Makino Hiroshi 牧野博之

… Alternative Names

牧野博之マキノヒロシ

MAKINO Hiroshi 牧野博之

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Researcher Number	50454038
Affiliation (Current)	2025: 大阪学院大学, 情報学部, 教授
Affiliation (based on the past Project Information) *help	2022 – 2023: 大阪工業大学, 情報科学部, 教授 2015 – 2020: 大阪工業大学, 情報科学部, 教授 2013: 大阪工業大学, 情報科学部, 教授 2011 – 2012: 大阪工業大学, 情報科学部, 准教授
Review Section/Research Field	Principal Investigator Basic Section 60040:Computer system-related / Electron device/Electronic equipment
Keywords	Principal Investigator ばらつき / しきい値電圧 / SRAM / モンテカルロシミュレーション / リングオシレータ / 集積回路 / 一次元縮退モデル / データ保持動作 / 読み出し動作 / 書き込み動作 … More / 閾値電圧 / 動作限界 / ロジック回路 / プロセッサ / 論理回路 / 適応的電圧制御 / ゲート酸化膜厚 / 読み出し / 書き込み / 電圧 / しきい値 / 電圧発生器 / スピードセンサ / 動作安定化 / 電子デバイス Less

Research Projects
(4 results)
Research Products
(33 results)

A verification of One-dimensional degenerate model in Monte-Carlo simulation of SRAMPrincipal Investigator
- Principal Investigator
  
  牧野博之
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Osaka Institute of Technology
A Study on the Operation limit of SRAM using Monte Carlo SimulationPrincipal Investigator
- Principal Investigator
  
  Makino Hiroshi
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 60040:Computer system-related
- Research Institution
  Osaka Institute of Technology
Improvement of LSIs' yield by Adaptive Supply Voltage OptimizationPrincipal Investigator
- Principal Investigator
  
  Makino Hiroshi
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Osaka Institute of Technology
Stabilization of SRAM according to fluctuation of transistor characteristicsPrincipal Investigator
- Principal Investigator
  
  MAKINO Hiroshi
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Osaka Institute of Technology

All 2023 2022 2021 2020 2019 2018 2016 2015 2014 2013 2012 2011

All Journal Article Presentation Book

[Book] 半導体LSI技術2012
- Author(s)
  牧野博之、益子洋治、山本秀和
- Total Pages
  287
- Publisher
  共立出版
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] Increase in Read Noise Margin of Single-bit-line SRAM using Adiabatic Change of Word Line Voltage2014
- Author(s)
  Shunji Nakata, Hiroki Hanazono, Hiroshi Makino, Hiroki Morimura, Masayuki Miyama, and Yoshio Matsuda
- Journal Title
  
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  
  Volume: Volume 22, Issue 3 Issue: 3 Pages: 686-690
- DOI
  10.1109/tvlsi.2013.2247642
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] ANALYSIS OF VOLTAGE, CURRENT AND ENERGY DISSIPATION OF STEPWISE ADIABATIC CHARGING OF A CAPACITOR USING A NONRESONANT INDUCTOR CURRENT2014
- Author(s)
  Shunji Nakata, Hiroshi Makino, Ryota Honda, Masayuki Miyama, and Yoshio Matsuda
- Journal Title
  
  Journal of Circuits, Systems, and Computers
  
  Volume: Volume 23, No. 3 Issue: 03 Pages: 1450039-1450039
- DOI
  10.1142/s021812661450039x
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] Improved Evaluation Method for the SRAM Cell Write Margin by Word Line Voltage Acceleration2012
- Author(s)
  Hiroshi Makino, Naoya Okada, Tetsuya Matsumura, Koji Nii, Tsutomu Yoshimura, Shuhei Iwade and Yoshio Matsuda
- Journal Title
  
  Circuits and Systems in Online Journal of Scientific Research Publishing (SCIRP)
  
  Volume: Volume 3, No. 3 Issue: 03 Pages: 242-251
- DOI
  10.4236/cs.2012.33034
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield2012
- Author(s)
  Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin’ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade and Yoshio Matsuda
- Journal Title
  
