大竹 哲史  Ohtake Satoshi

2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)

巻: - ページ: 663-664

10.1109/icce-taiwan58799.2023.10227017

Proceedings of IEEE 28th Asian Test Symposium

巻: - ページ: 31-36

10.1109/ats47505.2019.000-4

電子情報通信学会技術報告

巻: 117 ページ: 49-54

Proceedings of 18th IEEE Latin American Test Symposium

巻: - ページ: 1-4

10.1109/latw.2017.7906741

電子情報通信学会技術研究報告

巻: DC2016-76 ページ: 11-16

Proceedings of IEEE Latin American Test Symposium

巻: なし

電子情報通信学会技術報告(DC2014-85)

巻: 114 ページ: 43-48

電子情報通信学会技術報告

巻: Vol.115, No.339 ページ: 213-218

Proceedings of IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2015

巻: なし ページ: 243-248

10.1109/ddecs.2015.55

電子情報通信学会技術報告

巻: Vol.115, No.339 ページ: 219-224

Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing 2015

巻: なし ページ: 273-278

10.1109/prdc.2015.47

Fifth International Workshop on Virtual Environment and Network-Oriented Applications

巻: なし

Proceedings of 2013 Seventh International Conference on Complex, Intelligent, an d Software Intensive Systems

巻: なし ページ: 755-759

10.1109/cisis.2013.136

Proceedings of IEEE European Test Symposium

ページ: 203-203

10.1109/ets.2011.61

Proceedings of IEEE Asian Test Symposium

ページ: 206-211

10.1109/ats.2010.44

IEICE Trans. on Inf. and Syst. Vol.E94-D, No.1

ページ: 104-113

10027989592

IPSJ Transactions on System LSI Design Methodology

巻: 4 ページ: 117-130

10.2197/ipsjtsldm.4.117

110009598052

Proceedings of IEEE International Symposium on Communications and Information Technologies (ISCIT'10), IEEE Xplore

ページ: 717-722

10.1109/iscit.2010.5665081

Proceedings of IEEE International Test Conference

Proceedings of IEEE Asian Test Symposium

ページ: 206-211

Proceedings of IEEE International Symposium on Communications and Information Technologies

Proceedings of IEEE International Test Conference

巻: Paper 21.1 ページ: 1-10

10.1109/test.2010.5699265

IEICE Trans. on Information and Systems Vol.E93-D, No.7

ページ: 1857-1865

10027363954

Digest of papers of 16th IEEE International Test Synthesis Workshop (CD-ROM)

IEICE Trans. on Information and Systems Vol.E91-D, No.3

ページ: 763-770

10026802191

8th IEEE Workshop on RTL and High Level Testing

ページ: 9-15

IEEE/ACM International Conference on Computer -Aided Design

ページ: 418-423

IEEE 16th Asian Test Symposium

ページ: 65-68

Trans. of IEICE Vol. 89-D, No. 8

ページ: 1643-1653

110007380504

IPSJ Journal Vol. 47, No. 6

ページ: 1619-1628

130000022321

IPSJ (Information Processing Society of Japan) Journal (Special Issue on Design Methodology of System LSIs) Vol.47, No.6

ページ: 1619-1628

130000022321

Trans. of IEICE (DI) Vol.J89-D, No.8

ページ: 1643-1653

15th IEEE Asian Test Symposium

ページ: 375-380

110004748904

The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI

ページ: 274-279

IFIP International Conference on Very Large Scale Integration

ページ: 308-313

11th IEEE European Test Symposium

ページ: 146-151

IEEE the 14th Asian Test Symposium

ページ: 306-311

IEEE the 14th Asian Test Symposium

ページ: 254-259

Trans. of IEICE (DI) (in Japanese) Vol.J88-D-I, No.6

ページ: 1057-1064

110003203379

Journal of Electronic Testing : Theory and Applications Vol.20, No.3

ページ: 315-323

IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences Vol.E87-A, No.12

ページ: 3200-3207

110003212858

IPSJ (Information Processing Society of Japan) Journal. Vol.44, No.5

ページ: 1266-1275

IEICE Trans. on Information and Systems Vol.E86-D, No.6

ページ: 1042-1049

110004024945

Trans, of IEICE (DI) (in Japanese) Vol.J86-D-I, No.12

ページ: 872-883

Information Processing Society of Japan Journal 44, 5

ページ: 1266-1275

Trans. of IEICE (DI) (in Japanese) Vol.186-D-I, No.11

ページ: 809-820

110003171214