NAGATOMI Takaharu 永富隆清

… Alternative Names

永富清隆ナガトミタカハル

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Researcher Number	90314369
Other IDs
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Affiliation (based on the past Project Information) *help	2011 – 2012: 大阪大学, 大学院・工学研究科, 助教 2011: 大阪大学, 工学(系)研究科(研究院), 助教 2009 – 2010: Osaka University, 工学研究科, 助教 2007 – 2008: Osaka University, Graduate School of Engineering, Assistant Professor 2006: 大阪大学, 大学院工学研究科, 助手 … More 2000 – 2004: 大阪大学, 大学院・工学研究科, 助手 2003: 大阪大学, 助手 2000 – 2002: 大阪大学, 工学研究科, 助手 Less
Review Section/Research Field	Principal Investigator Thin film/Surface and interfacial physical properties / Applied physics, general / Applied physics, general Except Principal Investigator Thin film/Surface and interfacial physical properties / Applied physics, general / Applied physics, general
Keywords	Principal Investigator 絶縁物 / 二次電子 / 帯電 / 表面励起 / MC simulation / rotor-type X-ray source / wavelength-tunable X-ray source / high-brightness X-ray source / nano-film / MCシミュレーション … More / 回転対陰極式X線源 / 波長可変X線源 / 高輝度X線源 / ナノ薄膜 / 金ナノ粒子 / X線光電子 / 光電子 / 表面プラズモンポラリトン / エキソ電子 / エミッター / イオン化断面積 / 二次電子放出 / オージェ電子分光法 / 低速イオン銃 / 高分解能深さ分析 / 低速イオン / Extended Landau theory / データベース構築 / 表面プラズモン / バルクプラズモン / 反射電子エネルギー損失分光法 / 実効エネルギー損失関数 / extended Lnadau theory … More Except Principal Investigator DNA / 球面収差補正 / Spherical aberration Correction / Aberration-Free observation / 位相像観察 / 超解像位相差電子顕微鏡 / 生体試料観察 / 透過型高分解能電子顕微鏡 / Transmission Electron Microscope / 3次元フーリエ・フィルタリング法 / DNA分子直視観察 / ミニマムドーズシステム / Phase Electron Microscope / Bio Medical Sample / 3次元フーリエフィルタリング法 / low electron dose / radiation damage / 3 dimensional Fourier filtering / phase reconstruction / aberration correction / tansmission electron microscope / 低ドーズ観察 / 電子線照射損傷 / 位相像再構成 / 収差補正 / 透過型電子顕微鏡 / unstained biological sample / Three Dimensional Fourier Filtering / Low electron dose / Phase Electron Microscopy / Molecular structure / Sealing Film / Environmental Cell / Transmission Elecron Microscope / ガス雰囲気対応 / 圧力隔壁膜 / 環境ホルダー / 無収差結像 / コマ収差 / 色収差 / 球面収差 / 位相・振幅分離再生 / 波動場再構成 / 色消し結像条件 / 色収差補正 / 動的ホローコーン照明 / 高分解能電子顕微鏡 / 真空蒸着 / 超高真空電子顕微鏡 / ガス雰囲気観察 / 発光中心 / 希土類金属 / 電子線照射 / シリコンナノドット Less

表面プラズモンポラリトンを介した自由な低速光電子と光との間の相互作用の実証Principal Investigator
- Principal Investigator
  
  永富隆清
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
パルス照射による絶縁物の帯電及び二次電子放出の過渡解析法の開発と展開Principal Investigator
- Principal Investigator
  
  永富隆清
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Study on Secondary Electron Emission from Insulator and Construction of Database of Secondary Electron YieldPrincipal Investigator
- Principal Investigator
  
  NAGATOMI Takaharu
- Project Period (FY)
  2009 – 2010
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Simultaneous correction of spherical and chromatic aberrations by dynamic hollow-cone illumination
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
Development of bio electron microscopy under ultra low electron dose conditions
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2006 – 2007
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
UHV-TEMを用いたLa注入シリコンナノドットアレイ電界発光素子の開発
- Principal Investigator
  
  KIMURA Yoshihide
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Osaka University
超低速イオンを用いたシャロードープ層の原子レベル深さ分析Principal Investigator
- Principal Investigator
  
  永富隆清
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Young Scientists (A)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of Super Resolution Bio-Phase Transmission Electron Microscopy
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Direct Observation of DNA at a Molecular Scale Level by Three-Dimensional Fourier Filtering Method
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of high-brightness and wavelength-tunable nano-film-rotor-type X-ray sourcePrincipal Investigator
- Principal Investigator
  
  NAGATOMI Takaharu
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Extended Landau Theoryによる実効エネルギー損失関数の導出Principal Investigator
- Principal Investigator
  
  永富隆清
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University
Development of TEM specimen Holder Enabling Atomic Level Observation under One Atomospheric Pressure
- Principal Investigator
  
  TAKAI Yoshizo
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied physics, general
- Research Institution
  Osaka University

