IZUMI Hayato 泉隼人

… Alternative Names

Izumi Hayato 泉隼人

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Researcher Number	90578337
Other IDs
Affiliation (Current)	2025: 名古屋工業大学, 工学(系)研究科(研究院), 助教
Affiliation (based on the past Project Information) *help	2025: 名古屋工業大学, 工学(系)研究科(研究院), 助教 2015 – 2023: 名古屋工業大学, 工学(系)研究科(研究院), 助教 2012 – 2013: 名古屋工業大学, 工学研究科, 助教
Review Section/Research Field	Principal Investigator Basic Section 18010:Mechanics of materials and materials-related / Materials/Mechanics of materials Except Principal Investigator Microdevices/Nanodevices / Materials/Mechanics of materials
Keywords	Principal Investigator MEMS / シリコン / 疲労 / TEM / スクリーン印刷 / 印刷配線 / フレキシブルエレクトロニクス / 電子顕微鏡観察 / 銅配線 / フレキシブルプリント回路基板 … More / 曲げ耐久性能 / 曲げ疲労試験 / フレキシブルデバイス / 環境効果 / アクチュエータ / 圧電 / ねじり応力 / 透過電子顕微鏡 / MEMSミラー / 疲労破壊 / PZT / マイクロプロセス / ねじり試験 / 透過型電子顕微鏡 / 圧電素子 / 材料試験 / マイクロミラー / 有限要素法解析 / 反応性イオンエッチング / 欠陥 / 圧縮試験 / 塑性変形 / 転位 / 水素 … More Except Principal Investigator MEMS / シリコン / NEMS / 環境効果 / 水 / 長期信頼性 / 共振デバイス / 透過電子顕微鏡 / 再結合欠陥 / EBIC / 透過型電子顕微鏡 / その場観察 / TEM / 圧縮応力 / 疲労試験 Less

In-situ ETEM analysis of fatigue behavior on silicon under compressive-shear stress fieldPrincipal Investigator
- Principal Investigator
  
  泉隼人
- Project Period (FY)
  2025 – 2027
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Nagoya Institute of Technology
Systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformationPrincipal Investigator
- Principal Investigator
  
  泉隼人
- Project Period (FY)
  2022 – 2024
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Nagoya Institute of Technology
Fatigue Lifetime of Micro Mirror on High Torsional Stress and Elucidation of Accelerated Fatigue PhenomenaPrincipal Investigator
- Principal Investigator
  
  Izumi Hayato
- Project Period (FY)
  2018 – 2022
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Review Section
  
  Basic Section 18010:Mechanics of materials and materials-related
- Research Institution
  Nagoya Institute of Technology
Increasing of the ductility on single crystal silicon and its application to microneedlePrincipal Investigator
- Principal Investigator
  
  Izumi Hayato
- Project Period (FY)
  2015 – 2017
- Research Category
  
  Grant-in-Aid for Young Scientists (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
In-situ TEM observation of silicon fatigue process using resonance compressive fatigue test
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  2011 – 2013
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Materials/Mechanics of materials
- Research Institution
  Nagoya Institute of Technology
Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetime
- Principal Investigator
  
  KAMIYA Shoji
- Project Period (FY)
  2011 – 2012
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Microdevices/Nanodevices
- Research Institution
  Nagoya Institute of Technology

All 2022 2020 2019 2018 2017 2016 2015 2014 2013 2012 2011

All Journal Article Presentation

[Journal Article] The origin of fatigue fracture in single-crystal silicon2022
- Author(s)
  H.Izumi, T. Kita, S. Arai, K. Sasaki, S. Kamiya
- Journal Title
  
  Journal of Material Science
  
  Volume: 57 Issue: 18 Pages: 8557-8566
- DOI
  10.1007/s10853-022-07055-5
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K03836, KAKENHI-PROJECT-19K04091
[Journal Article] A multidimensional scheme of characterization for performance deterioration behavior of flexible devices under bending deformation2020
- Author(s)
  S.Kamiya, H. Izumi, T. Sekine, N. Shishido, H. Sugiyama, Y. Haga, T. Minari, M. Koganemaru, S. Tokito
- Journal Title
  
