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TANAKA Nobuo  田中 信夫

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Researcher Number 40126876
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Affiliation (Current) 2022: 公益財団法人名古屋産業科学研究所, 研究部, 上席研究員
2022: 名古屋大学, 未来材料・システム研究所, 研究員
Affiliation (based on the past Project Information) *help 2017: 名古屋大学, エコトピア科学研究所, 教授
2015 – 2017: 名古屋大学, 未来材料・システム研究所, 研究員
2015 – 2016: 名古屋大学, 未来材料・システム研究所, 特任教授
2015: 名古屋大学, 未来材料システム研究所, 教授
2005 – 2014: 名古屋大学, エコトピア科学研究所, 教授 … More
2013: 名古屋大学, エコトピア科学研究所, 准教授
2008: 名古屋大, エコトピア科学研究所, 教授
2006: 名古屋大学, エコトビア科学研究所, 教授
2004 – 2005: 名古屋大学, エコトピア科学研究機構, 教授
2002 – 2003: 名古屋大学, 理工科学総合研究センター, 教授
2001: 名古屋大学, 大学院・工学研究科, 教授
1999 – 2001: 名古屋大学, 工学研究科, 教授
1999: 名古屋大学, 大学院・工学研究科, 教授
1997 – 1998: Nagoya Univ., Dep.Eng., Assoc.Prof., 工学研究科, 助教授
1996 – 1997: 名古屋大学, 大学院・工学研究科, 助教授
1990 – 1996: 名古屋大学, 工学部, 助教授
1995: 名古屋大学, 工学研究科, 助教授
1986 – 1989: 名古屋大学, 工学部, 助手 Less
Review Section/Research Field
Principal Investigator
Science and Engineering / 表面界面物性 / Nanostructural science / Applied materials science/Crystal engineering / Thin film/Surface and interfacial physical properties / Nanomaterials engineering / 応用物理学一般(含航海学) / 固体物性Ⅰ(光物性・半導体・誘電体) / Inorganic materials/Physical properties / Applied materials … More
Except Principal Investigator
… More Science and Engineering / Nanomaterials/Nanobioscience / Applied materials science/Crystal engineering / Material processing/treatments / Thin film/Surface and interfacial physical properties / Physical properties of metals / Biophysics / Engineering / 素粒子・核・宇宙線 / Structural/Functional materials / Polymer/Textile materials / Applied materials / Quantum beam science / Nanomaterials engineering / Materials/Mechanics of materials / Nuclear engineering / Physical properties of metals/Metal-base materials Less
Keywords
Principal Investigator
電子顕微鏡 / TEM / ナノEELS / ナノメ-タ-電子回折 / MgO / クラスター / その場観察 / 半導体超格子 / 半導体界面 / 半導体 … More / パラジウム / 水素吸蔵 / 極微小電子線 / 電子線誘起電流測定 / 多層膜 / 金属 / ナノ回折 / 量子井戸 / 人工格子 / HREM / 原子クラスター / スピン状態 / 非晶質半導体 / 原子直視 / HAADF-STEM / 原子直視観察 / プロチウム / EELS / 界面 / 歪超格子 / interfaces / 金属界面 / ナノプローブ電子線 / 界面構造 / metal / 表面・界面 / STEM / 金属-半導体界面 / 金属ー半導体界面 / γ(ガンマ)ーFe / Fe / MgO人工格子 / 磁性測定 / 微結晶 / γ^CーFe / 強磁性 / 構造と磁性 / γ-Fe / RHEED観察 / TEM観察 / 真空蒸首 / MgO蒸首膜 / 構造と拘性 / 真空蒸着膜 / 構造と物性 / 金属フラーレン / MgO単結晶膜 / Gd@C82 / 真空蒸着法 / 試料トランスファーチャンパー / 内包構造 / 傾斜複合膜 / セラミックス / Fe-MgO / 磁気的特性 / 電気伝導率 / 遷移金属 / 量子ドット / 電子線ピンセット / ナノ電子線 / ピンセット / ナノ操作 / 酸化物膜 / 遷移金属クラスター / 暗視野STEM / ゲルコニウム / 原子直視視察 / 金属媒介結晶化 / ゲルマニウム / 金クラスター / 低温結晶化 / 動的高分解能電子顕微鏡法 / LaNi_5 / クラスターの自動振動 / 表面拡散原子 / タングステン原子 / 表面拡散 / 1個の原子 / タングステン / 水素吸蔵過程 / LaNi_5合金 / 水素吸蔵合金 / マンガン酸化物 / 先端軽元素材料 / 電子構造 / 軌道の異方性 / 3d軌道 / 可視化 / 収差補正 / SiO_2 / Si界面 / 酸化状態 / 光触媒 / 透過電子顕微鏡 / 光化学反応 / チタニア粉末 / チタニアナノロッド / 薄膜 / 酸化物半導体 / HR-profile TEM / Geナノドット / 極薄Si酸化膜 / 臨界核サイズ / 構造安定モデル / スピンエレクトロニクス / 量子ビーム / スピン偏極電子線の相互作用 / 磁性体薄膜 / マルチスライスシミュレーション / スピン偏極電子 / 低速電子顕微鏡 / スピン偏極電子銃 / 低速加速電子顕微鏡 / 散乱実験 / 低加速電子顕微鏡 / 環境電子顕微鏡 / 電池材料解析 / 非大気露出試料転送 / ナノマイクロ構造解析・評価・試験法 / リチウム電池 / ナノマイクロ構造評価 / その場電顕観察 / 非大気露出 / 歪解析 / 半導体歪超格子 / 界面歪 / InGaP / InP / 極微小構造解析 / Nano-electron diffraction / Strained superlattices quantum well / analysis of strain / 極微小電子線プローブ / ナノプローブ電子物性 / ナノ回打 / 電子物性 / Nano electron probe / semiconductor interfaces / nano-diffraction / nano-EELS / Study of physical properties by nano probe / 電子線プローブ / CBED / Nano materials / 表・界面 / 分析電子顕微鏡 / ナノメーター構造解析 / 先端材料 / イメージングプレート / 精密構造解析 / CCDカメラ / Electron probe / Convergent Beam Electron Diffraction / High Resolution Electron Microscopy / Nano-Materials / Interfaces / Analytical Electron Microscopy / ナノ電子ビーム回折 / 金属・半導体・界面 / 電子波の干渉 / 金属・半導体界面 / コヒーレントナノ電子回折 / 全面界面 / PbTe / MgO界面 / 位相決定 / コヒーレント電子回折 / 格子のフィッティング / nano-beam electron diffraction / semiconductor interface / interference of electrons / スピン偏極 / GaAs電子源 / 磁性 / 反射電子回折 / スピン偏極電子源 / 磁性体 / Spin-polarization / GaAs electron source / Surface, Interface / Magnetism / RHEED / 時間分解型観察 / ミリセカンド / 時間分解TEM / 水素放出 / ランタンニッケル / Time-resolved / Hydrogen-absorption / Milli-second / Atomistic observation / 構造ゆらぎ / 収差補正電子顕微鏡 / ナノ構造 / 界面・表面 / 球面収差補正 TEM / 高分解能観察 / ナノ制限視野回折 / 炭素ナノチューブ / 準結晶 / 球面収差補正 / ナノ電子回折 / Structural fluctuation / Cs-corrected TEM / Nanostracture / Interface, Surface / Alの組成変化 / Al-組成変化 / ナノメーター回折 / 砒化ガリウム / Alー組成変化 / Nano-diffraction / Semiconductor-superlattices / Compositional variation / Strained superlattices … More
Except Principal Investigator
電子顕微鏡 / 電子線 / 電子線加工 / 原子分解能 / 接合 / 界面 / ナノ構造 / 構造解析 / 高分解能透過電子顕微鏡 / その場解析 / 高分解能電子顕微鏡 / その場観察 / その場電子顕微鏡 / 原子直視型観察 / 高分解能観察 / 変形 / 金 / 水素 / エピタキシャル成長 / シリコン / 結晶成長 / 格子欠陥 / 収差補正TEM / ナノ粒子 / 電子回折 / 単原子 / bonding / スピン / 回折顕微法 / 位相イメージング / 転位 / 金属間化合物 / ナノ結晶 / 高分解能電子顕鏡 / L1_2型規則構造 / B_2型規則構造 / 細粒超塑性 / 変形能 / 高温構造材料 / 超微細加工 / ナノ機構 / 動的観察 / 組成 / ナノメートル加工 / 粒界すべり / 超塑性 / ナノスケール電子分光 / 電子分光 / 電子エネルギー損失分光 / 分光結像 / 電子励起光分光 / 軽元素 / 局在量子構造 / セラミックス / 金属 / 材料設計 / 電子状態 / リチウム / 酸化物 / カーボンナノチューブ / シリサイド / ニッケル / チタン / パラジウム / プラチナ / 走査型透過電子顕微鏡 / シリコンゲルマニウム / カーボン(炭素) / コバルト / エピタキシャル / 高角度散乱暗視野走査透過電子顕微鏡 / デバイス材料 / 組織制御 / 構造評価 / 電子プローブ / 金属ガラス / 制限視野電子回折 / 中距離範囲秩序 / パターソン関数 / 球面収差補正 / 膜細胞骨格 / クライオ電顕 / アクチン線維 / 細胞膜 / 細胞骨格 / フリーズエッチング / 微小管 / 生物物理 / 蛋白質 / 細胞・組織 / 裏打ち構造 / IQGAP1 / 収差補正STEM / ドーパント / アンチモン / 拡散 / 白金 / アモルファス / 半導体歪み解析 / 電気伝導 / 収束電子回折 / ゲルマニウム / 錫 / 歪 / CMOS / 表面・界面 / スズ(錫) / エネルギーバンド / ゲートスタック / スズ / ひずみ / 高キャリア移動度 / 欠陥 / LSI / らせん波 / 軌道角運動量 / 位相特異点 / ボルテックス / 渦 / 電子らせん波 / 円二色性 / キラリティー / ヘテロ接合 / Transmission electron microscopy / hetero bonding / in situ analysis / atomic resolution / 偏極度 / 偏極電子源 / 量子効率 / フォトカソード / 超格子 / 電界放出暗電流 / 電子銃 / 電子スピン / 偏極電子ビーム / 超格子半導体 / NEA表面 / 空間電荷制限 / 暗電流 / パルスレーザー / GaAs / 負の電子親和性 / 放電暗電流 / GaAs表面 / 研磨 / カソード / Spin / Polarization / Polarized Electron Source / Quantum efficiency / Photocathode / Superlattice / Field emission dark current / Electron gun / 接触 / 破壊 / ピエグ素子 / 原子直視観察 / 高分解解透過電子顕微鏡 / ピエヅ素子 / 原子過程 / 合金化 / ピエゾ素子 / High resolution microscopy / deformation / contact / fracture / piezo / Atomistic / in-situ / 不純物効果 / 硫黄 / 耐熱鋼 / 水蒸気酸化 / 鉄鋼材料 / 微量元素 / 合金設計 / 不純物元素 / impurity / sulfur / heat-resisting steel / steam oxidation / ブロック共重合体 / 星型共重合体 / ナノ相分離構造 / アルキメデスタイリング / 12回対称準結晶 / ミクロドメイン構造 / アルキメデスタイリング構造 / 階層構造 / block copolymer / star-shaped terpolymer / nanophase-separated structure / Archimedean tiling / quasicrystal with dodecagonal symmetry / サーメット / 単結晶複合薄膜 / 電気抵抗 / 磁性 / 高分解能電子顕微鏡法 / 準結晶薄膜 / 高分解能電子顕微鏡法準結晶薄膜 / 単結晶複合膜 / 複合膜の拘性 / 高分解能党子顕微鏡法 / 複合薄膜 / 真空蒸着 / 電子顕微鏡法 / cermet / single crystalline composite films / electric and magnetic properties / high resolution electron microscopy / 強度干渉 / 量子効果 / コインシデンス / 小角散乱 / 水素脆性 / 格子脆化説 / サブミクロン材料 / 強度評価 / 機械材料・材料力学 / 収差補正電子顕微鏡 / 正焦点 / 格子縞コントラスト / 金属ナノ粒子 / 三次元分布 / 非整合エピタキシャル界面 / 三次元観察 / 焦点位置スキャン / 結晶格子縞 / 動画計測 / 三次元計測 / 深さ分解能 / 電子回折顕微法 / 制限視野回折 / ナノ電磁場 / 照射損傷 / 核融合炉 / 原子炉 / 衝突カスケード / 原子空孔 / 格子間原子 / 材料強化 / 鉄鋼 Less
  • Research Projects

    (63 results)
  • Research Products

    (320 results)
  • Co-Researchers

    (82 People)
  •  Developing three-dimensional measurement method for nano- and atomistic structures using focal series of aberration-corrected transmission electron microscopy images

    • Principal Investigator
      Yamasaki Jun
    • Project Period (FY)
      2016 – 2017
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Osaka University
  •  Time-Correlation Measurement using Coherent Spin-Polarized Electron Beam

    • Principal Investigator
      Kuwahara Makoto
    • Project Period (FY)
      2015 – 2016
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Quantum beam science
    • Research Institution
      Nagoya University
  •  Study of a new mechanism for the suppression of radiation damage in materials

    • Principal Investigator
      Arakawa Kazuto
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Nuclear engineering
    • Research Institution
      Shimane University
  •  New strengthening mechanism of alpha-iron based materials by introduction of high-energy dislocations

    • Principal Investigator
      Arakawa Kazuto
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Physical properties of metals/Metal-base materials
    • Research Institution
      Shimane University
  •  Atomic level and in-situ observation of battery-related materials by environmental high-voltage electron microscopyPrincipal Investigator

    • Principal Investigator
      Tanaka Nobuo
    • Project Period (FY)
      2014 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Nanomaterials engineering
    • Research Institution
      Nagoya University
  •  Quantitative visualization of nanometer-scaled electromagnetic fields by a novel phase-imaging method based on small-angle electron scattering patterns

    • Principal Investigator
      Yamasaki Jun
    • Project Period (FY)
      2014 – 2015
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Nanomaterials engineering
    • Research Institution
      Osaka University
  •  Development of electron diffractive imaging for phase observations from the atomic level to micron scale

    • Principal Investigator
      Yamasaki Jun
    • Project Period (FY)
      2014 – 2016
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Osaka University
  •  Study on mechanism of hydrogen embrittlement through a use of characteristic strength properties of submicron materials

    • Principal Investigator
      TAKAHASHI Yoshimasa
    • Project Period (FY)
      2013 – 2015
    • Research Category
      Grant-in-Aid for Young Scientists (A)
    • Research Field
      Materials/Mechanics of materials
    • Research Institution
      Kansai University
  •  Experimental verification of relativistic spin-scattering in low energy TEMPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      2012 – 2014
    • Research Category
      Grant-in-Aid for Challenging Exploratory Research
    • Research Field
      Nanostructural science
    • Research Institution
      Nagoya University
  •  Studies of the production of electron vortex beams and their interaction with chiral materials

