TSUSAKA Yoshiyuki 津坂佳幸

… Alternative Names

津坂佳幸ツサカヨシユキ

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Researcher Number	20270473
External Links
Affiliation (Current)	2025: 兵庫県立大学, 理学研究科, 准教授
Affiliation (based on the past Project Information) *help	2021 – 2022: 兵庫県立大学, 理学研究科, 准教授 2020: 兵庫県立大学, 物質理学研究科, 准教授 2002 – 2003: 姫路工業大学, 大学院・理学研究科, 助手 2001 – 2003: 姫路工業大学, 理学部, 助手 1998 – 1999: 姫路工業大学, 理学部, 助手 1996: Okazaki National Research Institute, Institute for Molecular Science, research a, 理学部, 助手 1995: 岡崎国立共同研究機構, 分子科学研究所, 助手
Review Section/Research Field	Except Principal Investigator Radiation science / Basic Section 30010:Crystal engineering-related / Medium-sized Section 30:Applied physics and engineering and related fields / Electronic materials/Electric materials / 表面界面物性
Keywords	Except Principal Investigator 放射光 / 低転位 / 気相成長 / 低抵抗 / GaN / OVPE / LED / 位相画像 / synchrotron radiation / 格子定数 … More / 欠陥評価 / PNダイオード / Refraction contrast imaging / Microfocus X-ray / Ray Tracing method / 拡大イメージング / 拡大撮像 / 微小点光源 / 屈折コントラスト画像 / 微小焦点X線 / レイトレーシング法 / Silicon-on-Insulator Crystal / Semiconductor Laser / Device Characteristics / Synchrotron Radiation / X-ray Microbeam / Lattice Strain / Semiconductor Substrate / その場測定 / マイクロビーム / X線 / 電子デバイス / 局所歪み / 薄膜 / SOI / ゾーンプレート / 円筒ミラー / 非対称ブラッグ反射 / SOI結晶 / 半導体レーザー / デバイス特性 / X線マイクロビーム / 格子歪み / 半導体基板 / phase image / refraction contrast X-ray image / 屈折コントラスト法 / gas source MBE / disilanc / dimethyl aluminum hydride / carbon contamination / IRAS / Core electron excitations / カーボン汚染 / 内殻電子励起 / ジメチルアルミニウムハイドライド / 赤外表面反射吸収法 / ガスソースMBE / ジシラン Less

Growth of a thick GaN crystal with extremely low resistivity by the OVPE method
- Principal Investigator
  
  Mori Yusuke
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 30:Applied physics and engineering and related fields
- Research Institution
  Osaka University
Study of thick GaN crystals with low-dislocation density by the vapor phase epitaxy with an oxide gallium source
- Principal Investigator
  
  Imanishi Masayuki
- Project Period (FY)
  2020 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 30010:Crystal engineering-related
- Research Institution
  Osaka University
Study of medical imaging of X-ray minute point source using synchrotron radiation
- Principal Investigator
  
  YAMASAKI Katsuhito
- Project Period (FY)
  2002 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Radiation science
- Research Institution
  Japan Synchrotron Radiation Research institute
In-Situ Measurement of Local Crystal Strain Under Device Operation by Highly Parallel X-ray Microbeam.
- Principal Investigator
  
  MATSUI Junji
- Project Period (FY)
  2001 – 2003
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electronic materials/Electric materials
- Research Institution
  Himeji Institute of Technology
Research on the refraction-enhanced imaging using synchrotron radiation
- Principal Investigator
  
  YAMASAKI Katsuhito
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Radiation science
- Research Institution
  Kobe University
Effects of Inter-molecular Interaction of Surface Adsorbed Molecules in Synchrotron Radiation Stimulated CVD
- Principal Investigator
  
  URISU Tsuneo
- Project Period (FY)
  1995 – 1996
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  表面界面物性
- Research Institution
  Okazaki National Research Institutes

