Gomi Kenji 五味健二

… Alternative Names

GOMI Kenji 五味健二

KENJI Gomi 五味健二

五味健二ゴミケンジ

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Researcher Number	60281408
Other IDs
External Links
Affiliation (Current)	2025: 東京電機大学, 工学部, 教授
Affiliation (based on the past Project Information) *help	2007 – 2008: Tokyo Denki University, 工学部, 准教授 2006: 東京電機大学, 工学部, 助教授 2005: 東京電機大学, 工学部, 講師 2004: 東京電機大, 工学部, 講師 2003: 東京電機大学, 工学部, 講師 … More 2000 – 2001: 東京電機大学, 工学部, 助手 1998 – 1999: 東京電機大学, 工学部・機械工学科, 助手 1996: 東京電機大学, 工学部, 助手 Less
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials Except Principal Investigator Materials/Mechanics of materials
Keywords	Principal Investigator 電子デバイス / 可視化 / Laser Photoelasticity / Photoelastic Modulator / Experimental Stress Analysis / 光学素子・装置・材料 / 画像・光情報処理 / 光計測 / 評価 / 物性 … More / プロセス / 材料設計 / 共焦点顕微鏡 / 応用光学 / 再生医療 / レーザパッケージ / レーザ光弾性法 / サファイア単結晶 / 半導体レーザ / 長距離大容量通信システム / 消光比異常 / Experimental stress Analysis / 光弾性実験 / NDI / EPD / LEC法 / ひずみ光学定数 / GaAs / Laser-aided Diagnostics / Optical Measurement / Nondestructive inspection / Crystal Gliding / Residual Stress / Gallium Arsenide Semiconductor / Material Testing / Nondestructive Inspection … More Except Principal Investigator Reflecting Type Photoelasticitv / Thin Film / Laser Photoelasticitv / Stress Measurement / 高分子膜 / 偏光計測 / レーザー / 光弾性 / 皮膜応力 / レーザ- / 反射型光弾性 / 光弾性変調器 / 皮膜 / レーザー光弾性 / 応力測定 Less

Development of inexpensive and high-speed stress-microscope and application to stress evaluation in multilayer integrated circuit and avoidance of breaking in the circuitPrincipal Investigator
- Principal Investigator
  
  GOMI Kenji
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tokyo Denki University
高速度多点同時測定型応力顕微鏡の開発と細胞の応力場測定への応用Principal Investigator
- Principal Investigator
  
  五味健二
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tokyo Denki University
サファイアの複屈折測定と半導体レーザの通信速度向上技術への応用Principal Investigator
- Principal Investigator
  
  五味健二
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tokyo Denki University
Development of Reflecting Type Laser Micro-Polariscope and Stress Evaluation of Polymer Film "
- Principal Investigator
  
  YASUSHI Niitsu
- Project Period (FY)
  1999 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  TOKYO DENKI UNIVERSITY
GaAsウエハの残留応力場とウエハ熱処理時に誘起される転位の関係Principal Investigator
- Principal Investigator
  
  五味健二
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tokyo Denki University
赤外線レーザ光弾性法による半導体用単結晶の光弾性物性の測定Principal Investigator
- Principal Investigator
  
  五味健二
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tokyo Denki University

All 2008 2007 2006 2005

All Journal Article Presentation Patent

[Journal Article] 簡単な偏光測定による微小な複屈折分布の評価2008
- Author(s)
  五味健二, 鈴木智之, 一瀬謙輔, 新津靖
- Journal Title
  
  数理科学会論文集 Vol.10
  
  Pages: 15-20
- NAID
  40016662082
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 簡単な偏光測定による微小な複屈折分布の評価2008
- Author(s)
  五味健二、鈴木智之、一瀬謙輔、新津靖
- Journal Title
  