    • Principal Investigator
      KOH Saitoh
    • Project Period (FY)
      2011 – 2013
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Nagoya University
  •  Design of Electronic Properties and Development of High-Mobility Channel Technology for Low Power/High-Speed Nano-CMOS Devices

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2010 – 2013
    • Research Category
      Grant-in-Aid for Specially Promoted Research
    • Review Section
      Science and Engineering
      Engineering
    • Research Institution
      Nagoya University
  •  Development of spin-polarized pulsed TEM and the application of spin-resolved analysisPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      2009 – 2013
    • Research Category
      Grant-in-Aid for Scientific Research (S)
    • Research Field
      Nanostructural science
    • Research Institution
      Nagoya University
  •  Accurate measurements of lattice strains and electric conductivity in nanometer-scale areas

    • Principal Investigator
      SAITOH Koh
    • Project Period (FY)
      2008 – 2010
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  UHV in-situ and Cs-corrected HR(S)TEM Studies of structures and growth process of Ge nanodots formed on faintly oxidized Si surfacesPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo, SOMPYO Cho
    • Project Period (FY)
      2007 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  収差補正STEMによるシリコン中ドーパント拡散及びクラスタリングの単原子直視研究

    • Principal Investigator
      山崎 順
    • Project Period (FY)
      2007 – 2008
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  金属ガラスの局所原子構造の球面収差補正電子顕微鏡による研究

    • Principal Investigator
      山崎 順
    • Project Period (FY)
      2006 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  Nano architecture of membrane cytoskeleton in native state revealed by immuno-cryo-electron microscopy

    • Principal Investigator
      USUKURA Jirou
    • Project Period (FY)
      2006 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Biophysics
    • Research Institution
      Nagoya University
  •  高空間分解能光化学反応その場観察装置による酸化チタンの触媒反応界面の動的観察Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      2005 – 2006
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  Study of structural fluctuation of nanomaterials by Cs-corrected electron lensesPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      2005 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Nanostructural science
    • Research Institution
      Nagoya University
  •  Creation of A Two-dimensional Mesoscopic Quasicrystal with Dodecagonal Symmetry from An ABC Star-shaped Terpolymer

    • Principal Investigator
      MATSUSHITA Yushu
    • Project Period (FY)
      2005 – 2007
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Polymer/Textile materials
    • Research Institution
      Nagoya University
  •  電子プローブによる光・電子デバイス材料および実装素子のナノ組織解析技術の進展

    • Principal Investigator
      桑野 範之
    • Project Period (FY)
      2003
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Nanomaterials/Nanobioscience
    • Research Institution
      Kyushu University
  •  無球面収差結像TEMによるSiO_2/Si界面の酸化状態の原子直視的研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      2003 – 2004
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  異種材料界面制御による超低抵抗コンタクトの開発と半導体/金属界面の原子直視研究

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2001 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  EELSイメージングを用いたマンガン酸化物の電子構造の可視化Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      2001 – 2002
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  Milli-second time-resolved HRTEM of absorption / desorption of hydrogenPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      2001 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Inorganic materials/Physical properties
    • Research Institution
      Nagoya University
  •  LaNi_5極薄単結晶膜の作製とその中へのプロチウム吸蔵過程の原子直視動的観察Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      2000
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  軽元素修飾による局在量子構造と材料設計

    • Principal Investigator
      MORINAGA Masahiko
    • Project Period (FY)
      2000 – 2004
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  大角度暗視野STEM法を用いた非晶質半導体の金属媒介結晶化過程の原子直視研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1999
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Research Institution
      Nagoya University
  •  MgO中のPdナノクラスター内でのプロチウム形成過程の原子直視動的解析Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1999
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  表面拡散原子1個1個を追跡する研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      表面界面物性
    • Research Institution
      Nagoya University
  •  ナノスケール電子分光法の新展開と先端材料への応用

    • Principal Investigator
      田中 通義
    • Project Period (FY)
      1999
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Physical properties of metals
    • Research Institution
      Tohoku University
  •  Degradation of alloy properties by super purification and optimum design of advanced steels by the best use of impurity elements

    • Principal Investigator
      MORINAGA Masahiko
    • Project Period (FY)
      1999 – 2001
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Structural/Functional materials
    • Research Institution
      Nagoya University
  •  ナノEELSによる酸化物膜中の遷移金属ナノクラスターのスピン状態の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1998
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Research Institution
      Nagoya University
  •  超高分解能暗視野STEMを用いた非晶質半導体の金属媒介結晶化の原子直視的研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1998
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Research Institution
      Nagoya University
  •  MgO中のPdナノクラスターへの水素侵入過程の原子直視動的解析Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1998
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  高分解能電子顕微鏡による超塑性材料の粒界すべりの原子直視型その場観察

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1997
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  ナノEELSによる非磁性金属、酸化物膜中の遷移金属クラスターのスピン状態の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1997
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  孤立半導体量子ドット操作用“ナノ電子線ピンセット"の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1997 – 1998
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  Atomistic mechanical processing and visualization

    • Principal Investigator
      KIZUKA Tokushi
    • Project Period (FY)
      1997 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Material processing/treatments
    • Research Institution
      Nagoya University
  •  高分解能電子顕微鏡による超塑性材料の粒界すべりの原子直視型その場解析

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  金属-セラミックス単結晶傾斜機能膜の作製とその電気・磁気的性質の解明Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  高分解能電子顕微鏡を用いたナノ電子線加工過程における構造と伝熱のその場解析

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1995
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  Study of semiconductor/metal interfaces by coherent nano-beam electron diffraction.Principal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1995 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      NAGOYA UNIVERSITY
  •  The New Generation of Spin Polarized Electron Sources

    • Principal Investigator
      NAKANISHI Tsutomu
    • Project Period (FY)
      1995 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      素粒子・核・宇宙線
    • Research Institution
      Nagoya University
  •  Development of RHEED apparatus using spin-polarized electron source for the study of surface and interface magnetism.Principal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1995 – 1997
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      NAGOYA UNIVERSITY
  •  MgO単結晶膜上の金属フラーレン結晶の成長機構の電子顕微鏡学的研究と物性測定Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1994
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  高分解能電子顕微鏡によるナノ電子線加工過程の構造と伝熱のその場解析

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1994
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  Detailed structure-analysis by using electron probePrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1994 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      固体物性Ⅰ(光物性・半導体・誘電体)
    • Research Institution
      NAGOYA UNIVERSITY
  •  Developement of in situ structural analyzes of bonding between different materials

    • Principal Investigator
      KIZUKA Tokushi
    • Project Period (FY)
      1994 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Material processing/treatments
    • Research Institution
      Nagoya University
  •  MgO結晶中の原子クラスターの構造と物性の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  高分解能電子顕微鏡によるナノ電子線加工過程の構造と組成のその場解析

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  Studies of "buvied" metal/semiconductor interfaces by using very smoll electron probePrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1993 – 1994
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      Nagoya University
  •  γ-Fe/MgO人工格子の界面構造と磁性Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  MgO結晶中の原子クラスターの構造と拘性の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  ナノ結晶粒超塑性を利用した金属間化合物の変形能の改善

    • Principal Investigator
      木塚 徳志
    • Project Period (FY)
      1992
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  極微小電子線プロ-ブを用いた半導体ー金属界面の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1991
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  γーFe/MgO人工格子の構造と磁性Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1991
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  極微小電子線プロ-ブを用いた半導体ー金属界面の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1990
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  γーFe/MgO人工格子の構造と磁性Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1990
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  Nanometer-area-electron diffraction of strained semiconductor superlatticesPrincipal Investigator

    • Principal Investigator
      TAMAKA Nobuo
    • Project Period (FY)
      1990 – 1991
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      応用物理学一般(含航海学)
    • Research Institution
      Nagoya University
  •  極微小電子線プロ-ブを用いた半導体-金属界面の研究Principal Investigator

    • Principal Investigator
      田中 信夫
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Nagoya University
  •  Nanometer-area Electron Diffraction of Interfaces in SemiconductorPrincipal Investigator

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1988 – 1989
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Applied materials
    • Research Institution
      Nagoya University, School of Engineering
  •  Structure and Property of Single Crystalline MgO Films Embedded Fine Metal Crystallites

    • Principal Investigator
      MIHAMA Kazuhiro
    • Project Period (FY)
      1986 – 1988
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      Applied materials
    • Research Institution
      Nagoya University

All 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 Other

All Journal Article Presentation Book Patent

  • [Book] Electron Nano-imaging2017

    • Author(s)
      N. Tanaka
    • Total Pages
      333
    • Publisher
      Springer
    • ISBN
      9784431565000
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Book] Electron nano-imaging2017

    • Author(s)
      N. Tanaka
    • Total Pages
      333
    • Publisher
      Springer Publishing Company
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Book] Scanning Transmission Electron Microscopy for Nanomaterials2015

    • Author(s)
      N. Tanaka
    • Total Pages
      571
    • Publisher
      Imperial College Press
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Book] Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis2014

    • Author(s)
      N. Tanaka
    • Total Pages
      571
    • Publisher
      Imperial College Press
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Book] Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis2014

    • Author(s)
      N. Tanaka
    • Total Pages
      571
    • Publisher
      Imperial College Press
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Book] Introduction to physics for nanotechnology2007

    • Author(s)
      N, Tanaka
    • Total Pages
      240
    • Publisher
      Kyoritsu-syuppan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Book] 「ナノテクのための物理入門」8章分担執筆2007

    • Author(s)
      田中信夫
    • Total Pages
      240
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Book] 表面界面ハンドブック2004

    • Author(s)
      田中 信夫
    • Total Pages
      1500
    • Publisher
      NTS出版
    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] Catalytic etching of multi-walled carbon nanotubes controlled by oxygen gas pressure2018

    • Author(s)
      K. Yoshida, S. Arai, H. Matsumoto, M. Shirai, N. Tanaka
    • Journal Title

      ChemCatChem

      Volume: 10 Pages: 1-6

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode2016

    • Author(s)
      Makoto Kuwahara, Yoshito Nambo, Kota Aoki, Kensuke Sameshima, Xiuguang Jin, Toru Ujihara, Hidefumi Asano, Koh Saitoh, Yoshikazu Takeda, and Nobuo Tanaka
    • Journal Title

      Applied Physics Letters

      Volume: 109 Pages: 013108-013108

    • DOI

      10.1063/1.4955457

    • NAID

      120005844129

    • Peer Reviewed / Acknowledgement Compliant / Open Access / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26400417, KAKENHI-PROJECT-15K13404
  • [Journal Article] Catalytic behavior of noble metal nanoparticles for the hydrogeneration and oxidation of multiwalled carbon nanotubes2016

    • Author(s)
      K. Yoshida, S. Arai, Y. Sasaki and N. Tanaka
    • Journal Title

      Microscopy

      Volume: 65 Pages: 1-7

    • DOI

      10.1093/jmicro/dfw007

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] Further development of an environmental HVTEM for reaction science by new non-exposure transfer holder2016

    • Author(s)
      N. Tanaka, K. Higuchi, Y. Yamamoto, S. Arai and S. Ohta
    • Journal Title

      Microscopy and Microanalysis 2016

      Volume: なし Pages: 426-426

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] Graphen Quantum Dots: Structural Integrity and Oxygen Functional Groups for High Sulfur/Sulfide Utilization in Lithium Sulfur Batteries2016

    • Author(s)
      Y.-E. Sung, J. Park, J. Moon, C. Kim, J.-H. Kang, E. Lim, J. Park, K.-J.-Lee, S.-H.- Yu, J.-H. Seo, J. Lee, J. Heo, Tanaka N., S.-P.Cho, J. Pyun, J. Cabana and B.-H. Hong
    • Journal Title

      Nature Asia Materials

      Volume: 8 Pages: 272-281

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] Interfacial Fracture Strength of Micro-scale Si/Cu Components with Different Free-dege Shape2016

    • Author(s)
      Y. Takahashi, H. Kondo, K. Aihara, M. Takuma, K. Saitoh, S. Arai, S. Muto, Y. Yamamoto, K. Higuchi, N. Tanaka
    • Journal Title

      Key Engineering Materials

      Volume: 665 Pages: 169-172

    • DOI

      10.4028/www.scientific.net/kem.665.169

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PLANNED-25106004, KAKENHI-PROJECT-26249096, KAKENHI-PROJECT-25709003, KAKENHI-PROJECT-25000012
  • [Journal Article] Direct evaluation of grain boundary hydrogen embrittlement : a micro-mechanical approach2016

    • Author(s)
      Y. Takahashi, H. Kondo, R. Asano, S. Arai, K. Higuchi, Y. Yamamoto, S. Muto, N. Tanaka
    • Journal Title

      Materials Science & Engineering A

      Volume: 661 Pages: 211-216

    • DOI

      10.1016/j.msea.2016.03.035

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PLANNED-25106004, KAKENHI-PROJECT-26249096, KAKENHI-PROJECT-25709003, KAKENHI-PROJECT-25000012
  • [Journal Article] Development of an new non-exposure transfer holder for an environmental HVTEM2016

    • Author(s)
      N. Tanaka, K. Higuchi, Y. Yamamoto, S. Arai and S. Ohta
    • Journal Title

      AMTC Letter

      Volume: 5 Pages: 60-61

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] スピン偏極パルスTEMにおける超高速時間分解能とそのビーム品質2016

    • Author(s)
      桑原真人、宇治原徹、浅野秀文、齋藤晃、田中信夫
    • Journal Title

      顕微鏡

      Volume: 50 Pages: 151-155

    • NAID

      130007701778

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Journal Article] Fabrication of Si theomoelectric nanomaterials coating ultrasmall epitaxial Ge nanodots with an ultrahigh density2015

    • Author(s)
      S. Yamasaka, Y. Nakamura, T. Ueda, S. Takeuchi, Y. Yamamoto, S. Arai, T. Tanji, N. Tanaka and A. Sakai
    • Journal Title

      J. Electronic Materials

      Volume: 44 Pages: 2015-2020

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-Corrected TEM2015

    • Author(s)
      J. Yamasaki, M. Mori, Masayuki, A. Hirata, Y. Hirotsu, N. Tanaka
    • Journal Title

      Microscopy and Microanalysis

      Volume: 151 Pages: 1135-1136

    • DOI

      10.1016/j.ultramic.2014.11.005

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-24360260, KAKENHI-PROJECT-24656400, KAKENHI-PLANNED-26105009, KAKENHI-PROJECT-26286049, KAKENHI-PROJECT-26310205
  • [Journal Article] In situ micro-mechanical testing of grain boundaries combined with environmental TEM2015

    • Author(s)
      Y. Takahashi, S. Arai, Y. Yamamoto, K. Higuchi, H. Kondo, Y. Kitagawa, S. Muto, N. Tanaka
    • Journal Title

