Yamasue Kohei 山末耕平

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YAMASUE Kohei 山末耕平

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Researcher Number	70467455
Other IDs
Affiliation (Current)	2025: 東北大学, 電気通信研究所, 准教授
Affiliation (based on the past Project Information) *help	2015 – 2025: 東北大学, 電気通信研究所, 准教授 2010 – 2016: 東北大学, 電気通信研究所, 助教 2009: Kyoto University, 大学院・工学研究科, 助教 2008 – 2009: Kyoto University, 工学研究科, 助教
Review Section/Research Field	Principal Investigator Medium-sized Section 29:Applied condensed matter physics and related fields / Basic Section 29020:Thin film/surface and interfacial physical properties-related / Thin film/Surface and interfacial physical properties / Electron device/Electronic equipment / Communication/Network engineering Except Principal Investigator Electronic materials/Electric materials / Electron device/Electronic equipment / Power engineering/Power conversion/Electric machinery / Engineering / Science and Engineering
Keywords	Principal Investigator 走査型非線形誘電率顕微鏡 / 走査型非線形誘電率ポテンショメトリ / 走査型プローブ顕微鏡 / MOSFET / プローブ顕微鏡 / ワイドバンドギャップ半導体 / 局所CV特性測定 / 局所DLTS / 半導体 / パワーエレクトロニクス … More / 原子層材料 / キャリア物性 / 界面物性 / 層状物質 / グラフェン / 永久双極子 / 自発分極 / 強誘電体記録 / 走査プローブ顕微鏡 / 査定型プローブ顕微鏡 / 非線形動力学 / 走査プローブ顕微鏡・非線形動力学 / 表面・界面物性 / 時間遅れフィードバック制御 / 振動制御 / 制御工学 / マイクロ・ナノデバイス / カオス制御 … More Except Principal Investigator 走査型非線形誘電率顕微鏡 / 超高次非線形誘電率顕微鏡法 / 局所DLTS法 / 界面電荷輸送現象 / 超高次非線形誘電率顕微鏡法 / 走査型非線形誘電率ポテンショメトリ / 超高密度記録 / 強誘電体記録 / 走査型非線形誘電率ポテンショメリ / Dit分布観測 / 時間分解SNDM / 超高次SNDM法 / 走査型非線形誘電率顕微鏡法 / 時間分解SNDM法 / 次世代パワー半導体 / MOS界面 / 界面順位密度 / パワーデバイス / ワイドギャップ半導体 / 移動度 / 界面準位密度 / 時間分解走査型非線形誘電率顕微鏡 / MOS界面欠陥 / 走査型非線形誘電率ポテンショメリ / 超高次非線形誘電率顕微鏡 / 半導体デバイス計測 / 半導体原子計測 / 原子双極子モーメント / 半導体計測技術 / 原子分解能SNDM / オペランド計測． / SiCーMOSFET / 太陽電池 / グラフェン / 化合物パワー半導体デバイス / 超高次走査型非線形誘電率顕微鏡 / パラメトリック共振 / Arnoldの舌 / カンチレバー / MEMS / 微小エネルギー / ナノ・マイクロ機構 / 共振 / SNDM / プローブメモリ / ドメイン / 分極ドメイン / 強誘電体 / 高密度記録 Less

SNDMを用いた次世代パワーエレクトロニクスの創出に資する革新的評価技術の開発Principal Investigator
- Principal Investigator
  
  山末耕平
- Project Period (FY)
  2024 – 2027
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 29:Applied condensed matter physics and related fields
- Research Institution
  Tohoku University
Nano and atomic scale evaluation of atomic-layer materials and devices by scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  山末耕平
- Project Period (FY)
  2020 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 29020:Thin film/surface and interfacial physical properties-related
- Research Institution
  Tohoku University
界面電荷輸送現象解明のための高機能走査型非線形誘電率顕微鏡群の研究開発
- Principal Investigator
  
  長康雄
- Project Period (FY)
  2016
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tohoku University
Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopy
- Principal Investigator
  
  Cho Yasuo
- Project Period (FY)
  2016 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Tohoku University
Development of scanning nonlinear dielectric potentiometry and its applications to electronic materials and devices evaluationPrincipal Investigator
- Principal Investigator
  
  Yamasue Kohei
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Tohoku University
Energy-assisted ferroelectric recording using scanning nonlinear dielectric microscopyPrincipal Investigator
- Principal Investigator
  
  YAMASUE Kohei
- Project Period (FY)
  2012 – 2014
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
High functionalization of nonlinear dielectric microscopy and its application to electronic devices
- Principal Investigator
  
  Cho Yasuo
- Project Period (FY)
  2011 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Tohoku University
Development of mechanism for operating nano/micro structure and scavenging micro-energy
- Principal Investigator
  
  HIKIHARA Takashi
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Power engineering/Power conversion/Electric machinery
- Research Institution
  Kyoto University
Control of nonlinear cantilever oscillation in dynamic-mode atomic force microscopyPrincipal Investigator
- Principal Investigator
  
