HATANO Hiroshi 波多野裕

… Alternative Names

波多野裕ハタノヒロシ

Less

Researcher Number	80238013
Affiliation (Current)	2026: 静岡理工科大学, 理工学部, 教授
Affiliation (based on the past Project Information) *help	2013 – 2016: 静岡理工科大学, 理工学部, 教授 2009 – 2013: Shizuoka Institute of Science and Technology, 理工学部, 准教授
Review Section/Research Field	Principal Investigator Electron device/Electronic equipment
Keywords	Principal Investigator シミュレーション / 宇宙線 / 放射線、粒子線 / 電子デバイス・機器 / トランジスタ寸法最適化 / ＣＭＯＳ / ＳＥＴシミュレーション / 変換アルゴリズム / ＣＶＳＬ / 回路設計 / デバイス設計 / 放射線、粒子線、宇宙線 / デバイス設計、シミュレーション

Research Projects
(2 results)
Research Products
(34 results)

ＳＥＴ耐性強化カスケード電圧スイッチ論理回路組み込み宇宙用ＬＳＩの開発研究Principal Investigator
- Principal Investigator
  
  波多野裕
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Shizuoka Institute of Science and Technology
SET Immune Spaceborne LSI Circuit Designs by Embedding Cascade Voltage Switch Logic Circuits, High-speed Gates, and Neuron MOS structuresPrincipal Investigator
- Principal Investigator
  
  HATANO Hiroshi
- Project Period (FY)
  2009 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Shizuoka Institute of Science and Technology

All 2017 2013 2012 2011 2010 2009 Other

All Journal Article Presentation Book

[Book] 「宇宙用集積回路・高性能半導体回路の研究」静岡理工科大学教授波多野裕研究論文集2017
- Author(s)
  波多野　裕
- Total Pages
  352
- Publisher
  松本印刷
- Data Source
  KAKENHI-PROJECT-26420324
[Journal Article] SET immune spaceborne CVSL and C^2VSL circuits2013
- Author(s)
  H. Hatano
- Journal Title
  
  Journal of Electrical and Control Engineering
  
  Volume: vol. 3, no. 5 Pages: 43-48
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] SET immune spaceborne CVSL and C2VSL circuits2013
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Journal of Electrical and Control Engineering
  
  Volume: vol.3 Pages: 43-48
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] ワン・チップ計算回路の設計試作2013
- Author(s)
  波多野　裕、岡部　恵太
- Journal Title
  
  静岡理工科大学紀要
  
  Volume: vol.21 Pages: 167-174
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A CMOS SRAM Test Cell Design Using Selectively Metal-Covered Transistors for a Laser Irradiation Failure Analysis2012
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  IEICE Trans. Electron.
  
  Volume: E95.C Issue: 11 Pages: 1827-1829
- DOI
  10.1587/transele.E95.C.1827
- NAID
  10031142829
- ISSN
  0916-8524, 1745-1353
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A CMOS SRAM test cell design using selectively metal-covered transistors for a laser irradiation failure analysis2012
- Author(s)
  H. Hatano
- Journal Title
  
  IEICE Trans. Electronics
  
  Volume: Vol. E95-C, no.11
- NAID
  10031142829
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Proceedings of the IEEE International Conference on Microelectronics Test Structures
  
  Pages: 77-81
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012
- Author(s)
  H. Hatano
- Journal Title
  
  Proceedings of the IEEE International Conference on Microelectronics Test Structures
  
  Pages: 77-81
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] シングル・イベント耐性強化宇宙用CVSL及びC2VSL回路2011
- Author(s)
  波多野裕
- Journal Title
  
  電子情報通信学会再生可能集積システム時限研究会,信学技報
  
  Volume: RIS11-8(信学技報) Pages: 1-6
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Proceedings of the 12th European Conference on Radiation Effects on Components and Systems
  
  Pages: 458-462
- DOI
  10.1109/radecs.2011.6131422
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011
- Author(s)
  H. Hatano
- Journal Title
  
