Tanaka Shigeyasu 田中成泰

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TANAKA Shigeyasu 田中成泰

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Researcher Number	70217032
Other IDs
External Links
Affiliation (Current)	2025: 中部大学, 生命健康科学部, 教授
Affiliation (based on the past Project Information) *help	2018 – 2023: 中部大学, 生命健康科学部, 教授 2015 – 2016: 中部大学, 生命健康科学部, 教授 2013 – 2014: 名古屋大学, エコトピア科学研究所, 准教授 2007 – 2010: 名古屋大学, エコトピア科学研究所, 准教授 2005 – 2006: 名古屋大学, エコトピア科学研究所, 講師 … More 2004: Nagoya University, Ecotopia Science Institute, Associate Professor, エコトピア科学研究所, 助教授 2004: 名古屋大学, エコトピア科学研究機構, 講師 2002 – 2003: 名古屋大学, 理工科学総合研究センター, 講師 2002: 名古屋大学, 理工科学研究センター, 講師 1997 – 2001: Nagoya university, School of Engineering Research Associate, 工学研究科, 助手 1997: 名古屋大学, 大学院・工学研究科, 助手 1993 – 1996: 名古屋大学, 工学部, 助手 Less
Review Section/Research Field	Principal Investigator Electronic materials/Electric materials / Electronic materials/Electric materials / Basic Section 90110:Biomedical engineering-related / Basic Section 21050:Electric and electronic materials-related Except Principal Investigator Applied physics, general / 表面界面物性 / Electronic materials/Electric materials / 電子デバイス・機器工学 / Applied optics/Quantum optical engineering / Engineering / Science and Engineering / Applied materials science/Crystal engineering / Thin film/Surface and interfacial physical properties
Keywords	Principal Investigator SEM / 走査型電子顕微鏡 / シリコン / p-n接合 / 電子線誘起電流 / 半導体 / TEM / 画像修復 / 反射電子像 / 走査電子顕微鏡 … More / 最大エントロピー法 / コントラスト / 電位コントラスト / 不純物濃度 / EBIC / PN接合 / 電子顕微鏡 / 作成・評価技術 / イオン研磨法 … More Except Principal Investigator Electron Microscopy / 電子顕微鏡 / Quantum Noise / 電子レンズ / 球面収差補正 / 量子ノイズ / 薄膜レンズ / 収差補正 / 球面収差 / 電子線ホログラフィ / GaN / Image Restoration / Maximum Entropy Method / 画像修復 / 最大エントロピー法 / YAG / 透過電子顕微鏡 / Scanning Transmission Electron Microscopy / Foil Lens / Spherical Aberration / 走査透過電子顕微鏡 / カーボンナノチューブ / シリコン基板 / 光導波路 / 面間拡散 / ファセット成長 / 選択成長 / MOVPE / electron holography / transmission electron microscope / real time observation / stereoscopy / 透過型電子顕微鏡 / ステレオ位相顕微鏡 / 実時間ステレオ電子顕微鏡 / 実時間ステレオ観察 / 立体像観察 / ステレオ電子線ホログラフィ / 電子線実体位相顕微鏡 / 透過電子顕微鏡観察 / ステレオ法 / 立体観察 / 実時間観察 / ステレオ電子顕微鏡 / focused ion beam (FIB) / precise diamond cutter / surface decomposition of SiC / field emission electron gun / carbon nano-tube / SiC / 電界放出形電子銃 / FIB / 精密ダイヤモンドカッター / 炭化珪素 / 表面分解法 / 配向成長 / 収束イオンピーム(FIB)加工 / 収束イオンビーム(FIB)加工 / 精密ダイアモンドカッター / 炭化珪素表面分解法 / 電界放出電子銃 / Quantum dot / HVPE / Surface diffusion / Growth on facets / Selective growth / Hetero-epitaxy / 異種基板 / 緩衝層 / 三族窒化物 / 伝導性制御 / 量子細線 / ダブルヘテロ構造 / 量子ドット / HVPE法 / MOVPE法 / 表面拡散 / 選択成長法 / ヘテロエピタキシ / Resolution / Electron Lens / Correction / 超高分解能 / 高分解能 / 5次球面収差 / 対物レンズ / 分解能 / Complex Wave Function / Contrast Transfer Function / Structure Analysis / Random Noise Constraint / ランダム空間分布制約条件 / 複素波動関数 / コントラスト伝達関数 / 構造解析法 / ランダム空間分布制約 / 電子顕微鏡像 / electron beam annealing / Lorentz microscopy / granular film / fine magnetic structure / ローレンツ電顕法 / 電子ビーム加熱 / ローレンツ電子顕微鏡法 / グラニュラー膜 / 微細磁気構造 / 弱位相物体 / lens coupling system / glass hemisphere / high efficient scintillator / TV-system / high voltage electron microscope / 高効率シンチ-タ / レンズカップリング / 半球ガラス / 高効率シンチレータ / TVシステム / 超高圧電子顕微鏡 / electron lens / foil lens / spherical aberration correction / transmission electron microscopy / 球面収差測定法 / Electron Probe / Shadow Image / Aberration Correction / 信号演算処理 / 統計ノイズ / 非回転対称収差 / プローブフォーミングレンズ / 電子プローブ / 陰影像 / 電子線励起電流 / 電子線励起深紫外レーザ / ソーラーブラインド紫外線検出器 / バルクAlN / ナノカーボン電極 / 分極半導体 / グラフェン / 低加速電圧SEM / 分極電荷エンジニアリング / バルクAlN基板 / 深紫外発光素子 / ナノワイヤ / 深紫外 / 分極ドーピング / 熱処理 / ナノカーボン / 結晶成長その場観察 / AlGaN / AlN / 電気・電子材料 / 電子線ホログラフィー / 界面構造 / Si基板 / 時間分解分光 / 光デバイス / ナノヘテロ構造 / 不純物ドーピング / ナノへテロ構造 / 窒化物半導体 / 高干渉性電子線 / 制限視野電子回折 / 酸化ニッケル / 巨大磁気抵抗効果 / 電子線回析 / Cu / Co / 磁性金属多層膜 / 電子回折 / 反強磁性体 Less

