SASAKI Osami 佐々木修己

… Alternative Names

佐々木修己ササキオサミ

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Researcher Number	90018911
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2005 – 2013: Niigata University, Institute of Science and Technology, Professor, 自然科学系, 教授 2004: 新潟大学, 工学部, 教授 2001 – 2002: 新潟大学, 工学部, 教授 1990: 新潟大学, 工学部, 助教授 1988: 新潟大学, 工学部, 助教授 1986: 新大, 工学部, 助手
Review Section/Research Field	Principal Investigator 物理計測・光学 / Measurement engineering / Measurement engineering / Applied optics/Quantum optical engineering Except Principal Investigator Measurement engineering
Keywords	Principal Investigator 表面形状計測 / 光干渉 / 波長走査 / 半導体レ-ザ / レ-ザ干渉計 / 光波長走査 / 形状計測 / 信号推定 / 光干渉計 / 信号推処 … More / 信号推処理 / 光干渉計測 / 円筒内面形状 / 多波長干渉計 / 斜め入射干渉計 / 正弦波位相変調 / 流体軸受 / 計測機器 / 2波長干渉計 / プラズモン / 近接場 / 金属膜 / 微細加工 / アゾベンゼン / 金薄膜 / アゾベンゼン薄膜 / レーザ干渉計 / 半導体レーザ干渉計 / 正弦波位相変調干渉計 / 波長走査レーザ光 / 2光波混合 / 光断層画像 / フォトリフラクティブ結晶 / Wavelength-scanning laser / Two-wave mixing / Optical tomographic imaging / Photorefractive crystal / レーザ干渉 / 可変波長フィルタ / フィードバック制御 / フェーズロック / 距離測定 / レーザ干渉法 / 液晶ファブリ・ペロ干渉素子 / Wavelength scanning / Laser interferometry / Tunable wavelength filter / Feedback Control / Phase lock / Distance measurement … More Except Principal Investigator 半導体レーザ / 干渉計 / 波長走査 / 光外部共振器 / インプロセス計測 / 外部共振器型光源 / 広帯域波長走査 / 静的波長走査 / 光熱変調 / 半導体レーザー / 波長多重化 Less

Interferometric sensing with tomographic image produced by surface plasmonPrincipal Investigator
- Principal Investigator
  
  SASAKI OSAMI
- Project Period (FY)
  2012 – 2013
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Measurement engineering
- Research Institution
  Niigata University
Inner surface profile measurement of a cylindrical object by an oblique incidence and multiple-wavelength interferometerPrincipal Investigator
- Principal Investigator
  
  SASAKI Osami
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Measurement engineering
- Research Institution
  Niigata University
Sinusoidal wavelength-scanning interferometry for measurement of thickness and surface profiles of thin filmsPrincipal Investigator
- Principal Investigator
  
  SASAKI Osami
- Project Period (FY)
  2007 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Measurement engineering
- Research Institution
  Niigata University
In-process profile measurement system based on a multiple wavelength scanning laser diode
- Principal Investigator
  
  SUZUKI Takamasa
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Measurement engineering
- Research Institution
  Niigata University
Generation of a ruler marking every wavelength and its application to nano measurement by a wavelength-scanning interferometer with double feedback controlPrincipal Investigator
- Principal Investigator
  
  SASAKI Osami
- Project Period (FY)
  2004 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied optics/Quantum optical engineering
- Research Institution
  Niigata University
Three-dimensional tomographic imaging using wavelength-scanning laser and two-wave mixing and its applications to measurementsPrincipal Investigator
- Principal Investigator
  
  SASAKI Osami
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Measurement engineering
- Research Institution
  NIIGATA UNIVERSITY
外乱除去機能をもつフェ-ズロック半導体レ-ザ-干渉計による実時間表面形状計測Principal Investigator
- Principal Investigator
  
  佐々木修己
- Project Period (FY)
  1990
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  物理計測・光学
- Research Institution
  Niigata University
半導体レーザの直接変調を用いる正弦波位相変調干渉計に関する研究Principal Investigator
- Principal Investigator
  
  佐々木修己
- Project Period (FY)
  1988
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  物理計測・光学
- Research Institution
  Niigata University
正弦波位相変調レーザ干渉法による超精密加工表面の形状計測Principal Investigator
- Principal Investigator
  
  佐々木修己
- Project Period (FY)
  1986
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  物理計測・光学
- Research Institution
  Niigata University

