OWARI Masanori 尾張真則

… Alternative Names

尾張正則オワリマサノリ

尾張真則オワリマサノリ

尾張直則オワリマサノリ

Less

Researcher Number	70160950
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2016 – 2021: 東京大学, 環境安全研究センター, 教授 2010: The University of Tokyo, 教授 2003 – 2010: 東京大学, 環境安全研究センター, 教授 2005: 東京大学, 環境安全センター, 教授 1999 – 2001: Environmental Science Center, The University of Tokyo, Professor, 環境安全研究センター, 教授 … More 1999: Environmental Science Center, The University of Tokyo, Professor, 環境研究安全センター, 教授 1994 – 1998: 東京大学, 環境安全研究センター, 助教授 1990 – 1991: 東京大学, 生産技術研究所, 講師 1988: Institute of Industrial Science, University of Tokyo, Research Scientist, 生産技術研究所, 助手 1986: 東京大学, 生産技術研究所, 助手 Less
Review Section/Research Field	Principal Investigator 工業分析化学 / Basic Section 34020:Analytical chemistry-related / Nanostructural chemistry / 環境保全 / Environmental dynamic analysis / 工業分析化学 Except Principal Investigator 工業分析化学 / Science and Engineering / 工業分析化学 / 環境保全 / 環境影響評価(含放射線生物学)
Keywords	Principal Investigator 収束イオンビーム / 飛行時間型 / マッピング / 飛行時間型質量分析 / 三次元分析 / 二次イオン質量分析 / シミュレーション / 二次イオン質量分析法 / 原子分解能 / 活性サイト … More / アトムプローブ顕微鏡 / organic chemical synthesis / acetylation / Friedel-Crafts acylation / laboratory experiments / educationalexperiments / miniaturized chemical experiment / microlaboratofy / experiment wastes / グルコース / 微小規模化学実験 / マイクロラポラトリ / 有機合成 / アセチル化 / Friedel-Craftsアシル化 / 研究室実験 / 学生実験 / 微小化学実験 / マイクロラボラトリ / 実験廃棄物 / High accurate cross-sectioning of sample / Analytical reliability / Multi-elements detection / Elemental analysis with high spatial resolution / Nano-scale tree-dimensional analysis / Secondary ion mass spectrometry / Gallium focused ion beam / Ultra fine ion beam / 有害有機物 / 照射損傷 / パルスイオン銃 / 微粒子 / リフレクトロン / 直接分析 / 粒別分析 / 環境ホルモン物質 / time-of-flight mass spectrometry / elemental mapping / three-dimensional analysis / Auger electron spectroscopy / secondary ion mass spectrometry / focused ion beam / 微小部分析 / イオン励起 / オージェ電子 / パルス / 二次元イオン質量分析 / 元素マッピング / オージェ電子分光 / Epitaxial growth / Surface structural analysis / Chemical-state-discriminated XPED / X-ray photoelectron diffraction / X-ray photoelectron spectroscopy / Surface defect / Electron bombardment / Calcium fluoride / X線光電子回析法 / エピタキシャル成長 / 表層構造解析 / 化学状態識別XPED / X線光電子回折法 / X線光電子分光法 / 固体表面欠陥 / 電子線照射 / フッ化カルシウム / 収東イオンビーム加工 / 質量分析 / 超高真空 / 微小引出し電極 / 収束イオンビーム加工 / パルスレーザー / 電界蒸発 / アトムプローブ / 表面・界面ナノ構造 / ナノ構造化学 / 微細加工 / 三次元元素分布解析 / 二次元イオン質量分析法 … More Except Principal Investigator Cu / X線光電子回折 / X線光電子分光 / X線光電子回析 / X-Ray Photoelectron Spectroscopy / Position Sensitive Detector / Multichannel Detection / Angular Distribution / Energy Distribution / Toroidal Analyzer / Electron Spectrometer / 位置敏感検出器 / 多チャンネル同時計測 / 角度分布 / エネルギー分布 / トロイダル型アナライザー / 電子分光器 / micro reactor / microchip / exposure risk / environmental load / glass apparatus / downsizing / experimental education / chemical experiment / 環境教育 / 実験設備 / 環境負荷低減 / 環境安全学 / 環境科学 / マイクロ化学リアクター / 環境分析 / マイクロリアクター / マイクロチップ / 曝露リスク / 環境負荷 / ガラス器具 / ダウンサイジング / 実験教育 / 化学実験 / Photoelectron Holography / Ge (111) / Tensor XPED / Surface alloy / Surfactant Epitaxy / Real time XPED / Photoelectron Diffraction / Gu / 光電子ホログラフィー / Ge(111)系 / tensor XPED / 表面合金化プロセス / 表面変性エピタキシー / XPED時間分解測定 / Suspended Particulate Matters / Dioxines (PCDDS) / ICP-MS / ICP-AES / Separation Analysis / High Resolution MS / Surface-local Analysis / Environmental Chemical Analysis / 大気浮遊粒子状物質 / ダイオキシン類 / プラズマ発光・質量分析法 / 分離分析 / 高分解能質量分析 / 表面・局所分析 / 環境化学計測 / Health Effect / Risk Assessment / Methyl Mercury Poisoning / Mercury Pollution / Amazon / 水俣病 / 健康影響 / リスク評価 / 有機水銀中毒 / 水銀汚染 / アマゾン / Micro Particle / Three-Dimensional Analysis / Focused Ion Beam / Auger Electron Spectroscopy / Secondary Ion Mass Spectrometry / 微粒子 / 三次元元素分析 / 収束イオンビーム / オージェ電子分光法 / 二次イオン質量分析法 / 活性表面 / 表面反応 / 高速・時間分解 / 回折 / 光電子分光 / TiO_2(110) / VOx / 高速時間分解 / ダイナミクス / 自己組織化 / 低加速電子線回析 / Si(111) Less