All 2012 2011 2010 2009 2005 2004 Other

All Journal Article Presentation

[Journal Article] 半球型電子分光器を搭載したオージェ電子分光装置のジオメトリー特性に基づいた傾斜ホルダーを利用した高感度,高深さ分解能オージェ深さ方向分析2012
- Author(s)
  荻原俊弥, 永富隆清, 金慶中, 田沼繁夫
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 174-181
- NAID
  130005141467
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23686009
[Journal Article] 表面電子分光法および深さ方向分析の標準化2012
- Author(s)
  鈴木峰晴, 永富隆清, 高橋和裕
- Journal Title
  
  ぶんせき
  
  Pages: 371-377
- NAID
  10030826220
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23686009
[Journal Article] 半球型電子分光器を搭載したオージェ電子分光装置のジオメトリー特性に基づいた傾斜ホルダーを利用した高感度,高深さ分解能オージェ深さ方向分析2012
- Author(s)
  荻原俊弥, 永富隆清, 金慶中, 田沼繁夫
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 174-181
- NAID
  130005141467
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032
[Journal Article] Changes in Ionization Potentials of MgO and CaO Films upon Heating in Air and Vacuum Investigated by Metastable De-excitation Spectroscopy2012
- Author(s)
  K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, Y. Doi, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, Y. Takai
- Journal Title
  
  Applied Surface Science
  
  Volume: 259 Pages: 135-141
- DOI
  10.1016/j.apsusc.2012.07.005
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032, KAKENHI-PROJECT-23656580, KAKENHI-PROJECT-23686009
[Journal Article] 半球型電子分光器を搭載したオージェ電子分光装置のジオメトリー特性に基づいた傾斜ホルダーを利用した高感度，高深さ分解能オージェ深さ方向分析2012
- Author(s)
  荻原俊弥，永富隆清，金慶中，田沼繁夫
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 174-181
- NAID
  130005141467
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032
[Journal Article] Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels2011
- Author(s)
  K. Yoshino, T. Nagatomi, Y. Morita, T. Oue, N. Kosugi, M. Nishitani, M. Kitagawa, and Y. Takai,
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 50 Issue: 2R Pages: 026201-026201
- DOI
  10.1143/jjap.50.026201
- NAID
  40018283331
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032, KAKENHI-PROJECT-23686009
[Journal Article] Effects of Carbon Contaminations on Electron-Induced Damage of SiO2 Film Surface at Different Electron Primary Energies2011
- Author(s)
  T. Nagatomi, H. Nakamura, Y. Takai, T. Ogiwara, T. Kimura, and S. Tanuma
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 26-35
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032
[Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels2011
- Author(s)
  K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, Y. Takai
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 13-25
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23686009
[Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels2011
- Author(s)
  K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, and Y. Takai
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 13-25
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032
[Journal Article] Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels2011
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics Vol.50
- NAID
  40018283331
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Effects of Carbon Contaminations on Electron-Induced Damage of SiO2 Film Surface at Different Electron Primary Energies2011
- Author(s)
  T. Nagatomi, H. Nakamura, Y. Takai, T. Ogiwara, T. Kimura, S. Tanuma
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: 18 Pages: 26-35
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23686009
[Journal Article] Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder2011
- Author(s)
  T. Ogiwara, T. Nagatomi, K. J. Kim, S. Tanuma
- Journal Title
  
  Hyomen Kagaku
  
  Volume: 32 Issue: 10 Pages: 664-669
- DOI
  10.1380/jsssj.32.664
- NAID
  10029759920
- ISSN
  0388-5321, 1881-4743
- Language
  Japanese
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23686009
[Journal Article] Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Altemating-Current Plasma Display Panels2011
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: Vol.50
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Approach to Quantitative Evaluation of Electron-Induced Degradation of SiO2 Film Surface with Different Amounts of Carbon Contaminations2011
- Author(s)
  T. Nagatomi, H. Nakamura, Y. Takai, and S. Tanuma
- Journal Title
  
  e-J. Surf. Sci. Nanotechnol.
  
  Volume: 9 Pages: 277-288
- DOI
  10.1380/ejssnt.2011.277
- NAID
  130004439284
- ISSN
  1348-0391
- Language
  English
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23656032, KAKENHI-PROJECT-23686009
[Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels2011
- Author(s)
  K.Yoshino, Y.Morita, T.Nagatomi, M.Terauchi, T.Tsujita, T.Nakayama, Y.Yamauchi, M.Nishitani, M.Kitagawa, Y.Yamauchi, Y.Takai
- Journal Title
  
  Journal of Surface Analysis
  
  Volume: (掲載確定)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] In Situ Observation of Change in Surface Atomic Arrangement of Sc-O/W (100) System during Phase Transition at High Temperature2010
- Author(s)
  T.Nagatomi, Y.Nakanishi, Y.Takai
- Journal Title
  
  Journal of Vacuum Science and Technology A Vol.28
  
  Pages: 199-206
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Effects of Wall Charge on Firing Voltage and Statistical Delay Time in Alternating Current Plasma Display Panels2010
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics Vol.49
- NAID
  40017085038
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy Loss Spectroscopy and Elastic Peak Electron Spectroscopy2010
- Author(s)
  T.Nagatomi, S.Tanuma
- Journal Title
  
