Shinohara Hirofumi 篠原尋史

Researcher Number	50531810
Other IDs
Affiliation (Current)	2025: 京都大学, 情報学研究科, 研究員
Affiliation (based on the past Project Information) *help	2024: 京都大学, 情報学研究科, 研究員 2021 – 2023: 早稲田大学, 理工学術院(情報生産システム研究科・センター), 特任教授 2017 – 2019: 早稲田大学, 理工学術院(情報生産システム研究科・センター), 特任教授
Review Section/Research Field	Principal Investigator Basic Section 21060:Electron device and electronic equipment-related / Electron device/Electronic equipment
Keywords	Principal Investigator 認証 / ストロングPUF / ハードウェアセキュリティ / ビットエラー率 / TRNG / PUF / IoTセキュリティ / モデリング攻撃 / 機械学習攻撃 / 暗号・認証等 … More / セキュア・ネットワーク / 電子デバイス・機器 / ホットエレクトロン注入 / 乱数 Less

Research Projects
(3 results)
Research Products
(13 results)

Stochastic Response Authentication Using Strong PUF and TRNGPrincipal Investigator
- Principal Investigator
  
  篠原尋史
- Project Period (FY)
  2024 – 2026
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 21060:Electron device and electronic equipment-related
- Research Institution
  Kyoto University
Study of a Strong FUF for Light Weight Authentication without CryptographyPrincipal Investigator
- Principal Investigator
  
  Shinohara Hirofumi
- Project Period (FY)
  2021 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 21060:Electron device and electronic equipment-related
- Research Institution
  Waseda University
Quality Improvement of Natural Data for Security by Controling Initial StatePrincipal Investigator
- Principal Investigator
  
  Shinohara Hirofumi
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Waseda University

All 2023 2022 2021 2020 2019 2018

All Journal Article Presentation

[Journal Article] A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement2021
- Author(s)
  Liu Kunyang、Chen Xinpeng、Pu Hongliang、Shinohara Hirofumi
- Journal Title
  
  IEEE Journal of Solid-State Circuits
  
  Volume: 56 Issue: 7 Pages: 2193-2204
- DOI
  10.1109/jssc.2020.3035207
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04201
[Journal Article] A 373-F? 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection2020
- Author(s)
  Liu Kunyang、Min Yue、Yang Xuan、Sun Hanfeng、Shinohara Hirofumi
- Journal Title
  
  IEEE Journal of Solid-State Circuits
  
  Volume: 5 Pages: 1719-1732
- DOI
  10.1109/jssc.2019.2963002
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] Vss-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-In2023
- Author(s)
  Kunyang Liu, Yichen Tang, Shufan Xu, and Hirofumi Shinohara
- Organizer
  2023 IEEE Int. Conf. Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04201
[Presentation] Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection2023
- Author(s)
  Shufan Xu, Kunyang Liu, Yichen Tang, Ruilin Zhang, and Hirofumi Shinohara
- Organizer
  2023 IEEE Int. Conf. Microelectronic Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04201
[Presentation] A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance2023
- Author(s)
  Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, and Hirofumi Shinohara
- Organizer
  IEEE, 48th Europian Solid state Circuits Conference (ESSCIRC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04201
[Presentation] Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In2022
- Author(s)
  Kunyang Liu, Kiyoshi Takeuchi, and Hirofumi Shinohara
- Organizer
  2022 IEEE International conference on Microelectronics Test Structures (ICMTS)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04201
[Presentation] A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in2020
- Author(s)
  Kunyang Liu, Hongliang Pu and Hirofumi Shinohara
- Organizer
  IEEE 2020 Custom Integrated Circuits Conf. (CICC)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] High-Throughput & Power Efficiency 8 Bits Von Neumann Post-Processing with Waiting Strategy for True Random Number Generators2019
- Author(s)
  Ruilin Zhang and Hirofumi Shinohara
- Organizer
  TJCAS 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] A 373 F2 2D Power-Gated EE SRAM Physically Unclonable Function With Dark-Bit Detection Technique2018
- Author(s)
  Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun and Hirofumi Shinohara
- Organizer
  IEEE 2018 A-SSCC, pp.161-164, Nov. 2018.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] 情報セキュリティのためのランダム回路2018
- Author(s)
  篠原　尋史
- Organizer
  電子情報通信学会、ICD研究会
- Invited
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] High-Throughput Von Neumann Post-Processing for Random Number Generator2018
- Author(s)
  Ruilin Zhang, Sijia Chen, Chao Wan, Hirofumi Shinohara
- Organizer
  IEEE, 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), D3-1, April 2018.
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] Compensation of Temperature Induced Flipping-Bits in CMOS SRAM PUF by NMOS Body-Bias2018
- Author(s)
  Xuanhao Zhang, Xiang Chen, Hanfeng Sun and, Hirofumi Shinohara
- Organizer
  IEICE Technical Report, HWS2018-38, pp. 333-336, July 2018
- Data Source
  KAKENHI-PROJECT-17K06404
[Presentation] 情報セキュリティのためのランダム回路2018
- Author(s)
  篠原尋史
- Organizer
  信学技報、ICD2018-11, pp. 45-46, 2018年 4月
- Invited
- Data Source
  KAKENHI-PROJECT-17K06404

Shinohara Hirofumi 篠原 尋史

Research Projects

Research Products

Stochastic Response Authentication Using Strong PUF and TRNGPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study of a Strong FUF for Light Weight Authentication without CryptographyPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Quality Improvement of Natural Data for Security by Controling Initial StatePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement2021

Author(s)

Journal Title

DOI

Data Source

[Journal Article] A 373-F? 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection2020

Author(s)

Journal Title

DOI

Data Source

[Presentation] Vss-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-In2023

Author(s)

Organizer

Data Source

[Presentation] Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection2023

Author(s)

Organizer

Data Source

[Presentation] A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance2023

Author(s)

Organizer

Data Source

[Presentation] Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In2022

Author(s)

Organizer

Data Source

[Presentation] A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in2020

Author(s)

Organizer

Data Source

[Presentation] High-Throughput & Power Efficiency 8 Bits Von Neumann Post-Processing with Waiting Strategy for True Random Number Generators2019

Author(s)

Organizer

Data Source

[Presentation] A 373 F2 2D Power-Gated EE SRAM Physically Unclonable Function With Dark-Bit Detection Technique2018

Author(s)

Organizer

Data Source

[Presentation] 情報セキュリティのためのランダム回路2018

Author(s)

Organizer

Data Source

[Presentation] High-Throughput Von Neumann Post-Processing for Random Number Generator2018

Author(s)

Organizer

Data Source

[Presentation] Compensation of Temperature Induced Flipping-Bits in CMOS SRAM PUF by NMOS Body-Bias2018

Author(s)

Organizer

Data Source

[Presentation] 情報セキュリティのためのランダム回路2018

Author(s)

Organizer

Data Source

Shinohara Hirofumi 篠原尋史