KAMIYA Shoji 神谷庄司

… Alternative Names

神谷庄司カミヤショウジ

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Researcher Number	00204628
Other IDs
Affiliation (Current)	2025: 名古屋工業大学, 工学(系)研究科(研究院), 研究員
Affiliation (based on the past Project Information) *help	2011 – 2023: 名古屋工業大学, 工学(系)研究科(研究院), 教授 2012: 名古屋工業大学, 工学研究科, 教授 2009 – 2011: Nagoya Institute of Technology, 大学院・工学研究科, 教授 2008: Nagoya Institute of Technology, 工学研究科, 教授 2006: 名古屋工大, 工学(系)研究科(研究院), 教授 … More 2004 – 2005: 名古屋工業大学, 工学研究科, 教授 2003 – 2004: 東北大, 工学(系)研究科(研究院), 助教授 1998 – 2002: 東北大学, 大学院・工学研究科, 助教授 1998: 東北大, 工学(系)研究科, 講師 1997: Tohoku University, Graduate School of Engineering, Lecturer, 大学院・工学研究科, 講師 1997: 東北大学, 大学院工学研究科, 講師 1996: 東北大学, 工学部, 講師 1995: 東北大学, 工学部, 助手 1993: 東北大学, 工学部, 講師 Less
Review Section/Research Field	Principal Investigator Materials/Mechanics of materials / Materials/Mechanics of materials / Basic Section 18010:Mechanics of materials and materials-related / Nano/Microsystems / Microdevices/Nanodevices / Nanomaterials/Nanobioscience Except Principal Investigator Materials/Mechanics of materials / Aerospace engineering / Composite materials/Physical properties
Keywords	Principal Investigator シリコン / ポリシリコン / 付着強度 / crystal slip / fatigue / silicon / 電子顕微鏡観察 / Adhesive Strength / Thin Films / 薄膜 … More / その場観察 / 疲労試験 / MEMS / 機械材料・材料力学 / マイクロマシン / 疲労 / 損傷 / 準位 / 多結晶粒界 / 半導体材料 / 界面破壊じん性 / き裂進展抵抗曲線 / fatigue process / crystal slip deformation / micro-torsion device / fatiue / 疲労結晶すべり / 疲労過程 / crystal defect / 結晶欠陥 / 有機半導体 / フレキシブルエレクトロニクス / 有機トランジスタ / プリンテッドエレクトロニクス / 銀ナノ粒子インク配線 / 曲げ疲労試験 / 応力発光体 / 電子顕微鏡 / 電気特性変動 / 曲げ試験 / フレキシブルデバイス / 有機薄膜トランジスタ / Toughening / Crystalline structure / Substrate Bias / Non-Diamond Carbon / CVD diamond / 高じん化 / 結晶組織 / 基板バイアス処理 / 非晶質炭素 / 気相合成ダイヤモンド / Interface Fracture Toughness / Fracture resistance / Interface Crack / Quantitative Evaluation / 界面き裂 / 定量評価 / 結晶すべり / 分解せん断応力 / 転位群 / 剪断応力による寿命低下 / 圧縮応力による寿命低下 / すべり変形促進 / 転位集積 / ストライエーション / 疲労寿命低下 / 結晶すべり促進 / 水素 / NEMS / 環境効果 / 水 / 長期信頼性 / 共振デバイス / 透過電子顕微鏡 / 再結合欠陥 / EBIC / 透過型電子顕微鏡 / TEM / 圧縮応力 / 電子ビーム誘起電流 / 電子特性 / 疲労損傷 / 等価き裂 / 寿命分布 / 強度分布 / 寿命予測 / 疲労破壊 / 初期損傷 / 強度 / MEMS(マイクロマシン) / 単結晶シリコン / 強度評価 / はく離 / コーテイング / 電気抵抗特性 / 半導体 / ボロンドープ / 化学気相合成 / ダイヤモンド / はく離進展 / 荷重変位曲線 / 圧子押込み試験 / 結合エネルギー / 単独核破壊試験 / コンピュータシミュレーション / 界面き裂進展 / 破壊抵抗 / 単独粒子破壊試験 / ダイヤモンド薄膜 / 破壊挙動 / ひずみエネルギー解放率 / 層間はく離 / 繊維配向角 / 連続繊維強度複合材料席層板 / 複合材料 … More Except Principal Investigator 電子パッケージ / Inverse Problem / Ultrasonics / 斜角探傷 / 超音波 / 逆問題 / 斜角深傷 / Numerical Simulation / 数値シミュレーション / Sensitivity / Crack Depth / Crack Closing Stress / Ultrasonic Angle-Beam Technique / Shear Wave / Closed Crack / 感度 / き裂深さ / き裂閉口圧 / 横波 / 閉口き裂 / Materials / IC Package / Delamination / Spatial Resolution / Imaging / Focusing Sensor / Microwave / Nondestructive Evaluation / 材料 / はく離 / 空間分解能 / イメージング / 集束センサ / マイクロ波 / 非破壊評価 / Bamboo Line / Polycrystalline Line / Governing Parameter / Failure Prediction / Electromigration / Metal Line / Electronic Package / バンブー配線 / 多結晶配線 / 支配パラメータ / 断線予測 / エレクトロマイグレーション / 金属薄膜配線 / Theoretical Model / Small Angle of Incidence / Ultrasonic Angle Beam Technique / Crack Closure / Crack / Nondestructive Testing / 理論モデル / 微小入射角 / き裂閉口 / き裂 / 超音速 / 非破壊検査 / Active Control System / Piezoelectric Ceramics / Micromechanics / Identification / Damage / Composite Laminate / 損傷拡大抑制システム / 圧電セラミックス / マイクロメカニックス / 同定 / 損傷 / 積層複合材構造 / 耐熱材料 / 繊維 / ゲル Less

