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TAKAYANAGI Kunio  高柳 邦夫

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Researcher Number 80016162
Other IDs
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Affiliation (based on the past Project Information) *help 2007 – 2011: Tokyo Institute of Technology, 大学院・理工学研究科, 教授
2006: Tokyo Institute of Technology, Department of Condensed Matter Physics, Professor, 大学院理工学研究科, 教授
2001 – 2005: 東京工業大学, 大学院・理工学研究科, 教授
1996 – 2000: TIT,Graduate school, Dept.of materials & Engineering, Professor, 大学院・総合理工学研究科, 教授
1996: Tokyo Institute of Technology, Mater Sci, Professor, 総合理工研究科, 教授 … More
1993 – 1996: 東京工業大学, 総合理工学研究科, 教授
1995: 東京工業大学, 大学院・総合理工学研究科材料化学, 教授
1992 – 1994: 東京工業大学, 大学院・総合理工学研究科, 教授
1992: 東京工業大学, 大学院総合理工学研究科, 教授
1991 – 1992: 東京工業大学, 理学部, 教授
1989: 東京大学, 理学部, 教授
1988 – 1989: Physics Department, Professor, 理学部, 教授
1986 – 1987: 東京工業大学, 理学部, 助教授
1986: Tokyo Institute of Technology, assoc. professor, 理学部, 助教授
1985: 東京工業大学, 理, 助教授 Less
Review Section/Research Field
Principal Investigator
結晶学 / Nanostructural science / Physical properties of metals / Physics / 固体物性Ⅰ(光物性・半導体・誘電体) / Applied materials science/Crystal engineering / Applied materials
Except Principal Investigator
固体物性Ⅰ(光物性・半導体・誘電体) / Applied materials / 結晶学 … More / Applied materials science/Crystal engineering / 表面界面物性 / Physical properties of metals / 物性一般(含極低温・固体物性に対する理論) Less
Keywords
Principal Investigator
超高真空電子顕微鏡 / 表面再配列構造 / STM / 走査型トンネル顕微鏡 / 電子顕微鏡 / 表面構造 / 結晶成長 / 高分解能・超高真空電子顕微鏡 / 金 / 表面 … More / 走査トンネル顕微鏡 / シリコン / ナノワイヤ / 量子化コンダクタンス / 量子化電気伝導 / 超高真空電子顕微鏡法 / 混晶 / 表面変性エピタクシー / Gold cluster / Si(111)7x7 / reconstructed surface structure / high-resolution UHV electron microscope / その場観察 / 真空蒸着 / ヘテロエピタクシャル成長 / 超高真空・高分解能電子顕微鏡法 / シリコン-金属吸着構造 / シリコンー金属吸着構造 / 金属微粒子の構造 / シリコン表面 / Surface Structure / UHV Electron Microsocpy / Scanning tunneling Microscopy / 表面局在構造解析 / STM型超高真空電子顕微鏡 / グラファイト / surface structure analysis by transmission electron diffraction / 7x7 reconstruction of silicon surface / UHV electron microscope / 吸着構造 / 表面・結晶成長のミクロプロセス / 金原子とクラスター構造の高分解能観察 / 高分解能反射顕微鏡法 / 透過回析法による表面構造解析 / シリコン表面の7×7再配列構造 / active site / rutile / gold / HRTEM / catalyst / in-situ TEM / ultra fine particle / STS / 金触媒 / ナノ粒子 / 活性サイト / ルチル / 高分解能TEM / 触媒 / その場観察TEM / 超微粒子 / Atomic chain / Helical multi-shell nanowire / Super ionic conductor / Nonlinear conductance / Ballistic transport / Quantum Point Contact / 量子コンタクト / 融体 / ナノワイヤー / 原子間力顕微鏡 / 原子鎖 / ヘリカル多層ナノワイヤ / 超イオン伝導体 / 非線形コンダクタンス / バリスティック伝導 / 量子ポイントコンタクト / Gold Atomic Chain / Magic Number / High-Resolution Electron Microscopy / Quantized Conductance / Metal Nanowire / 白金ナノワイヤ / 鉛ナノワイヤ / 半整数値 / 単原子列 / 魔法数 / 炭素ナノチューブ / 金属ナノワイヤ / micro-evaporator / scanning tunneling microscopy / density-modulated super lattice / 密度変調・歪整合型格子 / 走査型マイクロ蒸発源 / 電界蒸発 / 不整合超格子 / マイクロ蒸発源 / 密度変調超格子 / Schottkey barrier / epitaxy / ultra-high vacuum electron microscope / シリコン・金属界面 / 原子スケール界面構造 / エピタクシャル界面 / ショットキー障壁 / エピタクシー / シリコン表面での混晶成長 / シリコン(001) / 分子線エピタクシ / 表面プラズモン / ルミネッセンス / ナノプローブ / 収差補正 / サーファクタント / シリコン表面の成長 / 錫を界面活性とするシリコン成長 / シリコン(111)表面のホモエピタクシ- / エピタクシャル成長 / 表面変性エピタクシ- … More
Except Principal Investigator
STM / 反射電顕法 / ゲルマニウム / シリコン / シリコン表面 / Germanium / Silicon / 走査型トンネル分光法 / 走査型トンネル顕微鏡 / 表面顕微鏡法 / 表面エレクトロマイグレーション / アトムプローブ / Ge / Si / MBE / ステップ形状 / 走査トンネル顕微鏡 / TEM / 光電子顕微鏡 / 表面顕微鏡 / 半導体 / Hydrogen on Si / Oxygen on Si / Si Surfaces / Reflection Electron Mictoscpy / Surface Electron Mictoscpy / 反射電子顕微法 / 表面電子顕微鏡 / Si(III)表面 / ガス吸着 / 低温表面 / Misfit Dislocation / Surface Stress / Step Morphology / Scanning Tunneling Microscope / Molecular Beam Epitaxy / Misfit転位 / 分子線エピタキシー / ミスフィット / 表面歪み / 分子線エピタオシー / Analytical Electron Microscopy / Interfaces / Nano-Materials / High Resolution Electron Microscopy / Convergent Beam Electron Diffraction / Electron probe / CCDカメラ / 表面・界面 / 原子クラスター / 精密構造解析 / ナノプローブ電子線 / イメージングプレート / 先端材料 / ナノメーター構造解析 / 分析電子顕微鏡 / 表・界面 / Nano materials / HREM / CBED / 電子線プローブ / silicon / tungsten / build-up / inertia piezomotor / field emission microscopy / scanning tunneling spectroscopy / scanning tunneling microscopy / atom transfer / ピエゾ慣性駆動モータ / 3次元粗動機構 / 電界放射電子分光法 / ピエゾ素子慣性駆動モータ / 3次元粗動 / 超高真空 / シリコン(111)面 / T-F処理 / タングステン / シリコン(lll)面 / ピエゾ素子慣性駆動 / 電界放射顕微鏡 / 原子移送 / Angle-resolved tunneling spectroscopy / Spin polarization / Near field / Coulomb blockade / STM light emission / SAM / Combined STM / UHV-AFM / 電解析出 / 金属のエピタキシャル成長 / フォトンSTM / 原子間隙相互作用 / 電子顕微鏡(SEM) / 絶縁体のトンネル過程 / 走査型原子間力 / 電気化学STM / 負性微分抵抗 / トンネル発光分光 / 探針-表面相互作用 / 走査型オージェ電子顕微鏡 / 高密度帯電機構 / 比接触原子分解能AFM / 静電気力顕微鏡 / 角度分解型トンネル分光 / スピン偏極 / 近接場 / クーロンブロッケード / トンネル発光 / 透過型電子顕微鏡 / STMとSAMの複合化 / トンネル顕微鏡 / 超高真空原子間力 / Epitaxial Growth / Eptaxial Growth / Scanning Tunneling Spectroscopy / Scanning Tunneling Microscopy / ヘテロ構造 / エピタキシャル成長 / ダイマー / Ge(ゲルマニウム) / Si(シリコン) / Si(001)2X1 / 高温超伝導体 / Si(111)7X7 / FIM / 透過電顕法 / 微構造 / 原子尺度の制御 / Misfit単位 / C60分子 / カーボン / ナノチューブ / 操作トンネル顕微鏡 / XSTM / ボロンクラスター / 反応場の構造 / 表面反応 / 脱離現象 / 紫外レーザーと表面の相互作用 / 第一原理分子動力学法 / 非熱的過程 / 量子過程 / 表面動的過程 / ショットキー障壁 / 構造安定性 / 電子状態 / 界面反応 / ヘテロ接合 / 金属ー半導体界面 / 微粒子 / エレクトロマイグレ-ション / 原子尺度 / 超構造 Less
  • Research Projects

