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Nakatsuka Osamu  中塚 理

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NAKATSUKA Osamu  中塚 理

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Researcher Number 20334998
Other IDs
External Links
Affiliation (Current) 2025: 名古屋大学, 工学研究科, 教授
Affiliation (based on the past Project Information) *help 2016 – 2023: 名古屋大学, 工学研究科, 教授
2017: 名古屋大学, 大学院工学研究科, 教授
2015: 名古屋大学, 工学(系)研究科(研究院), 准教授
2010: 名古屋大学, 工学研究科, 准教授
2008 – 2009: 名古屋大学, 工学研究科, 講師 … More
2007 – 2009: 名古屋大学, 大学院・工学研究科, 講師
2007: Nagoya University, 大学院・工学研究科, 助教
2005 – 2006: Nagoya University, Eco Topia Science Institute, Assistant Professor, エコトピア科学研究所, 助手
2004: 名古屋大学, エコトピア科学研究機構, 助手
2001 – 2003: 名古屋大学, 理工科学総合研究センター, 助手 Less
Review Section/Research Field
Principal Investigator
Medium-sized Section 29:Applied condensed matter physics and related fields / Basic Section 29020:Thin film/surface and interfacial physical properties-related / Thin film/Surface and interfacial physical properties / Thin film/Surface and interfacial physical properties
Except Principal Investigator
Thin film/Surface and interfacial physical properties / Science and Engineering / Thin film/Surface and interfacial physical properties / Basic Section 30010:Crystal engineering-related / Crystal engineering / Applied materials science/Crystal engineering / Applied materials science/Crystal engineering / Engineering / Science and Engineering
Keywords
Principal Investigator
界面 / 薄膜 / ゲルマニウム錫 / コンタクト / ゲルマニウム / 表面・界面 / 物質科学 / エレクトロニクス / 半導体 / 結晶材料 … More / 珪酸塩鉱物 / 低次元物質 / Ⅳ族半導 / 結晶成長 / エネルギーバンド / エピタキシャル成長 / Ⅳ族半導体 / ドーピング / ショットキー障壁 / 集積回路 / 電子・電気材料 / ニッケル / 結晶工学 / プロセス技術 / ULSI / ジャーマナイド … More
Except Principal Investigator
シリサイド / ゲルマニウム / シリコン / エピタキシャル成長 / シリコンゲルマニウム / 結晶成長 / IV族半導体 / 結晶工学 / 半導体物性 / ニッケル / 格子欠陥 / 走査トンネル顕微鏡 / 第一原理計算 / Silicon / Silicide / 欠陥 / エネルギーバンド / コンタクト / 表面・界面 / ひずみ / 錫 / 表面・界面物性 / チタン / ボロン / 透過電子顕微鏡 / 転位 / 材料系残 / パワーデバイス用半導体 / 計算手法 / 欠陥制御 / パワーデバイス / Ⅳ族半導体 / 集積回路 / ゲルマニウム錫 / 多軌道タイトバインディング法 / IV族元素 / ナノリボン / スピン軌道相互作用 / タイトバインディング近似 / 物質合成 / 物質設計 / エッジ状態 / 理論 / 物質創製 / 二次元物質 / スタネン / ゲルマネン / シリセン / 熱統計力学 / 半導体 / 大口径シリコン結晶 / パワーデバイス用シリコン / 太陽電池 / シリコン単結晶 / 材料物性値 / 原子配置 / 統計熱力学 / Strain structure / Germanium / Electron microscopy / Semiconductor property / Lattice defect / Crystal growth / Crystal engineering / 高分解能X線回析2次元逆格子マッピング / X線回折 / ヘテロエピタキシャル / 歪み / 歪構造 / 電子顕微鏡 / Scanning Tunneling Microscope / Contact / Surface / Interface / Nickel / Carbon / 表面物件 / 界面物件 / 表面物性 / 界面物性 / カーボン / Drain / Source / Germanosilicide / Titanium / Rapid thermal annealing / Silicon germanium / modulated interface / Ultra low resistance contact / 急速加熱化学気相成長法 / 超抵抗コンタクト / ドレイン / ソース / ジャーマノシリサイド / 急速加熱処理 / 界面組成変調層 / 超低抵抗コンタクト / LSI / 高キャリア移動度 / スズ / ゲートスタック / スズ(錫) / CMOS / 歪 / 酸化 / 表面終端 / 半導体工学 / 酸化現象 / 表面・界面物理 / 水素 / 歪ゲルマニウム / ゲートスタック構造 / ポストスケーリング / ナノ材料 / デバイス設計・製造プロセス / 半導体超微細化 / 高角度散乱暗視野走査透過電子顕微鏡 / エピタキシャル / コバルト / カーボン(炭素) / 走査型透過電子顕微鏡 / プラチナ / パラジウム / 界面 / ハイドープ / 低温エピタキシャル成長 / イオンビームスパッタ法 / 水素サーファクタント成長 / 固相エピタキシャル成長 / イオンビームスパッタ / 歪成長 / スパッタ粒子のエネルギーの低減 / スパッタ法のMCシミュレーション / 界面層 / 歪緩和バッファ層 / シリコンゲルマニウムカーボン / Bの高濃度ドープ / 2次元逆格子マッピングX線回折法 / B高濃度ドーピング / 熱電効果 / バッファ層 / 歪緩和 / シリコンゲルマニウムカーボンバッファ層 Less
  • Research Projects

    (17 results)
  • Research Products

    (660 results)
  • Co-Researchers

    (27 People)
  •  Energy band design based on controlling ordered/disordered structure of non-thermal equilibrium group-IV alloy thin filmsPrincipal Investigator

    • Principal Investigator
      Nakatsuka Osamu
    • Project Period (FY)
      2021 – 2023
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Review Section
      Basic Section 29020:Thin film/surface and interfacial physical properties-related
    • Research Institution
      Nagoya University
  •  Creation of exotic low-dimensional material originated from phyllosilicate and control of its electronic propertyPrincipal Investigator

    • Principal Investigator
      Nakatsuka Osamu
    • Project Period (FY)
      2021 – 2023
    • Research Category
      Grant-in-Aid for Challenging Research (Exploratory)
    • Review Section
      Medium-sized Section 29:Applied condensed matter physics and related fields
    • Research Institution
      Nagoya University
  •  Development of calculation technique for defect control in semiconductors for power device application

    • Principal Investigator
      Sueoka Koji
    • Project Period (FY)
      2019 – 2021
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Review Section
      Basic Section 30010:Crystal engineering-related
    • Research Institution
      Okayama Prefectural University
  •  Development of calculation method for physical properties based on the possible atomic configurations and its application to the IV group semiconductor materials

    • Principal Investigator
      Sueoka Koji
    • Project Period (FY)
      2016 – 2018
    • Research Category
      Grant-in-Aid for Scientific Research (C)
    • Research Field
      Crystal engineering
    • Research Institution
      Okayama Prefectural University
  •  Low Resistance Metal/Germanium Contacts by Alleviation of Fermi Level Pinning PhenomenonPrincipal Investigator

    • Principal Investigator
      NAKATSUKA Osamu
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Synthesis of New Group IV Two Dimensional Materials

    • Principal Investigator
      Shiraishi Kenji
    • Project Period (FY)
      2015 – 2017
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Establishment of Fundamental Engineering of Sn-related Group-IV Semiconductor Materials for Multi-Functional and Low-Power Electronics

    • Principal Investigator
      ZAIMA SHIGEAKI
    • Project Period (FY)
      2014 – 2018
    • Research Category
      Grant-in-Aid for Scientific Research (S)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Design of Electronic Properties and Development of High-Mobility Channel Technology for Low Power/High-Speed Nano-CMOS Devices

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2010 – 2013
    • Research Category
      Grant-in-Aid for Specially Promoted Research
    • Review Section
      Science and Engineering
      Engineering
    • Research Institution
      Nagoya University
  •  シリコン系エンジニアリングサブストレート実現のための材料・物性・構造制御技術

    • Principal Investigator
      財満 鎭明
    • Project Period (FY)
      2009 – 2011
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Construction of High-k Gate/Strain-engineered Germanium channel Structures with Functional Nano-system

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2006 – 2009
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  Creation of tensile-strained Ge high-mobility-channel by thermal nonequilibrium process

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2006 – 2008
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Formation technology of ultra-flat metal/Ge contacts with low resistance for Ge electronicsPrincipal Investigator

    • Principal Investigator
      NAKATSUKA Osamu
    • Project Period (FY)
      2006 – 2008
    • Research Category
      Grant-in-Aid for Young Scientists (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  Controlling deformation of strained hetero structure of group IV semiconductors for realization of ultra uniform strain fields

    • Principal Investigator
      SAKAI Akira
    • Project Period (FY)
      2004 – 2006
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  Control of solid-phase reaction dynamics and carbon engineering for nanofabrication of group-IV

    • Principal Investigator
      ZAIMA Shigeaki
    • Project Period (FY)
      2003 – 2005
    • Research Category
      Grant-in-Aid for Scientific Research (A)
    • Research Field
      Thin film/Surface and interfacial physical properties
    • Research Institution
      Nagoya University
  •  異種材料界面制御による超低抵抗コンタクトの開発と半導体/金属界面の原子直視研究

    • Principal Investigator
      財満 鎭明
    • Project Period (FY)
      2001 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University
  •  Study of low resistance contact structure using composition-modulated interface layer for 0.1-μm generation ULSI

    • Principal Investigator
      YASUDA Yukio
    • Project Period (FY)
      2000 – 2002
    • Research Category
      Grant-in-Aid for Scientific Research (B)
    • Research Field
      Applied materials science/Crystal engineering
    • Research Institution
      Nagoya University
  •  人工IV族半導体極微細構造デバイス製作のための原子精度要素プロセスの開発

    • Principal Investigator
      YASUDA Yukio
    • Project Period (FY)
      1999 – 2003
    • Research Category
      Grant-in-Aid for Scientific Research on Priority Areas
    • Review Section
      Science and Engineering
    • Research Institution
      Nagoya University

All 2024 2023 2022 2021 2019 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 Other

All Journal Article Presentation Book Patent

  • [Book] ポストシリコン半導体-ナノ成膜ダイナミクスと基板・界面効果-2013

    • Author(s)
      財満鎭明、中塚理、高木信一(全執筆者57名)
    • Total Pages
      510
    • Publisher
      株式会社エヌ・ティー・エヌ
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Book] ポストシリコン半導体-ナノ成膜ダイナミクスと基板・界面効果-(序論 : 財満、2.3. 3節 : 中塚)2013

    • Author(s)
      財満鎭明、中塚理(共著者の一部)
    • Total Pages
      510
    • Publisher
      株式会社エヌ・ティー・エス
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] In-situ Sb ドーピングによるInP上n型Ge0.75Sn0.25エピタキシャル膜の形成2024

    • Author(s)
      柴山茂久,高木孝明,坂下満男,黒澤昌志,中塚理
    • Journal Title

      第29回電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―予稿集

      Volume: 1 Pages: 12-12

    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] Ge1-xSnx layers with x~0.25 on InP(001) substrate grown by low-temperature molecular beam epitaxy reaching 70°C and in-situ Sb doping2024

    • Author(s)
      Shibayama Shigehisa、Takagi Komei、Sakashita Mitsuo、Kurosawa Masashi、Nakatsuka Osamu
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 176 Pages: 108302-108302

    • DOI

      10.1016/j.mssp.2024.108302

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] Self-organized Ge1-xSnx quantum dots formed on insulators and their room temperature photoluminescence2023

    • Author(s)
      Hashimoto Kaoru, Shibayama Shigehisa, Asaka Koji, Sakashita Mitsuo, Kurosawa Masashi, Nakatsuka Osamu
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 62 Issue: 7 Pages: 075506-075506