細胞内微細構造のSEM反射電子像の高解像化のための画像処理法の開発Principal Investigator
- Principal Investigator
  
  田中成泰
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 90110:Biomedical engineering-related
- Research Institution
  Chubu University
Understanding of SEM secondary electron voltage contrast and development of quantification methodPrincipal Investigator
- Principal Investigator
  
  Tanaka Shigeyasu
- Project Period (FY)
  2018 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Chubu University
Development of dopant concentration measuring technique for next generation semiconductor devicesPrincipal Investigator
- Principal Investigator
  
  TANAKA Shigeyasu
- Project Period (FY)
  2013 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Chubu University
  Nagoya University
Physics of highly polarized semiconductors and their application to deep ultraviolet light emitting devices
- Principal Investigator
  
  AMANO Hiroshi
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Specially Promoted Research
- Review Section
  
  Science and Engineering
  Engineering
- Research Institution
  Nagoya University
Development of dopant concentration measurement technique for next-generation devicesPrincipal Investigator
- Principal Investigator
  
  TANAKA Shigeyasu
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Nagoya University
Selective epitaxial growth of nitride nano-hetero structures on patterned silicon substrate
- Principal Investigator
  
  SAWAKI Nobuhiko
- Project Period (FY)
  2004 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (S)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Nagoya University
反強磁性薄膜材料の電子波による研究
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2003 – 2005
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Thin film/Surface and interfacial physical properties
- Research Institution
  Nagoya University
Development of a real time stereo phase microscope
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University
SELECTIVE GROWTH OF III-NITRIDE MICROSTRUCTURES ON SILICON SUBSTRATE
- Principal Investigator
  