      Experimental Mechanics

      Volume: 未定 Pages: 1047-1056

    • DOI

      10.1007/s11340-015-0008-2

    • Description
      accepted in printing
    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-25000012, KAKENHI-PLANNED-25106004, KAKENHI-PROJECT-25709003, KAKENHI-PROJECT-26246006
  • [Journal Article] Spatial and temporal coherence in spin-polarized transmission electron microscopy2014

    • Author(s)
      M, Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, N. Tanaka
    • Journal Title

      AMTC Letters

      Volume: 4 Pages: 262-263

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Nano-scale characterization of GaAsP/GaAs strained superlattice structure by nanobeam electron diffraction2014

    • Author(s)
      Xiuguang Jin, Hirotaka Nakahara, Koh Saitoh, Nobuo Tanaka, and Yoshikazu Takeda
    • Journal Title

      Appl. Phys. Lett

      Volume: VOL. 104 Pages: 113106-113106

    • DOI

      10.1063/1.4869030

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23241036, KAKENHI-PROJECT-23246003, KAKENHI-PROJECT-23760310, KAKENHI-PROJECT-24651123, KAKENHI-PROJECT-25390066, KAKENHI-PROJECT-26286014
  • [Journal Article] Whole-Cell Imaging of the BuddinfYeast Saccharomyces cerevisiae by High-Voltage Scanning Transmission Electron Tomography2014

    • Author(s)
      Murata, K., Esaki, M., Ogura, T., Arai, S., Yamamoto, Y., and Tanaka, N.
    • Journal Title

      Ultramicroscopy

      Volume: 146 Pages: 39-45

    • DOI

      10.1016/j.ultramic.2014.05.008

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24370056, KAKENHI-PROJECT-26246006
  • [Journal Article] Dynamic observation from continuous to well-controlled pulsed electron beam in Nagoya University2014

    • Author(s)
      N. Tanaka, M. Kuwahara, S. Arai, K. Sasaki and N. Tanaka
    • Journal Title

      AMTC Letters

      Volume: 4 Pages: 58-59

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] ETEM observation of Pt/C electrode catalysts in a moisturized cathode atmosphere2014

    • Author(s)
      K. Yoshida, X. Zhang, N. Tanaka, E. D. Boyes and P. L. Gai
    • Journal Title

      Journal of Physics: Conference Series

      Volume: 522

    • DOI

      10.1088/1742-6596/522/1/012007

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Journal Article] Dynamic observation from continuous to well-controlled pulsed electron beam in Nagoya University2014

    • Author(s)
      N. Tanaka, M. Kuwahara, S. Arai, K. Sasaki and K. Saitoh
    • Journal Title

      AMTC Letters

      Volume: 4 Pages: 58-59

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Development of an environmental high voltage electron microscope and its application to nano and bio-materials2014

    • Author(s)
      N. Tanaka, J. Usukura, M. Kusunoki, Y. Saito, K. Sasaki, T. Tanji, S. Muto, S. Arai
    • Journal Title

      Journal of Physics: Conference Series

      Volume: 522

    • DOI

      10.1088/1742-6596/522/1/012008

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PLANNED-25106004, KAKENHI-PROJECT-25630280, KAKENHI-PROJECT-26246006
  • [Journal Article] Coherence of a spin-polarized electron beam emitted from a semiconductor photocathode in2014

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Saitoh, X. G. Jin, T. Ujihara, H. Asano, Y. Takeda, N. Tanaka
    • Journal Title

      Applied Physics Letters

      Volume: 105 Pages: 193101-193101

    • DOI

      10.1063/1.4901745

    • Peer Reviewed / Acknowledgement Compliant / Open Access
    • Data Source
      KAKENHI-PROJECT-24651123, KAKENHI-PROJECT-25390066, KAKENHI-PROJECT-25706031, KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-26286014, KAKENHI-PROJECT-26400417
  • [Journal Article] Nano-second Time-Resolved Measurement in Spin-Polarized Pulse TEM2014

    • Author(s)
      Y. Nambo, M. Kuwahara, S. Kusunoki, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, N. Tanaka
    • Journal Title

      AMTC Letters

      Volume: 4 Pages: 256-256

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Statistical distribution of single atoms and clusters of supported Au catalyst analyzed by global high-resolution HAADF-STEM observation with morphological image-processing operation2014

    • Author(s)
      Yamamoto, S. Arai, A. Esaki, J. Ohyama, A. Satsuma and N. Tanaka
    • Journal Title

      Microscopy

      Volume: 63 Pages: 209-218

    • DOI

      10.1093/jmicro/dfu001

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-24651123, KAKENHI-PROJECT-25820393, KAKENHI-PROJECT-26246006
  • [Journal Article] Propagation Dynamics of Electron Vortex Pairs2013

    • Author(s)
      Y. Hasegawa, K. Saitoh, N. Tanaka, and M. Uchida
    • Journal Title

      Journal of the Physical Society of Japan

      Volume: 82 Pages: 073402-073402

    • NAID

      210000132625

    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] Key factors for the dynamic ETEM observation of single atoms2013

    • Author(s)
      K. Yoshida, T. Tominaga, T. Hanatani, A. Tagami, Y. Sasaki, J. Yamasaki, K. Saitoh, and N. Tanaka
    • Journal Title

      Microscopy

      Volume: VOL. 62 Pages: 571-582

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Young’s Interference Experiment with Electron Beams Carrying Orbital Angular Momentum2013

    • Author(s)
      Yuya Hasegawa
    • Journal Title

      Journal of the Physical Society of Japan

      Volume: 82 Issue: 3 Pages: 033002-033002

    • DOI

      10.7566/jpsj.82.033002

    • NAID

      210000132432

    • ISSN
      0031-9015, 1347-4073
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22540410, KAKENHI-PROJECT-23241036
  • [Journal Article] Study of microstructure and interdiffusion behavior of β-FeSi2 flat-islands grown on Si (111) surfaces2013

    • Author(s)
      S. -P. Cho, Y. Nakamura, J. Yamasaki, E. Okunishi, M. Ichikawa and N. Tanaka
    • Journal Title

      J. Appl. Crystallogr.

      Volume: VOL. 46 Pages: 1076-1080

    • DOI

      10.1107/s0021889813015355

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Phase-locking of oscillating images using laser-induced spin-polarized pulse TEM2013

    • Author(s)
      M. Kuwahara, Y. Nambo, S. Kusunokk, X. Jin, K. Saitoh, H. Asano, T. Ujihara, Y. Takeda, T. Nakanishi, and N. Tanaka
    • Journal Title

      Microscopy Advance Access

      Volume: 62 Pages: 607-607

    • DOI

      10.1093/jmicro/dft035

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005, KAKENHI-PROJECT-23241036, KAKENHI-PROJECT-24651123, KAKENHI-PROJECT-25390066, KAKENHI-PROJECT-25706031
  • [Journal Article] Phase-locking of oscillating images using laser-induced spin-polarized pulse TEM2013

    • Author(s)
      M. Kuwahara, Y. Nambo, S. Kusunoki, X Jin, K. Saitoh, H. Asano, T. Ujihara, Y. Takeda, T. Nakanishi and N. Tanaka
    • Journal Title

      Microscopy

      Volume: VOL. 62 Pages: 607-614

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] スピン偏極パルス透過型顕微鏡の開発-偏極電子源の原理とその応用2013

    • Author(s)
      桑原真人、中西彊、竹田美和、田中信夫
    • Journal Title

      顕微鏡

      Volume: 48巻1号 Pages: 3-8

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Measuring the Orbital Angular Momentum of Electron Vortex Beams Using a Forked Grating2013

    • Author(s)
      Koh Saitoh, Yuya Hasegawa, Kazuma Hirakawa, Nobuo Tanaka, and Masaya Uchida
    • Journal Title

      Physical Review Letters

      Volume: 111 Pages: 74801-74801

    • DOI

      10.1103/physrevlett.111.074801

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] Key factors for the dynamic ETEM observation of single atoms2013

    • Author(s)
      K. Yoshida, T. Tominaga, T. Hanatani, A. Tagami, Y. Sasaki, J. Yamasaki, K. Saitoh, and N. Tanaka
    • Journal Title

      Microsc.

      Volume: 62 Pages: 571-582

    • DOI

      10.1093/jmicro/dft033

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-23241036, KAKENHI-PROJECT-24710110
  • [Journal Article] Measuring the Orbital Angular Momentum of Electron Vortex Beams Using a Forked Grating2013

    • Author(s)
      K. Saitoh, Y. Hasegawa, K. Hirakawa, N. Tanaka, and M. Uchida
    • Journal Title

      Physical Review Letters

      Volume: 111 Pages: 74801-74801

    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] mprovement of the precision of lattice parameter determination by nano-beam electron diffraction2013

    • Author(s)
      K. Saitoh, H. Nakahara, and N. Tanaka
    • Journal Title

      Microscopy

      Volume: 62 Pages: 533-539

    • DOI

      10.1093/jmicro/dft023

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23241036
  • [Journal Article] Propagation Dynamics of Electron Vortex Pairs2013

    • Author(s)
      Yuya Hasegawa, Koh Saitoh, Nobuo Tanaka, and Masaya Uchida
    • Journal Title

      Journal of the Physical Society of Japan

      Volume: 82 Issue: 7 Pages: 073402-073402

    • DOI

      10.7566/jpsj.82.073402

    • NAID

      210000132625

    • ISSN
      0031-9015, 1347-4073
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] Phase-locking of oscillating images using laser-induced spin-polarized pulse TEM2013

    • Author(s)
      M. Kuwahara, Y. Nambo, S. Kusunoki, X Jin, K. Saitoh, H. Asano, T. Ujihara, Y. Takeda, T. Nakanishi and N. Tanaka
    • Journal Title

      Microscopy

      Volume: 62(6) Pages: 607-614

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] スピン偏極パルス透過型顕微鏡の開発-偏極電子源の原理とその応用2013

    • Author(s)
      桑原真人、中西彊、竹田美和、田中信夫
    • Journal Title

      顕微鏡

      Volume: 48 Pages: 3-8

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Production of electron vortex beams carrying large orbital angular momentum using spiral zone plates2012

    • Author(s)
      K. Saitoh, Y. Hasegawa, N. Tanaka, and M. Uchida
    • Journal Title

      Journal of Electron Microscopy

      Volume: 61(3) Pages: 171-177

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] 30-kV spin-polarized transmission electron microscope with GaAs-GaAsP strained superlattice photocathode2012

    • Author(s)
      M. Kuwahara, S. Kusunoki, X. G. Jin, T. Nakanishi, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, and N. Tanaka
    • Journal Title

      Applied Physics Letters

      Volume: 101(3) Pages: 33102-33102

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Structural and electrical properties of half-Heusler LaPtBi thin films grown by 3-source magnetron co-sputtering2012

    • Author(s)
      T.Miyawaki, N.Sugimoto, N.Fukatani, T.Yoshihara, K.Ueda, N.Tanaka, Asano
    • Journal Title

      J.Appl.Phys

      Volume: 111

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Production of electron vortex beams carrying large orbital angular momentum using spiral zone plates2012

    • Author(s)
      K. Saitoh, Y. Hasegawa, N. Tanaka, and M. Uchida
    • Journal Title

      Journal of Electron Microscopy

      Volume: 61 Pages: 171-177

    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] Polytype Transformation by Replication of Stacking Faults Formed by Two-Dimensional Nucleation on Spiral Steps during SiC Solution Growth2012

    • Author(s)
      S. Harada, K. Seki, Y. Yamamoto, C. Zhu, Y. Yamamoto, S. Arai, J. Yamasaki, N. Tanaka and T. Ujihara
    • Journal Title

      Crystal Growth & Design

      Volume: 12 Pages: 3209-3214

    • DOI

      10.1021/cg300360h

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23246004
  • [Journal Article] Fabrication of LaPtBi thin films by 3-source sputtering2012

    • Author(s)
      N.Sugimoto, T.Miyawaki, N.Fukatani, T.Yoshihara, K.Ueda, N.Tanaka, H.Asano
    • Journal Title

      J.Magn.Soc.Jpn

      Volume: (未定)(掲載確定)

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation2012

    • Author(s)
      Xiuguang Jin, Hirotaka Nakahara, Koh Saitoh, Takashi Saka, Toru Ujihara, Nobuo Tanaka, Yoshikazu Takeda
    • Journal Title

      Journal of Crystal Growth

      Volume: 353 Pages: 84-87

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Development of spin-polarized and pulsed TEM2012

    • Author(s)
      M Kuwahara, F.Ichihashi, S.Kusunoki, Y Takeda, K Saitoh, T Ujihara, H Asano, T.Nakanishi, N Tanaka
    • Journal Title

      Journal of Physics : Conference Seriese

      Volume: (未定)(掲載確定)

    • NAID

      130007640949

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] 30-kV spin-polarized transmission electron microscope with GaAs-GaAsP strained superlattice photocathode2012

    • Author(s)
      M. Kuwahara, S. Kusunoki, X. G. Jin, T. Nakanishi, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, and N. Tanaka
    • Journal Title

      Applied Physics Letters

      Volume: 101(3) Pages: 33102-33102

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation2012

    • Author(s)
      Xiuguang Jin, Hirotaka Nakahara, Koh Saitoh, Takashi Saka, Toru Ujihara, Nobuo Tanaka, Yoshikazu Takeda
    • Journal Title

      Journal of Crystal Growth

      Volume: 353 Pages: 84-87

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Journal Article] Electron interference from an amorphous thin film on a crystal transmission electron microscopy specimen2012

    • Author(s)
      R. A. Herring
    • Journal Title

      Journal of Electron Microscopy

      Volume: 61 Pages: 17-23

    • DOI

      10.1093/jmicro/dfr087

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20246013, KAKENHI-PROJECT-23241036
  • [Journal Article] Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation2012

    • Author(s)
      X. G. Jin, H. Nakahara, K. Saitoh, T. Saka, T. Ujihara, N. Tanaka, Y. Takeda
    • Journal Title

      Journal of Crystal rowth

      Volume: 353 Pages: 84-87

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Development of spin-polarized and pulsed TEM2012

    • Author(s)
      M Kuwahara, F. Ichihashi, S. Kusunoki, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, T. Nakanishi, N. Tanaka
    • Journal Title

      Journal of Physics : Conference Series

      Volume: 371 Pages: 12004-12004

    • NAID

      130007640949

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation2012

    • Author(s)
      X. Jin, H. Nakahara, K. Saitoh, T. Saka, T. Ujihara, N. Tanaka, Y. Takeda
    • Journal Title

      Journal of Crystal Growth

      Volume: 353 Pages: 84-87

    • DOI

      10.1016/j.jcrysgro.2012.05.017

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23246003, KAKENHI-PROJECT-23760310
  • [Journal Article] Structural and electrical properties of half-Heusler LaPtBi thin films grown by 3-source magnetron co-sputtering2012

