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Kim Youngwoo  Kim YoungWoo

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… Alternative Names

Kim YoungWoo  キム ヨンウ

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Researcher Number 30862403
Other IDs
Affiliation (Current) 2025: 奈良先端科学技術大学院大学, 先端科学技術研究科, 助教
Affiliation (based on the past Project Information) *help 2020 – 2022: 奈良先端科学技術大学院大学, 先端科学技術研究科, 助教
Review Section/Research Field
Principal Investigator
Basic Section 21010:Power engineering-related
Except Principal Investigator
Medium-sized Section 60:Information science, computer engineering, and related fields
Keywords
Principal Investigator
signal/power integrity / PIM / 3-D IC / simulator development / Hardware Security / EMI/EMI / Packaging / analytical modeling / non-linear noise / IEEE journal/conference … More / Modeling / Interposer / modeling / interposer / statistical approach / high-bandwidth memory / 回路シミュレーション / 信号と電力の完全性 / 半導体パッケージング … More
Except Principal Investigator
サイドチャネル攻撃 / 意図的電磁妨害 / 電磁的情報漏えい / ハードウェアセキュリティ / 暗号・認証など / 電磁放射 / 電磁波セキュリティ / 電磁環境 / 暗号・認証 / 環境電磁工学 / 電磁情報セキュリティ Less
  • Research Projects

    (4 results)
  • Research Products

    (28 results)
  • Co-Researchers

    (2 People)
  •  Development of a Fast Signal/Power Integrity Analysis Simulator for 3-Dimensional Integrated Circuits with Processing in Memory (PIM)Principal Investigator

    • Principal Investigator
      Kim YoungWoo
    • Project Period (FY)
      2022
    • Research Category
      Grant-in-Aid for Early-Career Scientists
    • Review Section
      Basic Section 21010:Power engineering-related
    • Research Institution
      Nara Institute of Science and Technology
  •  Acquiring Resistance against Threats of Information Leakage due to Intentional Electromagnetic Irradiation Exposure to Electronic Devices

    • Principal Investigator
      Hayashi Yuichi
    • Project Period (FY)
      2021 – 2022
    • Research Category
      Grant-in-Aid for Challenging Research (Exploratory)
    • Review Section
      Medium-sized Section 60:Information science, computer engineering, and related fields
    • Research Institution
      Nara Institute of Science and Technology
  •  Development of an Ultra-Fast Statistical Signal/Power Integrity Analysis Simulator for the High-speed Digital System DesignPrincipal Investigator

    • Principal Investigator
      Kim Youngwoo
    • Project Period (FY)
      2020 – 2022
    • Research Category
      Grant-in-Aid for Early-Career Scientists
    • Review Section
      Basic Section 21010:Power engineering-related
    • Research Institution
      Nara Institute of Science and Technology
  •  Advancing Device Design Techniques to Obfuscate the Measurement of Electromagnetic Information Leakage

    • Principal Investigator
      Hayashi Yuichi
    • Project Period (FY)
      2019 – 2022
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Review Section
      Medium-sized Section 60:Information science, computer engineering, and related fields
    • Research Institution
      Nara Institute of Science and Technology

All 2023 2022 2021 2020 2019

All Journal Article Presentation

  • [Journal Article] Evaluation of Statistical Fault Analysis Using Input Timing Violation of Sequential Circuit on Cryptographic Module Under IEMI2023

    • Author(s)
      Fujimoto Daisuke、Okamoto Takumi、Li Yang、Kim Youngwoo、Hayashi Yuichi
    • Journal Title

      IEEE Transactions on Electromagnetic Compatibility

      Volume: 65 Issue: 1 Pages: 51-57

    • DOI

      10.1109/temc.2022.3215583

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-19H01104, KAKENHI-PROJECT-21K19772
  • [Journal Article] Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distributions on PCBs2022

    • Author(s)
      Youngwoo Kim, Daisuke Fujimoto, Yuichi Hayashi
    • Journal Title

      IEEE Electromagnetic Compatibility Magazine

      Volume: 11(3) Pages: 84-92

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Journal Article] A Novel Remote Visualization of Screen Images Against High-Resolution Display With Divided Screens Focusing on the Difference of Transfer Function of Multiple Emanations2022

    • Author(s)
      Kitazawa Taiki、Arai Kimihiro、Kim Youngwoo、Fujimoto Daisuke、Hayashi Yuichi
    • Journal Title

