• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Voegeli Wolfgang  Voegeli Wolfgang

ORCIDConnect your ORCID iD *help
… Alternative Names

VOEGELI Wolfgang  フォグリ ヴォルフガング

Less
Researcher Number 90624924
Other IDs
Affiliation (Current) 2025: 東京学芸大学, 教育学部, 准教授
Affiliation (based on the past Project Information) *help 2019 – 2024: 東京学芸大学, 教育学部, 准教授
2013 – 2018: 東京学芸大学, 教育学部, 助教
Review Section/Research Field
Principal Investigator
Basic Section 80040:Quantum beam science-related / Science and Engineering / Material processing/Microstructural control engineering
Except Principal Investigator
Medium-sized Section 28:Nano/micro science and related fields / Basic Section 29020:Thin film/surface and interfacial physical properties-related / Crystal engineering
Keywords
Principal Investigator
X線反射率 / Multibeam CT / Synchrotron radiation / Time-resolved / X-ray tomography / X-ray CT / X線回折 / 時分割測定 / 物性実験 / 表面・界面 … More / X線回折 / X線反射率 / Copper / 表面・界面物性 / Silicon / X-ray reflectivity / Electrodeposition / 薄膜成長 / シリコン … More
Except Principal Investigator
オペランド観察 / マルチスケール解析 / X線分光 / X線散乱 / ナノ構造 / X線吸収分光 / 小角X線散乱 / 放射光 / 局所構造 / ナノスケール構造 / X線吸収分光 / 小角X線散乱 / ナノ材料 / オペランド分析 / 放射光X線 / ガス触媒反応 / 排ガス触媒 / 表面化学 / 表面分析 / 貴金属触媒 / 赤外分光 / 放射光分析 / 貴金属 / 触媒 / 表面科学 / X線逆格子マップ / 高速X線回折 / X線 / その場測定 / 結晶成長 / X線回折 / 窒化物半導体 / III-V族半導体 / 分子線エピタキシー / その場X線回折 Less
  • Research Projects

    (6 results)
  • Research Products

    (43 results)
  • Co-Researchers

    (4 People)
  •  Development of high temporal and spatial resolution multi-beam CT instrumentPrincipal Investigator

    • Principal Investigator
      Voegeli Wolfgang
    • Project Period (FY)
      2023 – 2025
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 80040:Quantum beam science-related
    • Research Institution
      Tokyo Gakugei University
  •  Development of a XAFS/SAXS simultaneous measurement system in a multi-wavelength dispersive mode for high-speed characterization of nanoscale and local atomic structures

    • Principal Investigator
      Shirasawa Tetsuro
    • Project Period (FY)
      2020 – 2022
    • Research Category
      Grant-in-Aid for Challenging Research (Exploratory)
    • Review Section
      Medium-sized Section 28:Nano/micro science and related fields
    • Research Institution
      National Institute of Advanced Industrial Science and Technology
  •  Study of surface structure and catalytic activity of noble metals under atmospheric pressure

    • Principal Investigator
      Shirasawa Tetsuro
    • Project Period (FY)
      2018 – 2020
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 29020:Thin film/surface and interfacial physical properties-related
    • Research Institution
      National Institute of Advanced Industrial Science and Technology
  •  High-speed in situ X-ray diffraction for dislocation control in semiconductor crystal growth

    • Principal Investigator
      Takahasi Masamitu
    • Project Period (FY)
      2017 – 2019
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Crystal engineering
    • Research Institution
      National Institutes for Quantum and Radiological Science and Technology
  •  Time-resolved observation of surface and interface structuresPrincipal Investigator

    • Principal Investigator
      Voegeli Wolfgang
    • Project Period (FY)
      2015 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
    • Review Section
      Science and Engineering
    • Research Institution
      Tokyo Gakugei University
  •  Electrodeposition of copper on silicon studied with in-situ X-ray scatteringPrincipal Investigator

    • Principal Investigator
      Voegeli Wolfgang
    • Project Period (FY)
      2013 – 2015
    • Research Category
      Grant-in-Aid for Young Scientists (B)
    • Research Field
      Material processing/Microstructural control engineering
    • Research Institution
      Tokyo Gakugei University

All 2024 2023 2020 2019 2018 2017 2016 2015 2014 Other

All Journal Article Presentation

  • [Journal Article] Multibeam X-ray tomography optical system for narrow-energy-bandwidth synchrotron radiation2024

