Miyase Kohei 宮瀬紘平

… Alternative Names

MIYASE Kohei 宮瀬紘平

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Researcher Number	30452824
Other IDs
Affiliation (Current)	2025: 九州工業大学, 大学院情報工学研究院, 准教授
Affiliation (based on the past Project Information) *help	2016 – 2024: 九州工業大学, 大学院情報工学研究院, 准教授 2013 – 2015: 九州工業大学, 大学院情報工学研究院, 助教 2012 – 2014: 九州工業大学, 情報工学研究院, 助教 2012: 九州工業大学, その他の研究科, 助教 2010 – 2012: 九州工業大学, 大学院・情報工学研究院, 助教 2011: 九州工業大学, 大学院情報工学研究院, 助教
Review Section/Research Field	Principal Investigator Computer system / Basic Section 60040:Computer system-related / Computer system/Network Except Principal Investigator Computer system / Computer system/Network / Basic Section 60040:Computer system-related / Developmental mechanisms and the body works
Keywords	Principal Investigator LSIテスト / LSI設計 / 消費電力解析 / VLSI設計技術 / LSIの消費電力解析 / LSIの消費電力 / LSI設計技術 Except Principal Investigator IR-Drop / LSIテスト / 低電力テスト … More / シフトエラー / シフト電力 / LSI回路 / 誤テスト / テスト電力 / スキャンテスト / 高信頼化 / 高品質化 / 活性化パス / 微小遅延故障 / 遅延テスト / テスト電力調整 / 計算機システム / ディペンダブル・コンピューティング / 欠陥検出設計 / 欠陥影響最小化設計 / 欠陥影響定量化 / 欠陥 / 耐ソフトエラー記憶素子 / ディペンダブル・コンピュー / ディペンダブル・コンピュータ / グルーピング / テストクロック / シフトタイミング / 電子デバイス・機器 / 運動学習 / 上下動 / ステップ頻度 / ステップ長 / センサー / フラット着地 / 地面反力 / ランニングフォーム / 市民ランナー / クロックパス / パス遅延 / 信号値遷移 / 誤テスト回避 / テスト電力制御 / クロック / マスク回路 / 入力遷移 / テスト電力安全性 / テスト生成 / テストデータ変更 / クロックストレッチ / IR-Dop / キャプチャ電力 / テストデータ / テスト品質 / 最適電力テスト / クロックスキュー / スキャンテスト電力 / (1)ディペンダブル・コンピューティング / VLSIの設計とテスト / 高信頼設計 / 論理回路 / システムオンチップ / VLSI の設計とテスト Less

Research on Defect-Aware Soft-Error Mitigation for Reliable LSIs
- Principal Investigator
  
  温暁青
- Project Period (FY)
  2021 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyushu Institute of Technology
Efficient and Effective Power Analysis Techniques for Efficient SoC DesignPrincipal Investigator
- Principal Investigator
  
  宮瀬紘平
- Project Period (FY)
  2020 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Kyushu Institute of Technology
LSI Test and Diagnosis for Defects on Power Supply NetworkPrincipal Investigator
- Principal Investigator
  
  Miyase Kohei
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Computer system
- Research Institution
  Kyushu Institute of Technology
Shift-Power-Safe Scan Test Methodology for High-Quality Low-Power LSI Circuits
- Principal Investigator
  
  Wen Xiaoqing
- Project Period (FY)
  2017 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Kyushu Institute of Technology
Construction of safe and efficient running form learning support system for recreational marathon runner
- Principal Investigator
  
  Tokui Masato
- Project Period (FY)
  2016 – 2018
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Developmental mechanisms and the body works
- Research Institution
  Kyushu Kyoritsu University
Research on High-Quality Test Method for Avoiding False Testing of Next-Generation Low-Power LSIs
- Principal Investigator
  
  Wen Xiaoqing
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Computer system
- Research Institution
  Kyushu Institute of Technology
Research on Extra-Low-Power Self-Test for LSI Circuits in Implantable Medical Devices
- Principal Investigator
  
  WEN XIAOQING
- Project Period (FY)
  2013 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system
- Research Institution
  Kyushu Institute of Technology
Maximize the Efficiency of LSI DesignFlow with Advanced LSI Test MethodPrincipal Investigator
- Principal Investigator
  
  Miyase Kohei
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Computer system
- Research Institution
  Kyushu Institute of Technology
Research on Logic Switching Activity Balanced Test for High-Quality Low-Cost LSIs
- Principal Investigator
  
  WEN Xiaoqing
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Computer system/Network
- Research Institution
  Kyushu Institute of Technology
Improvement of the quality and coverage for delay testing of high speed LSIPrincipal Investigator
- Principal Investigator
  
  MIYASE Kohei
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Kyushu Institute of Technology
Power Adjustment Testing for Next-Generation Low-Power LSI Circuits
- Principal Investigator
  
  WEN Xiaoqing
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Kyushu Institute of Technology
A study on high quality field test for VLSIs
- Principal Investigator
  
  KAJIHARA Seiji
- Project Period (FY)
  2009 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Computer system/Network
- Research Institution
  Kyushu Institute of Technology

[Journal Article] Probability of Switching activity to Locate Hotspots in Logic Circuits2021
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qian
- Journal Title
  
  IEICE Trans. on Inf. & Syst.
  
