Yamasaki Jun 山崎順

… Alternative Names

山崎順ヤマサキジユン

YAMASAKI Jun 山崎順

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Researcher Number	40335071
Other IDs
External Links
Affiliation (Current)	2025: 大阪大学, 超高圧電子顕微鏡センター, 教授
Affiliation (based on the past Project Information) *help	2021 – 2023: 大阪大学, 超高圧電子顕微鏡センター, 教授 2014 – 2020: 大阪大学, 超高圧電子顕微鏡センター, 准教授 2014: 大阪大学, 学内共同利用施設等, 准教授 2007 – 2012: Nagoya University, EcoTopia Science Institute, Assistant professor 2006: 名古屋大学, エコトビア科学研究所, 助手 … More 2005 – 2006: 名古屋大学, エコトピア科学研究所, 助手 2004: 名古屋大学, エコトピア化学研究機構, 助手 2004: 名古屋大学, エコトピア科学研究機構, 助手 2002 – 2003: 名古屋大学, 理工科学総合研究センター, 助手 Less
Review Section/Research Field	Principal Investigator Thin film/Surface and interfacial physical properties / Thin film/Surface and interfacial physical properties / Applied materials science/Crystal engineering / Medium-sized Section 29:Applied condensed matter physics and related fields / Basic Section 29020:Thin film/surface and interfacial physical properties-related / Nanomaterials engineering / Science and Engineering Except Principal Investigator Nanostructural science / Inorganic materials/Physical properties / Science and Engineering / Science and Engineering / Thin film/Surface and interfacial physical properties
Keywords	Principal Investigator 電子顕微鏡 / 電子線 / 回折顕微法 / 小角散乱 / 位相イメージング / 制限視野回折 / 単原子 / 電子回折 / ナノ粒子 / 収差補正TEM … More / 積層欠陥 / パルス電子ビーム / 電子線偏向 / 局在光 / 電子線透過率 / 透過率減衰 / 非線形強度減衰 / 多重散乱 / 密度定量 / 電子線トモグラフィー / ナノ構造 / 深さ分解能 / 三次元計測 / 動画計測 / 結晶格子縞 / 焦点位置スキャン / 三次元観察 / 非整合エピタキシャル界面 / 三次元分布 / 金属ナノ粒子 / 格子縞コントラスト / 正焦点 / 収差補正電子顕微鏡 / ナノ電磁場 / 原子分解能 / 電子回折顕微法 / 収差補正透過電子顕微鏡 / 3C-SiC/Si界面 / 界面ステップ / ミスフィット転位 / 第一原理計算 / 偽像処理 / 収差補正透過型電子顕微鏡 / 界面構造解析 / 3C-SiC/Si(001)界面 / サブオングストローム分解能 / アモルファス / 白金 / 拡散 / アンチモン / ドーパント / シリコン / 収差補正STEM / 球面収差補正 / パターソン関数 / 中距離範囲秩序 / 制限視野電子回折 / 金属ガラス / 自己拡散 / 点欠陥 / 面欠陥 / Si(100) / Ti / HRTEM / EELS / 原子直視観察 / Ge偏析 / HAADF-STEM / SiGe … More Except Principal Investigator TEM / STEM / ナノ構造 / 電子顕微鏡 / Interface, Surface / Nanostracture / Cs-corrected TEM / Structural fluctuation / 半導体界面 / ナノEELS / ナノ電子回折 / 球面収差補正 / 準結晶 / 炭素ナノチューブ / ナノ制限視野回折 / 高分解能観察 / 球面収差補正 TEM / 界面・表面 / 収差補正電子顕微鏡 / 構造ゆらぎ / Atomistic observation / Milli-second / Hydrogen-absorption / Time-resolved / ランタンニッケル / パラジウム / 水素放出 / 時間分解TEM / 原子直視 / ミリセカンド / 水素吸蔵 / 時間分解型観察 / 電子回折イメージング / ナノイメージング / 電子回折 / ナノ構造体 / 単原子 / グラフェン / イメージング / 酸化物半導体 / 界面 / 薄膜 / その場観察 / チタニアナノロッド / チタニア粉末 / EELS / 光化学反応 / 透過電子顕微鏡 / 光触媒 / 酸化状態 / 原子直視観察 / Si界面 / SiO_2 / 収差補正 Less

Visualization of submicron localized light using electron beamsPrincipal Investigator
- Principal Investigator
  
  Yamasaki Jun
- Project Period (FY)
  2022 – 2023
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 29:Applied condensed matter physics and related fields
- Research Institution
  Osaka University
Developing the electron tomography for correct reconstructions of three-dimensional shape and density of materials based on elucidation of the multiple scattering phenomenon of electron beamsPrincipal Investigator
- Principal Investigator
  
  Yamasaki Jun
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 29020:Thin film/surface and interfacial physical properties-related
- Research Institution
  Osaka University
Developing three-dimensional measurement method for nano- and atomistic structures using focal series of aberration-corrected transmission electron microscopy imagesPrincipal Investigator
- Principal Investigator
  
  Yamasaki Jun
- Project Period (FY)
  2016 – 2017
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Nano-Structure 3D Atomic Imaging using Electron Diffraction
- Principal Investigator
  
  GOHARA Kazutoshi
- Project Period (FY)
  2014 – 2018
- Research Category
  
  Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
- Review Section
  
  Science and Engineering
- Research Institution
  Hokkaido University
Development of electron diffractive imaging for phase observations from the atomic level to micron scalePrincipal Investigator
- Principal Investigator
  
  Yamasaki Jun
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Quantitative visualization of nanometer-scaled electromagnetic fields by a novel phase-imaging method based on small-angle electron scattering patternsPrincipal Investigator
- Principal Investigator
  
  Yamasaki Jun
- Project Period (FY)
  2014 – 2015
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Nanomaterials engineering
- Research Institution
  Osaka University
Three-dimensional analysis of atomic arrangements in cubic SiC/Si interfaces by aberration-corrected TEM and ab initio calculationsPrincipal Investigator
- Principal Investigator
  
  YAMASAKI Jun
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Nagoya University
Implementation of sub-A resolution by a new imaging method based on electron diffraction patterns and towards its application for materials sciencePrincipal Investigator
- Principal Investigator
  
  YAMASAKI Jun
- Project Period (FY)
  2009 – 2010
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Nagoya University
収差補正STEMによるシリコン中ドーパント拡散及びクラスタリングの単原子直視研究Principal Investigator
- Principal Investigator
  
  山崎順
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Nagoya University
金属ガラスの局所原子構造の球面収差補正電子顕微鏡による研究Principal Investigator
- Principal Investigator
  
  山崎順
- Project Period (FY)
  2006 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Nagoya University
高空間分解能光化学反応その場観察装置による酸化チタンの触媒反応界面の動的観察
- Principal Investigator
  
  田中信夫
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Nagoya University
Study of structural fluctuation of nanomaterials by Cs-corrected electron lenses
- Principal Investigator
  
  TANAKA Nobuo
- Project Period (FY)
  2005 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Nanostructural science
- Research Institution
  Nagoya University
無球面収差結像TEMによるSiO_2/Si界面の酸化状態の原子直視的研究
- Principal Investigator
  
