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Tanaka Hajime  田中 一

ORCIDConnect your ORCID iD *help
Researcher Number 40853346
Other IDs
Affiliation (Current) 2025: 関西学院大学, 工学部, 講師
Affiliation (based on the past Project Information) *help 2022 – 2024: 大阪大学, 大学院工学研究科, 助教
2020 – 2021: 大阪大学, 工学研究科, 助教
2019: 京都大学, 大学院横断教育プログラム推進センター 先端光・電子デバイス創成学卓越大学院, 特定助教
Review Section/Research Field
Principal Investigator
Basic Section 21050:Electric and electronic materials-related / 0302:Electrical and electronic engineering and related fields
Except Principal Investigator
Broad Section C
Keywords
Principal Investigator
シミュレーション / 移動度 / 炭化ケイ素 / 量子輸送 / 原子論 / MOS反転層 / キャリア輸送 / ワイドギャップ半導体 / 衝突イオン化 / 高電界 … More / モンテカルロ / モンテカルロ法 / 散乱過程 / Hall移動度 / SiC / MOS界面 … More
Except Principal Investigator
MOS界面 / 高温動作デバイス / パワーデバイス / 絶縁破壊 / MOSFET / 炭化珪素 Less
  • Research Projects

    (4 results)
  • Research Products

    (42 results)
  • Co-Researchers

    (2 People)
  •  SiC MOS反転層における電子輸送機構の原子論と量子論に基づく解明Principal Investigator

    • Principal Investigator
      田中 一
    • Project Period (FY)
      2024 – 2028
    • Research Category
      Grant-in-Aid for Early-Career Scientists
    • Review Section
      Basic Section 21050:Electric and electronic materials-related
    • Research Institution
      Osaka University
  •  Materials Science and Device Physics in SiC toward Robust Electronics

    • Principal Investigator
      木本 恒暢
    • Project Period (FY)
      2021 – 2025
    • Research Category
      Grant-in-Aid for Scientific Research (S)
    • Review Section
      Broad Section C
    • Research Institution
      Kyoto University
  •  Theoretical Study on Impact Ionization Phenomena in Wide-bandgap SemiconductorsPrincipal Investigator

    • Principal Investigator
      Tanaka Hajime
    • Project Period (FY)
      2021 – 2023
    • Research Category
      Grant-in-Aid for Early-Career Scientists
    • Review Section
      Basic Section 21050:Electric and electronic materials-related
    • Research Institution
      Osaka University
  •  Theoretical Study on Carrier Transport in SiC MOS InterfacesPrincipal Investigator

    • Principal Investigator
      Tanaka Hajime
    • Project Period (FY)
      2019 – 2020
    • Research Category
      Grant-in-Aid for Research Activity Start-up
    • Review Section
      0302:Electrical and electronic engineering and related fields
    • Research Institution
      Osaka University
      Kyoto University

All 2024 2023 2022 2021 2020 2019

All Journal Article Presentation

  • [Journal Article] Theoretical study on high-field carrier transport and impact ionization coefficients in 4H-SiC2024

    • Author(s)
      Tanaka Hajime, Kimoto Tsunenobu, Mori Nobuya
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 173 Pages: 108126-108126

    • DOI

      10.1016/j.mssp.2024.108126

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K14195, KAKENHI-PROJECT-21H05003
  • [Journal Article] Tunneling current through non-alloyed metal/heavily-doped SiC interfaces2024

    • Author(s)
      Masahiro Hara, Takeaki Kitawaki, Hajime Tanaka, Mitsuaki Kaneko, and Tsunenobu Kimoto
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 171 Pages: 108023-108023

    • DOI

      10.1016/j.mssp.2023.108023

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22KJ1709, KAKENHI-PROJECT-21H05003
  • [Journal Article] Full-band Monte Carlo analysis of strain effects on carrier transport in GaN2024

    • Author(s)
      Miyazaki Wataru, Tanaka Hajime, Mori Nobuya
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 63 Issue: 2 Pages: 02SP35-02SP35

    • DOI

      10.35848/1347-4065/ad1005

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Journal Article] Origin of hole mobility anisotropy in 4H-SiC2024

