ISHI Hideshi 石井秀司

… Alternative Names

ISHII Hideshi 石井秀司

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Researcher Number	30251466
External Links
Affiliation (based on the past Project Information) *help	2011: 立命館大学, 総合科学技術研究機構, チェアプロフェッサー 2010 – 2011: 立命館大学, 総合理工学研究機構, チェアプロフェッサー 2006: 京大, 工学(系)研究科(研究院), 助手 2006: 京都大学, 工学研究科, 助手(18年4月まで) 2003 – 2005: 京都大学, 工学研究科, 助手 1996 – 2002: 東京大学, 生産技術研究所, 助手
Review Section/Research Field	Principal Investigator 工業分析化学 / Analytical chemistry Except Principal Investigator 工業分析化学 / Analytical chemistry
Keywords	Principal Investigator 光電子回折 / シンクロトロン放射 / XAFS / リアルタイム測定 / 薄膜構造 / 界面 / 表面 / X線 / エピタキシャル薄膜 / Growth of Films … More / Epitaxial Films / Sychrotorn Radiation / Structure Analysis / Oxide Thin Films / Chemical State / Interface of Thin Films / Pjotoelectron Diffraction / 酸化物 / 絶縁体界面 / 金属 / 光電子回析 / 薄膜成長 / 構造解析 / 酸化物薄膜 / 化学状態 / 薄膜界面構造 / 放射光 / 超軟X線 / 大気圧測定 / 軽元素 / リチウム / 光触媒リスク評価 / SEM / 9V乾電池小型X線源 / EXEFS / 金属シリサイド半導体 / 有効電荷 / 蛍光X線 / Cu-K励起 / 高耐圧アナライザー / 高分解能蛍光X線分光 / シリサイド半導体 / X線吸収微細構造 / 乾電池X線発生装置 / 化学状態分析 / 高エネルギー光電子検出 / 光電子解析 / マイクロX線光電子回折 / マルチエネルギー測定 / 強力X線 / 光電子ホログラフィー / ガリウム収束イオンビーム / 収束イオンビーム加工 / 二次イオン質量分析 / オージェ電子回折 / X線光電子回折 / マルチエネルギー強力X線光源 / 表面構造 / 薄膜界面 / 集束イオンビーム加工 / 表面構造解析 / 電子アナライザー / 光電子分光 … More Except Principal Investigator Cu / High accurate cross-sectioning of sample / Analytical reliability / Multi-elements detection / Elemental analysis with high spatial resolution / Nano-scale tree-dimensional analysis / Secondary ion mass spectrometry / Gallium focused ion beam / Ultra fine ion beam / 環境微粒子 / 機能性粉体材料 / 機能性工業材料 / 精密試料断面加工 / 分析信頼性 / 多元素同時検出 / 高空間分解能元素分布解析 / ナノスケール三次元分析法 / 二次イオン質量分析法 / ガリウム収束イオンビーム / 超細束イオンビーム / Photoelectron Holography / Ge (111) / Tensor XPED / Surface alloy / Surfactant Epitaxy / Real time XPED / Photoelectron Diffraction / Gu / 光電子ホログラフィー / Ge(111)系 / tensor XPED / 表面合金化プロセス / 表面変性エピタキシー / XPED時間分解測定 / X線光電子回折 / Li電池 / ボロン化合物 / Liイオン電池 / 放射光科学 / XAFS / 軽元素 / 軟X線分光 / 計測工学 / 分析科学 / 状態分析 / ナノ粒子 / 光触媒 / 酸化チタン / エアロゾル / 毒性評価 / 化学状態分析 / SEM Less

リチウムから炭素の軽元素の大気圧XAFS測定分析手法の開発Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  Ritsumeikan University
Development of analytical spectroscopy using super-soft X-ray
- Principal Investigator
  
  WATANABE IWAO
- Project Period (FY)
  2008 – 2010
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  Ritsumeikan University
高分解能蛍光X線およびX線光電子分光による金属シリサイドの電子状態分析Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Analytical chemistry
- Research Institution
  Kyoto University
走査型電子顕微鏡を用いたX線CTによるナノ粒子断面イメージング法の開発
- Principal Investigator
  
