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KISHINO Seigo  岸野 正剛

ORCIDConnect your ORCID iD *help
Researcher Number 50201455
Other IDs
Affiliation (based on the past Project Information) *help 2002: 姫路工業大学, 大学院・工学研究科, 教授
2002: Himeji Institute of Technology, Graduate School of Engineering, Professor, 工学研究科, 教授
2001: 姫路工業大学, 工学部, 教授
1998 – 1999: 姫路工業大学, 工学部, 教授
1995 – 1996: 姫路工業大学, 工学部, 教授
Review Section/Research Field
Principal Investigator
Applied materials science/Crystal engineering
Except Principal Investigator
Applied materials science/Crystal engineering
Keywords
Principal Investigator
SPV / ICTS / localized state / 局在準位 / contactless measurement / MOS diode / carrier lifetime / interface trap / SPV法 / ICTS法 … More / 再結合ライフタイム / 生成ライフタイム / 非接触測定 / MOSダイオード / キャリアライフタイム / 界面トラップ / variable hopping conduction / proximity effect / oxide high temperature superconductor / ホッピング伝導 / 近接効果 / 酸化物高温超伝導体 … More
Except Principal Investigator
SOI Wafer / Water Mapping / Capacitance-frequency Method / Capacitance Transient / Capacitance-Voltage Method / Lifetime / Localized States / ContactLess Characterization / SOI / 走査型容量顕微鏡 / 局在凖位 / 容量-周波数特性 / 容量-電圧特性 / SOIウェーハ / ウェーハマッピング / 容量-周波数法 / 過渡容量分光法 / 容量-電圧法 / ライフタイム / 局在準位 / 非接触評価 Less
  • Research Projects

    (3 results)
  • Co-Researchers

    (4 People)
  •  Development of Scanning Capacitance Transient Spectroscopy and Characterization of Ultrathin Oxide/Silicon Interface

    • Principal Investigator
      YOSHIDA Haruhiko
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Himeji Institute of Technology
  •  Correlation between carrier lifetime and interface trap density in MOS devicesPrincipal Investigator

    • Principal Investigator
      KISHINO Seigo
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (C).
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Himeji Institute of Technology
  •  Study on the formation mechanism of long-distance proximity effectPrincipal Investigator

    • Principal Investigator
      KISHINO Seigo
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Himeji Institute of Techology
  • 1.  YOSHIDA Haruhiko (90264837)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 2.  MATSUDA Tetsuro (10047582)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 3.  内橋 貴之 (30326300)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 4.  SOHRODER D.K
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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