  YAMASUE Kohei
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Communication/Network engineering
- Research Institution
  Tohoku University
  Kyoto University
Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Technique
- Principal Investigator
  
  CHO Yasuo
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Specially Promoted Research
- Review Section
  
  Science and Engineering
  Engineering
- Research Institution
  Tohoku University

[Book] Nonlinear Dynamics of Nanosystems2010
- Author(s)
  Kohei Yamasue and Takashi Hikihara
- Publisher
  WILEY-VCH
- Data Source
  KAKENHI-PROJECT-21656074
[Book] Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, Chapter 9 in Nonlinear dynamics of nanosystems2010
- Author(s)
  Kohei Yamasue, Takashi Hikihara
- Publisher
  Wiley-VCH
- Data Source
  KAKENHI-PROJECT-20760238
[Book] Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, Chapter 9 inNonlinear Dynamics of Nanosystems2010
- Author(s)
  Kohei Yamasue and Takashi Hikihara
- Publisher
  Wiley-VCH
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interfaces Using Scanning Nonlinear Dielectric Microscopy2022
- Author(s)
  Yu Ogata, Kohei Yamasue, Xufang Zhang,Tsubasa Matsumoto, Norio Tokuda and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 1062 Pages: 298-303
- DOI
  10.4028/p-n0z51t
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] Boxcar averaging scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Nanomaterials
  
  Volume: 12 Issue: 5 Pages: 794-794
- DOI
  10.3390/nano12050794
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-20H02613
[Journal Article] Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue Yasuo Cho
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 135 Pages: 114588-114588
- DOI
  10.1016/j.microrel.2022.114588
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] Surface Potential Fluctuations of SiO2/SiC Interfaces Investigated by Local Capacitance-Voltage Profiling Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Materials Science Forum
  
  Volume: 1062 Pages: 335-340
- DOI
  10.4028/p-2t7zak
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K18706, KAKENHI-PROJECT-16H06360
[Journal Article] 走査型非線形誘電率顕微鏡の原理と半導体ナノスケール物性評価への応用2022
- Author(s)
  山末耕平
- Journal Title
  
  半導体・集積回路技術シンポジウム講演論文集
  
  Volume: 86
- Data Source
  KAKENHI-PROJECT-20H02613
[Journal Article] Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry2020
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Proceedings of the 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)
  
  Volume: － Pages: 1-4
- DOI
  10.1109/ifcs-isaf41089.2020.9234884
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20H02613
[Journal Article] Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy2020
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Journal of Applied Physics
  
  Volume: 128 Issue: 7 Pages: 074301-074301
- DOI
  10.1063/5.0016462
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20H02613
[Journal Article] Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy2019
- Author(s)
  Yamasue K.、Cho Y.
- Journal Title
  
  Microelectronics Reliability
  
  Volume: 100-101 Pages: 113345-113345
- DOI
  10.1016/j.microrel.2019.06.037
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Two-dimensional defect mapping of the SiO2/4H-SiC interface2019
- Author(s)
  Woerle Judith、Johnson Brett C.、Bongiorno Corrado、Yamasue Kohei、Ferro Gabriel、Dutta Dipanwita、Jung Thomas A.、Sigg Hans、Cho Yasuo、Grossner Ulrike、Camarda Massimo
- Journal Title
  
  Physical Review Materials
  
  Volume: 3 Issue: 8 Pages: 084602-084602
- DOI
  10.1103/physrevmaterials.3.084602
- Peer Reviewed / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy2018
- Author(s)
  Yamasue Kohei、Cho Yasuo
- Journal Title
  
  Applied Physics Letters
  
  Volume: 112 Issue: 24 Pages: 243102-243102
- DOI
  10.1063/1.5032277
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16H06360
[Journal Article] Introduction of Scanning Nonlinear Dielectric Microscopy and Its Applications to the Evaluation of Electronic Materials and Devices2017
- Author(s)
  山末耕平，茅根慎通，長康雄
- Journal Title
  
  The Journal of The Institute of Electrical Engineers of Japan
  
  Volume: 137 Issue: 10 Pages: 697-700
- DOI
  10.1541/ieejjournal.137.697
- NAID
  130006109857
- ISSN
  1340-5551, 1881-4190
- Language
  Japanese
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K04673
[Journal Article] Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, and Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 55 Issue: 8S1 Pages: 08NB02-08NB02
- DOI
  10.7567/jjap.55.08nb02
- NAID
  210000146969
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-16H06360
[Journal Article] Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, and Yasuo Cho
- Journal Title
  
  Physical Review Letters
  
  Volume: 114 Issue: 22 Pages: 226103-226103
- DOI
  10.1103/physrevlett.114.226103
- Peer Reviewed / Acknowledgement Compliant / Open Access
- Data Source
  KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-23000008, KAKENHI-PROJECT-23226008
[Journal Article] Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy2015
- Author(s)
  Masataka Suzuki, Kohei Yamasue, and Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 107 Issue: 3
- DOI
  10.1063/1.4927244
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] Scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Journal Title
  