All 2003 2002 2001

All Journal Article Book

[Book] X線マイクロビームを用いた局所領域微量ひずみの検出2003
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 木村滋
- Publisher
  応用物理学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 高分解能マイクロビームX線回折法による半導体レーザー素子の評価2002
- Author(s)
  木村滋, 津坂佳幸, 松井純爾
- Publisher
  (株)アグネ技術センター
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 第145回委員会研究会資料2001
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 横山和司
- Publisher
  日本学術振興会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Book] 第135回 X線材料強度部門委員会資料2001
- Author(s)
  松井純爾, 篭島靖, 津坂佳幸, 横山和司
- Publisher
  日本材料学会
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003
- Author(s)
  Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl. Instrum. & Methods B199
  
  Pages: 19-22
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Minute Local Strain in Semiconductor Material and Electronic Devices by Using a Highly-Parallel X-ray Microbeam2003
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
- Journal Title
  
  Nucl. Instrum. & Methods B199
  
  Pages: 15-18
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003
- Author(s)
  Y.Tsusaka, M.Urakawa, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, F.Yoshida, K.Watanabe, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl.Instrum.& Methods B199
  
  Pages: 19-22
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Minute Local Strain in Semiconductor Materials and Electronic Devices by Using a Highly Parallel X-ray Microbeam2003
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Katou, H.Kurihara, K.Watanabe, Y.Kagoshima, S.Kimura
- Journal Title
  
  Nucl.Instrum.& Methods B199
  
  Pages: 15-18
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002
- Author(s)
  S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
- Journal Title
  
  Japan.J.Appl.Phys. 41
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Evaluation of Lattice Strain in Silicon Substrate Beneath Alminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry2002
- Author(s)
  K.Yokoyama, H.Kurihara, S.Takeda, M.Yrakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Japan.J.Appl.Phys. 41
  
  Pages: 6094-6097
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Microscopic Strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
- Journal Title
  
  J.Crystal Growth 237-239
  
  Pages: 317-323
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Evaluation of Lattice Strain In Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffactometry2002
- Author(s)
  K.Yokoyama, H.Kurihara, S.Takeda, M.Urakawa, K.Watanabe, M.Katou, N.Inoue, N.Miyamoto, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Japan. J. Appl. Phys. 41
  
  Pages: 6094-6097
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-ray Diffraction Method with a Sub-mm Spatial Resolution2002
- Author(s)
  S.Kimura, Y.Kagoshima, K.Kobayashi, K.Izumi, Y.Sakata, S.Sudo, K.Yokoyama, T.Niimi, Y.Tsusaka, J.Matsui
- Journal Title
  
  Japan. J. Appl. Phys. 41
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Microscopic strain Analysis of Semiconductor Crystals Using a Synchrotron X-ray Microbeam2002
- Author(s)
  J.Matsui, Y.Tsusaka, K.Yokoyama, S.Takeda, M.Urakawa, Y.Kagoshima, S.Kimura
- Journal Title
  
  J. Crystal Growth 237-239
  
  Pages: 317-323
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Hyogo Beamline at Spring-8 : Multiple Station Beamline with the TROIKA concept2001
- Author(s)
  Y.Tsusaka, K.Yokoyama, K.Takai, S.Takeda, Y.Kagoshima, J.Matusi
- Journal Title
  
  Nucl. Instrum & Methods A467-468
  
  Pages: 670-673
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001
- Author(s)
  S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, Y.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
- Journal Title
  
  Nucl. Instrum & Methods A467-468
  
  Pages: 974-977
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] X-ray Phase-Contrast Imaging with submicron Resolution by Using Extremel Asymmetric Bragg Diffractions2001
- Author(s)
  K.Kobayashi, K.Izumi, H.Kimura, S.Kimura, T.Ibuki, K.Yokoyama, Y.Tsusaka, Y.Kagosima, J.Matsui
- Journal Title
  
  Appl. Phys. Letters 78
  
  Pages: 132-134
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Rocking Curve Measurement of Infrared LEDs Using Highly Parallel X-ray Microbeam2001
- Author(s)
  S.Takeda, K.Yokoyama, M.Urakawa, T.Ibuki, K.Takai, T.Tsusaka, Y.Kagoshima, J.Matsui, N.Miyamoto
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 974-977
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Hyogo Beamline at SPring-8: Multiple Station Beamline with the TROIKA Concept2001
- Author(s)
  Y.Tsusaka, K.Yokoyama, K.Takai, S.Takeda, Y.Kagoshima, J.Matsui
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 670-673
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001
- Author(s)
  K.Yokoyama, S Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, J.Matsui
- Journal Title
  
