ICHIHASHI Mikio 市橋幹雄

… Alternative Names

ICHIHASI Mikio 市橋幹雄

市橋幹雄イチハシミキオ

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Researcher Number	90345869
Affiliation (based on the past Project Information) *help	2007 – 2010: 名古屋大学, エコトピア科学研究所, 客員教授 2006: 名古屋大学, エコトピア科学研究所, 教授 2004: Nagoya University, Ecotopia Science Institute, Professor, エコトピア科学研究所, 教授 2004: 名古屋大学, エコトピア科学研究機構, 教授 2002 – 2003: 名古屋大学, 理工科学総合研究センター, 教授
Review Section/Research Field	Except Principal Investigator 表面界面物性
Keywords	Except Principal Investigator electron holography / transmission electron microscope / real time observation / stereoscopy / 透過型電子顕微鏡 / ステレオ位相顕微鏡 / 実時間ステレオ電子顕微鏡 / 実時間ステレオ観察 / 立体像観察 / ステレオ電子線ホログラフィ … More / 電子線実体位相顕微鏡 / 透過電子顕微鏡観察 / ステレオ法 / 立体観察 / 電子線ホログラフィ / 透過電子顕微鏡 / 実時間観察 / ステレオ電子顕微鏡 / focused ion beam (FIB) / precise diamond cutter / surface decomposition of SiC / field emission electron gun / carbon nano-tube / SiC / 電界放出形電子銃 / FIB / 精密ダイヤモンドカッター / 炭化珪素 / 表面分解法 / 配向成長 / 収束イオンピーム(FIB)加工 / 収束イオンビーム(FIB)加工 / 精密ダイアモンドカッター / 炭化珪素表面分解法 / 電界放出電子銃 / カーボンナノチューブ / 位相CT / ナノデバイス / ナノ材料 / CT / 電子顕微鏡 / Csコレクター / FE電子銃 / 位相コントラスト / 走査型透過電子顕微鏡 Less

Development of Nano-phase Tomographic STEM
- Principal Investigator
  
  IKUTA Takashi
- Project Period (FY)
  2006 – 2010
- Research Category
  
  Grant-in-Aid for Creative Scientific Research
- Research Institution
  Osaka Electro-Communication University
Development of a real time stereo phase microscope
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University
Equipping a transmission electron microscope with a field emission electron gun.
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University

All 2010 2009 2008 2007 2004

All Journal Article Presentation Patent

[Journal Article] Development of Parallel Image Detection System Using Annular Pupils for Scanning Transmission Electron Microscope2010
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta
- Journal Title
  
  AIP Conference Proceedings Vol.1282
  
  Pages: 111-114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Parallel Detection and Processing System using Multidetector Array in Scanning Transmission Electron Microscope with Annular Pupil2010
- Author(s)
  T.Matsutani, M.Taya, T.Fujimura, H.Inui, T.Tanaka, Y.Kimura, Y.Takai, Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Plasma Application and Hybrid Functionally Materials Vol.19
  
  Pages: 87-88
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Simulation Study of a Hollow Cone-Shaped Probe in Aberration-Corrected STEM for High-resolution Tomography2010
- Author(s)
  T.Kawasaki, T.Matsutani, T.Ikuta, M.Ichihashi, T.Tanji
- Journal Title
  
  Ultramicroscopy Vol.110
  
  Pages: 1332-1337
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Electron Optical System Using Annular Pupils for Scanning Transmission Electron Microscope2009
- Author(s)
  T.Matsutani, M.Taya, T.Tanaka, Y.Kimura, Y.Takai, T.Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Proceedings of the 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09), held in Maui, Hawaii, USA, 08P37 (2009年12月8日発表)
  
  Pages: 245-248
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009
- Author(s)
  T. Matsutani, M. Taya, T. Ikuta, T. Fujimura, H. Inui, T. Tanaka, I. Shimizu, Y. Kimura, Y. Takai, T. Kawasaki, and M. Ichihashi
- Journal Title
  
  Vacuum 83
  
  Pages: 201-204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Annular Pupils for Electron Optics Able to Suppress High-Energy Electron Scattering Formed by Focused Ion Beam Technique2009
- Author(s)
  T.Matsutani, M.Taya, T.Fujimura, H.Inui, T.Tanaka, Y.Kimura, Y.Takai, T.Kawasaki, M.Ichihashi, T.Ikuta
- Journal Title
  
  Advances in Applied Plasma Science Vol.7
  
  Pages: 259-260
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hirohiko Inui, Takeo Tanaka, Ippei Shimizu, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Vacuum Vol.83
  