  IET Circuits, Devices & Systems
  
  Volume: Volume 6, Issue 4 Issue: 4 Pages: 260-270
- DOI
  10.1049/iet-cds.2012.0090
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] General Stability of Stepwise Waveform of an Adiabatic Charge Recycling Circuit With Any Circuit Topology2012
- Author(s)
  Shunji Nakata, Ryota Honda, Hiroshi Makino, Shin’ichiro Mutoh, Masayuki Miyama and Yoshio Matsuda
- Journal Title
  
  IEEE Transactions on Circuits and Systems-I:Regular Papers
  
  Volume: Volume 59, Issue 10 Issue: 10 Pages: 2301-2314
- DOI
  10.1109/tcsi.2012.2189054
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Journal Article] Reexamination of SRAM Cell Write Margin Definitions in view of Predicting the Distribution2011
- Author(s)
  H. Makino, S. Nakata, H. Suzuki, S. Mutoh, M. Miyama, T. Yoshimura, S. Iwade, and Y. Matsuda
- Journal Title
  
  IEEE Transactions on Circuits and Systems-II Express Briefs
  
  Volume: Volume 58, Issue 4 Issue: 4 Pages: 230-234
- DOI
  10.1109/tcsii.2011.2124531
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] SRAMのデータ保持時の不良率予測における一次元縮退モデルの妥当性検証2023
- Author(s)
  堀内大、牧野博之
- Organizer
  令和5年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-22K11963
[Presentation] SRAMの書き込み不良率推定における一次元縮退モデルの妥当性に関する考察2022
- Author(s)
  松本慎輝、牧野博之
- Organizer
  令和4年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-22K11963
[Presentation] 不良出現を加速させたモンテカルロシミュレーションによるSRAMの動作限界推定2021
- Author(s)
  鶴薗陸人，居石壮平，牧野博之
- Organizer
  2021年電子情報通信学会総合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] ばらつきを加速させたモンテカルロシミュレーションによるSRAMのデータ保持限界推定2020
- Author(s)
  居石壮平，鶴薗陸人，牧野博之
- Organizer
  令和２年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] SRAMのデータ保持限界見極めに関する研究2019
- Author(s)
  上村貴史、武村健太、牧野博之
- Organizer
  令和元年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] ばらつきを加速させたモンテカルロシミュレーションによるSRAMの書き込み限界推定2019
- Author(s)
  武村健太、上村貴史、牧野博之
- Organizer
  2019 年電子情報通信学会総合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] 多段階出力DC-DCコンバータの設計2018
- Author(s)
  原佑一、牧野博之
- Organizer
  平成30年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] RAMの書き込み限界見極めに関する研究　―モンテカルロシミュレーションの回数削減の検討―2018
- Author(s)
  上村貴史、武村健太、牧野博之
- Organizer
  平成30年電気関係学会関西連合大会
- Data Source
  KAKENHI-PROJECT-18K11229
[Presentation] ばらつきを考慮した論理回路の電圧最適化に関する検討2016
- Author(s)
  橘凌太，遠藤寛明，池田裕樹，櫻井拓，牧野博之，布村泰浩，吉村勉，岩出秀平，松田吉雄
- Organizer
  2016年度電気関係学会関西連合大会
- Place of Presentation
  大阪府立大学、中百舌鳥キャンパス
- Year and Date
  2016-11-22
- Data Source
  KAKENHI-PROJECT-15K06042
[Presentation] トランジスタのVthおよびTox検知用プロセッサの設計2016
- Author(s)
  遠藤寛明，橘凌太，池田裕樹，櫻井拓，牧野博之，布村泰浩，吉村勉，岩出秀平，松田吉雄
- Organizer
  2016年度電気関係学会関西連合大会
- Place of Presentation
  大阪府立大学、中百舌鳥キャンパス
- Year and Date
  2016-11-22
- Data Source
  KAKENHI-PROJECT-15K06042
[Presentation] トランジスタの閾値およびゲート酸化膜厚検知手法の検討2015
- Author(s)
  池田裕樹，櫻井拓，牧野博之，布村泰浩，吉村勉，岩出秀平，松田吉雄
- Organizer
  2015年度電気関係学会関西連合大会
- Place of Presentation
  摂南大学　寝屋川キャンパス
- Year and Date
  2015-11-14
- Data Source
  KAKENHI-PROJECT-15K06042
[Presentation] トランジスタの閾値検知用プロセッサの設計2015
- Author(s)
  櫻井拓，池田裕樹，牧野博之，布村泰浩，吉村勉，岩出秀平，松田吉雄
- Organizer
  2015年度電気関係学会関西連合大会
- Place of Presentation
  摂南大学　寝屋川キャンパス
- Year and Date
  2015-11-14
- Data Source
  KAKENHI-PROJECT-15K06042
[Presentation] Estimation of Threshold Voltage from Frequency of Ring Oscillator2014
- Author(s)
  Takuya Matsumoto, Hroshi Makino, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda
- Organizer
  IEEE The 2014 International Meeting for Future of Electron Devices, Kansai(IMFEDK2014)
- Place of Presentation
  Ryukoku University Avanti Kyoto Hall, Kyoto(to be presented at)
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Estimation of Threshold Voltage from Frequency of Ring Oscillator2014