All 2013 2012 2011 2009 2008 2007 2004 Other

All Journal Article Presentation

[Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004
- Author(s)
  O.Sasaki, K.Honma, T.Suzuki
- Journal Title
  
  optical Engineering 43(6)
  
  Pages: 1329-1333
- NAID
  120006747007
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16560033
[Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004
- Author(s)
  O.Sasaki, K.Honma, T.Suzuki
- Journal Title
  
  Optical Engineering 43(6)
  
  Pages: 1329-1333
- NAID
  120006747007
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-16560033
[Presentation] 金属ナノピンホールにおけるエバネッセント波干渉計測2013
- Author(s)
  篠田大伍, 鹿野貴仁, 大平泰生, 金子双男, 佐々木修己
- Organizer
  秋季第74回応用物理学会学術講演会
- Place of Presentation
  同志社大学
- Year and Date
  2013-09-18
- Data Source
  KAKENHI-PROJECT-24656254
[Presentation] アゾベンゼン薄膜を用いた金薄膜の微細加工法の検討2012
- Author(s)
  鹿野貴仁, 大平泰生, 清水英彦, 佐々木修己, 金子双男, 川上貴浩
- Organizer
  秋季第73回応用物理学会学術講演会
- Place of Presentation
  愛媛大学・松山大学
- Year and Date
  2012-09-13
- Data Source
  KAKENHI-PROJECT-24656254
[Presentation] Evaluation of liquid crystal thin films near a metallic probe utilizing evanescent wave interferometer2012
- Author(s)
  Yasuo Ohdaira, Osami Sasaki, Kazunari Shinbo, Akira Baba, Keizo Kato and Futao Kaneko
- Organizer
  KJF International Conference on Organic Materials for Electronics and Photonics 2012
- Place of Presentation
  Tohoku University
- Year and Date
  2012-08-31
- Data Source
  KAKENHI-PROJECT-24656254
[Presentation] 多波長レーザ干渉計を用いた円筒内面形状計測2011
- Author(s)
  森松孝文、佐々木修己、崔森悦、鈴木孝昌
- Organizer
  電子情報通信学会信越支部大会
- Data Source
  KAKENHI-PROJECT-21560443
[Presentation] Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer, Optics+Photonics 20092009
- Author(s)
  O. Sasaki, R. Yamamura, K. Yokoyama, and T. Suzuki
- Organizer
  Optical Inspection and Metrology for Non-Optics Industries
- Place of Presentation
  San Deigo, USA
- Data Source
  KAKENHI-PROJECT-21560443
[Presentation] Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer2009
- Author(s)
  Osami Sasaki
- Organizer
  Optics+Photonics 2009, SPIE
- Place of Presentation
  San Diego, USA
- Year and Date
  2009-08-03
- Data Source
  KAKENHI-PROJECT-21560443
[Presentation] 外部共振器型半導体レーザ光源の静的波長制御に関する検討2008
- Author(s)
  永井竜一, 鈴木孝昌, 佐々木修己
- Organizer
  電気学会東京支部新潟支所研究発表会予稿集
- Place of Presentation
  新潟大学
- Year and Date
  2008-11-08
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] Wavelength-scanning interferometry using backpropagation of optical fields for shape measurement of thin plate2008
- Author(s)
  O. Sasaki, Hirot Ashitate, and T. Suzuki
- Organizer
  ICO21, Optical Instruments
- Place of Presentation
  Australia, Congress
- Data Source
  KAKENHI-PROJECT-19560419
[Presentation] A static wavelength scanning in a tunable external cavity laser diode2008
- Author(s)
  Takamasa Suzuki, Shin Nagasaki, and Osami Sasaki
- Organizer
  Proc. Of ICO21-2008 Congress
- Place of Presentation
  シドニーコンベンションセンター
- Year and Date
  2008-07-10
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] 外部共振器型半導体レーザ光源の静的波長制御に関する検討2008
- Author(s)
  永井竜一, 鈴木孝昌, 佐々木修己
- Organizer
  電気学会東京支部新潟支所研究発表会
- Place of Presentation
  新潟大学工学部
- Year and Date
  2008-11-08
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] 白色光源による正弦波状波長走査干渉計を用いた薄膜形状計測2008
- Author(s)
  上野浩、佐々木修己、鈴木孝昌
- Organizer
  OPTICS & PHOTONICS
- Place of Presentation
  JAPAN
- Data Source
  KAKENHI-PROJECT-19560419
[Presentation] A static wavelength scanning in a tunable external cavity laser diode2008
- Author(s)
  Takamasa Suzuki, Shin Nagasaki, Osami Sasaki
- Organizer
  ICO (International Commission for Optics)
- Place of Presentation
  シドニー・コンベンションセンター(オーストラリア)
- Year and Date
  2008-07-10
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] Sinusoidal wavelength-scanning interferometers for shape measurements2007
- Author(s)
  O. Sasaki
- Organizer
  Photonics Asia 2007, Advanced Materials and Devices for Sensing and Imaging III
- Place of Presentation
  Shanghai China
- Data Source
  KAKENHI-PROJECT-19560419
[Presentation] 外部共振器型半導体レーザ光源の波長制御に関する検討2007
- Author(s)
  長崎慎, 鈴木孝昌, 佐々木修己
- Organizer
  電気学会東京支部新潟支所研究発表会予稿集
- Place of Presentation
  長岡技術科学大学
- Year and Date
  2007-11-23
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] 外部共振器型半導体レーザ光源の波長制御に関する検討2007
- Author(s)
  長崎慎, 鈴木孝昌, 佐々木修己
- Organizer
  電気学会東京支部新潟支所研究発表会
- Place of Presentation
  長岡技術科学大学
- Year and Date
  2007-11-23
- Data Source
  KAKENHI-PROJECT-18560409
[Presentation] Sinusoidal wavelength-scanning interferometers for shape measurements2007
- Author(s)
  Osami Sasaki
- Organizer
  Photonics Asia 2007, Proc. SPIE 6829, 682908
- Place of Presentation
  Beijing, China
- Year and Date
  2007-11-13
- Data Source
  KAKENHI-PROJECT-19560419
[Presentation] Evaluation of liquid crystal thin films near a metallic probe utilizing evanescent wave interferometer
- Author(s)
  Yasuo Ohdaira, Osami Sasaki, Kazunari Shinbo, Akira Baba, Keizo Kato and Futao Kaneko
- Organizer
  KJF International Conference on Organic Materials for Electronics and Photonics
- Place of Presentation
  東北大学
- Data Source
  KAKENHI-PROJECT-24656254
[Presentation] アゾベンゼン薄膜を用いた金薄膜の微細加工法の検討
- Author(s)
  鹿野貴仁，大平泰生，清水英彦，佐々木修己，金子双男，川上貴浩
- Organizer
  2012年秋季第73回応用物理学会学術講演会
- Place of Presentation
  愛媛大学・松山大学
- Data Source
  KAKENHI-PROJECT-24656254
[Presentation] 金属ナノピンホールにおけるエバネッセント波干渉計測
- Author(s)
  篠田大伍，鹿野貴仁，大平泰生，金子双男，佐々木修己
- Organizer
  第74回応用物理学会秋季学術講演会
- Place of Presentation
  同志社大学
- Data Source
  KAKENHI-PROJECT-24656254