  Analytical Science 26
  
  Pages: 165-176
- NAID
  10026781658
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels2010
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: Vol.49
- NAID
  40017253815
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Absolutely Determined Inelastic Mean Free Paths for 300-3000 eV Electrons in 10 Elemental Solids2010
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Journal Title
  
  Surface and Interface Analysis
  
  Volume: Vol.42 Pages: 1537-1540
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Effects of Wall Charge on Firing Voltage and Statistical Delay Time in Alternating Current Plasma Display Panels2010
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: Vol.49
- NAID
  40017085038
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method2010
- Author(s)
  T.Nagatomi, K.Goto, R.Shimizu, Members of JSPS141-WG-SEY
- Journal Title
  
  Surface and Interface Analysis
  
  Volume: Vol.42 Pages: 1541-1543
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Members of JSPS141-WG-SEY, "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method"2010
- Author(s)
  T.Nagatomi, K.Goto, R.Shimizu
- Journal Title
  
  Surface amd Interface Analysis Vol.42
  
  Pages: 1541-1543
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Absolutely Determined Inelastic Mean Free Paths for 300-3000 eV Electrons in 10 Elemental Solids2010
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Journal Title
  
  Surface and Interface Analysis Vol.42
  
  Pages: 1537-1540
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Effects of Wall Charge on Firing Voltage and Statistical Delay Time in Alternating Current Plasma Display Panels2010
- Author(s)
  K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics (印刷中)
- NAID
  40017085038
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy Loss Spectroscopy and Elastic Peak Electron Spectroscopy2010
- Author(s)
  T.Nagatomi, S.Tanuma
- Journal Title
  
  Analytical Science Vol.26
  
  Pages: 165-176
- NAID
  10026781658
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Photoemission Electron Spectroscopy III: Satellites by Extended Excitations2010
- Author(s)
  J.D.Lee, T.Nagatomi, G.Mizutani, K.Endo
- Journal Title
  
  Journal of Surface Analysis Vol.16
  
  Pages: 196-213
- NAID
  130007499072
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Surface Energy Loss Processes in XPS Studied by Absolute Reflection Electron Energy Loss Spectroscopy2010
- Author(s)
  T.Nagatomi, K.Goto
- Journal Title
  
  Journal of Electron Spectroscopy and Related Phenomena Vol.178-179
  
  Pages: 178-185
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Surface Energy Loss Processes in XPS Studied by Absolute Reflection Electron Energy Loss Spectroscopy2010
- Author(s)
  T.Nagatomi, K.Goto
- Journal Title
  
  Journal of Electron Spectroscopy and Related Phenomena
  
  Volume: Vol.178-179 Pages: 178-185
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Surface Energy Loss Processes in XPS Studied by Absolute Reflection Electron Energy Loss Spectroscopy2010
- Author(s)
  T.Nagatomi, K.Goto
- Journal Title
  
  Journal of Electron Spectroscopy and Related Phenomen (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Photoemission Electron Spectroscopy II : Satellites by Local Excitation2009
- Author(s)
  J.D.Lee, T.Nagatomi, G.Mizutani, K.Endo
- Journal Title
  
  Journal of Surface Analysis Vol.16
  
  Pages: 127-152
- NAID
  130007499812
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Change in Work Function during Phase Transition of Sc-O/W(100) System at High Temperatures2009
- Author(s)
  Y.Nakanishi, T.Nagatomi, Y.T.akai
- Journal Title
  
  Applied Surface Science 256
  
  Pages: 1082-1087
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Incident Angle and Energy Dependences of Low-Energy Ar^+ Ion Sputtering of GaAs/AlAs Multilayered System2009
- Author(s)
  T.Nagatomi, T.Bungo, Y.Takai
- Journal Title
  
  Surface and Interface Analysis Vol.41
  
  Pages: 581-589
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Incident Angle and Energy Dependences of Low-Energy Ar+ Ion Sputtering of GaAs/AIAs Multilayered System2009
- Author(s)
  T.Nagatomi, T.Bungo, Y.Takai
- Journal Title
  
  Surface and Interface Analysis 41
  
  Pages: 581-589
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Inelastic Mean Free Path, Surface Excitation Parameter, and Differential Surface Excitation Parameter in Au for 300 to 3000 eV Electrons2009
- Author(s)
  T.Nagatomi, K.Goto
- Journal Title
  
  Applied Surface Science Vol.256
  
  Pages: 1200-1204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Photoemission Electron Spectroscopy I : Histry and Overview2009
- Author(s)
  J.D.Lee, T.Nagatomi, G.Mizutani K.Endo
- Journal Title
  
  Journal of Surface Analysis Vol.16
  
  Pages: 42-63
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Change in Work Function during Phase Transition of Sc-O/W (100) System at High Temperatures2009
- Author(s)
  Y.Nakanishi, T.Nagatomi, Y.Takai
- Journal Title
  
  Applied Surface Science Vol.256
  
  Pages: 1082-1087
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Photoemission Electron Spectroscopy II: Satellites by Local Excitations2009
- Author(s)
  J.D.Lee, T.Nagatomi, G.Mizutani, K.Endo
- Journal Title
  
