SEKI Setsuko 関節子

Researcher Number	40196944
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2002 – 2004: 拓殖大学, 工学部, 教授
Review Section/Research Field	Principal Investigator 表面界面物性
Keywords	Principal Investigator SIMS / ion implantation / focused ion beam / beveling method / liquid metal ion source / secondary ion image / LMIS / FIB / 政府二次イオン同時検出 / イオン注入 … More / 集束イオンビーム / 傾斜研磨 / 液体金属イオン源 / 二次イオン像 / 正負二次イオン同時検出 Less

Research Projects
(1 results)
Research Products
(9 results)

Simultaneous detection of positive and negative scanning ion images using a focused ion beamPrincipal Investigator
- Principal Investigator
  
  SEKI Setsuko
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  Takushoku University

All 2004 2003

All Journal Article

[Journal Article] Development of an instrument for simultaneous detection of positive and negative scanning ion images2004
- Author(s)
  S.Seki, H.Tamura, T.Kanoh, T.Satoh
- Journal Title
  
  Appl.Surf.Sci. vol.231-232
  
  Pages: 231-232
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Development of an instrument for simultaneous deterction of possitive and negative scanning in images2004
- Author(s)
  S.Seki, H.Tamura, T.Kanoh, A.Satoh
- Journal Title
  
  Appl.Surf.Sci. 231-232
  
  Pages: 976-980
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Development of an instrument for simultaneous detection of positive and negative scanning ion images2004
- Author(s)
  S.Seki, H.Tamura, T.Kanoh, T.Satoh
- Journal Title
  
  Appl.Surf.Sci. 231-232
  
  Pages: 976-980
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] SIMSの深さ方向分析測定における最近の動向2004
- Author(s)
  関節子, 田村一二三
- Journal Title
  
  拓殖大学理工学研究報告 9
  
  Pages: 15-20
- NAID
  110004686098
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Enhanced scanning ion microprobe image analysis for rough surface sample as an alternative to SIMS depth profiling2004
- Author(s)
  S.Seki, H.Tamura, S.Horita, N.Ito
- Journal Title
  
  Surf.Interface Anal. vol.36
  
  Pages: 896-899
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Enhanced scanning ion microprobe image analysis for rough surface sample as an alternative to SIMS depth profiling2004
- Author(s)
  S.Seki, H.Tamura, S.Horita, N.Ito
- Journal Title
  
  Surf.Interface Anal. 36
  
  Pages: 896-899
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Recent trend in the depth profile analysis of SIMS2004
- Author(s)
  S.Seki, H.Tamura
- Journal Title
  
  Bulletin of Science and Engineering Takushoku University vol.9
  
  Pages: 15-20
- NAID
  110004686098
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Ion image using in-situ implantation of Cs+ and O2+ ions2003
- Author(s)
  S.Seki, H.Tamura, W.Saitoh
- Journal Title
  
  Appl.Surf.Sci. 203-204
  
  Pages: 832-835
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14550028
[Journal Article] Ion image using in-situ Implantation of Cs^+ and O_2^+ ions2003
- Author(s)
  S.Seki, H.Tamura, W.Saitoh
- Journal Title
  
  Appl.Surf.Sci. vol.203-204
  
  Pages: 832-835
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14550028

SEKI Setsuko 関 節子

Research Projects

Research Products

Simultaneous detection of positive and negative scanning ion images using a focused ion beamPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Development of an instrument for simultaneous detection of positive and negative scanning ion images2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] Development of an instrument for simultaneous deterction of possitive and negative scanning in images2004

Author(s)

Journal Title

Data Source

[Journal Article] Development of an instrument for simultaneous detection of positive and negative scanning ion images2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] SIMSの深さ方向分析測定における最近の動向2004

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] Enhanced scanning ion microprobe image analysis for rough surface sample as an alternative to SIMS depth profiling2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] Enhanced scanning ion microprobe image analysis for rough surface sample as an alternative to SIMS depth profiling2004

Author(s)

Journal Title

Description

Data Source

[Journal Article] Recent trend in the depth profile analysis of SIMS2004

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] Ion image using in-situ implantation of Cs+ and O2+ ions2003

Author(s)

Journal Title

Description

Data Source

[Journal Article] Ion image using in-situ Implantation of Cs^+ and O_2^+ ions2003

Author(s)

Journal Title

Description

Data Source

SEKI Setsuko 関節子