  TANAKA NOBUO
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Nagoya University
原子直視観察HAADF-STEM法によるSiGe中の自己拡散と点欠陥反応の研究Principal Investigator
- Principal Investigator
  
  山崎順
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Nagoya University
Milli-second time-resolved HRTEM of absorption / desorption of hydrogen
- Principal Investigator
  
  TANAKA Nobuo
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Inorganic materials/Physical properties
- Research Institution
  Nagoya University

[Book] Chapter 4, Surface/Interface holography, 3D Local Structure and Functionality Design of Materials2019
- Author(s)
  K.Gohara, J.Yamasaki and H.Shioya
- Total Pages
  209
- Publisher
  World Scientific Publishing
- ISBN
  9789813273665
- Data Source
  KAKENHI-PLANNED-26105009
[Journal Article] Ultrafast dynamics of a photoinduced phase transition in single-crystal trititanium pentoxide2023
- Author(s)
  Shuhei Hatanaka, Taro Tsuchiya, Shuhei Ichikawa, Jun Yamasaki, Kazuhisa Sato
- Journal Title
  
  Applied Physics Letters
  
  Volume: 123 Issue: 24 Pages: 241902-241902
- DOI
  10.1063/5.0175450
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22K18974, KAKENHI-PROJECT-21H01764
[Journal Article] Quasi-static 3D structure of graphene ripple measured using aberration-corrected TEM2021
- Author(s)
  Segawa Yuhiro、Yamazaki Kenji、Yamasaki Jun、Gohara Kazutoshi
- Journal Title
  
  Nanoscale
  
  Volume: 13 Issue: 11 Pages: 5847-5856
- DOI
  10.1039/d1nr00237f
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19H02600, KAKENHI-PROJECT-19K15439
[Journal Article] Progress in environmental high-voltage transmission electron microscopy for nanomaterials2020
- Author(s)
  Tanaka Nobuo、Fujita Takeshi、Takahashi Yoshimasa、Yamasaki Jun、Murata Kazuyoshi、Arai Shigeo
- Journal Title
  
  Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
  
  Volume: 378 Issue: 2186 Pages: 20190602-20190602
- DOI
  10.1098/rsta.2019.0602
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H02293, KAKENHI-PROJECT-19H02600
[Journal Article] Empirical determination of transmission attenuation curves in mass-hickness contrast TEM imaging2019
- Author(s)
  Yamasaki Jun、Ubata Yuya、Yasuda Hidehiro
- Journal Title
  
  Ultramicroscopy
  
  Volume: 200 Pages: 20-27
- DOI
  10.1016/j.ultramic.2019.02.005
- Peer Reviewed
- Data Source
  KAKENHI-ORGANIZER-26105001, KAKENHI-PLANNED-26105009, KAKENHI-INTERNATIONAL-15K21719
[Journal Article] Precise method for measuring spatial coherence in TEM beams using Airy diffraction pattern2018
- Author(s)
  J. Yamasaki, Y. Shimaoka, H. Sasaki
- Journal Title
  
  Microscopy
  
  Volume: 67 Issue: 1 Pages: 1-10
- DOI
  10.1093/jmicro/dfx093
- Peer Reviewed
- Data Source
  KAKENHI-PLANNED-26105009, KAKENHI-ORGANIZER-26105001, KAKENHI-INTERNATIONAL-15K21719
[Journal Article] Design of Core-Pd/Shell-Ag Nanocomposite Catalyst for Selective Semihydrogenation of Alkynes2016
- Author(s)
  1.T. Mitsudome, T. Urayama, K. Yamazaki, Y. Maehara, J. Yamasaki, K. Gohara, Z. Maeno, T. Mizugaki, K. Jitsukawa, and K. Kaneda
- Journal Title
  
  ACS Catalysis
  
  Volume: 6 Issue: 2 Pages: 666-670
- DOI
  10.1021/acscatal.5b02518
- Peer Reviewed / Acknowledgement Compliant / Open Access / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17462, KAKENHI-INTERNATIONAL-15K21719, KAKENHI-ORGANIZER-26105001, KAKENHI-PLANNED-26105003, KAKENHI-PROJECT-24246129, KAKENHI-PROJECT-26630410, KAKENHI-PROJECT-26289303, KAKENHI-PLANNED-26105009
[Journal Article] Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM2015
- Author(s)
  J. Yamasaki, M. Mori, Masayuki, A. Hirata, Y. Hirotsu, N. Tanaka
- Journal Title
  
  Ultramicroscopy
  
  Volume: 151 Pages: 224-231
- DOI
  10.1016/j.ultramic.2014.11.005
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24360260, KAKENHI-PROJECT-24656400, KAKENHI-PLANNED-26105009, KAKENHI-PROJECT-26286049, KAKENHI-PROJECT-26310205
[Journal Article] 収差補正TEM像における高さ分解能と三次元ナノ構造情報の検出2014
- Author(s)
  山崎　順
- Journal Title
  
  顕微鏡
  
  Volume: 49 Pages: 216-221
- NAID
  130007701743
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286049
[Journal Article] Polytype Transformation by Replication of Stacking Faults Formed by Two-Dimensional Nucleation on Spiral Steps during SiC Solution Growth2012
- Author(s)
  S. Harada, Alexander, K. Seki, Y.Yamamoto, C. Zhu, Y. Yamamoto, S. Arai, J. Yamasaki, N. Tanaka, and T. Ujihara
- Journal Title
  
  Crystal Growth & Design
  
  Volume: 12 Pages: 3209-3214
- URL
  http://dx.doi.org/10.1021/cg300360h
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23760030
[Journal Article] Atomistic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(001) interface by aberration-corrected transmission electron microscopy2012
- Author(s)
  J. Yamasaki, S. Inamoto, Y. Nomura, H. Tamaki, and N. Tanaka
- Journal Title
  
  Journal of Physics D: Applied Physics
  
  Volume: 45 Issue: 49 Pages: 494002-494002
- DOI
  10.1088/0022-3727/45/49/494002
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23760030
[Journal Article] Atomic arrangement at the 3C-SiC/Si(001) interface revealed utilizing aberration-corrected transmission electron microscope2011
- Author(s)
  S. Inamoto, J. Yamasaki, H. Tamaki, and N. Tanaka
- Journal Title
  
  Philosophical Magazine Letters
  
  Volume: 91 Issue: 9 Pages: 632-639
- DOI
  10.1080/09500839.2011.600730
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23760030
[Journal Article] Atomic arrangement at the 3C-SiC/Si(001) interface revealed utilising aberration-corrected transmission electron microscope2011
- Author(s)
  S. Inamoto, J. Yamasaki, H. Tamaki, and N. Tanaka
- Journal Title
  
  Philosophical Magazine Letters
  
  Volume: 91 Pages: 632-639
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23760030
[Journal Article] Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture2011
- Author(s)
  S.Morishita, J.Yamasaki, N.Tanaka
- Journal Title
  
  Journal of Electron Microscopy 60(2)
  
  Pages: 101-108
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21760026
[Journal Article] Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture2011
- Author(s)
  S.Morishita, J.Yamasaki, N.Tanaka
- Journal Title
  