  Volume: E104-D
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Journal Article] Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation2016
- Author(s)
  F. Li, X. Wen, K. Miyase, S. Holst, S. Kajihara
- Journal Title
  
  IEICE Trans. Fundamentals
  
  Volume: E99.A Issue: 12 Pages: 2310-2319
- DOI
  10.1587/transfun.E99.A.2310
- NAID
  130005170516
- ISSN
  0916-8508, 1745-1337
- Language
  English
- Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016, KAKENHI-PROJECT-15K12003, KAKENHI-PROJECT-15K12004
[Journal Article] LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing2013
- Author(s)
  Y. Yamato, X. Wen, M. A. Kochte, K. Miyase, S. Kajihara, L.-T. Wang
- Journal Title
  
  IEEE Design & Test of Computers
  
  Volume: Vol. 30, No. 4 Issue: 4 Pages: 60-70
- DOI
  10.1109/mdt.2012.2221152
- NAID
  120005895737
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24650022, KAKENHI-PROJECT-25280016
[Journal Article] A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing2013
- Author(s)
  K. Miyase, R. Sakai, X. Wen, Xiaoqing, M. Aso, H. Furukawa, Y. Yamato, S. Kajihara
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E96.D Issue: 9 Pages: 2003-2011
- DOI
  10.1587/transinf.E96.D.2003
- NAID
  130003370989
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24650022, KAKENHI-PROJECT-25280016
[Journal Article] A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing2011
- Author(s)
  Y.Yamato, X.Wen, R.Miyase, H.Furukawa, S.Kajihara
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E94-D Issue: 4 Pages: 833-840
- DOI
  10.1587/transinf.E94.D.833
- NAID
  10029506602
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22300017
[Journal Article] Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing2011
- Author(s)
  K.Miyase, K.Noda, H.Ito, K.Hatayama, T.Aikyo, Y.Yamato, H.Furukawa, X.Wen, S.Kaiihara
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E94.D Issue: 6 Pages: 1216-1226
- DOI
  10.1587/transinf.E94.D.1216
- NAID
  10029805011
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22300017
[Journal Article] Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing2011
- Author(s)
  K. Miyase, K. Noda, H. Ito, K. Hatayama, T. Aikyo, Y. Yamato, H. Furukawa, X. Wen, and S. Kajihara
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: Vol. E94-D, No. 6 Pages: 1216-1226
- NAID
  10029805011
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22300017
[Journal Article] On Delay Test Quality for Test Cubes2010
- Author(s)
  S. Oku, S. Kajihara, Y. Sato, K. Miyase, X. Wen
- Journal Title
  
  IPSJ Transactions on System LSI Design Methodology
  
  Volume: 3 Pages: 283-291
- DOI
  10.2197/ipsjtsldm.3.283
- NAID
  110009599095
- ISSN
  1882-6687
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] On Estimation of NBTI-Induced Delay Degradation2010
- Author(s)
  M.Noda, S.Kajihara, Y.Sato, K.Miyase, X.Wen, Y.Miura
- Journal Title
  
  Proc.of 5th IEEE European Test Symposium
  
  Pages: 107-111
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A Study of Capture-Safe Test Generation Flow for At-Speed Testing2010
- Author(s)
  K.Miyase, X.Wen, S.Kajihara, Y.Yamato, A.Takashima, H.Furukawa, K.Noda, N.Ito, K.Hatayama, T.Aikyo, K.Saluja
- Journal Title
  
  IEICE Trans.Inf.& Syst.
  
  Volume: E93-A Pages: 1309-1318
- NAID
  10027367482
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22300017
[Journal Article] High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme2010
- Author(s)
  Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, (他3名)
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: E93-D Issue: 1 Pages: 2-9
- DOI
  10.1587/transinf.E93.D.2
- NAID
  10026812940
- ISSN
  0916-8532, 1745-1361
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A Study of Capture-Safe Test Generation Flow for At-Speed Testing2010
- Author(s)
  K. Miyase, X. Wen, S. Ka j ihara, Y. Yamato, A. Takashima, H. Furukawa, K. Noda, H. Ito, K. Hatayama, T. Aikyo, and K. K. Saluja
- Journal Title
  
  IEICE Trans. Inf. & Syst.
  
  Volume: Vol. E93-A, No. 7 Pages: 1309-1318
- NAID
  10027367482
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22300017
[Journal Article] On Test Pattern Compaction with Multi-Cycle and Multi-Observation Scan Test2010
- Author(s)
  Seiji Kajihara, Makoto Matsuzono, Hisato Yamaguchi, Yasuo Sato, Kohei Miyase, Xiaoqing Wen
- Journal Title
  
  Int. Symp. on Communications and Information Technologies
  
  Pages: 723-726
- DOI
  10.1109/iscit.2010.5665084
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] On Delay Test Quality for Test Cubes2010
- Author(s)
  S.Oku, S.Kajihara, Y.Sato, K.Miyase, X.Wen
- Journal Title
  
  IPSJ Transactions on System LSI Design Methodology
  
  Volume: Vol.3 Pages: 283-291
- NAID
  130000418476
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] On Test Pattern Compaction with Multi-Cycle and Multi-Observation Scan Test2010
- Author(s)
  S.Kajihara, M.Matsuzono, H.Yamaguchi, Y.Sato, K.Miyase, X.Wen
- Journal Title
  
  Proc.of 10th International Symposium on Communications and Information Technologies
  
  Pages: 723-726
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] High Launch Switching Activity Reduction in At-Speed Scan Testing using CTX : A Clock-Gating-Based Test Relaxation and X-Filling Scheme2010
- Author(s)
  K.Miyase, X.Wen, H.Furukawa, Y.Yamato, S.Kajihara, P.Girard, L.-T.Wang, M.Tehranipoor
- Journal Title
  
  IEICE Transactions on Information and Systems Vol.E93-D
  
  Pages: 2-9
- NAID
  10026812940
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] On Estimation of NBTI-Induced Delay Degradation2010
- Author(s)
  M. Noda, S. Kajihara, Y. Sato, K. Miyase, X. Wen, Y. Miura
- Journal Title
  