  Proceedings of the 12th European Conference on Radiation Effects on Components and Systems, Sevilla
  
  Pages: 458-462
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Clocked cascade voltage switch logic (C2VSL) adders2011
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  The Bulletin of the Shizuoka Institute of Science and Technology
  
  Volume: Vol.19 Pages: 69-73
- NAID
  120006554284
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A fundamental analysis of single event effects on clocked CVSL (C2VSL) circuits with gated feedback2011
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  IEICE Trans.Electronics
  
  Volume: Vol.E94-C Pages: 1131-1134
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A fundamental analysis of single event effects on clocked CVSL (C^2VSL) circuits with gated feedback2011
- Author(s)
  H. Hatano
- Journal Title
  
  IEICE Trans. Electronics
  
  Volume: vol. E94-C, no. 6 Pages: 1131-1134
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effects on CVSL and CMOS exclusive-OR (EX-OR) circuits2010
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Proc.of RADECS
  
  Pages: 131-135
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A Single event effect analysis on C^2VSL circuit with gated feedback2010
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Proceedings of the 11th European Conference on Radiation Effects on Components and Systems
  
  Volume: PF-1 Pages: 1-4
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effect analysis on C^2VSL circuit with gated feedback2010
- Author(s)
  H. Hatano
- Journal Title
  
  Proceedings of the 11th European Conference on Radiation Effects on Components and Systems, Langenfeld
  
  Volume: PF-1 Pages: 1-4
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A single event analysis on static CVSL exclusive-OR circuits2010
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  IEICE Trans.Electronics
  
  Volume: Vol.E93-C Pages: 1471-1473
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] A single event analysis on static CVSL exclusive-OR circuits2010
- Author(s)
  H. Hatano
- Journal Title
  
  IEICE Trans. Electronics
  
  Volume: Vol. E93-C, no. 9 Pages: 1471-1473
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effects on CVSL and CMOS exclusive-OR (EX-OR) circuits2009
- Author(s)
  H. Hatano
- Journal Title
  
  Proceedings of the 10th European Conference on Radiation Effects on Components and Systems, Bruges
  
  Pages: 131-135
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effects on static and clocked cascade voltage switch logic circuits2009
- Author(s)
  H. Hatano
- Journal Title
  
  IEEE Trans. Nuclear Science
  
  Volume: vol.56, No.4 Pages: 1987-1991
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effects on CVSL and CMOS exclusive-OR(EX-OR)circuits2009
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  Proc.of RADECS PB1
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Journal Article] Single event effects on static clocked cascade voltage switch logic(CVSL)circuits2009
- Author(s)
  Hiroshi Hatano
- Journal Title
  
