KATODA Takashi 河東田隆

… Alternative Names

加東田隆カトウダタカシ

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Researcher Number	90013739
External Links
Affiliation (based on the past Project Information) *help	1998 – 1999: 高知工科大学, 工学部, 教授 1995: The University of Tokyo, The Division of Engineering, The Graduate School, Associate Profesor., 大学院・工学系研究科, 助教授 1994 – 1995: 東京大学, 工学部, 助教授 1990 – 1992: University of Tokyo, Asso. Prof., 工学部, 助教授 1988 – 1990: 東京大学, 先端科学技術研究センター, 助教授 … More 1987: 東京大学, 工学部・境界領域研究施設・助教授教 1986 – 1987: 東京大学, 工学部, 助教授 1985: 東京大学, 工, 助教授 Less
Review Section/Research Field	Principal Investigator 表面界面物性 / Applied materials science/Crystal engineering Except Principal Investigator 電子機器工学
Keywords	Principal Investigator レ-ザラマン分光 / レーザラマン分光 / 結晶成長 / その場観察 / 評価 / 電極 / 半導体 / Micro-defects / Hetero-interface / FT-IR … More / FT-Raman / 微小欠陥 / 半導体ヘテロ界面 / フーリエ変換赤外分光 / フーリエ変換ラマン分光 / 微視的評価 / 格子欠陥 / II-VI族半導体 / 応力 / 表面再結合速度 / クラスタ / 原子間結合 / 混晶半導体 / 多結晶シリコン … More Except Principal Investigator 格子欠陥 / 原子間結合 / 原子配列 / 欠陥準位 / クラスタ / 転位 / AgGaS_2 / electrode / silicon substrate / nanocrystal seeding / bias enhanced nucleation / electron emitter device / semiconductor material / heteroepitaxial growth / diamond thin film / 電極形成 / シリコン基板 / 超微粒子種付け / バイアス核発生 / 電子放出素子 / 半導体材料 / ヘテロエピタキシャル成長 / ダイヤモンド薄膜 / Quantum Interference Effect / Quantum Wire / Field-Effect Transistor / Superlattice / Focused Ion Beam / 局在効果 / 電子波 / リソグラフィ- / 高圧効果 / 量子干渉効果 / 量子細線 / 電界効果トランジスタ / 超格子 / 集束イオンビ-ム / ドナー・アクセプター対発光 / 励起子 / フォトルミネッセンス / ヘテロ接合 / MOCVD法 / II-VI族化合物半導体 / 雰囲気処理 / 局在モ-ド / レ-ザラマン分光 / 界面歪 / ヘテロ界面 / ZnS / MOCVD Less

Research Projects
(16 results)
Co-Researchers
(19 People)

レーザラマン分光法による多結晶シリコン形成機構の解明と粒径制御Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1998 – 1999
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Kochi University of Technology
Heteroepitaxial Nucleation and Growth of Diamond
- Principal Investigator
  
  HIRAKI Akio
- Project Period (FY)
  1995
- Research Category
  
  Grant-in-Aid for International Scientific Research.
- Research Institution
  Osaka University
Characterization of micro-defects at semiconductor hetero-interfaces with FT-Raman and infrared monochrometers.Principal Investigator
- Principal Investigator
  
  KATODA Takashi
- Project Period (FY)
  1994 – 1995
- Research Category
  
  Grant-in-Aid for General Scientific Research (B)
- Research Field
  
  表面界面物性
- Research Institution
  The University of Tokyo
レーザラマン分光によりその場観察を用いた結晶成長の原子レベル制御Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1992
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
レ-ザラマン分光によるその場観察を用いた結晶成長の原子レベル制御Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1991
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
レ-ザラマン分光法による金属ー半導体界面の評価Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1991
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
レ-ザラマン分光によるその場観察を用いた結晶成長の原子レベル制御Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1990
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
レ-ザラマン分光法による金属ー半導体界面の評価Principal Investigator
- Principal Investigator
  
  加東田隆
- Project Period (FY)
  1990
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
レ-ザラマン分光法による金属-半導体界面の評価Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1989
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
Fabrication of Vertical Field-Effect Transistor with a Superlattice Source by Using Focused Ion Beam
- Principal Investigator
  
  IKOMA Toshiaki
- Project Period (FY)
  1989 – 1990
- Research Category
  
  Grant-in-Aid for Developmental Scientific Research (B).
- Research Field
  
  電子機器工学
- Research Institution
  Institute of Industrial Science, University of Tokyo.
化合物半導体の格子欠陥の評価と制御
- Principal Investigator
  
