HIRAYAMA Tsukasa 平山司

… Alternative Names

平山司ヒラヤマツカサ

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Researcher Number	50399599
Other IDs
Affiliation (Current)	2022: 一般財団法人ファインセラミックスセンター, その他部局等, 執行理事ナノ構造研究所副所長
Affiliation (based on the past Project Information) *help	2020: 一般財団法人ファインセラミックスセンター, その他部局等, 執行理事ナノ構造研究所副所長 2008: (財)ファインセラミックスセンター, ナノ構造研究所, 所長代理 2008: 名古屋大学, 財)ファインセラミックスセンター・ナノ構造研究所, 主幹研究員 2006 – 2007: 財)ファインセラミックスセンター, ナノ構造研究所, 主幹研究員 2005: (財)ファインセラミックスセンター, 材料技術研究所, 主幹研究員
Review Section/Research Field	Principal Investigator Medium-sized Section 29:Applied condensed matter physics and related fields Except Principal Investigator Science and Engineering
Keywords	Principal Investigator ２光源 / 可干渉 / 高度情報科学 / 像再生 / ダメージレス / 可干渉2光源照射 / 透過電子顕微鏡 Except Principal Investigator 電子線ホログラフィー / その場観察 / 燃料電池 … More / 酸化物イオン伝導体 / 電極電解質界面 / レーザアブレーション / 内部電位 / 電子線ホログラフィ / プロトン伝導体 / 電気二重層 / イオン濃度分布 / ヘテロ接触界面 / レーザ蒸着装置 / 電圧導入加熱試料ホルダー / 電子顕微鏡観察 / 8-YSZ / FIB加工 Less

2つの可干渉光源と高度情報科学を用いた透過電子顕微鏡ダメージレス観察法の開発Principal Investigator
- Principal Investigator
  
  平山司
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Challenging Research (Exploratory)
- Review Section
  
  Medium-sized Section 29:Applied condensed matter physics and related fields
- Research Institution
  Japan Fine Ceramics Center
In-situ observation of the inner-potential at hetero-interfaces by electron holography
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2004 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Nagoya University

All 2008 2007 2005 2004

All Journal Article Presentation Book

[Book] ナノマテリアル工学大系第1巻の一部2005
- Author(s)
  山本和生, 福永啓一, 王洲光, 平山司
- Total Pages
  7
- Publisher
  フジテクノシステム
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] 電子線ホログラフィーの原理と磁性材料・半導体デバイス解析への応用2008
- Author(s)
  平山司, 他
- Journal Title
  
  金属 78
  
  Pages: 463-467
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Wedge-shaped and flat cross-sections for quantitative characterization of the electrostatic potential distributions across_p-n junctions by electron holography2005
- Author(s)
  Z.Wang, T.Hirayama 他4名
- Journal Title
  
  Surf.Interface Anal. 37・2
  
  Pages: 221-224
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency.2005
- Author(s)
  T.Hirayama, K.Yamamoto, K.Miyashita, T.Saito
- Journal Title
  
  J.Electron Microsc. 54・1
  
  Pages: 51-55
- NAID
  10015519906
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Transmission electron microscopy characterization of a Yttria-stabilized zirconia coating fabricated by electron beam-physical vapor deposition.2005
- Author(s)
  T.Kato, T.Hirayama 他5名
- Journal Title
  
  Surf.Coat.Tech 194・1
  
  Pages: 16-23
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Transmission electron microscopy studies of YBCO coated conductor deposited using multiple-stage chemical vapor deposition2005
- Author(s)
  H. Sasaki, T. Kato, Y. Sasaki, T. Hirayama, N. Kashima, S. Nagaya, T. Izumi and Y. Shiohara
- Journal Title
  
  Physica C 426-431
  
  Pages: 1056-1061
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Off-axis Electron Holography without Fresnel Fringes.2004
- Author(s)
  T.Hirayama, T.Tanji ほか2名
- Journal Title
  
  Ultramicroscopy 101・2-4
  
  Pages: 265-269
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Off-axis Electron Holography without Fresnel Fringes2004
- Author(s)
  K. Yamamoto, T. Hirayama and T. Tanji
- Journal Title
  
  Ultramicroscopy 101
  
  Pages: 265-269
- Data Source
  KAKENHI-PROJECT-16079207
[Journal Article] Direct Observation of Electrostatic Microfields by Four-Electron-Wave Interference Using Two Electron Biprisms.2004
- Author(s)
  T.Hirayama, T.Tanji ほか2名
- Journal Title
  