  15thIEEE European Test Symp
  
  Pages: 107-111
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] On Calculation of Delay Range in Fault Simulation for Test Cubes2009
- Author(s)
  S.KAJIHARA, S.OKU, K.MIYASE, X.WEN, Y.SATO
- Journal Title
  
  Proc.of International Symposium on VLSI Design, Automation, and Test
  
  Pages: 64-67
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-Speed Scan Testing2009
- Author(s)
  Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara
- Journal Title
  
  IEEE 15th Pacific Rim Int. Symp. on Dependable Computing
  
  Pages: 81-86
- DOI
  10.1109/prdc.2009.21
- NAID
  120006784394
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment2009
- Author(s)
  Kohei Miyase, (他7名)
- Journal Title
  
  Int. Conf. on ComputerAided Design
  
  Pages: 97-104
- DOI
  10.1145/1687399.1687420
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] CAT : A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing2009
- Author(s)
  K.Enokimoto, X.Wen, Y.Yamato, K.Miyase, H.Sone, S.Kajihara, M.Aso, H.Furukawa
- Journal Title
  
  Proc.of Asian Test Symposium
  
  Pages: 99-104
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-Speed Scan Testing2009
- Author(s)
  Y.Yamato, X.Wen, K.Miyase, H.Furukawa, S.Kajihara
- Journal Title
  
  Proc.of IEEE 15th Pacific Rim International Symposium on Dependable Computing
  
  Pages: 81-86
- NAID
  120006784394
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment2009
- Author(s)
  K.Miyase, Y.Yamato, K.Noda, H.Ito, K.Hatayama, T.Aikyo, X.Wen, S.Kajihara
- Journal Title
  
  Proc.of International Conference on Computer-Aided Design
  
  Pages: 97-104
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Journal Article] CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing2009
- Author(s)
  Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, Hiroaki Sone, Seiji Kajihara(他2名)
- Journal Title
  
