IWAHARA Masayoshi 岩原正吉

Researcher Number	80020212
Other IDs
External Links
Affiliation (based on the past Project Information) *help	2004: Kanazawa University, Graduate School of Nature and Environmental Technology, professor, 自然科学研究科, 教授 2002 – 2003: 金沢大学, 工学部, 教授 1998 – 2000: 金沢大学, 工学部, 教授 1997: 金沢大学, 医学部, 教授 1994 – 1996: 金沢大学, 工学部, 助教授
Review Section/Research Field	Except Principal Investigator Measurement engineering / 計測・制御工学 / 電力工学・電気機器工学 / 環境影響評価(含放射線生物学)
Keywords	Except Principal Investigator eddy currents / うず電流 / planar coil / うず電流探傷 / 非破壊検査 / 平面コイル / 渦電流 / ミアンダ形コイル / image processing / property inspection … More / resistance test / non-contacting test / giant magneto-resistance / eddy-current testing / non-destructive testing / printed circuit board / 画像処理 / 性状検査 / 抵抗検査 / 非接触検査 / 巨大磁気抵抗素子 / プリント基板 / fatigue / conductivity / metal material / iverse problem / impedance / meander coil / 経時変化疲労予測 / 膜厚計測 / 透磁率計測 / 金属劣化 / 疲労予測 / 導電率計測 / 金属材料 / 逆問題 / インピーダンス / ミアニダ形コイル / disconnection / printed wirings / meander / crack / probe / nondestructive testing / ミアンダコイル / クラック / 高周波 / 差動動作 / 断線 / プリント配線 / ミアンダ / 欠陥 / プローブ / 被破壊検査 / simulation / high capacity / sodium / liquid metal / magnetic flux concentration / magnetic shielding / electromagnetic pump / ポンプ / 高速増殖炉 / リニアインダクションモータ / シミュレーション / 大規模 / ナトリウム / 液体金属 / 磁束収束 / 磁気シールド / 電磁ポンプ / permanent magnet / electromagnetic actuator / nonlinear control / feedback control / magnetic bearing / magnetic suspension / magnetic levitation / リアプノフ関数 / 電磁、アクチュエータ / 磁気軸学 / 永久磁石 / 電磁アクチュエータ / 非線形制御 / フィードバック制御 / 磁気軸受 / 磁気浮上 / 相乗効果 / 熱ショックタンパク質 / ミスマッチ修復 / ELF磁界 / 生体磁気 / ヒートショックタンパク / 遺伝子 / 生体影響 / 回転磁界 / 低周波交流 / 磁界 / 平面形磁気回路 / 磁気回路 / リニアアクチュエータ / 磁気駆動 Less

Research on inspection technique of printed circuit board using the probe composed of GMR sensor and planar coil
- Principal Investigator
  
  YAMADA Sotoshi
- Project Period (FY)
  2002 – 2004
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Measurement engineering
- Research Institution
  Kanazawa University
微細平面コイルによる金属体極表面の性状検出と初期劣化の推定に関する研究
- Principal Investigator
  
  YAMADA Sotoshi
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Measurement engineering
- Research Institution
  kanazawa University
低周波交番・回転高磁界における遺伝子および生化学反応への影響評価の研究
- Principal Investigator
  
  山田外史
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  環境影響評価(含放射線生物学)
- Research Institution
  Kanazawa University
Study on the configuration and structure of higher-capacity flux-concentration type electromagnetic pump
- Principal Investigator
  
  YAMADA Sotoshi
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  電力工学・電気機器工学
- Research Institution
  Kanazawa University
Study on flux-differential type eddy-current testing technique by planar coils
- Principal Investigator
  
  YAMADA Sotoshi
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  計測・制御工学
- Research Institution
  Kanazawa University
薄形、低電磁雑音のプレーナ形磁気アクチュエータの研究
- Principal Investigator
  
  YAMADA Sotoshi
- Project Period (FY)
  1994
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B)
- Research Field
  
  電力工学・電気機器工学
- Research Institution
  Kanazawa University
Organization of Stable Magnetic Suspension System with High Compliance
- Principal Investigator
  