    • Author(s)
      Voegeli Wolfgang、Takayama Haruki、Liang Xiaoyu、Shirasawa Tetsuroh、Arakawa Etsuo、Kudo Hiroyuki、Yashiro Wataru
    • Journal Title

      Applied Physics Express

      Volume: 17 Issue: 3 Pages: 032002-032002

    • DOI

      10.35848/1882-0786/ad2aff

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K28346
  • [Journal Article] Structural transition at the subsurface of few-layer Bi(110) film during the growth2023

    • Author(s)
      Shirasawa Tetsuroh、Voegeli Wolfgang、Arakawa Etsuo、Ushioda Ryota、Nakatsuji Kan、Hirayama Hiroyuki
    • Journal Title

      Physical Review Materials

      Volume: 7 Issue: 3

    • DOI

      10.1103/physrevmaterials.7.033404

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20K21137
  • [Journal Article] Multi-beam X-ray optical system for high-speed tomography using a σ-polarization diffraction geometry2023

    • Author(s)
      Voegeli Wolfgang、Liang Xiaoyu、Shirasawa Tetsuroh、Arakawa Etsuo、Hyodo Kazuyuki、Kudo Hiroyuki、Yashiro Wataru
    • Journal Title

      Applied Physics Express

      Volume: 16 Issue: 7 Pages: 072007-072007

    • DOI

      10.35848/1882-0786/ace5a5

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K28346
  • [Journal Article] High-speed multi-beam X-ray imaging using a lens coupling detector system2020

    • Author(s)
      Shirasawa Tetsuroh、Xiaouyu Liang、Voegeli Wolfgang、Arakawa Etsuo、Kajiwara Kentaro、Yashiro Wataru
    • Journal Title

      Applied Physics Express

      Volume: 13 Issue: 7 Pages: 077002-077002

    • DOI

      10.35848/1882-0786/ab9d30

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Journal Article] A multi-beam X-ray imaging detector using a branched optical fiber bundle2020

    • Author(s)
      Yashiro Wataru、Shirasawa Tetsuroh、Kamezawa Chika、Voegeli Wolfgang、Arakawa Etsuo、Kajiwara Kentaro
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 59 Issue: 3 Pages: 038003-038003

    • DOI

      10.35848/1347-4065/ab79fd

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Journal Article] 波長分散型X線CTR散乱法による界面現象のその場追跡2019

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、荒川悦雄、高橋敏男、増田卓也、魚崎浩平
    • Journal Title

      放射光

      Volume: 32 Pages: 292-299

    • NAID

      40022119156

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Journal Article] 表面X線回折測定の高速化と固液界面構造のその場追跡2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli、荒川悦雄、高橋敏男、松下 正
    • Journal Title

      固体物理

      Volume: 53 Pages: 525-530

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Journal Article] A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry2017

    • Author(s)
      Wolfgang Voegeli, Chika Kamezawa, Etsuo Arakawa, Yohko F. Yano, Tetsuroh Shirasawa, Toshio Takahashi and Tadashi Matsushita
    • Journal Title

      Journal of Applied Crystallography

      Volume: 50 Issue: 2 Pages: 570-575

    • DOI

      10.1107/s1600576717002461

    • Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
    • Data Source
      KAKENHI-PUBLICLY-15H01044, KAKENHI-INTERNATIONAL-15K21719, KAKENHI-PROJECT-16K13816
  • [Journal Article] Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity2016

    • Author(s)
      W. Voegeli, E. Arakawa, T. Matsushita, O. Sakata, Y. Wakabayashi
    • Journal Title

      Zeitschrift fuer Physikalische Chemie

      Volume: 230 Issue: 4 Pages: 577-585

    • DOI

      10.1515/zpch-2015-0669

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PUBLICLY-15H01044, KAKENHI-ORGANIZER-26105001, KAKENHI-PLANNED-26105008, KAKENHI-PROJECT-25820373, KAKENHI-PROJECT-26287080
  • [Presentation] Multi-beam X-ray optical system using a σ-polarization diffraction geometry for high-speed X-ray tomography2023

    • Author(s)
      Wolfgang Voegeli, Xiaoyu Liang, Tetsuroh Shirasawa, Etsuo Arakawa, Kazuyuki Hyodo, Hiroyuki Kudo, Wataru Yashiro
    • Organizer
      60 years of Synchrotron Radiation in Japan (JPSR60)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-23K28346
  • [Presentation] 波長分散型CTR散乱によるBi薄膜の特異な成長過程のライブ観察2020

