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Jpn. J. Appl. Phys.
Volume: 58 Issue: SB Pages: SBBB01-SBBB01
10.7567/1347-4065/aafb4d
210000135331
Microelectronics Journal
Volume: 82 Pages: 13-21
10.1016/j.mejo.2018.10.005
Volume: 57/4S Issue: 4S Pages: 04FN03-04FN03
10.7567/jjap.57.04fn03
210000148986
Japanese Journal of Applied Physics
Volume: 56, 4S
Institute of Engineering Technology (IET), Electronics Letters
Volume: 53, 7 Pages: 456-458
Volume: 56 Issue: 4S Pages: 04CN01-04CN01
10.7567/jjap.56.04cn01
IET Electronics Letters
Volume: 53 Pages: 456-458
10.1049/el.2016.4233
Proc. IEEE
Volume: 104 Pages: 1843-1863
10.1109/jproc.2016.2574939
Proceedings of the 43rd IEEE International Symposium on Multiple-Valued Logic
Volume: -
43rd IEEE International Symposium on Multiple-Valued Logic (ISMVL2013)
Pages: 147-151
10.1109/ismvl.2013.23
2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)
Pages: 105-108
10.1109/iscas.2013.6571793
Journal of Multiple-Valued Logic and Soft Computing
Volume: Vol.21, No.5-6 Pages: 597-608
http://www.oldcitypublishing.com/pdf/3498
42nd IEEE International Symposium on Multiple-Valued Logic (ISMVL2012)
Pages: 214-219
10.1109/ismvl.2012.52
Proceedings of 2012 IEEE International Symposium on Circuits & Systems
Volume: (掲載確定)
2012 IEEE International Symposium on Circuits & Systems (ISCAS2012)
Pages: 2705-2708
10.1109/iscas.2012.6271866
Proceedings of the 10th IEEE International NEWCAS Conference
Volume: - Pages: 97-100
10th IEEE International NEWCAS Conference (NEWCAS2012)
Pages: 97-100
10.1109/newcas.2012.6328965
Proceedings of the 42nd IEEE International Symposium on Multiple-Valued Logic
10th IEEE International NEWCAS Conference
Volume: Vol.19, No.1-3 Pages: 219-231
http://www.oldcitypublishing.com/pdf/2910
Volume: (未定)(掲載確定)
Volume: - Pages: 214-219
Proceedings of the 56th Magnetism and Magnetic Materials Conference
Pages: 480-481
The 56th Magnetism and Magnetic Materials Conference (MMM2011)
http://www.magnetism.org/
Booklet of the 19th International Workshop on Post-Binary ULSI Systems
Pages: 20-25
IEICE Electronics Express Vol. 4 No. 3
Pages: 88-93
130000088503