    (30 results)
  • Research Products

    (40 results)
  • Co-Researchers

    (37 People)
  •  Angle Resolved Spectroscopic Observation of Electron Beam induced Radiation from Nano-Structures excited by Low-Energy Electron Nano-probePrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      2007 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (S)
    • Research Field
      Nanostructural science
    • Research Institution
      Tokyo Institute of Technology
  •  Observation of quantum effect of catalyst activity of Gold Nanoisland / MO_xPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      2004 – 2006
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Nanostructural science
    • Research Institution
      Tokyo Institute of Technology
  •  Quantum ContactPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      2000 – 2003
    • Research Category
      Grant-in-Aid for Specially Promoted Research
    • Review Section
      Physics
    • Research Institution
      Tokyo Institute of Technology
  •  TEM-STMを用いたカーボンナノチューブ成長機構と物性のその場観察

    • Principal Investigator
      平山 博之
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas (A)
    • Research Institution
      Tokyo Institute of Technology
  •  Misfit転位網をもちいたC60量子細線ネットワーク形成

    • Principal Investigator
      平山 博之
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Exploratory Research
    • Research Field
      固体物性Ⅰ(光物性・半導体・誘電体)
    • Research Institution
      Tokyo Institute of Technology
  •  Thin Film Growth around Misfit Dislocations

    • Principal Investigator
      HIRAYAMA Hiroyuki
    • Project Period (FY)
      1999 – 2000
    • Research Category
      Grant-in-Aid for Scientific Research (B).
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Tokyo Institute of Technology
  •  Study of Nano-fabrication and Tunneling Phenomenon of Nanowires at Tip-Surface studied by UHV electron microscoopyPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1997 – 1999
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      固体物性Ⅰ(光物性・半導体・誘電体)
    • Research Institution
      Tokyo Institute of Technology
  •  Si劈開表面における正20面体Bクラスターの研究

    • Principal Investigator
      HIRAYAMA Hiroyuki
    • Project Period (FY)
      1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  Detailed structure-analysis by using electron probe

    • Principal Investigator
      TANAKA Nobuo
    • Project Period (FY)
      1994 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      固体物性Ⅰ(光物性・半導体・誘電体)
    • Research Institution
      NAGOYA UNIVERSITY
  •  Development of scanning micro-evaporator for the study of SiGeCPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1994 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Tokyo Institute of Technology
  •  Quantized Tunneling Processes and Novel Methods

    • Principal Investigator
      MORITA Seizo
    • Project Period (FY)
      1993 – 1996
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
      Hiroshima University
  •  Construction of an experimental apparatus for atom transfer between nano-regions

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1993 – 1995
    • Research Category
      Grant-in-Aid for Developmental Scientific Research (B)
    • Research Field
      表面界面物性
    • Research Institution
      Japan Advanced Institute of Science and Technology, Hokuriku
      Tokyo Institute of Technology
  •  表面変性エピタクシーPrincipal Investigator