3D shave-off分析法の開発と装置化Principal Investigator
- Principal Investigator
  
  尾張真則
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 34020:Analytical chemistry-related
- Research Institution
  The University of Tokyo
Development of Active Site Atomic Resolution MicroscopyPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  2016 – 2018
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nanostructural chemistry
- Research Institution
  The University of Tokyo
Development of laser-assisted wide angle three-dimensional atom probe and its application to atomic level characterization of true electronic devicesPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Creative Scientific Research
- Research Institution
  The University of Tokyo
高速・時間分解X線光電子分光/回折による表面自己組織化のダイナミクスの解明
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Tokyo University of Science
Downsizing studies on chemical experiments for minimization of environmental loads
- Principal Investigator
  
  KORENAGA Takashi
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  Tokyo Metropolitan University
Study on microscale chemical expenments for reduction of experiment wastesPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  環境保全
- Research Institution
  The University of Tokyo
Real tine characterization and control of growing interface structures of thin films
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
Development of a direct analysis technique for organic compounds adsorbed on environmental small particlesPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  1998 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Environmental dynamic analysis
- Research Institution
  University of Tokyo
Three-dimensional analysis of advanced industrial material using nano ion beamPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  1997 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
微小領液高感度三次元分析法の研究Principal Investigator
- Principal Investigator
  
  尾張真則
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
Study on Mercury Pollution in The Amazonia, Brazil
- Principal Investigator
  
  NAKANISHI Junko
- Project Period (FY)
  1996 – 1998
- Research Category
  
  Grant-in-Aid for international Scientific Research
- Research Field
  
  環境影響評価(含放射線生物学)
- Research Institution
  Yokohama National University
Comprehensive Research on Next Generation of Analytical Methodology for Environmental Protection
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1996 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  環境保全
- Research Institution
  University of Tokyo
Development of Three-Dimensional Microanalysis usig Ion and Electron Dual Focused Beams
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1994 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
Characterization of Surface Defect StructuresPrincipal Investigator
- Principal Investigator
  
  OWARI Masanori
- Project Period (FY)
  1990 – 1991
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  工業分析化学
- Research Institution
  Institute of Industrial Science, University of Tokyo
Development of Novel Electron Spectrometer for Simultaneous Detection of Energy and Angular Distributions
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1986 – 1988
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research
- Research Field
  
  工業分析化学
- Research Institution
  University of Tokyo

All 2020 2019 2018 2017 2016 2010 2009 2008 2007 2006 2004

All Journal Article Presentation Book Patent

[Book] イオンを用いた新たなナノ計測への展開(「アトムプローブの新たな展開」電子情報通信学会「知識ベース」、S2郡(ナノ・量子・バイオ)-4編(ナノ加工・計測技術)-3章(ナノ計測技術-ナノプローブ以外)-3.4)2009
- Author(s)
  間山憲仁、尾張真則
- Publisher
  オーム社(Web公開)
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Simulation of Secondary Ion Position on the Detector for Three-dimensional Shave-off Method2020
- Author(s)
  So-Hee Kang, Shinnosuke Kishi, Kohei Matsumura, Bunbunoshin Tomiyasu, Masanori Owari
- Journal Title
  
  e-J. Surf. Sci. Nanotechnol.
  