  河合潤
- Project Period (FY)
  2005 – 2006
- Research Category
  
  Grant-in-Aid for Exploratory Research
- Research Field
  
  Analytical chemistry
- Research Institution
  Kyoto University
高エネルギーX線光電子回折による埋もれた界面のリアルタイム構造評価法の開発Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  2003 – 2004
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Analytical chemistry
- Research Institution
  Kyoto University
X線光電子回折によるマイクロ領域のリアルタイム表面構造評価法の開発Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  2001 – 2002
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
X線光電子回折法を用いた収束イオンビーム加工断面の表層領域損傷評価Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
Development of nano-scale three-dimensional analytical apparatus for industrial material using an ultra fine focused ion beam
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1999 – 2000
- Research Category
  
  Grant-in-Aid for Scientific Research (B).
- Research Field
  
  工業分析化学
- Research Institution
  University of Tokyo
Real tine characterization and control of growing interface structures of thin films
- Principal Investigator
  
  NIHEI Yoshimasa
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
Structural analysis of interface reactions in thin films by photoelectron diffractionPrincipal Investigator
- Principal Investigator
  
  ISHII Hideshi
- Project Period (FY)
  1997 – 1998
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo
高角度分解光電子回折のオンライン解析システムに関する研究Principal Investigator
- Principal Investigator
  
  石井秀司
- Project Period (FY)
  1996
- Research Category
  
  Grant-in-Aid for Encouragement of Young Scientists (A)
- Research Field
  
  工業分析化学
- Research Institution
  The University of Tokyo

All 2013 2012 2011 2010 2007 2006 2005

All Journal Article Presentation

[Journal Article] Charge compensation mechanisms in Li_<1.16>Ni_<0.15>Co_<0.19>Mn_<0.50>O_2 positive electrode material for Li-ion batteries analyzed by a combination of hard and soft X-ray absorption near edge structure2013
- Author(s)
  M. Oishi, T. Fujimoto, Y. Takanashi, Y. Orikasa, A. Kawamura, T. Ina, H. Yamashige, D. Takamatsu, K. Sato, H. Murayama, H. Tanida, H. Arai, H. Ishii, C. Yogi, I. Watanabe, T. Ohta, A. Mineshige, Y. Uchimoto, Z. Ogumi
- Journal Title
  
  Journal of Power Sources
  
  Volume: 222 Pages: 45-51
- DOI
  10.1016/j.jpowsour.2012.08.023
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-11J01074, KAKENHI-PROJECT-23550107
[Journal Article] Partial Fluorescence Yield XAFS Measurements in Lower Soft X-Ray Region by Using Large-Caliber Silicon Drift Detector2012
- Author(s)
  C. Yogi, H. Ishii, K. Nakairishi, I. Watanabe, K. Kojima, T. Ohta
- Journal Title
  
  Adv. X-Ray Chem. Anal., Japan
  
  Volume: 43 Pages: 147-152
- NAID
  40019263023
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23550107
[Journal Article] Near-edge X-ray absorption fine structure study of vertically aligned carbon nanotubes grown by the surface decomposition of SiC2012
- Author(s)
  Takahiro Maruyama, Yuki Ishiguro, Shigeya Naritsuka, Wataru Norimatsu, Michiko Kusunoki, Kenta Amemiya, Hideshi Ishii, Toshiaki Ohta (T. Maruyama)
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 51 Issue: 5R Pages: 55102-55102
- DOI
  10.1143/jjap.51.055102
- NAID
  40019280423
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21510119, KAKENHI-PROJECT-23550107
[Journal Article] Pyroelectric X-ray application to X-ray adsorption and emission spectroscopies2012
- Author(s)
  Jun Kawai, Hideshi Ishii, Hiroyuki Ida
- Journal Title
  
  X-ray Spectrum
  
  Volume: 41 Issue: 4 Pages: 216-218
- DOI
  10.1002/xrs.2406
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23550107
[Journal Article] Size Effect of Au Nanoparticles on TiO_2 Crystalline Phase of Nanocomposite Thin Films and Their Photocatalytic Properties2011
- Author(s)
  C.Yogi, K.Kojima, T.Hashishin, N.Wada, Y.Inada, E.D.Gaspera, M.Bersani, A.Martucci, L.Liu, T.K.Sham
- Journal Title
  