    • DOI

      10.35848/1347-4065/ace5f9

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01809, KAKENHI-PROJECT-23K23040
  • [Journal Article] Crystalline and optoelectronic properties of Ge1-xSnx/high-Si-content-SiyGe1-x-ySnx double-quantum wells grown with low-temperature molecular beam epitaxy2023

    • Author(s)
      S. Zhang, S. Shibayama, and O. Nakatsuka
    • Journal Title

      Semiconductor Science and Technology

      Volume: 38 Issue: 1 Pages: 015018-015018

    • DOI

      10.1088/1361-6641/aca7d9

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] Lattice-matched growth of high-Sn-content (x~0.1) Si1-xSnx layers on S1-yGey buffers using molecular beam epitaxy2023

    • Author(s)
      Fujimoto Kazuaki、Kurosawa Masashi、Shibayama Shigehisa、Sakashita Mitsuo、Nakatsuka Osamu
    • Journal Title

      Applied Physics Express

      Volume: 16 Issue: 4 Pages: 045501-045501

    • DOI

      10.35848/1882-0786/acc3da

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01366, KAKENHI-PROJECT-21H01809
  • [Journal Article] Photoluminescence properties of heavily Sb doped Ge1-xSnx and heterostructure design favorable for n+-Ge1-xSnx active layer2022

    • Author(s)
      S. Zhang, M. Fukuda, J. Jeon, M. Sakashita, S. Shibayama, and O. Nakatsuka
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 61 Issue: SA Pages: SA1004-SA1004

    • DOI

      10.35848/1347-4065/ac25da

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] 極薄GeSiSn/GeSn/GeSiSn二重障壁構造の形成およびその電気的特性2022

    • Author(s)
      柴山茂久, G. R. Suwito, 中塚理
    • Journal Title

      応用物理学会 薄膜・表面物理分科会/シリコンテクノロジー分科会 共催 電子デバイス界面テクノロジー研究会 -材料・プロセス・デバイス特性の物理- 特別研究会研究報告

      Volume: 第27回研究会 Pages: 187-190

    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] 多層量子ドット構造実現に向けた絶縁体上へのGe1-xSnxナノドットの自己形成2022

    • Author(s)
      橋本薫, 柴山茂久, 安坂幸師, 中塚理
    • Journal Title

      信学技報 IEICE Technical Report

      Volume: 84 Pages: 5-8

    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] Interface structures and electrical properties of micro-fabricated epitaxial Hf-digermanide/n-Ge(001) contacts2022

    • Author(s)
      K. Kasahara, K. Senga, M. Sakashita, S. Shibayama, and O. Nakatsuka
    • Journal Title

      IEEE Journal of the Electron Devices Society

      Volume: 10 Pages: 744-750

    • DOI

      10.1109/jeds.2021.3139728

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Journal Article] Synthesis of heavily Ga-doped Si1-xSnx/Si heterostructures and their valence-band-offset determination2019

    • Author(s)
      M. Kurosawa, Y. Inaishi, R. Tange, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 58 Issue: SA Pages: SAAD02-SAAD02

    • DOI

      10.7567/1347-4065/aaeb36

    • NAID

      210000135207

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Influence of Sn precursors on Ge1-xSnx growth using metal-organic chemical vapor deposition2019

    • Author(s)
      Y. Miki, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 58 Issue: SA Pages: SAAD07-SAAD07

    • DOI

      10.7567/1347-4065/aaec1a

    • NAID

      210000135228

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Operation of thin-film thermoelectric generator of Ge-rich poly-Ge1-xSnx on SiO2 fabricated by a low thermal budget process2019

    • Author(s)
      K. Takahashi, H. Ikenoue, M. Sakashita, O. Nakatsuka, S. Zaima, and M. Kurosawa
    • Journal Title

      Appl. Phys. Express

      Volume: 12 Issue: 5 Pages: 051016-051016

    • DOI

      10.7567/1882-0786/ab1969

    • NAID

      210000155747

    • Peer Reviewed / Open Access
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-16J10846, KAKENHI-PROJECT-17H04919
  • [Journal Article] Formation of epitaxial Hf digermanide/Ge(001) contact and its crystalline properties2018

    • Author(s)
      O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 印刷中

    • NAID

      210000149378

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] Formation of ultra-low resistance contact with nickel stanogermanide/heavily doped n+-Ge1-xSnx structure2018

    • Author(s)
      J. Jeon, A. Suzuki, O. Nakatsuka, and S. Zaima
    • Journal Title

      Semicond. Sci. Tech.

      Volume: 33 Issue: 12 Pages: 124001-124001

    • DOI

      10.1088/1361-6641/aae624

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Growth and electrical properties of in situ Sb-doped Ge1-xSnx epitaxial layers for source/drain stressor of strained-Ge transistors2018

    • Author(s)
      J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57 Issue: 12 Pages: 121303-121303

    • DOI

      10.7567/jjap.57.121303

    • NAID

      210000149846

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Dopant behavior in heavily doped polycrystalline Ge1-xSnx layers prepared with pulsed laser annealing in water2018

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57 Issue: 4S Pages: 04FJ02-04FJ02

    • DOI

      10.7567/jjap.57.04fj02

    • NAID

      210000148950

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-17H04919, KAKENHI-PROJECT-16J10846
  • [Journal Article] Epitaxial growth of heavily doped n+-Ge layers using metal-organic chemical vapor deposition with in situ phosphorus doping2018

    • Author(s)
      S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 645 Pages: 57-63

    • DOI

      10.1016/j.tsf.2017.10.013

    • NAID

      120006473524

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si2018

    • Author(s)
      S. Gupta, Y. Shimura, O. Richard, B. Douhard, E. Simoen, H. Bender, O. Nakatsuka, S. Zaima, R. Loo, and M. Heyns
    • Journal Title

      Appl. Phys. Lett.

      Volume: 113 Issue: 19 Pages: 192103-192103

    • DOI

      10.1063/1.5048683

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] A New Application of Ge1-xSnx: Thermoelectric Materials2018

    • Author(s)
      M. Kurosawa, Y. Imai, T. Iwahashi, K. Takahashi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      ECS Trans. 2018

      Volume: 86 Issue: 7 Pages: 321-328

    • DOI

      10.1149/08607.0321ecst

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-17H04919
  • [Journal Article] Alleviation of Fermi level pinning at metal/n-Ge interface with lattice-matched Si x Ge1? x ? y Sn y ternary alloy interlayer on Ge2018

    • Author(s)
      Suzuki Akihiro、Nakatsuka Osamu、Sakashita Mitsuo、Zaima Shigeaki
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 6 Pages: 060304-060304

    • DOI

      10.7567/jjap.57.060304

    • NAID

      210000149097

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-15H03565, KAKENHI-PROJECT-26220605
  • [Journal Article] Formation of epitaxial Hf digermanide/Ge(001) contact and its crystalline properties2018

    • Author(s)
      O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57 Issue: 7S2 Pages: 07MA05-07MA05

    • DOI

      10.7567/jjap.57.07ma05

    • NAID

      210000149378

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Optoelectronic properties of high-Si-content-Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny double heterostructure2018

    • Author(s)
      M. Fukuda, D. Rainko, M. Sakashita, M. Kurosawa, D. Buca, O. Nakatsuka, and S. Zaima
    • Journal Title

      Semicond. Sci. Tech.

      Volume: 33 Issue: 12 Pages: 124018-124018

    • DOI

      10.1088/1361-6641/aaebb5

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] High n-type Sb dopant activation in Ge-rich poly-Ge1-xSnx layers on SiO2 using pulsed laser annealing in flowing water2018

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 112 Issue: 6 Pages: 062104-062104

    • DOI

      10.1063/1.4997369

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-17H04919, KAKENHI-PROJECT-16J10846
  • [Journal Article] Formation and characterization of Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny double heterostructures with strain-controlled Ge1-x-ySixSny layers2017

    • Author(s)
      M. Fukuda, T. Yamaha, T. Asano, S. Fujinami, Y. Shimura, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 70 Pages: 156-161

    • DOI

      10.1016/j.mssp.2016.10.024

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] In situ phosphorus-doped Ge1-xSnx layers grown using low-temperature metal-organic chemical vapor deposition2017

    • Author(s)
      S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Semicond. Sci. Tech.

      Volume: 32 Issue: 12 Pages: 124001-124001

    • DOI

      10.1088/1361-6641/aa90d2

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Control of Ge1-x-ySixSny layer lattice constant for energy band alignment in Ge1-xSnx/Ge1-x-ySixSny heterostructures2017

    • Author(s)
      M. Fukuda, K. Watanabe, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Journal Title

      Semicond. Sci. Tech.

      Volume: 32 Issue: 10 Pages: 104008-104008

    • DOI

      10.1088/1361-6641/aa80ce

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Modulation of Fermi level pining position at metal/n-Ge interface by semimetal Ge1-xSnx and Sn interlayers2017

    • Author(s)
      A. Suzukia, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Journal Title

      Mater. Sci. Semicond. Proc.

      Volume: 印刷中 Pages: 162-166

    • DOI

      10.1016/j.mssp.2016.12.028

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15H03565, KAKENHI-PROJECT-26220605
  • [Journal Article] Low-temperature crystallization of Ge-rich GeSn layers on Si3N4 substrate2017

    • Author(s)
      I. Yoshikawa, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 70 Pages: 151-155

    • DOI

      10.1016/j.mssp.2016.12.038

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] 金属/Ge接合へのSixGe1-x-ySny 界面層導入がショットキー障壁高さに及ぼす効果2017

    • Author(s)
      鈴木陽洋, 戸田祥太, 中塚理, 坂下満男, 財満鎭明
    • Journal Title

      特別研究会「電子デバイス界面テク ノロジー研究会―材料・プロセス・デバイス特性の物理―」 (第22回)報告書

      Volume: - Pages: 63-66

    • Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz2017

    • Author(s)
      Y. Shimura, T. Asano, T. Yamaha, M. Fukuda, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 70 Pages: 133-138

    • DOI

      10.1016/j.mssp.2016.11.013

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Selective growth of Ge1-xSnx epitaxial layer on patterned SiO2/Si substrate by metal-organic chemical vapor deposition2017

    • Author(s)
      W. Takeuchi, T. Washizu, S. Ike, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57 Issue: 1S Pages: 01AC05-01AC05

    • DOI

      10.7567/jjap.57.01ac05

    • NAID

      210000148543

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Self-organized lattice-matched epitaxy of Si1-xSnx alloys on (001)-oriented Si, Ge, and InP substrates2017

    • Author(s)
      M. Kurosawa, M. Kato, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 111 Issue: 19 Pages: 192106-192106

    • DOI

      10.1063/1.4995812

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] [招待講演] 低温プロセスに向けたマイクロ波加熱処理によるNiGe/Ge接合の形成2017

    • Author(s)
      中塚理, 渡部佳優, 鈴木陽洋, 西義雄, 財満鎭明
    • Journal Title

      信学技報

      Volume: 116 Pages: 11-15

    • Acknowledgement Compliant / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] Selective epitaxial growth of Ge1-xSnx on Si by using metal-organic chemical vapor deposition2017

    • Author(s)
      T. Washizu, S. Ike, Y. Inuzuka, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Journal of Crystal Growth

      Volume: - Pages: 614-619

    • DOI

      10.1016/j.jcrysgro.2016.10.013

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-14J10705, KAKENHI-PROJECT-26220605
  • [Journal Article] Growth and Applications of Si1-xSnx Thin Films2017

    • Author(s)
      M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Journal Title

      ECS Trans. 2017

      Volume: 80 Issue: 4 Pages: 253-258

    • DOI

      10.1149/08004.0253ecst

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Analysis of Microscopic Strain and Crystalline Structure in Ge/Ge1-xSnx Fine Structures By Using Synchrotron X-Ray Microdiffraction2016

    • Author(s)
      S. Ike, O. Nakatsuka, Y. Inuzuka, T. Washizu, W. Takeuchi, Y. Imai, S. Kimura, and S. Zaima
    • Journal Title

      ECS Trans. 2016

      Volume: 75 Issue: 8 Pages: 769-775

    • DOI

      10.1149/07508.0769ecst

    • Peer Reviewed / Acknowledgement Compliant / Open Access / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10705
  • [Journal Article] Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves2016

    • Author(s)
      M. Miura, S. Fujinami, K. Saitoh, N. Tanaka, O. Nakatsuka, and S. Zaima
    • Journal Title

      AMTC Lett.

