Ohshima Takeshi 大島武

… Alternative Names

Researcher Number	50354949
Other IDs
Affiliation (Current)	2019: 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所先端機能材料研究部, 上席研究員(定常)
Affiliation (based on the past Project Information) *help	2016 – 2019: 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所先端機能材料研究部, 上席研究員(定常) 2016: 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所先端機能材料研究部, 上席研究員 2016: 国立研究開発法人量子科学技術研究開発機構, 高崎量子応用研究所・先端機能材料研究部, プロジェクトリーダー 2015: 国立研究開発法人日本原子力研究開発機構, 原子力科学研究部門量子ビーム応用研究センター, 研究主幹 2015: 独立行政法人日本原子力研究開発機構, 量子ビーム応用研究部門, 研究主幹 … More
Review Section/Research Field	Principal Investigator Nuclear engineering / Crystal engineering / Applied materials science/Crystal engineering Except Principal Investigator Nuclear engineering / Applied materials science/Crystal engineering / Medium-sized Section 21:Electrical and electronic engineering and related fields / Science and Engineering / Electron device/Electronic equipment / Energy engineering / Particle/Nuclear/Cosmic ray/Astro physics / Nanostructural science
Keywords	Principal Investigator 格子欠陥 / 炭化ケイ素(SiC) / 結晶工学 / 半導体物性 / 放射線 / 光物性 / ゲート酸化膜リーク電流 / 放射線工学 / スピン / イオンビーム誘起過渡電流 … More Except Principal Investigator ダイヤモンド / スピン緩和 / 水素吸蔵合金 / 低雑音集積回路 / 界面 / characterization / 表面改質 / 実験 / ダイヤモンド薄膜 / 電子デバイス / 極限環境 / 量子コンピューティング / NVセンター / ワイドギャップ半導体 / solar cell / ダイヤモンド検出器 / 位置敏感型検出器 / 高エネルギーイオン / 格子欠陥 / 電子スピン共鳴 / MOSFET / 超高エネルギー / 欠陥 / 低質量ダークマター / 軽い暗黒物質 / 結晶評価 / マイクロビーム / 廃炉技術 / 半導体検出器 / スピントロニクス / 炭化ケイ素 / 量子コンピュータ / パルス電子スピン共鳴 / ダークマター / 電子デバイス・集積回路 / 同位体制御 / SiC / luminescence / 耐放射線 / CMOS集積回路 / 耐高温動作 / 放射線劣化 / 燐ドナー / 挙動 / レミネッセンス / 半導体物性 / 量子情報 / 粒子 / ルミネッセンス / 照射効果 / 大気取出し窓兼イオン位置検出器 / 暗黒物質 / 位置敏感型 / シリコン / IBIC / 水素吸蔵初期反応速度 / シリコンカーバイド / 太陽電池 / ワイドバンドギャップ / radiation effect / 単一光子光源 / 電子デバイス・電子機器 / 電子スピン / 欠陥デザイン / 極限環境エレクトロニクス / 量子ビーム Less

Multi-scale calculations for complex correlation appearing in SiC oxidation and its impact on electronic propertiesOngoing
- Principal Investigator
  
  松下雄一郎
- Project Period (FY)
  2018 – 2020
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Review Section
  
  Medium-sized Section 21:Electrical and electronic engineering and related fields
- Research Institution
  Tokyo Institute of Technology
Quantum state measurements of single photon sources in silicon carbide devicesPrincipal InvestigatorOngoing
- Principal Investigator
  
  大島武
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Crystal engineering
- Research Institution
  National Institutes for Quantum and Radiological Science and Technology
Research on Silicon Carbide Harsh Environment ElectronicsOngoing
- Principal Investigator
  
  黒木伸一郎
- Project Period (FY)
  2017 – 2019
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Electron device/Electronic equipment
- Research Institution
  Hiroshima University
Control of Photons and Spins of High-Brightness Single Photon Center in Silicon CarbidePrincipal Investigator
- Principal Investigator
  
  OHSHIMA Takeshi
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Crystal engineering
- Research Institution
  National Institutes for Quantum and Radiological Science and Technology
  Japan Atomic Energy Agency
Study of diamond thin film as a beam exit window to the atmosphere for high energy ions and a position-sensitivity detector
- Principal Investigator
  
  Kamiya Tomihiro
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Nuclear engineering
- Research Institution
  Gunma University
  Japan Atomic Energy Agency
The hydrogen occlusion materials high function in the defect design by the quantum beam irradiation
- Principal Investigator
  
  ABE Hiroshi
- Project Period (FY)
  2014 – 2016
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Energy engineering
- Research Institution
  National Institutes for Quantum and Radiological Science and Technology
  Japan Atomic Energy Agency
Development of wide gap semiconductor pixel detector for light dark matter search
- Principal Investigator
  
  Tanaka Manobu
- Project Period (FY)
  2013 – 2015
- Research Category
  
  Grant-in-Aid for Scientific Research (C)
- Research Field
  
  Particle/Nuclear/Cosmic ray/Astro physics
- Research Institution
  High Energy Accelerator Research Organization
Controlling of Single Photon Source in Silicon CarbidePrincipal Investigator
- Principal Investigator
  
  OHSHIMA Takeshi
- Project Period (FY)
  2012 – 2013
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Japan Atomic Energy Agency
Mechanism of the Destruction of Oxide on Silicon Carbide due to ChargeInduced by Ion BeamsPrincipal Investigator
- Principal Investigator
  
  OHSHIMA Takeshi
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nuclear engineering
- Research Institution
  Japan Atomic Energy Agency
Experimental study on behavior and radiation effect of very high-energy particles in matters
- Principal Investigator
  
  NAKASHIMA Hiroshi
- Project Period (FY)
  2009 – 2011
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nuclear engineering
- Research Institution
  Japan Atomic Energy Agency
2キュービットゲートを用いた鎖状スケーラブル量子コンピュータの開発
- Principal Investigator
  
  磯谷順一
- Project Period (FY)
  2009
- Research Category
  
  Grant-in-Aid for Challenging Exploratory Research
- Research Field
  
  Nanostructural science
- Research Institution
  University of Tsukuba
Induced Charge Evaluation for the Development of Particle Detectors Fabricated on Silicon CarbidePrincipal Investigator
- Principal Investigator
  
  OHSHIMA Takeshi
- Project Period (FY)
  2006 – 2008
- Research Category
  
  Grant-in-Aid for Scientific Research (B)
- Research Field
  
  Nuclear engineering
- Research Institution
  Japan Atomic Energy Agency
半導体電子スピン系量子コンピュータの要素技術の開発
- Principal Investigator
  
  磯谷順一
- Project Period (FY)
  2004 – 2005
- Research Category
  
  Grant-in-Aid for Scientific Research on Priority Areas
- Review Section
  
  Science and Engineering
- Research Institution
  University of Tsukuba
Development of Luminescence Technique for Accurate Diagnostic Characterization of Semiconductor Materials for Solar Cells
- Principal Investigator
  
  TAJIMA Michio
- Project Period (FY)
  2004 – 2006
- Research Category
  
  Grant-in-Aid for Scientific Research (A)
- Research Field
  
  Applied materials science/Crystal engineering
- Research Institution
  Japan Aerospace Exploration Agency

All 2018 2017 2016 2015 2014 2012 2011 2010 2009 2008 2007 2006 Other

All Journal Article Presentation

[Journal Article] Quantum Properties of Dichroic Silicon Vacancies in Silicon Carbide2018
- Author(s)
  R. Nagy, M. Widmann, M. Niethammer, D. B.R. Dasari, I. Gerhardt, O. O. Soykal, M. Radulaski, T. Ohshima, J. Vuckovic, N. T. Son, I. G. Ivanov, S. E. Economou, C. Bonato, S.-Y. Lee, J. Wrachtrup
- Journal Title
  
  Phys. Rev. Applied
  
  Volume: 9
- DOI
  10.1103/physrevapplied.9.034022
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H01056
[Journal Article] Single photon sources in 4H-SiC metal-oxide-semiconductor field-effect transistors2018
- Author(s)
  Y. Abe, T. Umeda, M. Okamoto, R. Kosugi, S. Harada, M. Haruyama, W. Kada, O. Hanaizumi, S. Onoda, T. Ohshima
- Journal Title
  
  Applied Physics Letters
  
  Volume: 112
- DOI
  10.1063/1.4994241
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H01056, KAKENHI-PROJECT-17H02781
[Journal Article] Identification of Si-vacancy related room-temperature qubits in 4H silicon carbide2017
- Author(s)
  V. Ivady, J. Davidsson, N. T. Son, T. Ohshima, I. A. Abrikosov, A. Gali
- Journal Title
  
  Phys. Rev. B
  
  Volume: 96
- DOI
  10.1103/physrevb.96.161114
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H01056
[Journal Article] Scalable Quantum Photonics with Single Color Centers in Silicon Carbide2017
- Author(s)
  M. Radulaski, M. Widmann, M. Niethammer, J. L. Zhang, S.-Y. Lee, T. Rendler, K. G. Lagoudakis, N. T. Son, E. Janzeen, T. Ohshima, J. Wrachtrup, J. Vuckovic
- Journal Title
  