シリコンの結晶すべりと疲労過程の３因子その場解析に向けたマイクロトーションテストPrincipal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Nagoya Institute of Technology
Dynamic observation of crystal slips in silicon under fatigue loadingPrincipal Investigator
- Principal Investigator
  
  Kamiya Shoji
- Project Period (FY)
  2019 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Nagoya Institute of Technology
A novel scheme of structure reliability for polymer MEMS and stress sensing by mechanoluminescencePrincipal Investigator
- Principal Investigator
  
  Shoji Kamiya
- Project Period (FY)
  2016 – 2018
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Nano/Microsystems
- Research Institution
  Nagoya Institute of Technology
A challenge to seek for the effect of hydrogen causing embrittlement and fatigue fracture in siliconPrincipal Investigator
- Principal Investigator
  
  Kamiya Shoji
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
In-situ TEM observation of silicon fatigue process using resonance compressive fatigue testPrincipal Investigator
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetimePrincipal Investigator
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Microdevices/Nanodevices
- Research Institution
  Nagoya Institute of Technology
表面の局所電子プローブイメージングによるシリコンの機械的疲労損傷機構描像への挑戦Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  2009 – 2010
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
Establishment of an reliability evaluation scheme based on statistical analysis and electronic defect sensing for the reliability of silicon against fatigue failurePrincipal Investigator
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
粒界ディープレベルと疲労損傷との関連によるポリシリコンの新しい信頼性評価Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
多結晶半導体材料の準位に基づくエレクトロナノメカニクスへの期待Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  2004 – 2005
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Nanomaterials/Nanobioscience
- Research Institution
  Nagoya Institute of Technology
  Tohoku University
In-Situセンサによるダイヤモンド薄膜の応力計測と超耐久コーティングの設計Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Responses of Angle-Beam Ultrasonic Shear Waves to Closed Cracks and Highly Sensitive Quantitative Nondestructive Evaluation of Crack Sizes Together With Closure Stresses
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  2000 – 2001
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Development of Prediction Method for Metal Line Failure Induced by High Current Density
- Principal Investigator
  
  SASAGAWA Kazuhiko
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Hirosaki University
Development of a Microwave Focusing Sensor and a High Resolution Imaging System for Nondestructive Evaluation of Materials
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Toughening of chemically-vapor deposited diamond by means of active incorporation of carbon allotropesPrincipal Investigator
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
Development of Ultrasonic Angle Beam Technique of Quantitative Nondestructive Evaluation of Small Closed Cracks
- Principal Investigator
  
  SAKA Masumi
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  TOHOKU UNIVERSITY
Establishment of a new method of evaluation for the adhesive strength of thin films by micro-indentation wit two degrees of freedomPrincipal Investigator
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  TOHOKU UNIVERSITY
微視付着力の直接計測とダイヤモンド薄膜付着の新しい強度評価基準の創成Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University
有機-無機複合均一ゲル繊維を前駆体とする超耐熱性無機繊維合成
- Principal Investigator
  
  黒川洋一
- Project Period (FY)
  1996 – 1997
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Composite materials/Physical properties
- Research Institution
  Tohoku University
Real-Time Active Control Systems of Damage Extension in Composite Laminate Aircraft Structures
- Principal Investigator
  
  SEKINE Hideki
- Project Period (FY)
  1995 – 1997
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Aerospace engineering
- Research Institution
  Tohoku University
マルチレイヤーFEMによる連続繊維強化複合材料積層板のはく離進展と破壊挙動の解析Principal Investigator
- Principal Investigator
  
  神谷庄司
- Project Period (FY)
  1993
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Tohoku University

[Journal Article] The origin of fatigue fracture in single-crystal silicon2022
- Author(s)
  H.Izumi, T. Kita, S. Arai, K. Sasaki, S. Kamiya
- Journal Title
  
  Journal of Material Science
  
  Volume: 57 Issue: 18 Pages: 8557-8566
- DOI
  10.1007/s10853-022-07055-5
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K03836, KAKENHI-PROJECT-19K04091
[Journal Article] The origin of fatigue fracture in single-crystal silicon2022
- Author(s)
  H. Izumi, T. Kita, S. Arai, K. Sasaki, and Shoji Kamiya
- Journal Title
  
  Journal of Materials Science
  
  Volume: 57 Pages: 8557-8566
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19K04091
[Journal Article] Sehar stress enhanced fatigue damage accumulation in single crystalline silicon under cyclic mechanical loading2016
- Author(s)
  Shoji Kamiya, Arasu Udhayakumar, Hayato Izumi, Kozo Koiwa
- Journal Title
  
  Sensors and Actuators A
  
  Volume: still unknown
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25630008
[Journal Article] Hydrogen enhanced mechanical fatigue in single crystal silicon2015
- Author(s)
  Hayato Izumi, Arasu Udhayakumar, Shoji Kamiya
- Journal Title
  
  Materials Letters
  
  Volume: 142 Pages: 130132-130132
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-25630008
[Journal Article] Effect of hydrogen at room temperature on electronic and mechanical properties of dislocations in silicon2014
- Author(s)
  Masatoshi Ogawa, Shoji Kamiya, Hayato Izumi, Yutaka Tokuda
- Journal Title
  
  Materials Letters
  
  Volume: 120 Pages: 236238-236238
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25630008
[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014
- Author(s)
  S.Kamiya, T.Kita, H.Izumi
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 208 Pages: 30-36
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014
- Author(s)
  Shoji Kamiya, Toshifumi Kita, Hayato Izumi
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 208 Pages: 3036-3036
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013
- Author(s)
  V.L.Huy, S.Kamiya, K.Nagayoshi, H.Izumi, J.Gaspar, O.Paul
- Journal Title
  
  Journal of Micromechanics and Microengineering
  
  Volume: 23
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013
- Author(s)
  Vu Le Huy, Shoji, Kamiya, Kei Nagayoshi, Hayato Izumi, Joao Gaspar, Oliver Paul
- Journal Title
  
