki, K.Yokoyama, Y.Tsusaka, Y.Kagosima, J.Matsui
- Journal Title
  
  Appl. Phys. Letters 78
  
  Pages: 132-134
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001
- Author(s)
  S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, T.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 974-977
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Hyogo Beamline at SPring-8: Multiple Station Beamline with the TROIKA Concept2001
- Author(s)
  Y.Tsusaka, K.Yokoyama, K.Takai, S.Takeda, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 670-673
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001
- Author(s)
  K.Yokoyama, S Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, J.Matsui
- Journal Title
  
  Nucl. Instrum & Methods A467-468
  
  Pages: 1205-1208
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] X-ray Phase-Contrast Imaging with Submicron Resolution by Using Extremely Asymmetric Bragg Diffractions2001
- Author(s)
  K.Kobayashi, K.Izumi, H.Kimura, S.Kimura, T.Ibuki, K.Yokoyama, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Appl.Phys.Letters 78
  
  Pages: 132-134
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001
- Author(s)
  K.Yokoyama, S.Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, N.Miyamoto
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 1205-1208
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096

1. YAMASAKI Katsuhito (50210381)

# of Collaborated Projects: 5 results

# of Collaborated Products: 0 results
2. SUGIMURA Kazuro (00136384)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
3. KAGOSHIMA Yasushi (10224370)

# of Collaborated Projects: 4 results

# of Collaborated Products: 19 results
4. TSUSAKA Yoshiyuki (20270473)

# of Collaborated Projects: 3 results

# of Collaborated Products: 21 results
5. SHIKATA Yoshihiro (50028114)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. YOSHIDA Shoji (20030869)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. ANDO Masami (30013501)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. YAGI Naoto (80133940)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. NEGORO Hitoshi (30300891)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. MAEDA Sakan (50030911)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. MIKOSHIBA Katsuhiko (30051840)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. KIMURA Shigeru (50360821)

# of Collaborated Projects: 1 results

# of Collaborated Products: 16 results
13. UMETANI Keiji (50344396)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. 河野通雄 (60030938)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. 宇山親雄 (30026059)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. 楠本昌彦 (90252767)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. 糸氏英一郎 (90243302)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. 足立秀治 (60159407)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

MATSUI Junji 松井 純爾

Research Projects

Research Products

Co-Researchers

Study of medical imaging of X-ray minute point source using synchrotron radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-Situ Measurement of Local Crystal Strain Under Device Operation by Highly Parallel X-ray Microbeam.Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Sudare Collimator Imaging Using Synchrotron Radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Research on the refraction-enhanced imaging using synchrotron radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Research for Super High Resolution CT using CdTe Detector and X-ray Spectroscopy

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] 放射光の威力-X線マイクロビーム測定を中心に-2003

Author(s)

Publisher

Description

Data Source

[Book] イオン工学ハンドブック(分筆;シンクロトロン放射光利用結晶評価技術)2003

Author(s)

Publisher

Description

Data Source

[Book] 薄膜作製応用ハンドブック(分筆;薄膜のX線評価)2003

Author(s)

Publisher

Description

Data Source

[Book] X線マイクロビームを用いた局所領域微量ひずみの検出2003

Author(s)

Publisher

Description

Data Source

[Book] 高分解能マイクロビームX線回折法による半導体レーザー素子の評価2002

Author(s)

Publisher

Description

Data Source

[Book] SPring-^8 シンクロトロンX線源2002

Author(s)

Publisher

Description

Data Source

[Book] 第145回委員会研究会資料2001

Author(s)

Publisher

Description

Data Source

[Book] 第135回 X線材料強度部門委員会資料2001

Author(s)

Publisher

Description

Data Source

[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003

Author(s)

Journal Title

Description

Data Source

[Journal Article] Measurement of Minute Local Strain in Semiconductor Material and Electronic Devices by Using a Highly-Parallel X-ray Microbeam2003

MATSUI Junji 松井純爾