  増本剛
- Project Period (FY)
  1987 – 1989
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Research Institute for Electric and Magnetic Materials
混晶の評価法と欠陥構造に関する研究
- Principal Investigator
  
  柊元宏
- Project Period (FY)
  1987
- Research Category
  
  Grant-in-Aid for Special Project Research
- Research Institution
  Tokyo Institute of Technology
レーザラマン分光法によるII-VI族半導体中の格子欠陥の微視的評価Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1987
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  The University of Tokyo
化合物半導体における格子欠陥の評価と制御
- Principal Investigator
  
  増本剛
- Project Period (FY)
  1987 – 1989
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Research Institution
  Research Institute for Electric and Magnetic Materials
混晶の評価法と欠陥構造に関する研究
- Principal Investigator
  
  柊元宏
- Project Period (FY)
  1986
- Research Category
  
  Grant-in-Aid for Special Project Research
- Research Institution
  Tokyo Institute of Technology
レーザラマン分光法による混晶半導体中の原子間結合の評価Principal Investigator
- Principal Investigator
  
  河東田隆
- Project Period (FY)
  1985
- Research Category
  
  Grant-in-Aid for Special Project Research
- Research Institution
  The University of Tokyo

1. KISHI Masato (00150285)

# of Collaborated Projects: 8 results

# of Collaborated Products: 0 results
2. 西野種夫 (60029452)

# of Collaborated Projects: 4 results

# of Collaborated Products: 0 results
3. 増本剛 (00181660)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
4. 田口常正 (90101279)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
5. 柊元宏 (50013488)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
6. 橋爪弘雄 (10011123)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
7. 神谷武志 (70010791)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
8. 角野浩二 (50005849)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
9. IKOMA Toshiaki (80013118)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
10. HIRAKAWA Kazuhiko (10183097)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. HIRAKI Akio (50029013)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. MORI Yusuke (90252618)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. HATTA Akimitsu (50243184)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. ITO Toshimichi (00183004)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. SASAKI Takatomo (50029237)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. 西田謙 (40299384)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. 成沢忠 (30299383)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. 西永頌 (10023128)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. LEE Chongmu

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results

KATODA Takashi 河東田 隆

加東田 隆 カトウダ タカシ

Research Projects

Co-Researchers

レーザラマン分光法による多結晶シリコン形成機構の解明と粒径制御Principal Investigator

Principal Investigator

Project Period (FY)

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Research Institution

Heteroepitaxial Nucleation and Growth of Diamond

Principal Investigator

Project Period (FY)

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Characterization of micro-defects at semiconductor hetero-interfaces with FT-Raman and infrared monochrometers.Principal Investigator

Principal Investigator

Project Period (FY)

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Research Field

Research Institution

レーザラマン分光によりその場観察を用いた結晶成長の原子レベル制御Principal Investigator

Principal Investigator

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レ-ザラマン分光によるその場観察を用いた結晶成長の原子レベル制御Principal Investigator

Principal Investigator

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レ-ザラマン分光法による金属ー半導体界面の評価Principal Investigator

Principal Investigator

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レ-ザラマン分光によるその場観察を用いた結晶成長の原子レベル制御Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Institution

レ-ザラマン分光法による金属ー半導体界面の評価Principal Investigator

Principal Investigator

Project Period (FY)

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Research Institution

レ-ザラマン分光法による金属-半導体界面の評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Institution

Fabrication of Vertical Field-Effect Transistor with a Superlattice Source by Using Focused Ion Beam

Principal Investigator

Project Period (FY)

Research Category

Research Field

Research Institution

化合物半導体の格子欠陥の評価と制御

Principal Investigator

Project Period (FY)

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Research Institution

混晶の評価法と欠陥構造に関する研究

Principal Investigator

Project Period (FY)

Research Category

Research Institution

レーザラマン分光法によるII-VI族半導体中の格子欠陥の微視的評価Principal Investigator

Principal Investigator

Project Period (FY)

Research Category

Research Institution

化合物半導体における格子欠陥の評価と制御

Principal Investigator

Project Period (FY)

Research Category

Research Institution

混晶の評価法と欠陥構造に関する研究

Principal Investigator

Project Period (FY)

KATODA Takashi 河東田隆

加東田隆カトウダタカシ