  Nano Letters
  
  Volume: 17 Pages: 1782-1786
- DOI
  10.1021/acs.nanolett.6b05102
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] Three-Dimensional Proton Beam Writing of Optically Active Coherent Vacancy Spins in Silicon Carbide2017
- Author(s)
  H. Kraus, D. Simin, C. Kasper, Y. Suda, S. Kawabata, W. Kada, T. Honda, Y. Hijikata, T. Ohshima, V. Dyakonov, G. V. Astakhov
- Journal Title
  
  Nano Letters
  
  Volume: - Pages: 2865-2870
- DOI
  10.1021/acs.nanolett.6b05395
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047, KAKENHI-PROJECT-16K13721, KAKENHI-PROJECT-15H03967
[Journal Article] Locking of Electron Spin Coherence above 20 ms in Natural Silicon Carbide2017
- Author(s)
  D. Simin, H. Kraus, A. Sperlich, T. Ohshima, G. V. Astakhov, V. Dyakonov
- Journal Title
  
  Phys. Rev. B
  
  Volume: 95
- DOI
  10.1103/physrevb.95.161201
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] 4H-SiC Pseudo-CMOS Logic Inverters for Harsh Environment Electronics2017
- Author(s)
  S-I. Kuroki, T. Kurose, H. Nagatsuma, S. Ishikawa, T. Maeda, H. Sezaki, T. Kikkawa, T. Makino, T. Ohshima, M. Ostling, and C.-M. Zetterling
- Journal Title
  
  Mat. Sci. Forum
  
  Volume: 897 Pages: 669-672
- Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H03253
[Journal Article] Creation and Functionalization of Defects in SiC by Proton Beam Writing2017
- Author(s)
  T. Ohshima, T. Honda, S. Onoda, T. Makino, M. Haruyama, T. Kamiya, T. Satoh, Y. Hijikata, W. Kada, O. Hanaizumi, A. Lohrmann, J. R. Klein, B. C. Johnson, J. C. McCallum, S. Castelletto, B. C. Gibson, H. Kraus, V. Dyakonov, G. V. Astakhov
- Journal Title
  
  Materials Science Forum
  
  Volume: 897 Pages: 233-237
- DOI
  10.4028/www.scientific.net/msf.897.233
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047, KAKENHI-PROJECT-15H03967
[Journal Article] Transient current induced in thin film diamonds by swift heavy ions2017
- Author(s)
  S.Sato, T.Makino, T.Ohshima, T.Kamiya, W.Kada, O.Hanaizumi, V.Grilj, N.Skukan, M.Pomorski, G.Vizkelethy
- Journal Title
  
  Diamond & Related Materials
  
  Volume: 75 Pages: 161-168
- DOI
  10.1016/j.diamond.2017.04.005
- Open Access / Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] Stark tuning and electrical charge state control of single divacancies in silicon carbide2017
- Author(s)
  C. F. de las Casas, D. J. Christle, J. Ul Hassan, T. Ohshima, N. T. Son, D. D. Awschalom
- Journal Title
  
  Appl. Phys. Lett.
  
  Volume: 111
- DOI
  10.1063/1.5004174
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-17H01056
[Journal Article] Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy,2016
- Author(s)
  45.W. Kada, Y. Kambayashi, Y. Ando, S. Onoda, H. Umezawa, Y. Mokuno, S. Shikata, T. Makino, M. Koka, O. Hanaizumi, T. Kamiya, T. Ohshima
- Journal Title
  
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  
  Volume: 372 Pages: 151-155
- DOI
  10.1016/j.nimb.2015.12.044
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] The evaluation of radiation damage parameter for CVD diamond2016
- Author(s)
  44.V. Grilj, N. Skukan, M. Jaksic;, M. Pomorski, W. Kada, T. Kamiya, and T. Ohshima
- Journal Title
  
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  
  Volume: 372 Pages: 161-164
- DOI
  10.1016/j.nimb.2015.12.046
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] Activation and Control of Visible Single Defects in 4H-, 6H-, and 3C-SiC by Oxidation2016
- Author(s)
  A. Lohrmann, S. Castelletto, J. R. Klein, T. Ohshima, M. Bosi, M. Negri, D. W. M. Lau, B. C. Gibson, S. Prawer, J. C. McCallum and B. C. Johnson
- Journal Title
  
  Applied Physics Letter
  
  Volume: 108
- DOI
  10.1063/1.4939906
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] Charge multiplication effect in thin diamond films2016
- Author(s)
  50.N. Skukan, V. Grilj, I. Sudic;, M. Pomorski, W. Kada, T. Makino, Y. Kambayashi, Y. Andoh, S. Onoda, S. Sato, T. Ohshima, T. Kamiya and M. Jaksic;,
- Journal Title
  
  Applied Physics Letters
  
  Volume: 109 Pages: 043502-043502
- DOI
  10.1063/1.4959863
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] Vector Magnetometry Using Silicon Vacancies in 4H-SiC Under Ambient Conditions2016
- Author(s)
  M. Niethammer, M. Widmann, S.-Y. Lee, P. Stenberg, O. Kordina, T. Ohshima, N. T. Son, E. Janzen, J. Wrachtrup
- Journal Title
  
  Phys. Rev. Appl.
  
  Volume: 6 Pages: 034001-034001
- DOI
  10.1103/physrevapplied.6.034001
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] X-Ray Characterization of Short Pulse Laser Illuminated Hydrogen Storae Alloys Having Very High Performance2015
- Author(s)
  Hiroyuki Daido, Hiroshi ABE, Takashi Shobu, Takuya Shimomura, Shinnosuke Tokuhira, Yusuke Takeyama, Takehiro Furuyama, Akihiko Nishimura Hirohisa Uchida and Takeshi Ohshima
- Journal Title
  
  Proceedings of SPIE 9589, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI
  
  Volume: 9589
- DOI
  10.1117/12.2186898
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420891
[Journal Article] Isolated Electron Spins in Silicon Carbide with Millisecond Coherence Times2015
- Author(s)
  David J. Christle, Abram L. Falk, Paolo Andrich, Paul V. Klimov, Jawad Ul Hassan, Nguyen T. Son, Erik Janzen, Takeshi Ohshima and David D. Awschalom
- Journal Title
  
  Nature Materials
  
  Volume: 14 Pages: 160-163
- DOI
  10.1038/nmat4144
- Open Access / Acknowledgement Compliant / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] Coherent Control of Single Spins in Silicon Carbide at Room Temperature2015
- Author(s)
  MatthiasWidmann, Sang-Yun Lee, Torsten Rendler, Nguyen Tien Son, Helmut Fedder, Seoyoung Paik, Li-Ping Yang, Nan Zhao, Sen Yang, Ian Booker, Andrej Denisenko, Mohammad Jamali, S. Ali Momenzadeh, Ilja Gerhardt, Takeshi Ohshima, Adam Gali, Erik Janzen and Jorg Wrachtrup
- Journal Title
  
  Nature Materials
  
  Volume: 14 Pages: 165-168
- DOI
  10.1038/nmat4145
- Open Access / Acknowledgement Compliant / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] Development of diagnostic method for deep levels in semiconductors using charge induced by heavy ion microbeams2015
- Author(s)
  41.W. Kada, Y. Kambayashi, N. Iwamoto, S. Onoda, T. Makino, M. Koka, T. Kamiya, N.Hoshino, H. Tsuchida, K. Kojima, O. Hanaizumi, and T. Ohshima
- Journal Title
  
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  
  Volume: 348 Pages: 240-245
- DOI
  10.1016/j.nimb.2014.12.054
- Acknowledgement Compliant / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] Surface Modification of Hydrogen Storage Alloy by Heavy Ion Beams with keV to MeV Irradiation Energies2015
- Author(s)
  Hiroshi ABE, Shinnosuke Tokuhira, Hirohisa Uchida and Takeshi Ohshima
- Journal Title
  
  Nuclear Instruments and Methods in Physics Research Section B365 (2015) 214-217
  
  Volume: 365 Pages: 214-217
- Acknowledgement Compliant / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26420891
[Journal Article] Single-Photon Emitting Diode in Silicon Carbide2015
- Author(s)
  A. Lohrmann, N. Iwamoto, Z. Bodrog, S. Castelletto, T. Ohshima, T. J. Karle, A. Gali, S. Prawer, J. C. McCallum and B. C. Johnson
- Journal Title
  
  Nature Communications
  
  Volume: 6
- DOI
  10.1038/ncomms8783
- Acknowledgement Compliant / Int'l Joint Research / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26286047
[Journal Article] Charge Collection Characteristics of A Super-Thin Diamond Membrane Detector Measured With High-Energy Heavy Ions2014
- Author(s)
  N.Iwamoto, T.Makino, W.Kada, N.Skukan, M.Pomorski, V.Grilj, M.Jaksic, S.Onoda, T.Ohshima, T.Kamiya
- Journal Title
  