      IEEE Transactions on Electromagnetic Compatibility

      Volume: 64 Issue: 6 Pages: 1941-1948

    • DOI

      10.1109/temc.2022.3204357

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Journal Article] Analysis of the PDN Induced Crosstalk Impacts on the High-Speed Signaling in Ultra- Thin and High Permittivity Substrates2022

    • Author(s)
      Kitazawa Taiki、Hayashi Yuichi、Fukawa Yoshi、Kim Yougwoo
    • Journal Title

      2022 International Symposium on Electromagnetic Compatibility EMC Europe

      Volume: 2022 Pages: 84-89

    • DOI

      10.1109/emceurope51680.2022.9900949

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Journal Article] Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs2022

    • Author(s)
      Kim Youngwoo、Fujimoto Daisuke、Hayashi Yuichi
    • Journal Title

      IEEE Electromagnetic Compatibility Magazine

      Volume: 11 Issue: 3 Pages: 84-92

    • DOI

      10.1109/memc.2022.9982569

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Journal Article] TEMPEST attack against high-resolution displays using differences in the transfer function of EM waves2022

    • Author(s)
      Kitazawa Taiki、Kitamura Yoshiki、Kim Yougwoo、Fujimoto Daisuke、Sone Hideaki、Hayashi Yuichi
    • Journal Title

      2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting

      Volume: 2022 Pages: 1-4

    • DOI

      10.23919/at-ap-rasc54737.2022.9814293

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K19772
  • [Journal Article] Micromachines2022

    • Author(s)
      Youngwoo Kim
    • Journal Title

      Design of Power/Ground Noise Suppression Structures Based on a Dispersion Analysis for Packages and Interposers with Low-Loss Substrates

      Volume: 13(9) Pages: 1-19

    • Peer Reviewed / Open Access / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Journal Article] Measurement and Analysis of Electromagnetic Information Leakage From Printed Circuit Board Power Delivery Network of Cryptographic Devices2021

    • Author(s)
      Wada Shinpei、Hayashi Yuichi、Fujimoto Daisuke、Homma Naofumi、Kim Youngwoo
    • Journal Title

      IEEE Transactions on Electromagnetic Compatibility

      Volume: 2021 Issue: 5 Pages: 1-11

    • DOI

      10.1109/temc.2021.3062417

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19H01104, KAKENHI-PROJECT-20K14719
  • [Journal Article] A Fundamental Evaluation of EM Information Leakage Induced by IEMI for a Device with Differential Signaling2021

    • Author(s)
      Kaji Shugo、Fujimoto Daisuke、Kim Youngwoo、Hayashi Yuichi
    • Journal Title

      2021Asia-Pacific International Symposium on Electromagnetic Compatibility

      Volume: 2021 Pages: 1-4

    • DOI

      10.1109/apemc49932.2021.9597081

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Journal Article] Wideband Power/Ground Noise Suppression in Low-Loss Glass Interposers Using a Double-Sided Electromagnetic Bandgap Structure2020

    • Author(s)
      Youngwoo Kim, Gapyeol Park, Kyungjun Cho, Pulugurtha Markondeya Raj, Rao R. Tummala, and Joungho Kim
    • Journal Title

      IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

      Volume: 68 Issue: 12 Pages: 5055-5064

    • DOI

      10.1109/tmtt.2020.3022009

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Journal Article] Statistical Eye-Diagram Estimation Method Considering Power/Ground Noise Induced by Simultaneous Switching Output (SSO) Buffers2020

    • Author(s)
      Youngwoo Kim , Daisuke Fujimoto, Shugo Kaji, Shinpei Wada, HyunwookPark, Daehwan Lho, Joungho Kim, and Yuichi Hayashi
    • Journal Title

      IEEE Transactions on Electromagnetic Compatibility

      Volume: 2020 Issue: 6 Pages: 1-11

    • DOI

      10.1109/temc.2020.2975202

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19H01104, KAKENHI-PROJECT-20K14719
  • [Journal Article] Statistical Analysis and Modeling of a High Bandwidth Memory (HBM) Interposer Channel2020

    • Author(s)
      Youngwoo Kim
    • Journal Title

      2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

      Volume: 62 Pages: 2-2

    • DOI

      10.1109/nemo49486.2020.9343617

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Journal Article] Statistical Analysis of Simultaneous Switching Output (SSO) Impacts on Steady State Output Responses and Signal Integrity2019

    • Author(s)
      Young Woo Kim, Daisuke Fujimoto, Hikaru Nishiyama, Daehwan Lho, Hyunwook Park, Joungho Kim and Yuichi Hayashi
    • Journal Title