    • Author(s)
      R. Ishikawa, H. Tanaka, M. Kaneko, and T. Kimoto
    • Journal Title

      Journal of Applied Physics

      Volume: 135 Issue: 7 Pages: 075704-075704

    • DOI

      10.1063/5.0186307

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22KJ1957, KAKENHI-PROJECT-21H05003
  • [Journal Article] Tight-binding analysis of the effect of strain on the band structure of GaN2023

    • Author(s)
      W. Miyazaki, H. Tanaka, and N. Mori
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 62 Issue: SC Pages: SC1076-SC1076

    • DOI

      10.35848/1347-4065/acb7fe

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Journal Article] Experimental and Theoretical Study on Anisotropic Electron Mobility in 4H-SiC2023

    • Author(s)
      R. Ishikawa, H. Tanaka, M. Kaneko, and T. Kimoto
    • Journal Title

      physica status solidi (b)

      Volume: 260 Issue: 10 Pages: 2300275-2300275

    • DOI

      10.1002/pssb.202300275

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22KJ1957, KAKENHI-PROJECT-21H05003
  • [Journal Article] Theoretical analysis of tunneling current in 4H-SiC Schottky barrier diodes under reverse-biased conditions based on the complex band structure2023

    • Author(s)
      Murakami Yutoku、Nagamizo Sachika、Tanaka Hajime、Mori Nobuya
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 62 Issue: SC Pages: SC1042-SC1042

    • DOI

      10.35848/1347-4065/acaed2

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H05003, KAKENHI-PROJECT-20H00250
  • [Journal Article] Impact of the split-off band on the tunneling current at metal/heavily-doped p-type SiC Schottky interfaces2023

    • Author(s)
      Takeaki Kitawaki, Masahiro Hara, Hajime Tanaka, Mitsuaki Kaneko, and Tsunenobu Kimoto
    • Journal Title

      Applied Physics Express

      Volume: 16 Issue: 3 Pages: 031005-031005

    • DOI

      10.35848/1882-0786/acc30d

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22KJ1709, KAKENHI-PROJECT-21H05003
  • [Journal Article] Carrier Trapping Effects on Forward Characteristics of SiC p-i-n Diodes Fabricated on High-Purity Semi-Insulating Substrates2022

    • Author(s)
      Takahashi Katsuya、Tanaka Hajime、Kaneko Mitsuaki、Kimoto Tsunenobu
    • Journal Title

      IEEE Transactions on Electron Devices

      Volume: 69 Issue: 4 Pages: 1989-1994

    • DOI

      10.1109/ted.2022.3154673

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K14209, KAKENHI-PROJECT-21H05003
  • [Journal Article] Simulation analysis of high-field carrier transport in wide-bandgap semiconductors considering tunable band structures and scattering processes2022

    • Author(s)
      H. Tanaka, T. Kimoto, and N. Mori
    • Journal Title

      Journal of Applied Physics

      Volume: 131 Issue: 22 Pages: 225701-225701

    • DOI

      10.1063/5.0090308

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21K14195, KAKENHI-PROJECT-21H05003
  • [Journal Article] Critical electric field for transition of thermionic field emission/field emission transport in heavily doped SiC Schottky barrier diodes2022

    • Author(s)
      Hara Masahiro、Tanaka Hajime、Kaneko Mitsuaki、Kimoto Tsunenobu
    • Journal Title

      Applied Physics Letters

      Volume: 120 Issue: 17 Pages: 172103-172103

    • DOI

      10.1063/5.0088681

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H05003, KAKENHI-PROJECT-22KJ1709
  • [Journal Article] Electron mobility along <0001> and <1-100> directions in 4H-SiC over a wide range of donor concentration and temperature2021

    • Author(s)
      R. Ishikawa, M. Hara, H. Tanaka, M. Kaneko, and T. Kimoto
    • Journal Title

      Appl. Phys. Express

      Volume: 14 Issue: 6 Pages: 061005-061005

    • DOI

      10.35848/1882-0786/abfeb5

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Journal Article] Theoretical analysis of band structure effects on impact ionization coefficients in wide-bandgap semiconductors2020

    • Author(s)
      Hajime Tanaka, Tsunenobu Kimoto, and Nobuya Mori
    • Journal Title