  Journal of Surface Analysis 16
  
  Pages: 127-152
- NAID
  130007499812
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Influences of Measurement Conditions on Etching Rate of GaAs/AlAs Superlattice in Auger Electron Spectroscopy Sputter Depth Profiling2009
- Author(s)
  T.Nagatomi, T.Bungo, Y.Takai
- Journal Title
  
  Journal of Surface Analysis 15
  
  Pages: 329-332
- NAID
  130007686485
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] In Situ Measurement of Surface Potential Developed on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy2009
- Author(s)
  T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Takai, Y.Morita, M.Nishitani, M.Kitagawa
- Journal Title
  
  Journal of Applied Physics Vol.106
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Influences of Measurement Conditions on Etching Rate of GaAs/AlAs Superlattice in Auger Electron Spectroscopy Sputter Depth Profiling2009
- Author(s)
  T.Nagatomi, T.Bungo, Y.Takai
- Journal Title
  
  Journal of Surface Analysis Vol.15
  
  Pages: 329-332
- NAID
  130007686485
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Photoemission Electron Spectroscopy I: Histry and Overview2009
- Author(s)
  J.D.Lee, T.Nagatomi, G. Mizutani, K.Endo
- Journal Title
  
  Journal of Surface Analysis 16
  
  Pages: 42-63
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] In Situ Measurement of Surface Potential Developed on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy2009
- Author(s)
  T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Takai, Y.Morita, M.Nishitani, M.Kitagawa
- Journal Title
  
  Journal of Applied Physics 106
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Inelastic Mean Free Path, Surface Excitation Parameter, and Differential Surface Excitation Parameter in Au for 300 to 3000 eV Electrons2009
- Author(s)
  T.Nagatomi, K.Goto
- Journal Title
  
  Applied Surface Science 256
  
  Pages: 1200-1204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Journal Article] Development of Ultrahigh Vacuum Floating-Type Low-Energy Ion Gun with Differential Pumping Facilities for High Resolution Depth Profiling2005
- Author(s)
  Y.Mizuhara, T.Bungo, T.Nagatomi, Y.Takai, S.Suzuki, K.Kikuchi, T.Sato, K.Uta
- Journal Title
  
  Surface and Interface Analysis Vol.37, No.2
  
  Pages: 171-175
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Abnormal Electron Emission from MgO Thin Film under Ion Irradiation2005
- Author(s)
  T.Tsujita, T.Nagatomi, Y.Takai
- Journal Title
  
  Surface and Interface Analysis Vol.37, No.2
  
  Pages: 137-140
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Transmission Electron Microscopy Study of Low-Energy Ion Induced Damaged Layer2005
- Author(s)
  J.Kato, T.Nagatomi, Y.Takai
- Journal Title
  
  Surface and Interface Analysis Vol.37, No.2
  
  Pages: 256-260
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Preferential Sputtering Observed in Auger Electron Spectroscopy Sputter Depth Profiling of AlAs/GaAs Suppterlattice Using Low-Energy Ions2005
- Author(s)
  Y.Mizuhara, T.Bungo, T.Nagatomi, Y.Takai
- Journal Title
  
  Surface and Interface Analysis Vol.37, No.3
  
  Pages: 343-347
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Surface Structure of Sc-O/W(100) System used as Schottky Emitter at High Temperature2004
- Author(s)
  S.Iida, Y.Nakanishi, T.Nagatomi, Y.Takai
- Journal Title
  
  Japanese Journal of Applied Physics Vol43, No.9A
  
  Pages: 6352-6353
- NAID
  10013574466
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Energy Distribution of Ion-Induced Secondary Electrons from MgO Surface2004
- Author(s)
  T.Tsujita, T.Nagatomi, Y.Takai, Y.Morita, M.Nishitani, M.Kitagawa, T.Uenoyama
- Journal Title
  
  Japanese Journal of Applied Physics Vol43, No.6B
- NAID
  10013161151
- Data Source
  KAKENHI-PROJECT-15686004
[Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels
- Author(s)
  K.Yoshino, Y.Morita, T.Nagatomi, M.Terauchi, T.Tsujita, T.Nakayama, Y.Yamauchi
- Journal Title
  