  数理科学会論文集第7巻
  
  Pages: 15-20
- NAID
  40016662082
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 簡便な複屈折測定装置の開発2007
- Author(s)
  鈴木智之、五味健二、鈴木隼、一瀬謙輔
- Journal Title
  
  材料試験技術第52-4巻
  
  Pages: 218-212
- NAID
  40015691462
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 新しい簡便な複屈折分布測定法2007
- Author(s)
  五味健二、一瀬謙輔、鈴木智之
- Journal Title
  
  東京電機大学総合研究所中間報告書2007 第2007巻
  
  Pages: 15-16
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 簡便な複屈折測定装置の開発2007
- Author(s)
  鈴木智之, 五味健二, 鈴木隼, 一瀬謙輔
- Journal Title
  
  材料試験技術 52-4
  
  Pages: 208-212
- NAID
  40015691462
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 簡便な偏光測定による新しい複屈折測定法2007
- Author(s)
  五味健二
- Journal Title
  
  日本機械学会論文集 73-727,A
  
  Pages: 426-433
- NAID
  110006242576
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] 新しい簡便な複屈折分布測定法2007
- Author(s)
  五味健二, 一瀬謙輔, 鈴木智之
- Journal Title
  
  東京電機大学総合研究所中間報告書2007 2007
  
  Pages: 15-16
- Data Source
  KAKENHI-PROJECT-19760076
[Journal Article] 参照波長板を用いた新しい複屈折測定法2006
- Author(s)
  五味健二, 清水健吾, 新津靖, 一瀬謙輔
- Journal Title
  
  日本機械学会論文集 72-719,A
  
  Pages: 1095-1099
- NAID
  110004763326
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] A New Technique of Minute Birefringence Measurement by using Simple Polarimetry2006
- Author(s)
  Kenji Gomi, Kensuke Ichinose, Yasushi Niitsu
- Journal Title
  
  Proc. of 8th International Conference on Electronics Materials and Packaging(2006) Kowloon, (Hong Kong) IEEE Catalog Number: 06EX1631C
  
  Pages: 420-423
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] 新しい複屈折位相差測定装置の開発2006
- Author(s)
  鈴木隼, 一瀬謙輔, 五味健二
- Journal Title
  
  日本機械学会2006年度年次大会講演論文集,Vol.1計算力学,材料力学,機械材料,材料加工(MECJ-06) Vol.1
  
  Pages: 879-880
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] レーザ光弾性法による電子デバイスの応力評価2006
- Author(s)
  五味健二
- Journal Title
  
  第43回X線材料強度に関する討論会論文集
  
  Pages: 36-41
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] A New Measurement Technique of Low-Level Strain Retardation in Optoelectronic Materials2006
- Author(s)
  Kenji Gomi, Yasushi Niitsu, Kensue Ichinose
- Journal Title
  
  Proc. of international conference on electronic systemintegration technology (2006), (Dresden, Germany) 1-4244-0553-X/06/$20.00・2006 IEEE
  
  Pages: 257-262
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] 参照波長板を用いた新しい光弾性法の開発2006
- Author(s)
  後平, 一瀬, 五味
- Journal Title
  
  日本機械学会関東学生会第45回学生員卒業研究発表講演前刷集
  
  Pages: 49-50
- Data Source
  KAKENHI-PROJECT-17686011
[Journal Article] A New Method of Birefringence Measurement to Obtain Stress Field Using Photoelasticity2005
- Author(s)
  K.GOMI, K.SHIMIZU, H.SUZUKI, S.GOHIRA, Y.NIITSU, K.ICHINOSE
- Journal Title
  
  Proc.of 7th International Conference on Electronics Materials and Packaging IEEE Catalog Number : O5EX1277
  