      Volume: 5 Pages: 46-47

    • DOI

      10.1002/9783527808465.emc2016.6141

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Effect of in situ Sb doping on crystalline and electrical characteristics of n-type Ge1-xSnx epitaxial layer2016

    • Author(s)
      J. Jeon, T. Asano, Y. Shimura, W. Takeuchi, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 55 Issue: 4S Pages: 04EB13-04EB13

    • DOI

      10.7567/jjap.55.04eb13

    • NAID

      120005898483

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-15H03565, KAKENHI-PROJECT-14J10698
  • [Journal Article] 原子層堆積法を用いたGeO2/Ge界面形成および欠陥の堆積温度依存性2016

    • Author(s)
      兼松正行, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Journal Title

      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会研究報告「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)

      Volume: 21 Pages: 5-8

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Evaluation of energy band offset of Si1-xSnx semiconductors by numerical calculation using density functional theory2016

    • Author(s)
      Y. Nagae, M. Kurosawa, M. Araidai, O. Nakatsuka, K. Shiraishi, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 56 Issue: 4S Pages: 04CR10-04CR10

    • DOI

      10.7567/jjap.56.04cr10

    • NAID

      210000147682

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Effect of GeO2 deposition temperature in atomic layer deposition on electrical properties of Ge gate stack2016

    • Author(s)
      M. Kanematsu, S. Shibayama, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 55 Issue: 8S2 Pages: 08PC05-08PC05

    • DOI

      10.7567/jjap.55.08pc05

    • NAID

      210000147000

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Defect and dislocation structures in low-temperature-grown Ge and Ge1-xSnx epitaxial layers on Si(110) substrates2016

    • Author(s)
      S. Kidowaki, T. Asano, Y. Shimura, M. Kurosawa, N. Taoka, O. Nakatsuka, S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 598 Pages: 72-81

    • DOI

      10.1016/j.tsf.2015.11.048

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10698
  • [Journal Article] Ge基板上エピタキシャルGeSn膜の電気的活性な欠陥の評価2016

    • Author(s)
      金田裕一, 兼松正行, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Journal Title

      信学技報 IEICE Technical Report

      Volume: 116 Pages: 37-41

    • Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Density functional study for crystalline structures and electronic properties of Si1-xSnx binary alloys2016

    • Author(s)
      Y. Nagae, M. Kurosawa, S. Shibayama, M. Araidai, M. Sakashita, O. Nakatsuka, K. Shiraishi, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 55 Issue: 8S2 Pages: 08PE04-08PE04

    • DOI

      10.7567/jjap.55.08pe04

    • NAID

      120005898481

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Si1-xSnx半導体のエネルギーバンド構造に関する理論的および実験的分析2016

    • Author(s)
      長江祐樹, 柴山茂久, 黒澤昌志, 洗平昌晃, 中塚理, 白石賢二, 財満鎭明
    • Journal Title

      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会研究報告「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)

      Volume: 21 Pages: 17-20

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Growth of ultra-high Sn content Ge1-xSnx epitaxial layer and its impact on controlling Schottky barrier height at metal/Ge interface2016

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 55 Issue: 4S Pages: 04EB12-04EB12

    • DOI

      10.7567/jjap.55.04eb12

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] Hydrogen-surfactant-mediated epitaxy of Ge1-xSnx layer and its effects on crystalline quality and photoluminescence property2016

    • Author(s)
      O. Nakatsuka, S. Fujinami, T. Asano, T. Koyama, M. Kurosawa, M. Sakashita, H. Kishida, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 56 Issue: 1S Pages: 01AB05-01AB05

    • DOI

      10.7567/jjap.56.01ab05

    • NAID

      210000147365

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Characterization of crystallinity of Ge1-xSnx epitaxial layers grown using metal-organic chemical vapor deposition2016

    • Author(s)
      Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, O. Nakatsuka, S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 602 Pages: 7-12

    • DOI

      10.1016/j.tsf.2015.10.043

    • Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10698, KAKENHI-PROJECT-14J10705
  • [Journal Article] Characterization of Shallow-and Deep-Level Defects in Undoped Ge1-xSnx Epitaxial Layers by Electrical Measurements2016

    • Author(s)
      W. Takeuchi, T. Asano, Y. Inuzuka, M. Sakashita, O. Nakatsuka and S. Zaima
    • Journal Title

      ECS Journal of Solid State Science and Technology

      Volume: 5 Issue: 4 Pages: 3082-3086

    • DOI

      10.1149/2.0151604jss

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10698
  • [Journal Article] Sn系IV族半導体混晶薄膜の成長と物性評価2016

    • Author(s)
      志村洋介, 竹内和歌奈, 坂下満男, 黒澤昌志, 中塚理, 財満鎭明
    • Journal Title

      信学技報 IEICE Technical Report

      Volume: 116 Pages: 447-459

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] 界面エネルギー制御による絶縁膜上GeSn薄膜の低温結晶成長2016

    • Author(s)
      吉川勲, 黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Journal Title

      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会研究報告「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)

      Volume: 21 Pages: 21-24

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Low thermal budget n-type doping into Ge(001) surface using ultraviolet laser irradiation in phosphoric acid solution2016

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, W. Takeuchi, O. Nakatsuka and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 108 Issue: 5 Pages: 052104-052104

    • DOI

      10.1063/1.4941236

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Experimental observation of type-I energy band alignment in lattice-matched Ge1-x-ySixSny/Ge heterostructures2016

    • Author(s)
      T. Yamaha, S. Shibayama, T. Asano, K. Kato, M. Sakashita, W. Takeuchi, O. Nakatsuka and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 108 Issue: 6 Pages: 061909-061909

    • DOI

      10.1063/1.4941991

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-15J10995, KAKENHI-PROJECT-15J11163, KAKENHI-PROJECT-14J10698
  • [Journal Article] Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects2016

    • Author(s)
      S. Ike, E. Simoen, Y. Shimura, A. Hikavyy, W. Vandervorst, R. Loo, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 55 Issue: 4S Pages: 1-5

    • DOI

      10.7567/jjap.55.04ej11

    • NAID

      210000146374

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10705
  • [Journal Article] 金属/Ge界面への超高Sn組成SnxGe1-x層導入による界面電気伝導特性の制御2015

    • Author(s)
      鈴木陽洋, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Journal Title

      信学技報

      Volume: 115 Pages: 57-61

    • Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] 高Sn組成SiSnの形成とバンド構造 -直接遷移構造化を目指して-2015

    • Author(s)
      黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Journal Title

      信学技報 IEICE Technical Report

      Volume: 115 Pages: 35-37

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Mobility Behavior of Polycrystalline Si<sub>1-<i>x</i>-<i>y</i></sub>Ge<sub><i>x</i></sub>Sn<sub><i>y</i></sub> Grown on Insulators2015

    • Author(s)
      T. Ohmura, T. Yamaha, M. Kurosawa, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Transactions of the Materials Research Society of Japan

      Volume: 40 Issue: 4 Pages: 351-354

    • DOI

      10.14723/tmrsj.40.351

    • NAID

      130005113361

    • ISSN
      1382-3469, 2188-1650
    • Language
      English
    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-15J11163
  • [Journal Article] Characterization of locally strained Ge1-xSnx/Ge fine structures by synchrotron X-ray microdiffraction2015

    • Author(s)
      S. Ike, O. Nakatsuka, Y. Moriyama, M. Kurosawa, N. Taoka, Y. Imai, S. Kimura, T. Tezuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 106 Issue: 18 Pages: 182104-182104

    • DOI

      10.1063/1.4921010

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10705
  • [Journal Article] Reduction of Schottky barrier height at metal/n-Ge interface by introducing an ultra-high Sn content Ge1-xSnx interlayer2015

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 107 Issue: 21

    • DOI

      10.1063/1.4936275

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-15H03565, KAKENHI-PROJECT-15J10995
  • [Journal Article] Epitaxial Ge1-xSnx Layers Grown by Metal-Organic Chemical Vapor Deposition Using Tertiary-butyl-germane and Tri-butyl-vinyl-tin2015

    • Author(s)
      Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, N. Taoka, O. Nakatsuka and S. Zaima
    • Journal Title

      ECS Solid State Letters

      Volume: 4 Issue: 8 Pages: 59-61

    • DOI

      10.1149/2.0041508ssl

    • Peer Reviewed / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26870261, KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-14J10698, KAKENHI-PROJECT-14J10705
  • [Journal Article] Growth and applications of GeSn-related group-IV semiconductor materials2015

    • Author(s)
      S. Zaima, O. Nakatsuka, N. Taoka, M. Kurosawa, W. Takeuchi and M. Sakashita
    • Journal Title

      Science and Technology of Advanced Materials

      Volume: 16 Issue: 4 Pages: 043502-043502

    • DOI

      10.1088/1468-6996/16/4/043502

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Near-infrared light absorption by polycrystalline SiSn alloys grown on insulating layers2015

    • Author(s)
      M. Kurosawa, M. Kato, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 106 Issue: 17 Pages: 171908-171908

    • DOI

      10.1063/1.4919451

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Non-uniform depth distributions of Sn concentration induced by Sn migration and desorption during GeSnSi layer formation2015

    • Author(s)
      N. Taoka, T. Asano, T. Yamaha, T. Terashima, O. Nakatsuka, I. Costina, P. Zaumseil, G. Capellini, S. Zaima, and T. Schroeder
    • Journal Title

      Appl. Phys. Lett.

      Volume: 106 Issue: 6 Pages: 061107-061107

    • DOI

      10.1063/1.4908121

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-14J10698, KAKENHI-PROJECT-26220605
  • [Journal Article] Influence of Interface Structure on Electrical Properties of NiGe/Ge Contacts2015

    • Author(s)
      Y. Deng, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 54 Issue: 5S Pages: 05EA01-05EA01

    • DOI

      10.7567/jjap.54.05ea01

    • NAID

      210000145166

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Journal Article] Effect of Sn on crystallinity and electronic property of low temperature grown polycrystalline-Si1-x-yGexSny layers on SiO22015

    • Author(s)
      T. Yamaha, M. Kurosawa, T. Ohmura, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Solid State Electronics

      Volume: 110 Pages: 54-58

    • DOI

      10.1016/j.sse.2015.01.005

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-12J04434, KAKENHI-PROJECT-26220605
  • [Journal Article] Formation of chemically stable GeO2 on the Ge surface with pulsed metal-organic chemical vapor deposition2015

    • Author(s)
      S. Shibayama, T. Yoshida, K. Kimihiko, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Applied Physics Letters

      Volume: 106 Issue: 6 Pages: 061107-061107

    • DOI

      10.1063/1.4908066

    • Peer Reviewed / Acknowledgement Compliant
    • Data Source
      KAKENHI-PROJECT-13J10462, KAKENHI-PROJECT-26220605
  • [Journal Article] Influence of Interface Structure on Electrical Properties of NiGe/Ge Contacts2015

    • Author(s)
      Y. Deng, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 54

    • NAID

      210000145166

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Epitaxial growth and crystalline properties of Ge1-x-ySixSny on Ge(001) substrates2015

    • Author(s)
      T. Asano, T. Terashima, T. Yamaha, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 110 Pages: 49-53

    • DOI

      10.1016/j.sse.2015.01.006

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Challenges of Energy Band Engineering with New Sn-Related Group IV Semiconductor Materials for Future Integrated Circuits2015

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Yamaha, T. Asano, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Journal Title

