Ueda Osamu 上田修

… Alternative Names

UEDA Osamu 上田修

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Researcher Number	50418076
Other IDs
Affiliation (Current)	2025: 明治大学, 研究・知財戦略機構(生田), 研究推進員(客員研究員)
Affiliation (based on the past Project Information) *help	2020 – 2024: 明治大学, 研究・知財戦略機構(生田), 研究推進員(客員研究員) 2019: 明治大学, 研究・知財戦略機構(生田), 客員教授 2019: 明治大学, 研究・知財戦略機構, 客員教授 2016 – 2018: 金沢工業大学, 工学研究科, 教授 2014 – 2015: 金沢工業大学, 工学(系)研究科(研究院), 教授 2012: 金沢工業大学, 工学(系)研究科(研究院), 教授 2010 – 2012: 金沢工業大学, 工学研究科, 教授
Review Section/Research Field	Principal Investigator Basic Section 30010:Crystal engineering-related / Crystal engineering / Applied materials science/Crystal engineering Except Principal Investigator Basic Section 21050:Electric and electronic materials-related
Keywords	Principal Investigator 電子顕微鏡 / 結晶欠陥 / 析出物 / 混晶半導体 / 欠陥 / 転位 / 格子欠陥 / 結晶成長 / 劣化 / 相分離 … More / ミストCVD / κ-Ga2O3 / Bi系半導体混晶 / Bi系混晶半導体 / 凝集体 / TEM / 欠陥評価 / THz波受送信素子 / 低温成長 / MBE / Ｂi系混晶半導体 / テラヘルツ素子 / 結晶評価 / 透過電子顕微鏡 / GaAsBi / InGaAs / アンテナ / 光伝導 / テラヘルツ波 / フォトルミネッセンス / 点欠陥 / 光照射 / 希釈窒化物半導体 / 長寿命化 / 信頼性 / 量子ドット / 発光デバイス … More Except Principal Investigator 高移動度トランジスタ / ミストCVD法 / 結晶成長 / 混晶 / ミストCVD / 単一ドメイン / 強誘電体 / 酸化ガリウム / 単結晶 / 高電子移動度トランジスタ / ε相酸化ガリウム Less

Characterization and control of defects, phase separation, and compositional fluctuation in kappa-(InxGa1-x)2O3 mixed crystals for novel electron devicesPrincipal Investigator
- Principal Investigator
  
  上田修
- Project Period (FY)
  2024 – 2026
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 30010:Crystal engineering-related
- Research Institution
  Meiji University
Research of ultra-low power switching devices based on ferroelectric kappa-Ga2O3
- Principal Investigator
  
  西中浩之
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Kyoto Institute of Technology
Characterization and control of defects in low-temperature-grown Bi-based compound semiconductors for novel terahertz wave emitters and detectorsPrincipal Investigator
- Principal Investigator
  
  Ueda Osamu
- Project Period (FY)
  2021 – 2023
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 30010:Crystal engineering-related
- Research Institution
  Meiji University
Research on Polarization-Controlled Ultra-Wide Bandgap Semiconductor Devices
- Principal Investigator
  
  Nishinaka Hiroyuki
- Project Period (FY)
  2019 – 2021
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Review Section
  
  Basic Section 21050:Electric and electronic materials-related
- Research Institution
  Kyoto Institute of Technology
Evaluation and control of defects in LTG GaAs-related alloy semiconductors for photoconductive antenna of THz wave excited by near infra-red lightPrincipal Investigator
- Principal Investigator
  
  Ueda Osamu
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Crystal engineering
- Research Institution
  Meiji University
  Kanazawa Institute of Technology
Study on the Behavior of Defects in Dilute Nitride Semiconductors and Improvement of Device ReliabilityPrincipal Investigator
- Principal Investigator
  
  Ueda Osamu
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Crystal engineering
- Research Institution
  Kanazawa Institute of Technology
Study of Optical Irradiation on Nobel Materials and Quantum DotStructures for Next Generation Optical DevicesPrincipal Investigator
- Principal Investigator
  
  UEDA Osamu
- Project Period (FY)
  2010 – 2012
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Kanazawa Institute of Technology