  J.Phys.Chem.C 115
  
  Pages: 6554-6560
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20550088
[Journal Article] Fabrication of a compact transfer vessel system for anerobic samples at BL-2 and BL-102010
- Author(s)
  K.Nakanishi
- Journal Title
  
  MEMOIRES OF THE SR CENTER, Ritsumeikan University
  
  Volume: 12 Pages: 161-163
- Data Source
  KAKENHI-PROJECT-20550088
[Journal Article] XAFSによる微粒子の化学状態分析2007
- Author(s)
  松本諭, 石井秀司, 田辺晃生, 河合潤
- Journal Title
  
  鉄と鋼 93
  
  Pages: 132-137
- NAID
  110006164995
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] X-ray Absorption Fine Structure Measurement with a 9 V Electric Battery X-ray Emitter2006
- Author(s)
  S.Mitsuya, H.Ishii, J.Kawai
- Journal Title
  
  Appl.Phys.Lett 89
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] 酸化チタン光触媒粒子リスク評価のための個別粒子分析2006
- Author(s)
  石井秀司, 松本諭, 松井康人, 寺田靖子, 田邊晃生, 内山巌雄, 河合潤
- Journal Title
  
  環境科学会誌 19
  
  Pages: 209-216
- NAID
  10019246652
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] 水素吸蔵合金のSEM-EDXによる元素分布分析2006
- Author(s)
  武田匡史, 石井秀司, 田辺晃生, 河合潤
- Journal Title
  
  X線分析の進歩 37
  
  Pages: 273-279
- NAID
  40007459876
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] シリコンドリフトX線検出器による走査電子顕微鏡でのSEM-EDX2006
- Author(s)
  石井秀司, 河合潤
- Journal Title
  
  X線分析の進歩 37
  
  Pages: 281-288
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] Sulfur chemical state analysis of diesel emissions of vehicles using X-ray absorption2006
- Author(s)
  S.Matsumoto, Y.Tanaka, H.Ishii, T.Tanabe, Y.Kitajima, J.Kawai
- Journal Title
  
  Spectrochim.Acta, Part B 61
  
  Pages: 991-994
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] Si Kα chemical shift and charge state of Si in metal silicides2005
- Author(s)
  Hideshi ISHII
- Journal Title
  
  J.Surf.Anal. 12
  
  Pages: 277-281
- NAID
  40007162384
- Data Source
  KAKENHI-PROJECT-17550079
[Journal Article] 乾電池X線発生装置による米・米ぬかの蛍光X線分析2005
- Author(s)
  石井秀司
- Journal Title
  
  分析化学 54
  
  Pages: 321-324
- Data Source
  KAKENHI-PROJECT-17550079
[Journal Article] 乾電池X線発生装置による環境標準試料の蛍光X線分析2005
- Author(s)
  石井秀司
- Journal Title
  
  X線分析の進歩 36
  
  Pages: 225-234
- Data Source
  KAKENHI-PROJECT-15750064
[Journal Article] SEM-EDX-SR-XRF-XANES2005
- Author(s)
  河合潤, 石井秀司
- Journal Title
  
  J.Surf.Anal. 12
  
  Pages: 384-389
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] Investigation of individual micrometer-size Kosa particle with on-site combination of electron microscope and synchrotron X-ray microscope2005
- Author(s)
  Y.Tanaka, Y.Taniguchi, D.Tanaka, M.Toyoda, H.Ishii, T.Tanabe, Y.Terada, S.Hayakawa, J.Kawai
- Journal Title
  
  Anal.Sci. 21
  
  Pages: 839-843
- NAID
  10016579472
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] Black-body approximation to the continuous X-ray spectra2005
- Author(s)
  J.Kawai, H.Ishii
- Journal Title
  
  Spectrochim.Acta, Part B 60
  
  Pages: 1586-1591
- Data Source
  KAKENHI-PROJECT-17655032
[Journal Article] マルチエネルギー強力X線光源強度の加速電圧依存性とその経時変化2005
- Author(s)
  石井秀司
- Journal Title
  
  X線分析の進歩 36
  
  Pages: 293-301
- NAID
  40006919967
- Data Source
  KAKENHI-PROJECT-15750064
[Journal Article] Effective charge on silicon atom in metal silicides, Mg_2Si and CaSi2005
- Author(s)
  Hideshi ISHII
- Journal Title
  