  SAWAKI Nobuhiko
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  NAGOYA UNIVERSITY
Equipping a transmission electron microscope with a field emission electron gun.
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  Nagoya University
Improvement of Resolution of a Electron Microscope by Means of Correction of Spherical Aberration Using a Foil Lens
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Nagoya University
Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Nagoya University
Fundamental Study on magnetic-granular films with fine structures
- Principal Investigator
  
  TANJI Takayoshi
- Project Period (FY)
  1996 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Nagoya University
高品質な高分解能電顕像を得るための半導体試料の薄片化法の検討Principal Investigator
- Principal Investigator
  
  田中成泰
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Nagoya University
Fundamental Study on a High Brightness and High Resolution YAG Screen for Electron Microscopy
- Principal Investigator
  
  HIBINO Michio
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied optics/Quantum optical engineering
- Research Institution
  Nagoya University
Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Nagoya University
高品質な高分解能電顕像を得るための半導体試料の薄片化法の検討Principal Investigator
- Principal Investigator
  
  田中成泰
- Project Period (FY)
  1994
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Nagoya University
Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1993 – 1995
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  電子デバイス・機器工学
- Research Institution
  Nagoya University
Fundamental study on spherical aberration correction of the objective lens of an electron microscope using a foil lens
- Principal Investigator
  
  HANAI Takaaki
- Project Period (FY)
  1993 – 1994
- Research Category
  
  Grant-in-Aid for General Scientific Research (C)
- Research Field
  
  Applied physics, general
- Research Institution
  Nagoya University

[Journal Article] Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations2020
- Author(s)
  S. Tanaka and Y. Ohmi
- Journal Title
  
  Microsc. Microanal.
  
  Volume: 26 Issue: S2 Pages: 2692-2693
- DOI
  10.1017/s1431927620022448
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K04246
[Journal Article] Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations2019
- Author(s)
  Shigeyasu Tanaka, Yusuke Ohmi
- Journal Title
  
  Microsc. Microanal.
  
  Volume: 25 (Suppl 2) Issue: S2 Pages: 902-903
- DOI
  10.1017/s1431927619005245
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K04246
[Journal Article] SEM observation and analysis of InGaN/GaN multiple quantum well structure using obliquely polished sample2017
- Author(s)
  S. Tanaka, T. Karumi
- Journal Title
  
  Microscopy
  
  Volume: 66 Pages: 131-135
- DOI
  10.1093/jmicro/dfw101
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25420285
[Journal Article] Observation of the Potential Distribution in GaN-based Devices by Scanning Electron2015
- Author(s)
  T.Karumi, S.Tanaka
- Journal Title
  
  Microsc. Microanal.
  
  Volume: 21 Issue: S3 Pages: 275-276
- DOI
  10.1017/s1431927615002172
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25420285
[Journal Article] Observation of the potential distribution in GaN-based devices by a scanning electron microscope2014
- Author(s)
  T. Karumi, T. Tanji and S. Tanaka
- Journal Title
  
  Microscopy
  
  Volume: 63 Issue: suppl 1 Pages: i22.1-i23
- DOI
  10.1093/jmicro/dfu051
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25000011, KAKENHI-PROJECT-25420285
[Journal Article] A simple way to obtain backscattered electron images in a scanning transmission electron microscope2014
- Author(s)
  H. Tsuruta, S. Tanaka, T. Tanji and C. Morita:
- Journal Title
  
  Microscopy
  
  Volume: 63 Issue: 4 Pages: 333-336
- DOI
  10.1093/jmicro/dfu017
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25420285
[Journal Article] Determination of piezoelectric fields across InGaN/GaN quantum wells by means of electron holography2010
- Author(s)
  M.Deguchi, S.Tanaka, T.Tanji
- Journal Title
  
  Journal of Electronic Materials
  
  Volume: 39 Pages: 815-818
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20560296
[Journal Article] Determination of Piezoelectric Fields Across InGaN/GaN Quantum Wells by Means of Electron Holography2010
- Author(s)
  M.Deguchi, S.Tanaka, T.Tanji
- Journal Title
  
