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Sasaki Hirokazu  佐々木 宏和

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SASAKI HIROKAZU  佐々木 宏和

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Researcher Number 70649821
Affiliation (Current) 2025: 古河電気工業株式会社研究開発本部横浜研究所, 先端技術研究所, 主席
Affiliation (based on the past Project Information) *help 2016: 古河電気工業株式会社研究開発本部横浜研究所, 先端技術研究所, 主席
2014 – 2016: 古河電気工業株式会社研究開発本部横浜研究所, その他部局等, 主席
2015: 古河電気工業株式会社研究開発本部横浜研究所, その他部局等, その他
2015: 古河電気工業株式会社, 研究開発本部横浜研究所, その他
Review Section/Research Field
Except Principal Investigator
Nanomaterials engineering / Thin film/Surface and interfacial physical properties
Keywords
Except Principal Investigator
電子線 / 回折顕微法 / 位相イメージング / 小角散乱 / ナノ電磁場 / 原子分解能 / 制限視野回折 / 電子回折顕微法 / 電子回折
  • Research Projects

    (2 results)
  • Research Products

    (13 results)
  • Co-Researchers

    (2 People)
  •  Development of electron diffractive imaging for phase observations from the atomic level to micron scale

    • Principal Investigator
      Yamasaki Jun
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Osaka University
  •  Quantitative visualization of nanometer-scaled electromagnetic fields by a novel phase-imaging method based on small-angle electron scattering patterns

    • Principal Investigator
      Yamasaki Jun
    • Project Period (FY)
      2014 – 2015
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Nanomaterials engineering
    • Research Institution
      Osaka University

All 2016 2015 Other

All Journal Article Presentation

  • [Journal Article] Visualization of Nano Electric Fields by Electron Diffractive Phase Imaging2016

    • Author(s)
      山﨑 順, 島岡勇記, 佐々木宏和
    • Journal Title

      Materia Japan

      Volume: 55 Issue: 12 Pages: 581-581

    • DOI

      10.2320/materia.55.581

    • NAID

      130005170196

    • ISSN
      1340-2625, 1884-5843
    • Language
      Japanese
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Refined Phase Imaging by Electron Diffractive Imaging2016

    • Author(s)
      Jun Yamasaki, Yuki Shimaoka, and Hirokazu Sasaki
    • Organizer
      Microscopy and Microanalysis 2016 Meeting
    • Place of Presentation
      Columbus, Ohio, USA
    • Year and Date
      2016-07-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM2016

    • Author(s)
      Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Junji Yoshida, Kazuo Yamamoto, Tsukasa Hirayama Jun Yamasaki and Naoya Shibata
    • Organizer
      The 5th International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      WINC Aichi, Nagoya, Japan
    • Year and Date
      2016-05-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] 電子線回折を用いた定量的位相イメージング法2016

    • Author(s)
      山﨑 順, 島岡 勇記, 佐々木 宏和
    • Organizer
      日本顕微鏡学会 第72回学術講演会
    • Place of Presentation
      仙台国際センター
    • Year and Date
      2016-06-14
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Developing Quantitative Phase Imaging by Electron Diffractive Imaging2016

    • Author(s)
      Jun Yamasaki, Yuki Shimaoka, and Hirokazu Sasaki
    • Organizer
      The 5th International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      WINC Aichi, Nagoya, Japan
    • Year and Date
      2016-05-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast2015

    • Author(s)
      Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki and Naoya Shibata
    • Organizer
      Microscopy and Microanalysis 2015 Meeting
    • Place of Presentation
      Portland, USA
    • Year and Date
      2015-08-02
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] 各種電子顕微鏡法による半導体中の電位分布解析2015

    • Author(s)
      佐々木宏和, 大友晋哉、山本和夫、平山司、山﨑 順、柴田直哉
    • Organizer
      日本顕微鏡学会 第71回記念学術講演会
    • Place of Presentation
      京都国際会館
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-26600042
  • [Presentation] Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast2015

    • Author(s)
      Hirokazu Sasaki,Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki and Naoya Shibata
    • Organizer
      Microscopy and Microanalysis 2015 Meeting
    • Place of Presentation
      Portland, USA
    • Year and Date
      2015-08-02
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26600042
  • [Presentation] 各種電子顕微鏡法による半導体中の電位分布解析2015

    • Author(s)
      佐々木宏和、大友晋哉、山本和生、平山司、山﨑 順、柴田直哉
    • Organizer
      日本顕微鏡学会 第71回記念学術講演会
    • Place of Presentation
      京都国際会館、京都府京都市
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] 位相回復法を用いた半導体解析

    • Author(s)
      佐々木宏和、大友晋哉、山本和生、平山司、山崎 順、谷垣俊明、明石哲也
    • Organizer
      日本顕微鏡学会第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場 (千葉県)
    • Year and Date
      2014-05-11 – 2014-05-13
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Observation of electric field using electron diffractive imaging

    • Author(s)
      J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
    • Organizer
      18th International Microscopy Congress (IMC 2014)
    • Place of Presentation
      Prague (チェコ)
    • Year and Date
      2014-09-07 – 2014-09-12
    • Data Source
      KAKENHI-PROJECT-26600042
  • [Presentation] 位相回復法を用いた半導体解析

    • Author(s)
      佐々木宏和、大友晋哉、山本和生、平山司、山崎 順、谷垣俊明、明石哲也
    • Organizer
      日本顕微鏡学会第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場 (千葉県)
    • Year and Date
      2014-05-11 – 2014-05-13
    • Data Source
      KAKENHI-PROJECT-26600042
  • [Presentation] Observation of electric field using electron diffractive imaging

    • Author(s)
      J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
    • Organizer
      18th International Microscopy Congress (IMC 2014)
    • Place of Presentation
      Prague (チェコ)
    • Year and Date
      2014-09-07 – 2014-09-12
    • Data Source
      KAKENHI-PROJECT-26286049
  • 1.  Yamasaki Jun (40335071)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 9 results
  • 2.  TANAKA NOBUO (40126876)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 2 results

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