  Journal of Electron Microscopy 53・6
  
  Pages: 577-582
- NAID
  10014320429
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Electron Holographic Dopant Profiling in Compound Semiconductors2008
- Author(s)
  T. Hirayama
- Organizer
  9 th Asia-Pacific Microscopy Conference
- Place of Presentation
  Jeju (Koria)
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Electron Holography for Developing Advanced Magnetic Materials and Semiconductor Devices2008
- Author(s)
  T. Hirayama
- Organizer
  Development of Advanced Instruments for New Electron Microscopy and Diffraction, Congress and General Assembly of the International Union of Crystallography, Satellite Meetings
- Place of Presentation
  Nagoya (Japan)
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Electron Holography for Developing Advanced Materials and Devices2008
- Author(s)
  T. Hirayama, et.al.
- Organizer
  1 st International Symposium on Advanced Microscopy and Theoretical Calculations
- Place of Presentation
  Nagoya (Japan)
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Electron Holography of Hetero-Interfaces between Metals and Solid Ionic Conductors2008
- Author(s)
  T. Tanji, H. Moritomo, M. Abe, S. Mizuno, T. Kato, and T. Hirayama
- Organizer
  9th Asia-Pacific Microscopy Conference
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] On-line Dynamic Digital Electron Holography2008
- Author(s)
  T. Hirayama
- Organizer
  Microscopy and Microanalysis 2008
- Place of Presentation
  Albuquerque (USA)
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] 電子線ホログラフィによるSOFCヘテロ界面の観察2007
- Author(s)
  丹司敬義, 森友広志, 志村哲生, 平山司, 加藤丈晴
- Organizer
  日本顕微鏡学会第63回学術講演会
- Place of Presentation
  新潟
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] 電子線ホログラフィーによる半導体内のキャリアプロファイリング2007
- Author(s)
  平山司
- Organizer
  日本顕微鏡学会第51回シンポジウム
- Place of Presentation
  徳島
- Year and Date
  2007-10-20
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Carrier Profiling in Semiconductor Devices by Electron Holography2007
- Author(s)
  T. Hirayama
- Organizer
  International Symposium on EcoTopia Science 2007
- Place of Presentation
  名古屋
- Year and Date
  2007-11-23
- Data Source
  KAKENHI-PROJECT-16079207
[Presentation] Electron Holography of a Hetero-Interface in a Solid Oxide Fuel Cell2007
- Author(s)
  T. Tanji, H. Moritomo, T. Shimura, T. Kato and T. Hirayama
- Organizer
  Microscopy and Microanalysis 2007
- Place of Presentation
  Fort Lauderdale, FL, USA
- Data Source
  KAKENHI-PROJECT-16079207

1. TANJI Takayoshi (90125609)

# of Collaborated Projects: 1 results

# of Collaborated Products: 6 results
2. SHIMURA Tetsuo (30273254)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
3. 穴田智史 (40772380)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. MORITOMO Hirosi

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
5. ABE Masato

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
6. MIZUNO Shunta

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
7. MORI Yuichiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results

HIRAYAMA Tsukasa 平山 司

平山 司 ヒラヤマ ツカサ

Research Projects

Research Products

Co-Researchers

2つの可干渉光源と高度情報科学を用いた透過電子顕微鏡ダメージレス観察法の開発Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

In-situ observation of the inner-potential at hetero-interfaces by electron holography

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

[Book] ナノマテリアル工学大系第1巻 の一部2005

Author(s)

Total Pages

Publisher

Data Source

[Journal Article] 電子線ホログラフィーの原理と磁性材料・半導体デバイス解析への応用2008

Author(s)

Journal Title

Data Source

[Journal Article] Wedge-shaped and flat cross-sections for quantitative characterization of the electrostatic potential distributions across_p-n junctions by electron holography2005

Author(s)

Journal Title

Data Source

[Journal Article] Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency.2005

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Transmission electron microscopy characterization of a Yttria-stabilized zirconia coating fabricated by electron beam-physical vapor deposition.2005

Author(s)

Journal Title

Data Source

[Journal Article] Transmission electron microscopy studies of YBCO coated conductor deposited using multiple-stage chemical vapor deposition2005

Author(s)

Journal Title

Data Source

[Journal Article] Off-axis Electron Holography without Fresnel Fringes.2004

Author(s)

Journal Title

Data Source

[Journal Article] Off-axis Electron Holography without Fresnel Fringes2004

Author(s)

Journal Title

Data Source

[Journal Article] Direct Observation of Electrostatic Microfields by Four-Electron-Wave Interference Using Two Electron Biprisms.2004

Author(s)

Journal Title

NAID

Data Source

[Presentation] Electron Holographic Dopant Profiling in Compound Semiconductors2008

Author(s)

Organizer

Place of Presentation

Data Source

[Presentation] Electron Holography for Developing Advanced Magnetic Materials and Semiconductor Devices2008

Author(s)

Organizer

Place of Presentation

Data Source

[Presentation] Electron Holography for Developing Advanced Materials and Devices2008

Author(s)

Organizer

Place of Presentation

Data Source

[Presentation] Electron Holography of Hetero-Interfaces between Metals and Solid Ionic Conductors2008

Author(s)

Organizer

Place of Presentation

Data Source

[Presentation] On-line Dynamic Digital Electron Holography2008

Author(s)

Organizer

Place of Presentation

HIRAYAMA Tsukasa 平山司

平山司ヒラヤマツカサ

[Book] ナノマテリアル工学大系第1巻の一部2005