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SASAKI Osami  佐々木 修己

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… Alternative Names

佐々木 修己  ササキ オサミ

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Researcher Number 90018911
Other IDs
External Links
Affiliation (based on the past Project Information) *help 2005 – 2013: Niigata University, Institute of Science and Technology, Professor, 自然科学系, 教授
2004: 新潟大学, 工学部, 教授
2001 – 2002: 新潟大学, 工学部, 教授
1990: 新潟大学, 工学部, 助教授
1988: 新潟大学, 工学部, 助教授
1986: 新大, 工学部, 助手
Review Section/Research Field
Principal Investigator
Measurement engineering / 物理計測・光学 / Applied optics/Quantum optical engineering / Measurement engineering
Except Principal Investigator
Measurement engineering
Keywords
Principal Investigator
表面形状計測 / 波長走査 / 光干渉 / Distance measurement / Phase lock / Feedback Control / Tunable wavelength filter / Laser interferometry / Wavelength scanning / 液晶ファブリ・ペロ干渉素子 … More / レーザ干渉法 / 距離測定 / フェーズロック / フィードバック制御 / 可変波長フィルタ / レーザ干渉 / Photorefractive crystal / Optical tomographic imaging / Two-wave mixing / Wavelength-scanning laser / フォトリフラクティブ結晶 / 光断層画像 / 2光波混合 / 波長走査レーザ光 / 正弦波位相変調干渉計 / 半導体レーザ干渉計 / レーザ干渉計 / アゾベンゼン薄膜 / 金薄膜 / アゾベンゼン / 微細加工 / 金属膜 / 近接場 / プラズモン / 2波長干渉計 / 計測機器 / 流体軸受 / 正弦波位相変調 / 斜め入射干渉計 / 多波長干渉計 / 円筒内面形状 / 光干渉計測 / 信号推処理 / 信号推処 / 光干渉計 / 信号推定 / 形状計測 / 光波長走査 / レ-ザ干渉計 / 半導体レ-ザ … More
Except Principal Investigator
波長多重化 / 半導体レーザー / 光熱変調 / 静的波長走査 / 広帯域波長走査 / 外部共振器型光源 / インプロセス計測 / 光外部共振器 / 波長走査 / 干渉計 / 半導体レーザ Less
  • Research Projects

    (9 results)
  • Research Products

    (21 results)
  • Co-Researchers

    (3 People)
  •  Interferometric sensing with tomographic image produced by surface plasmonPrincipal Investigator

    • Principal Investigator
      SASAKI OSAMI
    • Project Period (FY)
      2012 – 2013
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Measurement engineering
    • Research Institution
      Niigata University
  •  Inner surface profile measurement of a cylindrical object by an oblique incidence and multiple-wavelength interferometerPrincipal Investigator

    • Principal Investigator
      SASAKI Osami
    • Project Period (FY)
      2009 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Measurement engineering
    • Research Institution
      Niigata University
  •  Sinusoidal wavelength-scanning interferometry for measurement of thickness and surface profiles of thin filmsPrincipal Investigator

    • Principal Investigator
      SASAKI Osami
    • Project Period (FY)
      2007 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Measurement engineering
    • Research Institution
      Niigata University
  •  In-process profile measurement system based on a multiple wavelength scanning laser diode

    • Principal Investigator
      SUZUKI Takamasa
    • Project Period (FY)
      2006 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Measurement engineering
    • Research Institution
      Niigata University
  •  Generation of a ruler marking every wavelength and its application to nano measurement by a wavelength-scanning interferometer with double feedback controlPrincipal Investigator

    • Principal Investigator
      SASAKI Osami
    • Project Period (FY)
      2004 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied optics/Quantum optical engineering
    • Research Institution
      Niigata University
  •  Three-dimensional tomographic imaging using wavelength-scanning laser and two-wave mixing and its applications to measurementsPrincipal Investigator

    • Principal Investigator
      SASAKI Osami
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Measurement engineering
    • Research Institution
      NIIGATA UNIVERSITY
  •  外乱除去機能をもつフェ-ズロック半導体レ-ザ-干渉計による実時間表面形状計測Principal Investigator