  Review of Scientific Instruments
  
  Volume: 86 Issue: 9 Pages: 093704-093704
- DOI
  10.1063/1.4930181
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15K04673, KAKENHI-PROJECT-23226008
[Journal Article] Improved study of electric dipoles on the Si(100)-2x1 surface by non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
- Journal Title
  
  Applied Physics Letters
  
  Volume: 105 Issue: 10 Pages: 1016031-3
- DOI
  10.1063/1.4895031
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14F03355, KAKENHI-PROJECT-24656027, KAKENHI-PUBLICLY-26110516, KAKENHI-PROJECT-26600015, KAKENHI-PROJECT-23226008
[Journal Article] Atomic-dipole-moment induced local surface potential on Si(111)-(7x7) surface studied by non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
- Journal Title
  
  Applied Physics Letters
  
  Volume: 105 Issue: 12 Pages: 1216011-5
- DOI
  10.1063/1.4896323
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-14F03355, KAKENHI-PROJECT-24656027, KAKENHI-PUBLICLY-26110516, KAKENHI-PROJECT-26600015, KAKENHI-PROJECT-23226008
[Journal Article] Simultaneous measurement of tunneling current and atomic dipole moment on Si(111) -(7×7) surface by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Journal Title
  
  J. Appl. Phys.
  
  Volume: 113 Issue: 1
- DOI
  10.1063/1.4772705
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Atomic dipole moment distribution on a hydrogen-adsorbed Si(111) - (7×7) surface observed by noncontact scanning nonlinear dielectric microscopy2013
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 103 Issue: 10
- DOI
  10.1063/1.4820348
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy2013
- Author(s)
  N. Chinone, K. Yamasue, K. Honda, Y. Cho
- Journal Title
  
  Journal of Physics : Conference Series
  
  Volume: 471 Pages: 012023-012023
- DOI
  10.1088/1742-6596/471/1/012023
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy2012
- Author(s)
  Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho
- Journal Title
  
  Jpn. J. Appl. Phys
  
  Volume: Vol.51 Issue: 9S1 Pages: 09LE07-09LE07
- DOI
  10.1143/jjap.51.09le07
- NAID
  210000141273
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy2012
- Author(s)
  Nobuhiro Sawai
- Journal Title
  
  Jpn. J. Appl Phys.
  
  Volume: Vol.51 Issue: 12R Pages: 121801-121801
- DOI
  10.1143/jjap.51.121801
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008, KAKENHI-PROJECT-24656027
[Journal Article] Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy2011
- Author(s)
  Kohei Yamasue
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: Vol.50 Issue: 9S2 Pages: 09NE12-09NE12
- DOI
  10.1143/jjap.50.09ne12
- NAID
  210000071318
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23226008
[Journal Article] 遅延帰還を用いたダイナミックモード原子間力顕微鏡のカンチレバー振動の安定化2010
- Author(s)
  山末耕平, 引原隆士
- Journal Title
  
  顕微鏡
  
  Volume: 45(2) Pages: 137-139
- NAID
  130007788953
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] 遅延帰還を用いたダイナミックモード原子間力顕微鏡のカンチレバー振動の安定化2010
- Author(s)
  山末耕平, 引原隆士
- Journal Title
  
  顕微鏡
  
  Volume: 45 Pages: 137-139
- NAID
  130007788953
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] 遅延帰還を用いたダイナミックモード原子間力顕微鏡のカンチレバー振動の安定化2010
- Author(s)
  山末耕平, 引原隆士
- Journal Title
  
  顕微鏡
  
  Volume: 45 Pages: 137-139
- NAID
  130007788953
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21656074
[Journal Article] 原子間力顕微鏡における制御応用とその展望2009
- Author(s)
  山末耕平, 引原隆士
- Journal Title
  
  システム／制御／情報
  
  Volume: 53(6) Pages: 236-242
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] 原子間力顕微鏡における制御応用とその展望2009
- Author(s)
  山末耕平, 引原隆士
- Journal Title
  
  システム/制御/情報:システム制御情報学会誌 53
  
  Pages: 236-242
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] Controlling chaos in dynamic-mode atomic force microscope2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, Takashi Hikihara
- Journal Title
  
  Physics Letters A 373(35)
  
  Pages: 3140-3144
- NAID
  120002353771
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21656074
[Journal Article] Controlling chaos in dynamic-mode atomic force microscope2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, Takashi Hikihara
- Journal Title
  
  Physics Letters A
  
  Volume: 373(35) Pages: 3140-3144
- NAID
  120002353771
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21656074
[Journal Article] Controlling chaos in dynamic-mode atomic force microscope2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Journal Title
  
  Physics Letters A
  
  Volume: 373(35) Pages: 3140-3144
- NAID
  120002353771
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Journal Article] Controlling chaos in dynamic-mode atomic force microscope2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, Takashi Hikihara
- Journal Title
  