[Book] Reloability of Semiconductor Lasers and Optoelectronic Devices2021
- Author(s)
  Robert W. Herrick and Osamu Ueda (eds.)
- Total Pages
  318
- Publisher
  Elsevier Ltd.
- ISBN
  9780128192542
- Data Source
  KAKENHI-PROJECT-21K04910
[Book] 半導体デバイスの不良・故障解析技術2019
- Author(s)
  二川清、上田修、山本秀和
- Total Pages
  218
- Publisher
  株式会社日科技連出版社
- ISBN
  9784817196859
- Data Source
  KAKENHI-PROJECT-17K05044
[Book] 新版　信頼性ハンドブック2014
- Author(s)
  眞田　克、弓削哲史、横川慎二、松尾陽太郎、山本繁晴、青木雄一、田中浩和、伊藤貞則、岩谷康次郎、二川　清、上田　修、他
- Total Pages
  944
- Publisher
  株式会社日科技連出版社
- Data Source
  KAKENHI-PROJECT-26390057
[Book] 2013化合物半導体技術大全第2編第9章第2節、信頼性試験・劣化解析2013
- Author(s)
  上田修
- Publisher
  株式会社電子ジャーナル
- Data Source
  KAKENHI-PROJECT-22560012
[Book] 2013化合物半導体技術大全第2編第9章第2節信頼性試験・劣化解析2013
- Author(s)
  上田　修
- Publisher
  株式会社電子ジャーナル
- Data Source
  KAKENHI-PROJECT-22560012
[Book] Materials and Reliability Handbook for Semiconductor Optical and Electron Devices, Chapter 2 Failure Analysis of Semiconductor Optical Devices2012
- Author(s)
  Osamu Ueda
- Publisher
  Springer
- Data Source
  KAKENHI-PROJECT-22560012
[Book] Springer, Materials and Reliability Handbook for Semiconductor Opticaland Electron Devices Chapter 22012
- Author(s)
  Osamu Ueda and Robert W. Herrick
- Publisher
  Failure Analysis of Semiconductor Optical Devices
- Data Source
  KAKENHI-PROJECT-22560012
[Book] Springer, Materials andReliability Handbook for Semi- conductor Optical and Electron Devices Chapter 42012
- Author(s)
  Osamu Ueda
- Publisher
  Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
- Data Source
  KAKENHI-PROJECT-22560012
[Book] Materials and Reliability Handbook for Semiconductor Optical and Electron Devices, Chapter 4 Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation2012
- Author(s)
  Osamu Ueda
- Publisher
  Springer
- Data Source
  KAKENHI-PROJECT-22560012
[Book] 機器分析のための試料のサンプリング・前処理ノウハウ集2011
- Author(s)
  上田修(共著)
- Total Pages
  324
- Publisher
  株式会社技術情報協会
- Data Source
  KAKENHI-PROJECT-22560012
[Book] 機器分析のための試料のサンプリング・前処理ノウハウ集第6章第5節TEM 観察での試料前処理2011
- Author(s)
  上田修
- Publisher
  株式会社技術情報協会
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] Structural evaluation of GaAs1-xBix obtained by solid-phase epitaxial growth of amorphous GaAs1-xBix thin films deposited on (001) GaAs substrates2023
- Author(s)
  Osamu Ueda, Noriaki Ikenaga, Yukihiro Horita, Yuto Takagaki, Fumitaka Nishiyama, Mitsuki Yukimune, Fumitaro Ishikawa, Yoriko Tominaga
- Journal Title
  
  Journal of Crystal Growth
  
  Volume: 601 Pages: 126945-126945
- DOI
  10.1016/j.jcrysgro.2022.126945
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21K04910, KAKENHI-PROJECT-21KK0068, KAKENHI-PUBLICLY-21H05566, KAKENHI-PROJECT-19H00855, KAKENHI-PROJECT-21H01829
[Journal Article] TEM characterization of defects in κ-(InxGa1-x)2O3 thin film grown on (001) FZ-grown ε-GaFeO3 substrate by mist CVD2023
- Author(s)
  Ueda Osamu、Nishinaka Hiroyuki、Ikenaga Noriaki、Hasuike Noriyuki、Yoshimoto Masahiro
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 62 Issue: 12 Pages: 125501-125501
- DOI
  10.35848/1347-4065/ad07fb
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23K22797
[Journal Article] Growth of indium-incorporated κ-Ga2O3 thin film lattice-matched to the ε-GaFeO3 substrate2022
- Author(s)
  Nishinaka Hiroyuki、Ueda Osamu、Ikenaga Noriaki、Hasuike Noriyuki、Yoshimoto Masahiro
- Journal Title
  