  IEEE TRANSACTIONS ON NUCLEAR SCIENCE
  
  Volume: 61 Pages: 3732-3738
- DOI
  10.1109/tns.2014.2360937
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] A Silicon Carbide Room-Temperature Single-Photon Source2014
- Author(s)
  S. Castellettol, B. C. Johnson, V. Ivady, N. Stavrias, T. Umeda, A. Gali and T. Ohshima
- Journal Title
  
  Nature Materials
  
  Volume: 13 Pages: 151-156
- DOI
  10.1038/nmat3806
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-24656025
[Journal Article] Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement2014
- Author(s)
  W.Kada, N,Iwamoto, T.Satoh, S.Onoda, V.Grilj, N.Skukan, M. Koka, T.Ohshima, M.Jaksic, T.Kamiya,
- Journal Title
  
  NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
  
  Volume: 331 Pages: 113-116
- DOI
  10.1016/j.nimb.2013.11.040
- Open Access / Peer Reviewed
- Data Source
  KAKENHI-PROJECT-26249149
[Journal Article] Peak Degradation of Heavy-Ion Induced Transient Currents in 6H-SiC, MOS Capacitors2012
- Author(s)
  T. Makino, N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima, S. Nozaki
- Journal Title
  
  Materials Science Forum
  
  Volume: 717-720 Pages: 469-472
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency2012
- Author(s)
  N. Iwamoto, A. Koizumi, S. Onoda, T. Makino, T. Ohshima, K. Kojima, S. Koike, K. Uchida, S. Nozaki
- Journal Title
  
  Materials Science Forum
  
  Volume: 717-720 Pages: 267-270
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Fabrication of Single Photon Centres in Silicon Carbide2012
- Author(s)
  B. C. Johnson, S. Castelletto, T. Ohshima. T. Umeda
- Journal Title
  
  IEEE Conf. publication, Proceedings of 2012 Conference on Optoelectronic and Microelectronic Materials and Devices ,(COMMAD 2012)
  
  Volume: 1 Pages: 217-218
- DOI
  10.1109/commad.2012.6472328
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-10F00802, KAKENHI-PROJECT-24656025
[Journal Article] Oxygen Ion Induced Charge in SiC MOS Capacitors Irradiated with Gamma-rays2011
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, S. Nozaki, K. Kojima
- Journal Title
  
  Materials Science Forum
  
  Volume: 679-680 Pages: 370-373
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Refreshable Decrease In Peak Height Of Ion Beam Induced Transient Current From Silicon Carbide Metal-Oxide-Semiconductor Capacitors2011
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, M. Deki, S. Nozaki
- Journal Title
  
  AIP conference proceedings 1336 Application of Accelerators in Research and Industry
  
  Pages: 660-664
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] ingle-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC p^+n Diode Irradiated With High-Energy Electrons2011
- Author(s)
  N. Iwamoto, A. Koizumi, S. Onoda, T. Makino, T. Ohshima, K. Kojima, S. Koike, K. Uchida, and S. Nozaki
- Journal Title
  
  IEEE Transaction on Nuclear Science
  
  Volume: 58 Pages: 3328-3332
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Single-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC p^+n Diode Irradiated With High-Energy Electrons2011
- Author(s)
  N.Iwamoto, A.Koizumi, S.Onoda, T.Makino, T.Ohshima, K.Kojima, S.Koike, K.Uchida, S.Nozaki
- Journal Title
  
  IEEE Transaction on Nuclear Science
  
  Volume: 58 Pages: 3328-3332
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Charge Collection Efficiency of 6H-SiC P+N Diodes Degraded by Low-Energy Electron Irradiation2010
- Author(s)
  N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima, A. Koizumi, K. Uchida, S. Nozaki
- Journal Title
  
  Materials Science Forum
  
  Volume: 645-648 Pages: 921-924
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Change in Current Induced from Silicon Carbide Metal. Oxide-Semiconductor Capacitors by Oxygen Ions2010
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, M. Deki, S. Nozaki
- Journal Title
  
  Proc. of 9th Internat. Workshop on Radiation Effects on Semiconductor Devices for Space Applications
  
  Pages: 85-91
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Enhanced Charge Collection in Drain Contact of 6H-SiC MOSFETs Induced by Heavy Ion Microbeam2010
- Author(s)
  S.Onoda, G.Vizkelethy, T.Makino, N.Iwamoto, K.Kojima, S.Nozaki, T.Ohshima
- Journal Title
  
  Proc.of 9th Internat.Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA)
  
  Pages: 230-233
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Enhanced Charge Collection in Drain Contact of 6H-SiC MOSFETs Induced by Heavy Ion Microbeam2010
- Author(s)
  S. Onoda, G. Vizkelethy, T. Makino, N. Iwamoto, K. Kojima, S. Nozaki, T. Ohshima
- Journal Title
  
  Proc. of 9th Internat. Workshop on Radiation Effects on Semiconductor Devices for Space Applications
  
  Pages: 230-233
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Charge Enhancement Effects in 6H-SiC MOSFETs Induced by Heavy Ion Strike2010
- Author(s)
  S. Onoda, T. Makino, N. Iwamoto, G. Vizkelethy, K. Kojima, S. Nozaki, T. Ohshima
- Journal Title
  
  IEEE Transactions on Nuclear Science
  
  Volume: 57 Pages: 3373-3379
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation2010
- Author(s)
  N.Iwamoto, S.Onoda, T.Ohshima, K.Kojima, A.Koizumi, K.Uchida, S.Nozaki
- Journal Title
  
  Materials Science Forum 645-648
  
  Pages: 921-924
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Change in Current Induced from Silicon Carbide Metal-Oxide-Semiconductor Capacitors by Oxygen Ions2010
- Author(s)
  T.Ohshima, N.Iwamoto, S.Onoda, T.Makino, M.Deki, S.Nozaki
- Journal Title
  
  Proc.of 9th Internat.Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA)
  
  Pages: 85-91
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Transient Response to High Energy Heavy Ions in 6H-SiC n+p Diodes2009
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, N. Iwamoto, K. Kojima, K. Kawano
- Journal Title
  
  Materials Science Forum 600-603
  
  Pages: 1039-1042
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Charge Collection Properties of 6H-SiC Diodes by Wide Variety of Charged Particles up to Several Hundreds MeV2009
- Author(s)
  S. Onoda, N. Iwamoto, M. Murakami, T. Ohshima, T. Hirao, K. Kojima, K. Kawano, I. Nakano
- Journal Title
  
  Materials Science Forum 615-617
  
  Pages: 861-864
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation2009
- Author(s)
  N. Iwamoto, S. Onoda, S. Hishiki, T. Ohshima, M. Murakami, I. Nakano, K. Kawano
- Journal Title
  
  Materials Science Forum 600-603
  
  Pages: 1043-1046
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Reduction of Effective Carrier Density and Charge Collection Efficiency in SiC Devices due to Radiations2009
- Author(s)
  S. Onoda, N. Iwamoto, T. Hirao, K. Kawano, K. Kojima, T. Ohshima
- Journal Title
  
  American Institute of Physics Conference Proceedings 1099
  
  Pages: 1010-1013
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Transient Response to High Energy Heavy Ions in 6H-SiC n^+p Diodes2009
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, N. Iwamoto, K. Kojima, K. Kawano
- Journal Title
  
  Materials Science Forum 600-603
  
  Pages: 1039-1042
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] NIEL Analysis of Charge Collection Efficiency in Silicon Carbide Diodes Damaged by Gamma-Rays, Electrons and Protons2008
- Author(s)
  T. Ohshima, S. Onoda, N. Iwamoto, K. Kojima, K. Kawano
- Journal Title
  
  Proc. the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications
  
  Pages: 175-178
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions2007
- Author(s)
  T.Ohshima, T.Satoh, M.Oikawa, S.Onoda, S.Hishiki, T.Hirao, T.Kamiya, T.Yokoyama, A.Sakamoto, R.Tanaka, I Nakano, G.Wagner, H.Itoh
- Journal Title
  
  Materials Science Forum 556-557
  
  Pages: 913-916
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Charge Collection Efficiency of 6H-SiC Diodes Damaged by Electron Irradiation2007
- Author(s)
  N. Iwamoto, T. Ohshima, S. Onoda, S. Hishiki, M. Murakami, I. Nakano, K. Kawano
- Journal Title
  
  Proc. of the 26th Sympo. on Mater. Sci. and Engineer. Res. Center of Ion Beam Tech. Hosei Univ.
  