      2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

      Volume: 2019 Pages: 138-140

    • DOI

      10.1109/emccompo.2019.8919652

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Presentation] How to Design Secured Power Delivery Network of Cryptographic Devices: Challenges, Evaluation Methods, and Solutions2023

    • Author(s)
      Youngwoo Kim
    • Organizer
      DesignCon 2023
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] How to Design Secured Power Delivery Network of Cryptographic Devices: Challenges, Evaluation Methods, and Solutions2023

    • Author(s)
      Youngwoo Kim
    • Organizer
      DesignCon 2023
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22K14241
  • [Presentation] Analysis of the PDN Induced Crosstalk Impacts on the High-speed Signaling in Ultra-thin and High Permittivity Substrates2022

    • Author(s)
      Taiki Kitazawa, Yuichi Hayashi, Yoshi Fukawa, Youngwoo Kim
    • Organizer
      EMC Europe
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22K14241
  • [Presentation] Interposer Channel Design based on Statistical Signal/Power Integrity Co-analysis2022

    • Author(s)
      Youngwoo Kim
    • Organizer
      APEMC
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22K14241
  • [Presentation] 薄膜高誘電率基板を用いた低インピーダンスPDNによるクロストーク抑制効果の解析2022

    • Author(s)
      北澤太基, キムヨンウ, 藤本大介, 林優一
    • Organizer
      電子情報通信学会 環境電磁工学研究会
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Presentation] 暗号機器のプリント基板上の電源供給ネットワークにおける電磁的情報漏えい抑制に関する基礎検討2022

    • Author(s)
      和田慎平, 藤本大介, 林優一, キムヨンウ
    • Organizer
      電子情報通信学会 環境電磁工学研究会
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Presentation] Analysis of Filtering Window Impacts on Estimation Accuracy of Information Leakage from Exposed Power Delivery Network of Cryptographic Devices2022

    • Author(s)
      Youngwoo Kim, Shinpei Wada, Daisuke Fujimoto, and Yuichi Hayashi
    • Organizer
      EMC Compo
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-22K14241
  • [Presentation] Analysis of HDMI 2.1 Mated Connector Contact Boundary Impedance Impacts on a High-speed Digital System Performance2021

    • Author(s)
      Youngwoo Kim, Daisuke Fujimoto, and Yu-ichi Hayashi
    • Organizer
      30th International Conference on Electrical Contacts
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] 接触境界の表面粗さとトルク値がコネクタ高周波特性に与える影響に関する基礎検討2021

    • Author(s)
      上田浩行, 鍛治秀伍, 藤本大介, キムヨンウ, 林優一
    • Organizer
      電子情報通信学会・機構デバイス研究会
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Presentation] Feasibility Analysis of Over 20 Gb/s HDMI Signaling using Passive Connector and Cable Assembly2021

    • Author(s)
      Youngwoo Kim
    • Organizer
      IEEE The 13th Global Symposium on Millimeter-Waves & THz (GSMM)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] Analysis of Electromagnetic Information Leakage from Overdesigned Power Delivery Network of Cryptographic Devices2021

    • Author(s)
      Youngwoo Kim, Shinpei Wada, Daisuke Fujimoto, and Yuichi Hayashi
    • Organizer
      2021 Asia Pacific International Symposium on Electromagnetic Compatibility
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] Analysis of HDMI Mated Con- nector Electrical Performance Impacts on a Signal Integrity of the High-speed Digital System2020

    • Author(s)
      Youngwoo Kim
    • Organizer
      電子情報通信学会 2020-EMD-0010
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] Statistical Analysis and Modeling of a High Bandwidth Memory (HBM) Interposer Channel2020

    • Author(s)
      Youngwoo Kim
    • Organizer
      2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-20K14719
  • [Presentation] Statistical Signal/Power Integrity Analysis of High-BandwidthMemory (HBM) Interposer Channel considering SSO Noise and Data Coding2020

    • Author(s)
      Youngwoo Kim , Yu-ichi Hayashi, Fujimoto Daisuke, Hyunwook Park,and Joungho Kim
    • Organizer
      DesignCon 2020
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19H01104
  • [Presentation] 製造メーカの異なるコネクタの相互接続時に生ずる接触境界部の高周波特性の基礎評価2020

    • Author(s)
      上田浩行, 藤本大介, キム・ヨンウ, 北澤太基, 春日貴志, 林優一
    • Organizer
      電気情報通信学会ソサイエティ大会
    • Data Source
      KAKENHI-PROJECT-19H01104
  • 1.  Hayashi Yuichi (60551918)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 14 results
  • 2.  藤本 大介 (60732336)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 13 results

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