  Journal of Surface Analysis (in press)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] DP-WG活動と関連ソフトウェアの開発2012
- Author(s)
  永富隆清, DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-12
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] 相対感度係数を用いたスパッタ深さプロファイルの定量解析のためのソフトウェア開発2012
- Author(s)
  永富隆清, DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-11
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] AES & XPS-均質物質定量分析のための実験的に求められた相対感度係数の使用指針(ISO18118, JIS K 0167)-均質物質の正しい定量分析-2012
- Author(s)
  永富隆清
- Organizer
  表面分析実用化セミナー'12
- Place of Presentation
  きゅりあん(品川区立総合区民会館)
- Year and Date
  2012-07-31
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] 深さ方向分析における深さ分解能、界面幅及び界面位置に関するアンケート調査結果について2012
- Author(s)
  永富隆清
- Organizer
  第39回表面分析研究会
- Place of Presentation
  古河電気工業株式会社横浜研究所(招待講演)
- Year and Date
  2012-06-25
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] 深さ方向分析における深さ分解能、界面幅及び界面位置に関するアンケート調査結果について2012
- Author(s)
  永富隆清
- Organizer
  第39回表面分析研究会
- Place of Presentation
  古河電気工業株式会社横浜研究所(招待講演)
- Year and Date
  2012-06-25
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] オージェ電子分光法分析における電子線誘起試料損傷の標準化とデータベース化 -SiO2薄膜表面の損傷過程-2012
- Author(s)
  永富隆清, 田沼繁夫
- Organizer
  第32回表面科学学術講演会
- Place of Presentation
  東北大学さくらホール(招待講演)
- Year and Date
  2012-11-20
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] DP-WG活動報告2012
- Author(s)
  石津範子, 永富隆清、DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-11
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] AES & XPS-均質物質定量分析のための実験的に求められた相対感度係数の使用指針(ISO18118, JIS K 0167)-均質物質の正しい定量分析-2012
- Author(s)
  永富隆清
- Organizer
  表面分析実用化セミナー12
- Place of Presentation
  きゅりあん(品川区立総合区民会館)
- Year and Date
  2012-07-31
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] DP-WG活動報告2012
- Author(s)
  石津範子, 永富隆清、 DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-11
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] DP-WG活動と関連ソフトウェアの開発2012
- Author(s)
  永富隆清, DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-12
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] オージェ電子分光法分析における電子線誘起試料損傷の標準化とデータベース化 -SiO2薄膜表面の損傷過程-2012
- Author(s)
  永富隆清, 田沼繁夫
- Organizer
  第32回表面科学学術講演会
- Place of Presentation
  東北大学さくらホール(招待講演)
- Year and Date
  2012-11-20
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] 相対感度係数を用いたスパッタ深さプロファイルの定量解析のためのソフトウェア開発2012
- Author(s)
  永富隆清, DP-WG
- Organizer
  2012年度実用表面分析講演会
- Place of Presentation
  秋田県産業技術センター
- Year and Date
  2012-10-11
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] Surface Defect Influence on the Ion Induced Secondary Electron Emission Yield from MgO Films2011
- Author(s)
  Sung Heo, J.G. Chung, H.-I. Lee, J.C. Lee, H.J. Kang, T. Nagatomi and Y. Takai
- Organizer
  8th International Symposium on Atomic Level Characterizations for New Materials and Devices '11 (ALC'11)
- Place of Presentation
  Seoul, Republic of Korea
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] Investigation of Effects of Heating in Air on Ionization Potentials of MgO and CaO Films Using Metastable De-Excitation Spectroscopy2011
- Author(s)
  K. Yoshino, Y. Morita, M. Terauchi, T. Tsujita, Y. Doi, Y. Yamauchi, M. Nishitani, M. Kitagawa, T. Nagatomi, Y. Takai, T. Nakayama, and Y. Yamauchi
- Organizer
  Society For Information Display '11 (SID 2011)
- Place of Presentation
  Los Angeles, California, U.S.A
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] Effects of Heating in air and Vacuum on Ion-Induced Secondary Electron Yield of MgO Film2011
- Author(s)
  Y. Murasawa, H. Kataoka, T. Nagatomi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani, M. Kitagawa
- Organizer
  14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11)
- Place of Presentation
  Cardiff, UK
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] Surface Defect Influence on the Ion Induced Secondary Electron Emission Yield from MgO Films2011
- Author(s)
  Sung Heo, J.G. Chung, H.-I. Lee, J. C. Lee, H. J. Kang, T. Nagatomi, Y. Takai
- Organizer
  8th International Symposium on Atomic Level Characterizations for New Materials and Devices '11 (ALC'11)
- Place of Presentation
  Seoul, Republic of Korea
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] Investigation of Effects of Heating in Air on Ionization Potentials of Mgo and CaO Films Using Metastable De-Excitation Spectroscopy2011
- Author(s)
  K. Yashino, Y. Morita, M. Terauchi, T. Tsujita, Y. Doi, Y. Yamauchi, M. Nishitani, M. Kitagawa, T. Nagatomi, Y. Takai, T. Nakayama, Y. Yamauchi
- Organizer
  Society For Information Display '11 (SID 2011)
- Place of Presentation
  Los Angeles, California, U.S.A.
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] Effects of Carbon Contaminations on Electron-Induced Degradation of SiO22011
- Author(s)
  T. Nagatomi, H. Nakamura, Y. Takai and S. Tanuma
- Organizer
  14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11)
- Place of Presentation
  Cardiff, UK
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] AES & XPS-均質物質定量分析のための実験的に求められた相対感度係数の使用指針(ISO18118, JIS K 0167)-均質物質の正しい定量分析-2011
- Author(s)
  永富隆清
- Organizer
  表面分析実用化セミナー'11
- Place of Presentation
  島津製作所関西支社
- Year and Date
  2011-07-22
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] Effects of Carbon Contaminations on Electron-Induced Degradation of SiO22011
- Author(s)
  T. Nagatomi, H. Nakamura, Y. Takai, S. Tanuma
- Organizer
  14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11)
- Place of Presentation
  Cardiff, UK
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] 「深さ分解能」に関するアンケートへの回答のまとめ2011
- Author(s)
  永富隆清
- Organizer
  2011年度実用表面分析講演会
- Place of Presentation
  東京大学(駒場リサーチキャンパス)
- Year and Date
  2011-10-17
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] 極低角度入射ビームを用いた高感度,高分解能オージェ深さ方向分析による極薄膜多層試料の分析2011
- Author(s)
  荻原俊弥, 永富隆清, 田沼繁夫
- Organizer
  2011年度実用表面分析講演会
- Place of Presentation
  東京大学(駒場リサーチキャンパス)