  Journal of Electron Microscopy
  
  Volume: 60(2) Pages: 101-108
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21760026
[Journal Article] 回折顕微法による原子配列構造の可視化-制限視野回折図形からのSiダンベル構造再生-2009
- Author(s)
  山崎順、田中信夫、森下茂幸
- Journal Title
  
  まてりあ特集「顕微鏡法による材料開発のための微細構造研究最前線(9)」 48(12)
  
  Pages: 604-604
- NAID
  10026268055
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21760026
[Journal Article] 回折顕微法による原子配列構造の可視化 -制限視野回折図形からのSiダンベル構造再生-2009
- Author(s)
  山崎順、田中信夫、森下茂幸
- Journal Title
  
  まてりあ 48巻12号
  
  Pages: 604-604
- NAID
  10026268055
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21760026
[Journal Article] A practical solution for ehminating artificial image contrast in aberration-corrected TEM2008
- Author(s)
  Jun Yamasaki
- Journal Title
  
  Microscopy and Microanalysis 14(1)
  
  Pages: 27-35
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18029011
[Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007
- Author(s)
  Hirahara, K., Yamasaki, J., Saitoh, K., Tanaka, N
- Journal Title
  
  Microscopy and Microanalysis 890CD-891CD
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007
- Author(s)
  Hirahara, K., Yamasaki, J., Saitoh, K. and Tanaka, N
- Journal Title
  
  Microscopy and Microanalysis
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2007
- Author(s)
  J. Yamasaki, T. Kawai, N. Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54
  
  Pages: 209-214
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2007
- Author(s)
  J. Yamasaki, H. Sawada, N. Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54
  
  Pages: 123-126
- NAID
  10016683055
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007
- Author(s)
  Hirahara, K., Yamasaki, J., Saitoh, K. and Tanaka N
- Journal Title
  
  Microscopy and Microanalysis
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM2006
- Author(s)
  Kaori Hirahara, Koh Saitoh, Jun Yamasaki, and Nobuo Tanaka
- Journal Title
  
  NANO LETTERS Vol.6, No.8
  
  Pages: 1778-1783
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM2006
- Author(s)
  Kaori Hirahara, Koh Saitoh, Jun Yamasaki, Nobuo Tanaka
- Journal Title
  
  NANO LETTERS Vol.6,No.8
  
  Pages: 1778-1783
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM2006
- Author(s)
  Kaori, Hirahara, Koh, Saitoh, Jun, Yamasaki, Nobuo, Tanaka
- Journal Title
  
  NANO LETTERS 6
  
  Pages: 1778-1783
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2005
- Author(s)
  J.Yamasaki, T.Kawai, N.Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54・3
  
  Pages: 209-214
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005
- Author(s)
  J. Yamasaki, H. Sawada, and N. Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54・2
  
  Pages: 123-126
- NAID
  10016683055
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2005
- Author(s)
  J. Yamasaki, T. Kawai, and N. Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54・3
  
  Pages: 209-214
- Description
  「研究成果報告書概要(和文)」より
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005
- Author(s)
  J.Yamasaki, H.Sawada, N.Tanaka
- Journal Title
  
  J. Electron Microsc. 52
  
  Pages: 123-126
- NAID
  10016683055
- Data Source
  KAKENHI-PROJECT-17029030
[Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005
- Author(s)
  J.Yamasaki, H.Sawada, N.Tanaka
- Journal Title
  
  Journal of Electron Microscopy 54・2
  
  Pages: 123-126
- NAID
  10016683055
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] First observation of In_xGa_<1-x>As quantum dots in GaP by spherical aberration corrected HRTEM2004
- Author(s)
  N.Tanaka, J.Yamasaki, S.Fuchi, Y.Takeda
- Journal Title
  
  Microscopy and Microanal 10
  
  Pages: 139-139
- Data Source
  KAKENHI-PROJECT-15656010
[Journal Article] Direct observation of staking fault in Si-Ge semiconductors by Cs-corrected TEM and ADF-STEM2004
- Author(s)
  J.Yamasaki, T.Kawai, N.Tanaka
- Journal Title
  
  J.Electron Microscopy 53
  
  Pages: 129-129
- Data Source
  KAKENHI-PROJECT-15656010
[Journal Article] Direct observation of a stacking fault in Si_<1-x>Ge_x semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM2004
- Author(s)
  J.Yamasaki, T.Kawai, N.Tanaka
- Journal Title
  
  Journal of Electron Microscopy 53
  
  Pages: 129-135
- NAID
  10012932545
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] Three-dimensional Analysis of Platinum Super-Crystals by TEM and HAADF-STEM Observations2004
- Author(s)
  J.Yamasaki, N.Tanaka, N.baba, H.kaibayashi, O.Terasaki
- Journal Title
  
  Philosophical Magazine 84
  
  Pages: 2819-2828
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] First observation of SiO_2/Si(100) by spherical aberration corrected HRTEM2003
- Author(s)
  N.Tanaka, J.Yamasaki, K.Usuda, N.Ikarashi
- Journal Title
  
  J.Electron Microscopy 52.1
  
  Pages: 69-69
- Data Source
  KAKENHI-PROJECT-15656010
[Journal Article] HRTEM and EELS analysis of interfacial nanostructures in Ti/Si_<1-x>Ge_x/Si(100)2003
- Author(s)
  J.Yamasaki, N.Tanaka, O.Nakatsuka, A.Sakai, S.Zaima, Y.Yasuda
- Journal Title
  
  Proceedings of the 2003 International Conference on Solid State Devices and Materialas
  
  Pages: 86-87
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co-Al-O alloys2003
- Author(s)
  N.Tanaka, J.Yamasaki, S.Mitani, K.Takanashi
- Journal Title
  
  Scripta Materialia 48
  
  Pages: 909-914
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] First Observation of InGaAs Quantum Dots in GaP by Sperical Aberration-corrected HRTEM in comparison with ADF-STEM and Conventional HRTEM2003
- Author(s)
  N.Tanaka, J.Yamasaki, S.Fuchi, Y.Takeda
- Journal Title
  
  Microscopy and Microanalysis 10
  
  Pages: 139-145
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] 半導体/金属界面ナノ構造のHRTEM/EELS複合解析2003
- Author(s)
  山崎順, 田中信夫
- Journal Title
  
  名古屋大学電子光学研究のあゆみ 19
  
  Pages: 4-9
- Data Source
  KAKENHI-PROJECT-15760005
[Journal Article] 球面収差補正TEM法の材料研究への応用
- Author(s)
  山崎順, 田中信夫
- Journal Title
  
  特集 : 収差補正技術を用いた応用研究最前線
- NAID
  10018130997
- Data Source
  KAKENHI-PROJECT-17201022
[Journal Article] Oxygen release and structural changes in TiO_2 films during photocatalytic oxidation.
- Author(s)
  K.Yoshida, T.Nanbara, J.Yamasaki, N.Tanaka
- Journal Title
  
  J.Appl.Phys. (In print)
- Data Source
  KAKENHI-PROJECT-17029030
[Journal Article] Oxygen release and structural dhanges in TiO_2 films during photocatalytic oxidation.
- Author(s)
  K.Yoshida, T.nanbara, J.Yamasaki, N.Tanaka
- Journal Title
  