    • Author(s)
      T. Miyawaki, N. Sugimoto, N. Fukatani, T. Yoshihara, K. Ueda, N. Tanaka, and H. Asano
    • Journal Title

      J. Appl. Phys

      Volume: 111

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Production of electron vortex beams carrying large orbital angular momentum using spiral zone plates2012

    • Author(s)
      Koh Saitoh, Yuya Hasegawa, Nobuo Tanaka, Masaya Uchida
    • Journal Title

      Journal of Electron Microscopy

      Volume: 59(5) Pages: 387-394

    • DOI

      10.1093/jmicro/dfs036

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] tomistic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(001) interface by aberration-corrected transmission electron microscopy2012

    • Author(s)
      J. Yamasaki, S. Inamoto, Y. Nomura, H. Tamaki, and N. Tanaka
    • Journal Title

      Journal of Physics D: Applied Physics

      Volume: 45 Pages: 494002-494002

    • DOI

      10.1088/0022-3727/45/49/494002

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23760030
  • [Journal Article] Young's Interference Experiment with Electron Beams Carrying Orbital Angular Momentum2012

    • Author(s)
      Y. Hasegawa, K. Saitoh, N. Tanaka, S. Tanimura and M. Uchida
    • Journal Title

      Journal of the Physical Society of Japan

      Volume: 82 Pages: 33002-33002

    • NAID

      210000132432

    • Data Source
      KAKENHI-PROJECT-23241036
  • [Journal Article] Development of spin-polarized transmission electron microscope2011

    • Author(s)
      M. Kuwahara, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, T. Nakanishi, and N Tanaka
    • Journal Title

      Journal of Physics : Conference Seriese

      Volume: 298 Pages: 12016-12016

    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Development of spin-polarized transmission electron microscope2011

    • Author(s)
      M.Kuwahara, Y.Takeda, K.Saitoh, T.Ujihara, H.Asano, T.Nakanishi, N Tanaka
    • Journal Title

      Journal of Physics : Conference Seriese

      Volume: 298 Pages: 12016-12016

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Atomic arrangement at the 3C-SiC/Si(001) interface revealedutilizing aberration-corrected transmission electron microscope2011

    • Author(s)
      S. Inamoto, J. Yamasaki, H. Tamaki, and N. Tanaka
    • Journal Title

      Philosophical Magazine Letters

      Volume: 91 Pages: 632-639

    • DOI

      10.1080/09500839.2011.600730

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011, KAKENHI-PROJECT-23760030
  • [Journal Article] Three-dimensional reconstruction of the atomic arrangement of icosahe dral quasicrystals by binary discrete tomography2011

    • Author(s)
      Y.Ishibashi, H.Sugiura, K.Saitoh, N.Tanaka
    • Journal Title

      Philosophical Magazine Letters

      Volume: 91 Pages: 2519-2527

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture2011

    • Author(s)
      Shigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
    • Journal Title

      Journal of Electron Microscopy

      Volume: 60(2) Pages: 101-108

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Atomic arrangement at the 3C-SiC/Si(001) interface revealed utilizing a berration-corrected transmission electron microscope2011

    • Author(s)
      S.Inamoto, J.Yamasaki, H.Tamaki, N.Tanaka
    • Journal Title

      Philosophical Magazine Letters

      Volume: 91(9) Pages: 632-639

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Specific Surface Area and Three-Dimensional Nanostructure Measurements of Porous Titania Photocatalysts by Electron Tomography and Their Relation to Photocatalytic Activity2011

    • Author(s)
      Kenta Yoshida, Masaki Makihara, Nobuo Tanaka, Shinobu Aoyagi, Eiji Nishibori, Makoto Sakata, Edward D.Boyes, Pratibha L.Gai
    • Journal Title

      Microscopy and Microanalysis

      Volume: 17 Pages: 264-273

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe2010

    • Author(s)
      K.Saitoh, Y.Tatara, N.Tanaka
    • Journal Title

      J.Electron Microsc

      Volume: 59 Pages: 387-394

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Automated mapping of lattice parameters and lattice bending strain near a SiGe/Si interface by using split HOLZ line patterns2010

    • Author(s)
      K.Saitoh, Y.Yasuda, N.Tanaka
    • Journal Title

      International Journal of Advanced Microscopy and Theoretical Calculations 2

      Pages: 38-39

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Journal Article] Determination of a lattice strain field by iterative phase retrieval of rocking curves of HOLZ reflections2010

    • Author(s)
      K.Saitoh, M.Hamabe, S.Morishita, J.Yamasaki, N.Tanaka
    • Journal Title

      International Journal of Advanced Microscopy and Theoretical Calculations 2

      Pages: 120-121

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Journal Article] Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns2010

    • Author(s)
      K.Saitoh, Y.Yasuda, M.Hamabe, N.Tanaka
    • Journal Title

      J.Electron Microsc.

      Volume: 59 Pages: 367-378

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Annealing effects on a high-K lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy2010

    • Author(s)
      Shin Inamoto, Jun Yamasaki, Eiji Okunishi, Kuniyuki Kakushima, Hiroshi Iwai, Nobuo Tanaka
    • Journal Title

      Journal of Applied Physics

      Volume: 107 Pages: 124510-10

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe2010

    • Author(s)
      K.Saitoh, Y.Tatara, N.Tanaka
    • Journal Title

      Journal of Electron Microscopy 59

      Pages: 387-394

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Journal Article] Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy2010

    • Author(s)
      S.Inamoto, J.Yamasaki, E.Okunishi, K.Kakushima, H.Iwai, N.Tanaka
    • Journal Title

      J.Appl.Phys.

      Volume: 107

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns2010

    • Author(s)
      K.Saitoh, Y.Yasuda, M.Hamabe, N.Tanaka
    • Journal Title

      J.Electron Microsc

      Volume: 59 Pages: 367-378

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Coherent electron interference from amorphous TEM specimens2010

    • Author(s)
      R.A.Herring, K.Saitoh, N.Tanaka, T.Tanji
    • Journal Title

      J.Electron Microsc

      Volume: 59 Pages: 321-330

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Journal Article] Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe2010

    • Author(s)
      K.Saitoh, Y.Tatara, N.Tanaka
    • Journal Title

      J.Electron Microsc.

      Volume: 59 Pages: 387-394

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO2 coverage2008

    • Author(s)
      N. Tanaka, S.-P. Cho, A. A. Shklyaev J. Yamasaki, E. Okunishi and M. Ichikawa
    • Journal Title

      App. Sur. Sci 254

      Pages: 7569-7569

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] In-situ monitoring of nucleation and evolution of Ge nanodots on faintly oxidized Si(111)surfaces2008

    • Author(s)
      Sung-Pyo Cho, Shinji Kawano, Nobuo Tanaka
    • Journal Title

      Applied Surface Science 255

      Pages: 7868-7871

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] Automated lattice-parameter determination by using HOLZ line patterns2008

    • Author(s)
      K.Saitoh, Y.Yasuda, N.Tanaka
    • Journal Title

      International Journal of Advanced Microscopy and Theoretical Calculations 1

      Pages: 90-91

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Journal Article] in-situ monitoring of nucleation and evolution of Ge nanodots on faintly oxidized Si (111) surfaces2008

    • Author(s)
      Sung-Pyo Cho, Shinji Kawano and Nobuo Tanaka
    • Journal Title

      Applied Surface Science 印刷中

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] Automated lattice-parameter determination by using HOLZ line patterns2008

    • Author(s)
      K. Saitoh, Y. Yasuda N. Tanaka
    • Journal Title

      International Journal of Advanced Microscopy and Theoretical Calculations 1

      Pages: 90-91

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Journal Article] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO_2 coverage2008

    • Author(s)
      N. Tanaka, S. -P. Cho, A. A. ShklyaevJ. Yamasaki, E. Okunishi M. Ichikawa
    • Journal Title

      Applied Surface Science 255

      Pages: 7569-7572

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] In-situ monitoring of nucleation and evolution of Ge nanodots on faintly oxidized Si(111) surfaces2008

    • Author(s)
      Sung-Pyo Cho, Shinji Kawano and Nobuo Tanaka
    • Journal Title

      App. Sur. Sci 254

      Pages: 7868-7868

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007

    • Author(s)
      Hirahara, K., Yamasaki, J., Saitoh, K. and Tanaka, N
    • Journal Title

      Microscopy and Microanalysis

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Hierarchical Morphologies Formed by ABC Star-Shaped Terpolymers2007

    • Author(s)
      K. Hayashida, A. Takano, N. Tanaka, Y. Matsushita
    • Journal Title

      Macromolecules 40

      Pages: 3695-3699

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17205021
  • [Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007

    • Author(s)
      Hirahara, K., Yamasaki, J., Saitoh, K. and Tanaka N
    • Journal Title

      Microscopy and Microanalysis

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007

    • Author(s)
      Hirahara, K., Yamasaki, J., Saitoh, K., Tanaka, N
    • Journal Title

      Microscopy and Microanalysis 890CD-891CD

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Composition dependence of Nanophase-separated Structures Formed by Star-shaped Terpolymers of the A_<1.0>B_<1.0>C_x type2007

    • Author(s)
      A. Takano, W. Kawashima, S. Wada, K. Hayashida, S. Sato, K. Hirahara, S. Kawahara, Y. Isom, N. Tanaka, D. Kawaguchi, Y. Matsushita
    • Journal Title

      J.Polym. Sci., Part B, Polym. Phys 45

      Pages: 2277-2283

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17205021
  • [Journal Article] Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy2007

    • Author(s)
      Hirata, A., Hirotsu, Y., Nieh, T. G., Ohkubo, T. and Tanaka, N
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Direct Imaging of Local Atomic Ordering in a Pd-Ni-P Bulk Metallic Glass Using Cs-Corrected Transmission Electron Microscopy2007

    • Author(s)
      Akihiko, Hirata, Yoshihiko, Hirotsu, T.G. Nieh, Tadakatsu, Ohkubo, Nobuo, Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2007

    • Author(s)
      J. Yamasaki, T. Kawai, N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54

      Pages: 209-214

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Direct Imaging of Local Atomic Ordering in a Pd-Ni-P Bulk Metallic Glass Using Cs-Corrected Transmission Electron Microscopy2007

    • Author(s)
      Akihiko Hirata, Yoshihiko Hirotsu, T.G.Nieh, Tadakatsu Ohkubo, Nobuo Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] UHV in-situ とCs corrected HRTEMによる極薄Si酸化膜上でのGeナノドットの核形成・成長、および微細構造の評価2007

    • Author(s)
      趙星彪, 川野晋司, 齋藤晃, 山崎順, 田中信夫
    • Journal Title

      日本結晶成長学会誌 Vol.34, No.3

      Pages: 10-10

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] UHV in-situとCs corrected HRMEMによる極薄Si酸化膜上でのGeナノドットの核形成・成長、および微細構造の評価2007

    • Author(s)
      趙星彪, 川野晋司, 齋藤晃, 山崎順, 田中信夫
    • Journal Title

      日本結晶成長学会誌 34

      Pages: 10-10

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Journal Article] Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmiccion electron microscopy2007

    • Author(s)
      Akihiko Hirata, Yoshihiko Hirotsu, T.G.Nieh, Tadakatsu Ohkubo, Nobuo Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-116

    • Data Source
      KAKENHI-PROJECT-18029011
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2007

    • Author(s)
      J. Yamasaki, H. Sawada, N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54

      Pages: 123-126

    • NAID

      10016683055

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy2007

    • Author(s)
      Akihiko Hirata, Yoshihiko Hirotsu, T. G. Nieh, Tadakatsu Ohkubo, and Nobuo Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] C_sコレクター電顕による金属ガラスの局所構造観察2006

    • Author(s)
      平田秋彦, 弘津禎彦, 大久保忠勝, 田中信夫
    • Journal Title

      まてりあ 45

      Pages: 848-848

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Local atomic ordering and nanoscale phase separation in a Pd-Ni-P bulk metallic glass2006

    • Author(s)
      Yoshihiko Hirotsu, T.G.Nieh, Akihiko Hirata, Tadakatsu Ohkubo, Nobuo Tanaka
    • Journal Title

      PHYSICAL REVIEW B73

      Pages: 12205-12205

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM2006

    • Author(s)
      Kaori Hirahara, Koh Saitoh, Jun Yamasaki, and Nobuo Tanaka
    • Journal Title

      NANO LETTERS Vol.6, No.8

      Pages: 1778-1783

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Local atomic structure of Pd-Ni-P bulk metallic glass examined by high-resolution electron microscopy and electron diffraction2006

    • Author(s)
      Akihiko Hirata, Yoshihiko Hirotsu, Tadakatsu Ohkubo, Nobuo Tanaka, T.G. Nieh
    • Journal Title

      Intermetallics 14

      Pages: 903-903

    • Data Source
      KAKENHI-PROJECT-18029011
  • [Journal Article] Local atomic ordering and nanoscale phase separation in a Pd-Ni-P bulk metallic glass2006

    • Author(s)
      Yoshihiko Hirotsu, T. G. Nieh, Akihiko Hirata, Tadakatsu Ohkubo, and Nobuo Tanaka
    • Journal Title

      PHYSICAL REVIEW B73

      Pages: 12205-12205

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM2006

    • Author(s)
      Kaori Hirahara, Koh Saitoh, Jun Yamasaki, Nobuo Tanaka
    • Journal Title

      NANO LETTERS Vol.6,No.8

      Pages: 1778-1783

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Structural insight of human DEAD-box protein rck/p54 into its substrate recognition with conformational changes2006

    • Author(s)
      Matsui T, Hogetsu K, Usukura J, Sato T, Kumasaka T, Akao Y, Tanaka N.
    • Journal Title

      Genes Cells 11

      Pages: 439-452

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18370062
  • [Journal Article] Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM2006

    • Author(s)
      Kaori, Hirahara, Koh, Saitoh, Jun, Yamasaki, Nobuo, Tanaka
    • Journal Title

      NANO LETTERS 6

      Pages: 1778-1783

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Local atomic ordering and nanoscale phase separation in a Pd-Ni-P bulk metallic glass2006

    • Author(s)
      Yoshihiko, Hirotsu, T.G. Nieh, Akihiko, Hirata, Tadakatsu, Ohkubo, Nobuo, Tanaka
    • Journal Title

      PHYSICAL REVIEW 14

      Pages: 903-907

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005

    • Author(s)
      J.Yamasaki, H.Sawada, N.Tanaka
    • Journal Title

      J. Electron Microsc. 52

      Pages: 123-126

    • NAID

      10016683055

    • Data Source
      KAKENHI-PROJECT-17029030
  • [Journal Article] 球面収差補正による高分解能電子顕微鏡法の分解能向上2005