- Year and Date
  2011-10-17
- Data Source
  KAKENHI-PROJECT-23686009
[Presentation] MgO膜へのH_2O吸着によるイオン誘起二次電子収率の変化2011
- Author(s)
  村澤裕子, 小出博仁, 永富隆清, 高井義造, 吉野恭平, 森田幸弘, 西谷幹彦, 北川雅俊
- Organizer
  第58回応用物理学関係連合講演会
- Place of Presentation
  神奈川工科大学
- Year and Date
  2011-03-24
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Effects of Heating in air and Vacuum on Ion-Induced Secondary Electron Yield of MgO Film2011
- Author(s)
  Y. Murasawa, H. Kataoka, T. Nagatomi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani and M. Kitagawa
- Organizer
  14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11)
- Place of Presentation
  Cardiff, UK
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder2010
- Author(s)
  T.Ogiwara, T.Nagatomi, S.Tanuma
- Organizer
  Microscopy & Microanalysis 2010
- Place of Presentation
  Portland, OR (USA)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates2010
- Author(s)
  S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Change in Ion-Induced Secondary Electron Yield of MgO Film Caused by Heating in Air2010
- Author(s)
  Y.Murasawa, J.Azargal, K.Yoshino, T.Nagatomi, Y.Takai, Y.Morita, M.Nishitani
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates2010
- Author(s)
  S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] 傾斜ホルダーを用いた極低角度電子・イオン入射オニジェ深さ方向分析2010
- Author(s)
  荻原俊弥, 永富隆清, 田沼繁夫
- Organizer
  真空・表面科学合同講演会第30回表面科学学術講演会第51回真空に関する連合講演会
- Place of Presentation
  大阪大学(招待講演)
- Year and Date
  2010-11-06
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] High Depth Resolution Auger Depth Profiling using a 85^°-High-Angle Inclined Holder2010
- Author(s)
  T.Ogiwara, T.Nagatomi, K.J.Kim, S.Tanuma
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] High Depth Resolution Auger Depth Profiling using a 85°-High-Angle Inclined Holder2010
- Author(s)
  T.Ogiwara, T.Nagatomi, K.J.Kim, S.Tanuma
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] igh-Sensitive Depth Profiling Analyses of Delta-Doped Layers Specimens with Glancing Angle Irradiation and Detection Method2010
- Author(s)
  H.Tanishiki, T.Ogiwara, T.Nagatomi, Y.Takai, K.J.Kim, S.Tanuma
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Effects of Heating in Air on Metastable De-Excitation Spectroscopy Spectra of MgO and CaO Films2010
- Author(s)
  K.Yoshino, Y.Morita, M.Nishitani, T.Nagatomi, Y.Takai, Y.Yamauchi
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] 加熱処理によるMgO膜のイオン誘起二次電子収率及び表面状態の変化2010
- Author(s)
  村澤裕子, 片岡憲秀, 吉野恭平, 永富隆清, 高井義造, 森田幸弘, 西谷幹彦, 北川雅俊
- Organizer
  真空・表面科学合同講演会第30回表面科学学術講演会第51回真空に関する連合講演会
- Place of Presentation
  大阪大学
- Year and Date
  2010-11-05
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Measurement of Secondary Electron Yield by Charge Amplification Method2010
- Author(s)
  T.Miyagawa, M.Inoue, T.Iyasu, Y.Hashimoto, K.Goto, R.Shimizu, T.Nagatomi
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder2010
- Author(s)
  T.Ogiwara, T.Nagatomi, S.Tanuma
- Organizer
  Microscopy & Microanalysis 2010
- Place of Presentation
  Portland, USA.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Effects of Heating in Air on Metastable De-Excitation Spectroscopy Spectra of MgO and CaO Films2010
- Author(s)
  K.Yoshino, Y.Morita, M.Nishitani, T.Nagatomi, Y.Takai, Y.Yamauchi
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Determination of IMFP, SEP and DSEP by absolute REELS analysis2010
- Author(s)
  T.Nagatomi
- Organizer
  Hungarian-Japanese Joint Working Seminar on Studies of Fundamental Parameter Database and Atomic Processes for High Precision Quantitative Analysis using X-Ray Photoelectron Spectroscopy (in the frame of the bilateral MTA-JSPS scientific research cooperation project)
- Place of Presentation
  MTA ATOMKI, Debrecen (Hungary)(招待講演)
- Year and Date
  2010-10-27
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Measurement of Secondary Electron Yield by Charge Amplification Method2010
- Author(s)
  T.Miyagawa, M.Inoue, T.Iyasu, Y.Hashimoto, K.Goto, R.Shimizu, T.Nagatomi
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] 電子と固体(バルク,薄膜)の相互作用-モンテカルロシミュレーションによる2010
- Author(s)
  永富隆清
- Organizer
  日本学術振興会マイクロビームアナリシス第141委員会平成22年度研修セミナー「走査電子顕微鏡法とその周辺技術」-SEM,EPMA,EBSDの基礎から応用まで-
- Place of Presentation
  三島, 東レ総合研修センター(招待講演)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Surface Defect States of MgO Films2010
- Author(s)
  S.Heo, J.G Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Mechanism of Secondary electron Emission2010
- Author(s)
  T.Nagatomi
- Organizer
  Korea-Japan PDP Forum 2010
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] オージェ電子分光法装置におけるエネルギー軸校正法(ISO17973,17974)-元素分析と状態分析のために-2010
- Author(s)
  永富隆清
- Organizer
  実用表面分析セミナー'10-ISO規格を基礎とした表面分析の実際-
- Place of Presentation
  大阪大学中ノ島センター
- Year and Date
  2010-07-23
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Surface Defect States of MgO Films2010
- Author(s)
  S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S. Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Gyeongju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Determination of IMFP, SEP and DSEP by absolute REELS analysis2010
- Author(s)
  T.Nagatomi
- Organizer
  Hungarian-Japanese Joint Working Seminar on Studies of Fundamental Parameter Database and Atomic Processes for High Precision Quantitative Analysis using X-Ray Photoelectron Spectroscopy (in the frame of the bilateral MTA-JSPS scientific research cooperation project)
- Place of Presentation
  Debrecen, Hungary.
- Year and Date
  2010-10-27
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Si/BNデルタドープSIMS標準試料のオージェ深さ方向分析2010
- Author(s)
  荻原俊弥, 永富隆清, 田沼繁夫
- Organizer
  第35回表面分析研究会
- Place of Presentation
  軽井沢プリンスホテル
- Year and Date
  2010-06-21
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] How do we determine interface width and interface position of depth profile? -Definition in ISO documents and application to practical analysis-2010