  Physics Letters A 373
  
  Pages: 3140-3144
- NAID
  120002353771
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy2023
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  7th IEEE Electron Devices Technology and Manufacturing(EDTM) Conference 2023
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 走査型非線形誘電率顕微鏡によるSiO2上機械剥離MoS2の局所DLTS測定2023
- Author(s)
  石塚太陽，山末耕平
- Organizer
  第70回応用物理学会春季学術講演会 16p-B414-3，上智大学四谷キャンパス+オンライン，Mar. 15-18 (2023)
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Local capacitance-voltage profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by scanning nonlinear dielectric microscopy assisted with an insulating tip2022
- Author(s)
  Taiyo Ishizuka, Kohei Yamasue, and Yasuo Cho
- Organizer
  2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 5C-MA1-4, virtual, March 6-9(2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy2022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  THE 22ND INTERNATIONAL VACUUM CONGRESS IVC-22
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 時間分解SNDMを用いた半導体のナノスケール評価に関する最近の展開2022
- Author(s)
  山末耕平
- Organizer
  ISSP workshop/東京大学物性研究所短期研究会 "Frontier of scanning probe microscopy and related nano science”「機能的走査プローブ顕微鏡の新展開」, オンライン, March 30-31(2022)
- Invited
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] 走査型非線形誘電率顕微鏡の原理と半導体ナノスケール物性評価への応用2022
- Author(s)
  山末耕平
- Organizer
  電気化学会電子材料委員会第86回半導体・集積回路技術シンポジウム, オンライン, August 30-31 (2022)
- Invited
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Scanning nonlinear dielectric microscopic investigation of mechanically exfoliated WSe2/SiO2 and suspended WSe22022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, and Yasuo Cho
- Organizer
  2022 MRS Fall Meeting & Exhibit, NM02.10.18, Boston, Massachusetts, USA, Nov. 27-Dec. 2 (2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy2022
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  International Workshop on Nitride Semiconductor(IWN2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe2/SiO2 and Suspended WSe22022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiaki Kato and Yasuo Cho
- Organizer
  2022 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy2022
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, and Yasuo Cho
- Organizer
  The 22nd International Vacuum Congress (IVC-22), Mon-J1-4, Sapporo Convention Center, Sapporo, Japan, Sep. 11-16 (2022).
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Nanoscale characterization techniques for ultra-thin van der Waals semiconductors based on scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 5th international symposium on “Elucidation of Next Generation Functional Materials, Surface and Interface Properties", Osaka University, Osaka, Japan, Oct. 7-9(2021)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Microscopic carrier distribution imaging of atomically-thin van der Waals semiconductors by scanning nonlinear dielectric microscopy2021
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2021 MRS Fall Meeting & Exhibit, EQ20.12.01, Boston, Massachusetts, USA, Nov. 29-Dec. 2 (2021)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Nanoscale analysis of unintentional p- to n-type transition on ultrathin MoS2 layers2021
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Nanoscale comparative study of electric field effects in atomically-thin WSe2 on SiO2 and suspended WSe22021
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, and Yasuo Cho
- Organizer
  2021 International Conference on Nanoscience + Technology (ICN+T 2021), virtual, July 12-15 (2021)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry2020
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Nanoscale comparison of bias dependent carrier distributions in mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy2020
- Author(s)
  Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, and Yasuo Cho
- Organizer
  51st IEEE Semiconductor Interface Specialists Conference (SISC), Virtual conference, Dec. 16-19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] SNDM の半導体応用に関する新技術－時間分解SNDMによる界面欠陥準位の可視化と絶縁膜付き探針を用いた層状構造半導体の観察－2020
- Author(s)
  長康雄，山末耕平
- Organizer
  日本学術振興会産学協力研究委員会，ナノプローブテクノロジー第167委員会
- Invited
- Data Source
  KAKENHI-PROJECT-20H02613
[Presentation] Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface2019
- Author(s)
  Judith Woerle, Brett Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Yasuo Cho, Ulrike Grossner, Massimo Camarda
- Organizer
  International Conference on Silicon Carbide and Related Materials 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation2019
- Author(s)
  Kohei Yamasue Yuji Yamagishi, Yasuo Cho
- Organizer
  International Conference on Silicon Carbide and Related Materials 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy2019
- Author(s)
  Jun Hirota, Ken Hoshino, Tsukasa Nakai, Kohei Yamasue, and Yasuo Cho
- Organizer
  International Symposium for Testing and Failure Analysis 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors2019
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy2019
- Author(s)
  Koharu Suzuki, Kohei Yamasue, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale carrier distribution imaging on atomically-thin layered semiconductors by scanning nonlinear dielectric microscop2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 2D Interface Defect Density Evaluation on Macrostepped SiO2/SiC Using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  A. Hosaka, K. Yamasue, J. Woerle, G. Ferro, U. Grossner, M. Camarda, and Y. Cho
- Organizer
  50th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy2019
- Author(s)
  Anna Hosaka, Kohei Yamasue, Judith Woerle, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho
- Organizer
  2019 International Integrated Reliability Workshop
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Improvement of Signal-to-Noise Ratio in Carrier Distribution Imaging in Intermittent Contact Scanning Nonlinear Dielectric Microscopy Based on Boxcar Integration2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  8th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Unintentional n-Type Doping on Single Layer Nb-Doped MoS2 Observed by Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2019 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  International Symposium for Testing and Failure Analysis 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry2019
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  The 17th International Conference on the Formation of Semiconductor Interfaces