  Pages: 27-30
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Impact of Auger Recombination on Charge Collection of a 6H-SiC Diode by Heavy Ions2007
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, K. Mishima, S. Hishiki, N. Iwamoto, K. Kawano
- Journal Title
  
  IEEE Transactions on Nuclear Science 54
  
  Pages: 2706-2713
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Degradation of Charge Collection Efficiency Obtained for 6H-SiC n+p Diodes Irradiated with Gold Ions2007
- Author(s)
  T. Ohshima, T. Satoh, M. Oikawa, S. Onoda, S. Hishiki, T. Hirao, T. Kamiya, T. Yokoyama, A. Sakamoto, R. Tanaka, I Nakano, G. Wagner, H. Itoh
- Journal Title
  
  Materials Science Forum 556-557
  
  Pages: 913-916
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Decrease of Charge Collection due to Displacement Damage by Gamma Rays in a 6H-SiC Diode2007
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, K. Mishima, S. Hishiki, N. Iwamoto, K. Kojima, K. Kawano
- Journal Title
  
  IEEE Transactions on Nuclear Science 54
  
  Pages: 1953-1960
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Decrease in Ion Beam Induced Charge of 6H-SiC Diodes2007
- Author(s)
  S. Onoda, N. Iwamoto, T. Ohshima, T. Hirao, K. Kawano
- Journal Title
  
  Proc. of the 26th Sympo. on Mater. Sci. and Engineer. Res. Center of Ion Beam Tech. Hosei Univ.
  
  Pages: 35-40
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Structural Study on(Al) InGaP Single-Junction Solar Cell for Performance Improvement of Triple-Junction Solar Cells2007
- Author(s)
  C. Morioka, M. Imaizumi, H. Sugimoto, S. Sato, T. Ohshima and M. Tajima
- Journal Title
  
  Proc. 17th International Photovoltaic Science and Engineering Conference, Fukuoka, Japan
  
  Pages: 504-505
- Description
  「研究成果報告書概要(欧文)」より
- Data Source
  KAKENHI-PROJECT-16206002
[Journal Article] Observation of Charge Collection Efficiency of 6H-SiC n+p Diodes Irradiated with Au-Ions2006
- Author(s)
  N. Iwamoto, T. Ohshima, T. Satoh, M. Oikawa, S. Onoda, S. Hishiki, T. Hirao, T. Kamiya, T. Yokoyama, A. Sakamoto, R. Tanaka, I. Nakano, G. Wagner, H. Itoh, K. Kawano
- Journal Title
  
  Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
  
  Pages: 185-185
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Analysis of Transient Current in SiC Diodes Irradiated with MeV Ions2006
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, K. Mishima, N. Iwamoto, T. Kamiya, K. Kawano
- Journal Title
  
  Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
  
  Pages: 115-115
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency
- Author(s)
  N.Iwamoto, A.Koizumi, S.Onoda, T.Makino, T.Ohshima, K.Kojima, S.Koike, K.Uchida, S.Nozaki
- Journal Title
  
  Materials Science Forum
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Journal Article] Comparative Study of Transient Current Induced in SiC p+n and n+p Diodes by Heavy Ion Microbeams
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Kamiya, K. Kawano
- Journal Title
  
  Nucl. Inst. Meth. B (in press)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-18360458
[Journal Article] Peak Degradation of Heavy-Ion Induced Transient Currents in 6H-SiC MOS capacitors
- Author(s)
  T.Makino, N.Iwamoto, S.Onoda, T.Ohshima, K.Kojima, S.Nozaki
- Journal Title
  
