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Applied Sciences
Volume: 6
10.3390/app6040094
Applied Physics Letters
Volume: 103 Pages: 43702-43702
10.1063/1.4816267
Electron.Lett.
Volume: 47 Pages: 1336-1338
10.1049/el.2011.2854
Volume: 101
10.1063/1.4767132
Jpn. J. Appl. Phys.
Volume: 51
Appl.Phys.Lett.
Volume: 98
10.1063/1.3549178
120006582092
Appl. Phys. Lett.
Volume: Vol.98
ECS Symposium I1 : Proceedings of the First International Symposium on Dielectrics for Nanosystems(Honolulu, Hawaii, October 3-8,2004) 2004-04
Pages: 418-424
ECS Symposium I1 : Proceedings of the First International Symposium on Dielectrics for Nanosystems (Honolulu, Hawaii, October 3-8) Vol.2004-04
Technical Digest of the 2003 IEEE International Electron Devices Meeting(Washington, D.C., Dec.8-10,2003)
Pages: 657-660
Technical Digest of the 2003 IEEE International Electron Devices Meeting (Washington, D.C., Dec.8-10)
IEEE Electron Device Lett. 24
Pages: 472-474
Appl.Phys.Lett. 83
Pages: 335-337
Abst.AVS Topical Conference on Atomic Layer Deposition (ALD 2002)(Seoul, August 19-21)(Invited)
Pages: 6-6
J.Vac.Sci, Technol.B 20
Pages: 1406-1409
Appl.Phys Lett. 81
Pages: 2824-2826
Microelectronics Reliability 42
Pages: 1823-1835
J.Vac.Sci.& Technol B 20
Abst.AVS Topical Conference on Atomic Layer Deposition (ALD 2002)(Seoul, August 19-21,2002)
Appl.Phys.Lett. 80
Pages: 1252-1254
Appl.Phys Lett. 80
Appl.Phys.Lett. 81
Technical Digest of the 2001 IEEE International Electron Devices Meeting (Washington, D.C., Dec.2-5)
Pages: 133-136
I Technical Digest of the 2001 IEEE International Electron Devices Meeting(Washington, D.C., Dec.2-5,2001)
Volume: Vol. 101, No. 21 Pages: 213301-5