    • Author(s)
      田中信夫
    • Journal Title

      日本結晶学会誌 47,No.1

      Pages: 20-25

    • NAID

      10014463364

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005

    • Author(s)
      J. Yamasaki, H. Sawada, and N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・2

      Pages: 123-126

    • NAID

      10016683055

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2005

    • Author(s)
      J. Yamasaki, T. Kawai, and N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・3

      Pages: 209-214

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] 球面収差補正によるHRTEMの分解能向上2005

    • Author(s)
      田中 信夫
    • Journal Title

      日本結晶学会誌 47

      Pages: 20-20

    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2005

    • Author(s)
      J.Yamasaki, T.Kawai, N.Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・3

      Pages: 209-214

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005

    • Author(s)
      J.Yamasaki, H.Sawada, N.Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・2

      Pages: 123-126

    • NAID

      10016683055

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] 電子エネルギー損失分光法(EELS)2005

    • Author(s)
      田中信夫
    • Journal Title

      ナノマテリアル技術体系-ナノ金属-(フジテクノシステム) 3-1章

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Three-dimensional Analysis of Platinum Supercrystals by TEM and HAADF-STEM2004

    • Author(s)
      J.Yamasaki, N.Tanaka, N.Baba, O.Terasaki
    • Journal Title

      Philo.Mag. 84

      Pages: 2819-2828

    • Data Source
      KAKENHI-PROJECT-12130203
  • [Journal Article] Direct observation of staking fault in Si-Ge semiconductors by Cs-corrected TEM and ADF-STEM2004

    • Author(s)
      J.Yamasaki, T.Kawai, N.Tanaka
    • Journal Title

      J.Electron Microscopy 53

      Pages: 129-129

    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] Microstructure Change of Vanadium Clusters ZnO Crystalline Films by Heat Treatment2004

    • Author(s)
      H.Pan, A.Ohno, N.Tanaka
    • Journal Title

      Nanotechnology 15

    • Data Source
      KAKENHI-PROJECT-12130203
  • [Journal Article] A Trial for Quantitative TEM-EELS Measurement of Photocatalysts by TiO_2 Films2004

    • Author(s)
      K.Yoshida, J.Yamasaki, N.Tanaka
    • Journal Title

      Nanotechnology 15

    • Data Source
      KAKENHI-PROJECT-12130203
  • [Journal Article] First observation of In_xGa_<1-x>As quantum dots in GaP by spherical aberration corrected HRTEM2004

    • Author(s)
      N.Tanaka, J.Yamasaki, S.Fuchi, Y.Takeda
    • Journal Title

      Microscopy and Microanal 10

      Pages: 139-139

    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] First observation of SiO_2/Si(100) by spherical aberration corrected HRTEM2003

    • Author(s)
      N.Tanaka, J.Yamasaki, K.Usuda, N.Ikarashi
    • Journal Title

      J.Electron Microscopy 52.1

      Pages: 69-69

    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] 球面収差補正TEMによる半導体界面の微構造の観察2003

    • Author(s)
      田中 信夫
    • Journal Title

      まてりあ 42

      Pages: 895-895

    • Data Source
      KAKENHI-PROJECT-15656010
  • [Journal Article] 球面収差補正TEM法の材料研究への応用

    • Author(s)
      山崎 順, 田中 信夫
    • Journal Title

      特集 : 収差補正技術を用いた応用研究最前線

    • NAID

      10018130997

    • Data Source
      KAKENHI-PROJECT-17201022
  • [Journal Article] Oxygen release and structural dhanges in TiO_2 films during photocatalytic oxidation.

    • Author(s)
      K.Yoshida, T.nanbara, J.Yamasaki, N.Tanaka
    • Journal Title

      J. Appl Phys. (In print)

    • Data Source
      KAKENHI-PROJECT-17029030
  • [Journal Article] Oxygen release and structural changes in TiO_2 films during photocatalytic oxidation.

    • Author(s)
      K.Yoshida, T.Nanbara, J.Yamasaki, N.Tanaka
    • Journal Title

      J.Appl.Phys. (In print)

    • Data Source
      KAKENHI-PROJECT-17029030
  • [Patent] 反射電子を検出する走査電子顕微鏡2017

    • Inventor(s)
      桑原真人、田中信夫、宇治原徹、齋藤晃
    • Industrial Property Rights Holder
      桑原真人、田中信夫、宇治原徹、齋藤晃
    • Industrial Property Rights Type
      特許
    • Patent Publication Number
      2017-004774
    • Filing Date
      2017-01-05
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Patent] スピン偏極電子線のコヒーレンス測定装置と、その利用方法2016

    • Inventor(s)
      桑原真人、田中信夫、宇治原徹、齋藤晃
    • Industrial Property Rights Holder
      桑原真人、田中信夫、宇治原徹、齋藤晃
    • Industrial Property Rights Type
      特許
    • Filing Date
      2016-04-14
    • Overseas
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Patent] 分析装置2015

    • Inventor(s)
      桑原真人、田中信夫、齋藤晃、宇治原徹
    • Industrial Property Rights Holder
      桑原真人、田中信夫、齋藤晃、宇治原徹
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2015-121398
    • Filing Date
      2015-06-16
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Patent] スピンコヒーレンス測定装置2014

    • Inventor(s)
      桑原真人、田中信夫、齋藤晃、宇治原徹
    • Industrial Property Rights Holder
      桑原真人、田中信夫、齋藤晃、宇治原徹
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2014-208345
    • Filing Date
      2014-10-09
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Patent] 電子顕微鏡2013

    • Inventor(s)
      田中信夫、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、桑原真人
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2013-01-10
    • Overseas
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Patent] 電子顕微鏡2013

    • Inventor(s)
      田中信夫、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、桑原真人
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2013-02-06
    • Overseas
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Patent] 電子顕微鏡2013

    • Inventor(s)
      田中信夫、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、桑原真人
    • Industrial Property Rights Holder
      田中信夫、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、桑原真人
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2012-508141
    • Filing Date
      2013-01-10
    • Overseas
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Patent] 電子顕微鏡2011

    • Inventor(s)
      田中信夫、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、桑原真人
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2012-508141
    • Filing Date
      2011-02-22
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Future prospects of environmental transmission electron microscopy2017

    • Author(s)
      N. Tanaka
    • Organizer
      Nature Conference in Hangzhou
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Precise measure of the depth resolution in aberration-corrected TEM2017

    • Author(s)
      Jun Yamasaki, Koh Saitoh, and Nobuo Tanaka
    • Organizer
      日本顕微鏡学会 第73回学術講演会
    • Invited
    • Data Source
      KAKENHI-PROJECT-16K13688
  • [Presentation] Past and future prospects of Cs-corrected TEM for nanomaterials2017

    • Author(s)
      N. Tanaka
    • Organizer
      International Symposium of SALVE project
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Development and future directions of environmental high-voltage scanning transmission electron microscopy2017

    • Author(s)
      N. Tanaka
    • Organizer
      International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Structure & Dynamics of Radiation-Produced Defects in Metals: Comparison between Electron and Self-ion Irradiations2016

    • Author(s)
      Kazuto Arakawa, Ryota Nagasawa, Cedric Baumier, Brigitte Decamps, Estelle Meslin, Francois Willaime, Hidehiro Yasuda, Hirotaro Mori, Shigeo Arai, Nobuo Tanaka, Takafumi Amino, Shiori Ishino
    • Organizer
      The Fourth Workshop On TEM With In Situ Irradiation (WOTWISI-4)
    • Place of Presentation
      Orsay & Gif sur Yvette
    • Year and Date
      2016-03-16
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H04244
  • [Presentation] Research direction of environmental TEM for nano-materials2016

    • Author(s)
      Nobuo Tanaka
    • Organizer
      11th Asia-Pacific Microscopy Conference
    • Place of Presentation
      Phuket island, Thai
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Further development of an environmental HVTEM for reaction science by new non-exposure transfer holder2016

    • Author(s)
      Nobuo Tanaka
    • Organizer
      Microscopy & Microanalysis 2016 Meeting
    • Place of Presentation
      Columbus, Ohio, U.S.A.
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Direct HRTEM Observation of the Clustering Process of Self-Interstitial Atoms in Iron2016

    • Author(s)
      Kazuto Arakawa, Shigeo Arai, Cosmin Marinica, Estelle Meslin, Francois Willaime, Takafumi Amino, Par Olsson, Sergei Dudarev, Yonfeng Zhang, Hidehiro Yasuda, Hirotaro Mori, Yoshifumi Oshima, Yuta Yamamoto, Nobuo Tanaka
    • Organizer
      8th International Conference on Multiscale Materials Modeling (MMM 2016)
    • Place of Presentation
      Palais des Congres, Dijion, France
    • Year and Date
      2016-10-09
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K14109
  • [Presentation] Direct HRTEM Observation of the Clustering Process of Self-Interstitial Atoms in Iron2016

    • Author(s)
      Kazuto Arakawa, Shigeo Arai, Cosmin Marinica, Estelle Meslin, Francois Willaime, Takafumi Amino, Par Olsson, Sergei Dudarev, Yonfeng Zhang, Hidehiro Yasuda, Hirotaro Mori, Yoshifumi Oshima, Yuta Yamamoto, Nobuo Tanaka
    • Organizer
      8th International Conference on Multiscale Materials Modeling (MMM 2016)
    • Place of Presentation
      Palais des Congress, Dijion, France
    • Year and Date
      2016-10-09
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H04244
  • [Presentation] 銅における水素誘起キャビティの 特異な構造と動的挙動の TEM 観察2016

    • Author(s)
      荒河一渡, 石田佳大, 保田英洋, 森博太郎, 荒井重勇, 田中信夫, 深井有
    • Organizer
      日本顕微鏡学会(第72 回)学術講演会
    • Place of Presentation
      仙台国際センター, 仙台
    • Year and Date
      2016-06-14
    • Data Source
      KAKENHI-PROJECT-15H04244
  • [Presentation] 負の電子親和性をもつエミッタから放出される電子の性質2015

    • Author(s)
      桑原 真人,南保 由人,齋藤 晃,浅野 秀文,宇 治原 徹,田中 信夫
    • Organizer
      日本顕微鏡学会第71回学術講演会
    • Place of Presentation
      Kyoto, Japan
    • Year and Date
      2015-05-13
    • Invited
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Presentation] スピン偏極パルスTEMの開発とその可能性2015

    • Author(s)
      田中信夫, 桑原真人
    • Organizer
      日本顕微鏡学会 第39回関東支部講演会
    • Place of Presentation
      工学院大学
    • Year and Date
      2015-02-28
    • Invited
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] Depth-Resolution Imaging of Crystalline Nano Clusters Using Aberration-Corrected TEM2015

    • Author(s)
      Jun Yamasaki, Akihiko Hirata, Yoshihiko Hirotsu, Kaori Hirahara and Nobuo Tanaka
    • Organizer
      The 2nd East-Asia Microscopy Conference (EAMC2)
    • Place of Presentation
      姫路商工会議所、兵庫県姫路市
    • Year and Date
      2015-11-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Dynamic electron microscopic observation of nanomaterials2015

    • Author(s)
      N. Tanaka
    • Organizer
      12th Multinational Congress on Microscopy
    • Place of Presentation
      Eger, Hungary
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Depth-resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-corrected TEM2015

    • Author(s)
      Jun Yamasaki, Masayuki Mori, Akihiko Hirata, Yoshihiko Hirotsu, Kaori Hirahara, and Nobuo Tanaka
    • Organizer
      Third Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2015)
    • Place of Presentation
      Kasteel Vaalsbroek, the Netherlands
    • Year and Date
      2015-04-19
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] Interfacial fracture strength of micro-scale Si/Cu components with different free-edge shape2015

    • Author(s)
      Yoshimasa Takahashi, Hikaru Kondo, Kazuya Aihara, Masanori Takuma, Kenichi Saitoh, Shigeo Arai, Shunsuke Muto, Yuta Yamamoto, Kimitaka Higuchi, Nobuo Tanaka
    • Organizer
      14th International Conference on Fracture and Damage Mechanics
    • Place of Presentation
      Budva, Montenegro
    • Year and Date
      2015-09-21
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25709003
  • [Presentation] タングステンのセルフイオン照射による転位ループの異常安定化2015

    • Author(s)
      荒河一渡, 長澤良太, Brigitte Decamps, Cedric Baumier, Erwan Oliviero, Estelle Meslin, Francois Willaime, 保田英洋, 森博太郎, 荒井重勇, 田中信夫, 網野岳文, 石野栞
    • Organizer
      日本金属学会2015年秋期講演大会
    • Place of Presentation
      九州大学
    • Year and Date
      2015-09-16
    • Data Source
      KAKENHI-PROJECT-15H04244
  • [Presentation] Prospects high-voltage ETEM by using blanking or pulsed beams2015

    • Author(s)
      N. Tanaka
    • Organizer
      Symposium on Electron Microscopy for Biological, Enviromental and Energy Research
    • Place of Presentation
      PNNL, USA
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] Spinor interfernce in transmission electron microscope2015

    • Author(s)
      M. Kuwahara, K. Sameshima, K. Aoki, H. Asano, T. Ujihara, K. Saitoh, N. Tanaka
    • Organizer
      Internatinal Symposium on EcoTopia Science
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15K13404
  • [Presentation] 収差補正TEMによる結晶性ナノクラスターの深さ分解能結像2015

    • Author(s)
      山﨑 順,平田 秋彦,弘津 禎彦,平原 佳織,田中信夫
    • Organizer
      日本顕微鏡学会 第71回記念学術講演会
    • Place of Presentation
      京都国際会館、京都府京都市
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] タングステンのセルフイオン照射 下での転位ループ形成過程のTEMその場観察2015

    • Author(s)
      荒河一渡, 長澤良太, Brigitte D&#233;camps, C&#233;dric Baumier, Erwan Oliviero, Estelle Meslin, Francois Willaime, 保田英洋, 森博太郎, 荒井重勇, 田中信夫, 網野岳文, 石野栞
    • Organizer
      日本顕微鏡学会第71回学術講演会
    • Place of Presentation
      国立京都国際会館
    • Year and Date
      2015-05-13
    • Data Source
      KAKENHI-PROJECT-15H04244
  • [Presentation] Evaluation of interfacial fracture strength in micro-components with different free-edge shape2015

    • Author(s)
      Yoshimasa Takahashi, Kazuya Aihara, Itaru Ashida, Kimitaka Higuchi, Yuta Yamamoto, Shigeo Arai, Shunsuke Muto, Nobuo Tanaka
    • Organizer
      International Conference on Advanced Technology in Experimental Mechanics
    • Place of Presentation
      LOISIR HOTEL, Toyohashi, Aichi, Japan
    • Year and Date
      2015-10-04
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-25709003
  • [Presentation] Si (001)基板上3C-SiCエピタキシャル薄膜における積層欠陥発生プロセスの収差補正TEM解析2014