  Journal of Micromechanics and Microengineering
  
  Volume: 23 Pages: 45008-45008
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Effect of hydrogen on the mechanical properties of silicon crystal surface2013
- Author(s)
  Hayato Izumi, Ryota Mukaiyama, Nobuyuki Shishido, Shoji Kamiya
- Journal Title
  
  Proceedings　of　the　ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
  
  Pages: 73324-73324
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-25630008
[Journal Article] Effect of hydrogen on mechanical properties of single crystal surface2013
- Author(s)
  H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
- Journal Title
  
  ASME InterPACK 2013
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Journal Article] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2012
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Journal Title
  
  Physica B
  
  Volume: 407 Pages: 3034-4037
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Journal Article] Statistical characterization of fatigue lifetime of polysilicon thin films2012
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 179 Pages: 251-262
- DOI
  10.1016/j.sna.2012.03.011
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Statistical characterization of fatigue lifetime of polysiliocn thin films2012
- Author(s)
  V.L.Huy, J.Gaspar, O.Paul, S.Kamiya
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 179 Pages: 251-262
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Statistical characterization of fracture strength and fatigue lifetime of polysilicon thin films with different stress concentration fields2012
- Author(s)
  Vu Le Huy, Shoji, Kamiya, Joao Gaspar, Oliver Paul
- Journal Title
  
  Journal of Solid Mechanics and Materials Engineering
  
  Volume: 6 Pages: 10131029-10131029
- NAID
  130003323429
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Statistical characterization of fracture strength and fatigue lifetime of polysilicon thin films with different stress concentration fields2012
- Author(s)
  V.L.Huy, S.Kamiya, J.Gaspar, O.Paul
- Journal Title
  
  Journal of Solid Mechanics and Materials Engineering
  
  Volume: 6 Pages: 1013-1029
- NAID
  130003323429
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Electronic properties of dislocations infroduced mechanically at room temperature on a single crystal silicon substrate2012
- Author(s)
  Masatoshi Ogawa, Shoji Kamiya, Hayato Izumi, Yutaka Tokuda
- Journal Title
  
  Physica B
  
  Volume: 407
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Journal Article] CROSS COMPARISON OF FATIGUE LIFETIME TESTING ON SILICON THIN FILM SPECIMENS2011
- Author(s)
  S.Kamiya, T.Tsuchiya, T.Ikehara, K.Sato, T.Ando, T.Namazu, K.Takashima
- Journal Title
  
  Technical digest of the 24th IEEE conference on micro electro mechanical systems
  
  Pages: 404-407
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] FINITE FATIGUE LIFETIME OF SILICON UNDER INERT ENVIRONMENT2011
- Author(s)
  S.Kamiya, Y.Ikeda, M.Ishikawa, H.Izumi, J.Gaspar, O.Paul
- Journal Title
  
  Technical digest of the 24th IEEE conference on micro electro mechanical systems
  
  Pages: 432-435
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] Effect of humidity and temperature on the fatigue behavior of polysilicon thin film2011
- Author(s)
  Shoji Kamiya, Yusuke Ikeda, Joao Gaspar, Oliver Paul
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 170 Pages: 187-195
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] Accuracy of the Fatigue Lifetime of Polysilicon Predicted from its Strength Distribution2010
- Author(s)
  Le Huy Vu, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Journal Title
  
  Mater.Res.Soc.Symp.Proc.
  
  Volume: Vol.1245
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] Accuracy of the Fatigue Lifetime of Polysilicon Predicted from its Strength Distribution2010
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Journal Title
  
  Mater. Res. Soc. Symp. Proc
  
  Volume: Vol.1245 Pages: 17-2
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] Seamless Interpretation of Strength and Fatigue Lifetime of Poly crystalline Silicon Thin Films2008
- Author(s)
  Shoji Kamiya, Shingo Amaki, Taku Kawai, Naoko Honda, Patrick Ruther, Joao Gaspar, Oliver Paul
- Journal Title
  
  Journal of Micromechanics and Microengineering 18
  
  Pages: 95023-95023
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360052
[Journal Article] 切断加工による損傷に基づくシリコンチップの機械的信頼性評価2006
- Author(s)
  神谷庄司, 井上大喜郎, 神藤弘章
- Journal Title
  
  日本機械学会東海支部第55期総会講演会講演論文集 063-1
  
  Pages: 217-218
- Data Source
  KAKENHI-PROJECT-16651054
[Journal Article] 切断加工による損傷に基づくシリコンチップの機械的信頼性評価2006
- Author(s)
  神谷庄司、井上大喜郎、神藤弘章
- Journal Title
  
  日本機械学会東海支部第55期総会講演会講演論文集 063-1
  
  Pages: 217-218
- Data Source
  KAKENHI-PROJECT-16360047
[Journal Article] 半導体材料の高サイクル疲労特性に関する研究2005
- Author(s)
  神谷庄司、井上大喜郎、坂真澄、市村正也
- Journal Title
  
  日本機械学会2005年度年次大会講演論文集 Vol.6
  
  Pages: 263-264
- Data Source
  KAKENHI-PROJECT-16360047
[Journal Article] 多結晶シリコン薄膜の機械的信頼性評価に関する新しい試み2005
- Author(s)
  神谷庄司, 本田直子, ポールオリバー, ルターパトリック, 坂真澄
- Journal Title
  
  日本機械学会2005年度年次大会講演論文集 Vol.6
  
  Pages: 261-262
- Data Source
  KAKENHI-PROJECT-16651054
[Journal Article] 半導体材料の高サイクル疲労特性に関する研究2005
- Author(s)
  神谷庄司, 井上大喜郎, 坂真澄, 市村正也
- Journal Title
  