  Volume: 18 Issue: 0 Pages: 116-120
- DOI
  10.1380/ejssnt.2020.116
- NAID
  130007827474
- ISSN
  1348-0391
- Year and Date
  2020-04-02
- Language
  English
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-19H02743
[Journal Article] Angular distribution of sputtered particles in shave-off section processing with SDTrimSP2019
- Author(s)
  So-Hee Kang, Kohei Matsumura, Takeki Azuma, Bunbunoshin Tomiyasu, Masanori Owari
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 25 Pages: 165-171
- NAID
  130007852040
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] The interaction of O2 and residual H on Pt surface studied by field ion microscopy and in-situ surface atom probe2019
- Author(s)
  Sunwei Chen, Takumi Suzuki, Bunbunoshin Tomiyasu, Masanori Owari
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 26 Pages: 1-8
- NAID
  130007894794
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Emssion Trajectory Calculation of Ions from the Shave-off Cross Section for Realization of 3D Shave-off Method2018
- Author(s)
  Yuto Takagi, So-Hee Kang, Kohei Matsumura, Takeki Azuma, Bunbunoshin Tomiyasu, Masanori Owari
- Journal Title
  
  e-Journal of Surface Science and Nanotechnology
  
  Volume: 16 Pages: 324-328
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Study of the Ionization in a Field Ion Microscope Using Pulsed-Laser2018
- Author(s)
  Yun Kim, Masanori Owari
- Journal Title
  
  e-Journal of Surface Science and Nanotechnology
  
  Volume: 16 Pages: 190-192
- NAID
  130006744316
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Influence of the Shave-off Scan Speed on the Cross-Sectional Shape2018
- Author(s)
  So-Hee Kang, Yun Kim, Bunbunoshin Tomiyasu, Masanori Owari
- Journal Title
  
  e-Journal of Surface Science and Nanotechnology
  
  Volume: 16 Pages: 214-217
- NAID
  130007381533
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Angular Distribution of Secondary Ions under FIB-Shave-off Condition toward Development of Three-Dimensional Secondary Ion Image System2017
- Author(s)
  A. Habib, H. Asakura, M. Furushima, S.-H. Kang, Y. Kim, B. Tomiyasu and M. Owari
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 24 Pages: 159-163
- NAID
  130007405884
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Observation of the Gas Adsorption on the Surface of Catalytic Materials by Atom Probe Tomography2017
- Author(s)
  T. Egawa, Y. Kim, T. Suzuki and M. Owari
- Journal Title
  
  Proceedings of the 11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17
  
  Volume: - Pages: 386-387
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Emission trajectory calculation of ions from the Shave-off cross section for realization of 3D Shave-off method2017
- Author(s)
  Y. Takagi, S. Kang, K. Matsumura, T. Azuma, B. Tomiyasu and M. Owari
- Journal Title
  
  Proceedings of the 11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17
  
  Volume: - Pages: 395-396
- NAID
  130007404751
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article] Analysis of the Shape of Cross Sectons Developed under Shave-off Condition Sputtering2017
- Author(s)
  S.-H. Kang, M. Furushima, H. Asakura, A. Habib, Y. Kim, B. Tomiyasu and M. Owari
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 24 Pages: 164-166
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H03814
[Journal Article]2010
- Author(s)
  N.Mayama, T.Iwata, M.Nojima, M.Taniguchi, M.Owari, 他10名
- Journal Title
  
  Surf.Interface Anal. 42
  
  Pages: 1616-1621
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article]2010
- Author(s)
  N.Mayama, H.Yoshida, T.Iwata, K.Sasakawa, A.Suzuki, Y.Hanaoka, Y.Morita, A.Kuroda, M.Owari
- Journal Title
  