- Author(s)
  Takuya Matsumoto, Hroshi Makino, Tsutomu Yoshimura, Shuhei Iwade, and Yoshio Matsuda
- Organizer
  IEEE The 2014 International Meeting for Future of Electron Devices, Kansai(IMFEDK2014)
- Place of Presentation
  Ryukoku University
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Expansion of SRAM Operation Margin by Adaptive Voltage Supply2013
- Author(s)
  Kyohei Kishida, Tomohiro Tsujii, Hroshi Makino, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda
- Organizer
  Proceedings of IEEE The 2013 International Meeting for Future of Electron Devices, Kansai(IMFEDK2013)
- Place of Presentation
  Kansai University, Osaka
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] 2013年度電気関係学会関西連合大会2013
- Author(s)
  松本拓也, 大東士朗, 牧野博之, 吉村勉, 岩出秀平, 松田吉雄
- Organizer
  トランジスタの閾値電圧検知手法の提案
- Place of Presentation
  大阪電気通信大学(G9-0025)
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Expansion of SRAM Operation Margin by Adaptive Voltage Supply2013
- Author(s)
  Kyohei Kishida, Tomohiro Tsujii, Hroshi Makino, Tsutomu Yoshimura, Shuhei Iwade, and Yoshio Matsuda
- Organizer
  IEEE The 2013 International Meeting for Future of Electron Devices, Kansai(IMFEDK2013)
- Place of Presentation
  Kansai University
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] トランジスタの閾値電圧検知手法の提案2013
- Author(s)
  松本拓也、大東士朗、牧野博之、吉村勉、岩出秀平、松田吉雄
- Organizer
  2013年度電気関係学会関西連合大会
- Place of Presentation
  大阪電気通信大学
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] エネルギー散逸のないステップ電圧生成回路を用いたキャパシタの高効率充電2013
- Author(s)
  細川淳平、中田俊司、牧野博之、吉村勉、岩出秀平、深山正幸、松田吉雄
- Organizer
  2013年度電気関係学会北陸支部連合大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] ばらつきを考慮したSRAMメモリセルの動作範囲拡大の検討2012
- Author(s)
  岸田京平, 牧野博之, 吉村勉, 岩出秀平, 松田吉雄
- Organizer
  2012年電気関係学会関西連合大会
- Place of Presentation
  関西大学(9pmD-27)
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] 断熱充電回路を用いた高効率エネルギー蓄電技術の開発2012
- Author(s)
  中田俊司、本田良太、牧野博之、深山正幸、松田吉雄
- Organizer
  2012年度電子情報通信学会ソサイエティ大会
- Place of Presentation
  富山大学
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Energy Dissipation Reduction during Adiabatic Charging and Discharging with Controlled Inductor Current2012
- Author(s)
  Shunji. Nakata, Ryota Honda., Hiroshi. Makino, Hiroki. Morimura, and Yoshio. Matsuda
- Organizer
  IEEE International Midwest Symposium on Circuits and Systems 2012 (MWSCAS)
- Place of Presentation
  Boise, Idaho, USA
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] WL 電圧シフトによる電圧シフトによる書込みマージンの加速評価法2012
- Author(s)
  岡田尚也、牧野博之、中田俊司、吉村勉、岩出秀平、深山正幸、松田吉雄
- Organizer
  2012年度電気関係学会北陸支部連合大会
- Place of Presentation
  富山県立大学
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] ばらつきを考慮したSRAMメモリセルの動作範囲拡大の検討2012
- Author(s)
  岸田京平、牧野博之、吉村勉、岩出秀平、松田吉雄
- Organizer
  2012年電気関係学会関西連合大会
- Place of Presentation
  関西大学
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Accelerated Evaluation Method for the SRAM Cell Write Margin using Word Line Voltage Shift2011
- Author(s)
  H. Makino, Shunji Nakata, H. Suzuki, H. Morimura, S. Mutoh, M. Miyama, T. Yoshimura, S. Iwade, and Y. Matsuda
- Organizer
  IEEE International Symposium on Integrated Circuits 2011 (ISIC)
- Place of Presentation
  Suntec International Convention and Exhibition Centre, Singapore
- Data Source
  KAKENHI-PROJECT-23560423
[Presentation] Increasing Static Noise Margin of Single-bit-line SRAM by Lowering Bit-line Voltage during Reading2011
- Author(s)
  S. Nakata, H. Suzuki, H. Makino, S. Mutoh, M. Miyama, and Y. Matsuda
- Organizer
  IEEE International Midwest Symposium on Circuits and Systems 2011 (MECAS)
- Place of Presentation
  Yonsei University, Seoul, Korea
- Data Source
  KAKENHI-PROJECT-23560423