    • Principal Investigator
      高柳 邦夫
    • Project Period (FY)
      1992
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  表面量子過程

    • Principal Investigator
      村田 好正
    • Project Period (FY)
      1992
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      物性一般(含極低温・固体物性に対する理論)
    • Research Institution
      The University of Tokyo
  •  Schottrey barrier height of epitaxial interface studied by UHV-electron microscopePrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      Applied materials
    • Research Institution
      Tokyo Institute of Technology
  •  Microscopic Study of Si-Ge Heteroepitaxial Growth by STM/STS

    • Principal Investigator
      TOMITORI Masahiko
    • Project Period (FY)
      1992 – 1993
    • Research Category
      Grant-in-Aid for General Scientific Research (C)
    • Research Field
      Physical properties of metals
    • Research Institution
      TOKYO INSTITUTE OF TECIHNOLOGY
  •  表面変性エピタクシ-Principal Investigator

    • Principal Investigator
      高柳 邦夫
    • Project Period (FY)
      1991
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  表面変性エピタクシーPrincipal Investigator

    • Principal Investigator
      高柳 邦夫
    • Project Period (FY)
      1991 – 1993
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  半導体の原子尺度での制御に関する研究

    • Principal Investigator
      伊藤 良一
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      Applied materials
    • Research Institution
      The University of Tokyo
  •  表面顕微鏡法による表面観察と解析

    • Principal Investigator
      YAGI Katsumichi
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  金属ー半導体積層界面の基礎

    • Principal Investigator
      平木 昭夫
    • Project Period (FY)
      1989
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Osaka University
  •  半導体の原子尺度での制御に関する研究

    • Principal Investigator
      伊藤 良一
    • Project Period (FY)
      1988
    • Research Category
      Grant-in-Aid for Co-operative Research (B)
    • Research Field
      Applied materials
    • Research Institution
      The University of Tokyo
  •  表面顕微鏡法による表面の観察と解析

    • Principal Investigator
      八木 克道
    • Project Period (FY)
      1988
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  表面顕微鏡法による表面の観察と解析

    • Principal Investigator
      八木 克道
    • Project Period (FY)
      1987
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Research Institution
      Tokyo Institute of Technology
  •  Studies on Surfaces and Heterogrowths by High-Resolution UHV Electron MicroscopyPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI K
    • Project Period (FY)
      1987 – 1988
    • Research Category
      Grant-in-Aid for General Scientific Research (B)
    • Research Field
      結晶学
    • Research Institution
      Tokyo Institute of Technology
  •  超高真空電子顕微鏡による非平衡状態からの混晶成長と構造の解析Principal Investigator

    • Principal Investigator
      高柳 邦夫
    • Project Period (FY)
      1986
    • Research Category
      Grant-in-Aid for Special Project Research
    • Research Institution
      Tokyo Institute of Technology
  •  Development of STM for structure analysis of surfacesPrincipal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      Physical properties of metals
    • Research Institution
      Tokyo Institute of Technology
  •  Developemtn of Low temperture Surface Electron Mictoscpy and its Application to Gas Adsotption on Surfaces.

    • Principal Investigator
      YAGI Katsumichi
    • Project Period (FY)
      1986 – 1987
    • Research Category
      Grant-in-Aid for Developmental Scientific Research
    • Research Field
      結晶学
    • Research Institution
      Tokyo Institute of Technology
  •  超高真空電子顕微鏡による非平衡状態からの混晶成長と構造の解析Principal Investigator

    • Principal Investigator
      高柳 邦夫
    • Project Period (FY)
      1985
    • Research Category
      Grant-in-Aid for Special Project Research
    • Research Institution
      Tokyo Institute of Technology
  •  Ultra-high vacuum electron microscope study on Micro-processes of surface and crystal growth.Principal Investigator

    • Principal Investigator
      TAKAYANAGI Kunio
    • Project Period (FY)
      1984 – 1986
    • Research Category
      Grant-in-Aid for General Scientific Research (A)
    • Research Field
      結晶学
    • Research Institution
      Tokyo Institute of Technology