  Phys.Rev. B71
- Data Source
  KAKENHI-PROJECT-17550079
[Journal Article] 乾電池X線発生装置による環境標準試料の蛍光X線分析2005
- Author(s)
  石井秀司
- Journal Title
  
  X線分析の進歩 36,
  
  Pages: 225-234
- Data Source
  KAKENHI-PROJECT-17550079
[Journal Article] X-ray Absorption Spectrum Analysis with a 9V Battery X-ray Generator2005
- Author(s)
  Hideshi ISHII
- Journal Title
  
  Anal.Sci. 21
  
  Pages: 783-784
- Data Source
  KAKENHI-PROJECT-17550079
[Presentation] Study of local structure and optical properties of luminescent YBO_3:Eu^<3+> by using X-ray absorption fine structure spectroscopy2010
- Author(s)
  A.Nishimura
- Organizer
  The 2010 International Chemical Congress of Pacific Basin Societies
- Place of Presentation
  Honolulu(USA)
- Year and Date
  2010-12-18
- Data Source
  KAKENHI-PROJECT-20550088
[Presentation] 立命館大学SRセンターUltra Soft XASビームラインの高度化とXAFS測定2010
- Author(s)
  石井秀司
- Organizer
  第13回XAFS討論会
- Place of Presentation
  立命館大学(滋賀)
- Year and Date
  2010-09-04
- Data Source
  KAKENHI-PROJECT-20550088
[Presentation] 立命館大学SRセンターUltra Soft XASビームラインの高度化とXAFS測定2010
- Author(s)
  石井秀司
- Organizer
  第13回XAFS討論会
- Place of Presentation
  立命館大学(滋賀県)
- Year and Date
  2010-09-04
- Data Source
  KAKENHI-PROJECT-20550088
[Presentation] Study of local structure and optical properties of luminescent YBO_3 : Eu^<3+> by using X-ray absorption fine structure spectroscopy2010
- Author(s)
  A.Nishimura
- Organizer
  The 2010 International Chemical Congress of Pacific Basin Societies
- Place of Presentation
  Honolulu, USA
- Year and Date
  2010-12-17
- Data Source
  KAKENHI-PROJECT-20550088

1. NIHEI Yoshimasa (10011016)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
2. WATANABE IWAO (50028239)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. KOJIMA Kazuo (30131311)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
4. OWARI Masanori (70160950)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
5. SAKAMOTO Tetsuo (20313067)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
6. 河合潤 (60191996)

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results
7. 丸山隆浩

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
8. 成塚重弥

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

ISHI Hideshi 石井 秀司

ISHII Hideshi 石井 秀司

Research Projects

Research Products

Co-Researchers

リチウムから炭素の軽元素の大気圧XAFS測定分析手法の開発Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of analytical spectroscopy using super-soft X-ray

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

高分解能蛍光X線およびX線光電子分光による金属シリサイドの電子状態分析Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

走査型電子顕微鏡を用いたX線CTによるナノ粒子断面イメージング法の開発

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

高エネルギーX線光電子回折による埋もれた界面のリアルタイム構造評価法の開発Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

X線光電子回折によるマイクロ領域のリアルタイム表面構造評価法の開発Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

X線光電子回折法を用いた収束イオンビーム加工断面の表層領域損傷評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Development of nano-scale three-dimensional analytical apparatus for industrial material using an ultra fine focused ion beam

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Real tine characterization and control of growing interface structures of thin films

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

Structural analysis of interface reactions in thin films by photoelectron diffractionPrincipal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

高角度分解光電子回折のオンライン解析システムに関する研究Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

[Journal Article] Charge compensation mechanisms in Li_<1.16>Ni_<0.15>Co_<0.19>Mn_<0.50>O_2 positive electrode material for Li-ion batteries analyzed by a combination of hard and soft X-ray absorption near edge structure2013

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Partial Fluorescence Yield XAFS Measurements in Lower Soft X-Ray Region by Using Large-Caliber Silicon Drift Detector2012

Author(s)

Journal Title

NAID

ISHI Hideshi 石井秀司

ISHII Hideshi 石井秀司