  Thin Solid Films
  
  Volume: 694 Pages: 137613-137613
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18K03836
[Journal Article] Shear stress enhanced fatigue damage accumulation in single crystalline silicon under cyclic mechanical loading2016
- Author(s)
  S. Kamiya, A. Udhayakumar, H. Izumi, K. Koiwa
- Journal Title
  
  Sensors and Actuators A: Physical
  
  Volume: 244 Pages: 314-323
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-15K17937
[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014
- Author(s)
  Shoji Kamiya, Toshifumi Kita, Hayato Izumi
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 208 Pages: 3036-3036
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014
- Author(s)
  S.Kamiya, T.Kita, H.Izumi
- Journal Title
  
  Sensors and Actuators A
  
  Volume: 208 Pages: 30-36
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013
- Author(s)
  Vu Le Huy, Shoji, Kamiya, Kei Nagayoshi, Hayato Izumi, Joao Gaspar, Oliver Paul
- Journal Title
  
  Journal of Micromechanics and Microengineering
  
  Volume: 23 Pages: 45008-45008
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013
- Author(s)
  V.L.Huy, S.Kamiya, K.Nagayoshi, H.Izumi, J.Gaspar, O.Paul
- Journal Title
  
  Journal of Micromechanics and Microengineering
  
  Volume: 23
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23360054
[Journal Article] Effect of hydrogen on mechanical properties of single crystal surface2013
- Author(s)
  H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
- Journal Title
  
  ASME InterPACK 2013
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Journal Article] Electronic properties of dislocations infroduced mechanically at room temperature on a single crystal silicon substrate2012
- Author(s)
  Masatoshi Ogawa, Shoji Kamiya, Hayato Izumi, Yutaka Tokuda
- Journal Title
  
  Physica B
  
  Volume: 407
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Journal Article] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2012
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Journal Title
  