  Journal of Electronic Materials 39
  
  Pages: 815-818
- Data Source
  KAKENHI-PROJECT-20560296
[Journal Article] Growth and properties of semi-polar GaN on a patterned silicon substrate2009
- Author(s)
  N. Sawaki, T. Hikosaka, N. Koide, Y. Honda, M. Yamaguchi and T. Tanaka
- Journal Title
  
  J. Crystal Growth Online 14 Jan. doi.10.1016
  
  Pages: 1-8
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-16106001
[Journal Article] EBIC imaging using scanning transmission electron microscopy : experiment and analysis2008
- Author(s)
  S.Tanaka, H.Tanaka, T.Kawasaki, M.Ichihashi, T.Tanji, K.Arafune, Y.Ohshita, M.Yamaguchi
- Journal Title
  
  Journal of Materials Science-Materials in Electronics 19
- Data Source
  KAKENHI-PROJECT-20560296
[Journal Article] Development of a Real-Time Stereo Transmission Electron Microscope.2005
- Author(s)
  T.Tanji, H.Tanaka, T.Kojima
- Journal Title
  
  J.Electron Microsc. Vol.54(in press)
- NAID
  10016856151
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Development of a real-time stereo TEM.2005
- Author(s)
  H.Tanaka, T.Kojima, H.Tsuruta, J.Chen, T.Tanji, M.Ichihashi
- Journal Title
  
  J.Materials Science (in press)
- Data Source
  KAKENHI-PROJECT-15656011
[Journal Article] Development of a Real-Time Stereo Transmission Electron Microscope.2005
- Author(s)
  T.Tanji, H.Tanaka, T.Kojima
- Journal Title
  
  J.Electron Microsc 54・3
  
  Pages: 215-222
- NAID
  10016856151
- Data Source
  KAKENHI-PROJECT-15656011
[Journal Article] Transmission Electron Microscopy Study of an AlN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy.2004
- Author(s)
  S.Tanaka, T.Tanji, M.Ichihasi 他4名
- Journal Title
  
  J.Crystal Growth 260
  
  Pages: 360-365
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Electron holography study of a GaN/AlGaN interface and a GaN crystal on Si substrates2004
- Author(s)
  S.Tanaka
- Journal Title
  
  Proc. 8th Asia-Pacific Electron Microscopy Conference
  
  Pages: 507-508
- Data Source
  KAKENHI-PROJECT-16106001
[Journal Article] Transmission Electron Microscopy Study of an AlN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy.2004
- Author(s)
  S.Tanaka, Y.Honda, N.Kameshiro, R.Iwasaki, N.Sawaki, T.Tanji, M.Ichihashi
- Journal Title
  
  J.Crystal Growth Vol.260
  
  Pages: 360-365
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Electron Holography Study of a GaN/AlGaN Interface and a GaN Crystal on Si Substrates.2004
- Author(s)
  S.Tanaka, T.Tanji, M.Ichihashi ほか2名
- Journal Title
  
  Proc.8th Asia-Pacific Electron Microscopy Conference, Kanazawa
  
  Pages: 507-508
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Transmission Electron Microscopy Study of the Microstucture in Selective-Area-Grown GaN and an AlGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate.2002
- Author(s)
  S.Tanaka, T.Tanji, 他4名
- Journal Title
  
  Jpn.J.Appl.Phys. 41
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AlGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate.2002
- Author(s)
  S.Tanaka, Y.Honda, N.Kameshiro, R.Iwasaki, N.Sawaki, T.Tanji
- Journal Title
  
  Jpn.J.Appl.Phys. Vol.41Part2-No.7B
- NAID
  110004081100
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14205008
[Journal Article] Defect structure in selective area growth GaN pyramid on (111)Si substrate.2000
- Author(s)
  Shigeyasu Tanaka
- Journal Title
  