      ECS Trans. 2015

      Volume: 69 Issue: 10 Pages: 89-98

    • DOI

      10.1149/06910.0089ecst

    • Peer Reviewed / Acknowledgement Compliant / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605, KAKENHI-PROJECT-15J11163, KAKENHI-PROJECT-14J10698, KAKENHI-PROJECT-14J10705
  • [Journal Article] High hole mobility tin-doped polycrystalline germanium layers formed on insulating substrates by low-temperature solid-phase crystallization2015

    • Author(s)
      W. Takeuchi, N. Taoka, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: 107 Issue: 2 Pages: 022103-022103

    • DOI

      10.1063/1.4926507

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26870261, KAKENHI-PROJECT-26220605
  • [Journal Article] Ge1-xSnxエピタキシャル層中の欠陥へ及ぼす熱処理の効果2015

    • Author(s)
      浅野孝典, 柴山茂久, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Journal Title

      信学技報 IEICE Technical Report

      Volume: 115 Pages: 63-68

    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Growth of Si1-x-ySnxCy ternary alloy layer on Si(001) substrate and characterization of its crystalline properties2015

    • Author(s)
      T. Yamaha, M. Kurosawa, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 54 Issue: 8S1 Pages: 08KA11-08KA11

    • DOI

      10.7567/jjap.54.08ka11

    • NAID

      210000145540

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Journal Article] Stabilized formation of tetragonal ZrO2 thin film with high permittivity2014

    • Author(s)
      K. Kato, T. Saito, S. Shibayama, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: VOL. 30 Pages: 192-196

    • DOI

      10.1016/j.tsf.2014.01.031

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] 固溶限を超えるSn組成を有するGe1-xSnx層中におけるSn原子の熱安定性2014

    • Author(s)
      加藤 公彦, 浅野 孝典, 田岡 紀之, 坂下 満男, 竹内 和歌奈, 中塚 理, 財満 鎭明
    • Journal Title

      特別研究会「ゲートスタック研究会―材料. プロセス・評価の物理―」(第19回研究報告会)

      Pages: 37-40

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] 低界面準位密度を有するGe MOS構造を実現するGe表面の酸化条件2014

    • Author(s)
      柴山 茂久, 加藤 公彦, 坂下 満男, 竹内 和歌奈, 田岡 紀之, 中塚 理, 財満 鎭明
    • Journal Title

      特別研究会「ゲートスタック研究会―材料・プロセス・評価の物理―」(第19回研究報告会)

      Pages: 13-16

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Defects Induced by Reactive Ion Etching in Ge Substrate2014

    • Author(s)
      Kusumandari, N. Taoka, W. Takeuchi, M. Sakashita, O. Nakatsuka, S. Zaima
    • Journal Title

      Advanced Materials Research

      Volume: VOL. 896 Pages: 245-248

    • DOI

      10.4028/www.scientific.net/amr.896.241

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Reduction of Schottky barrier height for n-type Ge contact by using Sn electrode2014

    • Author(s)
      A. Suzuki, S. Asaba, J. Yokoi, K. Kato, M. Kurosawa, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: VOL. 53 Issue: 4S Pages: 04EA06-04EA06

    • DOI

      10.7567/jjap.53.04ea06

    • NAID

      210000143548

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Large grain growth of Ge-rich Gel-x Snx (x=0.02) on insulating surfaces using pulsed laser annealing in flowing water2014

    • Author(s)
      M. Kurosawa, N. Taoka, H. Ikenoue, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: VOL. 104 Issue: 6 Pages: 61901-61901

    • DOI

      10.1063/1.4864627

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Importance of Control of Oxidant Partial Pressure on Structural and Electrical Properties of Pr-oxide Films2014

    • Author(s)
      K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 30 Pages: 276-281

    • DOI

      10.1016/j.tsf.2013.10.088

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] MOCVD法により形成した極薄GeO2を用いたAl203/GeOx/Ge構造の電気的特性および構造評価2014

    • Author(s)
      吉田 鉄兵, 加藤 公彦, 柴山 茂久, 坂下 満男, 田岡 紀之, 竹内 和歌奈, 中塚 理, 財満 鎭明
    • Journal Title

      特別研究会rゲートスタック研究会―材料・プロセス・評価の物理―」(第19回研究報告会)

      Pages: 131-134

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Impacts of AlGeO formation by post thermal oxidation of Al203/Ge structure on interfacial properties2014

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: VOL. 30 Pages: 282-287

    • DOI

      10.1016/j.tsf.2013.10.084

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Development of epitaxial growth technology for Ge_<1-x>Sn_x alloy and study of its properties for Ge nanoelectronics2013

    • Author(s)
      O. Nakatsuka, Y. Shimura, W. Takeuchi, N. Taoka, and S. Zaima
    • Journal Title

      Solid-State Electron

      Volume: 83 Pages: 82-86

    • DOI

      10.1016/j.sse.2013.01.040

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Broad defect depth distribution in germanium substrates induced by CF4 plasma2013

    • Author(s)
      Kusumandari, N. Taoka, W. Takeuchi, M. Fukudome, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: VOL. 103 Issue: 3 Pages: 33511-33511

    • DOI

      10.1063/1.4815925

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] "Liquid-Sn-driven lateral growth of poly-GeSn on insulator assisted by surface oxide layer2013

    • Author(s)
      M. Kurosawa, N. Taoka, M. Sakashita, O. Nakatsuka, M. Miyao, and S. Zaima
    • Journal Title

      Appl. Phys. Lett.

      Volume: VOL. 103 Issue: 10 Pages: 101904-101904

    • DOI

      10.1063/1.4820405

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Reduction of Interface States Density Due to Post Oxidation with Formation of AlGeO Layer at Al203/Ge Interface2013

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      ECS Trans.

      Volume: VOL. 58 Issue: 9 Pages: 301-308

    • DOI

      10.1149/05809.0301ecst

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] テ トラエトキシゲルマニウムを用いた極薄Ge酸化膜の形成2013

    • Author(s)
      吉田鉄兵, 加藤公彦, 柴山茂久, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Journal Title

      特別研究会 「ゲートスタック研究会 ─材料・プロセス・評価の物理─」(第18回研究会)

      Pages: 39-42

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Effects of Light Exposure during Plasma Process on Electrical Properties of GeO_2/Ge Structures2013

    • Author(s)
      Kusumandari, Wakana Takeuchi, Kimihiko Kato, Shigehisa Shibayama, Mitsuo Sakashita, Noriyuki Taoka, Osamu Nakatsuka, Shigeaki Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 52 Issue: 1S Pages: 01AC04-01AC04

    • DOI

      10.7567/jjap.52.01ac04

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] Heteroepitaxial Growth of Sn-Related Group-IV Materials on Si Platform for Microelectronic and Optoelectronic Applications : Challenges and Opportunities2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, M. Sakashita, and S. Zaima
    • Journal Title

      ECS Trans

      Volume: 58 Issue: 9 Pages: 149-155

    • DOI

      10.1149/05809.0149ecst

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Al2O3/Ge構造に対する熱酸化機構の解明2013

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Journal Title

      特別研究会 「ゲートスタック研究会 ─材料・プロセス・評価の物理─」(第18回研究会)

      Pages: 39-42

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Understanding of interface structures and reaction mechanisms induced by Ge or GeO diffusion in Al2O3/Ge structure2013

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Journal Title

      Appl. Phys. Lett

      Volume: 103 Issue: 8 Pages: 82114-82114

    • DOI

      10.1063/1.4819127

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Interfacial Reaction Mechanisms in Al_2O_3/Ge Structure by Oxygen Radical2013

    • Author(s)
      Kimihiko Kato, Shigehisa Shibayama, Mitsuo Sakashita, Wakana Takeuchi, Noriyuki Taoka, Osamu Nakatsuka, Shigeaki Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 52 Issue: 4S Pages: 04CA08-04CA08

    • DOI

      10.7567/jjap.52.04ca08

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] Effect of Gate Metal on Chemical Bonding State in Metal/Pr-oxide/Ge Gate Stack Structure2013

    • Author(s)
      Kimihiko Kato, Mitsuo Sakashita, Wakana Takeuchi, Noriyuki Taoka, Osamu Nakatsuka, Shigeaki Zaima
    • Journal Title

      Solid State Electronics

      Volume: 83 Pages: 56-60

    • DOI

      10.1016/j.sse.2013.01.029

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] Pr 酸化膜/Ge構造におけるゲート金属が界面反応に与える影響2013

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Journal Title

      特別研究会 「ゲートスタック研究会 ─材料・プロセス・評価の物理─」(第18回研究会)

      Pages: 39-42

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Effect of Interfacial Reactions in Radical Process on Electrical Properties of Al_2O_3/Ge Gate Stack Structure2013

    • Author(s)
      Kimihiko Kato, Mitsuo Sakashita, Wakana Takeuchi, Osamu Nakatsuka, Shigeaki Zaima
    • Journal Title

      Journal of Physics : Conference Series

      Volume: 417 Pages: 012001-012001

    • DOI

      10.1088/1742-6596/417/1/012001

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] In-situ Ga doping of fully strained Ge1-xSnx heteroepitaxial layers grown on Ge(001) substrates2012

    • Author(s)
      Y. Shimura, S. Takeuchi, O. Nakatsuka, B. Vincent, F. Gencarelli, T. Clarysse, W. Vandervorst, M. Caymax, R. Loo, A. Jensen, D.H. Petersen, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 520 Issue: 8 Pages: 3206-3210

    • DOI

      10.1016/j.tsf.2011.10.084

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Al2O3/Ge構造への酸素熱処理および酸素ラジカル処理による界面反応機構の解明2012

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Journal Title

      信学技報

      Volume: 112 Pages: 27-32

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] ラジカルプロセスによるAl2O3/Ge界面特性の改善2012

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Journal Title

      特別研究会 「ゲートスタック研究会 ─材料・プロセス・評価の物理─」(第17回研究会)

      Volume: なし Pages: 125-128

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Low temperature formation of Si_<1-x-y>Ge_xSn_y-on-insulator structures by using solid-phase mixing of Ge_<1-z>Sn_z/Si-on-insulator substrates2012

    • Author(s)
      O. Nakatsuka, K. Mochizuki, Y. Shimura, T. Yamaha, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 520 Issue: 8 Pages: 3288-3292

    • DOI

      10.1016/j.tsf.2011.10.120

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Growth and Optical Properties of Ge1-xSnx Alloy Thin Films with a High Sn Content2012

    • Author(s)
      S. Zaima, O. Nakatsuka, M. Nakamura, W. Takeuchi, Y. Shimura, and N. Taoka
    • Journal Title

      ECS Trans.

      Volume: 50 Pages: 897-902

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] ゲート電極の還元性がGe基板上Pr酸化膜のPr価数に与える影響2012

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Journal Title

      信学技報

      Volume: 112 Pages: 37-42

    • NAID

      110009588302

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Growth of Ge_<1-x>Sn_x heteroepitaxial layers with very high Sn contents on InP(001) substrates2012

    • Author(s)
      M. Nakamura, Y. Shimura, S. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Thin Solid Films

      Volume: 520 Issue: 8 Pages: 3201-3205

    • DOI

      10.1016/j.tsf.2011.10.153

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Characterization of Damage of Al2O3/Ge Gate Stack Structure Induced with Light Radiation during Plasma Nitridation2012

    • Author(s)
      Kusumandari, W.Takeuchi, K. Kato, S. Shibayama, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 51 Issue: 1S Pages: 01AJ01-01AJ01

    • DOI

      10.1143/jjap.51.01aj01

    • NAID

      210000071710

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Al2O3/Ge に対する酸素熱処理が電気的特性および化学結合状態に与える効果2012

    • Author(s)
      柴山 茂久, 加藤 公彦, 坂下 満男, 竹内 和歌奈, 中塚 理, 財満 鎭明
    • Journal Title

      特別研究会 「ゲートスタック研究会 ─材料・プロセス・評価の物理─」(第17回研究会)

      Volume: なし Pages: 129-132

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Control of Strain Relaxation Behavior of Ge_<1-x>Sn_x Layers, Solid-State Electronics2011

    • Author(s)
      Y.Shimura, S.Takeuchi, N.Tsutsui, O.Nakatsuka, A.Sakai, S.Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Pages: 84-88

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] 電流検出型原子間力顕微鏡を用いた欠陥に起因するPr酸化膜のリーク電流機構の解明2011

    • Author(s)
      足立正樹, 加藤雄三, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Journal Title

      特別研究会研究報告ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)

      Pages: 123-126

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Effect of Pr Valence State on Interfacial Structure and Electrical Properties of Pr-oxide/PrON/Ge Gate Stack Structure2011

    • Author(s)
      K.Kato, M.Sakashita, W.Takeuchi, H.Kondo, O.Nakatsuka, S.Zaima
    • Journal Title

      Jpn.J.Appl.Phys.