- Author(s)
  T.Nagatomi
- Organizer
  The 1st Meeting of Korean-Chinese-Japanese Cooperative Program on "Materials Research with Emphasis on Activities Relating to VAMAS"
- Place of Presentation
  Deajeon, Korea
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Metastable De-excitation Spectroscopyを用いたプラズマディスプレイパネル用保護膜の分析(II)-CO_2暴露がMgO及びCaO膜のMDSスペクトルへ与える影響-2010
- Author(s)
  吉野恭平, 森田幸弘, 西谷幹彦, 寺内正治, 辻田卓司, 中山貴仁, 山内康弘, 永富隆清, 高井義造, 山内泰
- Organizer
  第71回応用物理学会学術講演会
- Place of Presentation
  長崎大学文京キャンパス
- Year and Date
  2010-09-16
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Mechanism of Secondary electron Emission2010
- Author(s)
  T.Nagatomi
- Organizer
  Korea-Japan PDP Forum 2010
- Place of Presentation
  Jeju, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] 斜入射・検出法を用いたデルタドープ層の高感度AES及びXPSスパッタ深さ分析2010
- Author(s)
  谷舗浩紀, 永富隆清, 高井義造, 荻原俊弥, 田沼繁夫, K.J.Kim
- Organizer
  真空・表面科学合同講演会第30回表面科学学術講演会第51回真空に関する連合講演会
- Place of Presentation
  大阪大学
- Year and Date
  2010-11-05
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Change in Ion-Induced Secondary Electron Yield of MgO Film Caused by Heating in Air2010
- Author(s)
  Y.Murasawa, J.Azargal, K.Yoshino, T.Nagatomi, Y.Takai, Y.Morita, M.Nishitani
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] How do we determine interface width and interface position of depth profile?-Definition in ISO documents and application to practical analysis-2010
- Author(s)
  T.Nagatomi
- Organizer
  The 1st Meeting of Korean-Chinese-Japanese Cooperative Program on "Materials Research with Emphasis on Activities Relating to VAMAS"
- Place of Presentation
  Deajeon, Korea.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] High-Sensitive Depth Profiling Analyses of Delta-Doped Layers Specimens with Glancing Angle Irradiation and Detection Method2010
- Author(s)
  H.Tanishiki, T.Ogiwara, T.Nagatomi, Y.Takai, K.J.Kim, S.Tanuma
- Organizer
  5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
- Place of Presentation
  Hyundae Hotel in Gyeongju (Korea)
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Electron Inelastic Mean Free Path and Surface Excitation Parameter in 10 Elemental Solids Determined by Absolute REELS analysis over 300-3000 eV Range2009
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Organizer
  13th European Conference on Application of Surface and Interface Analysis (ECASIA'09)
- Place of Presentation
  Antalya, Turkey.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] In Situ Measurement of Surface Potential Induced on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy2009
- Author(s)
  T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Morita, M.Nishitani, M.Kitagawa, Y.Takai
- Organizer
  5th International Workshop on High-Resolution Depth Profiling (HRDP-5)
- Place of Presentation
  Kyoto, Japan.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Influence of Wall Charges on Electron Emission from MgO Layer in AC-PDP2009
- Author(s)
  T.Nagatomi
- Organizer
  Japan-Korea PDP Forum '09
- Place of Presentation
  Kyoto, Japan
- Year and Date
  2009-07-11
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method2009
- Author(s)
  T.Nagatomi, K.Goto, R.Shimizu, Members of JSPS141-WG-SEY
- Organizer
  7th International Symposium on Atomic Level Characteri zations for New Materials and Devices '09 (ALC'09)
- Place of Presentation
  Hawaii, USA
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Absolutely Determined Inelastic Mean Free Pathes for 300-3000 eV Electrons in 10 Elemental Solids2009
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Organizer
  7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09)
- Place of Presentation
  Hawaii, USA.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Influence of Wall Charges on Electron Emission from MgO Layer in AC-PDP2009
- Author(s)
  T.Nagatomi
- Organizer
  Japan-Korea PDP Forum'09
- Place of Presentation
  Kyoto, Japan.
- Year and Date
  2009-07-11
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Absolutely Determined Inelastic Mean Free Pathes for 300-3000 eV Electrons in 10 Elemental Solids2009
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Organizer
  7th International Symposium on Atomic Level Characteri zations for New Materials and Devices '09 (ALC'09)
- Place of Presentation
  Hawaii, USA
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Members of JSPS141-WG-SEY, "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method"2009
- Author(s)
  T.Nagatomi, K.Goto, R.Shimizu
- Organizer
  7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09)
- Place of Presentation
  Hawaii, USA.
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] Electron Inelastic Mean Free Path and Surface Excitation Parameter in 10 Elemental Solids Determined by Absolute REELS analysis over 300-3000 eV Range2009
- Author(s)
  T.Nagatomi, S.Tanuma, K.Goto
- Organizer
  13th European Conference on Application of Surface and Interface Analysis (ECASIA'09)
- Place of Presentation
  Antalya, Turkey
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] In Situ Measurement of Surface Potential Induced on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy2009
- Author(s)
  T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Morita, M.Nishitani, M.Kitagawa, Y.Takai
- Organizer
  5th International Workshop on High-Resolution Depth Profiling (HRDP-5)
- Place of Presentation
  Kyoto, Japan
- Data Source
  KAKENHI-PROJECT-21686005
[Presentation] 深さ方向分析における深さ分解能，界面幅及び界面位置に関するアンケート調査結果について
- Author(s)
  永富隆清
- Organizer
  第31回表面科学学術講演会(招待講演)
- Place of Presentation
  東京
- Data Source
  KAKENHI-PROJECT-23656032
[Presentation] AES & XPS－均質物質定量分析のための実験的に求められた相対感度係数の使用指針（ISO18118，JIS K 0167）－均質物質の正しい定量分析－
- Author(s)
  永富隆清
- Organizer
  表面分析実用化セミナー '11 －　日常的な分析業務におけるJIS並びにISO規格の利用(招待講演)
- Place of Presentation
  大阪
- Data Source
  KAKENHI-PROJECT-23656032

