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HANAI Takaaki  花井 孝明

ORCIDConnect your ORCID iD *help
Researcher Number 00156366
Other IDs
Affiliation (based on the past Project Information) *help 1998 – 2000: Graduate School of Engineering, Nagoya University Assistant Professor, 工学研究科, 講師
1997: 名古屋大学, 大学院・工学研究科, 講師
1991 – 1996: 名古屋大学, 工学部, 講師
1988 – 1989: 名古屋大学, 工学部, 講師
1986 – 1988: 名古屋大学, 工学部, 助手
Review Section/Research Field
Principal Investigator
Applied physics, general / 電子デバイス・機器工学
Except Principal Investigator
物理計測・光学 / 電子機器工学 / Applied physics, general / Applied optics/Quantum optical engineering
Keywords
Principal Investigator
Electron Microscopy / Quantum Noise / 電子レンズ / 球面収差補正 / 量子ノイズ / 薄膜レンズ / 収差補正 / 球面収差 / Image Restoration / Maximum Entropy Method … More / 電子顕微鏡 / 画像修復 / 最大エントロピー法 / Scanning Transmission Electron Microscopy / Foil Lens / Spherical Aberration / 走査透過電子顕微鏡 / Resolution / Electron Lens / Correction / 超高分解能 / 高分解能 / 5次球面収差 / 対物レンズ / 分解能 / Complex Wave Function / Contrast Transfer Function / Structure Analysis / Random Noise Constraint / ランダム空間分布制約条件 / 複素波動関数 / コントラスト伝達関数 / 構造解析法 / ランダム空間分布制約 / 電子顕微鏡像 / 弱位相物体 / electron lens / foil lens / spherical aberration correction / transmission electron microscopy / 球面収差測定法 / 透過電子顕微鏡 / Electron Probe / Shadow Image / Aberration Correction / 信号演算処理 / 統計ノイズ / 非回転対称収差 / プローブフォーミングレンズ / 電子プローブ / 陰影像 … More
Except Principal Investigator
走査透過電子顕微鏡 / 電界放出電子銃 / ノイズ除去 / SN比 / YAG / 電子プローブ / 薄膜レンズ / 球面収差補正 / 磁界重畳型電子銃 / 電子レンズ / 減速レンズ / 加速レンズ / 電子銃 / 低加速電子銃 / 信号演算処理 / Noise elimination / Specific contrast / Electron signal manipulation / Digital processing system / Inelastically scattered electron / Elastically scattered electron / Scanning transmission electron microscopy / 量子検出効率 / 非弾性散乱 / 弾性散乱 / デコンボリュ-ション処理 / 特殊コントラスト / 電子信号間演算 / ディジタル処理システム / 非弾性散乱電子 / 弾性散乱電子 / Image processing / Manipulation among signal electrons / Signal electron detection / Specimen damage / High resolution observation / Field emission electron gun / High voltage STEM / 信号間演算処理 / YAG単結晶シンチレータ / 像のSN比 / 信号電子演算 / 高解像度電子顕微鏡観察 / 画像処理 / 信号電子間演算 / 信号電子検出法 / 試料損傷 / 高解像度観察 / 超高圧走査透過電子顕微鏡 / Recolution / Scanning Transmission Election Microscopy (STEM) / Electron Probe / Foil Lend / Correction / Shperical aberration / Electron lens / 分解能 / 走査透過電子顕微鏡(STEM) / 収差補正 / 球面収差 / Decelerating Lens / Accelerating Lens / Magnetic-Field-Superimposed Electron Gun / Field Emission Gun / Loe Voltage Electron Gun / Electron Gum / 超高真空 / real time phase observation / electron trapezoidal prism / differential microscopy / differential interferometry / electron holography / 電子系台形プリズム / 実時間位相計測 / 電子線台形プリズム / 微分顕微鏡法 / 微分干渉法 / 電子線ホログラフィ / lens coupling system / glass hemisphere / high efficient scintillator / TV-system / high voltage electron microscope / 高効率シンチ-タ / 電子顕微鏡 / レンズカップリング / 半球ガラス / 高効率シンチレータ / TVシステム / 超高圧電子顕微鏡 / foil lens / spherical aberration correction / detective quantum efficiency (DQE) / scanning transmission electron microscopy (STEM) / electron energy loss spectroscopy (EELS) / elemental mapping / 走査透過電子顕微鏡法 / 電子エネルギー損失分光法 / 元素マッピング像 / 検出量子効率 / パラレル電子エネルギー損失分光法 / 元素マッピング / 静電レンズ / 磁界放畳型電子銃 / 元素分布像 / STEM / 電位コントラスト / 電子ビームテスティング / 低加速SEM Less
  • Research Projects

    (13 results)
  • Co-Researchers

    (13 People)
  •  Improvement of Resolution of a Electron Microscope by Means of Correction of Spherical Aberration Using a Foil LensPrincipal Investigator

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied physics, general
    • Research Institution
      Nagoya University
  •  Development of electron differential interferometry and its application to magnetic materials

    • Principal Investigator
      TANJI Takayoshi
    • Project Period (FY)
      1997 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied physics, general
    • Research Institution
      Nagoya University
  •  Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.Principal Investigator

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1997 – 1998
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Applied physics, general
    • Research Institution
      Nagoya University
  •  Fundamental Study on a High Brightness and High Resolution YAG Screen for Electron Microscopy

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied optics/Quantum optical engineering
    • Research Institution
      Nagoya University
  •  Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.Principal Investigator

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Nagoya University
  •  Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberrationPrincipal Investigator

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1993 – 1995
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Nagoya University
  •  Fundamental study on spherical aberration correction of the objective lens of an electron microscope using a foil lensPrincipal Investigator

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1993 – 1994
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Applied physics, general
    • Research Institution
      Nagoya University
  •  Observation of high resolution elemental mapping images using a high sensitivity detector

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  磁界重畳型電界放出電子銃の装備による超低加速電子線プローブ応用装置の超高性能化

    • Principal Investigator
      SHIMOYAMA Hiroshi
    • Project Period (FY)
      1991 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      物理計測・光学
    • Research Institution
      Meijo University
      Nagoya University
  •  On line digital manipulation process of elastically and inelastically scattered electron signals in scanning transmission electron microscopy

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1988 – 1989
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      電子機器工学
    • Research Institution
      Nagoya University
  •  Research on High Resolution Electron Microscope Observations without Specimen Damage

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1987 – 1989
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  Developmental Research on the Magnetic-Field-Superimposed Field Emission Gum for Low Accelerating Voltage

    • Principal Investigator
      MARUSE Susumu
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil Lens

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      電子機器工学
    • Research Institution
      Nagoya University
  • 1.  HIBINO Michio (40023139)
    # of Collaborated Projects: 10 results
    # of Collaborated Products: 0 results
  • 2.  TANAKA Shigeyasu (70217032)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 0 results
  • 3.  SUGIYAMA Setuko (00115586)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 0 results
  • 4.  SHIMOYAMA Hiroshi (30023261)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 0 results
  • 5.  KIMURA Keiko (60262862)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 6.  UCHIKAWA Yoshiki (20023260)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 7.  TANJI Takayoshi (90125609)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 8.  MUROOKA Yoshie (40273263)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 9.  MARUSE Susumu (20022981)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 10.  大江 俊美 (30076632)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 11.  池田 晋 (20076623)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 12.  TOMITA Masahiro
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  HIRAYAMA Tsukasa
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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