    • Author(s)
      白澤 徹郎、Voegeli Wolfgang、荒川悦雄、高橋敏男
    • Organizer
      第33回日本放射光学会年会・放射光科学合同シンポジウム
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] Time-Resolved X-ray Diffraction From Nitride Thin Films: Observation of the Specular Rod2019

    • Author(s)
      W. Voegeli, M. Takahasi, T. Sasaki, S. Fujikawa, K. Sugitani, T. Shirasawa, E. Arakawa, T. Yamaguchi
    • Organizer
      第80回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-17H02778
  • [Presentation] Capturing Interface Structures by Fast Surface X-ray Diffraction Measurement2019

    • Author(s)
      白澤 徹郎、Voegeli Wolfgang、荒川悦雄、高橋敏男、松下正
    • Organizer
      The 17th International Conference on the Formation of Semiconductor Interfaces
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] High-speed X-Ray Reciprocal Space Mapping for Dynamics of Molecular Beam Epitaxy2019

    • Author(s)
      M. Takahasi, W. Voegeli, E. Arakawa, T. Shirasawa, T. Sasaki1, T. Yamaguchi and T. Matsushita
    • Organizer
      Materials Research Meeting 2019
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17H02778
  • [Presentation] 波長分散型X線CTR散乱法によるBi超薄膜成長過程の原子レベル構造解析2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli,溜池裕太、荒川悦雄、高橋敏男
    • Organizer
      日本物理学会2018年秋季大会
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] Dispersive X-ray scattering measurements for time-resolved observation of thin films2018

    • Author(s)
      W. Voegeli, E. Arakawa, T. Takahashi, T. Shirasawa, H. Tajiri, M. Takahasi, T. Sasaki, T. Matsushita
    • Organizer
      第65回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-17H02778
  • [Presentation] Real-Time Monitoring of Interface Processes by Wavelength Dispersive X-ray CTR Measurements2018

    • Author(s)
      Tetsuroh Shirasawa、Wolfgang Voegeli 、Etsuo Arakawa、Takuya Masuda、Toshio Takahashi、Kohei Uosaki、Tadashi Matsushita
    • Organizer
      The 15th International Surface X-ray and Neutron Scattering Conference
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] X線CTR散乱迅速測定によるBi超薄膜成長過程の原子レベル追跡2018

    • Author(s)
      白澤徹郎、Wolfgang Voegeli,溜池裕太、荒川悦雄、高橋敏男
    • Organizer
      2018年第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] Capturing interface processes at the atomic scale by high-speed surface X-ray diffraction2018

    • Author(s)
      Tetsuroh Shirasawa、Wolfgang Voegeli 、Etsuo Arakawa、Takuya Masuda、Toshio Takahashi、Kohei Uosaki、Tadashi Matsushita
    • Organizer
      The 9th Vacuum and Surface Science Conference of Asia and Australia
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] Atomic Scale Growth Process of Thin Films as Revealed by Fast Surface X-ray Diffraction2018

    • Author(s)
      Tetsuroh Shirasawa、Wolfgang Voegeli 、Etsuo Arakawa、Toshio Takahashi、Tadashi Matsushita
    • Organizer
      AiMES 2018
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] Time-resolved X-ray diffraction setup for in-situ observation of thin film growth2018

    • Author(s)
      Wolfgang Voegeli、Masamitu Takahasi、Takuo Sasaki、Seiji Fujikawa、Tetsuroh Shirasawa、Etsuo Arakawa、Toshio Takahashi
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-17H02778
  • [Presentation] 波長分散型表面X線回折による界面構造その場追跡2018

    • Author(s)
      白澤徹郎、増田卓也、Wolfgang Voegeli,荒川悦雄、高橋敏男、魚崎浩平、松下正
    • Organizer
      第21回XAFS討論会
    • Data Source
      KAKENHI-PROJECT-18H01880
  • [Presentation] III-V Semiconductor Thin-Film Growth2018

    • Author(s)
      W. Voegeli, M. Takahasi, T. Sasaki, S. Fujikawa, T. Shirasawa, E. Arakawa, T. Takahashi, T. Matsushita
    • Organizer
      The 15th International Surface X-ray and Neutron Scattering Conference
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-17H02778
  • [Presentation] Dispersive X-ray Scattering Measurements Using Monochromatic Undulator Radiation: Towards Millisecond Time Resolution2017