  Pages: 129-131
- Data Source
  KAKENHI-PROJECT-17686011
[Patent] 複屈折測定装置及び複屈折測定方法2007
- Inventor(s)
  五味健二
- Industrial Property Rights Holder
  学校法人東京電機大学
- Industrial Property Number
  2006-023238
- Filing Date
  2007-06-14
- Data Source
  KAKENHI-PROJECT-19760076
[Patent] 複屈折測定装置及び複屈折測定方法2007
- Inventor(s)
  五味健二
- Industrial Property Rights Holder
  学校法人東京電機大学
- Industrial Property Number
  2006-232380
- Filing Date
  2007-06-14
- Overseas
- Data Source
  KAKENHI-PROJECT-19760076
[Patent] 複屈折測定装置及び複屈折測定方法2007
- Inventor(s)
  五味健二
- Industrial Property Rights Holder
  学校法人東京電機大学
- Filing Date
  2007-06-14
- Overseas
- Data Source
  KAKENHI-PROJECT-19760076
[Patent] 複屈折測定装置及び複屈折測定方法2006
- Inventor(s)
  五味健二
- Industrial Property Rights Holder
  東京電機大学
- Industrial Property Number
  2006-232380
- Filing Date
  2006-08-29
- Data Source
  KAKENHI-PROJECT-17686011
[Presentation] New simplified measuring method for distributed low-level birefringence2008
- Author(s)
  Kenji Gomi, Tomoyuki Suzuki, Yasushi Niitsu, Kensuke Ichinose
- Organizer
  9th International Symposium on Laser Metrology
- Place of Presentation
  Singapore Management Univ
- Year and Date
  2008-06-30
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] RESIDUAL STRESS ESTIMATION IN SIC WAFER USING IR POLARISCOPE(Proc. Of The 3^<rd> International Microsystems, Packaging, Assembly and Circuits Technology Conference and the 10^<th> International Symposium on Electronics Materials and Packaging Joint Conference、pp.550-552)2008
- Author(s)
  Kenji Gomi, Kensuke Ichinose and Yasushi Niitsu
- Organizer
  Proc. Of The 3^<rd> International Microsystems, Packaging, Assembly and Circuits Technology Conference and the 10^<th> International Symposium on Electronics Materials and Packaging Joint Conference
- Place of Presentation
  Taiwan
- Year and Date
  2008-10-23
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] New simplified measuring method for distributed low-level birefringence(Proc. of 9th International Symposium on Laser Metrology on CD-ROM, edited by Chenggen Quan, Anand Asundi、SPIE Vol. 7155巻、pp.715510-1〜715510-8)2008
- Author(s)
  Kenji Gomi、Tomoyuki Suzuki、Yasushi Niitsu and Kensuke Ichinose
- Organizer
  Proc. of 9th International Symposium on Laser Metrology on CD-ROM
- Place of Presentation
  Singapore
- Year and Date
  2008-07-01
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] 偏光測定による微小複屈折分布評価(数理科学会第27回数理科学講演論文集、pp.89-90)2008
- Author(s)
  五味健二、鈴木智之、一瀬謙輔、新津靖
- Organizer
  数理科学会
- Place of Presentation
  東京
- Year and Date
  2008-08-30
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] RESIDUAL STRESS ESTIMATION IN SIC WAFER USING IR POLARIS COPE2008
- Author(s)
  Kenji Gomi, Kensuke Ichinose, Yasushi Niitsu
- Organizer
  3^<rd> and the 10^<th> EMAP Joint Conference
- Place of Presentation
  Taipei, Taiwan
- Year and Date
  2008-10-22
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] 偏光測定による微小複屈折分布評価2008
- Author(s)
  五味健二, 鈴木智之, 一瀬謙輔, 新津靖
- Organizer
  数理科学会
- Place of Presentation
  東京電機大学工学部
- Year and Date
  2008-08-30
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] New Simplified Measuring Method for Birefringence Distribution2007
- Author(s)
  Kenji Gomi, Tomoyuki Suzuki, Ken-suke Ichinose, Yasushi Niitsu
- Organizer
  9th International Symposium on Electronics Materials and Packaging
- Place of Presentation
  Dae jeon, Korea
- Year and Date
  2007-11-20
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] 応力顕微鏡の開発2007
- Author(s)
  鈴木智之, 五味健二, 一瀬謙輔, 新津靖
- Organizer
  日本実験力学会
- Place of Presentation
  埼玉大学東京ステーションカレッジ
- Year and Date
  2007-08-07
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] 応力顕微鏡の開発(日本実験力学会講演論文集、第7巻、pp.387-390)2007
- Author(s)
  鈴木智之、五味健二、一瀬謙輔、新津靖
- Organizer
  日本実験力学会
- Place of Presentation
  東京
- Year and Date
  2007-08-07
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] A New Automated measuring instrument for Minute Photoelasticity2007
- Author(s)
  Kenji Gomi, Kensuke Ichinose, Yasushi Niitsu
- Organizer
  13th International Conference on Experimental Mechanics
- Place of Presentation
  Alexandroupolis, Greece
- Year and Date
  2007-07-04
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] A New Automated measuring instrument for Minute Photoelasticity(Proc. Of 13th International Conference on Experimental Mechanics(2007)、ISBN : 978-1-4020-6238-4、CD-ROM Version(頁記載無し))2007
- Author(s)
  Kenji Gomi、Kensuke Ichinose、Yasushi Niitsu
- Organizer
  Proc. Of 13th International Conference on Experimental Mechanics(2007)
- Place of Presentation
  Greece
- Year and Date
  2007-07-04
- Data Source
  KAKENHI-PROJECT-19760076
[Presentation] New Simplified Measuring Method for Birefringence Distribution(Proc. Of 9th International Symposium on Electronics Materials and Packaging ISBN : 978-1-4244-1910-4、CD-ROM Version(頁記載無し))2007
- Author(s)
  Kenji Gomi、Tomoyuki Suzuki、Kensuke Ichinose、Yasushi Niitsu
- Organizer
  Proc. Of 9th International Symposium on Electronics Materials and Packaging
- Place of Presentation
  Korea
- Year and Date
  2007-11-21
- Data Source
  KAKENHI-PROJECT-19760076