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] A New Evaluation Technique for Interface Defect Density on High-κ/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy2019
- Author(s)
  K. Suzuki, K. Yamasue, and Y. Cho
- Organizer
  50th IEEE Semiconductor Interface Specialists Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Scanning nonlinear dielectric microscopy study on nanoscale carrier distribution in two dimensional semiconductors2018
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ICN+T2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] DC bias dependent nanoscale carrier distribution on a few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy2018
- Author(s)
  Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  ECOSS34
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] High-resolution observation of defects at nitride SiO2/4H-SiC interfaces by local deep level transient spectroscopy2018
- Author(s)
  Y. Yamagishi, K. Yamasue and Y. Cho
- Organizer
  ECSCRM2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy2018
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  45th Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-45), Sheraton Kona Resort & Spa, Kona, Hawaii, USA, Jan. 14 - Jan. 18
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] 走査型非線形誘電率顕微鏡を用いたSiO2上剥離WSe2観察におけるキャリア分布の直流バイアス依存性2018
- Author(s)
  山末耕平，加藤俊顕，金子俊郎，長康雄
- Organizer
  第65回応用物理学春季学術講演会
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Scanning nonlinear dielectric microscopy in peak-force tapping mode and its application to transition metal dichalcogenides2018
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ISPM2018
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Few-layer WSe2 on SiO2 Observed by Scanning Nonlinear Dielectric Microscopy and Electrostatic Force Microscopy2018
- Author(s)
  K. Yamasue, T. Kato, T. Kaneko and Y. Cho
- Organizer
  ACSIN-14 & ICSPM26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy2018
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  PCSI45
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Electric Field Effects on Few-Layer WSe2/SiO2 Investigated by Scanning Nonlinear Dielectric Microscopy2018
- Author(s)
  Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko and Yasuo Cho
- Organizer
  2018 MRS Fall Meeting & Exhibit
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 走査型非線形誘電率ポテンショメトリを用いたGaNの自発分極測定に関する実験的検討2017
- Author(s)
  山末耕平，長康雄
- Organizer
  2017年第64回応用物理学春季学術講演会
- Place of Presentation
  パシフィコ横浜，横浜市
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Local Carrier Distribution Imaging of Two-Dimensional Semiconductors by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  ICSPM25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 査型非線形誘電率顕微鏡によるSiO2/Si基板上の剥離二硫化モリブデンの観察2017
- Author(s)
  山末耕平，長康雄
- Organizer
  第78回応用物理学秋季学術講演会
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Local carrier distribution imaging of two-dimensional semiconductors by scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  25th International Colloquium on Scanning Probe Microscopy (ICSPM25), Atagawa Heights, Shizuoka, Japan, Dec. 7 - Dec. 9
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Atomic resolution imaging of MoS2 by noncontact scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  19th International Scanning Probe Microscopy Conference, Kyoto International Community House, Kyoto, Japan, May 16 - May 19
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Local carrier and charge distribution imaging on molybdenum disulfide by scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  8th International Symposium on Surface Science (ISSS-8), Tsukuba International Congress Center, Tsukuba, Japan, Oct. 22 - Oct. 26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Atomic resolution imaging and carrier type determination of Molybdenum disulfide by noncontact scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  ECOSS 33
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] “Atomic Resolution Imaging of MoS2 by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K.Yamasue and Y. Cho
- Organizer
  The 19th International Scanning Probe Microscopy Conference
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Atomic resolution imaging and carrier type determination of molybdenum disulfide by noncontact scanning nonlinear dielectric microscopy2017
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  33rd European Conference on Surface Science (ECOSS-33), Szeged, Hungary, Aug. 27 - Sep. 1
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Local Carrier and Charge Distribution Imaging on Molybdenum Disulfide by Scanning Nonlinear Dielectric Microscopy2017
- Author(s)
  K. Yamasue and Y. Cho
- Organizer
  ISSS-8 2017
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] 非接触走査型非線形誘電率ポテンショメトリによるSi(111)-(7×7)表面における分極電荷密度の原子スケール観察2016
- Author(s)
  山末耕平，長康雄
- Organizer
  2016年第77回応用物理学秋季学術講演会
- Place of Presentation
  朱鷺メッセ，新潟市
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  NC-AFM 2016
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Polarization charge density measurement by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  24th International Colloquium on Scanning Probe Microscopy
- Place of Presentation
  Hawaii Convention Center, Honolulu, United States of America
- Year and Date
  2016-12-14
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] 走査型非線形誘電率ポテンショメトリによる表面自発分極の測定に関する検討2016
- Author(s)
  山末耕平，長康雄
- Organizer
  2016年第62回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学大岡山キャンパス（東京都目黒区）
- Year and Date
  2016-03-19
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ecoss32
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  NC-AFM 2016
- Place of Presentation
  Nottingham,UK
- Year and Date
  2016-07-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] urface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ecoss32
- Place of Presentation
  Grenoble, France
- Year and Date
  2016-08-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  32nd European Conference on Surface Science
- Place of Presentation
  Alpexpo, Grenoble, France
- Year and Date
  2016-08-28
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry2016
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  19th International Conference on Non-Contact Atomic Force Microscopy
- Place of Presentation
  East Midlands, Conference Centre, Nottingham, United Kingdom
- Year and Date
  2016-07-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Polarization Charge Density Measurement by Noncontact Scanning Nonlinear Dielectric Potentiometry2016
- Author(s)
  K. Yamasue, and Y. Cho
- Organizer
  ICSPM24
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16H06360