  日本機械学会2005年度年次大会講演論文集 Vol.6
  
  Pages: 263-264
- Data Source
  KAKENHI-PROJECT-16651054
[Journal Article] 多結晶シリコン薄膜の機械的信頼性評価に関する新しい試み2005
- Author(s)
  神谷庄司、本田直子、ポールオリバー、ルターパトリック、坂真澄
- Journal Title
  
  日本機械学会2005年度年次大会講演論文集 Vol.6
  
  Pages: 261-262
- Data Source
  KAKENHI-PROJECT-16360047
[Journal Article] Electronic properties of dislocations introduced mechanically at room temperature on a single crystal silicon surface
- Author(s)
  Masatoshi Ogawa, Shoji Kamiya, Hayato Izumi, Yutaka Tokuda, Physica B
- Journal Title
  
  Physica B
  
  Volume: (in press)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20360052
[Patent] 材料の疲労特性決定方法および疲労寿命予測方法2010
- Inventor(s)
  神谷・池田・Vu Le
- Industrial Property Rights Holder
  名古屋工業大学
- Industrial Property Number
  2010-012493
- Filing Date
  2010-01-22
- Data Source
  KAKENHI-PROJECT-20360052
[Patent] 材料の疲労特性決定方法および疲労寿命予測方法2010
- Inventor(s)
  神谷庄司、池田裕介、ヴレフイ
- Industrial Property Rights Holder
  国立大学法人名古屋工業大学
- Industrial Property Number
  2011-012493
- Filing Date
  2010-01-22
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 切欠き先端近傍におけるせん断応力場におけるシリコンの結晶すべり系と疲労損傷2023
- Author(s)
  shoji kamiya
- Organizer
  日本機械学会2023年年次大会
- Data Source
  KAKENHI-PROJECT-19K04091
[Presentation] 繰返し圧縮負荷によるシリコン単結晶中の結晶欠陥集積と疲労亀裂進展の電子顕微鏡解析2021
- Author(s)
  神谷　庄司
- Organizer
  2019年度日本機械学会年次大会
- Data Source
  KAKENHI-PROJECT-19K04091
[Presentation] シリコンの疲労破壊　「なんとなく、メタリック」2021
- Author(s)
  神谷　庄司
- Organizer
  日本機械学会材料力学部門「ナノ・マイクロ疲労研究会」第4回研究会
- Invited
- Data Source
  KAKENHI-PROJECT-19K04091
[Presentation] A novel scheme of characterization for performance deterioration behavior of flexible devices under bending deformation2019
- Author(s)
  S. Kamiya, H. Izumi, T. Sekine, N. Shishido, H. Sugiyama, Y. Haga, T. Minari, M. Koganemaru, S. Tokito
- Organizer
  46th International Conference on Metallurgical Coatings and Thin Films
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] Bending Durability of Organic Thin Film Transistor and Stress Sensing using Mechanoluminecence2018
- Author(s)
  H. Izumi, Y. Haga, N. Shishido, S. Kamiya
- Organizer
  The 9th Asia-Pacific Conference of Transducers and Micro-Nano Technology
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] レキシブル基板上に印刷された銀粒子配線の曲げ疲労損傷挙動とその評価2018
- Author(s)
  神谷庄司、泉隼人、関根智仁、杉山裕子、芳賀康子、宍戸信之、小金丸正明
- Organizer
  日本機械学会2018年度年次大会
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] 応力発光を用いた積層構造フィルムの屈曲変形に伴う損傷挙動の評価2018
- Author(s)
  泉隼人、芳賀康子、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第67期総会・講演会
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] 印刷有機薄膜トランジスタの曲げ変形による損傷と電気特性変動2018
- Author(s)
  宍戸信之、泉隼人、関根智仁、杉山裕子、神谷庄司、小金丸正明
- Organizer
  日本機械学会2018年度年次大会
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] フレキシブル有機トランジスタの曲げ変形による性能劣化モードのその場観察2017
- Author(s)
  宍戸信之、末松祐一、泉隼人、神谷庄司
- Organizer
  日本機械学会2017年度年次大会
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] 曲げ試験による有機薄膜トランジスタの信頼性評価2016
- Author(s)
  宍戸信之、末松祐一、神谷庄司
- Organizer
  日本機械学会2016年度年次大会
- Place of Presentation
  九州大学伊都キャンパス、福岡
- Year and Date
  2016-09-11
- Data Source
  KAKENHI-PROJECT-16K13651
[Presentation] Shear stress with hydrogen, not oxygen, matters to the fatigue lifetime of silicon2015
- Author(s)
  S. Kamiya, A. Udhayakumar, H. Izumi, K. Koiwa
- Organizer
  18th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers 2015)
- Place of Presentation
  Anchorage, Alaska, USA
- Year and Date
  2015-06-21
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] 繰り返し荷重によるシリコンの疲労損傷集積の観察2014
- Author(s)
  泉隼人、喜多俊文、田中健太郎、神谷庄司
- Organizer
  日本機械学会東海支部第63会総会講演会
- Place of Presentation
  名古屋市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰り返し荷重によるシリコンの疲労損傷集積の観察2014
- Author(s)
  泉隼人、喜多俊文、田中健太郎、神谷庄司
- Organizer
  日本機械学会東海支部第63期総会
- Place of Presentation
  大同大学、愛知県
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Effect of hydrogen on mechanical properties of single crystal surface2013
- Author(s)
  H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
- Organizer
  ASME International Technical Conference & Exhibition Packaging and Integration of Electronic and Photonic Microsystems (InterPACK 2013)
- Place of Presentation
  Burlingame, USA
- Year and Date
  2013-07-20
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Ve Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62期総会講演会
- Place of Presentation
  津市
- Year and Date
  2013-03-19
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] EBIC observation of the defects in single crystalline silicon induced by mechanical compressive stress2013
- Author(s)
  T.Kita, S.Kamiya, H.Izumi
- Organizer
  The 27th International Conference on Defects in Semiconductors 2013 (ICDS2013)
- Place of Presentation
  Bologna, Italy
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Effect of hydrogen on the mechanical properties of silicon crystal surface2013
- Author(s)
  Hayato Izumi, Ryota Mukaiyama, Nobuyuki Shishido, Shoji Kamiya
- Organizer
  ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK 2013)
- Place of Presentation
  San Francisco
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] 繰り返し圧縮応力によるシリコン単結晶中の欠陥形成と残存引張強度2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人
- Organizer
  日本機械学会2013年度年次大会
- Place of Presentation
  岡山大学、岡山県
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第６２期総会講演会
- Place of Presentation
  Tsu, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  S.Kamiya, R.Hirai, H.Izumi, N.Umehara, T.Tokoroyama
- Organizer
  The 17th International Conference on Solid-State Sensors, Actuators, and Microsystems (Transducers2013&EurosensorsXXXVII)
- Place of Presentation
  Barcelona, Spain
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰り返し圧縮応力によるシリコン単結晶中の欠陥形成と残存引張強度2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人
- Organizer
  日本機械学会2013年度年次大会
- Place of Presentation
  岡山市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコン疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62会総会講演会
- Place of Presentation
  津市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  S. Kamiya, R. Hirai, H. Izumi, N. Umehara, T. Tokoroyama
- Organizer
  The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers 2013)
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2013-06-20
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62会総会講演会
- Place of Presentation
  津市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fatigue behavior of silicon wafer under bending load in different environment2013
- Author(s)
  Arasu Udhayakumar, Hayato Izumi, Shoji Kamiya
- Organizer
  JSME Materials and Mechanics Division 2013
- Place of Presentation
  Gifu University,Japan
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62期総会
- Place of Presentation
  三重大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  Shoji Kamiya, Ryutaro Hirai, Hayato Izumi, Noritsugu Umehara, Takayuki Tokoroyama
- Organizer
  Technical Digest of the 17th International Conference on Solid-State Sensors, Actuators, and Microsystems (Transducers2013&Eurosensors XXVII)
- Place of Presentation
  Barcelona, Spain
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第６２期総会講演会
- Place of Presentation
  Tsu, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62期総会
- Place of Presentation
  三重大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰返し応力に対するシリコンMEMS構造体の疲労寿命と長期信頼性評価2012
- Author(s)
  神谷庄司
- Organizer
  平成23年度第10回九州地区ナノテクノロジー拠点ネットワーク講演会
- Place of Presentation
  北九州産業学術研究都市早稲田大学講義室(招待講演)
- Year and Date
  2012-01-26
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  イスラムエムデイワヘドウル、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Year and Date
  2012-09-10
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川　創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012カンファレンス
- Place of Presentation
  Matsuyama, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] IDENTIFICATION OF FATIGUE CRACK EXTENSION PROCESS INZERO-TENSION CYCLIC STRESS TEST OF POLYSILICON FILMS2012
- Author(s)
  Vu Le Huy, Shoji Kamiya, Joao Gaspar, Oliver Paul
- Organizer
  25th IEEE International Conference on Micro Electro Mechanical Systems
- Place of Presentation
  Paris, France
- Year and Date
  2012-01-30
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流によるシリコンの疲労過程の微視観察2012
- Author(s)
  平井隆太郎，神谷庄司，泉隼人，梅原徳次
- Organizer
  日本機械学会東海支部第61期総会講演会
- Place of Presentation
  名古屋工業大学（愛知県）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] TEM内疲労試験その場観察を目的としたMEMS共振デバイスの開発2012
- Author(s)
  Lam Hoanson、泉隼人、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Mysteries in fracture behavior of silicon and polysilicon micro-scale structures in various environments and under repeated loading2012
- Author(s)
  Shoji Kamiya
- Organizer
  OKMETIC-Nagoya seminar 2012
- Place of Presentation
  Nagoya, Japan(招待講演)
- Year and Date
  2012-03-02
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Mysteries in fracture behavior of silicon and polysilicon micro-scale structures in various environments and under repeated loading2012
- Author(s)
  S.Kamiya
- Organizer
  OKMETIC-Nagoya seminar 2012
- Place of Presentation
  Nagoya
- Year and Date
  2012-03-02
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  イスラムエムディワヘドゥル、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  Kanazawa, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 繰返し応力に対するシリコンMEMS 構造体の疲労寿命と信頼性評価2012
- Author(s)
  神谷庄司
- Organizer
  平成13年度第10回九州地区ナノテクノロジー拠点ネットワーク講演会
- Place of Presentation
  北九州市
- Year and Date
  2012-01-16
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Identification of fatigue crack extension process inzero-tension cyclic stress test of polysilicon films2012
- Author(s)
  V.L.Huy, S.Kamiya, J.Gaspar, O.Paul
- Organizer
  25th IEEE International Conference on Micro Electro Mechanical Systems (MEMS2012)
- Place of Presentation
  Paris, France
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] TEM 内疲労試験その場観察を目的としたMEMS 共振デバイスの開発2012
- Author(s)
  Lam Hoanson、泉隼人、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流によるシリコンの疲労過程の微視観察2012
- Author(s)
  平井隆太郎、神谷庄司、泉隼人、梅原徳次
- Organizer
  日本機械学会年東海支部第61期総会講演会
- Place of Presentation
  名古屋市
- Year and Date
  2012-03-16
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  Isram Md. Wahedul、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012カンファレンス
- Place of Presentation
  松山市
- Year and Date
  2012-09-22
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  Isram Md. Wahedul、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012材料力学カンファレンス
- Place of Presentation
  愛媛大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012材料力学カンファレンス
- Place of Presentation
  松山市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2012
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62期総会講演会
- Place of Presentation
  津市
- Year and Date
  2012-03-19
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの疲労挙動とその環境依存性2011
- Author(s)
  石川正芳、神谷庄司、泉隼人、宍戸信之
- Organizer
  日本機械学会M&M2011材料力学カンファレンス
- Place of Presentation
  北九州市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  26th International Conference on Defects in Semiconductors
- Place of Presentation
  Rutherford Hotel(ﾆｭｰｼﾞｰﾗﾝﾄﾞ)
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Fracture Behavior of Silicon Thin Film under Liquid Water2011
- Author(s)
  Hayato Izumi, Ya-Chi Cheng, Masayoshi Ishikawa, Shoji Kamiya, Ming-Tzer Lin
- Organizer
  13th International Conference on Electronics Materials and Packaging
- Place of Presentation
  Kyoto, Japan
- Year and Date
  2011-12-14
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H.Izumi, Y.Cheng, M.Ishikawa, S.Kamiya, M-T.Lin
- Organizer
  13th International Conference on Electronics Materials and Packaging (EMAP2011)
- Place of Presentation
  Kyoto
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Cross comparison of fatigue lifetime testing on silicon thin film specimens2011
- Author(s)
  S. Kamiya, T. Tsuchiya, T. Ikehara, K. Sato, T. Ando, T. Namazu, K. Takashima
- Organizer
  The 24th International Conference on Micro Electro Mechanical Systems MEMS 2011
- Place of Presentation
  Cancun, Mexico
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] シリコンの疲労破壊-MEMSの長期信頼性は本当に大丈夫か?-2011
- Author(s)
  神谷庄司
- Organizer
  MEMS engineer forum 2011
- Place of Presentation
  大田区産業プラザPiO(蒲田)(invited)
- Year and Date
  2011-03-08
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Evaluation and comparison of fracture behavior of silicon thin films under various environmental conditions2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  日本実験力学学会2011年度年次講演会
- Place of Presentation
  奈良県文化会館（奈良県）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Finite fatigue lifetime of silicon under inert environment2011
- Author(s)
  S. Kamiya, Y. Ikeda, M. Ishikawa, H. Izumi, J. Gaspar, O. Paul
- Organizer
  The 24th International Conference on Micro Electro Mechanical Systems MEMS 2011
- Place of Presentation
  Cancun, Mexico
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 異なる試験手法により得られたシリコンの疲労挙動の相互比較2011
- Author(s)
  神谷庄司、土屋智由、池原毅、佐藤一雄、安藤妙子、生津資大、高島和希
- Organizer
  第3回マイクロ・ナノ工学シンポジウム
- Place of Presentation
  船堀、東京
- Year and Date
  2011-09-27
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  The 13th International Conference on Electronics Materials and Pachaging (EMAP2011)
- Place of Presentation
  京都ガーデンパレス（京都府）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Electronic sensing of mechanical damage on a single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  マイクロ・ナノ工学国際ワークショップ
- Place of Presentation
  京都大学桂ｷｬﾝﾊﾟｽ（京都府）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 異なる試験手法により得られたシリコンの疲労挙動の相互比較2011
- Author(s)
  神谷庄司、土屋智由、池原毅、佐藤一雄、安藤妙子、生津資大、高島和希
- Organizer
  第3回マイクロ・ナノ工学シンポジウム
- Place of Presentation
  船掘
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] ESTIMATION OF THE PARAMETERS DETERMINING STRENGTH AND FATIGUE BEHAVIORS OF ARBITRARILY-SHAPED POLYSILICON THIN FILMS2011
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Organizer
  ASME 2011 Pacific Rim Technical Conference & Exposition on Packaging and Integration of Electronic and Photonic Systems
- Place of Presentation
  Portland, OR, USA
- Year and Date
  2011-07-07
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの疲労挙動とその環境依存性2011
- Author(s)
  石川正芳、神谷庄司、泉隼人、宍戸信之
- Organizer
  日本機械学会M&M 2011
- Place of Presentation
  北九州、福岡
- Year and Date
  2011-07-16
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Estimation of the parameters determining strength and fatigue behaviors of arbitrarily-shaped polysilicon thin films2011
- Author(s)
  V.L.Huy, J.Gaspar, O.Paul, S.Kamiya
- Organizer
  ASME2011 Pacific Rim Technical Conference & Exposition on Packaging and Integration of Electronic and Photonic Systems (InterPACK2011)
- Place of Presentation
  Portland, USA
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  International Conference on Electronics Materials and Packaging (EMAP)
- Place of Presentation
  Kyoto
- Year and Date
  2011-12-14
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  26th International Conference on Defects in Semiconductor (ICDS)
- Place of Presentation
  New Zealand
- Year and Date
  2011-07-21
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Evaluation and comparison of fracture behavior of silicon thin films under various environmental conditions2011
- Author(s)
  Y-C. Cheng, H. Izumi, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  The Japanese Society for Experimental Mechanics
- Place of Presentation
  Nara
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの機械的損傷の電子的性質に関する研究2010
- Author(s)
  小川将史、神谷庄司、泉隼人、徳田豊
- Organizer
  第27回「センサ・マイクロマシンと応用システム」シンポジウム
- Place of Presentation
  くにびきメッセ(松江市)
- Year and Date
  2010-10-14
- Data Source
  KAKENHI-PROJECT-21656030
[Presentation] Electrical properties of mechanically induced defects in single crystal silicon2010
- Author(s)
  Masatoshi Ogawa, Shoji Kamiya, Hayato Izumi Yutaka Tokuda
- Organizer
  The 27th Sensor Symposium on Sensors
- Place of Presentation
  Shimane, Japan, Book of Abstracts
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Comparison of Fatigue Behavior Between Single and Polycrystalline Silicon Investigated Using a Novel Testing Method2010
- Author(s)
  Masayoshi Ishikawa, Hayato Izumi, Shoji Kamiya
- Organizer
  2010 MRS Fall Meeting
- Place of Presentation
  Hyne convention center(Boston, USA)
- Year and Date
  2010-11-30
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 単結晶シリコンの機械的損傷の電子的性質に関する研究2010
- Author(s)
  小川将史、神谷庄司、泉隼人、徳田豊
- Organizer
  第27回「センサ・マイクロマシンと応用システム」シンポジウム
- Place of Presentation
  くにびきメッセ(松江市)
- Year and Date
  2010-10-14
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 上活性環境下におけるシリコンの疲労寿命定量評価と環境による寿命変化に基づく疲労機構推測の試み2010
- Author(s)
  神谷庄司,池田祐介,石川正芳,泉隼人ジョアオガスパー,オリバーポール
- Organizer
  日本機械学会第2回マイクロ・ナノ工学シンポジウム講演論文集
- Place of Presentation
  松江くにびきメッセ
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] ボッシュプロセスで作製されたMEMS構造体の強度設計法に関する基礎的研究2010
- Author(s)
  永吉径、神谷庄司、ジョアオガスパー、オリバーポール
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-07
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Comparison of fatigue behavior between single and polycrystalline silicon investigated using a novel testing method2010
- Author(s)
  Masayoshi Ishikawa, Hayato Izumi, Shoji Kamiya
- Organizer
  MRS 2010 Fall Meeting
- Place of Presentation
  Boston USA
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] A novel fatigue test with ramping stress amplitude to evaluate fatigue behavior of polyrilison thin films2010
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Organizer
  The 23rd IEEE International Conference on Micro Electro Mechanical Systems MEMS 2010
- Place of Presentation