    • Principal Investigator
      佐々木 修己
    • Project Period (FY)
      1990
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      物理計測・光学
    • Research Institution
      Niigata University
  •  半導体レーザの直接変調を用いる正弦波位相変調干渉計に関する研究Principal Investigator

    • Principal Investigator
      佐々木 修己
    • Project Period (FY)
      1988
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      物理計測・光学
    • Research Institution
      Niigata University
  •  正弦波位相変調レーザ干渉法による超精密加工表面の形状計測Principal Investigator

    • Principal Investigator
      佐々木 修己
    • Project Period (FY)
      1986
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      物理計測・光学
    • Research Institution
      Niigata University

All 2013 2012 2011 2009 2008 2007 2004 Other

All Journal Article Presentation

  • [Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004

    • Author(s)
      O.Sasaki, K.Honma, T.Suzuki
    • Journal Title

      optical Engineering 43(6)

      Pages: 1329-1333

    • NAID

      120006747007

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560033
  • [Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004

    • Author(s)
      O.Sasaki, K.Honma, T.Suzuki
    • Journal Title

      Optical Engineering 43(6)

      Pages: 1329-1333

    • NAID

      120006747007

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16560033
  • [Presentation] 金属ナノピンホールにおけるエバネッセント波干渉計測2013

    • Author(s)
      篠田大伍, 鹿野貴仁, 大平泰生, 金子双男, 佐々木修己
    • Organizer
      秋季第74回応用物理学会学術講演会
    • Place of Presentation
      同志社大学
    • Year and Date
      2013-09-18
    • Data Source
      KAKENHI-PROJECT-24656254
  • [Presentation] アゾベンゼン薄膜を用いた金薄膜の微細加工法の検討2012

    • Author(s)
      鹿野貴仁, 大平泰生, 清水英彦, 佐々木修己, 金子双男, 川上貴浩
    • Organizer
      秋季第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛大学・松山大学
    • Year and Date
      2012-09-13
    • Data Source
      KAKENHI-PROJECT-24656254
  • [Presentation] Evaluation of liquid crystal thin films near a metallic probe utilizing evanescent wave interferometer2012

    • Author(s)
      Yasuo Ohdaira, Osami Sasaki, Kazunari Shinbo, Akira Baba, Keizo Kato and Futao Kaneko
    • Organizer
      KJF International Conference on Organic Materials for Electronics and Photonics 2012
    • Place of Presentation
      Tohoku University
    • Year and Date
      2012-08-31
    • Data Source
      KAKENHI-PROJECT-24656254
  • [Presentation] 多波長レーザ干渉計を用いた円筒内面形状計測2011

    • Author(s)
      森松孝文、佐々木修己、崔森悦、鈴木孝昌
    • Organizer
      電子情報通信学会信越支部大会
    • Data Source
      KAKENHI-PROJECT-21560443
  • [Presentation] Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer, Optics+Photonics 20092009

    • Author(s)
      O. Sasaki, R. Yamamura, K. Yokoyama, and T. Suzuki
    • Organizer
      Optical Inspection and Metrology for Non-Optics Industries
    • Place of Presentation
      San Deigo, USA
    • Data Source
      KAKENHI-PROJECT-21560443
  • [Presentation] Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer2009

    • Author(s)
      Osami Sasaki
    • Organizer
      Optics+Photonics 2009, SPIE
    • Place of Presentation
      San Diego, USA
    • Year and Date
      2009-08-03
    • Data Source
      KAKENHI-PROJECT-21560443
  • [Presentation] 外部共振器型半導体レーザ光源の静的波長制御に関する検討2008

    • Author(s)
      永井竜一, 鈴木孝昌, 佐々木修己
    • Organizer
      電気学会東京支部新潟支所研究発表会予稿集
    • Place of Presentation
      新潟大学
    • Year and Date
      2008-11-08
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] Wavelength-scanning interferometry using backpropagation of optical fields for shape measurement of thin plate2008

    • Author(s)
      O. Sasaki, Hirot Ashitate, and T. Suzuki
    • Organizer
      ICO21, Optical Instruments
    • Place of Presentation
      Australia, Congress
    • Data Source
      KAKENHI-PROJECT-19560419
  • [Presentation] A static wavelength scanning in a tunable external cavity laser diode2008