1. YASUSHI Niitsu (70143659)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
2. KENSUKE Ichinose (10057226)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. 池田輝樹

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. TERUKI Ikeda

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. 池田照樹

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Gomi Kenji 五味 健二

GOMI Kenji 五味 健二

KENJI Gomi 五味 健二

五味 健二 ゴミ ケンジ

Research Projects

Research Products

Co-Researchers

Development of inexpensive and high-speed stress-microscope and application to stress evaluation in multilayer integrated circuit and avoidance of breaking in the circuitPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

高速度多点同時測定型応力顕微鏡の開発と細胞の応力場測定への応用Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

サファイアの複屈折測定と半導体レーザの通信速度向上技術への応用Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Reflecting Type Laser Micro-Polariscope and Stress Evaluation of Polymer Film "

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

GaAsウエハの残留応力場とウエハ熱処理時に誘起される転位の関係Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

赤外線レーザ光弾性法による半導体用単結晶の光弾性物性の測定Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] 簡単な偏光測定による微小な複屈折分布の評価2008

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 簡単な偏光測定による微小な複屈折分布の評価2008

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 簡便な複屈折測定装置の開発2007

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 新しい簡便な複屈折分布測定法2007

Author(s)

Journal Title

Data Source

[Journal Article] 簡便な複屈折測定装置の開発2007

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 簡便な偏光測定による新しい複屈折測定法2007

Author(s)

Journal Title

NAID

Data Source

[Journal Article] 新しい簡便な複屈折分布測定法2007

Author(s)

Journal Title

Data Source

[Journal Article] 参照波長板を用いた新しい複屈折測定法2006

Author(s)

Journal Title

NAID

Gomi Kenji 五味健二

GOMI Kenji 五味健二

KENJI Gomi 五味健二

五味健二ゴミケンジ