  Materials Letters: X
  
  Volume: 14 Pages: 100149-100149
- DOI
  10.1016/j.mlblux.2022.100149
- Peer Reviewed / Open Access
- Data Source
  KAKENHI-PROJECT-23K22797
[Journal Article] Plan-view TEM observation of a single-domain κ-Ga2O3 thin film grown on ε-GaFeO3 substrate using GaCl3 precursor by mist chemical vapor deposition2021
- Author(s)
  Nishinaka Hiroyuki、Ueda Osamu、Ito Yusuke、Ikenaga Noriaki、Hasuike Noriyuki、Yoshimoto Masahiro
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 61 Issue: 1 Pages: 018002-018002
- DOI
  10.35848/1347-4065/ac3e17
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-19H02170
[Journal Article] Crystalline quality of low-temperature-grown InxGa1-xAs coherently grown on InP(001) substrate2020
- Author(s)
  Yoriko Tominaga, Shingo Hirose, Kentaro Hirayama, Hitoshi Morioka, Noriaki Ikenaga, and Osamu Ueda
- Journal Title
  
  Journal of Crystal Growth
  
  Volume: - Pages: 125703-125703
- DOI
  10.1016/j.jcrysgro.2020.125703
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17K05044, KAKENHI-PROJECT-18K14140, KAKENHI-PUBLICLY-19H04548
[Journal Article] Single-Domain and Atomically Flat Surface of κ-Ga2O3 Thin Films on FZ-Grown ε-GaFeO3 Substrates via Step-Flow Growth Mode2020
- Author(s)
 Nishinaka Hiroyuki、Ueda Osamu、Tahara Daisuke、Ito Yusuke、Ikenaga Noriaki、Hasuike Noriyuki、Yoshimoto Masahiro
- Journal Title
 
 ACS Omega
 
 Volume: 5 Issue: 45 Pages: 29585-29592
- DOI
 10.1021/acsomega.0c04634
- Peer Reviewed / Open Access
- Data Source
 KAKENHI-PROJECT-19H02170
[Journal Article] β-Ga2O3結晶中の欠陥のTEMによる評価2017
- Author(s)
  上田修
- Journal Title
  
  日本結晶成長学会誌
  
  Volume: 44
- NAID
  130006327989
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17K05044
[Journal Article] Electrical properties of Schottky barrier diodes fabricated on (001) β-Ga2O3 substrates with crystal defects2017
- Author(s)
  Oshima Takayoshi、Hashiguchi Akihiro、Moribayashi Tomoya、Koshi Kimiyoshi、Sasaki Kohei、Kuramata Akito、Ueda Osamu、Oishi Toshiyuki、Kasu Makoto
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 56 Issue: 8 Pages: 086501-086501
- DOI
  10.7567/jjap.56.086501
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17K05044, KAKENHI-PROJECT-16K13673
[Journal Article] Observation of nanometer-sized crystalline grooves in as-grown β-Ga2O3 single crystals2016
- Author(s)
  K. Hanada, T. Moribayashi, T. Uematsu, S. Masuya, K. Koshi, K. Sasaki, A. Kuramata, O. Ueda, and M. Kasu.
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 55 Issue: 3 Pages: 030303-030303
- DOI
  10.7567/jjap.55.030303
- NAID
  210000146118
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26390057, KAKENHI-PROJECT-15H03977
[Journal Article] Relationship between crystal defects and leakage current in β-Ga2O3 Schottky barrier diodes2016
- Author(s)
  M. Kasu, K. Hanada, T. Moribayashi, A. Hashiguchi, T. Oshima, T. Oishi, K. Koshi, K. Sasaki, A. Kuramata, and O. Ueda
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 55 Issue: 12 Pages: 1202BB-1202BB
- DOI
  10.7567/jjap.55.1202bb
- NAID
  210000147271
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15H03977, KAKENHI-PROJECT-26390057
[Journal Article] Structural evaluation of defects in beta-Ga2O3 single crystals grown by edge-defined film-fed growth process2016
- Author(s)
  O. Ueda N. Ikenaga, K. Koshi, K. Iizuka, A. Kuramata, K. Hanada, T. Moribayashi, S. Yamakoshi, and M. Kasu
- Journal Title
  
  Japanese Journal of Applied Physics
  
  Volume: 55 Issue: 12 Pages: 1202BD-1202BD
- DOI
  10.7567/jjap.55.1202bd
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PROJECT-15H03977, KAKENHI-PROJECT-26390057
[Journal Article] Effect of thermal annealing on the crystallization of low-temperature-grown In0.42Ga0.58As on InP substrate2016
- Author(s)
  Y. Tominaga, Y. Kadoya, H. Morioka, and O. Ueda
- Journal Title
  
  Jpn. J. Appl. Phys.
  