    • Author(s)
      Takamasa Suzuki, Shin Nagasaki, and Osami Sasaki
    • Organizer
      Proc. Of ICO21-2008 Congress
    • Place of Presentation
      シドニーコンベンションセンター
    • Year and Date
      2008-07-10
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] 外部共振器型半導体レーザ光源の静的波長制御に関する検討2008

    • Author(s)
      永井竜一, 鈴木孝昌, 佐々木修己
    • Organizer
      電気学会東京支部新潟支所研究発表会
    • Place of Presentation
      新潟大学工学部
    • Year and Date
      2008-11-08
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] 白色光源による正弦波状波長走査干渉計を用いた薄膜形状計測2008

    • Author(s)
      上野浩、佐々木修己、鈴木孝昌
    • Organizer
      OPTICS & PHOTONICS
    • Place of Presentation
      JAPAN
    • Data Source
      KAKENHI-PROJECT-19560419
  • [Presentation] A static wavelength scanning in a tunable external cavity laser diode2008

    • Author(s)
      Takamasa Suzuki, Shin Nagasaki, Osami Sasaki
    • Organizer
      ICO (International Commission for Optics)
    • Place of Presentation
      シドニー・コンベンションセンター(オーストラリア)
    • Year and Date
      2008-07-10
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] Sinusoidal wavelength-scanning interferometers for shape measurements2007

    • Author(s)
      O. Sasaki
    • Organizer
      Photonics Asia 2007, Advanced Materials and Devices for Sensing and Imaging III
    • Place of Presentation
      Shanghai China
    • Data Source
      KAKENHI-PROJECT-19560419
  • [Presentation] 外部共振器型半導体レーザ光源の波長制御に関する検討2007

    • Author(s)
      長崎 慎, 鈴木孝昌, 佐々木修己
    • Organizer
      電気学会東京支部新潟支所研究発表会予稿集
    • Place of Presentation
      長岡技術科学大学
    • Year and Date
      2007-11-23
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] 外部共振器型半導体レーザ光源の波長制御に関する検討2007

    • Author(s)
      長崎 慎, 鈴木孝昌, 佐々木修己
    • Organizer
      電気学会東京支部新潟支所研究発表会
    • Place of Presentation
      長岡技術科学大学
    • Year and Date
      2007-11-23
    • Data Source
      KAKENHI-PROJECT-18560409
  • [Presentation] Sinusoidal wavelength-scanning interferometers for shape measurements2007

    • Author(s)
      Osami Sasaki
    • Organizer
      Photonics Asia 2007, Proc. SPIE 6829, 682908
    • Place of Presentation
      Beijing, China
    • Year and Date
      2007-11-13
    • Data Source
      KAKENHI-PROJECT-19560419
  • [Presentation] Evaluation of liquid crystal thin films near a metallic probe utilizing evanescent wave interferometer

    • Author(s)
      Yasuo Ohdaira, Osami Sasaki, Kazunari Shinbo, Akira Baba, Keizo Kato and Futao Kaneko
    • Organizer
      KJF International Conference on Organic Materials for Electronics and Photonics
    • Place of Presentation
      東北大学
    • Data Source
      KAKENHI-PROJECT-24656254
  • [Presentation] アゾベンゼン薄膜を用いた金薄膜の微細加工法の検討

    • Author(s)
      鹿野貴仁,大平泰生,清水英彦,佐々木修己,金子双男,川上貴浩
    • Organizer
      2012年秋季第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛大学・松山大学
    • Data Source
      KAKENHI-PROJECT-24656254
  • [Presentation] 金属ナノピンホールにおけるエバネッセント波干渉計測

    • Author(s)
      篠田大伍,鹿野貴仁,大平泰生,金子双男,佐々木修己
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学
    • Data Source
      KAKENHI-PROJECT-24656254
  • 1.  SUZUKI Takamasa (40206496)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 12 results
  • 2.  OHDAIRA Yasuo (10361891)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 6 results
  • 3.  CHOI Samuel (60568418)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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