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HIBINO Michio  日比野 倫夫

ORCIDConnect your ORCID iD *help
Researcher Number 40023139
Other IDs
External Links
Affiliation (based on the past Project Information) *help 1996: Nagoya University, Center for Integrated Research in Science and Engineering, Pr
1995 – 1996: 名古屋大学, 理工科学総合研究センター, 教授
1995: Nagoya University, Center for Integrated Research in Science and Engineering, Pr, 理工科学総合研究所センター, 教授
1986 – 1994: 名古屋大学, 工学部, 教授
1986: 名大, 工学部, 教授
Review Section/Research Field
Principal Investigator
電子機器工学 / 物理計測・光学 / Applied optics/Quantum optical engineering
Except Principal Investigator
電子デバイス・機器工学 / 物理計測・光学 / Applied physics, general / 広領域
Keywords
Principal Investigator
走査透過電子顕微鏡 / ノイズ除去 / SN比 / YAG / 電子プローブ / 薄膜レンズ / 球面収差補正 / Noise elimination / Specific contrast / Electron signal manipulation … More / Digital processing system / Inelastically scattered electron / Elastically scattered electron / Scanning transmission electron microscopy / 量子検出効率 / 非弾性散乱 / 弾性散乱 / デコンボリュ-ション処理 / 特殊コントラスト / 電子信号間演算 / ディジタル処理システム / 非弾性散乱電子 / 弾性散乱電子 / Image processing / Manipulation among signal electrons / Signal electron detection / Specimen damage / High resolution observation / Field emission electron gun / High voltage STEM / 信号演算処理 / 信号間演算処理 / YAG単結晶シンチレータ / 像のSN比 / 信号電子演算 / 高解像度電子顕微鏡観察 / 画像処理 / 信号電子間演算 / 信号電子検出法 / 試料損傷 / 高解像度観察 / 電界放出電子銃 / 超高圧走査透過電子顕微鏡 / Recolution / Scanning Transmission Election Microscopy (STEM) / Electron Probe / Foil Lend / Correction / Shperical aberration / Electron lens / 分解能 / 走査透過電子顕微鏡(STEM) / 収差補正 / 球面収差 / 電子レンズ / lens coupling system / glass hemisphere / high efficient scintillator / TV-system / high voltage electron microscope / 高効率シンチ-タ / 電子顕微鏡 / レンズカップリング / 半球ガラス / 高効率シンチレータ / TVシステム / 超高圧電子顕微鏡 / foil lens / spherical aberration correction / detective quantum efficiency (DQE) / scanning transmission electron microscopy (STEM) / electron energy loss spectroscopy (EELS) / elemental mapping / 走査透過電子顕微鏡法 / 電子エネルギー損失分光法 / 元素マッピング像 / 検出量子効率 / パラレル電子エネルギー損失分光法 / 元素マッピング … More
Except Principal Investigator
電子レンズ / Quantum Noise / Scanning Transmission Electron Microscopy / 球面収差補正 / 量子ノイズ / 走査透過電子顕微鏡 / 薄膜レンズ / 収差補正 / 球面収差 / 磁界重畳型電子銃 / 減速レンズ / 加速レンズ / 電子銃 / 電界放出電子銃 / 低加速電子銃 / 信号演算処理 / Decelerating Lens / Accelerating Lens / Magnetic-Field-Superimposed Electron Gun / Field Emission Gun / Loe Voltage Electron Gun / Electron Gum / 超高真空 / Electron Microscopy / Image Restoration / Maximum Entropy Method / 弱位相物体 / 電子顕微鏡 / 画像修復 / 最大エントロピー法 / electron lens / foil lens / spherical aberration correction / transmission electron microscopy / 球面収差測定法 / 透過電子顕微鏡 / Electron Probe / Shadow Image / Foil Lens / Aberration Correction / Spherical Aberration / 統計ノイズ / 非回転対称収差 / プローブフォーミングレンズ / 電子プローブ / 陰影像 / Stereoscopic observation / High resolution electron microscopy / radiation damage / in-situ experiment / High voltage electron microscope / 格子欠陥 / 反射電顕法 / 照射損傷 / 立体観察 / 高分解能 / 〓射電顕 / ステレオ観察 / 高分解能電顕 / 放射損傷 / その場観察 / 超高圧電顕 / 静電レンズ / 磁界放畳型電子銃 / 元素分布像 / STEM / 電位コントラスト / 電子ビームテスティング / 低加速SEM Less
  • Research Projects

    (11 results)
  • Co-Researchers

    (15 People)
  •  Fundamental Study on a High Brightness and High Resolution YAG Screen for Electron MicroscopyPrincipal Investigator

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied optics/Quantum optical engineering
    • Research Institution
      Nagoya University
  •  Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1995 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Nagoya University
  •  Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1993 – 1995
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      電子デバイス・機器工学
    • Research Institution
      Nagoya University
  •  Fundamental study on spherical aberration correction of the objective lens of an electron microscope using a foil lens

    • Principal Investigator
      HANAI Takaaki
    • Project Period (FY)
      1993 – 1994
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Applied physics, general
    • Research Institution
      Nagoya University
  •  Observation of high resolution elemental mapping images using a high sensitivity detectorPrincipal Investigator

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  磁界重畳型電界放出電子銃の装備による超低加速電子線プローブ応用装置の超高性能化

    • Principal Investigator
      SHIMOYAMA Hiroshi
    • Project Period (FY)
      1991 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      物理計測・光学
    • Research Institution
      Meijo University
      Nagoya University
  •  Development of fundamental technique on high resolution electron microscopy and its applications

    • Principal Investigator
      MIHAMA Kazuhiro
    • Project Period (FY)
      1989 – 1991
    • Research Category
      Grant-in-Aid for Co-operative Research (A)
    • Research Field
      広領域
    • Research Institution
      Daido Institute of Technology
      Nagoya University
  •  On line digital manipulation process of elastically and inelastically scattered electron signals in scanning transmission electron microscopyPrincipal Investigator

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1988 – 1989
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      電子機器工学
    • Research Institution
      Nagoya University
  •  Research on High Resolution Electron Microscope Observations without Specimen DamagePrincipal Investigator

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1987 – 1989
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  Developmental Research on the Magnetic-Field-Superimposed Field Emission Gum for Low Accelerating Voltage

    • Principal Investigator
      MARUSE Susumu
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      物理計測・光学
    • Research Institution
      Nagoya University
  •  Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil LensPrincipal Investigator

    • Principal Investigator
      HIBINO Michio
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      電子機器工学
    • Research Institution
      Nagoya University
  • 1.  HANAI Takaaki (00156366)
    # of Collaborated Projects: 10 results
    # of Collaborated Products: 0 results
  • 2.  SHIMOYAMA Hiroshi (30023261)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 0 results
  • 3.  SUGIYAMA Setuko (00115586)
    # of Collaborated Projects: 5 results
    # of Collaborated Products: 0 results
  • 4.  TANAKA Shigeyasu (70217032)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 5.  UCHIKAWA Yoshiki (20023260)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 6.  KIMURA Keiko (60262862)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 7.  MARUSE Susumu (20022981)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 8.  大江 俊美 (30076632)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 9.  池田 晋 (20076623)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 10.  MIHAMA Kazuhiro (50023007)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 11.  HIRAGA Kenji (30005912)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 12.  URA Katsumi (10028938)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  渡辺 伝次郎 (50004239)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 14.  藤田 広志 (30028930)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 15.  TANJI Takayoshi (90125609)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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