      Applied Physics Express

      Volume: 13 Issue: 4 Pages: 041006-041006

    • DOI

      10.35848/1882-0786/ab7f16

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] Impacts of band structures and scattering processes on high-field carrier transport in wide bandgap semiconductors2023

    • Author(s)
      H. Tanaka, T. Kimoto, N. Mori
    • Organizer
      International Workshop on Computational Nanotechnology
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Full-Band Monte Carlo Analysis of Strain Effects on Carrier Transport in GaN2023

    • Author(s)
      W. Miyazaki, H. Tanaka, N. Mori
    • Organizer
      2023 International Conference on Solid State Devices and Materials
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Anisotropic Electron and Hole Mobilities in 4H-SiC Bulk Crystals2023

    • Author(s)
      R. Ishikawa, H. Tanaka, M. Kaneko, and T. Kimoto
    • Organizer
      65th Electronic Materials Conference
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Impacts of Band Structures and Scattering Processes on High-field Carrier Transport in Wide Bandgap Semiconductors2023

    • Author(s)
      H. Tanaka, T. Kimoto, and N. Mori
    • Organizer
      Int. Workshop on Computational Nanotechnology 2023
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] High-Field Phenomena in SiC Material and Devices2023

    • Author(s)
      T. Kimoto, H. Niwa, X. Chi, M. Hara, R. Ishikawa, H. Tanaka, and M. Kaneko
    • Organizer
      Symposium on Silicon Carbide as Quantum-Classical Platform 2023
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Full-band Monte Carlo analysis of the effects of strain on the impact ionization of GaN2023

    • Author(s)
      W. Miyazaki, H. Tanaka, N. Mori
    • Organizer
      22nd International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] 4H-SiCの衝突イオン化係数の理論解析2023

    • Author(s)
      田中 一, 木本 恒暢, 森 伸也
    • Organizer
      第83回 応用物理学会 秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Monte Carlo Simulation of Electron Transport in SiC MOS Inversion Layers Considering Capture and Emission by Interface States2022

    • Author(s)
      F. Tanaka, H. Tanaka, and N. Mori
    • Organizer
      IEEE 2022 International Meeting for Future of Electron Devices, Kansai
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Anisotropy of hole mobility in 4H-SiC over wide ranges of acceptor concentration and temperature2022

    • Author(s)
      R. Ishikawa, H. Tanaka, M. Kaneko, and T. Kimoto
    • Organizer
      Int. Conf. on Silicon Carbide and Related Materials 2022
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Tight-Binding Analysis of the Effect of Strain on the Band Structure of GaN2022

    • Author(s)
      W. Miyazaki, H. Tanaka, and N. Mori
    • Organizer
      2022 International Conference on Solid State Devices and Materials
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Theoretical Analysis of Tunneling Current in 4H-SiC Schottky Barrier Diodes Under Reverse-biased Condition Based on Complex Band Structure2022

    • Author(s)
      Y. Murakami, S. Nagamizo, H. Tanaka, and N. Mori
    • Organizer
      2022 Int. Conf. on Solid State Devices and Materials
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Theoretical Analysis of Tunneling Effect in 4H-SiC Schottky Barrier Diodes Based on Complex Band Structure2022

    • Author(s)
      Y. Murakami, S. Nagamizo, H. Tanaka, and N. Mori
    • Organizer
      Int. Workshop on Innovative Nanoscale Devices and Systems 2022
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] GaNのバンド構造に歪みが与える影響の強束縛近似法に基づく解析2022

    • Author(s)
      宮崎 航, 田中 一, 森 伸也
    • Organizer
      第83回 応用物理学会 秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Tight-binding and full-band Monte Carlo analysis of the strain effects in wurtzite GaN2022

    • Author(s)
      W. Miyazaki, H. Tanaka, and N. Mori
    • Organizer
      Workshop on Innovative Nanoscale Devices and Systems 2022
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] Contribution of a split-off band to tunneling current in heavily-doped p-type SiC Schottky barrier diodes2022