    • Author(s)
      Voegeli Wolfgang, 荒川悦雄, 高橋敏男, 白澤徹郎, 田尻寛男, 松下正
    • Organizer
      日本物理学会 第72回年次大会
    • Place of Presentation
      大阪大学(大阪府・豊中市)
    • Year and Date
      2017-03-17
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Quick surface/interface X-ray scattering measurements using monochromatic undulator radiation2017

    • Author(s)
      W. Voegeli,荒川悦雄,高橋敏男,白澤徹郎,田尻寛男,松下正
    • Organizer
      第30回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      神戸芸術センター(兵庫県・神戸市)
    • Year and Date
      2017-01-07
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Time-Resolved X-ray Scattering Observation of the Photoconversion of Pentacene Diketone Films to Pentacene2017

    • Author(s)
      W. Voegeli,荒川悦雄,高橋敏男,白澤徹郎,鈴木充朗,山田容子,松下正
    • Organizer
      第30回日本放射光学会年会・放射光科学合同シンポジウム
    • Place of Presentation
      神戸芸術センター(兵庫県・神戸市)
    • Year and Date
      2017-01-07
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Quick thin film/multilayer characterization using convergent-beam X-ray scattering measurements2016

    • Author(s)
      Wolfgang VOEGELI, Chika KAMEZAWA, Hirokazu SAITO, Etsuo ARAKAWA, Tetsuroh SHIRASAWA, Toshio TAKAHASHI, Yohko F. YANO, Yumiko TAKAHASHI, Tadashi MATSUSHITA
    • Organizer
      20th International Vacuum Congress
    • Place of Presentation
      Busan Exhibition Convention Center (Busan・韓国)
    • Year and Date
      2016-08-21
    • Int'l Joint Research
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] In-Situ Observation of the Structural Evolution During the Anodic Oxidation of Silicon2016

    • Author(s)
      W. Voegeli, E. Arakawa, T. Shirasawa, T. Matsushita
    • Organizer
      The 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)
    • Place of Presentation
      Nagoya Congress Center (Nagoya・Japan)
    • Year and Date
      2016-08-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] 単色アンジュレータ光を用いた多角度同時分散型反射率計2016

    • Author(s)
      フォグリ ヴォルフガング,白澤徹郎,荒川悦雄,齋藤広和,松下正
    • Organizer
      第29回日本放射光学会年会・放射光科学合同シンポジウム JSR2016
    • Place of Presentation
      東京大学柏の葉キャンパス駅前サテライト(つくば)
    • Year and Date
      2016-01-09
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] In-situ observation of the photoconversion of organic thin films2016

    • Author(s)
      Voegeli Wolfgang, 荒川悦雄, 白澤徹郎, 鈴木充朗, 山田容子, 高橋敏男, 松下正
    • Organizer
      日本物理学会 2016年秋季大会
    • Place of Presentation
      金沢大学(石川県・金沢市)
    • Year and Date
      2016-09-13
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Observation of oxide growth during anodic oxidation of silicon by time-resolved X-ray reflectivity2015

    • Author(s)
      W. Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa, T. Matsushita
    • Organizer
      日本放射光学会年会
    • Place of Presentation
      立命館大学びわこ・くさつキャンパス
    • Year and Date
      2015-01-11
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] Anodic Oxidation of Silicon Observed In-Situ by Specular X-ray Reflectivity2015

    • Author(s)
      Wolfgang Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa and T. Matsushita
    • Organizer
      ALC '15, 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15
    • Place of Presentation
      Kunibiki Messe (Matsue, Japan)
    • Year and Date
      2015-10-25
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] A method for quick measurement of the surface X-ray diffraction profile2015

    • Author(s)
      Voegeli Wolfgang、白澤徹郎、荒川悦雄、亀沢知夏、岩見隆太郎、松下正
    • Organizer
      日本物理学会第70回年次大会
    • Place of Presentation
      早稲田大学 早稲田キャンパス
    • Year and Date
      2015-03-24
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] An asymmetric crystal polychromator with a wide wavelength range for time-resolved surface diffraction measurements2015

    • Author(s)
      Voegeli Wolfgang,白澤徹郎,荒川悦雄,松下正
    • Organizer
      日本物理学 2015会秋季大会
    • Place of Presentation
      関西大学 千里山キャンパス(大阪)
    • Year and Date
      2015-09-16
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Observation of irreversible structural changes of surfaces and thin films with time-resolved X-ray reflectivity and diffraction2015