[Presentation] Oxygen adsorption on a Si(100)-(2×1) surface studied by noncontact scanning nonlinear dielectric microscopy2015
- Author(s)
  M. Suzuki, K. Yamasue, and Y. Cho
- Organizer
  nc AFM 2015
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY：NEW STRATEGY FOR MESURING DIPOLE-INDUCED POTENTIALS IN ATOIMIC SCALE2015
- Author(s)
  Y. Cho, K. Yamasue
- Organizer
  ISPM Conference 2015
- Place of Presentation
  RIO DE JANEIRO, Brazil
- Year and Date
  2015-06-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho
- Organizer
  nc AFM 2015
- Place of Presentation
  Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] HYDROGEN-INTERCALATED GRAPHENE ON SiC STUDIED BY NONCONTACT SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY2015
- Author(s)
  Y. Cho, K. Yamasue, H. Fukidome,K. Funakubo, M. Suemitsu
- Organizer
  ISPM Conference 2015
- Place of Presentation
  RIO DE JANEIRO, Brazil
- Year and Date
  2015-06-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] 非接触走査型非線形誘電率ポテンショメトリによる4H-SiC(0001-)上グラフェンの観察2015
- Author(s)
  山末耕平，吹留博一，田島圭一郎，舩窪一智，末光眞希，長康雄
- Organizer
  2015年第76回応用物理学会秋季学術講演会
- Place of Presentation
  名古屋国際会議場（愛知県名古屋市）
- Year and Date
  2015-09-13
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Simultaneous Imaging of Atomically Resolved Topography and Potential of Graphene on C-Terminated Face of SiC Using Scanning Nonlinear Dielectric Potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Kazutoshi Funakubo, Maki Suemitsu, and Yasuo Cho
- Organizer
  18th International Conference on non contact Atomic Force Microscopy
- Place of Presentation
  Oustau Calendal, Cassis, France
- Year and Date
  2015-09-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  ECOSS-31
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2015-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of Oxygen Adsorbed Si(100)-(2x1) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy2015
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Yasuo Cho
- Organizer
  2015 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2015-11-29
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Graphene　on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry2015
- Author(s)
  K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, Y. Cho
- Organizer
  ICSPM23
- Place of Presentation
  ヒルトンニセコビレッジホテル，北海道虻田郡ニセコ町, Japan
- Year and Date
  2015-12-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2×1) surface2015
- Author(s)
  Kohei Yamasue, Masataka Suzuki, Yasuo Cho
- Organizer
  ECOSS-31
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2015-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Kazutoshi Funakubo, Maki Suemitsu, and Yasuo Cho
- Organizer
  The 31st European Conference on Surface Science
- Place of Presentation
  International Convention Center of Barcelona, Barcelona, Spain
- Year and Date
  2015-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry2015
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, and Yasuo Cho
- Organizer
  23rd International Colloquium on Scanning Probe Microscopy
- Place of Presentation
  ヒルトンニセコビレッジホテル（北海道虻田郡ニセコ町）
- Year and Date
  2015-12-10
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K04673
[Presentation] High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Dipole-Induced Potential Measurement Using Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Comparative Study on Pristine and Hydrogen-Intercalated Graphene on 4H-SiC(0001) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Study of Electric Dipole Moment Distribution on Si(100)-2×1 Surface by Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Masataka Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy2014
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Simultaneous Observation of Topography and Electric Dipole Moments on Si(100)-2×1 Surface Using Non-Contact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2014 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2014-11-30
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  K. Yamasue, Yasuo Cho
- Organizer
  ICN+T 2014
- Place of Presentation
  Vail, Colorado, USA
- Year and Date
  2014-07-20
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy2014
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  ECOSS30
- Place of Presentation
  Antalya, TURKEY
- Year and Date
  2014-08-31
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution2012
- Author(s)
  Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga Koichiro Honda, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  The 20th International Colloquium on Scanning Probe Microscopy
- Place of Presentation
  Naha, Japan
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices2012
- Author(s)
  N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA, Y. CHO
- Organizer
  International Conference on Nanoscience + Technology 2012
- Place of Presentation
  Paris, FRANCE
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)-7×7 Surface2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  2012 MRS fall meeting
- Place of Presentation
  Boston, USA
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants2012
- Author(s)
  N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda, Y. Cho
- Organizer
  The 15th European Microscopy Congress
- Place of Presentation
  Manchester, UK
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy2012
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy2012
- Author(s)
  Kohei Yamasue, Yasuo Cho
- Organizer
  15th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Cesky Krumlov, Czech Republic
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Observation of local dipole moments on cleaned Si(111) surface with defects by non-contact scanning nonlinear dielectric microscopy2011
- Author(s)
  Kohei YAMASUE
- Organizer
  14th International Conference on Noncontact Atomic Force Microscopy
- Place of Presentation
  Lindau, Germany
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] 非接触走査型非線形誘電率顕微鏡によるSi(111)表面のドメイン境界観察2011
- Author(s)
  山末耕平
- Organizer
  第58回応用物理学関係連合講演会
- Place of Presentation
  神奈川工科大学(厚木市)
- Year and Date
  2011-03-27
- Data Source
  KAKENHI-PROJECT-18002005
[Presentation] タッピングモードAFMにおけるカンチレバー非線形振動に関する実験的検討2009
- Author(s)
  山末耕平, 小林圭, 山田啓文, 松重和美, 引原隆士
- Organizer
  2009年秋季第70回応用物理学会学術講演会
- Place of Presentation
  富山大学五福キャンパス(富山県)
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Chaotic cantilever oscillation and its control in amplitude modulation atomic force microscopy2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, Takashi Hikihara
- Organizer
  2nd Multifrequency AFM Conference