      Volume: 50

    • NAID

      210000070253

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Formation of Ni(Ge_<1-x>Sn_x) Layers with Solid-Phase Reaction in Ni/Ge_<1-x>Sn_x/Ge Systems2011

    • Author(s)
      T.Nishimura, Y.Shimura, S.Takeuchi, B.Vincent, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Pages: 46-52

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors2011

    • Author(s)
      B.Vincent, Y.Shimura, S.Takeuchi, T.Nishimura, G.Eneman, A.Firrincieli, J.Demeulemeester, A.Vantomme, T.Clarysse, O.Nakatsuka, S.Zaima, J.Dekoster, M.Caymax, R.Loo
    • Journal Title

      Microelectron.Eng.

      Volume: 88 Pages: 342-346

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Pr酸化膜/PrON/Ge構造におけるPrの化学結合状態が電気的特性に及ぼす影響2011

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Journal Title

      特別研究会研究報告ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)

      Pages: 99-102

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Crystalline orientation dependence of electrical properties of Mn Germanide/Ge(111) and (001) Schottky contacts2011

    • Author(s)
      T.Nishimura, O.Nakatsuka, S.Akimoto, W.Takeuchi, S.Zaima
    • Journal Title

      Microelectron.Eng.

      Volume: 88 Pages: 605-609

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Formation of Ni(Ge1-xSnx) Layers with Solid-Phase Reaction in Ni/Ge1-xSnx/Ge Systems2011

    • Author(s)
      T. Nishimura, Y. Shimura, S. Takeuchi, B. Vincent, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, and S. Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Issue: 1 Pages: 46-52

    • DOI

      10.1016/j.sse.2011.01.025

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy2011

    • Author(s)
      M.Adachi, M.Sakashita, H.Kondo, W.Takeuchi, O.Nakatsuka, S.Zaima
    • Journal Title

      Jpn.J.Appl.Phys.

      Volume: 50

    • NAID

      210000070244

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors2011

    • Author(s)
      B. Vincent, Y. Shimura, S. Takeuchi, T. Nishimura, G. Eneman, A. Firrincieli, J. Demeulemeester, A. Vantomme, T. Clarysse, O. Nakatsuka, S. Zaima, J. Dekoster, M. Caymax, and R. Loo
    • Journal Title

      Microelectron. Eng.

      Volume: 88 Issue: 4 Pages: 342-346

    • DOI

      10.1016/j.mee.2010.10.025

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] GeSn Technology : Impact of Sn on Ge CMOS Applications2011

    • Author(s)
      S. Zaima, O. Nakatsuka, Y. Shimura, S. Takeuchi, B. Vincent, F. Gencarelli, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, M. Caymax, and R. Loo
    • Journal Title

      ECS Trans

      Volume: 41 Issue: 7 Pages: 231-238

    • DOI

      10.1149/1.3633303

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Crystalline orientation dependence of electrical properties of Mn Germanide/Ge(1 1 1) and (0 0 1) Schottky contacts2011

    • Author(s)
      T. Nishimura, O. Nakatsuka, S. Akimoto, W. Takeuchi, and S. Zaima
    • Journal Title

      Microelectron. Eng.

      Volume: 88 Issue: 5 Pages: 605-609

    • DOI

      10.1016/j.mee.2010.08.014

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Al_2O_3界面層およびラジカル窒化法によるHigh-k/Ge界面構造および電気的特性の制御2011

    • Author(s)
      加藤公彦, 京極真也, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Journal Title

      特別研究会研究報告ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)

      Pages: 55-58

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy2011

    • Author(s)
      M. Adachi, M. Sakashita, H. Kondo, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 50 Issue: 4S Pages: 04DA08-04DA08

    • DOI

      10.1143/jjap.50.04da08

    • NAID

      210000070244

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Control of Strain Relaxation Behavior of Ge1-xSnx Layers2011

    • Author(s)
      Y. Shimura, S. Takeuchi, N. Tsutsui, O. Nakatsuka, A. Sakai, and S. Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Issue: 1 Pages: 84-88

    • DOI

      10.1016/j.sse.2011.01.023

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Effect of Pr Valence State on Interfacial Structure and Electrical Properties of Pr oxide/PrON/Ge Gate Stack Structure2011

    • Author(s)
      加藤公彦
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 50 Issue: 4S Pages: 04DA17-04DA17

    • DOI

      10.1143/jjap.50.04da17

    • NAID

      210000070253

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] Molecular beam deposition of Al2O3 on p-Ge(001)/Ge0.95Sn0.05 heterostructure and impact of a Ge-cap interfacial layer2011

    • Author(s)
      C. Merckling, X. Sun, Y. Shimura, A. Franquet, B. Vincent, S. Takeuchi, W. Vandervorst, O. Nakatsuka, S. Zaima, R. Loo, and M. Caymax
    • Journal Title

      Appl. Phys. Lett.

      Volume: 98 Issue: 19

    • DOI

      10.1063/1.3589992

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Pr酸化膜/Si構造へのAl導入による界面反応抑制効果2011

    • Author(s)
      古田和也, 竹内和歌奈, 加藤公彦, 坂下満男, 近藤博基, 中塚理, 財満鎭明
    • Journal Title

      特別研究会研究報告ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)

      Pages: 51-54

    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Ge1-xSnx stressors for strained-Ge CMOS2011

    • Author(s)
      S. Takeuchi, Y. Shimura, T. Nishimura, B. Vincent, G. Eneman, T. Clarysse, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, and S. Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Issue: 1 Pages: 53-57

    • DOI

      10.1016/j.sse.2011.01.022

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Ge_<1-x>Sn_x stressors for strained-Ge CMOS2011

    • Author(s)
      S.Takeuchi, Y.Shimura, T.Nishimura, B.Vincent, G.Eneman, T.Clarysse, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Pages: 53-57

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Control of Interfacial Properties of Al2O3/Ge Gate Stack Structure using Radical Nitridation Technique2011

    • Author(s)
      加藤公彦
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 50 Issue: 10S Pages: 10PE02-10PE02

    • DOI

      10.1143/jjap.50.10pe02

    • NAID

      210000071422

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-11J06058, KAKENHI-PROJECT-22000011
  • [Journal Article] Control of Interfacial Properties of Pr-oxide/Ge Gate Stack Structure by Introduction of Nitrogen2011

    • Author(s)
      K. Kato, H. Kondo, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Journal Title

      Solid-State Electronics

      Volume: 60 Issue: 1 Pages: 70-74

    • DOI

      10.1016/j.sse.2011.01.029

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Journal Article] Formation of Palladium Silicide on Heavily Doped Si (001) Substrates Using Ti Intermediate Laver2010

    • Author(s)
      R.Suryana, O.Nakatsuka, S.Zaima
    • Journal Title

      Jpn.J.Appl.Phys. (掲載決定)

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-21246009
  • [Journal Article] Low temperature growth of Ge_<1-x>Sn_x buffer layers for tensile-strained Ge layers2010

    • Author(s)
      Y.Shimura, N.Tsutsui, O.Nakatsuka, A.Sakai, S.Zaima
    • Journal Title

      Thin Solid Films 518

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Low temperature growth of Ge_<1-x>Sn_x buffer layers for tensile-strained Ge layers2010

    • Author(s)
      Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
    • Journal Title

      Thin Solid Films 518(6)

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Structural change of direct silicon bonding substrates by interfacial oxide out-diffusion annealing2010

    • Author(s)
      T. Kato, Y. Nakamura, J. Kikkawa, A. Sakai, E. Toyoda, K. Izunome, O. Nakatsuka, S. Zaima, Y. Imai, S. Kimura, O. Sakata
    • Journal Title

      Thin Solid Films 518(6)

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Control of Sn Precipitation and Strain Relaxation in Compositionally Step-Graded Ge_<1-x>Sn_x Buffer Layers for Tensile-Strained Ge Layers2009

    • Author(s)
      Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys. 48

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Novel Method to Introduce Uniaxial Tensile Strain in Ge by Microfabrication of Ge/Si_<1-x>Ge_x Structures on Si(001) Substrates2009

    • Author(s)
      T. Mizutani, O. Nakatsuka, A. Sakai, H. Kondo, M. Ogawa, S. Zaima
    • Journal Title

      Solid-State Electronics 53(11)

      Pages: 1198-1201

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Microstructures in directly bonded Sisubstrates2009

    • Author(s)
      Y. Ohara, T. Ueda, A. Sakai, O. Nakatsuka, M. Ogawa, S. Zaima, E. Toyoda, H. Isogai, T. Senda, K. Izunome, H. Tajiri, O. Sakata, S. Kimura, T. Sakata, H. Mori
    • Journal Title

      Solid-State Electronics 53

      Pages: 837-840

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Dependence of Electrical Characteristics on Interfacial Structures of Epitaxial NiSi_2/Si Schottky Contacts Formed from Ni/Ti/Si System2008

    • Author(s)
      O. Nakatsuka, A. Suzuki, S. Akimoto, A. Sakai, M. Ogawa, S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys. 47(4)

      Pages: 2402-2406

    • NAID

      10022551560

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Silicide and germanide technology for contacts and gates in MOSFET applications2008

    • Author(s)
      S. Zaima, O. Nakatsuka, H. Kondo, M. Sakashita, A. Sakai, M. Ogawa
    • Journal Title

      Thin Solid Films 517(1)

      Pages: 80-83

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Scanning Tunneling Microscopy Observation of Initial Growth of Sn and Ge_<1-x>Sn_x Layers on Ge(001) Substrates2008

    • Author(s)
      M. Yamazaki, S. Takeuchi, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
    • Journal Title

      Appl. Surf. Sci 254(19)

      Pages: 6048-60651

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Journal Article] Tensile strained Ge layers on strain-relaxed Ge_<1-x>Sn_x/virtual Ge substrates2008

    • Author(s)
      S.Takeuchi, A.Sakai, O.Nakatsuka, M.Ogawa, and S.Zaima
    • Journal Title

      Thin Solid Films 517(1)

      Pages: 159-162

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Dependence of Electrical Characteristics on Interfacial Structure of Epitaxial NiSi_2/Si Schottky Contacts Formed from Ni/Ti/Si System2008

    • Author(s)
      O. Nakatsuka, A. Suzuki, S. Akimoto, A. Sakai, M. Ogawa, and S. Zaima
    • Journal Title

      Jpn. J. Appl. Phys. 47

      Pages: 2402-2406

    • NAID

      10022551560

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Growth of highly strain-relaxed Ge_<1-x>Sn_x/virtual Ge by a Sn precipitation controlled compositionally step-graded method2008

    • Author(s)
      S.Takeuchi, Y.Shimura, O.Nakatsuka, S.Zaima, M.Ogawa, and A.Sakai
    • Journal Title

      Appl.Phys.Lett. 92

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Silicide and germanide technology for contacts and gates in MOSFET applications2008

    • Author(s)
      S.Zaima, O.Nakatsuka, H.Kondo, M.Sakashita, A.Sakai, M.Ogawa
    • Journal Title