    • Author(s)
      Wolfgang Voegeli, Etsuo Arakawa, Tetsuroh Shirasawa, Toshio Takahashi, Yohko F. Yano, Tadashi Matsushita
    • Organizer
      588. WE-Heraeus-Seminar on 'Element Specific Structure Determination in Materials on Nanometer and Sub-Nanometer'
    • Place of Presentation
      Conference Centre of the German Physical Society (ドイツ・Bad Honnef)
    • Year and Date
      2015-04-26
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] Anodic Oxidation of Silicon Observed In-Situ by Specular X-ray Reflectivity2015

    • Author(s)
      Wolfgang Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa and T. Matsushita
    • Organizer
      ALC '15, 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15
    • Place of Presentation
      Kunibiki Messe (Matsue, Japan)
    • Year and Date
      2015-10-25
    • Int'l Joint Research
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] Observation of irreversible structural changes of surfaces and thin films with time-resolved X-ray reflectivity and diffraction2015

    • Author(s)
      Wolfgang Voegeli, Etsuo Arakawa, Tetsuroh Shirasawa, Toshio Takahashi, Yohko F. Yano, Tadashi Matsushita
    • Organizer
      588. WE-Heraeus-Seminar on 'Element Specific Structure Determination in Materials on Nanometer and Sub-Nanometer'
    • Place of Presentation
      Conference Centre of the German Physical Society(ドイツ・Bad Honnef)
    • Year and Date
      2015-04-26
    • Int'l Joint Research
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] 逆格子マップおよびX線反射率曲線の迅速測定法ーin situ測定を目指してー2015

    • Author(s)
      松下 正、Voegeli Wolfgang
    • Organizer
      イノベーション ジャパン2015
    • Place of Presentation
      東京ブッグサイト(東京)
    • Year and Date
      2015-08-27
    • Data Source
      KAKENHI-PUBLICLY-15H01044
  • [Presentation] In-situ X-ray reflectivity observation of oxide growth during anodic oxidation of Si2014

    • Author(s)
      W. Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa, T. Matsushita
    • Organizer
      The 7th International Symposium on Surface Science
    • Place of Presentation
      島根県立産業交流会館(くにびきメッセ)
    • Year and Date
      2014-11-03
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] その場X線反射率測定による薄膜成長の観察2014

    • Author(s)
      Voegeli Wolfgang、荒川悦雄、亀沢知夏、岩見隆太郎、白澤徹郎、松下正
    • Organizer
      2014年電気化学秋季大会
    • Place of Presentation
      北海道大学高等教育推進機構
    • Year and Date
      2014-09-27
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] X線反射率による電気化学的薄膜成長のその場観察2014

    • Author(s)
      Voegeli Wolfgang、荒川悦雄、亀沢知夏、岩見隆太郎、白澤徹郎、松下正
    • Organizer
      日本物理学会2014年秋季大会
    • Place of Presentation
      中部大学春日井キャンパス
    • Year and Date
      2014-09-07
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] Electrochemical thin-film growth investigated by time-resolved X-ray reflectivity2014

    • Author(s)
      W. Voegeli, E. Arakawa, C. Kamezawa, R. Iwami, T. Shirasawa, T. Matsushita
    • Organizer
      The 13th Surface X-ray and Neutron Scattering conference
    • Place of Presentation
      ドイツ・ハンブルク
    • Year and Date
      2014-09-07
    • Data Source
      KAKENHI-PROJECT-25820373
  • [Presentation] X線反射率曲線の時分割測定法の開発と応用

    • Author(s)
      松下 正, 荒川悦雄, Wolfgang Voegeli, 岩見 隆太郎, 亀沢 知夏, 矢野 陽子, 西 直哉, 池田 陽一
    • Organizer
      物構研サイエンスフェスタ2013
    • Place of Presentation
      つくば・つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-25820373
  • 1.  Shirasawa Tetsuro (80451889)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 16 results
  • 2.  Takahasi Masamitu (00354986)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 5 results
  • 3.  増田 卓也 (20466460)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 4 results
  • 4.  工藤 博幸 (60221933)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 3 results

URL: 

Are you sure that you want to link your ORCID iD to your KAKEN Researcher profile?
* This action can be performed only by the researcher himself/herself who is listed on the KAKEN Researcher’s page. Are you sure that this KAKEN Researcher’s page is your page?

この研究者とORCID iDの連携を行いますか?
※ この処理は、研究者本人だけが実行できます。

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi