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Kosugi Ryouji  小杉 亮治

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KOSUGI Ryouji  小杉 亮治

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Researcher Number 10356991
Affiliation (Current) 2025: 国立研究開発法人産業技術総合研究所, エレクトロニクス・製造領域, 総括研究主幹
Affiliation (based on the past Project Information) *help 2022 – 2024: 国立研究開発法人産業技術総合研究所, エネルギー・環境領域, 上級主任研究員
2015: 国立研究開発法人産業技術総合研究所, 先進パワーエレクトロニクス研究センター, 研究員
2015: 国立研究開発法人産業技術総合研究所, 先進パワーエレクトロニクス研究センター, 主任研究員
2013 – 2014: 独立行政法人産業技術総合研究所, 先進パワーエレクトロニクス研究センター, 主任研究員
Review Section/Research Field
Except Principal Investigator
Basic Section 15020:Experimental studies related to particle-, nuclear-, cosmic ray and astro-physics / Thin film/Surface and interfacial physical properties
Keywords
Except Principal Investigator
検出器 / 放射線耐性 / ダイヤモンド / シリコンカーバイド / 荷電粒子検出器 / ピクセル検出器 / ワイドギャップ半導体 / ミューオン・電子転換過程 / ASIC / SiC … More / 半導体検出器 / 移動度劣化 / しきい値シフト / 界面水素 / チャネルドーピング / 界面窒素 / EDMR / ESR / しきい値電圧 / MOS界面 / 電流検出ESR法 / ESR法 / 電界効果トランジスタ / 界面欠陥 / 酸化膜界面 / 炭化ケイ素 / 閾値変動 / チャネル移動度 / 電子スピン共鳴分光 / 界面準位 / MOSFET / 4H-SiC / パワーエレクトロニクス Less
  • Research Projects

    (2 results)
  • Research Products

    (17 results)
  • Co-Researchers

    (6 People)
  •  Development of SiC Detectors for the COMET Experiment

    • Principal Investigator
      岸下 徹一
    • Project Period (FY)
      2022 – 2024
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 15020:Experimental studies related to particle-, nuclear-, cosmic ray and astro-physics
    • Research Institution
      High Energy Accelerator Research Organization
  •  Electron-spin-resonance study on SiC-MOSFETs and their MOS interface defects related to channel-mobility degradation

    • Principal Investigator
      Fujinoki Takahide
    • Project Period (FY)
      2013 – 2015
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      University of Tsukuba

All 2023 2016 2015 2014 2013 Other

All Journal Article Presentation

  • [Journal Article] Hybrid SiC Pixel Detector for Charged-Particle Beam Monitor2023

    • Author(s)
      Kishishita Tetsuichi、Kosugi Ryoji、Fujita Yowichi、Fukao Yoshinori、Kojima Kazutoshi、Masumoto Keiko、Nishiguchi Hajime、Tanaka Manobu M.、Tanaka Yasunori
    • Journal Title

      IEEE Transactions on Nuclear Science

      Volume: - Issue: 6 Pages: 1-1

    • DOI

      10.1109/tns.2023.3265318

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-23K22526
  • [Journal Article] Development of SiC super-junction (SJ) devices by multi-epitaxial growth2014

    • Author(s)
      R. Kosugi, Y. Sakuma, K. Kojima, S. Itoh, A. Nagata, T. Yatsuo, Y. Tanaka, H. Okumura
    • Journal Title

      Materials Science Forum

      Volume: 778-780 Pages: 845-850

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Journal Article] C-face interface defects in 4H-SiC MOSFETs studied by electrically detected magnetic resonance2014

    • Author(s)
      T. Umeda, M. Okamoto, R. Arai, Y. Satoh, R. Kosugi, S. Harada, H. Okumura, T. Makino, T. Ohshima
    • Journal Title

      Materials Science Forum

      Volume: 778-780 Pages: 414-417

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Journal Article] SiC MOS interface states: difference between Si face and C face2013

    • Author(s)
      T. Umeda, M. Okamoto, R. Kosugi, R. Arai, Y. Sato, S. Harada, T. Makino, T. Ohshima
    • Journal Title

      ECS Transactions

      Volume: 58 Pages: 55-60

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Journal Article] 4H-SiC MOS界面の電子スピン共鳴分光評価2013

    • Author(s)
      梅田享英, 岡本光央, 小杉亮治, 原田信介, 荒井亮, 佐藤嘉洋, 牧野高紘, 大島武, 奥村元
    • Journal Title

      シリコンテクノロジー(応用物理学会分科会)

      Volume: 161 Pages: 98-102

    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] 4H-SiC MOSFET中の単一表面欠陥の共焦点顕微鏡観察2016

    • Author(s)
      梅田享英、阿部裕太、Y.-W. Zhu、岡本光央、小杉亮治、原田信介、春山盛善、小野田忍、大島武
    • Organizer
      第63回応用物理学学術講演会
    • Place of Presentation
      東京工業大学(東京都目黒区)
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] エピタキシャル基板を使用した4H-SiC MOS窒化界面のESR評価2016

    • Author(s)
      梅田享英、鹿児山陽平、奥田貴史、須田淳、木本暢恒、小杉亮治、岡本光央、原田信介
    • Organizer
      第63回応用物理学学術講演会
    • Place of Presentation
      東京工業大学(東京都目黒区)
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] An interfacial defect complex (the P8/9 centers) in C-face 4H-SiC MOSFET studied by electrically detected magnetic resonance2015

    • Author(s)
      T. Umeda, R. Arai, M. Okamoto, R. Kosugi, S. Harada
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2016
    • Place of Presentation
      Sicily, Italy
    • Year and Date
      2015-10-04
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] Development of SiC super-junction (SJ) devices by multi-epitaxial growth2013

    • Author(s)
      R. Kosugi, Y. Sakuma, K. Kojima, S. Itoh, A. Nagata, T. Yatsuo, Y. Tanaka, H. Okumura
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2013
    • Place of Presentation
      Phoenix Seagaia Resort, Miyazaki, Japan
    • Invited
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] Nitrogen doping to channel regions of 4H-SiC MOSFETs characterized by electron spin resonance

    • Author(s)
      T. Umeda, Y. Sato, R. Kosugi, M. Okamoto), S. Harada, H. Okumura
    • Organizer
      European Conference on Silicon Carbide and Related Materials (ECSCRM) 2014
    • Place of Presentation
      Grenoble, France
    • Year and Date
      2014-09-21 – 2014-09-25
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] 容量検出型電子スピン共鳴分光法による4H-SiC MOSFETの結晶欠陥の測定

    • Author(s)
      鹿児山陽平、岡本光央、小杉亮治、原田信介、牧野高紘、大島武、梅田享英
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-15
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] Defects in 4H-SiC MOSFETs studied by Capacitively Detected Magnetic Resonance

    • Author(s)
      Y. Kagoyama, T. Umeda, M. Okamoto, R. Kosugi, S. Harada, T. Makino, T. Ohshima
    • Organizer
      European Conference on Silicon Carbide and Related Materials (ECSCRM) 2014
    • Place of Presentation
      Grenoble, France
    • Year and Date
      2014-09-21 – 2014-09-25
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] 4H-SiC中の空孔欠陥と水素の反応と、水素複合欠陥のESR評価

    • Author(s)
      棚井創基、村上功樹、奥田貴史、須田淳、木本恒暢、小杉亮治、大島武、梅田享英
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-15
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] 電流検出ESRによる C面4H-SiC MOSFET界面欠陥からの水素脱離の観察

    • Author(s)
      荒井亮、梅田享英、佐藤嘉洋、岡本光央、原田信介、小杉亮治、奥村元、牧野高紘、大島武
    • Organizer
      第74回応用物理学会学術講演会
    • Place of Presentation
      同志社大学、京都府
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] C-face interface defects in 4H-SiC MOSFETs studied by electrically detected magnetic resonance

    • Author(s)
      T. Umeda, M. Okamoto, R. Arai, Y. Satoh, R. Kosugi, S. Harada, H. Okumura, T. Makino, T. Ohshima
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2013
    • Place of Presentation
      Miyazaki, Japan
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] SiC MOS interface states: difference between Si face and C face

    • Author(s)
      T. Umeda, M. Okamoto, R. Kosugi, R. Arai, Y. Sato, S. Harada, T. Makino, T. Ohshima
    • Organizer
      224th Electrochemical Society Meeting
    • Place of Presentation
      The Hilton San Francisco Hotel, San Francisco, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-25286054
  • [Presentation] 4H-SiC MOS界面窒化処理における窒素ドーピングのESR定量

    • Author(s)
      梅田享英、佐藤嘉洋、佐久間由貴、小杉亮治
    • Organizer
      第75回応用物理学会秋季学術講演会
    • Place of Presentation
      北海道大学
    • Year and Date
      2014-09-17 – 2014-09-20
    • Data Source
      KAKENHI-PROJECT-25286054
  • 1.  Fujinoki Takahide (10361354)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 2.  OKAMOTO Mitsuo (60450665)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 12 results
  • 3.  HARADA Shinsuke (20392649)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 12 results
  • 4.  岸下 徹一 (80789165)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results
  • 5.  深尾 祥紀 (80443018)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results
  • 6.  梅田 享英
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 14 results

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