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Abe Toshinori  阿部 利徳

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阿部 利徳  アベ トシノリ

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Researcher Number 10570187
Affiliation (Current) 2025: 公益財団法人高輝度光科学研究センター, 加速器部門, 主幹研究員
Affiliation (based on the past Project Information) *help 2016 – 2017: 公益財団法人高輝度光科学研究センター, 光源基盤部門, 研究員
2015: 公益財団法人高輝度光科学研究センター, 情報部門, 研究員
2014: 公益財団法人高輝度光科学研究センター, 制御情報部門, 研究員
2013: 公益財団法人高輝度光科学研究センター, 制御・情報部門, 研究員
Review Section/Research Field
Except Principal Investigator
Science and Engineering
Keywords
Except Principal Investigator
CMOS微細トランジスタの放射線耐性 / 半導体センサ / 放射光 / X線自由電子レーザー / 物理化学 / 量子ビーム / 超高速ダイナミクス / 集積回路 / X線検出器 / CMOS … More / 半導体 / X線 / 検出 / 検出器 Less
  • Research Projects

    (1 results)
  • Research Products

    (4 results)
  • Co-Researchers

    (5 People)
  •  Detector for ultrafast structure analysis by XFEL

    • Principal Investigator
      Hatsui Takaki
    • Project Period (FY)
      2013 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
    • Review Section
      Science and Engineering
    • Research Institution
      Institute of Physical and Chemical Research

All 2014 2013

All Journal Article Presentation

  • [Journal Article] Development of Experimental Methodology for Highly Efficient Wafer-Level Evaluation of X-Ray Radiation Effects on Semiconductor Devices2014

    • Author(s)
      Togo Kudo, Kazuo Kobayashi, Shun Ono, Takeo Watanabe, Hiroo Kinoshita, Masao Okihara, and Takaki Hatsui,
    • Journal Title

      IEEE Transaction of Nuclear Science

      Volume: in press

    • Peer Reviewed
    • Data Source
      KAKENHI-PLANNED-25109007
  • [Journal Article] Development of Experimental Methodology for Highly Efficient Wafer-Level Evaluation of X-Ray Radiation Effects on Semiconductor Devices2014

    • Author(s)
      Togo Kudo, Kazuo Kobayashi, Shun Ono, Takeo Watanabe, Hiroo Kinoshita, Masao Okihara, and Takaki Hatsui
    • Journal Title

      IEEE Trans. Nuclear Science

      Volume: 61 Issue: 3 Pages: 1444-1450

    • DOI

      10.1109/tns.2014.2321766

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PLANNED-25109007
  • [Presentation] MPCCD検出器システムの現状とアップグレード2014

    • Author(s)
      亀島 敬、小野 峻、尾崎 恭介、桐原 陽一、工藤 統吾、小林 和生、堀米 利夫、初井 宇記、山鹿 光裕、古川 行人、阿部 利徳、岡田 謙介、杉本 崇、城地 保昌、片山 哲夫、矢橋 牧名、田中 良太郎
    • Organizer
      第27回日本放射光学会年会
    • Place of Presentation
      広島
    • Data Source
      KAKENHI-PLANNED-25109007
  • [Presentation] Current status of a 4 Mpixel Multiport CCD Detector with 8 Arrayed sensors for X-ray Free-Electron Laser Facility SACLA2013

    • Author(s)
      S. Ono, T. Kameshima, K. Ozaki, K. Kobayashi, T. Kudo, Y. Kirihara, T. Abe, M. Yamaga, T. Horigome, T. Hatsui
    • Organizer
      IEEE Nuclear Science Symposium
    • Place of Presentation
      Seoul, Korea
    • Data Source
      KAKENHI-PLANNED-25109007
  • 1.  Hatsui Takaki (40332176)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 2.  Kameshima Takashi (50558046)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 2 results
  • 3.  寺西 信一 (20738893)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  工藤 統吾 (40372148)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 5.  桐原 陽一 (30584536)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 2 results

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