All 2012 2011 2010 2009 2008 2007 2006 2003

All Journal Article Presentation

  • [Journal Article] Electron microscopy at a sub-50 pm resolution2011

    • Author(s)
      K.Takayanagi, S.Kim, S.Lee, Y.Oshima, T.Tanaka, Y.Tanishiro, H.Sawada, F.Hosokawa, T.Tomita, T.Kaneyama, Y.Kondo
    • Journal Title

      Journal of Electron Microsc

      Volume: 60 Issue: suppl 1 Pages: S239-S244

    • DOI

      10.1093/jmicro/dfr048

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Electronmicroscopy ata sub-50 pm resolution2011

    • Author(s)
      K. Takayanagi, S. Kim, S. Lee, Y. Oshima, T. Tanaka, Y. Tanishiro, H. Sawada, F. Hosokawa, T. Tomita, T. Kaneyama and Y. Kondo
    • Journal Title

      Journalof ElectronMicrosc

      Volume: Vol.60

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] One-by-One Introduction of Single Lattice Planes in a Bottle necked Gold Contact During Stretching2010

    • Author(s)
      Y.Oshima, Y.Kurui, K.Takayanagi
    • Journal Title

      Journal of Physical Society of Japan

      Volume: 79

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Quantitative Annular Dark Field STEM Image of Silicon Crystal using a Large Convergent Electron Probe with a 300-kv Cold Field Emission Gun2010

    • Author(s)
      S.Kim, Y.Oshima, H.sawada, T.Kaneyama, Y.Kondo, M.Takeguchi, Y.Nakayama, Y.Tanishiro, K.Takayanagi
    • Journal Title

      Journal of Electron Microscopy

      Volume: 60 Pages: 109-116

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Quantita tive Annular Dark Field STEM Image of Silicon Crystal using a Large Conver gent Electron Probe with a 300-kV Col d Field Emission Gun2010

    • Author(s)
      S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Y. Nakayama, Y. Tanishiro, and K. Takayanagi
    • Journal Title

      Journal of Elec tron Microscopy

      Volume: Vol.60 Pages: 109-116

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Direct Imaging of Lithium Atoms in LiV_2O_4 by a Spherical Aberration Corrected Electron Microscope2010

    • Author(s)
      Y.Oshima, H.Sawada, F.Hosokawa, E.Okunishi, T.Kaneyama, Y.Kondo, S.Niitaka, H.Takagi, Y.Tanishiro, K.Takayanagi
    • Journal Title

      Journal of Electron Microscopy

      Volume: 59 Pages: 457-467

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Direct Imaging of Lithium Atoms in LiV2O4 by a Spherical Aberration Co rrected Electron Microscope2010

    • Author(s)
      Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro, and K. Takayanagi
    • Journal Title

      Journal of Electron M icroscopy

      Volume: Vol.59

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] One-by-One Introduction of Single Lattice Planes in a Bottlenecked Gold Contact during Stretching2010

    • Author(s)
      Y. Oshima, Y. Kurui and K. Takayanagi
    • Journal Title

      Journal of Physical Society of Jap an

      Volume: Vol.79

    • NAID

      40017104676

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] A Dopant Cluster in a Highly Antimony Doped Silicon Crystal2010

    • Author(s)
      S.Kim, Y.Oshima, H.Sawada, N.Hashikawa, K.Asayama, T.Kaneyama, Y.Kondo, Y.Tanishiro, K.Takayanagi
    • Journal Title

      Applied Physics.Express

      Volume: 3

    • NAID

      10026586310

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] A Dopant Cluster in a Highly Antimony Doped Si licon Crystal2010

    • Author(s)
      S. Kim, Y. Oshima, H. Sawada, N. Hashikawa, K. Asayama, T. Kaneyama, Y. Kondo, Y. Tanishiro and K. Takayanagi
    • Journal Title