  Nucl. Instrum & Methods A467-468
  
  Pages: 1205-1208
- Description
  「研究成果報告書概要(和文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] X-ray Phase-Contrast Imaging with Submicron Resolution by Using Extremely Asymmetric Bragg Diffractions2001
- Author(s)
  K.Kobayashi, K.Izumi, H.Kimura, S.Kimura, T.Ibuki, K.Yokoyama, Y.Tsusaka, Y.Kagoshima, J.Matsui
- Journal Title
  
  Appl.Phys.Letters 78
  
  Pages: 132-134
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096
[Journal Article] Study of Local Strain Distribution in Semiconductor Devices Using High-Resolution X-ray Microbeam Diffractometry2001
- Author(s)
  K.Yokoyama, S.Takeda, M.Urakawa, Y.Tsusaka, Y.Kagoshima, J.Matsui, S.Kimura, H.Kimura, K.Kobayashi, T.Ohhira, K.Izumi, N.Miyamoto
- Journal Title
  
  Nucl.Instrum & Methods A467-468
  
  Pages: 1205-1208
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-13555096

1. MATSUI Junji (10295751)

# of Collaborated Projects: 3 results

# of Collaborated Products: 21 results
2. KAGOSHIMA Yasushi (10224370)

# of Collaborated Projects: 3 results

# of Collaborated Products: 20 results
3. SUGIMURA Kazuo (00136384)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. YAMASAKI Katsuhito (50210381)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. 上殿明良 (20213374)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. 河村貴宏 (80581511)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. URISU Tsuneo (50249950)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. MASE Kazuhiko (40241244)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. YAGI Naoto (80133940)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. KIMURA Shigeru (50360821)

# of Collaborated Projects: 1 results

# of Collaborated Products: 16 results
11. SHIKATA Yoshihiro (50028114)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. UMETANI Keiji (50344396)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. Mori Yusuke (90252618)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. Imanishi Masayuki (00795487)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. 足立秀治 (60159407)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. 酒井朗 (20314031)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

TSUSAKA Yoshiyuki 津坂 佳幸

津坂 佳幸 ツサカ ヨシユキ

Research Projects

Research Products

Co-Researchers

Growth of a thick GaN crystal with extremely low resistivity by the OVPE method

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study of thick GaN crystals with low-dislocation density by the vapor phase epitaxy with an oxide gallium source

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Study of medical imaging of X-ray minute point source using synchrotron radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

In-Situ Measurement of Local Crystal Strain Under Device Operation by Highly Parallel X-ray Microbeam.

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Research on the refraction-enhanced imaging using synchrotron radiation

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Effects of Inter-molecular Interaction of Surface Adsorbed Molecules in Synchrotron Radiation Stimulated CVD

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Book] X線マイクロビームを用いた局所領域微量ひずみの検出2003

Author(s)

Publisher

Description

Data Source

[Book] 高分解能マイクロビームX線回折法による半導体レーザー素子の評価2002

Author(s)

Publisher

Description

Data Source

[Book] 第145回委員会研究会資料2001

Author(s)

Publisher

Description

Data Source

[Book] 第135回 X線材料強度部門委員会資料2001

Author(s)

Publisher

Description

Data Source

[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003

Author(s)

Journal Title

Description

Data Source

[Journal Article] Measurement of Minute Local Strain in Semiconductor Material and Electronic Devices by Using a Highly-Parallel X-ray Microbeam2003

Author(s)

Journal Title

Description

Data Source

[Journal Article] Estimation of Bonded Silicon-on-Insulator Wafers by Means of Diffractometry Using a Parallel X-Ray Microbeam2003

Author(s)

Journal Title

Description

Data Source

[Journal Article] Measurement of Minute Local Strain in Semiconductor Materials and Electronic Devices by Using a Highly Parallel X-ray Microbeam2003

Author(s)

Journal Title

Description

TSUSAKA Yoshiyuki 津坂佳幸

津坂佳幸ツサカヨシユキ