  Hong Kong, China, Technical Digest
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] シリコンの疲労メカニズムの描像を目的としたSEM内疲労試験の試み2010
- Author(s)
  平井隆太郎,梅原徳次,月山陽介,泉隼人,神谷庄司
- Place of Presentation
  名古屋工業大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 不活性環境下におけるシリコンの疲労寿命定量評価と環境による寿命変化に基づく疲労機構推測の試み2010
- Author(s)
  神谷庄司、池田裕介、石川正芳、泉隼人、ジョアオガスパー、オリバーポール
- Organizer
  第2回マイクロ・ナノ工学シンポジウム
- Place of Presentation
  くにびきメッセ(松江市)
- Year and Date
  2010-10-15
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 多結晶シリコン薄膜の疲労挙動に及ぼす環境因子の影響2010
- Author(s)
  池田祐介,ガスパージョアオ,ポールオリバー,神谷庄司
- Organizer
  日本機械学会東海支部第59期総会講演会講演論文集
- Place of Presentation
  名城大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] ボッシュプロセスで作製されたMEMS構造体の強度設計法に関する基礎的研究2010
- Author(s)
  永吉径,神谷庄司,ジョアオガスパー,オリバーポール
- Organizer
  日本機械学会2010年度年次大会講演論文集
- Place of Presentation
  名古屋工業大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 新規疲労試験手法を用いた単結晶および多結晶シリコンの疲労特性の評価2010
- Author(s)
  石川正芳,池田祐介,泉隼人,神谷庄司
- Organizer
  日本機械学会2010年度年次大会講演論文集
- Place of Presentation
  名古屋工業大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 新規疲労試験手法を用いた単結晶および多結晶シリコンの疲労特性の評価2010
- Author(s)
  石川正芳、池田裕介、泉隼人、神谷庄司
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-07
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Statistical evaluation of fracture and fatigue behavior of polysilicon thin films with arbitrary shapes2010
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-07
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] シリコンの疲労メカニズムの描像を目的とした電子顕微鏡内疲労試験の試み2010
- Author(s)
  平井隆太郎、泉隼人、神谷庄司、梅原徳次、巨陽
- Organizer
  日本機械学会2010年度年次大会
- Place of Presentation
  名古屋工業大学(名古屋市)
- Year and Date
  2010-09-07
- Data Source
  KAKENHI-PROJECT-21656030
[Presentation] Mechanical Fatigue Fracture of Silicon-potential danger to the reliability of silicon MEMS structures2010
- Author(s)
  Shoji Kamiya
- Organizer
  2010 International Symposium on Micro-NanoMechatronics and Human Science
- Place of Presentation
  Nagoya University(Nagoya, Japan)(invited)
- Year and Date
  2010-11-10
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Statistical evaluation of fracture and fatigue behavior of polysilicon thin films with arbitrary shapes2010
- Author(s)
  Vu Le Huy, Joao Gaspar, Oliver Paul, Shoji Kamiya
- Organizer
  本機械学会2010年度年次大会講演論文集
- Place of Presentation
  名古屋工業大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Prediction of strength and fatigue lifetime of MEMS structures with arbitrary shapes2009
- Author(s)
  T. Kawai, J. Gaspar, O. Paul, and S. Kamiya
- Organizer
  IEEE Transducers 2009 conference
- Place of Presentation
  Denver, Colorado USA
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] ボッシュプロセスで作製されたMEMS構造体の傷に基づく静的強度予測2009
- Author(s)
  永吉径,神谷庄司,ジョアオガスパー,オリバーポール
- Organizer
  日本機械学会2009年度年次大会講演論文集
- Place of Presentation
  岩手大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Evaluation of fatigue behavior of polysilicon thin films2009
- Author(s)
  Taku Kawai, Joao Gaspar, Vu Le Huy, Oliver Paul, Shoji Kamiya
- Organizer
  日本機械学会2009年度年次大会講演論文集
- Place of Presentation
  岩手大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 不活性環境下でのシリコンの疲労挙動2009
- Author(s)
  池田祐介, Vu Le Huy,神谷庄司,ガスパージョアオ,ポールオリバー
- Organizer
  日本機械学会2009年度年次大会講演論文集
- Place of Presentation
  岩手大学
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Prediction of strength and fatigue lifetime of MEMS structures with arbitrary shapes2009
- Author(s)
  Shoji Kamiya
- Organizer
  Transducers 2009
- Place of Presentation
  Denver CO., USA
- Year and Date
  2009-06-23
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] シリコン材料の疲労特性に影響を及ぼす諸因子に関する研究2008
- Author(s)
  河合拓, 神谷庄司, ボールオリバー・ガスバージョアオ
- Organizer
  日本機械学会2008年度年次大会
- Place of Presentation
  横浜国立大学
- Year and Date
  2008-08-05
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] シリコン材料の疲労特性に影響を及ぼす諸因子に関する研究2008
- Author(s)
  河合拓,池田祐介,神谷庄司,ポールオリバー,ガスパージョアオ
- Organizer
  日本機械学会2008年度年次大会講演論文集
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] 単結晶シリコンのエッチング損傷と切欠き強度2008
- Author(s)
  永吉径, J. Gaspar, 0. Paul, 神谷庄司
- Organizer
  第4回マイクロマテリアルシンポジウム
- Place of Presentation
  東京大学山上会館
- Year and Date
  2008-09-24
- Data Source
  KAKENHI-PROJECT-20360052
[Presentation] Effect of crystal orientation and environment on fatigue lifetime of single crystal silicon
- Author(s)
  Arasu Udhayakumar, Hayato Izumi, Kozo Koiwa, Shoji Kamiya
- Organizer
  第6回マイクロナノ工学シンポジウム
- Place of Presentation
  くにびきメッセ　松江
- Year and Date
  2014-10-20 – 2014-10-22
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] Mechanical fatigue damage accumulation in silicon visualized by electronic defect analysis technique
- Author(s)
  Shoji Kamiya
- Organizer
  IEC standard SC47F/WG1, MEMS Standardization Workshop
- Place of Presentation
  Geneve, Switzerland
- Year and Date
  2014-06-24 – 2014-06-25
- Invited
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] Effect of hydrogen on fatigue lifetime of silicon with the aid of shear and compressive stress
- Author(s)
  Arasu Udhayakumar, Hayato Izumi, Kozo Koiwa, Shoji Kamiya
- Organizer
  日本機械学会東海支部第64期総会
- Place of Presentation
  中部大学　愛知
- Year and Date
  2015-03-13 – 2015-03-14
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] シリコン単結晶における疲労損傷の集積過程に及ぼす応力比の効果
- Author(s)
  喜多俊文，泉隼人，神谷庄司，Vu Le Huy
- Organizer
  2014年度日本機械学会年次大会
- Place of Presentation
  東京電機大学　北千住
- Year and Date
  2014-09-07 – 2014-09-10
- Data Source
  KAKENHI-PROJECT-25630008
[Presentation] Fatigue failure and fracture surface analysis of single crystal silicon exposed to oxygen, hydrogen and humidity air environment
- Author(s)
  Arasu Udhayakumar, Shoji Kamiya, Hayato Izumi, Nobuyuki Shishido
- Organizer
  41th International Conference on Metallurgical Coating and Thin Films
- Place of Presentation
  San Diego, US
- Year and Date
  2014-04-28 – 2014-05-02
- Data Source
  KAKENHI-PROJECT-25630008