  Pages: 201-204
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Focal Depth Extension by Hollow-cone Illumination with Annular Pupils for 200kV-Scanning Transmission Electron Microscope Tomography2009
- Author(s)
  T.Kawasaki, T.Matsutani, M.Taya, Y.Kimura, M.Ichihashi, T.Ikuta
- Journal Title
  
  Advances in Applied Plasma Science
  
  Pages: 261-262
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008
- Author(s)
  川崎忠寛, 市橋幹雄, 松谷貴臣, 木村吉秀, 生田孝
- Journal Title
  
  Surf.Interface Analysis Vol.40
  
  Pages: 1732-1735
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008
- Author(s)
  T. Kawasaki, M. Ichihashi, T. Matsutani, Y. Kimura and T. Ikuta
- Journal Title
  
  Surf.Interface Analysis 40
  
  Pages: 1732-1735
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] 集束イオンビームを用いた電子光学系輪帯瞳用アパーチャの作製2007
- Author(s)
  藤原誠,田中武雄,志水一平,松谷貴臣,日坂真樹,安江常夫,生田孝,田屋昌樹,木村吉秀,高井義造,川崎忠寛,市橋幹雄
- Journal Title
  
  真空(J.Vac.Soc.Jpn) Vol.50
  
  Pages: 639-643
- NAID
  10019784337
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hrihiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Advances in Applied Plasma Science Vol.6
  
  Pages: 209-212
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Phase Imaging Microscopy with Increased Depth of Focus by TEM and STEM (Invited)2007
- Author(s)
  生田孝, 市橋幹雄
- Journal Title
  
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07), held in Kanazawa, Japan, MoA-2 (2007年10月29日発表)
  
  Pages: 56-60
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2007
- Author(s)
  川崎忠寛, 市橋幹雄, 松谷貴臣, 木村吉秀, 生田孝
- Journal Title
  
  Proceedings of the International Symposium on EcoTopia Science Vol.1
  
  Pages: 1245-1247
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] New Computer Simulation Software of Electron Trajectories for Evaluation of Magnetic Field Immersion-Type Field Emission Gun2007
- Author(s)
  K.Tamura, T.Ikuta, R.Shimizu, M.Ichihashi
- Journal Title
  
  Japanese J.of Appl.Phys. Vol.46
  
  Pages: 834-837
- NAID
  10018546005
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Development of Annular Pupil for Electron Optics by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hrihiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Journal Title
  
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07), held in Kanazawa, Japan, TuP-13 (2007年10月30日発表)
  
  Pages: 147-150
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] New Computer Simulation Software of Electron Trajectories for Evaluation of Magnetic Field Immersion-Type Field Emission Gun2007
- Author(s)
  K.Tamura, T.Ikuta, R.Shimizu, M.Ichihashi
- Journal Title
  
  Japanese Journal of Applied Physics Vol. 46, No.2
  
  Pages: 834-837
- NAID
  10018546005
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Interpretation of Cs-corrector System with Twin Hexapoles and Transfer Doublet based on Geometrical Optics Theory2007
- Author(s)
  Tadahiro Kawasaki, Mikio Ichihashi, Taisuke Nakamura, Takeshi Kawasaki, Takaomi Matsutani, Yoshihide Kimura, Takashi Ikuta
- Journal Title
  
  Proceedings of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07), held in Kanazawa, Japan, TuP-2 (2007年10月30日発表)
  
  Pages: 119-122
- Data Source
  KAKENHI-PROJECT-18GS0211
[Journal Article] Transmission Electron Microscopy Study of an AlN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy.2004
- Author(s)
  S.Tanaka, T.Tanji, M.Ichihasi 他4名
- Journal Title
  
  J.Crystal Growth 260
  
  Pages: 360-365
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Transmission Electron Microscopy Study of an AlN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy.2004
- Author(s)
  S.Tanaka, Y.Honda, N.Kameshiro, R.Iwasaki, N.Sawaki, T.Tanji, M.Ichihashi
- Journal Title
  
  J.Crystal Growth Vol.260
  
  Pages: 360-365
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Electron Holography Study of a GaN/AlGaN Interface and a GaN Crystal on Si Substrates.2004
- Author(s)
  S.Tanaka, T.Tanji, M.Ichihashi ほか2名
- Journal Title
  
  Proc.8th Asia-Pacific Electron Microscopy Conference, Kanazawa
  
  Pages: 507-508
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Development of an On-line Stereo TEM.2004
- Author(s)
  T.Tanji, M.Ichihashi ほか4名
- Journal Title
  