  Volume: 55 Issue: 11 Pages: 110313-110313
- DOI
  10.7567/jjap.55.110313
- NAID
  210000147219
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26390057
[Journal Article] Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon2015
- Author(s)
  A. Y. Liu, R. W. Herrick, O. Ueda, P. M. Petroff, A. C. Gossard, and J. E. Bowers
- Journal Title
  
  IEEE Journal of Selected Topics in Quantum Electronics
  
  Volume: 21 Issue: 6 Pages: 1-8
- DOI
  10.1109/jstqe.2015.2418226
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26390057
[Journal Article] 信頼性と人材育成-発光デバイスの例-(招待論文)2013
- Author(s)
  上田修
- Journal Title
  
  日本信頼性学会誌
  
  Volume: 35 Pages: 89-97
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] 半導体発光デバイスの劣化解析と劣化抑制2013
- Author(s)
  上田　修
- Journal Title
  
  IEICE Fundamentals Review
  
  Volume: Vol. 4 Pages: 294-304
- NAID
  130004554749
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] 信頼性と人材育成－発光デバイスの例－2013
- Author(s)
  上田　修
- Journal Title
  
  日本信頼性学会誌
  
  Volume: Vol. 35 Pages: 89-97
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] 半導体発光デバイスの劣化解析と劣化抑制(招待論文)2013
- Author(s)
  上田修
- Journal Title
  
  IEICEFundamentals Review
  
  Volume: 4 Pages: 294-304
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] Structural evaluation of GaAs_<1-x>Bi_<x> mixed crystals by TEM2011
- Author(s)
 Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, Kunishige Oe
- Journal Title
 
 Extended Abstract of International Conference on InP and Related Material (IPRM 2011)
 
 Volume: IPRM 2011 Pages: 248-251
- Peer Reviewed
- Data Source
 KAKENHI-PROJECT-22560012
[Journal Article] TEM evaluation of MBE-grown GaAs_<1-x>Bi_<x> crystals2011
- Author(s)
 Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, Kunishige Oe
- Journal Title
 
 Extended Abstract of 30^<th> Electronic Materials Symposium (EMS-30)
 
 Volume: EMS-30 Pages: 155-156
- Peer Reviewed
- Data Source
 KAKENHI-PROJECT-22560012
[Journal Article] TEM observation of MBE-grown GaAs1-xBix crystals2011
- Author(s)
  Osamu Ueda, Yoriko Tominaga, NoriakiIkenaga, Masahiro Yoshimoto, and Kunishige Oe
- Journal Title
  
  Extended Abstract of 30th Electronic Materials Symposium
  
  Volume: EMS-30 Pages: 155-156
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] Structural evaluationof GaAs1-xBix mixed crystals by TEM, Extended Abstract of International2011
- Author(s)
  Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, and Kunishige Oe
- Journal Title
  
  Conference on InP and Related Materials (IPRM2011)
  
  Volume: IPRM2011 Pages: 248-251
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] A Review of Materials Issues and Degradation of III-V Compound Semiconductors and Optical Devices2010
- Author(s)
  Osamu Ueda
- Journal Title
  
  ECS Trans.
  
  Volume: 33 Pages: 73-92
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] A review of materials issues and degradation of III-Vcompound semiconductors and optical devices2010
- Author(s)
  Osamu Ueda
- Journal Title
  
  ECS Trans
  
  Volume: 33 Pages: 73-92
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] On Degradation Studies of III-V Compound Semiconductor Optical Devices over Three Decades : Focusing Gradual Degradation2010
- Author(s)
  Osamu Ueda
- Journal Title
  
  Japan.J.Appl.Phys.
  