1. SAKA Masumi (20158918)

# of Collaborated Projects: 9 results

# of Collaborated Products: 4 results
2. SOYAMA Hitoshi (90211995)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
3. SASAGAWA Kazuhiko (50250676)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
4. IZUMI Hayato (90578337)

# of Collaborated Projects: 2 results

# of Collaborated Products: 48 results
5. MIHARA Tsuyoshi (20174112)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. UMEHARA Noritsugu (70203586)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. HAYASHI Takahiro (30324479)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. TOKUDA Yutaka (30078927)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
9. SATO Kazuo (30262851)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
10. NAKAJIMA Masahiro (80377837)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. MORITANI Tomokazu (50362322)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. SEKINE Hideki (20005359)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. FUKUNAGA Hisao (50134664)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. MIYATA Hiroshi (80312479)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. YANG Ju (60312609)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. 黒川洋一 (80005298)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. 鈴木光政 (40091706)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. 小野崇人 (90282095)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. 胡寧 (60250685)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. 鈴木寛 (90179242)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. TAKEUCHI Masahiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. 羽生博之

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KAMIYA Shoji 神谷 庄司

神谷 庄司 カミヤ ショウジ

Research Projects

Research Products

Co-Researchers

シリコンの結晶すべりと疲労過程の３因子その場解析に向けたマイクロトーションテストPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Dynamic observation of crystal slips in silicon under fatigue loadingPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

A novel scheme of structure reliability for polymer MEMS and stress sensing by mechanoluminescencePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

A challenge to seek for the effect of hydrogen causing embrittlement and fatigue fracture in siliconPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-situ TEM observation of silicon fatigue process using resonance compressive fatigue testPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetimePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

表面の局所電子プローブイメージングによるシリコンの機械的疲労損傷機構描像への挑戦Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Establishment of an reliability evaluation scheme based on statistical analysis and electronic defect sensing for the reliability of silicon against fatigue failurePrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

粒界ディープレベルと疲労損傷との関連によるポリシリコンの新しい信頼性評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

多結晶半導体材料の準位に基づくエレクトロナノメカニクスへの期待Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-Situセンサによるダイヤモンド薄膜の応力計測と超耐久コーティングの設計Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Responses of Angle-Beam Ultrasonic Shear Waves to Closed Cracks and Highly Sensitive Quantitative Nondestructive Evaluation of Crack Sizes Together With Closure Stresses

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of Prediction Method for Metal Line Failure Induced by High Current Density

Principal Investigator

Project Period (FY)

KAMIYA Shoji 神谷庄司

神谷庄司カミヤショウジ