      Thin Solid Films 517

      Pages: 80-83

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Characterization of bonding structures of directly bonded hybrid crystal orientation substrates2008

    • Author(s)
      E. Toyoda, A. Sakai, O. Nakatsuka, H. Isogai, T. Senda, K. Izunome, M. Ogawa, S. Zaima
    • Journal Title

      Thin Solid Films 517(1)

      Pages: 323-326

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Tensile strained Ge layers on strain-relaxed Ge_<1-x>Sn_x/virtual Ge substrates2008

    • Author(s)
      S. Takeuchi, A. Sakai, O. Nakatsuka, M. Ogawa, S. Zaima
    • Journal Title

      Thin Solid Films 517(1)

      Pages: 159-162

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Tensile strained Ge layers on strain-relaxed Ge_<1-x> Sn_x/virtual Ge substrates2008

    • Author(s)
      S.Takeuchi, A.Sakai, O.Nakatsuka, M.Ogawa, S.Zaima
    • Journal Title

      Thin Solid Films 517

      Pages: 159-162

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Growth of highly strain-relaxed Ge_<1-x>Sn_x/virtual Ge by a Sn precipitation controlled compositionally step-graded method2008

    • Author(s)
      S. Takeuchi, Y. Shimura, O. Nakatsuka, S. Zaima, M. Ogawa, A. Sakai
    • Journal Title

      Appl. Phys. Lett. 92

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Scanning Tunneling Microscopy Observation of Initial Growth of Sn and Ge_<1-x>Sn_x Layers on Ge (001) Substrates2008

    • Author(s)
      M. Yamazaki, S. Takeuchi, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
    • Journal Title

      Appl. Surf. Sci. (印刷中)

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Journal Article] Growth of highly strain-relaxed Ge_<1-x> Sn_x/virtual Ge by a Sn precipitation controlled compositionally step-graded method2008

    • Author(s)
      S.Takeuchi, Y.Shimura, O.Nakatsuka, S.Zaima, M.Ogawa, A.Sakai
    • Journal Title

      Appl.Phys.Lett. 92

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] パルスレーザー蒸着法によるGe基板上へのPr酸化膜の作製とその構造及び電気的特性評価2007

    • Author(s)
      鬼頭伸幸, 坂下満男, 酒井朗, 中塚理, 近藤博基, 小川正毅, 財満鎭明
    • Journal Title

      特別研究会研究報告"ゲートスタック研究会 -材料・プロセス・評価の物理-"(第12回研究会)

      Pages: 251-256

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Growth and structure evaluation of strain-relaxed Ge_<1-x>Sn_x buffer layers grown on various types of substrates2007

    • Author(s)
      S. Takeuchi, A. Sakai, K. Yamamoto, O. Nakatsuka, M. Ogawa, S. Zaima
    • Journal Title

      Semicond. Sci. Technol. 22(1)

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Ge(001)表面の酸素エッチングおよび初期酸化過程の原子スケール評価2007

    • Author(s)
      山崎理弘, 若園恭伸, 酒井朗, 中塚理, 竹内正太郎, 小川正毅, 財満鎭明
    • Journal Title

      特別研究会研究報告"ゲートスタック研究会-材料・プロセス・評価の物理-"(第12回研究会)

      Pages: 197-202

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Journal Article] Impact of Pt Incorporation on Thermal Stability of NiGe Layers on Ge (001) Substrates2007

    • Author(s)
      O.Nakatsuka, A.Suzuki, A.Sakai, M.Ogawa, S.Zaima
    • Journal Title

      The 7th International Workshop on Junction Technology (掲載決定済)

    • Data Source
      KAKENHI-PROJECT-18686005
  • [Journal Article] Growth and structure evaluation of strain-relaxed Ge_1-xSn_x buffer layers grown on various types of substrates2007

    • Author(s)
      S.Takeuchi, A.Sakai, K.Yamamoto, O.Nakatsuka, M.Ogawa, S.Zaima
    • Journal Title

      Semiconductor Science and Technology 22 (1)

    • Data Source
      KAKENHI-PROJECT-18063012
  • [Journal Article] Ge(001)基板上NiGe薄膜のPt添加による熱的安定性向上2007

    • Author(s)
      鈴木敦之, 中塚理, 酒井朗, 小川正毅, 財満鎭明
    • Journal Title

      第54回応用物理学関係連合講演会 講演予稿集 第2分冊

      Pages: 902-902

    • Data Source
      KAKENHI-PROJECT-18686005
  • [Journal Article] Scanning Tunneling Microscopy Study on the Reaction of Oxygen with Clean Ge(001) Surfaces2007

    • Author(s)
      A. Sakai, Y. Wakazono, O. Nakatsuka, S. Zaima, and M. Ogawa
    • Journal Title

      ECS Trans 3(7)

      Pages: 1197-1203

    • Peer Reviewed
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Journal Article] Local strain in SiGe/Si heterostructures analyzed by X-ray microdiffraction2006

    • Author(s)
      S.Mochizuki, A.Sakai, N.Taoka, O.Nakatsuka, S.Takeda, S.Kimura, M.Ogawa, S.Zaima
    • Journal Title

      Thin Solid Films 508 (1-2)

      Pages: 128-131

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Control of misfit dislocations in strain-relaxed SiGe buffer layers on SOI substrates2006

    • Author(s)
      N.Taoka, A.Sakai, S.Mochizuki, O.Nakatsuka, M.Ogawa, S.Zaima
    • Journal Title

      Thin Solid Films 508 (1-2)

      Pages: 147-151

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Improvement in NiSi/Si contact properties with C-implantation2005

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, Y.Yasuda, S.Zaima
    • Journal Title

      Microelectronic Engineering 82 (3-4)

      Pages: 479-484

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Growth and characterization of strain-relaxed SiGe buffer layers on Si(001) substrates with pure-edge misfit dislocations2005

    • Author(s)
      N.Taoka, A.Sakai, T.Egawa, O.Nakatsuka, S.Zaima, Y.Yasuda
    • Journal Title

      Materials Science in Semiconductor Processing 8 (1-3)

      Pages: 131-135

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Growth and characterization of strain-relaxed SiGe buffer layers on Si(001) substrates with pure-edge misfit dislocations2005

    • Author(s)
      N.Taoka, A.Sakai, T.Egawa, O.Nakatsuka, S.Zaima, Y.Yasuda
    • Journal Title

      Materials Science in Semiconductor Processing 8(1-3)

      Pages: 131-135

    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Initial growth behaviors of SiGeC in SiGe and C alternate deposition2005

    • Author(s)
      S.Takeuchi, O.Nakatsuka, Y.Wakazono, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Materials Science in Semiconductor Processing 8

      Pages: 5-9

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Pure-edge dislocation network for strain-relaxed SiGe/Si(001) systems2005

    • Author(s)
      A.Sakai, N.Taoka, O.Nakatsuka, S.Zaima, Y.Yasuda
    • Journal Title

      Applied Physics Letters 86

    • NAID

      120000979691

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Initial growth behaviors of SiGeC in SiGe and C alternate deposition2005

    • Author(s)
      S.Takeuchi, O.Nakatsuka, Y.Wakazono, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Materials Science in Semiconductor Processing 8 (1-3)

      Pages: 5-9

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Thermal stability and electrical properties of Ni-silicide on C-incorporated Si2005

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, S.Zaima, J.Murota, Y.Yasuda
    • Journal Title

      Proceedings of Advanced Metallization Conference 2004 (AMC2004)

      Pages: 293-298

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Control of strain and dislocation structures of Si_<1-x>,Ge_x buffer layers2005

    • Author(s)
      N.Taoka, A.Sakai, S.Mochizuki, O.Nakatsuka, M.Ogawa, S.Zaima
    • Journal Title

      Journal of the Japanese Association of Crystal Growth 32

      Pages: 89-98

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Si_<1-x>Ge_xバッファ層の歪緩和および転位構造制御2005

    • Author(s)
      田岡紀之, 酒井朗, 望月省吾, 中塚理, 小川正毅, 財満鎭明
    • Journal Title

      日本結晶成長学会誌 32

      Pages: 89-98

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Thermal stability and electrical properties of Ni-silicide on C-incorporated Si2005

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, S.Zaima, J.Murota, Y.Yasuda
    • Journal Title

      Proceedings of Advanced Metallization Conference 2004 (AMC2004) 293

      Pages: 293-298

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Improvement in NiSi/Si contact properties with C-implantation2005

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, Y.Yasuda, S.Zaima
    • Journal Title

      Microelectronic Engineering 82

      Pages: 479-484

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Dislocation and strain engineering for SiGe buffer layers on Si2005

    • Author(s)
      A.Sakai, S.Mochizuki, N.Taoka, O.Nakatsuka, S.Takeda, S.Kimura, M.Ogawa, S.Zaima
    • Journal Title

      Crystalline Defects and Contamination : Their Impact and Control in Device Manufacturing IV, DECON 2005, Proceedings of the Satellite Symposium to 35th European Solid-State Device Research Conference 2005 2005-10

      Pages: 16-29

    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Improvement in NiSi/Si contact properties with C-implantation2005

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, Y.Yasuda, S.Zaima
    • Journal Title

      Microelectronic Engineering 82(3-4)

      Pages: 479-484

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Influence of C incorporation on the initial growth of epitaxial NiSi_2 on Si(100)2004

    • Author(s)
      E.Okada, O.Nakatsuka, S.Oida, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Applied Surface Science 237 (1-4)

      Pages: 150-155

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] SiおよびSi_<1-x-y>Ge_xC_y上のNiシリサイド形成2004

    • Author(s)
      中塚理, 酒井朗, 財満鎭明, 安田幸夫
    • Journal Title

      電気学会研究会資料(電子材料研究会) EFM-04

      Pages: 25-30

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Influence of C incorporation on the initial growth of epitaxial NiSi_2 on Si(100)2004

    • Author(s)
      E.Okada, O.Nakatsuka, S.Oida, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Applied Surface Science 237(1-4)

      Pages: 150-155

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Influence of C incorporation on the initial growth of epitaxial NiSi_2 on Si(100)2004

    • Author(s)
      E.Okada, O.Nakatsuka, S.Oida, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Applied Surface Science 237

      Pages: 150-155

    • Description
      「研究成果報告書概要(和文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Si及びSi_<1-x-y>Ge_xC_y上のNiシリサイド形成2004

    • Author(s)
      中塚理, 酒井朗, 財満鎭明, 安田幸夫
    • Journal Title

      電気学会研究会資料(電子材料研究会) EFM-04

      Pages: 25-30

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Silicide Formation on Si and Si_<1-x-y>Ge_xC_y2004

    • Author(s)
      O.Nakatsuka, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Reports of DENKI GAKKAI KENKYUUKAI (DENSHI ZAIRYOU KENKYUUKAI) EFM-04

      Pages: 25-30

    • Description
      「研究成果報告書概要(欧文)」より
    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Initial growth behaviors of SiGeC in SiGe and C alternate deposition2004

    • Author(s)
      S.Takeuchi, O.Nakatsuka, Y.Wakazono, A.Sakai, S.Zaima, Y.Yasuda
    • Journal Title

      Materials Science and Semiconductor Processing 8(1-3)

      Pages: 5-9

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Control of Ni/Si interfacial reaction and NiSi technology for ULSI applications

    • Author(s)
      S.Zaima, O.Nakatsuka, A.Sakai, Y.Yasuda
    • Journal Title

      Proceedings of IUMRS International Conference in Asia 2004 (印刷中)

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Journal Article] Local strain in SiGe/Si heterostructures analyzed by X-ray microdiffraction

    • Author(s)
      A.Sakai, S.Mochizuki, N.Taoka, O.Nakatsuka, S.Takeda, S.Kimura, M.Ogawa, S.Zaima
    • Journal Title

      Thin Solid Films (印刷中)

    • Data Source
      KAKENHI-PROJECT-16360005
  • [Journal Article] Thermal stability and electrical properties of Ni-silicide on C-incorporated Si