  MATSUMURA Fumio
- Project Period (FY)
  1994 – 1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  計測・制御工学
- Research Institution
  Kanazawa University

All 2005 2004 2003 2002 2001

All Journal Article

[Journal Article] Conductive Micro-Bead Array Detection By High-Frequency Eddy-Current Testing Technique with SV-GMR Sensor2005
- Author(s)
  S.Yamada, K.Chomsuwan, T.Hagino, H.Tian, M.Iwahara
- Journal Title
  
  International Magnetic Conference (発表確定)
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Eddy-Current Model and Detection in a Thick Stainless Steel Plate2005
- Author(s)
  H.Tian, S.Yamada, M.Iwahara, H.Tooyama, K.Miya
- Journal Title
  
  Transaction on Magnetics Society of Japan 5
  
  Pages: 39-42
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] PCB Conductor Inspection with GMR Based ECT Probe2005
- Author(s)
  S.Yamada, K.Chomsuwan, M.Iwahara, H.Wakiwaka, T.Taniguchi, S.Shoji
- Journal Title
  
  Review of Quantitative Nondestructive Evaluation 24 (to be published)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] PCB Conductor Dimension and Alignment Inspection by using ECT Probe with SV-GMR Sensor2005
- Author(s)
  K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  Transaction on Magnetics Society of Japan 5 (to be published)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Bare PCB Inspection by Mean of ECT Technique with Spin-Valve GMR2005
- Author(s)
  K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, T.Taniguchi, S.Shoji
- Journal Title
  
  Proceeding of World Conference on Nondestructive Testing (to be published)
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Application of the Repulsive Type Magnetic Bearing for Manufacturing Micromass Measurement Balance Equipment2005
- Author(s)
  K.Chomsuwan, S.Yamada, M.Iwahara H.Wakiwaka, S.Shoji
- Journal Title
  
  International Magnetic Conference (発表確定)
- NAID
  120006656565
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] PCB Conductor Dimension and Alignment Inspection by Using ECT Probe with SV-GMR sensor2005
- Author(s)
  K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  日本応用磁器学会誌 (印刷中)
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004
- Author(s)
  S.Yamada, K.Chomsuwan, Y.Fukuda, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  IEEE Transactions on Magnetics 40・4
  
  Pages: 2676-2678
- NAID
  120001137838
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] High-Freqency, Low-Amplitude Magnetic Field Characteristics of SV-GMR Sensor for ECT Technique2004
- Author(s)
  Y.Fukuda, K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  Transaction on Magnetics Society of Japan (in Japanese) 28, 3
  
  Pages: 405-408
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004
- Author(s)
  S.Yamada, K.Chomsuwan, Y.Fukuda, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  IEEE Transactions on Magnetics 40, 4
  
  Pages: 2676-2678
- NAID
  120001137838
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Inspection of bare printed circuit board using planar type ECT probe2004
- Author(s)
  S.Yamada, M.Iwahara, Y.Fukuda, T.Taniguchi, H.Wakiwaka
- Journal Title
  
  Review of Quantitative Nondestructive Evaluation 23
  
  Pages: 374-381
- NAID
  120006345319
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique2004
- Author(s)
  K.Chomsuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  Transaction on Magnetics Society of Japan 4, 1
  
  Pages: 39-42
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Inspection of Bare Printed Circuit Board Using Planar Type ECT Probe2004
- Author(s)
  S.Yamada, M.Iwahara, Y.Fukuda, T.Taniguchi, H.Wakiwaka
- Journal Title
  
  Review of Quantitative Nondestructive Evaluation 23
  
  Pages: 374-381
- NAID
  120006345319
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique2004
- Author(s)
  K.Chomsuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
- Journal Title
  
  Trans.Magn.Soc.Japan 4・1
  
  Pages: 39-42
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Application of ECT Technique for Inspection of Bare PCB2003
- Author(s)
  S.Yamada, K.Nakamura, M.Iwahara, T.Taniguchi, H.Wakiwak
- Journal Title
  