  J. Appl Phys. (In print)
- Data Source
  KAKENHI-PROJECT-17029030
[Patent] 支持体上に単原子が分散した構造体、支持体上に単原子が分散した構造体を製造する方法およびスパッタ装置2017
- Inventor(s)
  郷原一寿、前原　洋祐、山崎　憲慈
- Industrial Property Rights Holder
  郷原一寿、前原　洋祐、山崎　憲慈
- Industrial Property Rights Type
  特許
- Filing Date
  2017
- Overseas
- Data Source
  KAKENHI-PLANNED-26105009
[Patent] 支持体上に単原子が分散した構造体、支持体上に単原子が分散した構造体を製造する方法およびスパッタ装置2017
- Inventor(s)
  郷原一寿、前原洋祐、山崎憲慈
- Industrial Property Rights Holder
  郷原一寿、前原洋祐、山崎憲慈
- Industrial Property Rights Type
  特許
- Filing Date
  2017-01-26
- Overseas
- Data Source
  KAKENHI-PLANNED-26105009
[Patent] 分散体を製造する方法および分散体2016
- Inventor(s)
  郷原一寿、前原洋祐,山崎憲慈
- Industrial Property Rights Holder
  郷原一寿、前原洋祐,山崎憲慈
- Industrial Property Rights Type
  特許
- Industrial Property Number
  2016-016872
- Filing Date
  2016-02-01
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Theoretical Study on Light Output from Orthogonal Lattice Waveguide Edge in Circular Defect in Two-dimensional Photonic Crystal (CirD) Laser2023
- Author(s)
  Hikari Kubota, Kazuki Sato, Yuki Adachi, Masato Morifuji, Hirotake Kajii, Akihiro Maruta, Jun Yamasaki, and Masahiko Kondow
- Organizer
  Photonic Device Workshop 2023 (PDW2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K18974
[Presentation] Edge Structure Optimization for Improving Output Power of Circular Defect in Photonic Crystal Laser2023
- Author(s)
  Yuki Adachi, Rintaro Maji, Yuto Kudo, Masato Morifuji, Hirotake Kajii, Akihiro Maruta, Jun Yamasaki, and Masahiko Kondow
- Organizer
  Photonic Device Workshop 2023 (PDW2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K18974
[Presentation] Wavelength properties of CirD (Circular Defect in 2D photonic crystal) Laser with aluminum oxide cladding layers having OLW (Orthogonal Lattice Waveguide) with air cladding layers2023
- Author(s)
  Kazuki Sato, Hikari Kubota, Yuki Adachi, Masato Morifuji, Hirotake Kajii, Akihiro Maruta, Jun Yamasaki, and Masahiko Kondow
- Organizer
  Photonic Device Workshop 2023 (PDW2023)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K18974
[Presentation] Time-resolved observation of photoinduced phase transition of trititanium pentoxide by ultrafast electrton microscopy2022
- Author(s)
  Shuhei Hatanaka, Taro Tsuchiya, Shuhei Ichikawa, Jun Yamasaki and Kazuhisa Sato
- Organizer
  14th International Symposium on Atomic Level Characterizations for New Materials and Devices '22 (ALC'22)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K18974
[Presentation] Quantitative Analysis of Intensity Attenuation with Increasing Thickness in TEM and STEM Images2021
- Author(s)
  Jun Yamasaki, Hideo Nishikubo, Hirokazu Sasaki, and Shigeo Arai
- Organizer
  International Conference on Materials and Systems for Sustainability 2021 (ICMaSS2021)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Improved resolution in rapid electron tomography based on the image sharpness measurement2021
- Author(s)
  Tomohito Ishii and Jun Yamasaki
- Organizer
  13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] TEM/STEM Intensity Modulation with Increasing Thickness Induced by Electron Multiple Scattering Phenomena in Materials2021
- Author(s)
  Jun Yamasaki, Hideo Nishikubo, Hirokazu Sasaki, and Shigeo Arai
- Organizer
  2nd Canada-Japan Microscopy Societies Symposium
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Precise analysis of transmission attenuation in mass-thickness contrast TEM images2020
- Author(s)
  Jun Yamasaki, Yuya Ubata, and Hidehiro Yasuda
- Organizer
  12th Asia-Pacific Microscopy conference (APMC-2020)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Advances in Diffractive Imaging2019
- Author(s)
  J. Yamasaki
- Organizer
  International Workshop of Ultra High-Resokution on Microscopy 2019
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] TVノルム最小化を用いた密度定量トモグラフィにおけるノイズ問題解決法2019
- Author(s)
  照屋海登、山崎順、加藤丈晴、藤田直弘、馬場則男
- Organizer
  日本物理学会 2019年秋季大会
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] 電子線トモグラフィーの非線形透過率補正におけるノイズ問題の解決法2019
- Author(s)
  照屋海登、山崎順、加藤丈晴、藤田直弘、馬場則男
- Organizer
  日本顕微鏡学会第75回学術講演会
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Precise analysis of intensity attenuation with increasing thickness in TEM images2019
- Author(s)
  Jun Yamasaki, Yuya Ubata, and Hidehiro Yasuda
- Organizer
  the 6th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC6)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Precise Measurements of Transmission Attenuation in Mass-Thickness Contrast TEM Images2019
- Author(s)
  Jun Yamasaki, Yuya Ubata, and Hidehiro Yasuda
- Organizer
  Microscopy and Microanalysis 2019 Meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02600
[Presentation] Correction of artifical density in 3D resonstructed micron-sized materials induced by nonlinear TEM image intensity2018
- Author(s)
  Jun Yamasaki, Yuya Ubata, Kazuyoshi Murata, Kazumi Takahashi, Shin Inamoto, Ryusuke Kuwahara
- Organizer
  4th International Congress on 3D Materials Science (3DMS 2018)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Anchoring Site of Single Pt Atoms on Free-standing Graphene2017
- Author(s)
  前原洋祐、山崎憲慈、郷原一寿
- Organizer
  日本顕微鏡学会第73回学術講演会
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] グラフェン上コンタミネーションのTEM/STEMとAFMによる3次元構造解析2017
- Author(s)
  伊藤寛康、北嶋凌、山崎憲慈、前原洋祐、郷原一寿
- Organizer
  日本顕微鏡学会北海道支部学術講演会
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Precise measure of the depth resolution in aberration-corrected TEM2017
- Author(s)
  Jun Yamasaki, Koh Saitoh, and Nobuo Tanaka
- Organizer
  日本顕微鏡学会第73回学術講演会
- Invited
- Data Source
  KAKENHI-PROJECT-16K13688
[Presentation] 3D imaging of ripple structure in Free-standing single-layer graphene2017
- Author(s)
  瀬川裕大、山崎憲慈、前原洋祐、郷原一寿
- Organizer
  日本顕微鏡学会第73回学術講演会
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] グラフェン上Pt単原子の原子分解能イメージングと電子状態解析2017
- Author(s)
  山崎憲慈, 前原洋祐, 郷原一寿
- Organizer
  応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] EELSによる担持グラフェン上の水素検出2017
- Author(s)
  鈴田耀大、山崎憲慈、前原洋祐、瀬川裕大、内田努、郷原一寿
- Organizer
  日本顕微鏡学会北海道支部学術講演会
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Precise measure of the depth resolution in aberration-corrected TEM2017
- Author(s)
  Jun Yamasaki, Koh Saitoh, Nobuo Tanaka
- Organizer
  日本顕微鏡学会第73回学術講演会
- Invited
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Developing Quantitative Phase Imaging by Electron Diffractive Imaging2016
- Author(s)
  Jun Yamasaki, Yuki Shimaoka, and Hirokazu Sasaki
- Organizer
  The 5th International Symposium on Advanced Microscopy and Theoretical Calculations
- Place of Presentation
  WINC Aichi, Nagoya, Japan
- Year and Date
  2016-05-11
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Refined Phase Imaging by Electron Diffractive Imaging2016
- Author(s)
  Jun Yamasaki, Yuki Shimaoka, and Hirokazu Sasaki
- Organizer
  Microscopy and Microanalysis 2016 Meeting
- Place of Presentation
  Columbus, Ohio, USA
- Year and Date
  2016-07-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM2016
- Author(s)
  Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Junji Yoshida, Kazuo Yamamoto, Tsukasa Hirayama Jun Yamasaki and Naoya Shibata
- Organizer
  The 5th International Symposium on Advanced Microscopy and Theoretical Calculations
- Place of Presentation
  WINC Aichi, Nagoya, Japan
- Year and Date
  2016-05-11
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] グラフェン上へのＰｔ単原子分散体の作製と評価2016