  Applied Physics Letters 76
  
  Pages: 2701-2703
- NAID
  120000979659
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-11650055
[Journal Article] Defect structure in selective area growth GaN pyramid on (111)Si substrate.2000
- Author(s)
  田中成泰
- Journal Title
  
  Applied Physics Letters 76
  
  Pages: 2701-2703
- NAID
  120000979659
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-11650055
[Presentation] 半導体p-n接合のSEMドーパントコントラストの検討2023
- Author(s)
  田中成泰
- Organizer
  日本顕微鏡学会第79回学術講演会
- Data Source
  KAKENHI-PROJECT-22K12808
[Presentation] 半導体p-n接合のSEMドーパントコントラストの検討2023
- Author(s)
  田中成泰
- Organizer
  日本顕微鏡学会第79回学術講演会
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] 半導体p-n接合のSEMドーパントコントラストの検討2023
- Author(s)
  田中成泰
- Organizer
  日本顕微鏡学会　第79回学術講演会
- Data Source
  KAKENHI-PROJECT-22K12808
[Presentation] SEM観察のための液中生物試料の簡便な調整法2022
- Author(s)
  田中成泰、丹羽麻琴、湯川絹叶
- Organizer
  日本顕微鏡学会第78回学術講演会
- Data Source
  KAKENHI-PROJECT-22K12808
[Presentation] SEM観察のための液中生物試料の簡便な調整法2022
- Author(s)
  田中成泰、丹羽麻琴、湯川絹叶
- Organizer
  日本顕微鏡学会第78回学術講演会
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] Ar イオンビームによるSEM観察のための培養細胞断面試料の作製2020
- Author(s)
  田中成泰, 大海雄介
- Organizer
  日本顕微鏡学会第76回学術講演会
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations2019
- Author(s)
  S. Tanaka, Y. Ohmi
- Organizer
  Microscopy & Microanalysis 2019
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] Preparation of Biological Samples for SEM Observations using Ionic Liquid2018
- Author(s)
  S. Tanaka, S. Nakayama. K. Niimi, H. Miyake
- Organizer
  19th International Microscopy Congress
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] 培養細胞断面SEM観察のためのArイオンビームによる試料作製2018
- Author(s)
  田中成泰、長岡祥平、大海雄介
- Organizer
  日本顕微鏡学会第74回学術講演会
- Data Source
  KAKENHI-PROJECT-18K04246
[Presentation] 斜め研磨によるInGaN/GaN量子井戸構造のSEM観察と解析2017
- Author(s)
  田中成泰、新實幸樹
- Organizer
  第73回日本顕微鏡学会学術講演会
- Place of Presentation
  札幌コンベンションセンター（北海道・札幌）
- Year and Date
  2017-05-30
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] 電子線ホログラフィ法による窒化物半導体超格子内のピエゾ電界の解析2014
- Author(s)
  長尾俊介, 田中成泰, 丹司敬義, 天野浩
- Organizer
  電気・電子・情報関係学会東海支部連合大会
- Place of Presentation
  名古屋市
- Year and Date
  2014-09-08
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] Observation of the potential distribution in GaN-based devices by a scanning electron microscope2014
- Author(s)
  T. Karumi, S. Tanaka and T. Tanji
- Organizer
  日本顕微鏡学会第58回シンポジウム
- Place of Presentation
  福岡市
- Year and Date
  2014-11-16
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] 走査型電子顕微鏡による半導体ポテンシャル分布の観察2014
- Author(s)
  軽海貴博, 田中成泰, 丹司敬義, 天野浩
- Organizer
  電気・電子・情報関係学会東海支部連合大会
- Place of Presentation
  名古屋市
- Year and Date
  2014-09-08
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] 低加速電圧SEM-EBIC法によるAlGaN系深紫外発光素子断面の電気的特性の解析2013
- Author(s)
  軽海貴博, 田中成泰, 丹司敬義, 天野浩, 古澤優太
- Organizer
  平成25年電気関係学会東海支部連合大会
- Place of Presentation
  浜松
- Year and Date
  2013-09-25
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] 低加速電圧SEM-EBIC によるシリコン中のドーパント濃度分布の可視化2013
- Author(s)
  丹羽辰嗣，田中成泰，軽海貴博，丹司敬義
- Organizer
  日本顕微鏡学会第69回学術講演会
- Place of Presentation
  吹田市
- Invited
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] BSE detector incorporated in STEM sample holder and its application2013
- Author(s)
  H. Tsuruta, S. Tanaka, T. Tanji and C. Morita
- Organizer
  9th International Symposium on Atomic Level Characterizations　for New Materials and Devices ’13
- Place of Presentation
  Hawaii, USA
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] 低加速SEM-EBIC法によるAlGaN系深紫外発光素子断面の電気的特性の解析2013
- Author(s)
  軽梅貫博, 田中成泰, 丹司敬義, 天野浩, 古澤優太
- Organizer