    • Author(s)
      O.Nakatsuka, K.Okubo, A.Sakai, M.Ogawa, S.Zaima, J.Murota, Y.Yasuda
    • Journal Title

      Proceedings of Advanced Metallization Conference 2004 (AMC2004) (印刷中)

    • Data Source
      KAKENHI-PROJECT-15206004
  • [Patent] 電子素子およびその製造方法2016

    • Inventor(s)
      中塚理, 鈴木陽洋, 戸田祥大, 坂下満男, 財満鎭明
    • Industrial Property Rights Holder
      中塚理, 鈴木陽洋, 戸田祥大, 坂下満男, 財満鎭明
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2016-162977
    • Filing Date
      2016-08-23
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Patent] 電子素子およびその製造方法2016

    • Inventor(s)
      中塚理、鈴木陽洋、戸田祥太、坂下満男、財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2016-162977
    • Filing Date
      2016-08-23
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Patent] MOSキャパシタ及びMOSFET2015

    • Inventor(s)
      坂下、財満、中塚、竹内、柴山、田岡、加藤、吉田
    • Industrial Property Rights Holder
      坂下、財満、中塚、竹内、柴山、田岡、加藤、吉田
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2015-022059
    • Filing Date
      2015-04-06
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Patent] 半導体決勝の製造方法、半導体結晶及び半導体デバイス2014

    • Inventor(s)
      黒澤昌志、中塚理、田岡紀之、坂下満男、財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2014-02-20
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Patent] 半導体結晶、その製造方法、及び多層膜構造体2013

    • Inventor(s)
      黒澤昌志、田岡紀之、坂下満男、中塚理、財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      2013-024605
    • Filing Date
      2013-02-12
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Patent] 多層膜構造体及びその形成方法2012

    • Inventor(s)
      中塚理、財満鎭明、望月健太、志村洋介
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2012-12-10
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Patent] 多層膜構造体及びその形成方法2011

    • Inventor(s)
      中塚理、財満鎭明、望月健太、志村洋介
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Filing Date
      2011-05-23
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Patent] 多層膜構造体の形成方法2008

    • Inventor(s)
      中塚理、酒井朗、小川正毅, (他4名)
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Number
      2008-122891
    • Filing Date
      2008
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Patent] 多層膜構造体の形成方法2007

    • Inventor(s)
      中塚理、酒井朗、小川正毅、財満鎭明、近藤博基、湯川勝規、水谷卓也
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Filing Date
      2007
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Patent] 伸張歪ゲルマニウム薄膜の作製方法、伸張歪ゲルマニウム薄膜、及び多層膜構造体2007

    • Inventor(s)
      竹内正太郎, 酒井朗, 中塚理、ほか2名
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Number
      2007-132189
    • Filing Date
      2007-05-23
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Patent] ジャーマナイド薄膜、ジャーマナイド薄膜の作成方法、ジャーマナイド薄膜を備えたゲルマニウム構造体2007

    • Inventor(s)
      中塚理、酒井朗、鈴木敦之、小川正毅、財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Number
      2007-247138
    • Filing Date
      2007-09-25
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Patent] ジャーマナイド薄膜、ジャーマナイド薄膜の作成方法、ジャーマナイド薄膜を備えたゲルマニウム構造体2007

    • Inventor(s)
      中塚理、酒井朗、鈴木敦之、小川正毅、財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Industrial Property Number
      2007-247138
    • Acquisition Date
      2007-09-25
    • Overseas
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Patent] 伸張歪ゲルマニウム薄膜の作製方法、伸張歪ゲルマニウム薄膜、及び多層膜構造体2007

    • Inventor(s)
      竹内正太郎, 酒井朗, 中塚理, 小川正毅, 財満鎭明
    • Industrial Property Rights Holder
      国立大学法人名古屋大学
    • Filing Date
      2007-05-17
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Patent] 歪緩和ゲルマニウム膜及びその製造方法並びに多層膜構造体2005

    • Inventor(s)
      酒井朗, 湯川勝規, 中塚理, 小川正毅, 財満鎭明
    • Industrial Property Rights Holder
      名古屋大学
    • Industrial Property Number
      2005-355102
    • Filing Date
      2005-12-08
    • Data Source
      KAKENHI-PROJECT-16360005
  • [Presentation] Al/GeSn(111)構造上への熱処理による極薄・高Sn組成GeSn表面偏析2024

    • Author(s)
      柴山茂久, 松本泰河, 大田晃生, 横川凌, 坂下満男, 黒澤昌志, 中塚 理
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第29回)
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] In-situ Sbドーピングによるn型Ge0.75Sn0.25エピタキシャル層の形成2024

    • Author(s)
      柴山茂久, 高木孝明, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      第71回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] In-situ SbドーピングによるInP上n型Ge0.75Sn0.25エピタキシャル膜の形成2024

    • Author(s)
      柴山茂久, 高木孝明, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第29回)
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Al/GeSn(111)構造からの偏析を用いた極薄・高 Sn 組成 GeSn の形成2023

    • Author(s)
      松本泰河, 大田晃生, 横川凌, , 坂下満男, 黒澤昌志, 中塚理, 柴山茂久
    • Organizer
      第10回応用物理学会名古屋大学スチューデントチャプター東海地区学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Al/GeSn(111)エピタキシャル層構造からの偏析による極薄GeSn形成2023

    • Author(s)
      松本泰河, 柴山茂久, 大田晃夫, 横川凌,, 黒澤昌志, 坂下満男, 中塚理
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] スパッタリング法によるInP基板上のGe0.75Sn0.25エピタキシャル成長2023

    • Author(s)
      壁谷汰知, 柴山茂久, 高木孝明, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Heteroepitaxial Growth of High Substitutional Sn-content Ge1-xSnx Layer Lattice-matched on InP Substrate2023

    • Author(s)
      O. Nakatsuka, K. Takagi, S. Shibayama, M. Kurosawa, and M. Sakashita
    • Organizer
      International Conference on Silicon Epitaxy and Heterostructures International SiGe Technology and Device Meeting (ICSI-ISTDM 2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Development of accurate characterization technique of electrical properties in Ge1-xSnx-based group-IV epitaxial layers2023

    • Author(s)
      T. Mori, S. Shibayama, K. Nishizawa, M. Sakashita, M. Kurosawa, and O. Nakatsuka
    • Organizer
      13th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21K18893
  • [Presentation] 高Sn組成Ge1-xSnx(111)エピタキシャル薄膜の高品質形成2023

    • Author(s)
      森俊輔, 柴山茂久, 加藤芳規, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Optoelectronic properties of Ge1-xSnx/high-Si-content SiyGe1-y-zSnz double quantum wells formed by low-temperature MBE growth and post deposition annealing2023

    • Author(s)
      S. Shibayama, S. Zhang, M. Sakashita, M. Kurosawa, and O. Nakatsuka
    • Organizer
      2023 International Conference on Solid State Devices and Materials (SSDM 2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Seed-layer driven solid phase epitaxy of amorphous Ge1-xSnx layers on Si(001) substrates toward in-plane strain control2023

    • Author(s)
      T. Hiraide, M. Kurosawa, S. Shibayama, M. Sakashita, and O. Nakatsuka
    • Organizer
      2023 International Conference on Solid State Devices and Materials (SSDM 2023)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Challenge and new opportunity of Ge1-x-ySixSny/Ge1-xSnx heterostructures for optoelectronic and electronic device applications2023

    • Author(s)
      S. Shibayama, S. Zhang, M. Sakashita, M. Kurosawa, and O. Nakatsuka
    • Organizer
      13th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 固相成長法による Si(001)基板上の伸長歪み Ge1-xSnx薄膜の形成2023

    • Author(s)
      平出達磨, 大岩樹, 柴山茂久, 坂下満男, 中塚理, 黒澤昌志
    • Organizer
      第70回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] スパッタリング法による InP 基板上へのエピタキシャル Ge0.75Sn0.25 形成2023

    • Author(s)
      壁谷汰知, 柴山茂久, 高木孝明, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      第10回応用物理学会名古屋大学スチューデントチャプター東海地区学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Epitaxy and heterostructure of germanium tin-related group-IV alloy semiconductors for future electronic and optoelectronic applications2023

    • Author(s)
      O. Nakatsuka, M. Kurosawa, S. Shibayama, and M. Sakashita
    • Organizer
      2023 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC VS TFT 8)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Heteroepitaxy of Ge1-xSnx with a high Sn content over 25% on InP(001) toward group-IV infrared detector2023

    • Author(s)
      K. Takagi, S. Shibayama, M. Sakashita, M. Kurosawa, and O. Nakatsuka
    • Organizer
      13th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Formation of Ge1-xSnx/SixGe1-x-ySny double quantum wells structure and its photoluminescence mechanism2022

    • Author(s)
      S. Zhang, S. Shibayama, and O. Nakatsuka
    • Organizer
      第69回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Sn-driven self-formation of Ge1-xSnx nanodots on insulator for multi-layered quantum dots structure2022

    • Author(s)
      K. Hashimoto, S. Shibayama, K. Asaka, M. Kurosawa, and O. Nakatsuka
    • Organizer
      The 9th International Symposium on Control of Semiconductor Interfaces (ISCSI-IX)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] InP基板上の超高Sn組成Ge1-xSnxヘテロエピタキシャル層の結晶性改善2022

    • Author(s)
      高木孝明, 柴山茂久, 黒澤昌志, 坂下満男, 中塚理
    • Organizer
      第83回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 熱安定性の高いGe1-xSnx量子ドットの自己形成2022

    • Author(s)
      橋本薫, 柴山茂久, 安坂幸師, 黒澤昌志, 坂下満男, 中塚理
    • Organizer
      第83回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Si(111)上における直接遷移Ge1-xSnxヘテロエピタキシャル層の形成2022

    • Author(s)
      森俊輔, 柴山茂久, 坂下満男, 黒澤昌志, 中塚理
    • Organizer
      第83回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 多層量子ドット構造実現に向けた絶縁体上へのGe1-xSnxナノドットの自己形成2022

    • Author(s)
      橋本薫, 柴山茂久, 安坂幸師, 中塚理
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)「MOSデバイス・メモリ・パワーデバイス高性能化-材料・プロセス技術」
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 量子ドット実現に向けた超高Sn組成GeSnの自己組織化形成2022

    • Author(s)
      橋本薫, 柴山茂久, 安坂幸師, 中塚理
    • Organizer
      第69回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Research and Development of GeSn-related Group-IV Semiconductor Heterostructures for Optoelectronic Applications2022

    • Author(s)
      O. Nakatsuka, S. Shibayama, M. Kurosawa, and M. Sakashita
    • Organizer
      Symposium on Light Emission and Photonics of Group IV Semiconductor Nanostructures (LPGN)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Substrate engineering for strain-controlled high-Sn-content Ge1-xSnx epitaxy2022

    • Author(s)
      O. Nakatsuka, S. Shibayama, M. Kurosawa, and M. Sakashita
    • Organizer
      The 6th Asia-Pacific Conference on Semiconducting Silicides and Related Materials, 2022 (APAC-Silicide 2022)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 極薄GeSiSn/GeSn/GeSiSn二重障壁構造の形成およびその電気的特性2022

    • Author(s)
      柴山茂久, G. R. Suwito, 中塚理
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第27回)
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Formation of non-equilibrium Ge1-xSnx/SixGe1-x-ySny double-quantum wells and its photoluminescence property2022

    • Author(s)
      S. Zhang, S. Shibayama, and O. Nakatsuka
    • Organizer
      14th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials (ISPlasma 2022)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Molecular beam epitaxy of Si1-xSnx layers with 10%-Sn content on Si1-yGey buffers2022

    • Author(s)
      K. Fujimoto, S. Shibayama, M. Sakashita, M. Kurosawa, and O. Nakatsuka
    • Organizer
      2022 International Conference on Solid State Devices and Materials (SSDM 2022)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Si1-xGexバッファ上におけるSi1-xSnx薄膜の結晶成長2022