      Applied Physics. Expre ss

      Volume: Vol.3

    • NAID

      10026586310

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Conductance quantization and dequantization in gold nanowires due to multiple reflection at the interface2009

    • Author(s)
      Y.Kurui, Y.Oshima, K.Takayanagi
    • Journal Title

      Phys. Rev. B 79

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] STEM imaging of 47-pm-separated atomic columns by a spherical aberration -corrected electron microscope with a 300-kV cold field emission gun2009

    • Author(s)
      H. Sawada, Y. Tanishiro, N. Ohashi, T. Tomita F. Hosokawa, T. Kaneyama, Y. Kondo, K. Takayanagi
    • Journal Title

      J. Electron. Microsc 58

      Pages: 357-361

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun2009

    • Author(s)
      H.Sawada, Y.Tanishiro, N.Ohashi, T.Tomita F.Hosokawa, T.Kaneyama, Y.Kondo, K.Takayanagi
    • Journal Title

      J. Electron. Microsc. 58

      Pages: 357-361

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Measurement Method of Aberration from Ronchigram by Autocorrelation Function2008

    • Author(s)
      H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi
    • Journal Title

      Ultramicroscopy 108

      Pages: 1467-1475

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Journal Article] Active-Site Imaging of Au Nanoparticle Catalyst on rutile-TiO_2 by TEM2007

    • Author(s)
      T.Tanaka, M.Ando, K.Sano, K.Takayanagi
    • Journal Title

      Proc. 54 th, Japanese Applied Physics Society 28a ZA/II

      Pages: 667-667

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Shape Change of Au clusters dispersed on rutile Ti02(110) surface in CO and O2 gases2006

    • Author(s)
      M.Ando, T.Tanaka, K.Takayanagi
    • Journal Title

      Proc. 16th Int. Microsc. Cong. 3

      Pages: 1569-1569

    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Dynamic behavior of Au Nanoparticles Exposured to CO and O_2 Revealed By Novel TEM-Gas Inlet Holder equipped with compact valves2006

    • Author(s)
      T.Tanaka, M.Ando, K.Takayanagi
    • Journal Title

      Proc. 16th Int. Microsc. Cong. Vol. 2

      Pages: 937-937

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Shape Change of Au clusters dispersed on rutile TiO_2 (110) surface in CO and O_2 gases2006

    • Author(s)
      M.Ando, T.Tanaka, K.Takayanagi
    • Journal Title

      Proc.16th Int.Microsc.Cong. Vol.3

      Pages: 1569-1569

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Dynamic behavior of Au Nanoparticles Exposured to CO and O_2 Revealed By Novel TEM-Gas Inlet Holder equipped with compact valves2006

    • Author(s)
      T.Tanaka, M.Ando, K.Takayanagi
    • Journal Title

      Proc.16th Int.Microsc.Cong. Vol.2

      Pages: 937-937

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Dynamic behavior of Au Nanoparticles Exposured to CO and O2 Revealed By Novel TEM-Gas Inlet Holder equipped with compact valves2006

    • Author(s)
      T.Tanaka, M.Ando, K.Takayanagi
    • Journal Title

      Proc. 16th Int. Microsc. Cong. 2

      Pages: 937-937

    • Data Source
      KAKENHI-PROJECT-16201020
  • [Journal Article] Shape Change of Au clusters dispersed on rutile TiO_2 (110) surface in CO and O_2 gases2003

    • Author(s)
      M.Ando, T.Tanaka, K.Takayanagi
    • Journal Title

      Proc. 16th Int. Microsc. Cong. Vol. 3

      Pages: 1569-1569

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16201020
  • [Presentation] 高分解能カソードルミネッセンス顕微鏡による金属微粒子表面プラズモンの研究2012

    • Author(s)
      江成めぐみ, 山本直紀、高柳邦夫
    • Organizer
      日本物理学会第67回年次大会
    • Place of Presentation
      関西学院大
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] 球面収差補正STEMによるZコントラストイメージング2012

