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All Journal Article Presentation
The 8th International Conference on Electronics, Communications and Control Engineering (ICECC 2025)
Pages: 1-5
Proc. of the 8th Conference on Electronics, Communications and Control Engineering
Volume: IE0039
Volume: -
信学技報
Volume: 124(374) Pages: 25-30
IEEE Trans. on VLSI
Volume: 33 Issue: 2 Pages: 449-461
10.1109/tvlsi.2024.3467089
2024 IEEE International Test Conference in Asia (ITC-Asia)
Pages: 1-6
10.1109/itc-asia62534.2024.10661324
Microelectronics Journal
Volume: 151 Pages: 106363-106363
10.1016/j.mejo.2024.106363
情報処理学会 DAシンポジウム2024論文集
Volume: 2024 Pages: 200-207
Journal of Communications
Volume: 20(2) Issue: 2 Pages: 214-220
10.12720/jcm.20.2.214-220
Volume: - Pages: 1-6
2024 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
Pages: 1-4
10.1109/icce-asia63397.2024.10773800
2024 International Technical Conference on Circuits/Systems, Computers, and Communications
10.1109/itc-cscc62988.2024.10628398
10.1109/itc-cscc62988.2024.10628279
IEICE Trans. Inf. & Syst.
Volume: E107.D Issue: 1 Pages: 60-71
10.1587/transinf.2023EDP7101
信学技報,
Volume: 123 Pages: 23-28
Proc. in 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pages: 1-3
10.1109/dft59622.2023.10313532
Proc. in 2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC)
10.1109/itc-cscc58803.2023.10212844
ACM Transactions on Design Automation of Electronic Systems
Volume: 29 Issue: 1 Pages: 1-17
10.1145/3610295
10.1109/itc-cscc58803.2023.10212888
2023 International Technical Conference on Circuits/Systems, Computers, and Communications,
Volume: - Pages: 1-8
Volume: 123 Pages: 112-116
電子情報通信学会技術報告
Volume: DC2022(87) Pages: 27-32
Volume: 123 Pages: 162-167
Proc. in 2023 IEEE 32nd Asian Test Symposium (ATS)
10.1109/ats59501.2023.10317989
電子情報通信学会信学技報
Volume: DC2023-68 Pages: 162-167
Proc. in 2023 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)
10.1109/asianhost59942.2023.10409383
Volume: DC2023-98 Pages: 23-28
Volume: - Issue: 3 Pages: 1-21
10.1145/3563552
Volume: vol. 122(no. 393) Pages: 27-32
情報科学技術フォーラム講演論文集 (FIT)
Pages: 269-271
Proceedings of IEEE 11th Global Conference on Consumer Electronics
Volume: - Pages: 561-565
10.1109/gcce56475.2022.10014218
Volume: vol. 122(no. 285) Pages: 168-173
Proceedings of International Technical Conference on Circuits/Systems, Computers and Communications
Volume: - Pages: 477-480
10.1109/itc-cscc55581.2022.9894966
Volume: vol.122(no.393) Pages: 27-32
Volume: 21st Pages: 269-271
Volume: vol.122(no.285) Pages: 168-173
Volume: DC2022(64) Pages: 168-173
エレクトロニクス実装学会学会誌
Volume: 24 Pages: 668-674
130008110211
Volume: - Pages: 51-54
10.1109/itc-cscc52171.2021.9501474
Journal of The Japan Institute of Electronics Packaging
Volume: 24 Issue: 7 Pages: 668-674
10.5104/jiep.24.668
IEEE the 22nd Workshop on RTL and High Level Testing (WRTLT)
Pages: 11-16
2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
10.1109/itc-cscc52171.2021.9501454
International Technical Conference on Circuits/Systems, Computers and Communications
Pages: 131-136
Volume: E103.D Issue: 11 Pages: 2289-2301
10.1587/transinf.2019EDP7235
130007933859
Pages: 228-233
Volume: vol. 120, no. 358 Pages: 36-41
Volume: DC2020-35 Pages: 24-29
Proc. Int. Technical Conf. on Circuits/Systems, Computers and Communications
Volume: - Pages: 131-136
Volume: vol. 120, no. 236 Pages: 24-29
電子情報通信学会技術研究報告
Volume: 119 Pages: 19-24
Volume: DC2020-75 Pages: 36-41
Volume: 118 Pages: 49-54
Volume: - Pages: 1-4
10.1109/itc-cscc.2019.8793328
Proceedings Internationa Technical Conference on Circuits/Systems, Computers and Communications
Volume: - Pages: 525-528
10.1109/itc-cscc.2019.8793429
Volume: 119 Pages: 145-150
IEEE Design and Test of Computers
Proc. 23rd IEEE European Test Symposium, ETS 2018
Volume: - Pages: 1-2
10.1109/ets.2018.8400707
IEEE Design & Test
Volume: 35(3) Issue: 3 Pages: 39-45
10.1109/mdat.2018.2799801
IEEE European Test Symposium
Proc. 27th IEEE Asian Test Symposium, ATS 2018
Volume: - Pages: 155-160
10.1109/ats.2018.00038
Volume: E100.D Issue: 9 Pages: 2224-2227
10.1587/transinf.2016EDL8210
130006038431
IEEE Asian Test Symposium
Volume: - Pages: 13-18
10.1109/ats.2017.16
Proc. IEEE Asian Test Symposium
Volume: - Pages: 209-214
10.1109/ats.2016.40
Volume: DC2016-76 Pages: 11-16
Proceedings of JIEP Annual Meeting
Volume: 28 Issue: 0 Pages: 231-234
10.11486/ejisso.28.0_231
130007429048