  Diam.Relat.Mater. 19
  
  Pages: 946-949
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article]2009
- Author(s)
  N.Mayama, Y.Kajiwara, S.Mikami, S.Ito, T.Kaneko, T.Iwata, M.Owari
- Journal Title
  
  e-JSSNT 7
  
  Pages: 35-38
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] e-JSSNT2009
- Author(s)
  N. Mayama, S. Mikami, S. Ito, T. Kaneko, T. Iwata, M. Taniguchi, M. Owari
- Journal Title
  
  7
  
  Pages: 70-73
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Surf2008
- Author(s)
  N. Mayama, C. Yamashita, T. Kaito, M. Nojima, M. Owari
- Journal Title
  
  Interface Anal. 40
  
  Pages: 1610-1613
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Surf2008
- Author(s)
  S. Ito, T. Kaneko, C. Yamashita, T. Kaito, T. Adachi, T. Iwata, N. Mayama, M. Nojima, M. Taniguchi, M. Owari
- Journal Title
  
  Interface Anal. 40
  
  Pages: 1696-1700
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Surf2008
- Author(s)
  T. Kaneko, S. Ito, C. Yamashita, N. Mayama, T. Iwata, M. Nojima, M. Owari
- Journal Title
  
  Interface Anal. 40
  
  Pages: 1688-1691
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Pin point depth profiling for unit device or several nano-devices2006
- Author(s)
  A.Maekawa, T.Yamamoto, Y.Ishizaki, R.Tanaka, M.Owari, M.Nojima, Y.Nihei
- Journal Title
  
  Surface and interface analysis 38・12-13
  
  Pages: 1747-1750
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Shave-off depth profiling of dendritic short-circuit growth caused by ion migration2006
- Author(s)
  T.Yamamoto, A.Maekawa, Y.Ishizaki, R.Tanaka, M.Owari, M.Nojima, Y.Nihei
- Journal Title
  
  Surface and interface analysis 38・12-13
  
  Pages: 1662-1665
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Surface structural analysis of h-BN/Ni(111) by X-ray photoelectron diffraction exited by Al-ka line and Cr-ka line2006
- Author(s)
  H.Mochiduki, K.Amano, M.Nojima, M.Owari, Y.Nihei
- Journal Title
  
  Surface and Interface Analysis (submitted)
- Data Source
  KAKENHI-PROJECT-17034058
[Journal Article] Improvement of a method for reconstructing the three-dimensional atom probe (3DAP) data2006
- Author(s)
  T.Chiba, M.Nojima, M.Owari
- Journal Title
  
  Surface and interface analysis 38・12-13
  
  Pages: 1751-1755
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Handling of the ice protective film for potential use in the 3D microscale analysis of biological samples2006
- Author(s)
  T.Iwanami, Yujing Liu, M.Okazaki, M.Nojima, T.Sakamoto, M.Owari
- Journal Title
  
  Surface and interface analysis 38・12-13
  
  Pages: 1658-1661
- Data Source
  KAKENHI-PROJECT-18GS0204
[Journal Article] Highly angular resolved photoelectron diffraction study on semiconductor surface phase transition2006
- Author(s)
  K.Amano H.Mochiduki, M.Nojima, M.Owari, Y.Nihei
- Journal Title
  
  Surface and Interface Analysis (submitted)
- Data Source
  KAKENHI-PROJECT-17034058
[Journal Article] Development of a separable-type of micro-scale glassware optimized for microscale chemical experiments in university laboratories.2004
- Author(s)
  B.Kim, Y.Tojo, T.Sakamoto, M.Owari
- Journal Title
  
  Chemical Education 52
  
  Pages: 172-173
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-15069207
[Journal Article] 大学における有機合成化学実験に対応したセパラブル・タイプのガラス製マイクロスケール実験用器具の開発2004
- Author(s)
  金朋央, 東條洋介, 坂本哲夫, 尾張真則
- Journal Title
  
  化学と教育 52(3)
  
  Pages: 172-173
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-15069207
[Patent] 試料及び電極ホルダユニット、位置調整台、並びに試料及び電極の装置への組付方法2007
- Inventor(s)
  尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
- Industrial Property Rights Holder
  尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
- Industrial Property Number
  2007-279318
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Patent] アトムプローブ用針状試料の加工方法及び集束イオンビーム装置2007
- Inventor(s)
  尾張真則, 皆藤孝, 野島雅
- Industrial Property Rights Holder
  尾張真則, 皆藤孝, 野島雅
- Industrial Property Number
  2007-279319
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Patent] アトムプローブ用針状試料の加工方法及び集束イオンビーム装置2007
- Inventor(s)
  尾張真則, 皆藤孝, 野島雅
- Industrial Property Rights Holder
  尾張真則, 皆藤孝, 野島雅
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Patent] 特許権2007
- Inventor(s)
  尾張真則, 他2名
- Industrial Property Rights Holder
  尾張真則, 他2名
- Industrial Property Number
  2007-279319
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Patent] 特許権2007
- Inventor(s)
  尾張真則, 他4名
- Industrial Property Rights Holder
  尾張真則, 他4名
- Industrial Property Number
  2007-279318
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Patent] 試料及び電極ホルダユニット、位置調整台、並びに試料及び電極の装置への組付方法2007
- Inventor(s)
  尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
- Industrial Property Rights Holder
  尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
- Filing Date
  2007-10-26
- Data Source
  KAKENHI-PROJECT-18GS0204
[Presentation] Study on the design of secondary ion optics to develop 3D shave-off SIMS2019
- Author(s)
  Shinnosuke Kishi,Kohei Matsumura,So-Hee Kang,Bunbunoshin Tomiyasu,Masanori Owari
- Organizer
  12th International Symposium on Atomic Level Characterizations for New Materials and Devices '19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02743
[Presentation] Simulation of secondary ions position on the detector for three-dimensional shave-off method2019
- Author(s)
  So-Hee Kang,Shinnosuke Kishi,Kohei Matsumura,Bunbunoshin Tomiyasu,Masanori Owari
- Organizer
  12th International Symposium on Atomic Level Characterizations for New Materials and Devices '19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-19H02743
[Presentation] 三次元Shave-off SIMSの実現に向けた二次イオン光学系の開発2018
- Author(s)
  松村康平, 姜　少煕, 冨安文武乃進, 尾張真則
- Organizer
  2018年度実用表面分析講演会
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] The interaction of O<sub>2</sub> and residual H on Pt surface: studied by field ion microscopy and in-situ surface atom probe2018
- Author(s)
  Sunwei Chen, Takumi Suzuki, Bunbunoshin Tomiyasu, Masanori Owari
- Organizer
  2018年度実用表面分析講演会
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] 電界イオン顕微鏡を用いた触媒表面反応の観察2018
- Author(s)
  鈴木　匠, CHEN Sunwei, 尾張真則
- Organizer
  2018年度実用表面分析講演会
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] Angular distribution of sputtered particles in shave-off section processing2018
- Author(s)
  S-Hee Kang, Takeki Azuma,Kohei Matumura,Bunbunoshin Tomiyasu,Masanori Owari
- Organizer
  2018年度実用表面分析講演会
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] アトムプローブ装置を利用した触媒表面観察に関する研究2017
- Author(s)
  江川卓也、金潤、鈴木匠、尾張真則
- Organizer
  2017年度実用表面分析講演会
- Invited
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] Observation of the Gas Adsorption on the Surface of Catalytic Materials by Atom Probe Tomography2017
- Author(s)
  T. Egawa, Y. Kim, T. Suzuki and M. Owari
- Organizer
  11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] Emission trajectory calculation of ions from the Shave-off cross section for realization of 3D Shave-off method2017
- Author(s)
  Y. Takagi, S. Kang, K. Matsumura, T. Azuma, B. Tomiyasu and M. Owari
- Organizer
  11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] Study on the time difference of the field evaporation between the shadow and the irradiated sides in laser-triggered APT2016
- Author(s)
  Yun Kim, Yutaro Hirai, Masanori Owari
- Organizer
  9th International Symposium on Practical Surface Analysis
- Place of Presentation
  Daejeon, Korea
- Year and Date
  2016-10-16
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H03814
[Presentation] Nanoscale Three-Dimensional Element Imaging-Introductory Talk2009
- Author(s)
  M.Owari
- Organizer
  7th International Symposium on Atomic Level Characterizations for New Materials and Devices
- Place of Presentation
  Hawaii, USA
- Year and Date
  2009-12-10
- Data Source
  KAKENHI-PROJECT-18GS0204
[Presentation]2009
- Author(s)
  M.Owari
- Organizer
  7th International Symposium on Atomic Level Characterizations for New Materials and Devices(招待講演)
- Place of Presentation
  Hawaii, USA.
- Year and Date
  2009-12-09
- Data Source
  KAKENHI-PROJECT-18GS0204
[Presentation] Development of Laser-Assisted Wide Angle Three-Dimensional Atom Probe and Its Application to Atomic Level Characterization of Real Electronic Devices2008
- Author(s)
  M. Owari
- Organizer
  The 10th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei
- Place of Presentation
  Tokyo, Japan
- Year and Date
  2008-07-17
- Data Source
  KAKENHI-PROJECT-18GS0204
[Presentation]2008
- Author(s)
  M.Owari
- Organizer
  The 10^<th> International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-10)(招待講演)
- Place of Presentation
  Tokyo, Japan.
- Data Source
  KAKENHI-PROJECT-18GS0204
[Presentation] Development of Laser-Assisted Three-Dimensional Atom Probe for Atomic Level Characterization of Real Electronic Devices2007
- Author(s)
  Masanori Owari
- Organizer
  6th International Symposium on Atomic Level Characterizations for New Materials and Devices'07
- Place of Presentation
  金沢市
- Year and Date
  2007-11-02
- Data Source
  KAKENHI-PROJECT-18GS0204

1. NIHEI Yoshimasa (10011016)

# of Collaborated Projects: 5 results

# of Collaborated Products: 2 results
2. SAKAMOTO Tetsuo (20313067)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
3. NOJIMA Masashi (50366449)

# of Collaborated Projects: 2 results

# of Collaborated Products: 10 results
4. TANIGUCHI Masahiro (30250418)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
5. MAYAMA Norihito (40508131)

# of Collaborated Projects: 1 results

# of Collaborated Products: 8 results
6. IWATA Tatsuo (20119647)

# of Collaborated Projects: 1 results

# of Collaborated Products: 6 results
7. NAKANISHI Junko (10010836)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. HARADA Masazumi (00040519)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. YOTSUYANAGI Takao (00001199)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. MIYATA Hideaki (80167676)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. HARAGUCHI Hiroki (70114618)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. KUDO Masahiro (10114464)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. ISHII Hideshi (30251466)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. KORENAGA Takashi (30124788)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. TAKEUCHI Toyohide (40135322)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. UCHIYAMA Kazumi (40151899)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. KAWAI Jun (60191996)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. 高橋敬雄 (70134955)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. 横山道子 (90280940)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 鶴田俊 (90197773)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. TANAKA Akihiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. OIKAWA Teiichi

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. DA Costa Man

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. DA Conceicao

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. MANOEL Quaresma da Costa

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
26. SILVA PINHEIRO Maria da

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
27. SILVA Pinhei

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
28. PINHEIRO Mar

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
29. CARDOSO Bern

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
30. GERALDO de A

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
31. 八幡需

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
32. YAHATA Motomu

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

OWARI Masanori 尾張 真則

尾張 正則 オワリ マサノリ

尾張 真則 オワリ マサノリ

尾張 直則 オワリ マサノリ

Research Projects

Research Products

Co-Researchers

3D shave-off分析法の開発と装置化Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Development of Active Site Atomic Resolution MicroscopyPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of laser-assisted wide angle three-dimensional atom probe and its application to atomic level characterization of true electronic devicesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Institution

高速・時間分解X線光電子分光/回折による表面自己組織化のダイナミクスの解明

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Downsizing studies on chemical experiments for minimization of environmental loads

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study on microscale chemical expenments for reduction of experiment wastesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Real tine characterization and control of growing interface structures of thin films

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of a direct analysis technique for organic compounds adsorbed on environmental small particlesPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Three-dimensional analysis of advanced industrial material using nano ion beamPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

微小領液高感度三次元分析法の研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on Mercury Pollution in The Amazonia, Brazil

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Comprehensive Research on Next Generation of Analytical Methodology for Environmental Protection

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Three-Dimensional Microanalysis usig Ion and Electron Dual Focused Beams

Principal Investigator

OWARI Masanori 尾張真則

尾張正則オワリマサノリ

尾張真則オワリマサノリ

尾張直則オワリマサノリ