  Materials Science Forum
  
  Volume: (印刷中)
- Peer Reviewed
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] プロトンビーム描画を用いたSiC pinダイオード中への発光中心の形成2018
- Author(s)
  千葉陽史, 常見大貴, 本多智也, 牧野高紘, 佐藤真一郎, 山田尚人, 佐藤隆博, 土方泰斗, 大島武
- Organizer
  第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 4H-SiCエピ層中の積層欠陥近傍における単一光子源の発光効率向上2018
- Author(s)
  赤堀周平、古川頼誉、松下雄一郎、大島武、土方泰斗
- Organizer
  第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 4H-SiC酸化によるアモルファス構造が表面単一光子光源に与える影響の理論的分析2018
- Author(s)
  古川頼誉, 土方泰斗, 大島武, 松下雄一郎
- Organizer
  第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Magnetic Field Sensing with Silicon Vacancy in 4H-SiC Under Ambient Conditions2018
- Author(s)
  Hoang Minh Tuan, Takeshi Ohshima, Yuta Masuyama, Takayuki Iwasaki, Digh Hisamoto, Mutsuko Hatano
- Organizer
  第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Low-parasitic-capacitance self-aligned 4H-SiC nMOSFETs for harsh environment electronics2017
- Author(s)
  T. Kurose, S.-I. Kuroki, S. Ishikawa, T. Maeda, H. Sezaki, T. Makino, T. Ohshima, M. Ostling, and C.-M. Zetterling
- Organizer
  The International Conference on Silicon Carbide and Related Materials 2017 (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] 4H-SiC pMOSFETsの高温特性及びガンマ線曝露効果2017
- Author(s)
  梶原純, 黒木伸一郎, 瀬崎洋, 石川誠治，前田知徳, 牧野高紘, 大島武, Mikael Ostling, and Carl-Mikael Zetterling
- Organizer
  応用物理学会先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] 4H-SiC pMOSFETs with Al-doped S/D and NbNi silicide ohmic contacts2017
- Author(s)
  J. Kajihara, S-I. Kuroki, S. Ishikawa, T. Maeda, H. Sezaki, T. Makino, T. Ohshima, M. Ostling, and C.-M. Zetterling
- Organizer
  The International Conference on Silicon Carbide and Related Materials 2017 (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] 高周波CMOSインバータに向けた4H-SiCトレンチpMOSFETsの研究2017
- Author(s)
  井上純、黒木伸一郎、石川誠治、前田知徳、瀬崎洋、牧野高紘、大島武、Mikael Ostling、Carl-Mikael Zetterling
- Organizer
  2018年第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] Research on 400°C Thermal Stability of Ni/Nb Ohmic Contacts on 4H-SiC For Harsh Environment Applications2017
- Author(s)
  Vuong Van Cuong, Milantha De Silva, Seiji Ishikawa, Hiroshi Sezaki, Tomonori Maeda, Takahiro Makino, Takeshi Ohshima, Yasunori Tanaka, and Shin-Ichiro Kuroki
- Organizer
  応用物理学会先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] 4H-SiC MOSFETチャネルの単一光子源の偏光角度依存性2017
- Author(s)
  阿部裕太、岡本光央、小野田忍、大島武、春山盛善、加田渉、花泉修、小杉亮治、原田信介、梅田享英
- Organizer
  2017年　第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川県横浜市
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Coherent defect engineering with varying irradiation methods2017
- Author(s)
  C. Kasper, D. Simin, H. Kraus, W. Kada, T. Ohshima, A. Sperlich, C. Salter, M. Trupke, V. Dyakonov, G. V. Astakhov
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Oxidation-process dependence of Single photon sources embedded in 4H-SiC MOSFETs2017
- Author(s)
  Y. Abe, M. Okamoto, S. Onoda, T. Ohshima, M. Haruyama, W. Kada, O. Hanaizumi, R. Kosugi, S. Harada, Y. Kagoyama, T. Umeda
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Enhanced single photon emission near stacking fault in 4H-SiC epilayer2017
- Author(s)
  Y. Hijikata, S. Akahori, T. Ohshima
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Functionalization of Silicon Carbide by Particle Irradiation toward Quantum Devices2017
- Author(s)
  T. Ohshima, T. Honda, H. Tsunemi, T. Makino, S. Sato, S. Onoda, Y. Hijikata
- Organizer
  2017 MRS Fall Meeting and Exhibit
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 4H-SiCエピ層における積層欠陥近傍の単一光子源の発光特性2017
- Author(s)
  赤堀周平、古川頼誉、松下雄一郎、大島武、土方泰斗
- Organizer
  2017年第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 4H-SiC 中の積層欠陥が単一光子光源の発光波長に及ぼす影響の理論的分析2017
- Author(s)
  古川頼誉，土方泰斗，大島武，松下雄一郎
- Organizer
  先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] ダイヤモンドの高速重イオン誘起過渡電流測定とポーラリゼーション効果2017
- Author(s)
  佐藤真一郎 , 牧野高紘 , 大島武 , Vizkelethy Gyorgy , 神谷富裕
- Organizer
  第６４回応用物理春季学術講演会
- Place of Presentation
  パシフィコ横浜
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Radiation Response of Silicon Carbide Devices - Degradation and Functionalization -2017
- Author(s)
  T. Ohshima
- Organizer
  Workshop on Ultra-Precision Processing for Wide Bandgap Semiconductors 2017
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 4H-SiC MOSFETチャネルの単一光子源のゲート電圧制御2017
- Author(s)
  梅田亨英, 阿部裕太, 岡本光央, 原田信介, 春山盛善, 加田渉, 花泉修, 小野田忍, 大島武
- Organizer
  2017年第78回応用物理学会秋季学術講演
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] SiC p+nn+ダイオード中の発光中心のバイアス電圧による発光強度変化2017
- Author(s)
  本多智也, 常見大貴, 児島一聡, 佐藤真一郎, 牧野高紘, 小野田忍, 土方泰斗, 大島武
- Organizer
  2017年第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] 極限環境エレクトロニクスのための4H-SiC nMOSFETs セルフアラインプロセス2017
- Author(s)
  黒瀬達也、黒木伸一郎、石川誠治、前田知徳、瀬崎洋、牧野高紘、大島武、Mikael Ostling、Carl-Mikael Zetterling
- Organizer
  2017年第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] NbNiシリサイドS/D 3C-SiC nMOSFETsと高ガンマ線照射特性2017
- Author(s)
  永野耕平、目黒達也、武山昭憲、牧野高紘、大島武、田中保宣、黒木伸一郎
- Organizer
  2018年第65回応用物理学会春季学術講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] SiC pinダイオード中の発光中心の観察2017
- Author(s)
  常見大貴、本多智也、牧野高紘、小野田忍、佐藤真一郎、土方泰斗、大島武
- Organizer
  2017年　第64回応用物理学会春季学術講演会
- Place of Presentation
  パシフィコ横浜、神奈川県横浜市
- Year and Date
  2017-03-14
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Various single photon sources observed in SiC pin diodes2017
- Author(s)
  H. Tsunemi, T. Honda, T. Makino, S. Onoda, S-I. Sato, Y. Hijikata, T. Ohshima
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] バイアス印加によるSiCダイオード中の発光中心の発光強度変化2017
- Author(s)
  本多智也, 常見大貴, 小野田忍, 佐藤真一郎, 牧野高紘, 土方泰斗, 大島武
- Organizer
  先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Ba導入nMOSFETsに対するBTS試験およびガンマ線照射2017
- Author(s)
  村岡幸輔，瀬崎洋，石川誠治，前田知徳，牧野高紘，大島武，黒木伸一郎
- Organizer
  応用物理学会先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H03253
[Presentation] 4H-SiC MOSFETチャネル中の単一光子源に対する水素の影響2017
- Author(s)
  阿部裕太, 岡本光央, 小野田忍, 大島武, 春山盛善, 加田渉, 花泉修, 原田信介, 鹿児山陽平, 梅田亨英
- Organizer
  2017年第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Observation of Single Photon Sources in Silicon Carbide PiN Diodes2017
- Author(s)
  T. Ohshima, T. Honda, H. Tsunemi, T. Makino, S. Sato, S. Onoda, Y. Hijikata, B. C. Johnson, J. R. Klein, A. Lohrmann, J. C. McCaiium
- Organizer
  International Union of Materials Research Societies, The 15th International Conference on Advanced Materials (IUMRS-ICAM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] SiC p+nn+ダイオード表面に形成される単一光子源の発光特性2017
- Author(s)
  常見大貴, 本多智也, 佐藤真一郎, 小野田忍, 牧野高紘, 土方泰斗, 大島武
- Organizer
  先進パワー半導体分科会第4回講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] SiC p+nn+ダイオードに形成される単一光子源の発光スペクトル2017
- Author(s)
  常見大貴，本多智也，牧野高紘，小野田忍，佐藤真一郎，土方泰斗，大島武
- Organizer
  2017年第78回応用物理学会秋季学術講演会
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Controlled 3D Placement of Vacancy Spins for Quantum Applications in Silicon Carbide2017
- Author(s)
  H. Kraus, D. Simin, C. Kasper, W. Kada, Y. Hijikata, C. Cochrane, T. Ohshima, V. Dyakonov, G. V. Astakhov
- Organizer
  International Conference on Silicon Carbide and Related Materials (ICSCRM2017)
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-17H01056
[Presentation] Transient Current Induced in Thin Film Diamonds by Swift Heavy Ions2016
- Author(s)
  S-I. Sato, T. Makino, T. Ohshima, T. Kamiya, W. Kada, V. Grilj, N. Skukan, M. Jaksic, M. Pomorski, G. Vizkelethy
- Organizer
  27th International Conference on Diamond and Carbon Materials
- Place of Presentation
  Le Corum, Montpellier, France
- Year and Date
  2016-09-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] 次世代高機能デバイスを目指し原子のスピンと光を操る2016
- Author(s)
  大島　武
- Organizer
  第6回CSJ化学フェスタ2016
- Place of Presentation
  タワーホール船堀、東京都江戸川区
- Year and Date
  2016-11-14
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Creation of Single Photon Sources in Wide Bandgap Semiconductors by Ion Irradiation2016
- Author(s)
  T. Ohshima, T. Honda, S. Onoda, T. Makino, Y. Hijikata, A. Lohrmann, J. R. Klein, B. C. Johnson3, J. C. McCallum, S. Castelletto, B. C. Gibson, H. Kraus, V. Dyakonov, G. Astakhov
- Organizer
  第26回　日本MRS年次大会
- Place of Presentation
  横浜市開港記念会館　他、神奈川県横浜市
- Year and Date
  2016-12-19
- Invited
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] 4H-SiC MOSFETにおける単一発光欠陥の界面酸化プロセス依存性の共焦点顕微鏡評価2016
- Author(s)
  阿部裕太、梅田享英、岡本光央、小杉亮治、原田信介、波多野睦子、岩崎孝之、小野田忍、大島武、春山盛善、加田渉、花泉修
- Organizer
  2016年　第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ、新潟県新潟市
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Coherence Properties of the Silicon Vacancy in SiC: from Ensemble to Single Defects2016
- Author(s)
  D.Simin, H. Kraus, A. Sperlich, M. Trupke, T. Ohshima, G. V. Astakhov, V. Dyakonov
- Organizer
  11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016)
- Place of Presentation
  Halkidiki, Greece
- Year and Date
  2016-09-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Creation and Functionalization of Defects in SiC by Irradiation and Thermal Treatment2016
- Author(s)
  T. Ohshima, T. Honda, S. Onoda, T. Makino, Y. Hijikata, A. Lohrmann, J. R. Klein, B. C. Johnson, J. C. McCallum, S. Castelletto, B. C. Gibson, H. Kraus, V. Dyakonov, G. Astakhov
- Organizer
  11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016)
- Place of Presentation
  Halkidiki, Greece
- Year and Date
  2016-09-25
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] 4H-SiC MOSFET中の単一表面欠陥の共焦点顕微鏡観察2016
- Author(s)
  梅田享英，阿部裕太，Y.-W. Zhu，岡本光央，小杉亮治，原田信介，春山盛善，牧野高紘，小野田忍，大島武
- Organizer
  第63回応用物理学会春季学術講演会
- Place of Presentation
  東京工業大学（東京都目黒区）
- Year and Date
  2016-03-19
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] プロトンビームライティングによるSiC中へのシリコン空孔の形成2016
- Author(s)
  本多智也、Kraus Hannes、加田渉、小野田忍、春山盛善、佐藤隆博、江夏昌志、神谷富裕、川端駿介、三浦健太、花泉修、土方泰斗、大島武
- Organizer
  応用物理学会先進パワー半導体分科会第3回講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2016-11-08
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Development of radiation detector based on CVD diamond membrane with embedded living-cell cultivation environment,2016
- Author(s)
  2.W. Kada, M. Sakai, M. Pomorski, N. Skukan, T. Makino, M. Jaksic;, S. Onoda, T. Ohshima,T. Kamiya, and O. Hanaizumi,
- Organizer
  The 12th International Workshop on Ionizing Radiation Monitoring(IWIRM)
