KITANO Akiko 北野彰子

Researcher Number	50393319
Affiliation (based on the past Project Information) *help	2005: Japan Synchrotron Radiation Research Institute, Industrial Application Division, Research Scientist, 産業利用推進室産業利用支援チーム, 研究員 2005: (財)高輝度光科学研究センター, 産業利用推進室・産業利用支援チーム, 研究員 2004: 財団法人高輝度光科学研究センター, 利用研究促進部門I・産業応用・利用支援Iチーム, 研究員
Review Section/Research Field	Except Principal Investigator Nanomaterials/Nanobioscience
Keywords	Except Principal Investigator 迅速構造解析 / ナノ細線 / ナノ材料 / 超薄膜 / 超高感度なの計測回析法 / 原子細線 / 単色高エネルギーX線 / 逆格子イメージング法 / 超高感度ナノ計測回折法 / 新構造解析法 … More / ナノ結晶体の迅速構造解析法 / X線逆格子空間イメージング法 / 放射光X線 / ナノワイヤ / 構造解析 / 大気中表面測定 / Rapid diffraction method / Nanowire / Nanometer scale structure / Ultrathin film / Super-high-sensitive x-ray method / Atomic wire / Monochromatic high energy x-rays / Reciprocal-lattice space imaging Less

Development and application of a rapid analysis method of a nanostructure by direct observation of a reciprocal-lattice space using synchrotron diffraction
- Principal Investigator
  
  SAKATA Osami
- Project Period (FY)
  2004 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Japan Synchrotron Radiation Research Institute

All 2005 2004

All Journal Article Patent

[Journal Article] Reciprocal-lattice space imaging of x-ray intensities diffracted from nanowires2005
- Author(s)
  O.Sakata, A.Kitano, W.Yashiro, K.Sakamoto, K.Miki, A.Matsuda, W.Hara, S.Akiba, M.Yoshimoto
- Journal Title
  
  Material Research Society Proceedings 840
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16510096
[Journal Article] Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure2005
- Author(s)
  O.Sakata, W.Yashiro, D.R.Bowler, A.Kitano, K.Sakamoto, K.Miki
- Journal Title
  
  Phys.Rev.B (Rapid Communication) 72
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16510096
[Journal Article] Reciprocal -lattice space imaging of x-ray intensities diffracted from nanowires2005
- Author(s)
  O.Sakata, A.Kitano, W.Yashiro, K.Sakamoto, K.Miki, A.Matsuda, W.Hara, S.Akiba, M.Yoshimoto
- Journal Title
  
  Material Research Society Proceedings 840
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16510096
[Journal Article] Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure2005
- Author(s)
  O.Sakata, W.Yashiro, D.R.Bowler, a.Kitano, K.Sakamoto, K.Miki
- Journal Title
  
  Phys. Rev. B(Rapid Communication) 72
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16510096
[Patent] 特許2004
- Inventor(s)
  坂田修身, 北野彰子
- Industrial Property Rights Holder
  財団法人高輝度光科学研究センター
- Industrial Property Number
  2004-144473
- Filing Date
  2004-05-14
- Data Source
  KAKENHI-PROJECT-16510096
[Patent] 特許2004
- Inventor(s)
  坂田修身, 北野彰子
- Industrial Property Rights Holder
  財団法人高輝度光科学研究センター
- Industrial Property Number
  2004-144473
- Filing Date
  2004-05-14
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16510096

1. SAKATA Osami (40215629)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
2. YOSHIMOTO Mamoru (20174998)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
3. FUNAKUBO Hiroshi (90219080)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. WALKER Christopher J

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KITANO Akiko 北野 彰子

Research Projects

Research Products

Co-Researchers

Development and application of a rapid analysis method of a nanostructure by direct observation of a reciprocal-lattice space using synchrotron diffraction

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Reciprocal-lattice space imaging of x-ray intensities diffracted from nanowires2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Reciprocal -lattice space imaging of x-ray intensities diffracted from nanowires2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure2005

Author(s)

Journal Title

Description

Data Source

[Patent] 特許2004

Inventor(s)

Industrial Property Rights Holder

Industrial Property Number

Filing Date

Data Source

[Patent] 特許2004

Inventor(s)

Industrial Property Rights Holder

Industrial Property Number

Filing Date

Description

Data Source

KITANO Akiko 北野彰子