  Volume: 49 Pages: 90001-90008
- NAID
  210000069140
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Journal Article] On degradation studies of III-V compound semiconductor optical devices over three decades: focusingon gradual degradation2010
- Author(s)
  Osamu Ueda
- Journal Title
  
  Jpn. J. Appl. Phys
  
  Volume: 49 Pages: 90001-90008
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] THz波発生検出素子応用に向けた低温成長Bi系半導体の結晶欠陥制御2024
- Author(s)
  富永依里子、石川史太郎、池永訓昭、上田修
- Organizer
  レーザー学会学術講演会第44回年次大会
- Invited
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] 低温MBE成長GaAsBi層の光電評価2023
- Author(s)
  梅田皆友、今林弘毅、塩島謙次、梅西達哉、富永依里子、行宗詳規、石川史太郎、上田修
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] 低温MBE成長GaAsBi層の光電評価2023
- Author(s)
  今林弘毅、梅田皆友、塩島謙次、梅西達哉、富永依里子、行宗詳規、石川史太郎、上田修
- Organizer
  第42回電子材料シンポジウム
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] (001) FZ成長ε-GaFeO3基板上にミストCVD成長したκ-(InxGa1-x)2O3薄膜中の欠陥のTEM評価2023
- Author(s)
  上田修, 西中浩之，池永訓昭, 蓮池紀幸，吉本昌広
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-23K22797
[Presentation] ミストCVD法による(001) β-Ga2O3薄膜のホモエピタキシャル成長2023
- Author(s)
  上田遼, 西中浩之，永岡達司, 三宅裕樹，吉本昌広
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-23K22797
[Presentation] (001)GaAs基板上のGaAs1-xBix薄膜の構造評価(1)熱処理した低温成長GaAs1-xBix薄膜中の欠陥のTEM評価2023
- Author(s)
  上田修、池永訓昭、堀田行紘、高垣佑斗、西山文隆、行宗詳規、石川史太郎、富永依里子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] (001)GaAs基板上のGaAs1-xBix薄膜の構造評価(2)固相成長したGaAs1-xBix薄膜中の欠陥のTEM評価2023
- Author(s)
  上田修、池永訓昭、堀田行紘、高垣佑斗、西山文隆、行宗詳規、石川史太郎、富永依里子
- Organizer
  第70回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] Internal Photoemission Characterization for Low-Temperature-Grown GaAsBi Layers2022
- Author(s)
  Hiroki Imabayashi, Minato Umeda, Kenji Shiojima, Tatsuya Umenishi, Yoriko Tominaga, Mitsuki Yukimune, Fumitaro Ishikawa, Osamu Ueda
- Organizer
  Advanced Metallization Conference 2022 31st Asian Session (ADMETA Plus 2022)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] Single-domain κ-Ga2O3 thin films grown on ε-GaFeO3 substrates by mist CVD2022
- Author(s)
  H. Nishinaka, O. Ueda, N. Ikenaga, N. Hasuike, and M. Yoshimoto
- Organizer
  The 4th International Workshop on Gallium Oxide and Related Materials
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22797
[Presentation] ε-GaFeO3基板を用いた単一ドメインκ-Ga2O3の成長2022
- Author(s)
  西中浩之, 上田修, 迫秀樹,　池永訓昭, 宮戸祐治, 蓮池紀幸, 鐘ケ江一孝, 吉本昌広
- Organizer
  第83回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-23K22797
[Presentation] 結晶欠陥評価およびデバイスへの影響2022
- Author(s)
  上田　修
- Organizer
  日本材料学会半導体エレクトロニクス部門セミナー
- Invited
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] TEM characterization of defects in κ-(Ga1-xInx)2O3 thin film grown on (001) FZ-grown ε-GaFeO3 substrate by Mist CVD2022
- Author(s)
  O. Ueda, H. Nishinaka, N. Ikenaga, N. Hasuike, and M. Yoshimoto
- Organizer
  The 4th International Workshop on Gallium Oxide and Related Materials
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-23K22797
[Presentation] 50余年にわたるIII-V族化合物半導体発光デバイスの材料（欠陥）評価と信頼性解析のあゆみ2021
- Author(s)
  上田　修
- Organizer
  日本学術振興会R025委員会2021年度フォーラム
- Invited
- Data Source
  KAKENHI-PROJECT-21K04910
[Presentation] Current Status of Characterization of Defects in EFG-grown β-Ga2O3 Single Crystals2019
- Author(s)
  Osamu Ueda, Akito Kuramata, Hirotaka Yamaguchi, and Makoto Kasu
- Organizer
  18th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] シンクロトロンＸ線トポグラフィーによる垂直ブリッジマン成長β-Ga2O3単結晶の欠陥の観察2019
- Author(s)
  桝谷聡士、佐々木公平、倉又朗人、小林拓実、干川圭吾、上田修、嘉数誠
- Organizer
  応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] 固相成長したInGaAsの結晶性評価2019
- Author(s)
  堀田行紘，平山賢太郎，富永依里子，池永訓昭，上田修
