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TAKAKUBO Hajime  高窪 統

ORCIDConnect your ORCID iD *help
… Alternative Names

高窪 統  タカクボ ハジメ

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Researcher Number 90245796
External Links
Affiliation (based on the past Project Information) *help 2004 – 2007: 中央大学, 理工学部, 教授
2000 – 2001: 中央大学, 理工学部, 助教授
Review Section/Research Field
Principal Investigator
Electron device/Electronic equipment / 電子デバイス・機器工学
Keywords
Principal Investigator
低電圧アナログ回路 / Fourquadrant-input analog multiplier / Voltage reference / Low leakage MOSFET / Subthreshold MOSFET / Voltage detector / Low power analog circuit / On-chip temperature sensor / Low voltage analog circuits / 掛け算回路 … More / オンチップセンサ / 4象限掛け算回路 / CMOS温度センサ / 基準電流発生回路 / 4象限アナログ掛け算回路 / 基準電圧発生回路 / 低リークMOSFET / 弱反転領域で動作するMOSFET / 電圧検出器 / 低消費電力アナログ回路 / スマート温度センサ / ボルテージボロワ / OTA / 低電圧CMOS回路 / CMOSアナログ回路 / 電圧減衰回路 / 弱反転領域 Less
  • Research Projects

    (2 results)
  • Research Products

    (16 results)
  •  Study on System LSI using Low Voltage and Low Power CMOS Analog Integrated Circuit ThchnologyPrincipal Investigator

    • Principal Investigator
      TAKAKUBO Hajime
    • Project Period (FY)
      2004 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Electron device/Electronic equipment
    • Research Institution
      Chuo University
  •  2段積み構成を用いたCMOSアナログ回路Principal Investigator

    • Principal Investigator
      高窪 統
    • Project Period (FY)
      2000 – 2001
    • Research Category
      Grant-in-Aid for Encouragement of Young Scientists (A)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Chuo University

All 2008 2007 2006 2005 2004

All Journal Article Presentation

  • [Journal Article] A CMOS Temperature-to-Pulse-Width Converter with a Current Comparator2008

    • Author(s)
      Takuya, Yamashita, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      in Proceedings on the 21st Workshop on Circuits and Systems in Karuizawa Vol. 1

    • NAID

      40016083639

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Journal Article] Four-Quadrant-Input Linear Transconductor Employing Source and Sink Currents Pair for Analog Multiplier2006

    • Author(s)
      Masakazu, Mizokami, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      IEICE Transactions on Fundamentals of electronics, communications and computer sciences Vol. E89-A, No. 2

      Pages: 362-368

    • NAID

      110004656480

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Journal Article] CMOS Zero-Temperature-Coefficient Point Voltage Reference with Variable-Output-Voltage Level2005

    • Author(s)
      Hidetoshi, Ikeda, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      IEICE Transactions on Fundamentals of electronics, communications and computer sciences Vol. E88-A, No. 2

      Pages: 476-482

    • NAID

      110003213330

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Journal Article] Switched capacitor DC-DC converter using nested structure2005

    • Author(s)
      Genta, Okabe, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      in Proceedings on the 18th Workshop on Circuits and Systems in Karuizawa Vol. 1

      Pages: 79-84

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Journal Article] Four-quadrant Multiplying Approach with Low Distortion Voltage -to-Current Convertor in Saturation2004

    • Author(s)
      Masakazu, Mizokami, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      in Proceedings on the 2004 IEEJ International Analog VLSI Workshop Vol. 1

      Pages: 1-6

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Journal Article] CMOS Linear-Voltage-Output Temperature Sensor based on Characteristic of Zero-Temperature-Coefficient Point2004

    • Author(s)
      Hidetoshi, Ikeda, Kawori, Takakubo, Hajime, Takakubo
    • Journal Title

      in Proceedings on the 2004 IEEJ International Analog VLSI Workshop Vol. 1

      Pages: 67-72

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] PTAT Circuit using Characteristic of Subthreshold MOSFET2008

    • Author(s)
      Naoto, Tamura, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan
    • Place of Presentation
      Aiti
    • Year and Date
      2008-03-27
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] A low power consumption Voltage Detector operating in minute current2007

    • Author(s)
      Kohei, Sakamoto, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan
    • Place of Presentation
      Kagoshima
    • Year and Date
      2007-10-11
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] A consideration of leakage current suppression of MOSFET in off-state2007

    • Author(s)
      Kawori, Takakubo, Torn, Etou, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan
    • Place of Presentation
      Niigata
    • Year and Date
      2007-12-07
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] MOSFETにおけるリーク電流低減に関する一考察2007

    • Author(s)
      高窪 統
    • Organizer
      電気学会電子回路研究会
    • Place of Presentation
      日本大学(新潟県)
    • Year and Date
      2007-12-07
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] MOSFETにおけるリーク電流低減に関する一考察2007

    • Author(s)
      高窪 統
    • Organizer
      電気学会電子回路研究会
    • Place of Presentation
      日本大学(新潟)
    • Year and Date
      2007-12-07
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] Temperature sensor using characteristic of MOSFET operating in weak inversion region2006

    • Author(s)
      Yosuke, Itabashi, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan
    • Place of Presentation
      Ohita
    • Year and Date
      2006-01-26
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] A CMOS Current Reference Independent of Deviation of Threshold Voltage2006

    • Author(s)
      Masashi, Negishi, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      Technical Report of IEICE
    • Place of Presentation
      Hokkaido
    • Year and Date
      2006-06-22
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] Low leakage MOS switch using the body effect2005

    • Author(s)
      Daisuke, Kibe, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan
    • Place of Presentation
      Tochigi
    • Year and Date
      2005-12-16
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] CMOS Current Reference based on using Zero-Temperature-Coefficient Point2005

    • Author(s)
      Yusuke, Wada, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan, ETC-05-96
    • Place of Presentation
      Tochigi
    • Year and Date
      2005-12-16
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309
  • [Presentation] CMOS Voltage Reference using a characteristics of weak inversion region and linear region2005

    • Author(s)
      Kuniya, Abe, Kawori, Takakubo, Hajime, Takakubo
    • Organizer
      The Papers of Technical Meeting on Electronic Circuits, IEE Japan ETC-05-98
    • Place of Presentation
      Tochigi
    • Year and Date
      2005-12-16
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16560309

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