  Proc.8th Asia-Pacific Electron Microscopy Conference, Kanazawa
  
  Pages: 288-289
- Data Source
  KAKENHI-PROJECT-14205008
[Patent] 磁場界浸電子銃及び電子線装置2010
- Inventor(s)
  市橋幹雄、大西崇、渡辺俊一、田村圭司
- Industrial Property Rights Holder
  株式会社日立ハイテクノロジーズ
- Industrial Property Number
  2010-056095
- Filing Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-18GS0211
[Patent] 磁場界浸型電子銃及び電子線装置2010
- Inventor(s)
  市橋幹雄,大西崇,渡辺俊一,田村圭司
- Industrial Property Rights Holder
  株式会社日立ハイテクノロジーズ
- Industrial Property Number
  2010-056095
- Filing Date
  2010-03-12
- Data Source
  KAKENHI-PROJECT-18GS0211
[Patent] 電子銃2009
- Inventor(s)
  市橋幹雄、大西崇、渡辺俊一、田村圭司
- Industrial Property Rights Holder
  株式会社日立ハイテクノロジーズ
- Industrial Property Number
  2009-123684
- Filing Date
  2009-05-22
- Data Source
  KAKENHI-PROJECT-18GS0211
[Patent] 電子銃2009
- Inventor(s)
  市橋幹雄,大西崇,渡辺俊一,田村圭司
- Industrial Property Rights Holder
  株式会社日立ハイテクノロジーズ
- Industrial Property Number
  2009-123684
- Filing Date
  2009-05-22
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Development of Electron Optical System Using Annular Pupils for Scanning Transmission Electron Microscope by Focused Ion Beam2010
- Author(s)
  Takaomi Matsutani, Tsuchika Yasumoto, Takeo Tanaka, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta
- Organizer
  17th International Conference on Ion Beam Modification of Materials
- Place of Presentation
  Montreal, Canada
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Development of Parallel Detection and Processing System using Multidetector Array in Scanning Transmission Electron Microscope with Annular Pupil2010
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta
- Organizer
  The 17th Annual Meeting of IAPS International Workshop 2010 in Busan
- Place of Presentation
  Busan, Korea
- Year and Date
  2010-02-26
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 収差補正STEMにおける輪帯絞りを用いたプローブ形成-シミュレーション解析-2010
- Author(s)
  川崎忠寛,松谷貴臣,生田孝,市橋幹雄,丹司敬義
- Organizer
  日本物理学会第65回年次大会
- Place of Presentation
  岡山大学(2010年3月21日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 磁場界浸型C-FE電子銃の開発(2)理論解析2009
- Author(s)
  田村圭司,大西崇,渡辺俊一,市橋幹雄
- Organizer
  日本顕微鏡学会第65回学術講演会
- Place of Presentation
  仙台国際センター(2009年5月27日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 集束イオンビームによるテーパを有した電子光学系輪帯瞳の開発2009
- Author(s)
  松谷貴臣,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄,生田孝
- Organizer
  平成21年電気学会全国大会
- Place of Presentation
  北海道
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 集束イオンビームによる走査型透過電子顕微鏡用輪帯アパーチャの開発2009
- Author(s)
  松谷貴臣,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄,生田孝
- Organizer
  第50回真空に関する連合講演会
- Place of Presentation
  学習院大学,東京(2009年11月5日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 磁場界浸型C-FE電子銃の開発(1)機構設計2009
- Author(s)
  大西崇,田村圭司,渡辺俊一,大江俊美,市橋幹雄
- Organizer
  日本顕微鏡学会第65回学術講演会
- Place of Presentation
  仙台国際センター(2009年5月27日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 走査型透過電子顕微鏡における輪帯照明システムの開発2008
- Author(s)
  松谷貴臣,田屋昌樹,生田孝,田中武雄,木村吉秀,高井義造,川崎忠寛,市橋幹雄
- Organizer
  日本顕微鏡学会第64回学術講演会
- Place of Presentation
  京都
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Formation of High-energy Electron Scattering Suppressible Annular Pupils for Electron Optics by Focused Ion Beam Technique2008
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Tetsuya Fujimura, Hirohiko Inui, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Toshimi Ohye
- Organizer
  The 15th Annual Meeting of Institute of Applied Plasma Science
- Place of Presentation
  held in Tairen, China
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] 集束イオンビームを用いた電子光学系輪帯照明用アパーチャの開発2007
- Author(s)
  松谷貴臣,生田孝,田屋昌樹,高井義造,川崎忠寛,市橋幹雄,志水一平,藤原誠,田中武雄
- Organizer
  2007年度春季第54回応用物理学関係連合講演会
- Place of Presentation
  神奈川
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Phase Imaging Microscopy with Increased Depth of Focus by TEM and STEM(Invited)2007
- Author(s)
  T. Ikuta, and M. Ichihashi
- Organizer
  Proc.of the 6th International Symposium on Atomic Level Characterizations for New Materials and Devices'07
- Place of Presentation
  held in Kanazawa,Japan(招待講演)
- Data Source
  KAKENHI-PROJECT-18GS0211
[Presentation] Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique2007
- Author(s)
  Takaomi Matsutani, Masaki Taya, Takashi Ikuta, Makoto Fujiwara, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi
- Organizer
  The 6th International Symposium on Applied Plasma Science
- Place of Presentation
  held in Nikko, Japan(2007年9月27日発表)
- Data Source
  KAKENHI-PROJECT-18GS0211