- Organizer
  第11回ナノ構造・エピタキシャル成長講演会
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] Structural evaluation of β-Ga2O3 single crystals by TEM and related techniques2019
- Author(s)
  Osamu Ueda, Akito Kuramata, Hirotaka Yamaguchi, and Makoto Kasu
- Organizer
  Materials Research Meeting 2019
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] InxGa1-xAsの固相エピタキシャル成長2018
- Author(s)
  堀田行紘、平山賢太郎、富永依里子、森岡仁、池永訓昭、上田修
- Organizer
  第37回電子材料シンポジウム
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] Solid-phase epitaxial growth of InxGa1-xAs on InP substrate2018
- Author(s)
  Yukihiro Horita, Kentaro Hirayama, Yorko Tominaga, Hitoshi Morioka, Noriaki Ikenaga, and Osamu Ueda
- Organizer
  International Conference on Solid State Devices and Materials 2018 (SSDM 2018)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] Gradual Degradation in III‐V and GaN‐Related Optical Devices2017
- Author(s)
  Osamu Ueda
- Organizer
  17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-17)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] 固相成長させたInxGa1-xAs内の欠陥の評価2017
- Author(s)
  平山賢太郎、富永依里子、角屋豊、森岡仁、池永訓昭、上田修
- Organizer
  第36回電子材料シンポジウム
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] EFG成長したβ-Ga2O3結晶中の欠陥のTEMを中心とした評価2017
- Author(s)
  上田修、池永訓昭
- Organizer
  日本学術振興会第161委員会第98回研究会
- Place of Presentation
  長浜ロイヤルホテル（滋賀県・長浜市）
- Year and Date
  2017-01-13
- Invited
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] InP基板上低温成長InxGa1-xAsの結晶性2017
- Author(s)
  富永依里子、廣瀬伸悟、角屋豊、森岡仁、池永訓昭、上田修
- Organizer
  第78回応用物理学会秋季学術講演会2017
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] Gradual degradation in III-V and GaN-related optical devices2017
- Author(s)
  O. Ueda
- Organizer
  Intensive Discussion on Growth of Nitride Semiconductors
- Place of Presentation
  東北大学金属材料研究所（宮城県・仙台市）
- Year and Date
  2017-01-17
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] Nano-Level Analytical and Evaluation Techniques Essential to the Development of ULSI and Nano-devices2017
- Author(s)
  Osamu Ueda
- Organizer
  The 6th International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EMNANO-2017)
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17K05044
[Presentation] レーザ照射によるGaInNAs半導体の発光効率への影響2016
- Author(s)
  米倉成一、高宮健吾、八木修平、上田修、矢口裕之
- Organizer
  第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ（新潟県・新潟市）
- Year and Date
  2016-09-15
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] InGaN/GaN単一量子井戸構造の光照射による劣化2016
- Author(s)
  上田修、山口敦史、谷本瞬平、西堀翔宣、熊倉一英、山本秀樹
- Organizer
  第35回電子材料シンポジウム
- Place of Presentation
  ラフォーレ琵琶湖（滋賀県・守山市）
- Year and Date
  2016-07-07
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] Growth temperature dependence of crystalline state of low-temperature-grown InGaAs on InP substrates2015
- Author(s)
  Y. Tominaga, Y. Kadoya, H. Morioka, and O. Ueda
- Organizer
  EMN 3CG 2015
- Place of Presentation
  Hong Kong(China)
- Year and Date
  2015-12-16
- Invited / Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] Degradation of InGaN/GaN SQW Structure under Optical Irradiation2014
- Author(s)
  O. Ueda, A. A. Yamaguchi, S. Tanimoto, S. Nishibori, K. Kumakura, and H. Yamamoto
- Organizer
  International Workshop on Nitride Semiconductors IWN 2014
- Place of Presentation
  Wroclaw (Poland)
- Year and Date
  2014-08-27
- Data Source
  KAKENHI-PROJECT-26390057
[Presentation] 半導体発光デバイスの信頼性研究～総論と 1990 年代の1990年代のトピックス～2012
- Author(s)
  上田修
- Organizer
  電子情報通信学会信頼性研究会
- Place of Presentation
  仙台市、東北大学電気通信研究所
- Year and Date
  2012-08-23
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体発光デバイスの再結合欠陥反応による劣化2012
- Author(s)
  上田修
- Organizer
  日本物理学会第22回格子欠陥フォーラム
- Place of Presentation
  神奈川県三浦市、マホロバ・マインズ三浦
- Year and Date
  2012-09-21
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体とひずみ2012
- Author(s)
  上田修
- Organizer
  第59回応用物理学関係連合講演会シンポジウム「ナノひずみエレクトロニクス～半導体ナノひずみの新規デバイス応用と高分解能測定～」
- Place of Presentation
  東京、早稲田大学(招待講演)
- Year and Date
  2012-03-15
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体とひずみ2012
- Author(s)
  上田修
- Organizer
  第59回応用物理学関係連合講演会シンポジウム「ナノひずみエレクトロニクス～半導体ナノひずみの新規デバイス応用と高分解能測定～」
- Place of Presentation
  東京、早稲田大学
- Year and Date
  2012-03-15
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 光デバイスの信頼性・劣化研究の40 年と今後の課題2012
- Author(s)
  上田修
- Organizer
  第73回応用物理学会学術研究会
- Place of Presentation
  松山市、愛媛大学
- Year and Date
  2012-09-13
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 発光デバイスの劣化研究の現状と課題2012
- Author(s)
  上田修
- Organizer
  2011年度電子情報通信学会エレクトロニクスソサイエティ大会 CI-1 光能動デバイス・装置を支える信頼性・安全性技術
- Place of Presentation
  札幌市、北海道大学
- Year and Date
  2012-09-13
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] Structural evaluation of GaAs1-xBix mixed crystals by TEM2011
- Author(s)
  Osamu Ueda, Yoriko Tominaga, NoriakiIkenaga, Masahiro Yoshimoto, andKunishige Oe
- Organizer
  International Conference on InP and Related Materials (IPRM2011)
- Place of Presentation
  Berlin、Germany
- Year and Date
  2011-05-24
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] Structural evaluation of GaAs_<1-x>Bi_<x> mixed crystals by TEM2011
- Author(s)
 Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, Kunishige Oe
- Organizer
 International Conference on InP and Related Material (IPRM 2011)
- Place of Presentation
 Berlin, Germany
- Year and Date
 2011-05-24
- Data Source
 KAKENHI-PROJECT-22560012
[Presentation] TEM evaluation of MBE-grown GaAs_<1-x>Bi_<x> crystals2011
- Author(s)
 Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, Kunishige Oe
- Organizer
 30^<th> Electronic Materials Symposium (EMS-30)
- Place of Presentation
 滋賀県守山市、ラフォーレ琵琶湖
- Year and Date
 2011-06-30
- Data Source
 KAKENHI-PROJECT-22560012
[Presentation] TEM evaluation of MBE-grown GaAs1-xBix crystals2011
- Author(s)
  Osamu Ueda, Yoriko Tominaga, Noriaki Ikenaga, Masahiro Yoshimoto, and Kunishige Oe
- Organizer
  30th Electronic Materials Symposium (EMS-30)
- Place of Presentation
  滋賀県守山市、ラフォーレ琵琶湖
- Year and Date
  2011-06-30
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 発光デバイスの劣化研究の現状と今後の課題2011
- Author(s)
  上田修
- Organizer
  2011年度電子情報通信学会エレクトロニクスソサイエティ大会CI-1光能動デバイス・装置を支える信頼性・安全性技術
- Place of Presentation
  札幌、北海道大学(招待講演)
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体発光デバイスに関する信頼性や高信頼化の課題や今後の展望2010
- Author(s)
  上田修
- Organizer
  電子情報通信学会第19回ポリマー光回路(POC)研究会
- Place of Presentation
  愛知県豊田中央研究所
- Year and Date
  2010-12-06
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体発光デバイスに関する信頼性や高信頼化の課題や今後の展望2010
- Author(s)
  上田修
- Organizer
  第19回ポリマー光回路(POC)研究会
- Place of Presentation
  愛知県、豊田中央研究所(招待講演)
- Year and Date
  2010-12-06
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 光デバイスの信頼性・劣化研究の40年と今後の課題
- Author(s)
  上田　修
- Organizer
  第73回応用物理学会学術講演会
- Place of Presentation
  愛媛大学
- Invited
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体発光デバイスの信頼性研究
- Author(s)
  上田　修
- Organizer
  電子情報通信学会信頼性研究会～総論と1990年代以降のトピックス～
- Place of Presentation
  東北大学電気通信研究所
- Invited
- Data Source
  KAKENHI-PROJECT-22560012
[Presentation] 半導体発光デバイスの再結合促進欠陥反応による劣化
- Author(s)
  上田　修
- Organizer
  日本物理学会第22回格子欠陥フォーラム
- Place of Presentation
  神奈川県三浦市マホロバ・マインズ三浦
- Invited
- Data Source
  KAKENHI-PROJECT-22560012