  Physica B
  
  Volume: 407 Pages: 3034-4037
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] A novel method of systematic quantitative characterization for mechanical robustness of flexible thin film devices against repeated bending deformation2022
- Author(s)
  H. Izumi, M. Nomura, Y. Haga, H. Sugiyama, S. Kamiya
- Organizer
  18th International Conference on Plasma Surface Engineering
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] A novel method of systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformation2022
- Author(s)
  H. Izumi, M. Nomura, Y. Haga, H. Sugiyama, S. Kamiya
- Organizer
  18th International Conference on Plasma Surface Engineering
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K03825
[Presentation] Test method of electrical characteristic under two-directional deformation for flexible electro-mechanical devices2022
- Author(s)
  H.Izumi
- Organizer
  International Electrotechnical Commission 2022 general meeting
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-22K03825
[Presentation] A novel scheme of characterization for performance deterioration behavior of flexible devices under bending deformation2019
- Author(s)
  S. Kamiya, H. Izumi, T. Sekine, N. Shishido, H. Sugiyama, Y. Haga, T. Minari, M. Koganemaru, S. Tokito
- Organizer
  46th International Conference on Metallurgical Coating and Thin Films
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] 極薄シリコンチップの曲げ強度測定2019
- Author(s)
  灰本隆志，松崎栄，川合章仁，泉隼人，神谷庄司
- Organizer
  日本機械学会2019年度年次大会
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] 繰返し圧縮負荷によるシリコン単結晶中の結晶欠陥集積とき裂進展の電子顕微鏡観察2019
- Author(s)
  杉山裕子，泉隼人，神谷庄司
- Organizer
  日本機械学会2019年度年次大会
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] マイクロシステムの機械的信頼性評価2018
- Author(s)
  泉隼人
- Organizer
  有機機能材料のリソグラフィ加工コンソーシアム
- Invited
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] Plastic Deformation Enhanced Silicon Surface by Synergistic Effect between Defect and Hydrogen2018
- Author(s)
  H. Izumi M. Nakamura S. Kamiya
- Organizer
  The 9th Asia-Pacific Conference of Transducers and Micro-Nano technology (APCOT2018)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] Increasing the ductility of single crystalline silicon treated by hydrogen plasma2018
- Author(s)
  H. Izumi M. Nakamura S. Kamiya
- Organizer
  16th International Conference on Plasma Surface Engineering (PSE2018)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-18K03836
[Presentation] Plastic deformation enhanced silicon surface by synergistic effect between defect and hydrogen2018
- Author(s)
  H. Izumi, M. Nakamura, S. Kamiya
- Organizer
  The 9th Asisa-Pacific Conference of Transducers and Micro-Nano Technology
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] Increasing the ductility of single crystalline silicon treated by hydrogen plasma2018
- Author(s)
  H. Izumi, M. Nakamura, S. Kamiya
- Organizer
  16th International Conference on Plasma Surface Engineering
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] 透過型電子顕微鏡を用いた単結晶シリコンの疲労破壊起点の観察2017
- Author(s)
  泉隼人，喜多俊文，荒井重勇，佐々木勝寛
- Organizer
  日本機械学会2017年度年次大会
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] 単結晶シリコンの疲労過程における結晶すべり変形の電子線誘起電流観察2017
- Author(s)
  神谷庄司，金剛英，杉山裕子，泉隼人
- Organizer
  日本機械学会2017年度年次大会
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] World-First Electronic Imaging of Subcritical Slip Growth in Single Crystal Silicon under Fatigue Loading2017
- Author(s)
  S. Kamiya, A. Kongo, H. Sugiyama, H. Izumi
- Organizer
  The 19th International Conference on Solid -State Sensors, Actuators and Microsystems
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] 反応性イオンエッチングを施した単結晶シリコン表面の機械的性質に及ぼす水素の影響2017
- Author(s)
  中村克，泉隼人，神谷庄司
- Organizer
  日本機械学会M&M材料力学カンファレンス
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] Effect of hydrogen on the mobility of surface defects induced in plasma etching process for silicon2016
- Author(s)
  M. Nakamura, T. Kim, H. Izumi, S. Kamiya
- Organizer
  15th International Conference on Plasma Surface Engineering
- Place of Presentation
  Garmisch-Partenkirchen, Germany
- Year and Date
  2016-09-12
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] Effect of hydrogen on the mobility of surface defects induced in plasma etching process for silicon2016
- Author(s)
  M. Nakamura, T. Kim, H. Izumi, S. Kamiya
- Organizer
  The 15th International Conference on Plasma Surface Engineering (PSE 2016)
- Place of Presentation
  in Garmisch-Partenkirchen, Germany
- Year and Date
  2016-09-12
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] シリコンへの水素注入とその機械的特性に及ぼす水素の影響2016
- Author(s)
  キムテフン、中村克、泉隼人、神谷庄司
- Organizer
  日本機械学会東海支部第65期総会・講演会
- Place of Presentation
  愛知工業大学八草キャンパス
- Year and Date
  2016-03-17
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] Existential states and effect of hydrogen on surface defects in silicon2016
- Author(s)
  M. Nakamura, H. Izumi, S. Kamiya
- Organizer
  International Symposium on Micro-Nano Science and Technology 2016
- Place of Presentation
  The university of Tokyo, Tokyo, Japan
- Year and Date
  2016-12-16
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] Si結晶中の水素が機械的性質に及ぼす影響2015
- Author(s)
  中村克、キムテフン、泉隼人、神谷庄司
- Organizer
  日本機械学会 M&M2015材料力学カンファレンス
- Place of Presentation
  慶應義塾大学矢上キャンパス
- Year and Date
  2015-11-21
- Data Source
  KAKENHI-PROJECT-15K17937
[Presentation] 繰り返し荷重によるシリコンの疲労損傷集積の観察2014
- Author(s)
  泉隼人、喜多俊文、田中健太郎、神谷庄司
- Organizer
  日本機械学会東海支部第63期総会
- Place of Presentation
  大同大学、愛知県
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰り返し荷重によるシリコンの疲労損傷集積の観察2014
- Author(s)
  泉隼人、喜多俊文、田中健太郎、神谷庄司
- Organizer
  日本機械学会東海支部第63会総会講演会
- Place of Presentation
  名古屋市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Effect of hydrogen on mechanical properties of single crystal surface2013
- Author(s)
  H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
- Organizer
  ASME International Technical Conference & Exhibition Packaging and Integration of Electronic and Photonic Microsystems (InterPACK 2013)
- Place of Presentation
  Burlingame, USA
- Year and Date
  2013-07-20
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  S. Kamiya, R. Hirai, H. Izumi, N. Umehara, T. Tokoroyama
- Organizer
  The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers 2013)
- Place of Presentation
  Barcelona, Spain
- Year and Date
  2013-06-20
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Ve Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62期総会講演会
- Place of Presentation
  津市
- Year and Date
  2013-03-19
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62期総会
- Place of Presentation
