YAMAUCHI Jun 山内淳

… Alternative Names

山内淳ヤマウチジユン

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Researcher Number	90383984
Other IDs
Affiliation (Current)	2025: 慶應義塾大学, 理工学部(矢上), 准教授
Affiliation (based on the past Project Information) *help	2010 – 2014: 慶應義塾大学, 理工学部, 准教授 2007 – 2009: 慶応義塾大学, 理工学部, 講師 2008: 慶応義塾大学, 理工学部, 専任講師 2005 – 2008: 慶應義塾大学, 理工学部, 専任講師
Review Section/Research Field	Except Principal Investigator Science and Engineering / Science and Engineering
Keywords	Except Principal Investigator 第一原理計算 / 半導体 / 炭素ナノチューブ / 分子動力学法 / モデリング / 原子間力モデル / 電極反応 / 非平衡ダイナミクス / 熱伝導 / 第一原理分子動力学法 … More / 量子効果 / MOSトランジスタ / ナノ物性 / 半導体デバイス / 界面 / ナノサイエンス / 新材料 / ナノ界面 / 理論 / 電子状態 / バイオ物質 / ナノ物質 / ナノ構造 / 量子力学 / タンパク質 / 表面・界面 / ナノ構造体 / 密度汎関数理論 / 計算科学 / 量子論 Less

Studies on Structure Sampling and Non-Equilibrium Dynamics Using Ab-Initio Molecular Dynamics Methods
- Principal Investigator
  
  TSUNEYUKI Shinji
- Project Period (FY)
  2010 – 2014
- Research Category
  
  Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
- Review Section
  
  Science and Engineering
- Research Institution
  The University of Tokyo
Theoretical Design of Nano-Device and Nano-Interface by First Principles Approach
- Principal Investigator
  
  SHIRAISHI Kenji
- Project Period (FY)
  2006 – 2009
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  University of Tsukuba
Quantum Design of Shapes and Functions in Nano- and Bio-Materials
- Principal Investigator
  
  OSHIYAMA Atsushi
- Project Period (FY)
  2005 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  The University of Tokyo
  University of Tsukuba

All 2014 2013 2012 2011 2010 2009 2008 2007 Other

All Journal Article Presentation

[Journal Article] First Principles XPS Calculation for the B defects in SiC2014
- Author(s)
  N. Matsushima and J. Yamauchi
- Journal Title
  
  JPS Conf. Proc.
  
  Volume: 1 Pages: 12027-12027
- DOI
  10.7566/jpscp.1.012027
- Peer Reviewed
- Data Source
  KAKENHI-PLANNED-22104006
[Journal Article] First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal2014
- Author(s)
  H. Kishi, M. Miyazawa, N. Matsushima, J. Yamauchi
- Journal Title
  
  AIP Conf. Proc.
  
  Volume: 1583 Pages: 226-229
- DOI
  10.1063/1.4865641
- Peer Reviewed / Acknowledgement Compliant
- Data Source
  KAKENHI-PLANNED-22104006
[Journal Article] A first-principles core-level XPS study on the boron impurities in germanium crystal2013
- Author(s)
  J. Yamauchi, Y. Yoshimoto, and Y. Suwa
- Journal Title
  
  AIP Conf. Proc.
  
  Volume: 1566 Pages: 41-41
- DOI
  10.1063/1.4848275
- Peer Reviewed
- Data Source
  KAKENHI-PLANNED-22104006
[Journal Article] X-ray Photoelectron Spectroscopy for the Boron Impurities in Silicon : a First-principles Study2011
- Author(s)
  J.Yamauchi, Y.Yoshimoto
- Journal Title
  
  AIP Conf.Proc.
  
  Volume: 1,399 Pages: 89-90
- DOI
  10.1063/1.3666271
- Peer Reviewed
- Data Source
  KAKENHI-PLANNED-22104006
[Journal Article] Identification of boron clusters in silicon crystal by B1s core-level X-ray photoelectron spectroscopy : A first-principles study2011
- Author(s)
  Jun Yamauchi, Yoshihide Yoshimoto and Yuji Suwa
- Journal Title
  
  Applied Physics Letters
  
  Volume: 99 Issue: 19 Pages: 191901-191901
- DOI
  10.1063/1.3658030
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-20740215, KAKENHI-PLANNED-22104006
[Journal Article] Qualitative prediction of conduction band valley profile in silicon thin films from bulk properties by density functional k.p perturbation theory2009
- Author(s)
  J. Yamauchi
- Journal Title
  