  日本顕微鏡学会第57回シンポジウム
- Place of Presentation
  名古屋
- Year and Date
  2013-11-15
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] Electrical characterization of AlGaN-based deep ultraviolet light-emitting diode by low-voltage cross-sectional SEM-EBIC2013
- Author(s)
  T. Karumi, S. Tanaka, T. Tanji, H. Amano, Y. Furusawa
- Organizer
  International Symposium on Ecotopia Science '13
- Place of Presentation
  Nagoya, Japan
- Year and Date
  2013-12-14
- Data Source
  KAKENHI-PROJECT-25000011
[Presentation] Application of Electron-Beam-Induced-Current Technique in Scanning Transmission Electron Microscope to Observation of Si p-n Junction2010
- Author(s)
  S.Tanaka, T.Niwa, T.Tanji
- Organizer
  International Microscopy Congress 17
- Place of Presentation
  リオデジャネイロ(ブラジル)
- Year and Date
  2010-09-22
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] Application of Electron-Beam-Induced-Current Technique in Scanning Transmission Electron Microscope to Observation of Si p-n Junction2010
- Author(s)
  T.Niwa, S.Tanaka, T.Tanji
- Organizer
  International Microscopy Congress 17
- Place of Presentation
  Rio, Brazil
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] STEM-EBIC法によるシリコンpn接合の観察2010
- Author(s)
  丹羽辰嗣、田中成泰、丹司敬義
- Organizer
  日本顕微鏡学会第66回学術講演会
- Place of Presentation
  名古屋国際会議場(愛知県)
- Year and Date
  2010-05-24
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] Determination of Piezoelectric Fields across InGaN/GaN Quantum Wells by Mwans of Electron Holography2009
- Author(s)
  S.Tanaka, M.Deguchi, T.Tanji
- Organizer
  13th Int.Conf.on Defects Recognition, Imaging and Physics in Semiconductors
- Place of Presentation
  Wheeling, USA
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] Determination of piezoelectric fields across InGaN/GaN quantum wells by means of electron holography2009
- Author(s)
  田中成泰
- Organizer
  13th Int. Conf. on Defects Recognition, Imaging and Physics in Semiconductors
- Place of Presentation
  Wheeling, USA
- Year and Date
  2009-09-14
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] Characterization of a-Si/c-Si Junctions by Electron Holography2008
- Author(s)
  S.Tanaka, M.Deguchi, T.Tanji
- Organizer
  The 9th Asia-Pasific Microscopy Conference
- Place of Presentation
  Jeju, Korea
- Data Source
  KAKENHI-PROJECT-20560296
[Presentation] 走査型電子顕微鏡による半導体ポテンシャル分布の観察
- Author(s)
  軽海貴博，田中成泰，丹司敬義，天野浩
- Organizer
  平成26年度電気・電子・情報関係学会　東海支部連合大会
- Place of Presentation
  名古屋市
- Year and Date
  2014-09-08 – 2014-09-09
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] STEM用試料ホルダー組み込み型の反射電子検出器（2）
- Author(s)
  鶴田浩貴，田中成泰，丹司敬義，森田千明
- Organizer
  日本顕微鏡学会第70回記念学術講演会
- Place of Presentation
  千葉市
- Year and Date
  2014-05-11 – 2014-05-13
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] 電子線ホログラフィ法による窒化物半導体超格子内のピエゾ電界の解析
- Author(s)
  長尾俊介，田中成泰，丹司敬義，天野浩
- Organizer
  平成26年度電気・電子・情報関係学会　東海支部連合大会
- Place of Presentation
  名古屋市
- Year and Date
  2014-09-08 – 2014-09-09
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] An attempt to visualize dopant distribution in Si by low-voltage SEM-EBIC
- Author(s)
  S. Tanaka, T. Niwa and T. Tanji
- Organizer
  IMC2014（18th International Microscopy Congress）
- Place of Presentation
  Prague, Czech Republic
- Year and Date
  2014-09-07 – 2014-09-12
- Data Source
  KAKENHI-PROJECT-25420285
[Presentation] A simple way to obtain BSE image in STEM
- Author(s)
  H. Tsuruta, S. Tanaka, T. Tanji and C. Morita
- Organizer
  IMC2014（18th International Microscopy Congress）
- Place of Presentation
  Prague, Czech Republic
- Year and Date
  2014-09-07 – 2014-09-12
- Data Source
  KAKENHI-PROJECT-25420285