  三重大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  Shoji Kamiya, Ryutaro Hirai, Hayato Izumi, Noritsugu Umehara, Takayuki Tokoroyama
- Organizer
  Technical Digest of the 17th International Conference on Solid-State Sensors, Actuators, and Microsystems (Transducers2013&Eurosensors XXVII)
- Place of Presentation
  Barcelona, Spain
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] EBIC observation of the defects in single crystalline silicon induced by mechanical compressive stress2013
- Author(s)
  T.Kita, S.Kamiya, H.Izumi
- Organizer
  The 27th International Conference on Defects in Semiconductors 2013 (ICDS2013)
- Place of Presentation
  Bologna, Italy
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰り返し圧縮応力によるシリコン単結晶中の欠陥形成と残存引張強度2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人
- Organizer
  日本機械学会2013年度年次大会
- Place of Presentation
  岡山大学、岡山県
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第６２期総会講演会
- Place of Presentation
  Tsu, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第６２期総会講演会
- Place of Presentation
  Tsu, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62期総会
- Place of Presentation
  三重大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013
- Author(s)
  S.Kamiya, R.Hirai, H.Izumi, N.Umehara, T.Tokoroyama
- Organizer
  The 17th International Conference on Solid-State Sensors, Actuators, and Microsystems (Transducers2013&EurosensorsXXXVII)
- Place of Presentation
  Barcelona, Spain
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2013
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62会総会講演会
- Place of Presentation
  津市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 繰り返し圧縮応力によるシリコン単結晶中の欠陥形成と残存引張強度2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人
- Organizer
  日本機械学会2013年度年次大会
- Place of Presentation
  岡山市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコン疲労損傷の観察2013
- Author(s)
  喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Vu Le Huy、小川将史
- Organizer
  日本機械学会東海支部第62会総会講演会
- Place of Presentation
  津市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  Isram Md. Wahedul、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  Isram Md. Wahedul、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  イスラムエムデイワヘドウル、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Year and Date
  2012-09-10
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川　創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012カンファレンス
- Place of Presentation
  Matsuyama, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012
- Author(s)
  イスラムエムディワヘドゥル、泉隼人、小川将史、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  Kanazawa, Japan
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 電子線誘起電流によるシリコンの疲労過程の微視観察2012
- Author(s)
  平井隆太郎，神谷庄司，泉隼人，梅原徳次
- Organizer
  日本機械学会東海支部第61期総会講演会
- Place of Presentation
  名古屋工業大学（愛知県）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012材料力学カンファレンス
- Place of Presentation
  愛媛大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] TEM内疲労試験その場観察を目的としたMEMS共振デバイスの開発2012
- Author(s)
  Lam Hoanson、泉隼人、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢大学
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012材料力学カンファレンス
- Place of Presentation
  松山市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2012
- Author(s)
  向山諒太、泉隼人、宍戸信之、神谷庄司
- Organizer
  日本機械学会東海支部第62期総会講演会
- Place of Presentation
  津市
- Year and Date
  2012-03-19
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] TEM 内疲労試験その場観察を目的としたMEMS 共振デバイスの開発2012
- Author(s)
  Lam Hoanson、泉隼人、神谷庄司
- Organizer
  日本機械学会2012年度年次大会
- Place of Presentation
  金沢市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] 電子線誘起電流によるシリコンの疲労過程の微視観察2012
- Author(s)
  平井隆太郎、神谷庄司、泉隼人、梅原徳次
- Organizer
  日本機械学会年東海支部第61期総会講演会
- Place of Presentation
  名古屋市
- Year and Date
  2012-03-16
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012
- Author(s)
  平川創、泉隼人、生津資大、神谷庄司
- Organizer
  日本機械学会M&M2012カンファレンス
- Place of Presentation
  松山市
- Year and Date
  2012-09-22
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Evaluation and comparison of fracture behavior of silicon thin films under various environmental conditions2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  日本実験力学学会2011年度年次講演会
- Place of Presentation
  奈良県文化会館（奈良県）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  The 13th International Conference on Electronics Materials and Pachaging (EMAP2011)
- Place of Presentation
  京都ガーデンパレス（京都府）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  International Conference on Electronics Materials and Packaging (EMAP)
- Place of Presentation
  Kyoto
- Year and Date
  2011-12-14
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Electronic sensing of mechanical damage on a single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  マイクロ・ナノ工学国際ワークショップ
- Place of Presentation
  京都大学桂ｷｬﾝﾊﾟｽ（京都府）
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの疲労挙動とその環境依存性2011
- Author(s)
  石川正芳、神谷庄司、泉隼人、宍戸信之
- Organizer
  日本機械学会M&M2011材料力学カンファレンス
- Place of Presentation
  北九州市
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  26th International Conference on Defects in Semiconductor (ICDS)
- Place of Presentation
  New Zealand
- Year and Date
  2011-07-21
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2011
- Author(s)
  M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
- Organizer
  26th International Conference on Defects in Semiconductors
- Place of Presentation
  Rutherford Hotel(ﾆｭｰｼﾞｰﾗﾝﾄﾞ)
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] Evaluation and comparison of fracture behavior of silicon thin films under various environmental conditions2011
- Author(s)
  Y-C. Cheng, H. Izumi, M. Ishikawa, S. Kamiya, M-T. Lin
- Organizer
  The Japanese Society for Experimental Mechanics
- Place of Presentation
  Nara
- Year and Date
  2011-08-30
- Data Source
  KAKENHI-PROJECT-23651137
[Presentation] 単結晶シリコンの疲労挙動とその環境依存性2011
- Author(s)
  石川正芳、神谷庄司、泉隼人、宍戸信之
- Organizer
  日本機械学会M&M 2011
- Place of Presentation
  北九州、福岡
- Year and Date
  2011-07-16
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fracture Behavior of Silicon Thin Film under Liquid Water2011
- Author(s)
  Hayato Izumi, Ya-Chi Cheng, Masayoshi Ishikawa, Shoji Kamiya, Ming-Tzer Lin
- Organizer
  13th International Conference on Electronics Materials and Packaging
- Place of Presentation
  Kyoto, Japan
- Year and Date
  2011-12-14
- Data Source
  KAKENHI-PROJECT-23360054
[Presentation] Fracture behavior of silicon thin film under liquid water2011
- Author(s)
  H.Izumi, Y.Cheng, M.Ishikawa, S.Kamiya, M-T.Lin
- Organizer
  13th International Conference on Electronics Materials and Packaging (EMAP2011)
- Place of Presentation
  Kyoto
- Data Source
  KAKENHI-PROJECT-23360054