1. IKENAGA Noriaki (30512371)

# of Collaborated Projects: 6 results

# of Collaborated Products: 21 results
2. Nishinaka Hiroyuki (70754399)

# of Collaborated Projects: 3 results

# of Collaborated Products: 9 results
3. YAGUCHI Hiroyuki (50239737)

# of Collaborated Projects: 2 results

# of Collaborated Products: 2 results
4. 富永依里子 (40634936)

# of Collaborated Projects: 2 results

# of Collaborated Products: 13 results
5. 塩島謙次 (70432151)

# of Collaborated Projects: 2 results

# of Collaborated Products: 3 results
6. 蓮池紀幸 (40452370)

# of Collaborated Projects: 2 results

# of Collaborated Products: 8 results
7. YAMAGUCHI Atsushi (60449428)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
8. SAKUMA Yoshiki (60354346)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. GONOKAMI Makoto (70161809)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. YOSHIMOTO Masahiro (20210776)

# of Collaborated Projects: 1 results

# of Collaborated Products: 8 results
11. YAGI SHUHEI (30421415)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
12. 宮戸祐治 (80512780)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
13. KASU Makoto

# of Collaborated Projects: 0 results

# of Collaborated Products: 2 results

Ueda Osamu 上田 修

UEDA Osamu 上田 修

Research Projects

Research Products

Co-Researchers

Characterization and control of defects, phase separation, and compositional fluctuation in kappa-(InxGa1-x)2O3 mixed crystals for novel electron devicesPrincipal Investigator

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Research of ultra-low power switching devices based on ferroelectric kappa-Ga2O3

Principal Investigator

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Characterization and control of defects in low-temperature-grown Bi-based compound semiconductors for novel terahertz wave emitters and detectorsPrincipal Investigator

Principal Investigator

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Review Section

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Research on Polarization-Controlled Ultra-Wide Bandgap Semiconductor Devices

Principal Investigator

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Review Section

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Evaluation and control of defects in LTG GaAs-related alloy semiconductors for photoconductive antenna of THz wave excited by near infra-red lightPrincipal Investigator

Principal Investigator

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Research Institution

Study on the Behavior of Defects in Dilute Nitride Semiconductors and Improvement of Device ReliabilityPrincipal Investigator

Principal Investigator

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Study of Optical Irradiation on Nobel Materials and Quantum DotStructures for Next Generation Optical DevicesPrincipal Investigator

Principal Investigator

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[Book] Reloability of Semiconductor Lasers and Optoelectronic Devices2021

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[Book] 半導体デバイスの不良・故障解析技術2019

Author(s)

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[Book] 新版 信頼性ハンドブック2014

Author(s)

Total Pages

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Data Source

[Book] 2013化合物半導体技術大全第2編第9章第2節、信頼性試験・劣化解析2013

Author(s)

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Data Source

[Book] 2013化合物半導体技術大全 第2編第9章第2節 信頼性試験・劣化解析2013

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Data Source

[Book] Materials and Reliability Handbook for Semiconductor Optical and Electron Devices, Chapter 2 Failure Analysis of Semiconductor Optical Devices2012

Author(s)

Publisher

Data Source

[Book] Springer, Materials and Reliability Handbook for Semiconductor Opticaland Electron Devices Chapter 22012

Author(s)

Publisher

Data Source

Ueda Osamu 上田修

UEDA Osamu 上田修

[Book] 新版　信頼性ハンドブック2014

[Book] 2013化合物半導体技術大全第2編第9章第2節信頼性試験・劣化解析2013

[Book] 機器分析のための試料のサンプリング・前処理ノウハウ集第6章第5節TEM 観察での試料前処理2011