  Proc. Asian Test Symp
  
  Pages: 99-104
- DOI
  10.1109/ats.2009.22
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 論理回路の分岐再収斂構造解析による高消費電力エリア特定に関する研究2024
- Author(s)
  山下友哉，宮瀬紘平，温暁青
- Organizer
  電子情報通信学会技術研究報告（DC研究会）
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] 回路情報を用いた入力パターンによって異なる高消費電力エリア特定に関する研究2024
- Author(s)
  章子晗，山下友哉，宮瀬紘平，温暁青
- Organizer
  第88回FTC研究会
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] 論理回路内のホットスポット特定手法とテストパターンごとに異なるホットスポットの評価に関する研究2023
- Author(s)
  宇都宮大喜, 宮瀬紘平, 星野龍, ルーシュエクン, 温暁青, 梶原誠司
- Organizer
  DC研究会（電子情報通信学会）
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits2022
- Author(s)
  Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, and Seiji Kajihara
- Organizer
  IEEE International Test Conference in Asia
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] 信号値遷移確率を用いた高消費電力エリア特定技術の計算処理評価に関する研究2022
- Author(s)
  星野龍, 宇都宮大喜, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告, DC2021-73, pp. 51-56
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits2022
- Author(s)
  T. Utsunomiya, R. Hoshino, K. Miyase, S.-K. Lu, X. Wen, and S. Kajihara
- Organizer
  IEEE Int'l Test Conf. in Asia
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K21653
[Presentation] Evaluation of Power Consumption with Logic Simulation and Placement Information for At-Speed Testing2021
- Author(s)
  Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
- Organizer
  Digest. of IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] LSIの高消費電力エリアに対する信号値遷移制御率向上に関する研究2020
- Author(s)
  史傑, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  信学技報, Vol. 119, No. 420, DC2019-94
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Probability of Switching activity to Locate Hotspots in Logic Circuits2020
- Author(s)
  R. Oba, K. Miyase, R. Hoshino, S.-K. Lu, X. Wen, S. Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Probability of Switching Activity to Locate Hotspots in Logic Circuits2020
- Author(s)
  Ryo Oba, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
- Organizer
  Digest. of IEEE Workshop on RTL and High Level Testing
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] LSIの領域毎の信号値遷移確率に基づく電力評価に関する研究2020
- Author(s)
  大庭涼, 星野龍, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告, vol. 120, no. 236, DC2020-33, pp. 12-17
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] メモリのサイズおよび形状に起因するロジック部の高消費電力エリア特定に関する研究2020
- Author(s)
  高藤大輝, 星野龍, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告, DC2020-72
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] LSIの領域毎の信号値遷移確率に基づく電力評価に関する研究2020
- Author(s)
  大庭涼, 星野竜, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  信学技報, Vol. 120, No. 236, DC2020-33
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] メモリのサイズおよび形状に起因するロジック部の高消費電力エリア特定に関する研究2020
- Author(s)
  高藤大輝, 星野龍, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告, DC2020-72, pp. 18-23
- Data Source
  KAKENHI-PROJECT-20K11736
[Presentation] メモリ搭載LSIに対するロジック部の消費電力解析に関する研究2020
- Author(s)
  児玉優也, 宮瀬紘平, 高藤大輝, 温暁青, 梶原誠司
- Organizer
  信学技報, Vol. 119, No. 420, DC2019-93
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] LSIの高消費電力エリアに対する信号値遷移制御率向上に関する研究2020
- Author(s)
  史傑, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  信学技報, vol. 119, no. 420, DC2019-94, pp. 49-54
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] メモリ搭載LSIに対するロジック部の消費電力解析に関する研究2020
- Author(s)
  児玉優也, 宮瀬紘平, 高藤大輝, 温暁青, 梶原誠司
- Organizer
  信学技報, vol. 119, no. 420, DC2019-93, pp. 43-48
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] LSIのホットスポット分布の解析に関する研究2019
- Author(s)
  河野雄大, 宮瀬紘平, 呂學坤, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会ディペンダブルコンピューティン研究会
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] A Static Method for Analyzing Hotspot Distribution on the LSI2019
- Author(s)
  K. Miyase, Y. Kawano, S.-K. Lu, X. Wen, S. Kajihara
- Organizer
  IEEE Int'l Test Conf. in Asia
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption2019
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qian
- Organizer
  第11回LSIテストセミナー
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] A Static Method for Analyzing Hotspot Distribution on the LSI2019
- Author(s)
  Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
- Organizer
  IEEE International Test Conference in Asia
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing2018
- Author(s)
  Y. Zhang, X. Wen, S. Holst, K. Miyase, S. Kajihara, H.-J. Wunderlich, J. Qian
- Organizer
  IEEE Asian Test Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Progressive ECC Techniques for Phase Change Memory2018
- Author(s)
  Shyue-Kung Lu, Hui-Ping Li, and Kohei Miyase
- Organizer
  2018 IEEE 27th Asian Test Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] 正当化操作を用いたレイアウト上のホットスポット特定に関する研究2018
- Author(s)
  河野雄大, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  DC研究会
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption2018
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qian
- Organizer
  第17 回情報科学技術フォーラム
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] 正当化操作を用いたレイアウト上のホットスポット特定に関する研究2018
- Author(s)
  河野雄大, 宮瀬紘平, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会DC研究会
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors2017
- Author(s)
  S. Holst, E. Schneiderz, H. Kawagoe, M. A. Kochtez, K. Miyase, H.-J. Wunderlichz, S. Kajihara, X. Wen
- Organizer
  Proc. of IEEE Int'l Test Conf.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Locating Hot Spot with Justification Techniques in a Layout Design2017
- Author(s)
  K. Miyase, Y. Kawano, X. Wen, S. Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] 電源ネットワークに対するIR-Dropの影響範囲特定に関する研究2017
- Author(s)
  宮瀬紘平, 濱崎機一, ザウアーマティアス, ポリアンイリア, ベッカーベルンド, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会 DC研究会
- Place of Presentation
  東京都
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors2017
- Author(s)
  S. Holst, E. Schneider, H. Kawagoe, M. A. Kochtez, K. Miyase, H.-J. Wunderlichz, S. Kajihara, X. Wen
- Organizer
  IEEE Int'l Test Conf.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] ランニングフォームに対する動作解析システムに関する研究2017
- Author(s)
  池松宅磨、松原健人、ホルストシュテファン、宮瀬紘平、得居雅人
- Organizer
  第７８回ＦＴＣ研究会
- Data Source
  KAKENHI-PROJECT-16K01644
[Presentation] Locating Hot Spot with Justification Techniques in a Layout Design2017
- Author(s)
  K. Miyase, Y. Kawano, X. Wen, S. Kajihara
- Organizer
  Proc. of IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption2017
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qia
- Organizer
  IEEE Asian Test Symp.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] On Avoiding Test Data Corruption by Optimal Scan Chain Grouping2017
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qian
- Organizer
  第181回SLDM・第46回EMB合同研究発表会
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Locating Hot Spot with Justification Techniques in a Layout Design2017
- Author(s)
  K. Miyase, Y. Kawano, X. Wen, S. Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] 高品質実速度スキャンテスト生成に関する研究2017
- Author(s)
  宮崎俊紀、温暁青、ホルストシュテファン、宮瀬紘平、梶原誠司
- Organizer
  第9回LSIテストセミナー
- Place of Presentation
  福岡市
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Locating Hot Spot with Justification Techniques in a Layout Design2017
- Author(s)
  K. Miyase, Y. Kawano, X. Wen, and S. Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Data Source
  KAKENHI-PROJECT-17K00081
[Presentation] Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption2017