  J. of Computational and Theoretical Nanoscience (印刷中)(掲載確定)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective Mass Anomalies in Strained Si Thin Films and Crystals2008
- Author(s)
  J. Yamauchi
- Journal Title
  
  IEEE Electron Device Letters 29
  
  Pages: 186-188
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective Mass Anomalies in Strained Si Thin Films and Crystals2008
- Author(s)
  J. Yamauchi
- Journal Title
  
  IEEE ELECTRON DEVICE LETTERS 29
  
  Pages: 186-188
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063003
[Journal Article] Effective Mass Anomalies in Strained-Si Thin Films and Crystals2008
- Author(s)
  J. Yamauchi
- Journal Title
  
  IEEE Electron Device Letters 29
  
  Pages: 186-188
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective mass anomalies in strained Si thin films and crystals2008
- Author(s)
  J. Yamauchi
- Journal Title
  
  IEEE Electron Device Letters 29
  
  Pages: 186-186
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] シリコンナノ構造の第一原理計算 : 有効質量異常の発現2008
- Author(s)
  山内淳
- Journal Title
  
  固体物理 43
  
  Pages: 289-296
- NAID
  40016099914
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063003
[Journal Article] トリコンナノ構造の第一原理計算 : 有効質量異常の発現2008
- Author(s)
  山内淳
- Journal Title
  
  固体物理 43
  
  Pages: 289-296
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective-Mass Anormalies in Strained Si Thin Films and Crystals2007
- Author(s)
  J., Yamauchi
- Journal Title
  
  IEEE ELECTRON DEVICE LETTERS; 29
  
  Pages: 186-1886
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063003
[Journal Article] Electronic transport properties of strained Si thin films: Effective mass anomalies2007
- Author(s)
  J. Yamauchi
- Journal Title
  
  Conference Porceedings 893, Physics of Semi conductors, 28^<th> International Conference
  
  Pages: 1405-1406
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective-Mass Anormalies of Strained Silicon Thin Films: Surface and Confinement Effects2007
- Author(s)
  J. Yamauchi, S. Matsuno
- Journal Title
  
  JAPANEASE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIER COMMUNICATIONS & REVIEW PAPERS 46
  
  Pages: 3273-3276
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063003
[Journal Article] Effective-mass anomalies of strained Si thin films : surface and confinement effects2007
- Author(s)
  J. Yamauchi and S. Matsuno
- Journal Title
  
  Jpn. J. Appl. Phys. 46
  
  Pages: 3273-3273
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective-Mass Anormalies of Strained Silicon Thin Films:Surface and Confinement Effects2007
- Author(s)
  J., Yamauchi・S., Matsuno
- Journal Title
  
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1 46
  
  Pages: 3273-3276
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18063003
[Journal Article] Effective-Mass Anomalies of Strained Silicon Thin Films: Surface and Confinement Effects2007
- Author(s)
  J. Yamauchi and S. Matsuno
- Journal Title
  
  Japanese Journal of Applied Physics 46
  
  Pages: 3273-3276
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17064002
[Journal Article] Effective-Mass Anomalies of Strained Silicon Thin Films : Surface and Confinement Effects2007
- Author(s)
  J.Yamauchi, S.Matsuno
- Journal Title
  
  Jpn.J.Appl.Phys. (印刷中)
- Data Source
  KAKENHI-PROJECT-17064002
[Presentation] 「第一原理計算の基礎：密度汎関数法を中心として」2012
- Author(s)
  山内　淳
- Organizer
  分子シミュレーション研究会
- Place of Presentation
  慶應義塾立科山荘（長野県）
- Year and Date
  2012-09-07
- Invited
- Data Source
  KAKENHI-PLANNED-22104006
[Presentation] Si中不純物Bの第一原理計算XPSスペクトルにおけるモデルサイズ依存性2010
- Author(s)
  山内淳
- Organizer
  日本物理学会2010年秋季大会
- Place of Presentation
  大阪府立大学
- Year and Date
  2010-09-26
- Data Source
  KAKENHI-PLANNED-22104006
[Presentation] SiC中不純物格子欠陥の第一原理XPS計算
- Author(s)
  松島直輝、山内淳
- Organizer
  日本物理学会　2013年秋季大会
- Place of Presentation
  徳島大学・常三島キャンパス（徳島県）
- Data Source
  KAKENHI-PLANNED-22104006
[Presentation] First principles XPS calculation for the B defects in SiC
- Author(s)
  N. Matsushima and J. Yamauchi
- Organizer
  the 12th Asia Pacific Physics Conference (APPC12)
- Place of Presentation
  Makuhari Messe（Chiba）
- Data Source
  KAKENHI-PLANNED-22104006
[Presentation] First-principles core-level XPS calculation on the defects in semiconductors
- Author(s)
  H. Kishi, M. Miyazawa, N. Matsushima, and J. Yamauchi
- Organizer
  The 27th Int. Conf. on Defects in Semiconductors
- Place of Presentation
  Complesso Belmeloro(Bologna, Italy)
- Data Source
  KAKENHI-PLANNED-22104006
[Presentation] SiC中N欠陥の第一原理XPS計算
- Author(s)
  松島直輝、山内淳
- Organizer
  日本物理学会　第６９回年次大会
- Place of Presentation
  東海大学・湘南キャンパス（神奈川県）
- Data Source
  KAKENHI-PLANNED-22104006