- Author(s)
  山崎憲慈, 前原洋祐, 北嶋　凌, 郷原一寿
- Organizer
  応用物理学会学術講演会
- Place of Presentation
  朱鷺メッセ（新潟）
- Year and Date
  2016-09-12
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast2015
- Author(s)
  Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki and Naoya Shibata
- Organizer
  Microscopy and Microanalysis 2015 Meeting
- Place of Presentation
  Portland, USA
- Year and Date
  2015-08-02
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast2015
- Author(s)
  Hirokazu Sasaki,Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki and Naoya Shibata
- Organizer
  Microscopy and Microanalysis 2015 Meeting
- Place of Presentation
  Portland, USA
- Year and Date
  2015-08-02
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] Reconstruction of Atomic Structures and Electric Fields of Nano Materials Using Electron Diffractive Imaging2015
- Author(s)
  Jun Yamasaki
- Organizer
  International Conference on Electron Microscopy and XXXVI Annual Meeting of the Electron Microscope Society of India (EMSI-2015)
- Place of Presentation
  Mumbai, India
- Year and Date
  2015-07-08
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] CVD成長させたグラフェン膜に観察されるモアレパターンの解析2015
- Author(s)
  山崎憲慈, 前原洋祐, 郷原一寿
- Organizer
  日本顕微鏡学会学術講演会
- Place of Presentation
  京都国際会館（京都）
- Year and Date
  2015-05-11
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Reconstruction of Atomic Structures and Electric Fields of Nano Materials Using Electron Diffractive Imaging2015
- Author(s)
  Jun Yamasaki
- Organizer
  International Conference on Electron Microscopy and XXXVI Annual Meeting of the Electron Microscope Society of India (EMSI-2015)
- Place of Presentation
  Mumbai, India
- Year and Date
  2015-07-08
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] ＣＶＤ法によって銅箔の両面に成長させたグラフェン膜に由来するモアレパターンの解析2015
- Author(s)
  山崎憲慈, 前原洋祐, 郷原一寿
- Organizer
  応用物理学会学術講演会
- Place of Presentation
  名古屋国際会議場（愛知）
- Year and Date
  2015-09-11
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] Depth-Resolution Imaging of Crystalline Nano Clusters Using Aberration-Corrected TEM2015
- Author(s)
  Jun Yamasaki, Akihiko Hirata, Yoshihiko Hirotsu, Kaori Hirahara and Nobuo Tanaka
- Organizer
  The 2nd East-Asia Microscopy Conference (EAMC2)
- Place of Presentation
  姫路商工会議所、兵庫県姫路市
- Year and Date
  2015-11-24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Depth-resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-corrected TEM2015
- Author(s)
  Jun Yamasaki, Masayuki Mori, Akihiko Hirata, Yoshihiko Hirotsu, Kaori Hirahara, and Nobuo Tanaka
- Organizer
  Third Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2015)
- Place of Presentation
  Kasteel Vaalsbroek, the Netherlands
- Year and Date
  2015-04-19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Observation of electric field using electron diffractive imaging2014
- Author(s)
  J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
- Organizer
  18th International Microscopy Congress (IMC 18)
- Place of Presentation
  Prague
- Year and Date
  2014-09-09
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] 3C-SiC/Si(001) 界面における積層欠陥の収差補正 TEM 解析2013
- Author(s)
  山崎順、稲元伸、野村優貴、石田篤志、秋山賢輔、平林康男、田中信夫
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  神奈川工大
- Year and Date
  2013-03-30
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] 収差補正TEM 像による Si 基板上 high-k 絶縁膜の膜厚測定2013
- Author(s)
  山崎順、稲元伸、田中信夫
- Organizer
  日本顕微鏡学会第69回学術講演会
- Place of Presentation
  大阪
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] 3C-SiC/Si(001)界面における積層欠陥の収差補正TEM解析2013
- Author(s)
  山崎順、稲元伸、野村優貴、石田篤志、秋山賢輔、平林康男、田中信夫
- Organizer
  第60回応用物理学会春季学術講演会
- Place of Presentation
  神奈川工科大学
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomistic Structure Analysis of 3C-SiC/Si(001) Interface and Stacking Faults by Aberration-Corrected Transmission Electron Microscopy2012
- Author(s)
  J. Yamasaki, S. Inamoto, Y. Nomura and N. Tanaka
- Organizer
  icroscopy & Microanalysis 2012
- Place of Presentation
  Phoenix, USA
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Interface Atomistic structure of 3C-SiC/Si(001) Revealed by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2012
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  International Symposium on Role of Electron Microscopy in Industry Toward Genuine Collaboration Between Academia and industry
- Place of Presentation
  Nagoya
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] 積層欠陥と 3C-SiC/Si(001)界面の接合部の収差補正 TEM 解析2012
- Author(s)
  野村優貴、稲元伸、山崎順、田中信夫
- Organizer
  日本顕微鏡学会第68回学術講演会
- Place of Presentation
  つくば国際会議場
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomistic interfacial structure of 3C-SiC/Si(001) and stacking faults studied by aberration-corrected transmission electron microscopy2012
- Author(s)
  Y. Nomura, J. Yamasaki, S. Inamoto, K. Okazaki-Maeda, and N. Tanaka
- Organizer
  The 3rd International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC3)
- Place of Presentation
  長良川国際会議場
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomistic interfacial structure of 3C-SiC/Si(001) and stacking faults studied by aberration-corrected transmission electron microscopy2012
- Author(s)
  Y. Nomura, J. Yamasaki, S. Inamoto, K. Okazaki-Maeda, and N. Tanaka
- Organizer
  The 3rd International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC3)
- Place of Presentation
  Gifu
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomistic Structure Analysis of 3C-SiC/Si(001) Interface and Stacking Faults by Aberration-Corrected Transmission Electron Microscopy2012
- Author(s)
  J. Yamasaki, S. Inamoto, Y. Nomura and N. Tanaka
- Organizer
  Microscopy & Microanalysis 2012
- Place of Presentation
  Phoenix, USA
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] 積層欠陥と3C-SiC/Si(001)界面の接合部の収差補正TEM解析2012
- Author(s)
  野村優貴、稲元伸、山崎順、田中信夫
- Organizer
  日本顕微鏡学会第68回学術講演会
- Place of Presentation
  つくば国際会議場
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Interface Atomistic structure of 3C-SiC/Si(001) Revealed by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2012
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  International Symposium on Role of Electron Microscopy in Industry Toward Genuine Collaboration Between Academia and industry
- Place of Presentation
  名古屋大学
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  2011 International Conference on Solid State Devices and Materials (SSDM 2011)
- Place of Presentation
  名古屋市
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, K.Okazaki-Maeda, and N. Tanaka
- Organizer
  12th KIM-JIM symposium
- Place of Presentation
  Okinawa
- Year and Date
  2011-11-06
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  2011 International Conference on Solid State Devices and Materials (SSDM 2011)
- Place of Presentation
  Nagoya
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, K.Okazaki-Maeda, and N. Tanaka
- Organizer
  15th International Conference on Thin Films (ICTF15)
- Place of Presentation
  Kyoto
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomic Arrangement at 3C-SiC/Si(001) Interface Revealed by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  International Symposium on EcoTopia Science 2011
- Place of Presentation
  Nagoya
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Atomic Arrangement at 3C-SiC/Si(001) Interface Revealed by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, and N. Tanaka