- Author(s)
  Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, J. Qian
- Organizer
  Proc. of IEEE Asian Test Symp.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01716
[Presentation] Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test2016
- Author(s)
  S. Eggersgluess, S. Holst, D. Tillex, K. Miyase, X. Wen
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Hiroshima, Japan
- Year and Date
  2016-11-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] SAT-Based Post-Processing for Regional Capture Power Reduction in At-Speed Scan Test Generation2016
- Author(s)
  S. Eggersgluess, K. Miyase, X. Wen
- Organizer
  IEEE European Test Symp.
- Place of Presentation
  Amsterdam, The Netherlands
- Year and Date
  2016-05-23
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test2016
- Author(s)
  S. Eggersgluess, S. Holst, D. Tillex, K. Miyase, X. Wen
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Hiroshima, Japan
- Year and Date
  2016-11-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation2016
- Author(s)
  F. Li, X. Wen, S. Holst, K. Miyase, S. Kajihara
- Organizer
  Int'l Symp. on Applied Engineering and Sciences
- Place of Presentation
  Kitakyushu, Japan
- Year and Date
  2016-12-17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] On Optimal Power-Aware Path Sensitization2016
- Author(s)
  M. Sauer, J. Jiang, S. Reimer, K. Miyase, X. Wen, B. Becker, I. Polian
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Hiroshima, Japan
- Year and Date
  2016-11-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] On Optimal Power-Aware Path Sensitization2016
- Author(s)
  M. Sauer, J. Jiang, S. Reimer, K. Miyase, X. Wen, B. Becker, I. Polian
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Hiroshima, Japan
- Year and Date
  2016-11-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] SAT-Based Post-Processing for Regional Capture Power Reduction in At-Speed Scan Test Generation2016
- Author(s)
  S. Eggersgluess, K. Miyase, X. Wen
- Organizer
  IEEE European Test Symp.
- Place of Presentation
  Amsterdam, The Netherlands
- Year and Date
  2016-05-23
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation2016
- Author(s)
  F. Li, X. Wen, S. Holst, K. Miyase, S. Kajihara
- Organizer
  Int'l Symp. on Applied Engineering and Sciences
- Place of Presentation
  Kitakyushu, Japan
- Year and Date
  2016-12-17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Identification of High Power Consuming Areas with Gate Type and Logic Level Information2015
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  IEEE European Test Symp.
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K12003
[Presentation] Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch2015
- Author(s)
  K. Asada, X. Wen, S. Holst, K. Miyase, S. Kajihara, M. A. Kochte, E. Schneider, H.-J. Wunderlich, J. Qian
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Bombay, India
- Year and Date
  2015-11-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] レイアウトデータを用いたテスト時の高消費電力エリア特定手法に関する研究2015
- Author(s)
  宮瀬紘平, ザウアーマティアス, ベッカーベルンド, 温暁青, 梶原誠司
- Organizer
  ディペンダブルコンピューティング研究会
- Place of Presentation
  東京：機械振興会館
- Year and Date
  2015-06-16
- Data Source
  KAKENHI-PROJECT-25730031
[Presentation] Identification of High Power Consuming Areas with Gate Type and Logic Level Information2015
- Author(s)
  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
- Organizer
  European Test Symposium
- Place of Presentation
  ルーマニア
- Year and Date
  2015-05-28
- Data Source
  KAKENHI-PROJECT-25730031
[Presentation] A Soft-Error Tolerant TCAM Using Partial Don’t-Care Keys2015
- Author(s)
  I. Syafalni, T. Sasao, X. Wen, S. Holst, K. Miyase
- Organizer
  IEEE European Test Symp.
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-11-05
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Identification of High Power Consuming Areas with Gate Type and Logic Level Information2015
- Author(s)
  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
- Organizer
  European Test Symposium 2015
- Place of Presentation
  ルーマニア　クルージュ・ナポカ
- Year and Date
  2015-05-26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25730031
[Presentation] On Guaranteeing Capture Safety in At-Speed Scan Testing With Broadcast-Scan-Based Test Compression2013
- Author(s)
  K. Enokimoto, X. Wen, K. Miyase, J.-L. Huang, S. Kajihara, L.-T. Wang
- Organizer
  26th Intl. Conf. on VLSI Design
- Place of Presentation
  Pune, India
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Controllability Analysis of Local Switching Activity for Layout Design2013
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  Workshop on Design and Test Methodologies for Emerging Technologies
- Place of Presentation
  Avignon, France
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] Controllability Analysis of Local Switching Activity for Layout Design2013
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  Workshop on Design and Test Methodologies for Emerging Technologies
- Place of Presentation
  Avignon, France
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Controllability Analysis of Local Switching Activity for Layout Design2013
- Author(s)
  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
- Organizer
  South European Test Seminar 2013
- Place of Presentation
  オーストリア
- Year and Date
  2013-02-27
- Data Source
  KAKENHI-PROJECT-23700061
[Presentation] ロジック BIST のキャプチャ電力安全性に関する研究2013
- Author(s)
  冨田明宏, 温暁青, 宮瀬紘平, 梶原誠司
- Organizer
  第68回 FTC 研究会
- Place of Presentation
  秋田市
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Search Space Reduction for Low-Power Test Generation2013
- Author(s)
  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
- Organizer
  Asian Test Symposium
- Place of Presentation
  台湾
- Data Source
  KAKENHI-PROJECT-25730031
[Presentation] Search Space Reduction for Low-Power Test Generation2013
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Yilan, Taiwan
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] On Guaranteeing Capture Safety in At-Speed Scan Testing With Broadcast-Scan-Based Test Compression2013
- Author(s)
  K. Enokimoto, X. Wen, K. Miyase, J.-L. Huang, S. Kajihara, and L.-T. Wang
- Organizer
  Proc. 26th Intl. Conf. on VLSI Design
- Place of Presentation
  Pune, India
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Search Space Reduction for Low-Power Test Generation2013
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  IEEE Asian Test Symp.
- Place of Presentation
  Yilan, Taiwan
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] マルチサイクル BIST におけるスキャン出力の電力低減手法2012
- Author(s)
  王森レイ,佐藤康夫,梶原誠司,宮瀬紘平
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  福岡市
- Year and Date
  2012-11-28
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] New Test Partition Approach for Segmented Testing with Lower System Failure Rate2012
- Author(s)
  S.Wang, S.Kajihara, Y.Sato, K.Miyase, Xiaoqing Wen
- Organizer
  第66回FTC研究会
- Place of Presentation
  大分県ホテルソラージュ大分・日出
- Year and Date
  2012-01-19
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] ネットリストを用いたドントケアビット数の見積り手法に関する研究2012
- Author(s)
  宮瀬紘平, 梶原誠司, 温暁青
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  福岡市
- Year and Date
  2012-11-28
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] New Test Partition Approach for Rotating Test with Lower Rate2012
- Author(s)
  S.Wang, S.Kajihara, Y.Sato, K.Miyase, X.Wen