    • Author(s)
      石田篤志、山崎順、秋山賢輔、平林康男、田中信夫
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 電子線内殻励起非弾性散乱をもちいたSmBaMn2O6の電荷軌道秩序解析2014

    • Author(s)
      十朱洋平、齋藤晃、田中信夫、竹中康司
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 電子らせん波の照射によるナノ粒子の挙動の研究2014

    • Author(s)
      平川和馬、齋藤晃、吉田健太、田中信夫、佐々木祐生、北浦良、篠原久典
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 2つの渦を含む電子ビームの伝播ダイナミックス2014

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Invited
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 半導体光陰極を用いたTEMの空間コヒーレンス測定2014

    • Author(s)
      桑原真人、南保由人、鮫島健輔 、楠聡一郎、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 2つの渦を含む電子ビームの伝播ダイナミックス2014

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 半導体光陰極を用いたTEMの空間コヒーレンス測定2014

    • Author(s)
      桑原真人、南保由人、鮫島健輔、楠総一郎、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本物理学会第69回年次大会
    • Place of Presentation
      東海大学 湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 電子らせん波の照射によるナノ粒子の挙動の研究2014

    • Author(s)
      平川和馬、齋藤晃、吉田健太、田中信夫、佐々木祐生、北浦良、篠原久典
    • Organizer
      日本物理学会 第69回年次大会
    • Place of Presentation
      東海大学湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 半導体光陰極を用いたTEMの空間コヒーレンス測定2014

    • Author(s)
      桑原真人、南保由人、鮫島健輔、楠総一郎、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本物理学会第69回年次大会
    • Place of Presentation
      東海大学 湘南キャンパス
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 電子らせん波の生成および伝播特性の研究2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会超分解能電子顕微鏡分科会 第8回研究会 「vortexビームとその可能性」
    • Place of Presentation
      東京
    • Invited
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 2つの位相特異点をもつ電子らせん波の生成および伝播特性2013

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 収差補正TEM像解析に基づくSi基板上high-k絶縁膜の精密膜厚測定2013

    • Author(s)
      山崎順, 稲元伸, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] スピン偏極パルス同期TEM像の取得2013

    • Author(s)
      桑原真人、楠総一郎、南保由人、鮫島健輔、齋藤晃、宇治原徹、竹田美和、中西彊、田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク (吹田市)
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 反応科学超高圧電子顕微鏡を用いたガス環境実験2013

    • Author(s)
      荒井重勇、高橋可昌、武藤俊介、山本悠太、丹司敬義、田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-25709003
  • [Presentation] スピン偏極パルスTEM2013

    • Author(s)
      桑原真人、楠総一郎、南保由人、鮫島健輔、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウィンクあいち (名古屋市)
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] "Highly precise lattice-parameter determination by nano-beam electron diffraction2013

    • Author(s)
      K. Saitoh, H. Nakahara, K. Doi, and N. Tanaka
    • Organizer
      International Symposium on EcoTopia Science 2013
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 軌道角運動量を持つ電子の発生と干渉、そして将来の応用2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      2013年ビーム物理研究会、ならびに若手の会
    • Place of Presentation
      沖縄科学技術大学院大学
    • Invited
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Highly precise lattice-parameter determination by nano-beam electron diffraction2013

    • Author(s)
      K. Saitoh, H. Nakahara, K. Doi, and N. Tanaka
    • Organizer
      International Symposium on EcoTopia Science 2013
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Development of spin-polarized transmission electron microscope2013

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H Asano, Y Takeda, T Nakanishi and N Tanaka
    • Organizer
      9th International Symposium on Atomic Level Characterizations for New Materials and Devices ‘13
    • Place of Presentation
      Hawaii, USA
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極パルスTEM2013

    • Author(s)
      桑原真人, 楠総一郎, 南保由人, 鮫島健輔, 齋藤晃, 宇治原徹, 浅野秀文, 竹田美和, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Development of spin-polarized transmission electron microscope2013

    • Author(s)
      Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, T. Nakanishi , and N. Tanaka
    • Organizer
      9th International Symposium on Atomic Level Characterizations
    • Place of Presentation
      Sheraton Kona (Hawaii)
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] ABF-STEMをもちいたAl-Ni-Ruデカゴナル準結晶および近似結晶の構造の研究2013

    • Author(s)
      齋藤晃、横山大樹、田中信夫、高倉洋礼、杉山 和正
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 2つの位相特異点をもつ電子らせん波の生成および伝播特性2013

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      吹田
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極パルスTEM2013

    • Author(s)
      桑原真人, 楠総一郎, 南保由人,鮫島健輔, 齋藤晃, 宇治原徹, 浅野秀文, 竹田美和, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] フォーク型回折格子をちいた電子らせん波の軌道角運動量計測2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 電子らせん波の生成および伝播特性の研究2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会超分解能電子顕微鏡分科会第8回研究会 「vortexビームとその可能性」
    • Place of Presentation
      東京
    • Year and Date
      2013-03-04
    • Invited
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] GaAs/InAsヘテロ接合ナノワイヤーの界面構造解析と元素分析2013

    • Author(s)
      三浦正視, 山崎順, P. Krogstrup, E-Johnson, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 収差補正HRTEMを用いた3C-Sic/Si (001)界面における積層欠陥の解析2013

    • Author(s)
      石田篤志, 山﨑順, 稲元伸, 野村優貴, 秋山賢輔, 平林康男, 田中信夫
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Spin-polarized transmission electron microscope toward an analysis of sub-picosecond dynamics2013

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, T. Nakanishi and N. Tanaka
    • Organizer
      The 3rd Banff Meeting on Structural Dynamics Ultrafast Dynamics with X-Ray and Electrons
    • Place of Presentation
      Banff, Alberta, Canada
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極パルス同期TEM像の取得2013

    • Author(s)
      桑原真人、楠総一郎、南保由人、鮫島健輔、齋藤晃、宇治原徹、竹田美和、中西彊、田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク (吹田市)
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Spin-polarized transmission electron microscope toward an analysis of sub-picosecond dynamics2013

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, T. Nakanishi and N. Tanaka
    • Organizer
      The 3rd Banff Meeting on Structural Dynamics Ultrafast Dynamics with X-Ray and Electrons
    • Place of Presentation
      Banff, Alberta, Canada
    • Invited
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 3C-SiC/Si (001)界面における積層欠陥の収差補正HRTEM解析2013

    • Author(s)
      石田篤志, 山﨑順, 稲元伸, 野村優貴, 秋山賢輔, 平林康男, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Development of spin-polarized transmission electron microscope2013

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, T. Nakanishi , and N. Tanaka
    • Organizer
      9the International Symposium on Atomic Level Characterizations for New Materials and Devices '13
    • Place of Presentation
      Sheraton Kona (Hawaii)
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極透過電子顕微鏡による電子線空間干渉性2013

    • Author(s)
      楠 総一郎, 桑原 真人, 宇治原 徹, 浅野 秀文, 竹田 美和, 齋藤 晃, 田中 信夫
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極透過電子顕微鏡による電子線空間干渉性2013

    • Author(s)
      楠総一郎、桑原真人、宇治原徹、浅野秀文、竹田美和、齋藤晃、田中信夫
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      ホテル阪急エキスポパーク (吹田市)
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 電子線内殻励起非弾性散乱をもちいたNd0.5Sr0.5MnO3の電荷軌道秩序解析2013

    • Author(s)
      十朱洋平, 齋藤晃, 田中信, 竹中康司
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極透過電子顕微鏡による電子線空間干渉性2013

    • Author(s)
      楠総一郎、桑原真人、宇治原徹、浅野秀文、竹田美和、齋藤晃、田中信夫
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学 常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 収差補正TEM像によるSi基板上high-k絶縁膜の膜厚測定2013

    • Author(s)
      山﨑順, 稲元伸, 田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] フォーク型回折格子をもちいた電子らせん波の軌道角運動量計測2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      吹田
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 軌道角運動量を持っ電子の発生と干渉、そして将来の応用2013

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      2013年ビーム物理研究会、ならびに若手の会
    • Place of Presentation
      沖縄科学技術大学院大学
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 電子ベッセルビームの生成および伝播特性2013

    • Author(s)
      齋藤晃、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 水素ガスがアモルファスカーボン膜担持した白金微粒子に及ぼす影響2013

    • Author(s)
      張旭東, 吉田健太, 齋藤晃, 田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] スピン偏極パルスTEM2013

    • Author(s)
      桑原真人、楠総一郎、南保由人、鮫島健輔、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウィンクあいち (名古屋市)
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 電子ベッセルビームの生成および自己修復性の検証2013

    • Author(s)
      平川 和馬, 齋藤 晃,田中 信夫, 内田 正哉
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] 水素ガスがアモルファスカーボン膜担持した白金微粒子に及ぼす影響2013

    • Author(s)
      張 旭東,吉田 健太,齋藤 晃,田中 信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極透過電子顕微鏡による電子線空間干渉性2013

    • Author(s)
      楠総一郎, 桑原真人, 宇治原徹,浅野秀文, 竹田美和, 齋藤晃, 田中信夫
    • Organizer
      日本物理学会秋季大会
    • Place of Presentation
      徳島大学常三島キャンパス
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Development of spin-polarized transmission electron microscope2013

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H Asano, Y Takeda, T Nakanishi and N Tanaka
    • Organizer
      9th International Symposium on Atomic Level Characterizations for New Materials and Devices
    • Place of Presentation
      Hawaii, USA
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極パルスTEMによるパルス同期TEM像の取得2013

    • Author(s)
      桑原真人,南保由人,楠聡一郎,齋藤晃,宇治原徹,竹田美和,中西彊,田中信夫
    • Organizer
      日本顕微鏡学会第69回学術講演会
    • Place of Presentation
      ホテル阪急エキスポパーク.
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 電子線内殻励起非弾性散乱を用いたNd0.5Sr0.5MnO3の電荷軌道秩序解析2013

    • Author(s)
      十朱洋平, 桃井浩太, 齋藤晃, 竹中康司, 田中信夫
    • Organizer
      日本顕微鏡学会第57回シンポジウム
    • Place of Presentation
      ウインクあいち
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Spin-polarized and Pulsed TEM Using a Laser-driven Semiconductor Photocathode2012

    • Author(s)
      N. Tanaka, M. Kuwahara, K. Saitoh, S. Kusunoki, T. Ujihara, H. Asano, Y. Takeda and T. Nakanishi
    • Organizer
      Microscopy & Microanalysis 2012
    • Place of Presentation
      Phoenix, USA
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 電子らせん波をもちいたヤングの干渉実験2012

    • Author(s)
      長谷川裕也、齋藤晃、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Electron vortex pair produced with a nano-fabicated holographic grating2012

    • Author(s)
      M. Uchida, Y. Hasegawa, K. Saitoh and N. Tanaka
    • Organizer
      A Joint Meeting of the Asian Crystallographic Association
    • Place of Presentation
      Adelaide
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] レーザー励起半導体電子源を用いた30kVパルスTEMの開発2012

    • Author(s)
      田中信夫、桑原真人、楠聡一郎、浅野秀文、宇治原徹、齋藤晃、竹田美和、中西彊
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場.
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極透過電子顕微鏡の開発とその性能2012

    • Author(s)
      桑原真人、楠聡一郎、宇治原徹、浅野秀文、竹田美和、中西彊、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 電子らせん波の相互干渉による位相観察2012

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本物理学会第67回年次大会
    • Place of Presentation
      関西学院大学
    • Year and Date
      2012-03-27
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Spin-polarized TEM using an NEA photocathode2012

    • Author(s)
      M. Kuwahara, S. Kusunoki, K. Saitoh, T. Ujihara, and N. Tanaka
    • Organizer
      The 3rd International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC3)
    • Place of Presentation
      Gifu
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] レーザー励起半導体電子源を用いた30kVパルスTEMの開発2012

    • Author(s)
      田中信夫、桑原真人、楠聡一郎、浅野秀文、宇治原徹、齋藤晃、竹田美和、中西彊
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 2つの位相特異点を有する電子らせん波の生成2012

    • Author(s)
      長谷川裕也、齋藤晃、田中信夫、内田正哉
    • Organizer
      日本物理学会2012年秋季大会
    • Place of Presentation
      横浜
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] スピン偏極TEMにおけるNEAフォトカソードからの低エネルギー分散ビームの生成2012

    • Author(s)
      楠聡一郎、桑原真人、宇治原徹、浅野秀文、竹田美和、中西彊、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極透過電子顕微鏡の開発とその性能2012

    • Author(s)
      桑原真人、楠聡一郎、宇治原徹、浅野秀文、竹田美和、中西彊、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場.
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Spin-polarized and Pulsed TEM Using a Laser-driven Semiconductor Photocathode2012

    • Author(s)
      N. Tanaka, M. Kuwahara, K. Saitoh, S. Kusunoki, T. Ujihara, H. Asano, Y. Takeda and T. Nakanishi
    • Organizer
      Microscopy & Microanalysis 2012
    • Place of Presentation
      Phoenix, USA.
    • Invited
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極TEMにおけるNEAフォトカソードからの低エネルギー分散ビームの生成2012

    • Author(s)
      楠聡一郎、桑原真人、宇治原徹、浅野秀文、竹田美和、中西彊、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場.
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Production of electron vortex beams using fork-like gratings and spiral zone plates and their propagating properties2012

    • Author(s)
      K. Saitoh, Y. Hasegawa, K. Hirakawa, N. Tanaka and M. Uchida
    • Organizer
      The 3rd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Gifu
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Spin-polarized TEM using an NEA photocathode2012

    • Author(s)
      M. Kuwahara, S. Kusunoki, K. Saitoh, T. Ujihara, and N. Tanaka
    • Organizer
      The 3rd International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC3)
    • Place of Presentation
      Gifu
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] レーザー励起半導体電子源を用いた30kVパルスTEMの開発2012

    • Author(s)
      田中信夫、桑原真人、楠聡一郎、浅野秀文、宇治原徹、齋藤晃、竹田美和、中西彊
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] スピン偏極透過電子顕微鏡の開発とその性能2012

    • Author(s)
      桑原真人、楠聡一郎、宇治原徹、浅野秀文、竹田美和、中西彊、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば国際会議場
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スパイラルゾーンプレートによる電子らせん波の生成2012

    • Author(s)
      長谷川裕也、齋藤晃、田中信夫、内田正哉
    • Organizer
      日本物理学会第67回年次大会
    • Place of Presentation
      関西学院大学
    • Year and Date
      2012-03-27
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Propagation of electron vortices2012

    • Author(s)
      M. Uchida, K. Saitoh, Y. Hasegawa, K. Hirakawa, N. Tanaka
    • Organizer
      Tonomura FIRST International Symposium on "Electron Microscopy and Gauge Fields"
    • Place of Presentation
      Tokyo
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] Spin-polarized and Pulsed TEM Using a Laser-driven Semiconductor Photocathode2012

