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IHSIKAWA Akira  石川 晃

ORCIDConnect your ORCID iD *help
Researcher Number 90023241
Other IDs
External Links
Affiliation *help 2004 – 2005 : 日本大学, 文理学部, 教授
Review Section/Research Field
Principal Investigator
Thin film/Surface and interfacial physical properties
Keywords
Principal Investigator
電子顕微鏡 / イオン捕集 / 隔膜 / 含水試料観察 / 電子線透過率 / ガス雰囲気試料室 / Environmental Cell / その場観察 / Electron Transmittance / 高耐圧隔膜 … More / Hydrated Specimens / 含水試料 / 試料損傷 / Ion Collection / Electron microscope / In-situ Observation / Sealing Film Less
  • Research Projects

    (1results)
  • Research Products

    (2results)
  •  Development of Versatile Environmental Cell for Electron MicroscopePrincipal Investigator

    • Principal Investigator
      IHSIKAWA Akira
    • Project Period (FY)
      2004 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nihon University

All 2004

All Journal Article

  • [Journal Article] 雰囲気試料室2004

    • Author(s)
      石川 晃
    • Journal Title

      顕微鏡 39.2

      Pages : 99-104

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16560025
  • [Journal Article] 雰囲気試料室2004

    • Author(s)
      石川 晃
    • Journal Title

      顕微鏡 39

      Pages : 99-104

    • Data Source
      KAKENHI-PROJECT-16560025

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