1. KAMIYA Shoji (00204628)

# of Collaborated Projects: 2 results

# of Collaborated Products: 47 results
2. SATO Kazuo (30262851)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
3. NAKAJIMA Masahiro (80377837)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
4. MORITANI Tomokazu (50362322)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

IZUMI Hayato 泉 隼人

Izumi Hayato 泉 隼人

Research Projects

Research Products

Co-Researchers

In-situ ETEM analysis of fatigue behavior on silicon under compressive-shear stress fieldPrincipal Investigator

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Systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformationPrincipal Investigator

Principal Investigator

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Fatigue Lifetime of Micro Mirror on High Torsional Stress and Elucidation of Accelerated Fatigue PhenomenaPrincipal Investigator

Principal Investigator

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Review Section

Research Institution

Increasing of the ductility on single crystal silicon and its application to microneedlePrincipal Investigator

Principal Investigator

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Research Institution

In-situ TEM observation of silicon fatigue process using resonance compressive fatigue test

Principal Investigator

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Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetime

Principal Investigator

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Research Institution

[Journal Article] The origin of fatigue fracture in single-crystal silicon2022

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[Journal Article] A multidimensional scheme of characterization for performance deterioration behavior of flexible devices under bending deformation2020

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[Journal Article] Shear stress enhanced fatigue damage accumulation in single crystalline silicon under cyclic mechanical loading2016

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[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014

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[Journal Article] Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress2014

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[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013

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[Journal Article] A prediction scheme of the static fracture strength of MEMS structures based on the characterization of damage distribution on a processed surface2013

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[Journal Article] Effect of hydrogen on mechanical properties of single crystal surface2013

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[Journal Article] Electronic properties of dislocations infroduced mechanically at room temperature on a single crystal silicon substrate2012

Author(s)

Journal Title

Data Source

[Journal Article] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2012

Author(s)

IZUMI Hayato 泉隼人

Izumi Hayato 泉隼人