    • Author(s)
      N. Tanaka, M. Kuwahara, K. Saitoh, S. Kusunoki, T. Ujihara, H. Asano, Y. Takeda and T. Nakanishi
    • Organizer
      Microscopy & Microanalysis 2012
    • Place of Presentation
      Phoenix, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] スパイラルゾーンプレートによる大きな軌道角運動量をもつ電子らせん波の生成2012

    • Author(s)
      齋藤晃、長谷川裕也、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第68回学術講演会
    • Place of Presentation
      つくば
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] フォーク型回折格子をもちいた電子らせん波の生成と空間伝播の観察2011

    • Author(s)
      齋藤晃、多々良美秀、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会第67回学術講演会
    • Place of Presentation
      福岡国際会議場
    • Year and Date
      2011-05-17
    • Data Source
      KAKENHI-PROJECT-23241036
  • [Presentation] In-situ gas study and 3D quantification of titania photocatalysts by advanced electron microscopy2011

    • Author(s)
      N.Tanaka
    • Organizer
      Electron Microscopy and Analysis Group Conference 2011
    • Place of Presentation
      Birmingham UK(招待講演)
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] スピン偏極パルスTEM用電子源と照射系の開発2011

    • Author(s)
      桑原真人、中西彊、竹田美和、浅野秀文、齋藤晃、宇治原徹、田中信夫
    • Organizer
      日本顕微鏡学会第67回学術講演会
    • Place of Presentation
      福岡
    • Year and Date
      2011-05-16
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Development of spin-polarized and pulsed TEM2011

    • Author(s)
      M. Kuwahara, T. Nakanishi, Y. Takeda, K. Saito, T. Ujihara, H. Asano, and N. Tanaka
    • Organizer
      Electron Microscopy and Analysis Group Conference 2011
    • Place of Presentation
      Birmingham UK
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] In-situ gas study and 3D quantification of titania photocatalysts by advanced electron microscopy2011

    • Author(s)
      N. Tanaka
    • Organizer
      Electron Microscopy ]and Analysis Group Conference 2011
    • Place of Presentation
      Birmingham UK
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Injection system of spin-polarized transmission microscopy2011

    • Author(s)
      M. Kuwahara, S. Kusunoki, F. Ichihashi, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, T. Nakanishi, and N. Tanaka
    • Organizer
      International Symposium on EcoTopia Science 2011
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Atomic Structure of a 3C-SiC/Si (100) Interface Revealed by Aberration-Corrected Transmission Electron Microscopy and Ab Initio Calculations2010

    • Author(s)
      S.Inamoto, J.Yamasaki, H.Tamaki, K.Okazati-Maeda, N.Tanaka
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeilo, Brazil
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Development of High-Voltage Electron Microscope for Reaction Science2010

    • Author(s)
      N.Tanaka, J.Usukura, M.Kusnoki, K.Kuroda, Y.Saito, T.Tanji, S.Muto, S.Arai
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeiro, Brazil.
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Determination of 3D Lattice Displacements of Strained Semiconductors by Convergent-Beam Electron Diffraction2010

    • Author(s)
      K.Saitoh, M.Hamabe, S.Morishita, J.Yamasaki, N.Tanaka
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeilo, Brazil
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Atomic Structure of a 3C-SiC/Si (100) Interface Revealed by Aberration-Corrected Transmission Electron Microscopy and Ab Initio Calculations2010

    • Author(s)
      S.Inamoto, J.Yamasaki, H.Tamaki, K.Okazaki-Maeda, N.Tanaka
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeiro, Brazil.
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Spherical aberration corrected HRTEM of nano interfaces of semiconductors2010

    • Author(s)
      N.Tanaka
    • Organizer
      The 13th International Conference on Intergranular and Interphase Boundaries in Materials
    • Place of Presentation
      Shima, Mie
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Automated Mapping of Lattice Parameters and Lattice Bending Strain Near a SiGe/Si Interface by Using Split HOLZ Lines Patterns2010

    • Author(s)
      K.Saitoh, Y. Yasuda, M. Hamabe, N. Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] 電子線バイプリズムをもちいたアモルレファス試料の回折波干渉の観察2010

    • Author(s)
      齋藤晃, Rodney HERRING, 丹司敬義, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Automated Mapping of Lattice Parameters and Lattice Bending Strain near a SiGe/Si Interface by using Split HOLZ Lines Patterns2010

    • Author(s)
      齋藤晃, 濱邊麻衣子, 田中信夫
    • Organizer
      名古屋大学材料バックキャストテクノロジーシンポジウム次世代グリーンビークルに向けた材料テクノロジーの展開
    • Place of Presentation
      名古屋大学
    • Year and Date
      2010-09-29
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] HOLZ線のロッキングカーブプロファイルをもちいた3次元格子歪み分布解析II2010

    • Author(s)
      浜辺麻衣子, 齋藤晃, 田中信夫
    • Organizer
      日本物理学会第65回年次大会
    • Place of Presentation
      岡山大学
    • Year and Date
      2010-03-21
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] 収差補正TEMを用いた3C-SiC/Si(100)界面の3次元原子配列構造解析2010

    • Author(s)
      稲元伸, 山崎順, 玉置央和, 岡崎一行, 田中信夫
    • Organizer
      名古屋大学材料バックキャストテクノロジーシンポジウム次世代グリーンビークルに向けた材料テクノロジーの展開2010
    • Place of Presentation
      名古屋大学(愛知県)
    • Year and Date
      2010-09-29
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Advanced and In-site TEM/STEM of Functional Small Particles on Titanium Oxide Materials2010

    • Author(s)
      N.Tanaka, S.Sueda, K. Yoshida
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeiro, Brazil
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Image Subtraction & Deconvolution Processing of Aberration-Corrected HRTEM Images for Observations of Atomic Columns at Interfaces2010

    • Author(s)
      J.Yamasaki, S.Inamoto, H.Tamaki, N.Tanaka
    • Organizer
      The 13th International Conference on Intergranular and Interphase Boundaries in Materials
    • Place of Presentation
      Shima, Mie, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Observations of Atomic Columns in Compounds by Image Subtraction & Deconvolution Processing of Aberration-Corrected HRTEM Images2010

    • Author(s)
      J.Yamasaki, S.Inamoto, H.Tamaki, N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 収差補正TEM/STEMを用いたhigh-kゲート絶縁膜厚測定法2010

    • Author(s)
      稲元伸, 山崎順, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 収差補正TEM像と第一原理計算を用いた3C-SiC/Si(100)界面の原子構造精密化2010

    • Author(s)
      稲元伸, 山崎順, 玉置央和, 岡崎一行, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Observations of Atomic Columns in Compounds by Image Subtraction & Deconvolution of Aberration-Corrected TEM Images2010

    • Author(s)
      J.Yamasaki, S.Inamoto, H.Tamaki, N.Tanaka
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeilo, Brazil
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Determination of 3D Lattice Displacements of Strained Semiconductors by Convergent-Beam Electron Diffraction2010

    • Author(s)
      齋藤晃, 濱邊麻衣子, 森下茂幸, 山崎順, 田中信夫
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeiro, Brazil.
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] HOLZ線のロッキングカーブプロファイルをもちいた3次元格子歪み解析II2010

    • Author(s)
      濱邊麻衣子, 齋藤晃, 森下茂幸, 山崎順, 田中信夫
    • Organizer
      日本物理学会第65回年次大会
    • Place of Presentation
      岡山大学
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] HOLZ線ロッキングカーブの反復位相回復による格子湾曲変位場の再生2010

    • Author(s)
      齋藤晃, 濱邊麻衣子, 森下茂幸, 山崎順, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] HOLZ線ロッキングカーブの反復位相回復による格子湾曲変位場の再生2010

    • Author(s)
      齋藤晃, 濱邊麻衣子, 森下茂幸, 山崎順, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Automated Mapping of Lattice Parameters and Lattice Bending Strain near a SiGe/Si Interface by using Split HOLZ Lines Patterns2010

    • Author(s)
      齋藤晃, 濱邊麻衣子, 田中信夫
    • Organizer
      名古屋大学材料バックキャストテクノロジーシンポジウム次世代グリーンビークルに向けた材料テクノロジーの展開2010
    • Place of Presentation
      名古屋大学(愛知県)
    • Year and Date
      2010-09-29
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] スピン偏極パルス透過電子顕微鏡の開発12010

    • Author(s)
      田中信夫, 中西彊, 竹田美和, 浅野秀文, 斎藤晃, 宇治原徹, 桒原真人
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Automated Mapping of Lattice Parameters and Lattice Bending Strain Near a SiGe/Si Interface by Using Split HOLZ Lines Patterns2010

    • Author(s)
      K.Saitoh, Y.Yasuda, M.Hamabe, N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pulsed spin-polarized electron source toward a transmission electron microscope2010

    • Author(s)
      M. Kuwahara, T. Nakanishi, N. Tanaka, Y. Takeda, H. Asano, K. Saito, T. Ujihara
    • Organizer
      The 17th IFSM International Microscopy Congress
    • Place of Presentation
      Rio de Janeilo, Brazil
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] 収差補正TEMを用いた3C-SiC/Si(100)界面の3次元原子配列構造解析2010

    • Author(s)
      稲元伸, 山崎順, 玉置央和, 岡崎一行, 田中信夫
    • Organizer
      名古屋大学材料バックキャストテクノロジーシンポジウム次世代グリーンビークルに向けた材料テクノロジーの展開
    • Place of Presentation
      名古屋大学
    • Year and Date
      2010-09-29
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] スピン偏極パルスTEM用電子源の特性評価2010

    • Author(s)
      桒原真人, 中西彊, 田中信夫, 竹田美和 浅野秀文, 斎藤晃, 宇治原徹
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] Determination of a Lattice Strain Field by Iterative Phase Retrieval of Rocking Curves of HOLZ Reflections2010

    • Author(s)
      K.Saitoh, M.Hamabe, S.Morishita, J.Yamasaki, N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 収差補正TEM像と第一原理計算を用いた3C-SiCISi(100)界面の原子構造精密化2010

    • Author(s)
      稲元伸, 山崎順, 玉置央和, 岡崎一行, 田中信夫
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Determination of a Lattice Strain Field by Iterative Phase Retrieval of Rocking Curves of HOLZ Reflections2010

    • Author(s)
      K.Saitoh, M.Hamabe, S.Morishita, J.Yamasaki, N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Atomic Arrangement at 3C-SiC/Si (100) Interface Analyzed by Aberration-Corrected Transmission Electron Microscopy and Ab Initio Calculations2010

    • Author(s)
      S.Inamoto, J.Yamasaki, H.Tamaki, K.Okazaki-Maeda, N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Spherical aberration corrected HRTEM of nano interfaces of semiconductors2010

    • Author(s)
      N.Tanaka
    • Organizer
      The 13th International Conference on Intergranular and Interphase Boundaries in Materials
    • Place of Presentation
      Shima, Mie, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 反応学超高圧電子顕微鏡の開発2010

    • Author(s)
      田中信夫, 臼倉治郎, 楠美智子, 黒田光太郎, 斎藤弥八, 丹司敬義, 武藤俊介, 荒井重勇
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] In-situ TEM/STEM Observation of Photocatalytic Reactions of Titanium Oxide Materials2010

    • Author(s)
      N.Tanaka
    • Organizer
      The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] スピン偏極パルスTEM用電子源の特性評価2010

    • Author(s)
      桑原真人, 中西彊, 田中信夫, 竹田美和, 浅野秀文, 斎藤晃, 宇治原徹
    • Organizer
      日本顕微鏡学会66回学術講演会
    • Place of Presentation
      Rio de Janeilo, Brazil
    • Data Source
      KAKENHI-PROJECT-21221005
  • [Presentation] UHV in-situ TEMによる極薄Si酸化膜付Si基板上に成長するGeナノドットの歪み評価2009

    • Author(s)
      趙星彪, 藤林裕明, 田中信夫
    • Organizer
      日本物理学会第64回年次大会
    • Place of Presentation
      東京 (立教大)
    • Year and Date
      2009-03-27
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Strain mapping near Si/SiGe interfaces using HOLZ line CBED patterns2009

    • Author(s)
      齋藤晃, 浜辺麻衣子, 田中信夫
    • Organizer
      AsCA'09 Beijing, Joint Conference of the Asian Crystallographic Association and Chinese Crystallographic Society
    • Place of Presentation
      Beijing, China
    • Year and Date
      2009-10-25
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] CBED法をもちいた格子湾曲歪みを含むSiGe/Si界面近傍の二次元格子歪み解析2009

    • Author(s)
      濱邊麻衣子、齋藤晃、田中信夫
    • Organizer
      日本顕微鏡学会第65回学術講演会
    • Place of Presentation
      仙台国際センター
    • Year and Date
      2009-05-26
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] HOLZ線のロッキングカーブプロファイルをもちいた3次元格子歪み分布解析2009

    • Author(s)
      浜辺麻衣子, 齋藤晃, 田中信夫
    • Organizer
      日本物理学会2009年秋季大会
    • Place of Presentation
      熊本大学
    • Year and Date
      2009-09-26
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] 収差補正STEMを用いた非晶質カーボン膜中白金原子の運動の観察2009

    • Author(s)
      黒島光, 山崎順, 田中信夫
    • Organizer
      日本物理学会第64回年次大会
    • Place of Presentation
      立教大学
    • Year and Date
      2009-03-27
    • Data Source
      KAKENHI-PROJECT-19656007
  • [Presentation] UHV in-situ TEMによる極薄Si酸化膜付Si基板上に成長するGeナノドットの歪み評価2009

    • Author(s)
      藤林裕明, 趙星彪, 田中信夫
    • Organizer
      日本物理学会
    • Place of Presentation
      東京、立教大
    • Year and Date
      2009-03-28
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] HOLZ線図形の多点自動解析による二次元歪みマツピング2009

    • Author(s)
      浜辺麻衣子, 斎藤晃, 田中信夫
    • Organizer
      日本物理学会第64回年次大会
    • Place of Presentation
      立教大学
    • Year and Date
      2009-03-27
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Strain mapping near Si/SiGe interfaces using HOLZ line CBED patterns2009

    • Author(s)
      齋藤晃, 濱邊麻衣子, 田中信夫
    • Organizer
      AsCA'09 Beijing, Joint Conference of the Asian Crystallographic Association and Chinese Crystallographic Society
    • Place of Presentation
      Beijing, China.
    • Year and Date
      2009-10-25
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Studies of Ge Quantum Dots on Slightly Oxidized Si(111) Surfaces by Cs-corrected TEM/STEM2008

    • Author(s)
      N Tanaka, S-P Cho, A A Shklyaev, J Yamasaki, E Okunishi, M Ichikawa
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC 1)
    • Place of Presentation
      Nagoya, japan
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Studies of Ge Quantum Dots on Slightly Oxidized Si(111) Surfaces by Cs-corrected TEM/STEM2008