- Place of Presentation
  大洗パークホテル
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] 3C-SiC中の表面に形成される単一発光源の発光特性と表面処理の関係2016
- Author(s)
  本多智也、小野田忍、土方泰斗、大島武
- Organizer
  2016年　第77回応用物理学会秋季学術講演会
- Place of Presentation
  朱鷺メッセ、新潟県新潟市
- Year and Date
  2016-09-13
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Charge State Switching of Single Silicon Vacancies in SiC2016
- Author(s)
  M. Widmann, M. Niethammer, S.-Y. Lee, I. Booker, T. Ohshima, A. Gali, N. T. Son, E. Janzen, J. Wrachtrup
- Organizer
  11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016)
- Place of Presentation
  Halkidiki, Greece
- Year and Date
  2016-09-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Visible Range Photoluminescence from Single Photon Sources in 3C, 4H and 6H Silicon Carbide2016
- Author(s)
  A. Lohrmann, S. Castelletto, J. Klein, M. Bosi, M. Negri, D. W. M. Lau, B. C. Gibson, S. Prawer, J. C. McCallum, T. Ohshima, and B. C. Johnson
- Organizer
  International Conference on Nanoscience and Nanotechnology 2016
- Place of Presentation
  National Convention Center (Canberra, Australia)
- Year and Date
  2016-02-07
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Vector Magnetic Field Sensing using Defect Spins in 4H-SiC2016
- Author(s)
  M. Niethammer, M. Widmann, S.-Y. Lee, P. Neumann, P. Stenberg, H. Pedersen, O. Kordina, T. Ohshima, N. T. Son, E. Janzen, J. Wrachtrup
- Organizer
  11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016)
- Place of Presentation
  Halkidiki, Greece
- Year and Date
  2016-09-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Excitation Properties of the Divacancy in 4H and 3C SiC2016
- Author(s)
  I. G. Ivanov, N. T. Son, T. Ohshima, E. Janzen
- Organizer
  11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016)
- Place of Presentation
  Halkidiki, Greece
- Year and Date
  2016-09-25
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Creation of Single Photon Emitters in Silicon Carbide using Particle Beam Irradiation2016
- Author(s)
  T. Ohshima, T. Honda, S. Onoda, T. Makino, Y. Hijikata, A. Lohrmann, J. R. Klein, B. C. Johnson, J. C. McCallum, S. Castelletto, B. C. Gibson, H. Kraus, V. Dyakonov, G. Astakhov
- Organizer
  20th International Conference on Ion Beam Modification of Materials (IBMM2016)
- Place of Presentation
  Wellington, New Zealand
- Year and Date
  2016-10-30
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] 4H-SiC MOSFETにおける単一発光欠陥の酸化膜界面依存性の共焦点顕微鏡評価2016
- Author(s)
  阿部裕太、岡本光央、小杉亮治、原田信介、波多野睦子、岩崎孝之、小野田忍、春山盛善、加田渉、花泉修、大島武、梅田享英
- Organizer
  応用物理学会先進パワー半導体分科会第3回講演会
- Place of Presentation
  つくば国際会議場、茨城県つくば市
- Year and Date
  2016-11-08
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Investigation of Deep Levels in Diamond based Radiation Detector by Transient Charge Spectroscopy with Focused Heavy Ion Microbeam2015
- Author(s)
  Y. Ando, Y. Kambayashi, W. Kada, S. Onoda, T. Makino, S. Sato, H. Umezawa, Y. Mokuno, S. Shikata, O. Hanaizumi, T. Kamiya and T. Ohshima
- Organizer
  2015 International Conference on Solid State Devices and Materials (SSDM2015)
- Place of Presentation
  札幌コンベンションセンター
- Year and Date
  2015-09-27
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Study of diamond membrane detector aiming at highly-efficient and position-sensitive particle detection for ion beam applications2015
- Author(s)
  T. Kamiya, W. Kada, Y. Kambayashi, T. Makino, S. Onoda, T. Ohshima, N.Iwamoto, S. Shikata, Y. Mokuno, H. Umezawa, M. Pomorski, V. Grilj, N.Skukan, and M. Jakšić
- Organizer
  22nd International Conference on Ion Beam Analysis(IBA2015)
- Place of Presentation
  Opatija, Croatia
- Year and Date
  2015-06-14
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Surface Modification Effects on Hydrogen Absorpton Property of a Hydrogen Storage Alloy by Short Pulse Laser Irradiation2015
- Author(s)
  Hiroshi Abe, Takuya Shimomura, Shinnosuke Tokuhira, Yukihiro Shimada, Yusuke Takeyama, Takehiro Furuyama, Akihiro Nishimura, Hirohisa Uchida, Hiroyuki Daido and Takeshi Ohshima
- Organizer
  The 7th International Congress on Laser Advanced Materials Processing
- Place of Presentation
  KITAKYUSHU INTERNATIONAL CONFERENCE CENTER(Kitakyushu-shi, Fukuoka)
- Year and Date
  2015-05-26
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26420891
[Presentation] X-Ray Characterization of Short Pulse Laser Illuminated Hydrogen Storage Alloys Having Very High Performance2015
- Author(s)
  Hiroyuki Daido, Hiroshi Abe, Takashi Shobu, Takuya Shimomura, Shinnosuke Tokuhira, Yusuke Takeyama, Takehiro Furuyama, Akihiro Nishimura, Hirohisa Uchida and Takeshi Ohshima
- Organizer
  SPIE Optical Engineering +Applications Conferences
- Place of Presentation
  San Diego, California (USA)
- Year and Date
  2015-08-09
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-26420891
[Presentation] Engineering Single Defects in Silicon Carbide Bulk, Nanostructures and Devices2015
- Author(s)
  S. Castelletto, A. Lohrmann, A.F.M. Almutairi, D.W.M. Lau, M. Negri, M. Bosi, B. C. Johnson, B.C. Gibson, J. C. McCallum, A. Gali, and T. Ohshima
- Organizer
  International Conference on Silicon Carbide and Related Materials 2015
- Place of Presentation
  Giardini Naxos (Sicily, Italy)
- Year and Date
  2015-10-04
- Int'l Joint Research / Invited
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] 高温熱処理したSiC中に存在する単一光子源2015
- Author(s)
  大島　武，A. Lohrmann，B. C. Johnson，S. Castelletto，小野田忍，牧野高紘，武山昭憲，J. Klein，M. Bosi，M. Negri，D. W. M. Lau，B. C. Gibson，S. Prawer，J. C. McCallum
- Organizer
  応用物理学会先進パワー半導体分科会講演会第2回講演会
- Place of Presentation
  大阪国際交流センター（大阪府大阪市）
- Year and Date
  2015-10-09
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Single-Photon Emitting Diode in 4H- and 6H-SiC2015
- Author(s)
  A. Lohrmann, N. Iwamoto, Z. Bodrog, S. Castelletto, T. Ohshima, T. J. Karle, A.Gali3, S.Prawer, J.C. McCallum, and B.C. Johnson
- Organizer
  International Conference on Silicon Carbide and Related Materials 2015
- Place of Presentation
  Giardini Naxos (Sicily, Italy)
- Year and Date
  2015-10-04
- Int'l Joint Research
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Optically Active Defect Centres in Silicon Carbide Devices2014
- Author(s)
  B.C. Johnson, N. Iwamoto, S. Castelletto, S. Onoda, T. Ohshima, T. Karle and J. C. McCallum
- Organizer
  2014 Internat. Conf. on Nanoscience and Nanotechnology
- Place of Presentation
  Adelaide Convention Centre (Adelaide, Australia)
- Data Source
  KAKENHI-PROJECT-24656025
[Presentation] Fabrication of Single Photon Centres in Silicon Carbide2012
- Author(s)
  B. C. Johnson, S. Castelletto, T. Ohshima and T. Umeda
- Organizer
  2012 Conference on Optoelectronic and Microelectronic Materials and Devices
- Place of Presentation
  Univ. of Melbourne (Melbourne, Australia)
- Data Source
  KAKENHI-PROJECT-24656025
[Presentation] Peak Degradation of Heavy-Ion Induced Transient Currents in 6H-SiC MOS capacitors2011
- Author(s)
  T.Makino, N.Iwamoto, S.Onoda, T.Ohshima, K.Kojima, S.Nozaki
- Organizer
  International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM2011)
- Place of Presentation
  Renaissance Cleveland Hotel, Cleveland (USA)
- Year and Date
  2011-09-14
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency2011
- Author(s)
  N. Iwamoto, A. Koizumi, S. Onoda, T. Makino, T. Ohshima, K. Kojima, S. Koike, K. Uchida, S. Nozaki
- Organizer
  Internat. Conf. on Silicon Carbide and Related Materials 2011(ICSCRM2011)
- Place of Presentation
  Cleveland(USA)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Peak Degradation of Heavy-Ion Induced Transient Currents in 6H-SiC MOS capacitors2011
- Author(s)
  T. Makino, N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima, S. Nozaki
- Organizer
  Internat. Conf. on Silicon Carbide and Related Materials 2011(ICSCRM2011)
- Place of Presentation
  Cleveland(USA)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency2011
- Author(s)
  N.Iwamoto, A.Koizumi, S.Onoda, T.Makino, T.Ohshima, K.Kojima, S.Koike, K.Uchida, S.Nozaki
- Organizer
  International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM2011)
- Place of Presentation
  Renaissance Cleveland Hotel, Cleveland (USA)
- Year and Date
  2011-09-13
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Refreshable Decrease in Peak Height of Ion Beam Induced Transient Current from Silicon Carbide Metal-Oxide-Semiconductor Capacitors2010
- Author(s)
  T.Ohshima, N.Iwamoto, S.Onoda, T.Makino, M.Deki, S.Nozaki
- Organizer
  21st International Conference on the Application of Accelerators in Research and Industry (CAARI)
- Place of Presentation
  Worthington Renaissance, Fort Worth, Texas (USA)
- Year and Date
  2010-08-10
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Oxygen Ion Induced Charge in SiC MOS Capacitors Irradiated with Gamma-rays2010
- Author(s)
  T.Ohshima, N.Iwamoto, S.Onoda, T.Makino, S.Nozaki, K.Kojima
- Organizer
  The 8th European Conference on Silicon Carbide and Related Materials (ECSCRM)
- Place of Presentation
  Sundvolden Conf.Center, Oslo (Norway)
- Year and Date
  2010-08-31
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Change in Current Induced from Silicon Carbide Metal. Oxide-Semiconductor Capacitors by Oxygen Ions2010
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, M. Deki, S. Nozaki
- Organizer
  9th Internat. Workshop on Radiation Effects on Semiconductor Devices for Space Applications(9thRASEDA)
- Place of Presentation
  Takasaki(Japan)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Enhanced Charge Collection in Drain Contact of 6H-SiC MOSFETs Induced by Heavy Ion Microbeam2010
- Author(s)
  S.Onoda, G.Vizkelethy, T.Makino, N.Iwamoto, K.Kojima, S.Nozaki, T.Ohshima
- Organizer
  9th Internat.Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA)
- Place of Presentation
  Takasaki City Gallery, Takasaki (Japan)
- Year and Date
  2010-10-27
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Charge Enhancement Effects in 6H-SiC MOSFETs Induced by Heavy Ion Strike2010
- Author(s)
  S. Onoda, T. Makino, N. Iwamoto, G. Vizkelethy, K. Kojima, S. Nozaki, T. Ohshima
- Organizer
  IEEE Nuclear and Space Radiation Effects Conference(NSREC)
- Place of Presentation