    • Author(s)
      T. Kitawaki, M. Hara, H. Tanaka, M. Kaneko, and T. Kimoto
    • Organizer
      Int. Conf. on Silicon Carbide and Related Materials 2022
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Physics and Innovative Technologies in SiC Power Devices2021

    • Author(s)
      T. Kimoto, M. Kaneko, K. Tachiki, K. Ito, R. Ishikawa, X. Chi, D. Stefanakis, T. Kobayashi, and H. Tanaka
    • Organizer
      67th IEEE Int. Electron Devices Meeting
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] A New Horizon of SiC Technology Driven by Deeper Understanding of Physics2021

    • Author(s)
      T. Kimoto, M. Kaneko, T. Kobayashi, H. Tanaka, K. Tachiki, A. Iijima, S. Yamashita, X. Chi, Y. Zhao, D. Stefanakis, and Y. Matsushita
    • Organizer
      Europ. Conf. on Silicon Carbide and Related Materials 2020-2021
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Monte Carlo simulation of two-dimensional carrier mobility in wide-gap semiconductor devices2021

    • Author(s)
      N. Mori, H. Tanaka, T. Hoshino, G. Mil'nikov
    • Organizer
      International Symposium on Wide Gap Semiconductor Growth, Process and Device Simulation 2021
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] Electronic States in 4H-SiC MOS Inversion Layers Considering Crystal Structure Using Empirical Pseudopotential Method2021

    • Author(s)
      S. Nagamizo, H. Tanaka, N. Mori
    • Organizer
      International Workshop on Computational Nanotechnology 2021
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] Ideal Thermionic Field Emission and Field Emission Transport through Metal/Heavily-Doped SiC Schottky Barriers2021

    • Author(s)
      M. Hara, H. Tanaka, M. Kaneko, and T. Kimoto
    • Organizer
      Europ. Conf. on Silicon Carbide and Related Materials 2020-2021
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] Anisotropy of electron mobility in 4H-SiC over wide ranges of donor concentration and temperature2021

    • Author(s)
      R. Ishikawa, M. Hara, H. Tanaka, M. Kaneko, and T. Kimoto
    • Organizer
      Europ. Conf. on Silicon Carbide and Related Materials 2020-2021
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H05003
  • [Presentation] 強束縛近似法による酸化ガリウムの電子状態の解析に関する研究2021

    • Author(s)
      入田一輝,岡田丈,橋本風渡,田中一,森伸也
    • Organizer
      第82回応用物理学会 秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21K14195
  • [Presentation] 衝突イオン化係数のバンド構造に対する依存性の理論的解析2020

    • Author(s)
      田中 一, 木本 恒暢, 森 伸也
    • Organizer
      第81回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] 経験的擬ポテンシャル法を用いた4H-SiCにおける浮遊電子状態の計算2020

    • Author(s)
      永溝 幸周, 田中 一, 森 伸也
    • Organizer
      先進パワー半導体分科会第7回講演会
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] ワイドギャップ半導体の衝突イオン化係数にバンド構造が与える影響の解析2020

    • Author(s)
      田中一,木本恒暢,森伸也
    • Organizer
      第67回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] 界面準位の影響に着目したSiC MOS反転層における電子輸送の理論的検討2020

    • Author(s)
      田中 一, 森 伸也
    • Organizer
      先進パワー半導体分科会第6回個別討論会
    • Invited
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] Theoretical Study of Band Structure Effects on Impact Ionization Coefficients in Wide-bandgap Semiconductors2019

    • Author(s)
      Hajime Tanaka, Nobuya Mori, and Tsunenobu Kimoto
    • Organizer
      9th Asia-Pacific Workshop on Widegap Semiconductors
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] 衝突イオン化係数にバンド構造が与える影響の理論解析2019

    • Author(s)
      田中一,木本恒暢,森伸也
    • Organizer
      応用物理学会先進パワー半導体分科会第6回講演会
    • Data Source
      KAKENHI-PROJECT-19K23514
  • [Presentation] Monte Carlo Simulation of Hall Mobility in 4H-SiC MOS Inversion Layers2019

    • Author(s)
      Hajime Tanaka and Nobuya Mori
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-19K23514
  • 1.  木本 恒暢 (80225078)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 11 results
  • 2.  金子 光顕 (60842896)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 11 results

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