1. HANAI Takaaki (00156366)

# of Collaborated Projects: 6 results

# of Collaborated Products: 0 results
2. TANJI Takayoshi (90125609)

# of Collaborated Projects: 5 results

# of Collaborated Products: 8 results
3. HIBINO Michio (40023139)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
4. MUROOKA Yoshie (40273263)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
5. KIMURA Keiko (60262862)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
6. HONDA Yoshio (60362274)

# of Collaborated Projects: 3 results

# of Collaborated Products: 1 results
7. ICHIHASHI Mikio (90345869)

# of Collaborated Projects: 2 results

# of Collaborated Products: 3 results
8. SAWAKI Nobuhiko (70023330)

# of Collaborated Projects: 2 results

# of Collaborated Products: 1 results
9. YAMAGUCHI Masahito (20273261)

# of Collaborated Projects: 2 results

# of Collaborated Products: 1 results
10. NIWA Tatsushi

# of Collaborated Projects: 2 results

# of Collaborated Products: 5 results
11. AMANO Hiroshi (60202694)

# of Collaborated Projects: 1 results

# of Collaborated Products: 5 results
12. DEKI Manato (80757386)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. OHNO Yutaka (10324451)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. MIYAKE Hideto (70209881)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. NARITSUKA Shigeya (80282680)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. TAKEUCHI Tetsuya (10583817)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. IWAYA Motoaki (40367735)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. FUKUYAMA Hiroyuki (40252259)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. SUGIYAMA Setsuko (00115586)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. CHEN Jun (90308338)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. 川崎忠寛 (10372533)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. DEGUCHI Masashi

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
23. KUSHIDA Takuya

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. TEJIMA Motohiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. KARUMI Takahiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
26. NAGAO Shunsuke

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
27. KUSUONKI Michiko

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
28. 岡本篤人

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
29. OKAMAOT Atsuto

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

Tanaka Shigeyasu 田中 成泰

TANAKA Shigeyasu 田中 成泰

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細胞内微細構造のSEM反射電子像の高解像化のための画像処理法の開発Principal Investigator

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Understanding of SEM secondary electron voltage contrast and development of quantification methodPrincipal Investigator

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Development of dopant concentration measuring technique for next generation semiconductor devicesPrincipal Investigator

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Development of dopant concentration measurement technique for next-generation devicesPrincipal Investigator

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高品質な高分解能電顕像を得るための半導体試料の薄片化法の検討Principal Investigator

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Tanaka Shigeyasu 田中成泰

TANAKA Shigeyasu 田中成泰