- Organizer
  International Symposium on EcoTopia Science 2011
- Place of Presentation
  名古屋大学
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation]2011
- Author(s)
  太田圭佑、森下茂幸、山崎順、田中信夫
- Organizer
  日本顕微鏡学会67回学術講演会
- Place of Presentation
  福岡国際会議場
- Year and Date
  2011-05-17
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, K. Okazaki-Maeda, and N. Tanaka
- Organizer
  15th International Conference on Thin Films (ICTF15)
- Place of Presentation
  京都市
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] 電子回折顕微法を用いた位相像観察2011
- Author(s)
  太田圭佑、森下茂幸、山崎順、田中信夫
- Organizer
  日本顕微鏡学会67回学術講演会
- Place of Presentation
  福岡国際会議場(発表確定)
- Year and Date
  2011-05-17
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy and a New Image Processing Method2011
- Author(s)
  J. Yamasaki, S. Inamoto, H. Tamaki, K. Okazaki-Maeda, and N. Tanaka
- Organizer
  12th KIM-JIM symposium
- Place of Presentation
  沖縄
- Data Source
  KAKENHI-PROJECT-23760030
[Presentation] Measurement of Wavefront Curvature and Spatial Coherenceof Electron Beams by Using a Small Aperture2010
- Author(s)
  S.Morishita, J.Yamasaki, N.Tanaka
- Organizer
  COHERENCE 2010
- Place of Presentation
  Rostock-Warnemunde, Germany.
- Year and Date
  2010-06-09
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] 電子回折顕微法を用いた結晶原子配列の可視化2010
- Author(s)
  山崎順
- Organizer
  原子分解能ホログラフィー研究会ワークショップ
- Place of Presentation
  東北大学金属材料研究所
- Year and Date
  2010-11-13
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] HOLZ線のロッキングカーブプロファイルをもちいた3次元格子歪み解析II2010
- Author(s)
  濱邊麻衣子, 齋藤晃, 森下茂幸, 山崎順, 田中信夫
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山大学
- Year and Date
  2010-03-21
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  森下茂幸, 山崎順, 加藤丈晴, 田中信夫
- Organizer
  日本顕微鏡学会66回学術講演会
- Place of Presentation
  名古屋国際会議場
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  J.Yamasaki, S.Morishita, N.Tanaka
- Organizer
  The 17th IFSM International Microscopy Congress
- Place of Presentation
  Rio de Janeilo, Brazil
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  森下茂幸,山崎順,田中信夫
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山大学
- Year and Date
  2010-03-21
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] Reconstruction of Crystalline Structures at 78 pmResolution by Electron Diffractive Imaging2010
- Author(s)
  J.Yamasaki, S.Morishita, N.Tanaka
- Organizer
  COHERENCE 2010
- Place of Presentation
  Rostock-Warnemunde, Germany.
- Year and Date
  2010-06-09
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  濱邊麻衣子, 齋藤晃, 森下茂幸, 山崎順, 田中信夫
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山大学
- Year and Date
  2010-03-21
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  S.Morishita, J.Yamasaki, T.Kato, N.Tanaka
- Organizer
  The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
- Place of Presentation
  名古屋国際会議場
- Year and Date
  2010-06-25
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  S.Morishita, J.Yamasaki, T.Kato
- Organizer
  The 17th IFSM International Microscopy Congress
- Place of Presentation
  Rio de Janeilo, Brazil
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  S.Morishita, J.Yamasaki, N.Tanaka
- Organizer
  COHERENCE 2010
- Place of Presentation
  Rostock-Warnemunde, Germany
- Year and Date
  2010-06-09
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  山崎順
- Organizer
  原子分解能ホログラフィー研究会ワークショップ
- Place of Presentation
  東北大学
- Year and Date
  2010-11-13
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  J.Yamasaki, S.Morishita, N.Tanaka
- Organizer
  COHERENCE 2010
- Place of Presentation
  Rostock-Warnemunde, Germany
- Year and Date
  2010-06-09
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2010
- Author(s)
  J.Yamasaki, A.Hirata, Y.Hirotsu, N.Tanaka
- Organizer
  The 17th IFSM International Microscopy Congress
- Place of Presentation
  Rio de Janeilo, Brazil
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] 電子回折顕微法の再生結果に及ぼす量子ノイズの影響2010
- Author(s)
  森下茂幸, 山崎順, 田中信夫
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山大学
- Year and Date
  2010-03-21
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2009
- Author(s)
  Shigeyuki Morishita, Jun Yamasaki
- Organizer
  Microscopy & Microanalysis 2009
- Place of Presentation
  Richmond, USA
- Year and Date
  2009-07-30
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2009
- Author(s)
  森下茂幸, 山崎順, 加藤丈晴, 田中信夫
- Organizer
  日本顕微鏡学会第65回学術講演会
- Place of Presentation
  仙台国際センター
- Year and Date
  2009-05-27
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] 収差補正STEMを用いた非晶質カーボン膜中白金原子の運動の観察2009
- Author(s)
  黒島光, 山崎順, 田中信夫
- Organizer
  日本物理学会第64回年次大会
- Place of Presentation
  立教大学
- Year and Date
  2009-03-27
- Data Source
  KAKENHI-PROJECT-19656007
[Presentation]2009
- Author(s)
  Jun Yamasaki, Nobuo Tanaka, Shigeyuki Morishita
- Organizer
  The 12th Frontiers of Electron Microscopy in Materials Science (FEMMS2009)
- Place of Presentation
  長崎ハウステンボス
- Year and Date
  2009-09-28
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] High-resolution imaging and structure analysis by using aberration-corrected electron diffraction2009
- Author(s)
  Jun Yamasaki, Nobuo Tanaka, Shigeyuki Morishita
- Organizer
  The 12th Frontiers of Electron Microscopy in Materials Science(FEMM2009)
- Place of Presentation
  長崎ハウステンボス
- Year and Date
  2009-09-28
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation]2009
- Author(s)
  Jun Yamasaki, et al
- Organizer
  Microscopy & Microanalysis 2009
- Place of Presentation
  Richmond, USA
- Year and Date
  2009-07-30
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] Analysis of Crystalline Nano Structures Embedded in Amorphous Films by Selected Area Nano Diffraction in a Cs-corrected TEM2009
- Author(s)
  Jun Yamasaki, et al.
- Organizer
  Microscopy & Microanalysis 2009
- Place of Presentation
  Richmond, USA
- Year and Date
  2009-07-30
- Data Source
  KAKENHI-PROJECT-21760026
[Presentation] Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal by Cs-corrected STEM2007
- Author(s)
  Jun Yamasaki
- Organizer
  Microscopy and Microanalysis 2007 Meeting
- Place of Presentation
  Fort Lauderdale, Florida, USA
- Year and Date
  2007-08-06
- Data Source
  KAKENHI-PROJECT-19656007
[Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007
- Author(s)
  Yamasaki, J., Okunishi, E., Sawada, H and Tanaka, N
- Organizer
  The NIMS Conference 2007 on Recent Breakthroughs in Materials Science and Tech nology
- Place of Presentation
  筑波
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] 球面収差補正TEM・ナノ電子回折を用いた金属ガラスの局所構造解析2007
- Author(s)
  山崎順
- Organizer
  日本物理学会第62回年次大会
- Place of Presentation
  北海道大学
- Year and Date
  2007-09-23
- Data Source
  KAKENHI-PROJECT-18029011
[Presentation] Site Hopping of Individual Dopant Atoms in Si Crystal Observed by Cs-corrected ADF-STEM2007
- Author(s)
  Jun Yamasaki
- Organizer
  The NIMS Conference 2007 on Recent Breakthroughs in Materials Science and Technology
- Place of Presentation
  つくば国際会議場
- Year and Date
  2007-06-12
- Data Source
  KAKENHI-PROJECT-19656007
[Presentation] Cs補正ADF-STEMで捉えたSi中ドーパントアンチモンの置換位置移動2007
- Author(s)
  山崎順
- Organizer
  日本顕微鏡学会第63回学術講演会
- Place of Presentation
  新潟コンベンションセンター
- Year and Date
  2007-05-22
- Data Source
  KAKENHI-PROJECT-19656007
[Presentation] 収差補正制限視野ナノ回折法によるZr-Ni系金属ガラスの局所構造解析2007
- Author(s)
  山崎順
- Organizer