- Organizer
  FTC研究会
- Place of Presentation
  日本大分県
- Year and Date
  2012-01-19
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Estimation of the Amount of Don't-Care Bits in Test Vectors2012
- Author(s)
  K. Miyase, S. Kajihara, X. Wen
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Niigata, Japan
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] On Pinpoint Capture Power Management in At-Speed Scan Test Generation2012
- Author(s)
  X. Wen, Y. Nishida, K. Miyase, S. Kajihara, P. Girard, M. Tehranipoor, L.-T. Wang
- Organizer
  IEEE Int'l Test Conf.
- Place of Presentation
  Anaheim, USA
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] New Test Partition Approach for Segmented Testing with Lower System Failure Rate2012
- Author(s)
  Senling Wang, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen
- Organizer
  第66回 FTC 研究会
- Place of Presentation
  大分
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 実速度スキャンテストにおける高品質なキャプチャ安全性保障型テスト生成について2012
- Author(s)
  西田優一郎, 温暁青, 工藤雅幸, 宮瀬紘平, 梶原誠司
- Organizer
  FTC研究会
- Place of Presentation
  日本大分県
- Year and Date
  2012-01-21
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] A Novel Capture-Safety Checking Method for Multi-Clock Designs and Accuracy Evaluation with Delay Capture Circuits2012
- Author(s)
  K. Miyase, M. Aso, R. Ootsuka, X. Wen, H. Furukawa, Y. Yamato, K, Enokimoto, S. Kajihara
- Organizer
  IEEE VLSI Test Symp.
- Place of Presentation
  Hawaii, USA
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Estimation of the Amount of Don' t-Care Bits in Test Vectors2012
- Author(s)
  K. Miyase, S. Kajihara, and X. Wen
- Organizer
  Proc. IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Niigata, Japan
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] A Novel Capture-Safety Checking Method for Multi-Clock Designs and Accuracy Evaluation with Delay Capture Circuits2012
- Author(s)
  K. Miyase, M. Aso, R. Ootsuka, X. Wen, H. Furukawa, Y. Yamato, K, Enokimoto, and S. Kajihara
- Organizer
  Proc. IEEE VLSI Test Symp.
- Place of Presentation
  Hawaii, USA
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] パターンマージングによる遷移遅延故障用テストのパス遅延故障検出能力向上手法2011
- Author(s)
  田中広彬, 宮瀬紘平, 榎元和成, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告　vol. 111, no. 435, DC2011-78
- Place of Presentation
  東京
- Data Source
  KAKENHI-PROJECT-23700061
[Presentation] Additional Path Delay Fault Detection with Adaptive Test Data2011
- Author(s)
  Kohei Miyase, Hiroaki Tanaka, Kazunari Enokimoto, Xiaoqing Wen, Seiji Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  インド
- Year and Date
  2011-11-25
- Data Source
  KAKENHI-PROJECT-23700061
[Presentation] Additional Path Delay Fault Detection with Adaptive Test Data2011
- Author(s)
  K.Miyase, H.Tanaka, K.Enokimoto, X.Wen, S.Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Jaipur, India
- Year and Date
  2011-11-26
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing2011
- Author(s)
  F.Wu, L.Dilillo, A.Bosio, P.Girard, S.Pravossoudovitch, A.Virazel, M.Tehranipoor, K.Miyase, X.Wen, N.Ahmed
- Organizer
  6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
- Place of Presentation
  Athens, Grace
- Year and Date
  2011-04-06
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Mapping Test Power to Functional Power Through Smart X-Filling for LOS Scheme2011
- Author(s)
  F.Wu, L.Dilillo, A.Bosio, P.Girard, M.Tehranipoor, K.Miyase, X.Wen, N.Ahmed
- Organizer
  IEEE Intl.Workshop on Impact of Low-Power design on Test and Reliability
- Place of Presentation
  Trodheim, Norway
- Year and Date
  2011-05-27
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing2011
- Author(s)
  Y. Yamato, X. Wen, M. A. Kochte, K. Miyase, S. Ka j ihara, and L. -T. Wang
- Organizer
  Proc. IEEE Intl. Test Conf.
- Place of Presentation
  Anaheim, USA
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] SAT-based Capture-Power Reduction for At-Speed Broadcast-Scan-Based Test Compression Architectures2011
- Author(s)
  M.A.Kochte, K.Miyase, X.Wen, S.Kajihara, Y.Yamato, K.Enokimoto, H.-J.Wunderlich
- Organizer
  IEEE International Symposium on Low Power Electronics and Design
- Place of Presentation
  Fukuoka, Japan
- Year and Date
  2011-08-01
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Power-Aware Test Pattern Generation for At-Speed LOS Testing2011
- Author(s)
  A.Bosio, L.Dilillo, P.Girard, A.Todri, A.Virazel, K.Miyase, X.Wen
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  New Delhi, India
- Year and Date
  2011-11-23
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] 実速度テストに対する品質考慮ドントケア判定2011
- Author(s)
  河野潤, 宮瀬紘平, 榎元和成, 大和勇太, 温暁青, 梶原誠司
- Organizer
  第64回FTC研究会
- Place of Presentation
  岐阜県恵那市
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 実速度テストに対する品質考慮ドントケア判定2011
- Author(s)
  河野潤, 宮瀬紘平,榎元和成,大和勇太,温暁青, 梶原誠司
- Organizer
  第64回FTC研究会
- Place of Presentation
  恵那市
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] SAT-based Capture-Power Reduction for At-Speed Broadcast-Scan-Based Test Compression Architectures2011
- Author(s)
  M. A. Kochte, K. Miyase, X. Wen, S. Ka j ihara, Y. Yamato, K. Enokimoto, and H.-J. Wunderlich
- Organizer
  Proc. IEEE Intl. Symp. on Low Power Electronics and Design
- Place of Presentation
  Fukuoka, Japan
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Additional Path Delay Fault Detection with Adaptive Test Data2011
- Author(s)
  K. Miyase, H. Tanaka, K. Enokimoto, X. Wen, and S. Kajihara
- Organizer
  Proc. IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Jaipur, India
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Efficient BDD-based Fault Simulation in Presence of Unknown Values2011
- Author(s)
  M.A.Kochte, S.Rundu, K.Miyase, X.Wen, H.-J.Wunderlich
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  New Delhi, India
- Year and Date
  2011-11-23
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Effective Launch Power Reduction for Launch-Off-Shift Scheme with Adjacent-Probability-Based X-Filling2011
- Author(s)
  K. Miyase, U. Uchinodan, K. Enokimoto, Y. Yamato, X. Wen, S. Kajihara, F. Wu, L. Dilillo, A. Bosio, and P. Girard
- Organizer
  Proc. IEEE Asian Test Symp.
- Place of Presentation
  New Delhi, India
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] パターンマージングによる遷移遅延故障用テストのパス遅延故障検出能力向上手法2011
- Author(s)
  田中広彬、宮瀬紘平、榎元和成、温暁青、梶原誠司
- Organizer
  電子情報通信学会技術研究報告、Vol.111、No.435、DC2011-78
- Place of Presentation
  機械振興会館(東京)
- Year and Date
  2011-02-13
- Data Source
  KAKENHI-PROJECT-23700061
[Presentation] Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing2011
- Author(s)
  X.Wen, K.Enokimoto, K.Miyase, Y.Yamato, M.Kochte, S.Kajihara, P.Girard, M.Tehranipoor
- Organizer
  IEEE VLSI Test Symposium
- Place of Presentation
  Dana Point, USA
- Year and Date
  2011-05-03
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Effective Launch Power Reduction for Launch-Off-Shift Scheme with Adjacent-Probability-Based X-Filling2011
- Author(s)
  K.Miyase, U.Uchinodan, K.Enokimoto, Y.Yamato, X.Wen, S.Kajihara, F.Wu, L.Dilillo, A.Bosio, P.Girard
- Organizer
  IEEE Asian Test Symposium
- Place of Presentation
  New Delhi, India
- Year and Date
  2011-11-22
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing2011
- Author(s)
  X. Wen, K. Enokimoto, K. Miyase, Y. Yamato, M. Kochte, S. Ka j ihara, P. Girard, and M. Tehranipoor
- Organizer
  Proc. IEEE VLSI Test Symp.
- Place of Presentation