- Place of Presentation
  Holiday Inn Madrid(スペイン,マドリード)
- Year and Date
  2009-09-15
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] 時間遅れフィードバック制御の振幅変調型原子間力顕微鏡への応用2009
- Author(s)
  山末耕平, 小林圭, 山田啓文, 松重和美, 引原隆士
- Organizer
  第58回理論応用力学講演会, OS24-1, カオスとその応用
- Place of Presentation
  日本学術会議
- Year and Date
  2009-06-10
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] 時間遅れフィードバック制御の振幅変調型原子間力顕微鏡への応用2009
- Author(s)
  山末耕平, 小林圭, 山田啓文, 松重和美, 引原隆士
- Organizer
  第58理論応用力学講演会
- Place of Presentation
  日本学術会議
- Year and Date
  2009-06-10
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Chaotic cantilever oscillation and its control in amplitude modulation atomic force microscopy2009
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  2nd Multifrequency AFM Conference
- Place of Presentation
  Holiday Inn Madrid, Madrid, Spain
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] タッピングモードAFMにおけるカンチレバー非線形振動に関する実験的検討2009
- Author(s)
  山末耕平, 小林圭, 山田啓文, 松重和美, 引原隆士
- Organizer
  2009年秋季第70回応用物理学会学術講演会, 8a-E-8
- Place of Presentation
  富山大学五福キャンパス
- Year and Date
  2009-09-08
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Stabilization of cantilever oscillation in tapping-mode AFM using time-delayed feedback control2008
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  2008年秋季第69回応用物理学会学術講演会
- Place of Presentation
  中部大学
- Year and Date
  2008-09-04
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Experimental study on stabilization of chaotic cantilever oscillation in AM-AFM by time-delayed feedback control2008
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008)
- Place of Presentation
  11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008)
- Year and Date
  2008-09-17
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Stabilization of cantilever oscillation in tapping-mode AFM using time-delayed feedback control2008
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  2008年秋季第69回応用物理学会学術講演会
- Place of Presentation
  中部大学, 愛知県春日井市
- Year and Date
  2008-09-04
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Control of chaotic sensor oscillation in dynamic-mode atomic force microscopy2008
- Author(s)
  Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  The 5th International Conference on Nonlinear Science (Dynamics Days Asia Pacific 5)
- Place of Presentation
  Nara, Japan
- Year and Date
  2008-09-11
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Control of chaotic sensor oscillation in dynamic-mode atomic force microscopy2008
- Author(s)
  Kobel Yamasue, Kei KobayaShi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  The 5th International Conference on Nonlinear Science (Dynamics Days Asia Pacific 5)
- Place of Presentation
  Nara Prefectural New Public Hall, Nara, Japan
- Year and Date
  2008-09-11
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Experimental study on stabilization of chaotic cantilever oscillation in AM-AFM by time-delayed feedback contro2008
- Author(s)
  Kohei. Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, and Takashi Hikihara
- Organizer
  11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008)
- Place of Presentation
  HOTEL Rafael-Atocha, Madrid, Spain
- Year and Date
  2008-09-17
- Data Source
  KAKENHI-PROJECT-20760238
[Presentation] Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Y. Cho, D. Mizuno, K. Yamasue
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Year and Date
  2013-09-09 – 2013-09-13
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7× 7) surface studied by noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue, Daisuke Mizuno, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Year and Date
  2013-08-05 – 2013-08-09
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] A new atomically resolved potentiometry for dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  the 30th European Conference on Surface Science
- Place of Presentation
  Antalya, Turkey
- Year and Date
  2014-08-31 – 2014-09-05
- Data Source
  KAKENHI-PROJECT-24760263
[Presentation] A novel method for simultaneous measurement of topography and dipole-induced local surface potential based on noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2014 International Conference on Nanoscience + Technology
- Place of Presentation
  Vail, Colorado, United States of America
- Year and Date
  2014-07-20 – 2014-07-25
- Data Source
  KAKENHI-PROJECT-24760263
[Presentation] Surface potentiometry based on scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  17th International Conference on non-contact Atomic Force Microscopy
- Place of Presentation
  Tsukuba, Japan
- Year and Date
  2014-08-04 – 2014-08-08
- Data Source
  KAKENHI-PROJECT-24760263
[Presentation] Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue , Yasuo Cho
- Organizer
  19th International Vacuum Congress
- Place of Presentation
  Paris, France
- Year and Date
  2013-09-09 – 2013-09-13
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy
- Author(s)
  N.Chinone, K.Yamasue, K.Honda,Y.Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK University of Oxford, UK Prague, Czech Republic University of Maryland College Park, Maryland, USA 発
- Year and Date
  2013-04-07 – 2013-04-11
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue , Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  ACSIN-12 & ICSPM21
- Place of Presentation
  Tsukuba, Japan
- Year and Date
  2013-11-04 – 2013-11-08
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
- Organizer
  18th Microscopy of Semiconducting Materials Meeting
- Place of Presentation
  University of Oxford, UK
- Year and Date
  2013-04-07 – 2013-04-11
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7× 7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  2013 MRS fall meeting
- Place of Presentation
  Boston, USA
- Year and Date
  2013-12-01 – 2013-12-06
- Data Source
  KAKENHI-PROJECT-23226008
[Presentation] Dipole-induced potential measurement using noncontact scanning nonlinear dielectric microscopy
- Author(s)
  Kohei Yamasue and Yasuo Cho
- Organizer
  2014 MRS Fall Meeting & Exhibit
- Place of Presentation
  Boston, Massachusetts, United States of America
- Year and Date
  2014-12-01 – 2014-12-05
- Data Source
  KAKENHI-PROJECT-24760263
[Presentation] Site specific measurement of surface potential shift on Si(111)-(7ｘ7) surface by noncontact scanning nonliear dielectric microscopy
- Author(s)
  Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
- Organizer
  NC-AFM 2013
- Place of Presentation
  University of Maryland College Park, Maryland, USA
- Year and Date
  2013-08-05 – 2013-08-09
- Data Source
  KAKENHI-PROJECT-23226008

