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Jpn. J. Appl. Phys.
Volume: 58 Issue: 5 Pages: 052004-052004
10.7567/1347-4065/ab10aa
210000155652
IEEE Transactions on Instrumentation and Measurement
Volume: Volume: 66, Issue: 6 Pages: 1592-1597
10.1109/tim.2017.2661618