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Matsumoto Takashi  松本 高士

ORCIDConnect your ORCID iD *help
Researcher Number 70417369
Affiliation (Current) 2025: 東京大学, 大学院工学系研究科(工学部), 助教
Affiliation (based on the past Project Information) *help 2019 – 2023: 東京大学, 大学院工学系研究科(工学部), 助教
2017 – 2018: 東京大学, 大規模集積システム設計教育研究センター, 助教
Review Section/Research Field
Principal Investigator
Basic Section 60040:Computer system-related
Except Principal Investigator
Computer system
Keywords
Principal Investigator
IoT / 特性ゆらぎ / 経年劣化 / 信頼性 / 常時起動デバイス
Except Principal Investigator
スタックトランジスタ / バルク / FDSOI / パワエレ / BTI … More / ランダムテレグラフノイズ / 信頼性 / RTN / NBTI / 永久故障 / 一時故障 / パワーエレクトロニクス / 経年劣化 / ソフトエラー / IoT Less
  • Research Projects

    (2 results)
  • Research Products

    (7 results)
  • Co-Researchers

    (8 People)
  •  Long-term NBTI measurement and its modelingPrincipal Investigator

    • Principal Investigator
      Matsumoto Takashi
    • Project Period (FY)
      2018 – 2023
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 60040:Computer system-related
    • Research Institution
      The University of Tokyo
  •  An IoT that can keep on running over years efficiently and reliably

    • Principal Investigator
      Kobayashi Kazutoshi
    • Project Period (FY)
      2015 – 2018
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Computer system
    • Research Institution
      Kyoto Institute of Technology

All 2020 2019 2017 2015

All Journal Article Presentation

  • [Journal Article] Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement2020

    • Author(s)
      Hosaka Takumi、Nishizawa Shinichi、Kishida Ryo、Matsumoto Takashi、Kobayashi Kazutoshi
    • Journal Title

      IPSJ Transactions on System LSI Design Methodology

      Volume: 13 Issue: 0 Pages: 56-64

    • DOI

      10.2197/ipsjtsldm.13.56

    • NAID

      130007887399

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Journal Article] Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model2017

    • Author(s)
      T. Komawaki, M. Yabuuchi, R. Kishida, J. Furuta, T. Matsumoto, and K. Kobayashi
    • Journal Title

      IEICE Trans. Fundamentals

      Volume: E100.A Issue: 12 Pages: 2758-2763

    • DOI

      10.1587/transfun.E100.A.2758

    • NAID

      130006236533

    • ISSN
      0916-8508, 1745-1337
    • Language
      English
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-15H02677
  • [Presentation] Compact Modeling of NBTI Replicationg AC Stress / Recovery from a Single-shot Long-term DC Measurement2019

    • Author(s)
      Shinichi NISHIZAWA, Takumi HOSAKA, Ryo KISHIDA, Takashi MATSUMOTO, Kazutoshi KOBAYASHI
    • Organizer
      25th IEEE International Symposium on On-Line Testing and Robust System Design
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Presentation] 単発DCストレス測定による負バイアス温度不安定性のAC特性を再現可能なモデル2019

    • Author(s)
      保坂 巧、西澤真一、岸田 亮、松本高士、小林和淑
    • Organizer
      電子情報通信学会 デザインガイア2019
    • Data Source
      KAKENHI-PROJECT-18K11210
  • [Presentation] Circuit-level Simulation Methodology for Random Telegraph Noise by Using Verilog-AMS2017

    • Author(s)
      T. Komawaki, M. Yabuuchi, R. Kishida, J. Furuta, T. Matsumoto, and K. Kobayashi
    • Organizer
      Circuit-level Simulation Methodology for Random Telegraph Noise by Using Verilog-AMS
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H02677
  • [Presentation] The Impact of RTN-Induced Temporal Performance Fluctuation Against Static Performance Variation2017

    • Author(s)
      T. Matsumoto, K. Kobayashi, and H. Onodera
    • Organizer
      Electron Devices Technology and Manufacturing
    • Place of Presentation
      Toyama, Japan
    • Year and Date
      2017-03-01
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H02677
  • [Presentation] Impact of Random Telegraph Noise on Ring Oscillators Evaluated by Circuit-level Simulations2015

    • Author(s)
      大島, Pieter Weckx, Ben Kaczer, 小林, 松本
    • Organizer
      International Conference on IC Design and Technology
    • Place of Presentation
      Leuven, Belgium
    • Year and Date
      2015-06-02
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H02677
  • 1.  Kobayashi Kazutoshi (70252476)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 6 results
  • 2.  西澤 真一 (40757522)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 3 results
  • 3.  古田 潤 (30735767)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results
  • 4.  吉河 武文 (60636702)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 5.  Stoffels Steve
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 6.  Posthuma Niels
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 7.  Li Xiangdong
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 8.  Decoutere Stefaan
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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