1. CHO Yasuo (40179966)

# of Collaborated Projects: 5 results

# of Collaborated Products: 80 results
2. HIRANAGA Yoshiomi (70436161)

# of Collaborated Projects: 4 results

# of Collaborated Products: 4 results
3. HIROSE Ryusuke (60422143)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. KIN Nobuhiro (80418269)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. HIKIHARA Takashi (70198985)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
6. SATO Nobuo (70397602)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. 加藤俊顕 (20502082)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
8. SUGIMOTO Yoshiaki

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results

Yamasue Kohei 山末 耕平

YAMASUE Kohei 山末 耕平

Research Projects

Research Products

Co-Researchers

SNDMを用いた次世代パワーエレクトロニクスの創出に資する革新的評価技術の開発Principal Investigator

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Nano and atomic scale evaluation of atomic-layer materials and devices by scanning nonlinear dielectric microscopyPrincipal Investigator

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界面電荷輸送現象解明のための高機能走査型非線形誘電率顕微鏡群の研究開発

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Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopy

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Development of scanning nonlinear dielectric potentiometry and its applications to electronic materials and devices evaluationPrincipal Investigator

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Energy-assisted ferroelectric recording using scanning nonlinear dielectric microscopyPrincipal Investigator

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High functionalization of nonlinear dielectric microscopy and its application to electronic devices

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Development of mechanism for operating nano/micro structure and scavenging micro-energy

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Control of nonlinear cantilever oscillation in dynamic-mode atomic force microscopyPrincipal Investigator

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Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Technique

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[Book] Nonlinear Dynamics of Nanosystems2010

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[Book] Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, Chapter 9 in Nonlinear dynamics of nanosystems2010

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[Book] Nonlinear dynamics in atomic force microscopy and its control for nanoparticle manipulation, Chapter 9 inNonlinear Dynamics of Nanosystems2010

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Data Source

[Journal Article] Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interfaces Using Scanning Nonlinear Dielectric Microscopy2022

Author(s)

Journal Title

Yamasue Kohei 山末耕平

YAMASUE Kohei 山末耕平