Makino Hiroshi 牧野 博之

牧野 博之 マキノ ヒロシ

MAKINO Hiroshi 牧野 博之

Research Projects

Research Products

A verification of One-dimensional degenerate model in Monte-Carlo simulation of SRAMPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

A Study on the Operation limit of SRAM using Monte Carlo SimulationPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Improvement of LSIs' yield by Adaptive Supply Voltage OptimizationPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Stabilization of SRAM according to fluctuation of transistor characteristicsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] 半導体LSI技術2012

Author(s)

Total Pages

Publisher

Data Source

[Journal Article] Increase in Read Noise Margin of Single-bit-line SRAM using Adiabatic Change of Word Line Voltage2014

Author(s)

Journal Title

DOI

Data Source

[Journal Article] ANALYSIS OF VOLTAGE, CURRENT AND ENERGY DISSIPATION OF STEPWISE ADIABATIC CHARGING OF A CAPACITOR USING A NONRESONANT INDUCTOR CURRENT2014

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Improved Evaluation Method for the SRAM Cell Write Margin by Word Line Voltage Acceleration2012

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield2012

Author(s)

Journal Title

DOI

Data Source

[Journal Article] General Stability of Stepwise Waveform of an Adiabatic Charge Recycling Circuit With Any Circuit Topology2012

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Reexamination of SRAM Cell Write Margin Definitions in view of Predicting the Distribution2011

Author(s)

Journal Title

DOI

Data Source

[Presentation] SRAMのデータ保持時の不良率予測における一次元縮退モデルの妥当性検証2023

Author(s)

Organizer

Data Source

[Presentation] SRAMの書き込み不良率推定における 一次元縮退モデルの妥当性に関する考察2022

Author(s)

Organizer

Data Source

[Presentation] 不良出現を加速させたモンテカルロシミュレーションによるSRAMの動作限界推定2021

Author(s)

Organizer

Data Source

[Presentation] ばらつきを加速させたモンテカルロシミュレーションによるSRAMのデータ保持限界推定2020

Author(s)

Organizer

Data Source

Makino Hiroshi 牧野博之

牧野博之マキノヒロシ

MAKINO Hiroshi 牧野博之

[Presentation] SRAMの書き込み不良率推定における一次元縮退モデルの妥当性に関する考察2022

[Presentation] RAMの書き込み限界見極めに関する研究　―モンテカルロシミュレーションの回数削減の検討―2018