    • Author(s)
      和田麻友香、谷城康眞、高柳邦夫
    • Organizer
      日本物理学会、第67回年次大会
    • Place of Presentation
      関西学院大学
    • Year and Date
      2012-03-27
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] 高分解能カソードルミネッセンス装置の開発と応用2011

    • Author(s)
      山本直紀、江成めぐみ、高柳邦夫
    • Organizer
      日本顕微鏡学会第67回学術講演会
    • Place of Presentation
      福岡国際会議場
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Z-contrast Imaging by Cs-corrected STEM2011

    • Author(s)
      M.Wada、Y.Tanishiro, K.Takayanagi
    • Organizer
      ISSS-6
    • Place of Presentation
      Tokyo in Japan
    • Year and Date
      2011-12-12
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Observation of defects in CuInSe2 by 300kV aberration corrected scanning transmission electron microscope2011

    • Author(s)
      A. Takeshita, T. Tanaka, T. Kubota, H. Miyake, H. Sawada, Y. Kondo, Y. Oshima, Y. Tanishiro and K. Takayanagi
    • Organizer
      APS March Meeting 2011
    • Place of Presentation
      Dallas USA
    • Year and Date
      2011-03-21
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] An effect of probe current on ADF image intensity of Si crystal2011

    • Author(s)
      S. Kim, Y. Oshima, Y. Tanishiro and K. Takayanagi
    • Organizer
      APS March Meeting 2011
    • Place of Presentation
      Dallas USA
    • Year and Date
      2011-03-24
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Nanostructures at Matrix/Interface/Surface2011

    • Author(s)
      K.Takayanagi
    • Organizer
      11^<th>ACSIN2011
    • Place of Presentation
      St. Petersburg, Russia(招待講演)
    • Year and Date
      2011-10-03
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Z-contrast Imaging by Aberration-Corrected ADF-STEM2011

    • Author(s)
      M.Wada, Y.Tanishiro, K.Takayanagi
    • Organizer
      ALC'11
    • Place of Presentation
      Korea
    • Year and Date
      2011-05-24
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Surface/interface imaging by ABF-STEM method : Litium ions in diffusion channel of LIB electrode materials2011

    • Author(s)
      S. Lee, Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, Y. Tanishiro and K. Takayanagi
    • Organizer
      ISSS-6
    • Place of Presentation
      Tokyo Japan
    • Year and Date
      2011-12-14
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Z-contrast Imaging by Aberration-Corrected ADF-STEM2011

    • Author(s)
      M. Wada, Y. Tanishiro and K. Takayanagi
    • Organizer
      ALC' 11
    • Place of Presentation
      Korea
    • Year and Date
      2011-05-24
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] 薄膜試料におけるリチウムイオンの定量観察2011

    • Author(s)
      李少淵、大島義文、高柳邦夫
    • Organizer
      表面・界面スペクトロスコピー2011
    • Place of Presentation
      三浦マホロバマインズ
    • Year and Date
      2011-12-02
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Localized surface plasmon in metal nanoparticles studied by high-resolution cathodoluminescence2011

    • Author(s)
      M.Enari, N.Yamamoto, K.Takayanagi
    • Organizer
      ISSS-6
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Z-contrast Imaging by Cs-corrected STEM2011

    • Author(s)
      M. Wada、Y. Tanishiro and K. Takayanagi
    • Organizer
      ISSS-6
    • Place of Presentation
      Tokyo
    • Year and Date
      2011-12-12
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] 高分解能カソードルミネッセンス顕微鏡による金属微粒子表面プラズモンの研究2011

    • Author(s)
      江成めぐみ, 山本直紀、高柳邦夫
    • Organizer
      日本物理学会2011秋季大会
    • Place of Presentation
      富山大
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Visualization of Lithium Atoms in LiV_2O_4 by a SphericalAberration Corrected Electron Microscope2010