  IEEE Trans.Nuclear Science Vol.56
  
  Pages: 1987-1991
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] A simulation-based re-examination of single event transient pulse propagation failures in NOR/NAND devices2013
- Author(s)
  H. Hatano
- Organizer
  24th European Symposium on Reliability of Electron Devices
- Place of Presentation
  Failure Physics and Analysis
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012
- Author(s)
  H. Hatano
- Organizer
  Proceedings of the IEEE International Conference on Microelectronics Test Structures, pp.77–81
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012
- Author(s)
  Hiroshi Hatano
- Organizer
  IEEE International Conference on Microelectronics Test Structures
- Place of Presentation
  San Diego, USA
- Year and Date
  2012-03-20
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011
- Author(s)
  Hiroshi Hatano
- Organizer
  12th European Conference on Radiation Effects on Components and Systems
- Place of Presentation
  Seville, Spain
- Year and Date
  2011-09-21
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] シングル・イベント耐性強化宇宙用CVSL及びC2VSL回路2011
- Author(s)
  波多野裕
- Organizer
  電子情報通信学会再生可能集積システム時限研究会
- Place of Presentation
  慶応義塾大学(横浜市)
- Year and Date
  2011-10-15
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] シングル・イベント耐性強化宇宙用CVSL及びC^2VSL回路2011
- Author(s)
  波多野裕
- Organizer
  電子情報通信学会再生可能集積システム時限研究会
- Place of Presentation
  信学技報RIS11-8, pp.1-6
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011
- Author(s)
  H. Hatano
- Organizer
  Proceedings of the 12th European Conference on Radiation Effects on Components and Systems, pp. 458-462
- Place of Presentation
  Sevilla
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] A Single event effect analysis on C^2VSL circuit with gated feedback2010
- Author(s)
  Hiroshi Hatano
- Organizer
  11th European Conference on Radiation Effects on Components and Systems
- Place of Presentation
  Langenfeld, Austria
- Year and Date
  2010-09-23
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] Single event effect analysis on C^2VSL circuit with gated feedback2010
- Author(s)
  H. Hatano
- Organizer
  Proceedings of the 11th European Conference on Radiation Effects on Components and Systems, PF-1, pp.1-4
- Place of Presentation
  Langenfeld
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] Single event effects on CVSL and CMOS exclusive-OR (EX-OR) circuits2009
- Author(s)
  H. Hatano
- Organizer
  Proceedings of the 10th European Conference on Radiation Effects on Components and Systems, pp. 131-135
- Place of Presentation
  Bruges
- Data Source
  KAKENHI-PROJECT-21560375
[Presentation] A simulation-baced re-examination of single event transient pulse propagation failures in NOR/NAND devices
- Author(s)
  Hiroshi Hatano
- Organizer
  24th European Symposium Reliability on Electron Devices,Failure Physics and Analysis
- Place of Presentation
  Arcachon,France
- Data Source
  KAKENHI-PROJECT-21560375

HATANO Hiroshi 波多野 裕

波多野 裕 ハタノ ヒロシ

Research Projects

Research Products

ＳＥＴ耐性強化カスケード電圧スイッチ論理回路組み込み宇宙用ＬＳＩの開発研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

SET Immune Spaceborne LSI Circuit Designs by Embedding Cascade Voltage Switch Logic Circuits, High-speed Gates, and Neuron MOS structuresPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] 「宇宙用集積回路・高性能半導体回路の研究」静岡理工科大学教授波多野裕研究論文集2017

Author(s)

Total Pages

Publisher

Data Source

[Journal Article] SET immune spaceborne CVSL and C^2VSL circuits2013

Author(s)

Journal Title

Data Source

[Journal Article] SET immune spaceborne CVSL and C2VSL circuits2013

Author(s)

Journal Title

Data Source

[Journal Article] ワン・チップ計算回路の設計試作2013

Author(s)

Journal Title

Data Source

[Journal Article] A CMOS SRAM Test Cell Design Using Selectively Metal-Covered Transistors for a Laser Irradiation Failure Analysis2012

Author(s)

Journal Title

DOI

NAID

ISSN

Language

Data Source

[Journal Article] A CMOS SRAM test cell design using selectively metal-covered transistors for a laser irradiation failure analysis2012

Author(s)

Journal Title

NAID

Data Source

[Journal Article] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012

Author(s)

Journal Title

Data Source

[Journal Article] A proposition on test circuit structures using selectively metal-covered transistors for a laser irradiation failure analysis2012

Author(s)

Journal Title

Data Source

[Journal Article] シングル・イベント耐性強化宇宙用CVSL及びC2VSL回路2011

Author(s)

Journal Title

Data Source

[Journal Article] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Novel test circuit structures using selectively metal-covered transistors for a laser irradiation upset analysis2011

Author(s)

Journal Title

Data Source

[Journal Article] Clocked cascade voltage switch logic (C2VSL) adders2011

Author(s)

Journal Title

NAID

Data Source

[Journal Article] A fundamental analysis of single event effects on clocked CVSL (C2VSL) circuits with gated feedback2011

Author(s)

Journal Title

Data Source

[Journal Article] A fundamental analysis of single event effects on clocked CVSL (C^2VSL) circuits with gated feedback2011

Author(s)

Journal Title

Data Source

HATANO Hiroshi 波多野裕

波多野裕ハタノヒロシ