  Denver(USA)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Oxygen Ion Induced Charge in SiC MOS Capacitors Irradiated with Gamma-rays2010
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, S. Nozaki, K. Kojima
- Organizer
  The 8th European Conference on Silicon Carbide and Related Materials(ECSCRM)
- Place of Presentation
  Oslo(Norway)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Change in Current Induced from Silicon Carbide Metal-Oxide-Semiconductor Capacitors by Oxygen Ions2010
- Author(s)
  T.Ohshima, N.Iwamoto, S.Onoda, T.Makino, M.Deki, S.Nozaki
- Organizer
  9th Internat.Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA)
- Place of Presentation
  Takasaki City Gallery, Takasaki (Japan)
- Year and Date
  2010-10-28
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Charge Enhancement Effects in 6H-SiC MOSFETs Induced by Heavy Ion Strike2010
- Author(s)
  S.Onoda, T.Makino, N.Iwamoto, G.Vizkelethy, K.Kojima, S.Nozaki, T.Ohshima
- Organizer
  IEEE Nuclear and Space Radiation Effects Conference (NSREC)
- Place of Presentation
  Sheraton, Denver, Colorado (USA)
- Year and Date
  2010-07-21
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Refreshable Decrease in Peak Height of Ion Beam Induced Transient Current from Silicon Carbide Metal-Oxide-Semiconductor Capacitors2010
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, M. Deki, S. Nozaki
- Organizer
  21st International Conference on the Application of Accelerators in Research and Industry(CAARI)
- Place of Presentation
  Fort Worth(USA)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Enhanced Charge Collection in Drain Contact of 6H-SiC MOSFETs Induced by Heavy Ion Microbeam2010
- Author(s)
  S. Onoda, G. Vizkelethy, T. Makino, N. Iwamoto, K. Kojima, S. Nozaki, T. Ohshima
- Organizer
  9th Internat. Workshop on Radiation Effects on Semiconductor Devices for Space Applications(9thRASEDA)
- Place of Presentation
  Takasaki(Japan)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Charge Collection Efficiency of 6H-SiC P+N Diodes Degraded by Low-Energy Electron Irradiation2009
- Author(s)
  N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima, A. Koizumi, K. Uchida, and S. Nozaki
- Organizer
  The 13th International Conference on Silicon Carbide and Related Materials 2009(ICSCRM2009)
- Place of Presentation
  Nuremberg(Germany)
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation2009
- Author(s)
  N.Iwamoto, S.Onoda, T.Ohshima, K.Kojima, A.Koizumi, K.Uchida, S.Nozaki
- Organizer
  The 13^<th> International Conference on Silicon Carbide and Related Materials 2009 (ICSCRM2009)
- Place of Presentation
  Nuremberg(Germany)
- Year and Date
  2009-10-14
- Data Source
  KAKENHI-PROJECT-21360471
[Presentation] Charge Collection Properties of 6H-SiC Diodes by Wide Variety of Charged Particles up to Several Hundreds MeV2008
- Author(s)
  S. Onoda, N. Iwamoto, M. Murakami, T. Ohshima, T. Hirao, K. Kojima, K. Kawano, I. Nakano
- Organizer
  7th European Conference on Silicon Carbide and Related Materials (ECSCRM)
- Place of Presentation
  Barcelona(Spain)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Comparative Study of Transient Current Induced in SiC p+n and n+p Diodes by Heavy Ion Microbeams2008
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Kamiya, K. Kawano
- Organizer
  11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA)
- Place of Presentation
  Debrecen(Hungary)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Reduction of Effective Carrier Density and Charge Collection Efficiency in SiC Devices due to Radiations2008
- Author(s)
  S. Onoda, N. Iwamoto, T. Hirao, K. Kawano, K. Kojima, T. Ohshima
- Organizer
  20th International Conference on the Application of Accelerators in Research and Industry (CAARI)
- Place of Presentation
  Fort Worth(USA)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Comparative Study of Transient Current Induced in SiC p^+n and n^+p Diodes by Heavy Ion Microbeams2008
- Author(s)
  T. Ohshima, N. Iwamoto, S. Onoda, T. Kamiya, K. Kawano
- Organizer
  11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA)
- Place of Presentation
  Debrecen (Hungary)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 数百MeV級高エネルギー重イオンによる6H-SiCダイオードの電荷収集効率の測定2008
- Author(s)
  小野田忍, 大島武, 岩本直也, 平尾敏雄, 児島一聡, 河野勝泰
- Organizer
  2008年秋季第69回応用物理学会学術講演会
- Place of Presentation
  春日井(日本)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 数百MeV 級高エネルギー重イオンによる6H-SiCダイオードの電荷収集効率の測定2008
- Author(s)
  小野田忍、大島武、岩本直也、平尾敏雄、児島一聡、河野勝泰
- Organizer
  008年秋季第69回応用物理学会学術講演会
- Place of Presentation
  春日井(日本)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] NIEL Analysis of Charge Collection Efficiency in Silicon Carbide Diodes Damaged by Gamma-Rays, Electrons and Protons2008
- Author(s)
  T. Ohshima, S. Onoda, N. Iwamoto, K. Kojima, K. Kawano
- Organizer
  The 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA)
- Place of Presentation
  Tsukuba (Japan)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 高エネルギー重イオンによるTIBIC測定技術の開発II2007
- Author(s)
  小野田忍、平尾敏雄、菱木繁臣、大島武
- Organizer
  2007年(平成19年)秋季第68回応用物理学会学術講演会
- Place of Presentation
  北海道(日本)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 電子線照射により損傷を導入した6H-SiCダイオードの電荷収集効率2007
- Author(s)
  N. Iwamoto, T. Ohshima, S. Onoda, S. Hishiki, M. Murakami, I. Nakano, K. Kawano
- Organizer
  第26回法政大学イオンビーム工学研究所シンポジウム
- Place of Presentation
  東小金井(日本)
- Year and Date
  2007-12-13
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Transient Response to High Energy Heavy Ions in 6H-SiC n+p diodes2007
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, N. Iwamoto, K. Kojima, K. Kawano
- Organizer
  Int. Conf. on Silicon Carbide and Related Materials 2007
- Place of Presentation
  Otsu (Japan)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 電子線照射された6H-SiC pnダイオードの電荷収集効率2007
- Author(s)
  岩本直也、小野田忍、菱木繁臣、大島武、村上允、中野逸夫、河野勝泰
- Organizer
  2007年(平成19年)秋季第68回応用物理学会学術講演会
- Place of Presentation
  北海道(日本)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Decrease of Charge Collection Due to Displacement Damage by Gamma Rays in a 6H-SiC Diodes2007
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, K. Mishima, S. Hishiki, N. Iwamoto, K. Kojima, K. Kawano
- Organizer
  2007 IEEE Nuclear and Space Radiation Effects Conference
- Place of Presentation
  Hawaii (USA)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] 6H-SiCダイオードにおけるイオンビーム誘起電荷量の低下2007
- Author(s)
  小野田忍, 岩本直也, 大島武, 平尾敏雄,河野勝泰
- Organizer
  第26回法政大学イオンビーム工学研究所シンポジウム
- Place of Presentation
  東小金井(日本)
- Year and Date
  2007-12-13
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation2007
- Author(s)
  N. Iwamoto, S. Onoda, S. Hishiki, T. Ohshima, M. Murakami, I. Nakano, K. Kawano
- Organizer
  Int. Conf. on Silicon Carbide and Related Materials 2007
- Place of Presentation
  Otsu (Japan)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Observation of Charge Collection Efficiency of 6H-SiC n+p Diodes Irradiated with Au-Ions2006
- Author(s)
  N. Iwamoto, T. Ohshima, T. Satoh, M. Oikawa, S. Onoda, S. Hishiki, T. Hirao, T. Kamiya, T. Yokoyama, A. Sakamoto, R. Tanaka, I. Nakano, G. Wagner, H. Itoh, K. Kawano
- Organizer
  7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
- Place of Presentation
  Takasaki (Japan)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Analysis of Transient Current in SiC Diodes Irradiated with MeV Ions2006
- Author(s)
  S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, K. Mishima, N. Iwamoto, T. Kamiya, K. Kawano
- Organizer
  7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application
- Place of Presentation
  Takasaki(Japan)
- Data Source
  KAKENHI-PROJECT-18360458
[Presentation] Development of Diagnostic Method for Deep Levels in Semiconductors using Charge Induced by Heavy Ion
- Author(s)
  T.OHSHIMA, N. IWAMOTO, M.KOKA,S.ONODA, T. MAKINO, T. KAMIYA, W.KADA, Y.KANBAYASHI, N. HOSHINO, H.TSUCHIDA, K. KOJIMA,
- Organizer
  14th International Conference on Nuclear Microprobe Technology and Applications
- Place of Presentation
  イタリア、パドバ、パドバ大学及びサンガエターノ文化センター
- Year and Date
  2014-07-06 – 2014-07-11
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Transmission diamond membrane detector and vacuum window for external microbeams
- Author(s)
  N.SKUKAN, W.KADA, N. IWAMOTO, T.KAMIYA,M. Jakšić, T.OHSHIMA, V.GRILJ, M.POMORSKI,
- Organizer
  14th International Conference on Nuclear Microprobe Technology and Applications
- Place of Presentation
  イタリア、パドバ、パドバ大学及びサンガエターノ文化センター
- Year and Date
  2014-07-06 – 2014-07-11
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Optically Active Defects in Silicon Carbide
- Author(s)
  B. C. Johnson, Alex Lohrmann, H. Bowers, J. C. McCallum and Takeshi Ohshima
- Organizer
  Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014)
- Place of Presentation
  The University of Western Australia (Perth, Australia)
- Year and Date
  2014-12-14 – 2014-12-17
- Data Source
  KAKENHI-PROJECT-26286047
[Presentation] Development of single ion detection technique for microbeam applications
- Author(s)
  Tomihiro Kamiya, Takahiro Satoh, Masashi Koka, Shinobu Onoda, Takeshi Ohshima, Takahiro Makino, Wataru Kada, Veljko Grilj,
- Organizer
  8th International Symposium on BioPIXE
- Place of Presentation
  クロアチア、ブレッド、ホテルゴルフ
- Year and Date
  2014-09-14 – 2014-09-19
- Invited
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] Investigation of Deep Levels in Silicon Carbide using Ion-Induced Charge Transient Spectroscopy
- Author(s)
  W.KADA, S. ONODA, N.IWAMOTO, N.HOSHINO, H.TSUCHIDA, T.MAKINO, Y.KANBAYASHI, O.HANAIZUMI, M. KOKA,T. KAMIYA, T.OHSHIMA,
- Organizer
  14th International Conference on Nuclear Microprobe Technology and Applications
- Place of Presentation
  イタリア、パドバ、パドバ大学及びサンガエターノ文化センター
- Year and Date
  2014-07-06 – 2014-07-11
- Data Source
  KAKENHI-PROJECT-26249149
[Presentation] SiC中の単一発光源となる欠陥の探索
- Author(s)
  大島武，小野田忍，牧野高紘，岩本直也，B. C. Johnson，A. Lohrmann，T. Karle，J. C. McCallum，S. Castelletto，梅田享英，佐藤嘉洋，朱煜偉，V. Ivády，A. Gali，春山盛善，加田渉，花泉修
- Organizer
  2014年　第75回応用物理学会秋季学術講演会
- Place of Presentation
  北海道大学札幌キャンパス（北海道・札幌市）
- Year and Date
  2014-09-17 – 2014-09-20
- Data Source
  KAKENHI-PROJECT-26286047