1. TANJI Takayoshi (90125609)

# of Collaborated Projects: 2 results

# of Collaborated Products: 4 results
2. TANAKA Shigeyasu (70217032)

# of Collaborated Projects: 2 results

# of Collaborated Products: 3 results
3. IKUTA Takashi (20103343)

# of Collaborated Projects: 1 results

# of Collaborated Products: 28 results
4. HISAKA Masaki (40340640)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
5. USUKURA Jiro (30143415)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. KAWASAKI Tadahiro (10372533)

# of Collaborated Projects: 1 results

# of Collaborated Products: 24 results
7. KIMURA Yoshihide (70221215)

# of Collaborated Projects: 1 results

# of Collaborated Products: 20 results
8. OYE Toshjimi (30076632)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
9. KODAMA Tetsuji (50262861)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. MATSUTANI Takaomi (00411413)

# of Collaborated Projects: 1 results

# of Collaborated Products: 24 results
11. YASUE Tuneo (00212275)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
12. CHEN Jun (90308338)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. 室岡義栄 (40273263)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. KUSUONKI Michiko

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. 岡本篤人

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. OKAMAOT Atsuto

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

ICHIHASHI Mikio 市橋 幹雄

ICHIHASI Mikio 市橋 幹雄

市橋 幹雄 イチハシ ミキオ

Research Projects

Research Products

Co-Researchers

Development of Nano-phase Tomographic STEM

Principal Investigator

Project Period (FY)

Research Category

Research Institution

Development of a real time stereo phase microscope

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Equipping a transmission electron microscope with a field emission electron gun.

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Development of Parallel Image Detection System Using Annular Pupils for Scanning Transmission Electron Microscope2010

Author(s)

Journal Title

Data Source

[Journal Article] Development of Parallel Detection and Processing System using Multidetector Array in Scanning Transmission Electron Microscope with Annular Pupil2010

Author(s)

Journal Title

Data Source

[Journal Article] Simulation Study of a Hollow Cone-Shaped Probe in Aberration-Corrected STEM for High-resolution Tomography2010

Author(s)

Journal Title

Data Source

[Journal Article] Development of Electron Optical System Using Annular Pupils for Scanning Transmission Electron Microscope2009

Author(s)

Journal Title

Data Source

[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009

Author(s)

Journal Title

Data Source

[Journal Article] Annular Pupils for Electron Optics Able to Suppress High-Energy Electron Scattering Formed by Focused Ion Beam Technique2009

Author(s)

Journal Title

Data Source

[Journal Article] Evaluation of annular pupil for scanning transmission electron microscope formed by focused ion beam technique2009

Author(s)

Journal Title

Data Source

[Journal Article] Focal Depth Extension by Hollow-cone Illumination with Annular Pupils for 200kV-Scanning Transmission Electron Microscope Tomography2009

Author(s)

Journal Title

Data Source

[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008

Author(s)

Journal Title

Data Source

[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2008

Author(s)

Journal Title

Data Source

[Journal Article] 集束イオンビームを用いた電子光学系輪帯瞳用アパーチャの作製2007

Author(s)

Journal Title

NAID

Data Source

[Journal Article] Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique2007

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[Journal Article] Phase Imaging Microscopy with Increased Depth of Focus by TEM and STEM (Invited)2007

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[Journal Article] Aberration Analysis of Cs-corrector System with Twin Hexapoles and Transfer Lens Doublet in Scanning Transmission Electron Microscope by Simple Ray Tracing Based on Geometrical Optics2007

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ICHIHASHI Mikio 市橋幹雄

ICHIHASI Mikio 市橋幹雄

市橋幹雄イチハシミキオ