  日本顕微鏡学会第63回学術講演会
- Place of Presentation
  新潟コンベンションセンター
- Year and Date
  2007-05-20
- Data Source
  KAKENHI-PROJECT-18029011
[Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007
- Author(s)
  Yamasaki, J., Okunishi, E., Sawada, H and Tanaka, N
- Organizer
  The NIMS Conference 2007 on Recent Breakthroughs in Materials Scienoe and Technology
- Place of Presentation
  Tsukuba
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] STEMドーパント原子の直接観察2007
- Author(s)
  山崎順
- Organizer
  日本顕微鏡学会関西支部特別講演会
- Place of Presentation
  分子科学研究所・岡崎
- Year and Date
  2007-07-31
- Data Source
  KAKENHI-PROJECT-19656007
[Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007
- Author(s)
  Yamasaki, J., Okunishi, E., Sawada, H, Tanaka, N
- Organizer
  The NEVIS
- Place of Presentation
  Tsukuba
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO_2 coverage2007
- Author(s)
  Tanaka, N., Cho, S.P., Sbklyaev, A. A., Yamasaki, J., Okunishi, E, Icbikawa, M
- Organizer
  ACSIN-9
- Place of Presentation
  Tokyo, Japan
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] Spherical aberration corrected STEM studies of Ge nanodotsgrown on Si (001) surfaces with an ultrathin SiO_2 coverage2007
- Author(s)
  Tanaka, N., Cho, S. P., Shklyaev, A. A., Yamasaki, J., Okunishi, E and Ichikawa, M
- Organizer
  ACSIN-9
- Place of Presentation
  東京
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001)surfaces with an ultrathin SiO_2 coverage2007
- Author(s)
  Tanaka, N., Cho, S. P., Shklyaev, A. A., Yamasaki, J., Okunishi, E and Ichikawa, M
- Organizer
  ACSIN-9
- Place of Presentation
  Tokyo, Japan
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] 収差補正制限視野ナノ回折法を用いた金属ガラスの局所構造解析2007
- Author(s)
  山崎順
- Organizer
  日本金属学会2007年秋期大会
- Place of Presentation
  岐阜大学
- Year and Date
  2007-09-20
- Data Source
  KAKENHI-PROJECT-18029011
[Presentation] Direct Observation of Six-membered Rings in a Graphene Monolayer Constituting a Single Wall Carbon Nanotube by Using Cs-Corrected TEM2006
- Author(s)
  Hirahara, K., Saitoh, K., Yamasaki, J and Tanaka, N
- Organizer
  IMC 16
- Place of Presentation
  Sapporo
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] High-resolution TEM/STEM Analysis on La_2O_3/Si(100)interfaces2006
- Author(s)
  Tanaka, N., Yamasaki, J and Saitoh, K
- Organizer
  International Workshop on Nano-CMOS
- Place of Presentation
  Mishima
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] Recent development of spherical aberration corrected electron microscopy and its application to studies of nano-structures2005
- Author(s)
  Tanaka, N., Yamasaki, J
- Organizer
  International Symposium on Application of Quantum Beam 2005
- Place of Presentation
  神戸大学
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-17201022
[Presentation] Electron Diffractive Imaging of Crystalline Structures and Electric Fields of Nano Materials
- Author(s)
  J. Yamasaki
- Organizer
  The 15th International Union of Materials Research Society – International Conference in Asia (IUMRS-ICA)
- Place of Presentation
  Fukuoka
- Year and Date
  2014-08-24 – 2014-08-30
- Data Source
  KAKENHI-PLANNED-26105009
[Presentation] 位相回復法を用いた半導体解析
- Author(s)
  佐々木宏和、大友晋哉、山本和生、平山司、山崎　順、谷垣俊明、明石哲也
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  幕張メッセ国際会議場（千葉県）
- Year and Date
  2014-05-11 – 2014-05-13
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] Phase Imaging by Electron Diffractive Imaging
- Author(s)
  Jun Yamasaki
- Organizer
  Holo Workshop
- Place of Presentation
  Dresden （ドイツ）
- Year and Date
  2014-06-10 – 2014-06-12
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] 電子回折図形に基づくナノイメージング
- Author(s)
  山崎　順
- Organizer
  第1回「3D活性サイト科学」公開ワークショップ
- Place of Presentation
  CIVI研修センター新大阪東（大阪府）
- Year and Date
  2014-11-21 – 2014-11-22
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] Electron Diffractive Imaging of Crystalline Structures and Electric Fields in/around Nano Materials
- Author(s)
  Jun Yamasaki
- Organizer
  the 18th SANKEN International Symposium
- Place of Presentation
  Knowledge Capital Conges Convention Center （大阪府）
- Year and Date
  2014-12-10 – 2014-12-11
- Invited
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] 電子線の空間コヒーレンス測定と電子線回折イメージング
- Author(s)
  山崎　順
- Organizer
  日本放射光学会第６回若手研究会
- Place of Presentation
  理研播磨SPring-8 （兵庫県）
- Year and Date
  2014-08-21 – 2014-08-22
- Invited
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] 収差補正TEMによる深さ分解能結像
- Author(s)
  山崎　順
- Organizer
  日本顕微鏡学会超高分解能顕微法分科会 2014年度研究会
- Place of Presentation
  マホロバ・マインズ三浦（神奈川県）
- Year and Date
  2015-02-20 – 2015-02-21
- Invited
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] 位相回復法を用いた半導体解析
- Author(s)
  佐々木宏和、大友晋哉、山本和生、平山司、山崎　順、谷垣俊明、明石哲也
- Organizer
  日本顕微鏡学会第70回学術講演会
- Place of Presentation
  幕張メッセ国際会議場（千葉県）
- Year and Date
  2014-05-11 – 2014-05-13
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Electron Diffractive Imaging of Crystalline Structures and Electric Fields of Nano Materials
- Author(s)
  Jun Yamasaki
- Organizer
  The 15th International Union of Materials Research Society – International Conference in Asia (IUMRS-ICA)
- Place of Presentation
  Fukuoka University （福岡県）
- Year and Date
  2014-08-24 – 2014-08-30
- Invited
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] Observation of electric field using electron diffractive imaging
- Author(s)
  J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
- Organizer
  18th International Microscopy Congress (IMC 2014)
- Place of Presentation
  Prague （チェコ）
- Year and Date
  2014-09-07 – 2014-09-12
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] 電子回折図形に基づくナノイメージング
- Author(s)
  山崎　順
- Organizer
  第1回「3D活性サイト科学」公開ワークショップ
- Place of Presentation
  CIVI研修センター新大阪東（大阪府）
- Year and Date
  2014-11-21 – 2014-11-22
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Electron Diffractive Imaging of Crystalline Structures and Electric Fields of Nano Materials
- Author(s)
  Jun Yamasaki
- Organizer
  The 15th International Union of Materials Research Society - International Conference in Asia (IUMRS-ICA)
- Place of Presentation
  Fukuoka University （福岡県）
- Year and Date
  2014-08-24 – 2014-08-30
- Invited
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Electron Diffractive Imaging of Crystalline Structures and Electric Fields in/around Nano Materials
- Author(s)
  Jun Yamasaki
- Organizer
  the 18th SANKEN International Symposium
- Place of Presentation
  Knowledge Capital Congres Convention Center （大阪府）
- Year and Date
  2014-12-10 – 2014-12-11
- Invited
- Data Source
  KAKENHI-PROJECT-26286049
[Presentation] Phase Imaging by Electron Diffractive Imaging
- Author(s)
  Jun Yamasaki
- Organizer
  Holo Workshop
- Place of Presentation
  Dresden （ドイツ）
- Year and Date
  2014-06-10 – 2014-06-12
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] Observation of electric field using electron diffractive imaging
- Author(s)
  J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
- Organizer
  18th International Microscopy Congress (IMC 2014)
- Place of Presentation
  Prague （チェコ）
- Year and Date
  2014-09-07 – 2014-09-12
- Data Source
  KAKENHI-PROJECT-26600042
[Presentation] 電子線の空間コヒーレンス測定と電子線回折イメージング
- Author(s)
  山崎　順
- Organizer
  日本放射光学会第６回若手研究会
- Place of Presentation
  理研播磨SPring-8 （兵庫県）
- Year and Date
  2014-08-21 – 2014-08-22
- Invited
- Data Source
  KAKENHI-PROJECT-26286049