1. UMEDA Takehide (10361354)

# of Collaborated Projects: 4 results

# of Collaborated Products: 7 results
2. ONODA Shinobu (30414569)

# of Collaborated Projects: 3 results

# of Collaborated Products: 75 results
3. KAMIYA Tomihiro (70370385)

# of Collaborated Projects: 3 results

# of Collaborated Products: 25 results
4. SATOH Takahiro (10370404)

# of Collaborated Projects: 3 results

# of Collaborated Products: 45 results
5. ITOH Hisayoshi (40354930)

# of Collaborated Projects: 2 results

# of Collaborated Products: 4 results
6. NAKANO Itsuo (90133024)

# of Collaborated Projects: 2 results

# of Collaborated Products: 11 results
7. MAKINO Takakahiro (80549668)

# of Collaborated Projects: 2 results

# of Collaborated Products: 9 results
8. 磯谷順一 (60011756)

# of Collaborated Projects: 2 results

# of Collaborated Products: 0 results
9. 土方泰斗 (70322021)

# of Collaborated Projects: 2 results

# of Collaborated Products: 16 results
10. NAKASHIMA Hiroshi (20354764)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
11. SHIBATA Tokushi (80028224)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
12. KASUGAI Yoshimi (40354724)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
13. SAKAMOTO Yukio (90354703)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
14. IWAMOTO Yosuke (10391327)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
15. MATSUDA Norihiro (80354760)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
16. NAKAMURA Takashi (70026029)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
17. HIRAYAMA Hideo (00044785)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
18. BAN Shuichi (70141976)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
19. SANAMI Toshiya (90321538)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
20. HAGIWARA Masayuki (10450363)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
21. IWASE Hiroshi (00469876)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
22. YASHIMA Hiroshi (40378972)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
23. SEKIMOTO Shun (10420407)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
24. OISHI Koji (70393585)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
25. ISHIBASHI Kenji (00159766)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
26. SHIGYO Nobuyuki (40304836)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
27. TAJIMA Michio (30216965)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
28. IMAIZUMI Mitsuru (90421859)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
29. Tanaka Manobu (00222117)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
30. KANEKO Junichi (90333624)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
31. SHIMAOKA Takehiro (80650241)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
32. MIUCHI Kentaro (80362440)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
33. MOKUNO Yoshiaki (60358166)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
34. ABE Hiroshi (30354947)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
35. UCHIDA Hirohisa (20147119)

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
36. DAIDO Hiroyuki (70144532)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
37. NISHIMURA Akihiko (90370452)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
38. SYOUBU Takahisa (90425562)

# of Collaborated Projects: 1 results

# of Collaborated Products: 2 results
39. HARAKI Takeshi (70439735)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
40. 水落憲和 (00323311)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
41. 谷口尚 (80354413)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
42. 鹿田真一 (00415689)

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
43. 加田渉 (60589117)

# of Collaborated Projects: 1 results

# of Collaborated Products: 16 results
44. 波多野睦子 (00417007)

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
45. 松下雄一郎 (90762336)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
46. 押山淳 (80143361)

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
47. 黒木伸一郎 (70400281)

# of Collaborated Projects: 1 results

# of Collaborated Products: 9 results
48. SHIMOMURA Takuya

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
49. TOKUHIRA Shin-nosuke

# of Collaborated Projects: 1 results

# of Collaborated Products: 4 results
50. SHIMADA Yukihiro

# of Collaborated Projects: 1 results

# of Collaborated Products: 1 results
51. TAKENAKA Yusuke

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
52. FURUYAMA Yuta

# of Collaborated Projects: 1 results

# of Collaborated Products: 3 results
53. 川北史朗

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
54. 高本達也

# of Collaborated Projects: 1 results

# of Collaborated Products: 0 results
55. 藤ノ木享英(梅田享英)

# of Collaborated Projects: 0 results

# of Collaborated Products: 5 results
56. JOHNSON Brett

# of Collaborated Projects: 0 results

# of Collaborated Products: 3 results
57. 岡本光央

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results
58. 原田信介

# of Collaborated Projects: 0 results

# of Collaborated Products: 1 results

Ohshima Takeshi 大島 武

OHSHIMA Takeshi 大島 武

Research Projects

Research Products

Co-Researchers

Multi-scale calculations for complex correlation appearing in SiC oxidation and its impact on electronic propertiesOngoing

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Quantum state measurements of single photon sources in silicon carbide devicesPrincipal InvestigatorOngoing

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Research on Silicon Carbide Harsh Environment ElectronicsOngoing

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Control of Photons and Spins of High-Brightness Single Photon Center in Silicon CarbidePrincipal Investigator

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Study of diamond thin film as a beam exit window to the atmosphere for high energy ions and a position-sensitivity detector

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The hydrogen occlusion materials high function in the defect design by the quantum beam irradiation

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Development of wide gap semiconductor pixel detector for light dark matter search

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Controlling of Single Photon Source in Silicon CarbidePrincipal Investigator

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Mechanism of the Destruction of Oxide on Silicon Carbide due to ChargeInduced by Ion BeamsPrincipal Investigator

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Experimental study on behavior and radiation effect of very high-energy particles in matters

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2キュービットゲートを用いた鎖状スケーラブル量子コンピュータの開発

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Induced Charge Evaluation for the Development of Particle Detectors Fabricated on Silicon CarbidePrincipal Investigator

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半導体電子スピン系量子コンピュータの要素技術の開発

Principal Investigator

Project Period (FY)

Ohshima Takeshi 大島武

OHSHIMA Takeshi 大島武