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Kondo Yohan  近藤 余範

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… Alternative Names

近藤 余範  コンドウ ヨハン

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Researcher Number 10586316
Other IDs
Affiliation (Current) 2025: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員
Affiliation (based on the past Project Information) *help 2021 – 2023: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員
2017 – 2019: 国立研究開発法人産業技術総合研究所, 計量標準総合センター, 主任研究員
2015: 国立研究開発法人産業技術総合研究所, 工学計測標準研究部門, 主任研究員
2014: 独立行政法人産業技術総合研究所, 計測標準研究部門, 主任研究員
Review Section/Research Field
Principal Investigator
Production engineering/Processing studies
Except Principal Investigator
Basic Section 18020:Manufacturing and production engineering-related
Keywords
Principal Investigator
球面 / 自由曲面 / 平面 / 形状計測 / 自己校正法 / ロータリエンコーダ / 幾何学 / 機械力学・制御 / 精密研磨 / 超精密計測 … More / 計測工学 / 回転振れ / オプチカルフラット / 角度測定 / Dual mirror pair (DMP) / ペンタミラー / 形状測定システム / 曲率 / 平行平板 / 自己校正型ロータリエンコーダ / オートコリメータ / 平面度 / 三次元形状 / 角度 / 球目 … More
Except Principal Investigator
マイクロCMM / 形状測定 / フリーフォーム / 精密形状計測 / 計量標準 / 三次元計測 / 精密計測 / トレーサビリティ / CMM / 形状計測 Less
  • Research Projects

    (3 results)
  • Research Products

    (11 results)
  • Co-Researchers

    (4 People)
  •  Development of high precision free-form shape measurement system traceable to Avogadro's constant

    • Principal Investigator
      Bitou Youichi
    • Project Period (FY)
      2021 – 2023
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 18020:Manufacturing and production engineering-related
    • Research Institution
      National Institute of Advanced Industrial Science and Technology
  •  3-D scanning deflectometric profiler using self-calibration rotary encoderPrincipal Investigator

    • Principal Investigator
      Kondo Yohan
    • Project Period (FY)
      2017 – 2019
    • Research Category
      Grant-in-Aid for Young Scientists (A)
    • Research Field
      Production engineering/Processing studies
    • Research Institution
      National Institute of Advanced Industrial Science and Technology
  •  Development of deflectmetric profiler using self-calibratable rotary encoderPrincipal Investigator

    • Principal Investigator
      Kondo Yohan
    • Project Period (FY)
      2014 – 2015
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Production engineering/Processing studies
    • Research Institution
      National Institute of Advanced Industrial Science and Technology

All 2023 2022 2018 2017 2016 2014

All Journal Article Presentation

  • [Journal Article] Two-point diameter calibration of a sphere using a micro-coordinate measuring machine at NMIJ2022

    • Author(s)
      Yohan Kondo, Akiko Hirai and Bitou Youichi
    • Journal Title

      Metrologia

      Volume: 59 Issue: 2 Pages: 024005-024005

    • DOI

      10.1088/1681-7575/ac579e

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01232
  • [Journal Article] High-lateral-resolution scanning deflectometric profiler using a commercially available autocollimator2014

    • Author(s)
      尾藤 洋一, 近藤 余範
    • Journal Title

      MEASUREMENT SCIENCE & TECHNOLOGY

      Volume: 25 Issue: 9 Pages: 095202-095202

    • DOI

      10.1088/0957-0233/25/9/095202

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26820028
  • [Presentation] マイクロCMMを用いた球直径測定に関する研究―ブロックゲージ表面粗さの影響について―2023

    • Author(s)
      近藤 余範、川嶋 なつみ、平井亜紀子、尾藤洋一
    • Organizer
      精密工学会誌春季講演論文集
    • Data Source
      KAKENHI-PROJECT-21H01232
  • [Presentation] マイクロCMMを用いた球直径測定に関する研究―T型先鋭スタイラスの開発―2023

    • Author(s)
      近藤 余範、川嶋 なつみ、平井亜紀子、尾藤洋一
    • Organizer
      精密工学会誌秋季講演論文集
    • Data Source
      KAKENHI-PROJECT-21H01232
  • [Presentation] Self-calibration method of nanometer profile measurement on large aspheric optical surface2018

    • Author(s)
      高村智彦、近藤 余範、尾藤 洋一、高橋哲、高増潔
    • Organizer
      ICPE2018
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] 角度測定に基づく三次元形状測定システムの開発2018

    • Author(s)
      近藤 余範、尾藤 洋一
    • Organizer
      精密工学会春季大会
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] Φ450 mmオプチカルフラットの絶対平面度測定2018

    • Author(s)
      近藤 余範、尾藤 洋一
    • Organizer
      精密工学会秋季大会
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] Nanometer Profile Measurement on Large Aspheric Optical Surface2017

    • Author(s)
      郭翔、近藤 余範、尾藤 洋一、高橋哲、高増潔
    • Organizer
      ASPEN2017
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] Scanning Deflectometric Profiler (SDP) systems at NMIJ2017

    • Author(s)
      尾藤 洋一、近藤 余範
    • Organizer
      The 3rd MacroScale conference
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] 角度測定を利用した高精度形状計測2017

    • Author(s)
      尾藤 洋一、近藤 余範
    • Organizer
      光計測シンポジウム2017
    • Data Source
      KAKENHI-PROJECT-17H04901
  • [Presentation] λ/100 reference flat for commercially available Fizeau interferometer2016

    • Author(s)
      Yohan Kondo, Youichi Bitou and Kazuhide Yamauchi
    • Organizer
      The 8th SPIE International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2016)
    • Place of Presentation
      中国(蘇州)
    • Year and Date
      2016-04-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26820028
  • 1.  Bitou Youichi (30357842)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 3 results
  • 2.  早稲田 篤 (20272172)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 3.  倉本 直樹 (60356938)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  水島 茂喜 (60358091)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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