  Dana Point, USA
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] Efficient BDD-based Fault Simulation in Presence of Unknown Values2011
- Author(s)
  M. A. Kochte, S. Kundu, K. Miyase, X. Wen, and H. -J. Wunderlich
- Organizer
  Proc. IEEE Asian Test Symp.
- Place of Presentation
  New Delhi, India
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] 3値テストパターンに対する遅延テスト品質計算とX割当について2010
- Author(s)
  奥慎治, 梶原誠司, 佐藤康夫, 宮瀬紘平, 温暁青
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  東京都
- Year and Date
  2010-02-15
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] A Path Selection Method for Delay Test Targeting Transistor Aging2010
- Author(s)
  M.Noda, S.Kajihara, Y.Sato, K.Miyase, X.Wen, Y.Miura
- Organizer
  IEEE International Workshop on Reliability Aware System Design and Test
- Place of Presentation
  Bangalore, India
- Year and Date
  2010-01-08
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme2010
- Author(s)
  K.Miyase, F.Wu, L.Dilillo, A.Bosio, P.Girard, X.Wen, S.Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Shanghai, China
- Year and Date
  2010-12-06
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] A Path Selection Method for Delay Test Targeting Transistor Aging2010
- Author(s)
  Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura
- Organizer
  Digest of IEEE International Workshop on Reliability Aware System Design and Test
- Place of Presentation
  Bangalore, India
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 3 値テストパターンに対する遅延テスト品質計算と X 割当について2010
- Author(s)
  奥慎治, 梶原誠司, 佐藤康夫 ,宮瀬紘平, 温暁青
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  東京
- Year and Date
  2010-02-15
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Low-Capture-Power Post-Processing Test Vectors for Test Compression Using SAT Solver2010
- Author(s)
  K K.Miyase, M.A.Kochte, X.Wen, S.Kajihara, H.-J.Wunderlich
- Organizer
  IEEE Workshop on Defect and Date Driven Testing
- Place of Presentation
  Austin, USA
- Year and Date
  2010-11-05
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing2010
- Author(s)
  Y.Yamato, X.Wen, M.A.Kochte, K.Miyase, S.Kajihara, L.-T.Wang
- Organizer
  IEEE International Test Conference
- Place of Presentation
  Anaheim, USA
- Year and Date
  2010-09-21
- Data Source
  KAKENHI-PROJECT-22300017
[Presentation] 部分X分解によるX故障モデルを用いた故障診断手法の高速化2010
- Author(s)
  宮瀬紘平, 中村優介, 大和勇太, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  東京都
- Year and Date
  2010-02-15
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 部分X分解によるX故障モデルを用いた故障診断手法の高速化2010
- Author(s)
  宮瀬紘平, 中村優介, 大和勇太, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  東京
- Year and Date
  2010-02-15
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] フィールドテストにおける巡回テストとテスト集合印加順序について2010
- Author(s)
  広実一輝, 梶原誠司, 佐藤康夫, 宮瀬紘平, 温暁青
- Organizer
  第62回FTC研究会
- Place of Presentation
  岡山県総社市
- Year and Date
  2010-01-21
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] フィールドテストにおける巡回テストとテスト集合印加順序について2010
- Author(s)
  広実一輝, 梶原誠司, 佐藤康夫, 宮瀬紘平, 温暁青
- Organizer
  第62回FTC研究会
- Place of Presentation
  総社市
- Year and Date
  2010-01-21
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] X-Identification According to Required Distribution for Industrial Circuits2009
- Author(s)
  I.Beppu, K.Miyase, Y.Yamato, X.Wen
- Organizer
  IEEE Workshop on RTL and High Level Testing,
- Place of Presentation
  Hong Kong
- Year and Date
  2009-11-27
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] ブロードキャストスキャン圧縮環境下における実速度テストに対するIR-Drop削減Post-ATPG手法2009
- Author(s)
  宮瀬紘平, 大和勇太, 埜田健治, 伊藤秀昭, 畠山一実, 相京隆, 温暁青, 梶原誠司
- Organizer
  第61回FTC研究会
- Place of Presentation
  三重県多気郡大台町
- Year and Date
  2009-07-18
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 信号値遷移削減のためのドントケア判定率の最適化に関する研究2009
- Author(s)
  別府厳,宮瀬紘平,大和勇太,温暁青,梶原誠司
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  高知市
- Year and Date
  2009-10-04
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 劣化検知テストにおけるパス選択について2009
- Author(s)
  野田光政, 梶原誠司, 佐藤康夫, 宮瀬紘平, 温暁青, 三浦幸也
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  高知市
- Year and Date
  2009-12-05
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 信号値遷移削減のためのドントケア判定率の最適化に関する研究2009
- Author(s)
  別府厳, 宮瀬紘平, 大和勇太, 温暁青, 梶原誠司
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  高知市
- Year and Date
  2009-12-04
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] 劣化検知テストにおけるパス選択について2009
- Author(s)
  野田光政, 梶原誠司, 佐藤康夫, 宮瀬紘平, 温暁青, 三浦幸也
- Organizer
  電子情報通信学会技術研究報告
- Place of Presentation
  高知市
- Year and Date
  2009-10-05
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Optimizing the Percentage of X-Bits to Reduce Switching Activity2009
- Author(s)
  I.Beppu, K.Miyase, Y.Yamato, X.Wen, S.Kajihara
- Organizer
  IEEE International Workshop on Defect and Data Driven Testing
- Place of Presentation
  Austin, TX, USA
- Year and Date
  2009-11-06
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] ブロードキャストスキャン圧縮環境下における実速度テストに対する IR-Drop 削減Post-ATPG 手法2009
- Author(s)
  宮瀬紘平, (他7名)
- Organizer
  第61回FTC研究会
- Place of Presentation
  三重県大台町
- Year and Date
  2009-07-18
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] X-Identification According to Required Distribution for Industrial Circuits2009
- Author(s)
  Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara
- Organizer
  IEEE Workshop on RTL and High Level Testing
- Place of Presentation
  Hong, Kong
- Year and Date
  2009-10-27
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Optimizing the Percentage of X-Bits to Reduce Switching Activity2009
- Author(s)
  Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara
- Organizer
  IEEE International Workshop on Defect and Data Driven Testing
- Place of Presentation
  USA
- Year and Date
  2009-10-06
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Identification of High Power Consuming Areas with Gate Type and Logic Level Information
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-25 – 2015-05-29
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] A Soft-Error Tolerant TCAM Using Partial Don’t-Care Keys
- Author(s)
  I. Syafalni, T. Sasao, X. Wen, S. Holst, K. Miyase
- Organizer
  IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-25 – 2015-05-29
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] ネットリストを用いたドントケアビット数の見積り手法に関する研究
- Author(s)
  宮瀬紘平
- Organizer
  電子情報通信学会ディペンダブルコンピューティング研究会
- Place of Presentation
  福岡市
- Data Source
  KAKENHI-PROJECT-21300015
[Presentation] Identification of High Power Consuming Areas with Gate Type and Logic Level Information
- Author(s)
  K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara
- Organizer
  IEEE European Test Symposium
- Place of Presentation
  Cluj-Napoca, Romania
- Year and Date
  2015-05-25 – 2015-05-29
- Data Source
  KAKENHI-PROJECT-25280016
[Presentation] Soft-Error Tolerant TCAMs for High-Reliability Packet Classification
- Author(s)
  I. Syafalni, T. Sasao, X. Wen, S. Holst, K. Miyase
- Organizer
  IEEE Asia Pacific Conference on Circuits and Systems
- Place of Presentation
  Ishigaki Island, Japan
- Year and Date
  2014-11-17 – 2014-11-20
- Data Source
  KAKENHI-PROJECT-24650022
[Presentation] Controllability of Analysis of Local Switching Activity for Layout Design
- Author(s)
  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
- Organizer
  Workshop on Design and Test Methodologies for Emerging Technologies
- Place of Presentation
  フランス
- Data Source
  KAKENHI-PROJECT-25730031