1. BOERO Mauro (40361315)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
2. OKADA Susumu (70302388)

# of Collaborated Projects: 3 results

# of Collaborated Products: 0 results
3. OSHIYAMA Atsushi (80143361)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. SHIRAISHI Kenji (20334039)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. BERBER Savas (90375402)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. IWATA Junichi (70400695)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. NAKAYAMA Takashi (70189075)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
8. UCHIDA Kazuyuki (10393810)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
9. MURAGUCHI Masakazu (90386623)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. NOMURA Shintaro (90271527)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. ENDOH Tetsuo (00271990)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. TSUNEYUKI Shinji (90197749)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. OTANI Minoru (50334040)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. YOSHIMOTO Yoshihide (80332584)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
15. SUGINO Osamu (90361659)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. MORIKAWA Yoshitada (80358184)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. AKAGI Kazuto (50313119)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. TATEYAMA Yoshitaka (70354149)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. SUWA Yuji (20216500)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
20. GOHDA Yoshihiro (50506730)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

YAMAUCHI Jun 山内 淳

山内 淳 ヤマウチ ジユン

Research Projects

Research Products

Co-Researchers

Studies on Structure Sampling and Non-Equilibrium Dynamics Using Ab-Initio Molecular Dynamics Methods

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Theoretical Design of Nano-Device and Nano-Interface by First Principles Approach

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

Quantum Design of Shapes and Functions in Nano- and Bio-Materials

Principal Investigator

Project Period (FY)

Research Category

Review Section

Research Institution

[Journal Article] First Principles XPS Calculation for the B defects in SiC2014

Author(s)

Journal Title

DOI

Data Source

[Journal Article] First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal2014

Author(s)

Journal Title

DOI

Data Source

[Journal Article] A first-principles core-level XPS study on the boron impurities in germanium crystal2013

Author(s)

Journal Title

DOI

Data Source

[Journal Article] X-ray Photoelectron Spectroscopy for the Boron Impurities in Silicon : a First-principles Study2011

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Identification of boron clusters in silicon crystal by B1s core-level X-ray photoelectron spectroscopy : A first-principles study2011

Author(s)

Journal Title

DOI

Data Source

[Journal Article] Qualitative prediction of conduction band valley profile in silicon thin films from bulk properties by density functional k.p perturbation theory2009

Author(s)

Journal Title

Data Source

[Journal Article] Effective Mass Anomalies in Strained Si Thin Films and Crystals2008

Author(s)

Journal Title

Data Source

[Journal Article] Effective Mass Anomalies in Strained Si Thin Films and Crystals2008

Author(s)

Journal Title

Data Source

[Journal Article] Effective Mass Anomalies in Strained-Si Thin Films and Crystals2008

Author(s)

Journal Title

Data Source

[Journal Article] Effective mass anomalies in strained Si thin films and crystals2008

Author(s)

Journal Title

Data Source

[Journal Article] シリコンナノ構造の第一原理計算 : 有効質量異常の発現2008

Author(s)

Journal Title

NAID

Data Source

[Journal Article] トリコンナノ構造の第一原理計算 : 有効質量異常の発現2008

Author(s)

Journal Title

Data Source

[Journal Article] Effective-Mass Anormalies in Strained Si Thin Films and Crystals2007

Author(s)

Journal Title

YAMAUCHI Jun 山内淳

山内淳ヤマウチジユン