1. SUZUKI Takamasa (40206496)

# of Collaborated Projects: 6 results

# of Collaborated Products: 12 results
2. OHDAIRA Yasuo (10361891)

# of Collaborated Projects: 2 results

# of Collaborated Products: 6 results
3. CHOI Samuel (60568418)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

SASAKI Osami 佐々木 修己

佐々木 修己 ササキ オサミ

Research Projects

Research Products

Co-Researchers

Interferometric sensing with tomographic image produced by surface plasmonPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Inner surface profile measurement of a cylindrical object by an oblique incidence and multiple-wavelength interferometerPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Sinusoidal wavelength-scanning interferometry for measurement of thickness and surface profiles of thin filmsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-process profile measurement system based on a multiple wavelength scanning laser diode

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Generation of a ruler marking every wavelength and its application to nano measurement by a wavelength-scanning interferometer with double feedback controlPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Three-dimensional tomographic imaging using wavelength-scanning laser and two-wave mixing and its applications to measurementsPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

外乱除去機能をもつフェ-ズロック半導体レ-ザ-干渉計による実時間表面形状計測Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

半導体レーザの直接変調を用いる正弦波位相変調干渉計に関する研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

正弦波位相変調レーザ干渉法による超精密加工表面の形状計測Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004

Author(s)

Journal Title

NAID

Description

Data Source

[Journal Article] Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control2004

Author(s)

Journal Title

NAID

Description

Data Source

[Presentation] 金属ナノピンホールにおけるエバネッセント波干渉計測2013

Author(s)

Organizer

Place of Presentation

Year and Date

Data Source

[Presentation] アゾベンゼン薄膜を用いた金薄膜の微細加工法の検討2012

Author(s)

Organizer

SASAKI Osami 佐々木修己

佐々木修己ササキオサミ