1. KAJIHARA Seiji (80252592)

# of Collaborated Projects: 7 results

# of Collaborated Products: 89 results
2. WEN Xiaoqing (20250897)

# of Collaborated Projects: 7 results

# of Collaborated Products: 107 results
3. Holst Stefan (40710322)

# of Collaborated Projects: 4 results

# of Collaborated Products: 16 results
4. Tehranipoor M.

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. Girard P.

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. Tokui Masato (00227571)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
7. 小木曽一之 (20249808)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. KINOSHITA Kozo

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. AIKYO Takashi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. TAKAGI Noriaki

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. HAMADA Shuji

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. HADATE Koji

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. Saluja K. K.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. Keller B.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. Varma P.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. Chakravarty K.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. Wunderlich H.-J.

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
18. Wang L.-T.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. Jan M. E.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Miyase Kohei 宮瀬 紘平

MIYASE Kohei 宮瀬 紘平

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Efficient and Effective Power Analysis Techniques for Efficient SoC DesignPrincipal Investigator

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LSI Test and Diagnosis for Defects on Power Supply NetworkPrincipal Investigator

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Maximize the Efficiency of LSI DesignFlow with Advanced LSI Test MethodPrincipal Investigator

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Improvement of the quality and coverage for delay testing of high speed LSIPrincipal Investigator

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[Journal Article] Probability of Switching activity to Locate Hotspots in Logic Circuits2021

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[Journal Article] Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation2016

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Miyase Kohei 宮瀬紘平

MIYASE Kohei 宮瀬紘平