    • Author(s)
      N. Tanaka, S. -P. Cho, A. A. Shklyaev, J. Yamasaki, E. Okunishi, and M. Ichikawa
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC 1)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] 極薄酸化膜付きSi上に成長するGe量子ドットに含まれる歪分布の定量的評価2008

    • Author(s)
      藤林裕明, 趙星彪, 田中信夫
    • Organizer
      日本顕微鏡学会第64回学術講演会
    • Place of Presentation
      京都(国立京都国際会館)
    • Year and Date
      2008-05-22
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Cs-corrected STEM Studies of Ge Nanodots Grown on Slightly Oxidized Si(001) Surfaces2008

    • Author(s)
      N Tanaka, S-P Cho, A A Shklyaev, J Yamasaki, E Okunishi, M Ichikawa
    • Organizer
      Microscopy Society of America
    • Place of Presentation
      New Mexico, USA
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] 極薄Si酸化膜付Si上に成長するGeナノドツトに含まれる歪み分布の定量的な評価2008

    • Author(s)
      藤林裕明, 趙星彪, 田中信夫
    • Organizer
      日本顕微鏡学会
    • Place of Presentation
      京都、国立京都国際会館
    • Year and Date
      2008-05-22
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] 分裂したHOLZ線を含むCBED図形の解析による湾曲格子歪み計測法の研究2008

    • Author(s)
      齋藤晃、浜辺麻衣子、田中信夫
    • Organizer
      日本顕微鏡学会第64回学術講演会
    • Place of Presentation
      京都国際会議場
    • Year and Date
      2008-05-21
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] Cs-corrected STEM Studies of Ge Nanodots Grown on Slightly Oxidized Si(111) Surfaces2008

    • Author(s)
      N Tanaka, S-P Cho, A A Shklyaev, J Yamasaki, E Okunishi and M Ichikawa
    • Organizer
      Microscopy & Microanalysis 2008
    • Place of Presentation
      New Mexico, USA
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] A method for the determination of a bending strain of a lattice by CBED2008

    • Author(s)
      濱邊麻衣子, 齋藤晃, 田中信夫
    • Organizer
      Development of Advanced Instruments for New Electron Microscopy and Diffraction, IUCr2008 satellite
    • Place of Presentation
      名古屋大学
    • Year and Date
      2008-09-01
    • Data Source
      KAKENHI-PROJECT-20360007
  • [Presentation] 極薄Si酸化膜上でのGeナノドットの核形成・成長、および微細構造の評価2007

    • Author(s)
      趙星彪, 川野晋司, 田中信夫
    • Organizer
      日本顕微鏡学会第63回学術講演会
    • Place of Presentation
      新潟コンベンションセンター
    • Year and Date
      2007-05-20
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007

    • Author(s)
      Yamasaki, J., Okunishi, E., Sawada, H and Tanaka, N
    • Organizer
      The NIMS Conference 2007 on Recent Breakthroughs in Materials Science and Tech nology
    • Place of Presentation
      筑波
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      Tanaka, N., Cho, S.P., Sbklyaev, A. A., Yamasaki, J., Okunishi, E, Icbikawa, M
    • Organizer
      ACSIN-9
    • Place of Presentation
      Tokyo, Japan
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodotsgrown on Si (001) surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      Tanaka, N., Cho, S. P., Shklyaev, A. A., Yamasaki, J., Okunishi, E and Ichikawa, M
    • Organizer
      ACSIN-9
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] 極薄Si酸化膜を用いたSi(001)表面上のGeナノドットの微細構造および組成の評価2007

    • Author(s)
      趙星彪, Alexander A Shklyaev, 山崎順, 奥西栄治, 市川昌和, 田中信夫
    • Organizer
      日本物理学会第62回年次大会
    • Place of Presentation
      札幌 (北海道大)
    • Year and Date
      2007-09-23
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      N. Tanaka, S.-P. Cho, A. A. Shklyaev J. Yamasaki, E. Okunishi and M. Ichikawa
    • Organizer
      ACSIN-9(9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures)
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001)surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      Tanaka, N., Cho, S. P., Shklyaev, A. A., Yamasaki, J., Okunishi, E and Ichikawa, M
    • Organizer
      ACSIN-9
    • Place of Presentation
      Tokyo, Japan
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Advanced electron microscopic characterization of Nanometerials2007

    • Author(s)
      Tanaka, N
    • Organizer
      Extended abstract of the firs Extended abstract of the first Doyama Conference
    • Place of Presentation
      Tokyo
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Advanced electron microscopic characterization of nanometerials2007

    • Author(s)
      Tanaka, N
    • Organizer
      Extended abstract of the first Doyama Conference
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Effectiveness of Cs-corrected TEM/STEM for nano-materials research2007

    • Author(s)
      Tanaka, N
    • Organizer
      Microscopy & Microanalysis
    • Place of Presentation
      米国、フロリダ
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] 極薄Si酸化膜上でのGeナノドットの核形成・成長、および微細構造の評価2007

    • Author(s)
      趙星彪, 川野晋司, 田中信夫
    • Organizer
      日本顕微鏡学会第63回学術講演会
    • Place of Presentation
      新潟(新潟コンベンションセンター)
    • Year and Date
      2007-05-20
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007

    • Author(s)
      Yamasaki, J., Okunishi, E., Sawada, H and Tanaka, N
    • Organizer
      The NIMS Conference 2007 on Recent Breakthroughs in Materials Scienoe and Technology
    • Place of Presentation
      Tsukuba
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] In-situ monitoring of nucleation and evolution of Ge nanodots on faintly oxidized Si(111) surfaces November11-152007

    • Author(s)
      Sung-Pyo Cho, Shinji Kawano and Nobuo Tanaka
    • Organizer
      2007, ACSIN-9(9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures)
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-19560023
  • [Presentation] Effectiveness of Cs-corrected TEM/STEM for nano-materials research2007

    • Author(s)
      Tanaka, N
    • Organizer
      Microscopy & Microanalysis
    • Place of Presentation
      Florida, US
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007

    • Author(s)
      Yamasaki, J., Okunishi, E., Sawada, H, Tanaka, N
    • Organizer
      The NEVIS
    • Place of Presentation
      Tsukuba
    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Advanced electron microscopic characterization of nanometerials2007

    • Author(s)
      Tanaka, N
    • Organizer
      Extended abstract of the first Doyama Conference
    • Place of Presentation
      Tokyo
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] High-resolution TEM/STEM Analysis on La_2O_3/Si(100)interfaces2006

    • Author(s)
      Tanaka, N., Yamasaki, J and Saitoh, K
    • Organizer
      International Workshop on Nano-CMOS
    • Place of Presentation
      Mishima
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Direct Observation of Six-membered Rings in a Graphene Monolayer Constituting a Single Wall Carbon Nanotube by Using Cs-Corrected TEM2006

    • Author(s)
      Hirahara, K., Saitoh, K., Yamasaki, J and Tanaka, N
    • Organizer
      IMC 16
    • Place of Presentation
      Sapporo
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Spherical-aberration-corrected HRTEM of Al-Ni-Co Decagonal Quasicrystals2006

    • Author(s)
      Saitoh, K., Tanaka, N., Tsai, A. P. and Ishizuka, K
    • Organizer
      Joint Conference of the Asian Crystallographic Association and the Crystallographic Society of Japan
    • Place of Presentation
      Tsukuba
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Cs-corrected HRTEM and advanced STEM of nano-structures and interfaces2005

    • Author(s)
      Tanaka, N
    • Organizer
      Beijing Conference and Exhibition on Instrumental Analysis
    • Place of Presentation
      Peking University, China
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] Recent development of spherical aberration corrected electron microscopy and its application to studies of nano-structures2005

    • Author(s)
      Tanaka, N., Yamasaki, J
    • Organizer
      International Symposium on Application of Quantum Beam 2005
    • Place of Presentation
      神戸大学
    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-17201022
  • [Presentation] スピン偏極TEMにおけるナノ秒パルス電子線の発生

    • Author(s)
      南保由人、桒原真人、楠総一郎、鮫島健輔、齋藤晃、宇治原徹、浅野秀文、竹田美和、田中信夫
    • Organizer
      日本顕微鏡学会 第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場
    • Year and Date
      2014-05-11 – 2014-05-13
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] Nano-second Time-Resolved Measurement in Spin- Polarized Pulse TEM

    • Author(s)
      Y. Nambo, M. Kuwahara, S. Kusunoki, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, N. Tanaka
    • Organizer
      The 4th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC4)
    • Place of Presentation
      Hamamatsu
    • Year and Date
      2014-05-08 – 2014-05-10
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] スピン偏極パルスTEMによるピコ秒パルス電子線発生

    • Author(s)
      桑原真人、南保由人、浅野秀文、齋藤晃、宇治原徹、田中信夫
    • Organizer
      日本顕微鏡学会 第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場
    • Year and Date
      2014-05-11 – 2014-05-13
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] Observation of electric field using electron diffractive imaging

    • Author(s)
      J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
    • Organizer
      18th International Microscopy Congress (IMC 2014)
    • Place of Presentation
      Prague (チェコ)
    • Year and Date
      2014-09-07 – 2014-09-12
    • Data Source
      KAKENHI-PROJECT-26600042
  • [Presentation] New possibility of ETEM studies of thick samples by HVEM

    • Author(s)
      N. Tanaka, T. Fujita, Y. Takahashi and S. Arai
    • Organizer
      18th International Microscopy Congress (IMC 2014)
    • Place of Presentation
      Prague, Czech
    • Year and Date
      2014-09-07 – 2014-09-12
    • Data Source
      KAKENHI-PROJECT-26246006
  • [Presentation] In situ micro-mechanical testing of grain boundaries combined with environmental TEM

    • Author(s)
      Yoshimasa Takahashi, Hikaru Kondo, Ryo Asano, Masanori Takuma, Kenichi Saitoh, Sigeo Arai, Shunsuke Muto, Nobuo Tanaka
    • Organizer
      Asian-Pacific Conference on Fracture and Strength (APCFS) /International Conference on Structural Integrity and Failure (SIF)
    • Place of Presentation
      Sydney, Australia
    • Year and Date
      2014-12-09 – 2014-12-12
    • Data Source
      KAKENHI-PROJECT-25709003
  • [Presentation] Observation of electric field using electron diffractive imaging

    • Author(s)
      J. Yamasaki, K. Ohta, H. Sasaki, and N. Tanaka
    • Organizer
      18th International Microscopy Congress (IMC 2014)
    • Place of Presentation
      Prague (チェコ)
    • Year and Date
      2014-09-07 – 2014-09-12
    • Data Source
      KAKENHI-PROJECT-26286049
  • [Presentation] スピン偏極TEMにおける偏極電子線のコヒーレンス評価

    • Author(s)
      桑原真人、楠聡一郎、南保由人、浅野秀文、齋藤晃、宇治原徹、竹田美和、田中信夫
    • Organizer
      日本顕微鏡学会 第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場
    • Year and Date
      2014-05-11 – 2014-05-13
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] TEMとSTEM:私の研究から

    • Author(s)
      田中信夫
    • Organizer
      2014年度 超高分解能顕微鏡法分科会 研究会
    • Place of Presentation
      マホロバ・マインズ三浦
    • Year and Date
      2015-02-20 – 2015-02-21
    • Invited
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] Spatial and Temporal Coherences in Spin-Polarized Transmission Electron Microscopy

    • Author(s)
      M. Kuwahara, S. Kusunoki, Y. Nambo, K. Sameshima, K. Saitoh, T. Ujihara, H. Asano, Y. Takeda, N. Tanaka
    • Organizer
      The 4th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC4)
    • Place of Presentation
      Hamamatsu
    • Year and Date
      2014-05-08 – 2014-05-10
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 回折顕微法による電子らせん波の位相回復および磁場イメージング

    • Author(s)
      南部裕紀, 齋藤晃, 田中信夫, 内田正哉
    • Organizer
      日本物理学会第70回年次大会
    • Place of Presentation
      早稲田大学早稲田キャンパス
    • Year and Date
      2015-03-21 – 2015-03-24
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] 電子ボルテックスビームの生成および伝播

    • Author(s)
      齋藤晃、長谷川裕也、平川和馬、田中信夫、内田正哉
    • Organizer
      日本顕微鏡学会 第70回学術講演会
    • Place of Presentation
      幕張メッセ国際会議場
    • Year and Date
      2014-05-11 – 2014-05-13
    • Invited
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] スピン偏極パルスTEMにおけるコヒーレンス

    • Author(s)
      桑原真人、南保由人、鮫島健輔、浅野秀文、宇治原徹、田中信夫
    • Organizer
      2014年度 超高分解能顕微鏡法分科会 研究会
    • Place of Presentation
      マホロバ・マインズ三浦
    • Year and Date
      2015-02-20 – 2015-02-21
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] スピン偏極透過電子顕微鏡を用いた磁性体観察

    • Author(s)
      鮫島健輔, 桒原真人, 南保由人, 齋藤晃, 宇治原徹, 田中信夫, 浅香透, 岡部桃子
    • Organizer
      日本物理学会第70回年次大会
    • Place of Presentation
      早稲田大学早稲田キャンパス
    • Year and Date
      2015-03-21 – 2015-03-24
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] Dynamic Observation from Continuous to Well-controlled Pulsed Electron Beams in Nagoya University

    • Author(s)
      N. Tanaka
    • Organizer
      The 4th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC4)
    • Place of Presentation
      Hamamatsu
    • Year and Date
      2014-05-08 – 2014-05-10
    • Data Source
      KAKENHI-PROJECT-24651123
  • [Presentation] TEMとSTEM:私の研究から

    • Author(s)
      田中信夫
    • Organizer
      2014年度 超高分解能顕微鏡法分科会 研究会
    • Place of Presentation
      マホロバ・マインズ三浦
    • Year and Date
      2015-02-20 – 2015-02-21
    • Invited
    • Data Source
      KAKENHI-PROJECT-26246006
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  • 2.  YAMASAKI Jun (40335071)
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  • 3.  SAITOH Koh (50292280)
    # of Collaborated Projects: 8 results
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  • 4.  MIHAMA Kazuhiro (50023007)
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  • 5.  ISHIDA Yoichi (60013108)
    # of Collaborated Projects: 6 results
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  • 6.  MUROOKA Yoshie (40273263)
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  • 7.  NAKANISHI Tsutomu (40022735)
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  • 8.  SHINDO Daisuke (20154396)
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  • 12.  YUKAWA Hiroshi (50293676)
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  • 13.  ZAIMA Shigeaki (70158947)
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  • 77.  ESAKI Masatoshi
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  • 80.  小椋 光
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  • 81.  宇治原 徹
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  • 82.  山本 剛久
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