1. KIMURA Yoshihide (70221215)

# of Collaborated Projects: 7 results

# of Collaborated Products: 0 results
2. TAKAI Yoshizo (30236179)

# of Collaborated Projects: 6 results

# of Collaborated Products: 0 results
3. 佐藤了平 (80343242)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. 吉田清和 (50263223)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. FUKUSHIMA Kurio

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. 大堀謙一

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
7. OBORI Ken-ich

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

NAGATOMI Takaharu 永富 隆清

永富 清隆 ナガトミ タカハル

Research Projects

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表面プラズモンポラリトンを介した自由な低速光電子と光との間の相互作用の実証Principal Investigator

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パルス照射による絶縁物の帯電及び二次電子放出の過渡解析法の開発と展開Principal Investigator

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Study on Secondary Electron Emission from Insulator and Construction of Database of Secondary Electron YieldPrincipal Investigator

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Simultaneous correction of spherical and chromatic aberrations by dynamic hollow-cone illumination

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Development of bio electron microscopy under ultra low electron dose conditions

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UHV-TEMを用いたLa注入シリコンナノドットアレイ電界発光素子の開発

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超低速イオンを用いたシャロードープ層の原子レベル深さ分析Principal Investigator

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Development of Super Resolution Bio-Phase Transmission Electron Microscopy

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Direct Observation of DNA at a Molecular Scale Level by Three-Dimensional Fourier Filtering Method

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Development of high-brightness and wavelength-tunable nano-film-rotor-type X-ray sourcePrincipal Investigator

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Extended Landau Theoryによる実効エネルギー損失関数の導出Principal Investigator

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Development of TEM specimen Holder Enabling Atomic Level Observation under One Atomospheric Pressure

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[Journal Article] 半球型電子分光器を搭載したオージェ電子分光装置のジオメトリー特性に基づいた傾斜ホルダーを利用した高感度,高深さ分解能オージェ深さ方向分析2012

Author(s)

Journal Title

NAGATOMI Takaharu 永富隆清

永富清隆ナガトミタカハル