Mashiko Yoji 益子洋治

Researcher Number	10404360
Affiliation (based on the past Project Information) *help	2014 – 2016: 大分大学, 工学部, 教授
Review Section/Research Field	Principal Investigator Electron device/Electronic equipment
Keywords	Principal Investigator 荷電粒子ビーム / ナノ―プロービング / アクティブビームプロービング / トランジスタ特性測定 / FIB / 電子ビーム / ナノプロービング / 荷電粒子ビーム応用 / LSI / 故障解析

Study on non-contact probing technology using charged particle beamsPrincipal Investigator
- Principal Investigator
  
  Mashiko Yoji
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Oita University

All 2016 2015 2014

All Journal Article Presentation

[Journal Article] Study on non-contact current path formation using charged particle beams2016
- Author(s)
  J. Ma, Y. Fujimura, M. Utsumi, S. Tomonaga, Y. Mashiko
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 64 Pages: 326-329
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-26420312
[Journal Article] 荷電粒子ビームを用いた電流経路機構に関する研究2016
- Author(s)
  内海元貴,　馬晶鴻，藤村陽平，國重友里，益子洋治
- Journal Title
  
  第36回ナノテスティングシンポジウム(NANOTS2016)会議録
  
  Volume: 2016 Pages: 183-187
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420312
[Journal Article] 荷電粒子ビームを用いた電流経路形成技術に関する研究2015
- Author(s)
  馬晶鴻,朝長俊也,内海元貴, 鈴木界人,北野　大, 益子洋治
- Journal Title
  
  第35回ナノテスティングシンポジウム(NANOTS2015)会議録
  
  Volume: 2015 Pages: 191-196
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420312
[Journal Article] EBAC法におけるMOSFET FIBプロービング制御の検討2015
- Author(s)
  鈴木界人,花田昌大, 馬晶鴻,北野　大,　則松研二,益子洋治
- Journal Title
  
  第35回ナノテスティングシンポジウム(NANOTS2015)会議録
  
  Volume: 2015 Pages: 197-202
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420312
[Journal Article] 荷電粒子ビームによる電流経路形成に関する研究2014
- Author(s)
  朝長俊也,増冨智明, 馬晶鴻, 則松研二, 益子洋治
- Journal Title
  
  第34回ナノテスティングシンポジウム(NANOTS2014)会議録
  
  Volume: ２０１４年版 Pages: 251-255
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420312
[Journal Article] 2電極へのFIB同時プロービング計測についての研究2014
- Author(s)
  花田昌大,垣副大輝, 鈴木界人,　則松研二,益子洋治
- Journal Title
  
  第34回ナノテスティングシンポジウム(NANOTS2014)会議録
  
  Volume: ２０１４年版 Pages: 257-261
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420312
[Presentation] Study on non-contact current path formation using charged particle beams2016
- Author(s)
  Y.Mashiko
- Organizer
  27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2016)
- Place of Presentation
  Handel-Halle　(Halle, Germany)
- Year and Date
  2016-09-19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26420312

1. Tomonaga Syunya

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
2. Hanada Masahiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
3. Kitano Dai

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
4. Suzuki Kaito

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
5. Jing Hong

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
6. Utsumi Mototaka

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
7. Fujimura Youhei

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
8. Kunishige Yuri

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
9. Fukuhara Kazuki

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Mashiko Yoji 益子洋治

Research Projects

Research Products

Co-Researchers

Study on non-contact probing technology using charged particle beamsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Study on non-contact current path formation using charged particle beams2016

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームを用いた電流経路機構に関する研究2016

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームを用いた電流経路形成技術に関する研究2015

Author(s)

Journal Title

Data Source

[Journal Article] EBAC法におけるMOSFET FIBプロービング制御の検討2015

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームによる電流経路形成に関する研究2014

Author(s)

Journal Title

Data Source

[Journal Article] 2電極へのFIB同時プロービング計測についての研究2014

Author(s)

Journal Title

Data Source

[Presentation] Study on non-contact current path formation using charged particle beams2016

Author(s)

Organizer

Place of Presentation

Year and Date

Data Source

Mashiko Yoji 益子 洋治

Research Projects

Research Products

Co-Researchers

Study on non-contact probing technology using charged particle beamsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Study on non-contact current path formation using charged particle beams2016

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームを用いた電流経路機構に関する研究2016

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームを用いた電流経路形成技術に関する研究2015

Author(s)

Journal Title

Data Source

[Journal Article] EBAC法におけるMOSFET FIBプロービング制御の検討2015

Author(s)

Journal Title

Data Source

[Journal Article] 荷電粒子ビームによる電流経路形成に関する研究2014

Author(s)

Journal Title

Data Source

[Journal Article] 2電極へのFIB同時プロービング計測についての研究2014

Author(s)

Journal Title

Data Source

[Presentation] Study on non-contact current path formation using charged particle beams2016

Author(s)

Organizer

Place of Presentation

Year and Date

Data Source

Mashiko Yoji 益子洋治