1. TANAKA NOBUO (40126876)

# of Collaborated Projects: 9 results

# of Collaborated Products: 36 results
2. SAITO Koh (50292280)

# of Collaborated Projects: 3 results

# of Collaborated Products: 9 results
3. MUROOKA Yoshie (40273263)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. GOHARA Kazutoshi (40153746)

# of Collaborated Projects: 2 results

# of Collaborated Products: 9 results
5. SASAKI HIROKAZU (70649821)

# of Collaborated Projects: 2 results

# of Collaborated Products: 9 results
6. SOMPYO Cho (90318783)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. HIRATA AKIHIKO (90350488)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
8. KOBAYASHI KEITA (40556908)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. 塩谷浩之 (90271642)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
10. 畑中修平 (30838503)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
11. 近藤正彦 (90403170)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
12. 森藤正人 (00230144)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
13. SAKAGUCHI Norihito

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. UCHIDA Tsutomu

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
15. YAMAZAKI Kenji

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results
16. MAEHARA Yosuke

# of Collaborated Projects: 1 results

# of Collaborated Products: 8 results
17. WATANABE Hiroki

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. HAIDER M

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. 成瀬幹夫

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 五十嵐信行

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. HAIDER M.

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 藤田武志

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

Yamasaki Jun 山崎 順

山崎 順 ヤマサキ ジユン

YAMASAKI Jun 山崎 順

Research Projects

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Visualization of submicron localized light using electron beamsPrincipal Investigator

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Developing the electron tomography for correct reconstructions of three-dimensional shape and density of materials based on elucidation of the multiple scattering phenomenon of electron beamsPrincipal Investigator

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Developing three-dimensional measurement method for nano- and atomistic structures using focal series of aberration-corrected transmission electron microscopy imagesPrincipal Investigator

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Nano-Structure 3D Atomic Imaging using Electron Diffraction

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Development of electron diffractive imaging for phase observations from the atomic level to micron scalePrincipal Investigator

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Quantitative visualization of nanometer-scaled electromagnetic fields by a novel phase-imaging method based on small-angle electron scattering patternsPrincipal Investigator

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Three-dimensional analysis of atomic arrangements in cubic SiC/Si interfaces by aberration-corrected TEM and ab initio calculationsPrincipal Investigator

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Implementation of sub-A resolution by a new imaging method based on electron diffraction patterns and towards its application for materials sciencePrincipal Investigator

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収差補正STEMによるシリコン中ドーパント拡散及びクラスタリングの単原子直視研究Principal Investigator

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金属ガラスの局所原子構造の球面収差補正電子顕微鏡による研究Principal Investigator

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高空間分解能光化学反応その場観察装置による酸化チタンの触媒反応界面の動的観察

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Study of structural fluctuation of nanomaterials by Cs-corrected electron lenses

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無球面収差結像TEMによるSiO_2/Si界面の酸化状態の原子直視的研究

Principal Investigator

Yamasaki Jun 山崎順

山崎順ヤマサキジユン

YAMASAKI Jun 山崎順