  IEEE Transactions on Magnetics 39, 5
  
  Pages: 3325-3327
- NAID
  120006323943
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Enhancing the Sensitivity and Resolution of Multi-ECT Probe for Inspection of Printed Circuit Board2003
- Author(s)
  K.Nakamura, S.Yamada, M.Iwahara, T.Taniguchi
- Journal Title
  
  Transaction on Magnetics Society of Japan (in Japanese) 27, 4
  
  Pages: 393-396
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Eddy Current Testing of Weld Zone Defects Using a Meander Probe2003
- Author(s)
  T.Maeda, S.Mizuno, S.Yamada, M.Iwahara
- Journal Title
  
  Transaction on Magnetics Society of Japan (in Japanese) 27, 4
  
  Pages: 397-401
- NAID
  10007795353
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe2002
- Author(s)
  D.Kacprzak, S.Yamada, M.Iwahara
- Journal Title
  
  International Journal of Applied Electromagnetics and Mechanics 15
  
  Pages: 15-20
- NAID
  120006368375
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects2002
- Author(s)
  T.Taniguchi, K.Nakamura, S.Yamada, M.Iwahara
- Journal Title
  
  International Journal of Applied Electromagnetics and Mechanics 14
  
  Pages: 503-506
- NAID
  120006368371
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe2001
- Author(s)
  D.Kacprzak, S.Yamada, M.Iwahara
- Journal Title
  
  International Journal of Applied Electromagnetics and Mechanics 15
  
  Pages: 1-4
- NAID
  120006368375
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218
[Journal Article] Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects2001
- Author(s)
  T.Taniguchi, K.Nakamura, S.Yamada, M.Iwahara
- Journal Title
  
  International Journal of Applied Electromagnetics and Mechanics 14
  
  Pages: 1-4
- NAID
  120006368371
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-14350218

1. YAMADA Sotoshi (80019786)

# of Collaborated Projects: 7 results

# of Collaborated Products: 21 results
2. KANAMARU Yasunori (00139750)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
3. MATSUMURA Fumio (40019724)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. NAMERIKAWA Toru (30262554)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. YOSHIMOTO Takeshi (10042912)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. WAKIWAKA Hiroyuki (50240461)

# of Collaborated Projects: 1 results

# of Collaborated Products: 12 results
7. TANIGUCHI Tetuki (50283099)

# of Collaborated Projects: 1 results

# of Collaborated Products: 8 results
8. AZUMA Takehito (60308179)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. 原田真市 (90272955)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. 米倉秀人 (80240373)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. 山本博 (00115198)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

IWAHARA Masayoshi 岩原 正吉

Research Projects

Research Products

Co-Researchers

Research on inspection technique of printed circuit board using the probe composed of GMR sensor and planar coil

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

微細平面コイルによる金属体極表面の性状検出と初期劣化の推定に関する研究

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

低周波交番・回転高磁界における遺伝子および生化学反応への影響評価の研究

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on the configuration and structure of higher-capacity flux-concentration type electromagnetic pump

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Study on flux-differential type eddy-current testing technique by planar coils

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

薄形、低電磁雑音のプレーナ形磁気アクチュエータの研究

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Organization of Stable Magnetic Suspension System with High Compliance

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Conductive Micro-Bead Array Detection By High-Frequency Eddy-Current Testing Technique with SV-GMR Sensor2005

Author(s)

Journal Title

Data Source

[Journal Article] Eddy-Current Model and Detection in a Thick Stainless Steel Plate2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] PCB Conductor Inspection with GMR Based ECT Probe2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] PCB Conductor Dimension and Alignment Inspection by using ECT Probe with SV-GMR Sensor2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Bare PCB Inspection by Mean of ECT Technique with Spin-Valve GMR2005

Author(s)

Journal Title

Description

Data Source

[Journal Article] Application of the Repulsive Type Magnetic Bearing for Manufacturing Micromass Measurement Balance Equipment2005

Author(s)

Journal Title

NAID

Data Source

[Journal Article] PCB Conductor Dimension and Alignment Inspection by Using ECT Probe with SV-GMR sensor2005

Author(s)

Journal Title

Data Source

[Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004

IWAHARA Masayoshi 岩原正吉