    • Author(s)
      Y.Oshima, H.Sawada, E.Okunishi, Y.Kondo, S.Niitaka, H.Takagi, Y.Tanishiro, K.Takayanagi
    • Organizer
      Microscopy & Microanalysis 2010 Meeting
    • Place of Presentation
      Portland U.S.A
    • Year and Date
      2010-08-04
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope2010

    • Author(s)
      Y. Oshima, H. Sawada, E. Okunishi, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro and K. Takayanagi
    • Organizer
      Microscopy & Microanalysis2010 Meeting
    • Place of Presentation
      Portland U. S. A
    • Year and Date
      2010-08-04
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Visualization of Lithium Atoms in LiV2O4 using a Spherical Aberration Corrected Electron Microscope2010

    • Author(s)
      Y. Oshima, H. Sawada, Y. Kondo, K. Takayanagi, Y. Tanishiro
    • Organizer
      7th International Microscopy Congress
    • Place of Presentation
      Riode Janeiro Brazil
    • Year and Date
      2010-09-20
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] Visualization of Lithium Atoms in LiV_2O_4 using a Spherical Aberration Corrected Electron Microscope2010

    • Author(s)
      Y.Oshima, H.Sawada, Y.Kondo, K.Takayanagi, Y.Tanishiro
    • Organizer
      17th International Microscopy Congress
    • Place of Presentation
      Rio de Janeiro, BRAZIL
    • Year and Date
      2010-09-20
    • Data Source
      KAKENHI-PROJECT-19101004
  • [Presentation] 50pm resolution electron microscope, performance and application2009

    • Author(s)
      K. Takayanagi
    • Organizer
      Workshop on Advanced Application of Aberration Correction TEM (National Synchrotron Radiation Research Center Hsinchu
    • Place of Presentation
      Taiwan
    • Data Source
      KAKENHI-PROJECT-19101004
  • 1.  TANISHIRO Yasumasa (40143648)
    # of Collaborated Projects: 8 results
    # of Collaborated Products: 23 results
  • 2.  OSHIMA Yoshifumi (80272699)
    # of Collaborated Projects: 7 results
    # of Collaborated Products: 0 results
  • 3.  HIRAYAMA Hiroyuki (60271582)
    # of Collaborated Projects: 7 results
    # of Collaborated Products: 0 results
  • 4.  YAGI Katsumichi (90016072)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 0 results
  • 5.  KIMURA Yoshinobu (60225076)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 0 results
  • 6.  YAMAMOTO Naoki (90108184)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 4 results
  • 7.  TOMITORI Masahiko (10188790)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 8.  中島 尚男 (20198071)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 9.  西川 治 (10108235)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 10.  MINODA Hiroki (20240757)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 11.  伊藤 良一 (40133102)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 12.  尾鍋 研太郎 (50204227)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 13.  竹田 美和 (20111932)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 14.  吉野 淳二 (90158486)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 15.  寺倉 清之 (40028212)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 16.  MORITA Seizo (50091757)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 17.  OHTSU Motoichi (70114858)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 18.  UOZUMI Kiyohiko (20011124)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 19.  USHIODA Suketatsu (90176652)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 20.  ICHINOKAWA Takeo (70063310)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 21.  TANAKA Nobuo (40126876)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 22.  HIROTSU Yoshihiko (70016525)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 23.  SHINDO Daisuke (20154396)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 24.  HIRAGA Kenji (30005912)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 25.  TANAKA Takayuki (10367120)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 7 results
  • 26.  丹司 敬義 (90125609)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 27.  平木 昭夫 (50029013)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 28.  金原 桀 (90010719)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 29.  長谷川 英機 (60001781)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 30.  一宮 彪彦 (00023292)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 31.  村田 好正 (10080467)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 32.  吉森 昭夫 (50013470)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 33.  興地 斐男 (20029002)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 34.  石田 洋一 (60013108)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 35.  KONDO Yukihito
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 36.  HARADA Yoshiyasu
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 37.  YAGI Kastumichi
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results

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