    • Author(s)
      藤本一彰, 黒澤昌志, 中塚理
    • Organizer
      第69回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] 固相エピタキシャル成長法によるPドープSi1-xSnx薄膜の形成2022

    • Author(s)
      大岩樹, 黒澤昌志, 中塚理
    • Organizer
      第69回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] GaAs基板上におけるSi1-xSnx薄膜の結晶成長2021

    • Author(s)
      藤本一彰, 黒澤昌志, 中塚理
    • Organizer
      第82回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Optoelectronic properties of heterostructures based on pseudo-direct-bandgap transition n+-Ge1-xSnx active layer2021

    • Author(s)
      S. Zhang, and O. Nakatsuka
    • Organizer
      The 2nd International Workshop on Advanced Nanomaterials for Future Electron Devices 2021 (IWAN2021)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] Optoelectronic properties of pseudo-direct transition n+-Ge1-xSnx and heterostructures composed of n+-Ge1-xSnx and n-SiyGe1-y thin layers2021

    • Author(s)
      S. Zhang, M. Sakashita, S. Shibayama, and O. Nakatsuka
    • Organizer
      International Conference on Materials and Systems for Sustainability 2021 (ICMaSS 2021)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-21H01809
  • [Presentation] HfO2-ZrO2系薄膜における反強誘電性の発現過程について2019

    • Author(s)
      柴山茂久, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第66回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 高Si組成Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny二重ヘテロ構造のエネルギーバンド構造および光電特性評価2019

    • Author(s)
      福田雅大, 坂下満男, 柴山茂久, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第24回)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] エピタキシャルHfGe2/Ge(001)界面の形成によるショットキー障壁高さ制御2019

    • Author(s)
      千賀一輝, 中塚理, 坂下満男, 柴山茂久, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第24回)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Strain-relaxed Ge1-x-ySixSny Epitaxial Layer using Ionimplanted Ge Substrate2019

    • Author(s)
      H. Sofue, M. Fukuda, S. Shibayama, O. Nakatsuka, and S. Zaima
    • Organizer
      11th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials/12th International Conference on Plasma-Nano Technology and Science (ISPlasma2019/IC-PLANTS2019)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GaSb(001)基板上に形成したSi1-xSnx薄膜の結晶構造評価2019

    • Author(s)
      丹下龍志, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第24回)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Raman分光法を用いたイオン注入Ge基板表面の結晶損傷評価2019

    • Author(s)
      祖父江秀隆, 福田雅大, 柴山茂久, 中塚理, 財満鎭明
    • Organizer
      第66回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Growth and electronic properties of GeSn-related group-IV alloy semicondcutor thin films2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      2018 International Conference on Solid State Devices and Materials (SSDM 2018)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 熱電特性評価に向けた組成傾斜SixGe1-x細線の形成2018

    • Author(s)
      中田壮哉, 高橋恒太, 西嶋泰樹, 清水智, 角田功, 中塚理, 財満鎭明, 渡邉孝信, 黒澤昌志
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge1-xSnxゲートスタック構造における欠陥の電気的評価2018

    • Author(s)
      金田裕一, 池進一, 兼松正行, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第23回)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Thermoelectric Performance of Polycrystalline Si1-x-yGexSny Ternary Alloy Layer Prepared with Ion Implantation2018

    • Author(s)
      Y. Peng, M. Kurosawa, O. Nakatsuka, L. Miao, J. Gao, and S. Zaima
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Impact of Crystalline Property of SixGe1-x-ySny Ternary Alloy Interlayer on Schottky Barrier Height Engineering of Metal/Ge Contact2018

    • Author(s)
      O. Nakatsuka, A. Suzuki, M. Sakashita, and S. Zaima
    • Organizer
      Advanced Metallization Conference 2018: 28th Asian Session (ADMETA Plus 2018)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] SixGe1-x-ySny三元混晶界面層の結晶物性が金属/Ge界面Schottky障壁高さに及ぼす影響2018

    • Author(s)
      中塚理, 鈴木陽洋, 坂下満男, 財満鎭明
    • Organizer
      Advanced Metallization Conference: Satellite Workshop (ADMETA Satellite Workshop)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Heavily p-type Doping to Si1-xSnx Layers Grown on SOI Substrates2018

    • Author(s)
      Y. Inaishi, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      10th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials/11th International Conference on Plasma-Nano Technology and Science (ISPlasma2018/IC-PLANTS2018)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation and Optoelectronic Characterization of Strain-relaxed Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny Double-heterostructure2018

    • Author(s)
      M. Fukuda, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Thin Film Growth and Characterization of Group-IV Alloy Semiconductors for Future Nanoelectronic Applications2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, and S. Zaima
    • Organizer
      The 9th International Conference on Physics and Its Applications (ICOPIA)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 高Si組成歪緩和Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny二重ヘテロ構造の形成および光電特性評価2018

    • Author(s)
      福田雅大, 坂下満男, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 多結晶Ge1-xSnx薄膜熱電素子の低温形成2018

    • Author(s)
      髙橋恒太, 池上浩, 坂下満男, 中塚理, 財満鎭明, 黒澤昌志
    • Organizer
      第2回フォノンエンジニアリング研究グループ研究会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Low thermal budget fabrication of poly-Ge1-xSnx thin film thermoelectric generator2018

    • Author(s)
      K. Takahashi, H. Ikenoue, M. Sakashita, O. Nakatsuka, S. Zaima, and M. Kurosawa
    • Organizer
      The 2nd Electron Devices Technology and Manufacturing (EDTM 2018)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GaSb基板上におけるSi1-xSnx薄膜の結晶成長2018

    • Author(s)
      丹下龍志, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Nickel Stanogermanide/Heavily Doped n+-Ge1-xSnx Structure with Ultra-Low Contact Resistivity2018

    • Author(s)
      J. Jeon, A. Suzuki, S. Shibayama, O. Nakatsuka, and S. Zaima
    • Organizer
      12th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 単結晶p型Ge0.95Sn0.05薄膜の熱電特性におけるドメインサイズの効果2018

    • Author(s)
      今井志明, 高橋恒太, 内田紀行, 前田辰郎, 中塚理, 財満鎭明, 黒澤昌志
    • Organizer
      第2回フォノンエンジニアリング研究グループ研究会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn-based thin film thermoelectric generators2018

    • Author(s)
      M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Processing & Manufacturing of Advanced Materials Processing, Fabrication, Properties, Applications (THERMEC'2018)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn-related group-IV semiconductor heterostructures for electronic and optoelectronic applications2018

    • Author(s)
      O. Nakatsuka, M. Fukuda, M. Kurosawa, M. Sakashita, and S. Zaima
    • Organizer
      12th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Study of factors to limit increasing Sn content in Ge1-xSnx for MOCVD method2018

    • Author(s)
      Y. Miki, W. Takeuchi, S. Shibayama, O. Nakatsuka, and S. Zaima
    • Organizer
      12th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Ultra-Low Resistance Contact with Nickel Stanogermanide/Heavily Doped n+-Ge1-xSnx Structure2018

    • Author(s)
      J. Jihee, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Organizer
      1st Joint Conference ICSI / ISTDM 2018
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] MOCVD法によるGe1-xSnx薄膜成長におけるSn析出過程2018

    • Author(s)
      三鬼悠輔, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] SiO2上に形成したGe1-xSnx多結晶薄膜の熱電特性評価2018

    • Author(s)
      今井志明, 高橋恒太, 中塚理, 財満鎭明, 黒澤昌志
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Cイオン注入に伴いGe中に形成される結晶欠陥の電気的特性2018

    • Author(s)
      中島啓佑, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第23回)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Engineering electronic properties of GeSn-related group-IV thin films for nanoelectronic applications2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      European Materials Research Society (2018 E-MRS Spring Meeting)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Engineering optoelectronic properties of high-Sn-content GeSn, GeSiSn, and SiSn thin films2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, M. Fukuda, M. Sakashita, W. Takeuchi, and S. Zaima
    • Organizer
      IEEE Photonics Society Summer Topical Meeting Series 2018
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Electrical Conduction Property at Metal/Heavily Sb-doped n-Ge1-xSnx Contact2018

    • Author(s)
      J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Organizer
      第65回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Heterostructure Engineering of GeSn and SiGeSn Group-IV Alloy Semiconductor Layers2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      11th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Heterostructure Engineering of GeSn and SiGeSn Group-IV Alloy Semiconductor Layers2018

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      11th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Electrical Conduction Property at Metal/Heavily Sb-doped n-Ge1-xSnx Contact2018

    • Author(s)
      J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, S. Zaima
    • Organizer
      第65回応用物理学会春季学術講演
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 溶融成長法によるGe1-xSnx細線の形成と電気特性評価2018

    • Author(s)
      高橋恒太, 今井祐太, 西嶋泰樹, 清水智, 黒澤昌志, 角田功, 中塚理, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Optoelectronic Characterization of Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny Double-Heterostructure with High-Si-Content Ge1-x-ySixSny Layer2018

    • Author(s)
      M. Fukuda, D. Rainko, M. Sakashita, M. Kurosawa, D. Buca, O. Nakatsuka, and S. Zaima
    • Organizer
      1st Joint Conference ICSI / ISTDM 2018
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of laterally graded SixGe1-x stripes for thermoelectric generator2018

    • Author(s)
      M. Nakata, K. Takahashi, T. Nishijima, S. Shimizu, I. Tsunoda, O. Nakatsuka, S. Zaima, T. Watanabe, and M. Kurosawa
    • Organizer
      The 3rd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-3)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] イオン注入基板によるGe1-x-ySixSnyエピタキシャル層の歪緩和促進2018

    • Author(s)
      祖父江秀隆, 福田雅大, 中塚理, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Composition and Strain Engineering of New Group-IV Thermoelectric Materials2018

    • Author(s)
      M. Kurosawa, Y. Imai, T. Iwahashi, K. Takahashi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      AiMES 2018 Meeting
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] エピタキシャルHfGe2/Ge接合の形成と結晶構造および電気伝導特性2018

    • Author(s)
      千賀一輝, 中塚理, 鈴木陽洋, 坂下満男, 財満鎭明
    • Organizer
      第79回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] ドーパント種が水中パルスレーザアニールによるGe1-xSnx薄膜への高濃度ドーピングに及ぼす効果2018

    • Author(s)
      髙橋恒太, 黒澤昌志, 池上浩, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第65回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Growth of Ge1-xSnx Layer by Metal-organic Chemical Vapor Deposition Method using Tetrakis Dimethylamino Tin2018

    • Author(s)
      Y. Miki, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      10th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials/11th International Conference on Plasma-Nano Technology and Science (ISPlasma2018/IC-PLANTS2018)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny二重ヘテロ構造の光電特性評価2018

    • Author(s)
      福田雅大, Rainko Denis, 坂下満男, 黒澤昌志, Buca Dan, 中塚理, 財満鎭明
    • Organizer
      第65回応用物理学会春季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Thermal Stability Study of in-situ Sb-Doped n-Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained Ge Transistors2017

    • Author(s)
      J. Jeon, A. Suzuki, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Materials and Systems for Sustainability 2017 (ICMaSS2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Selective Growth of Ge1-xSnx Epitaxial Layer on Patterned Si Substrate using Metal-organic Chemical Vapor Deposition Method2017

    • Author(s)
      T. Washizu, S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      9th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 10th International Conference on Plasma-Nano Technology and Science
    • Place of Presentation
      Kasugai, Japan
    • Year and Date
      2017-03-04
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長法を用いたGe1-xSnx成長におけるSn原料の検討2017

    • Author(s)
      三鬼悠輔, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystalline and electrical properties of epitaxial HfGe2/Ge contact for lowering Schottky barrier height2017

    • Author(s)
      O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
    • Organizer
      Advanced Metallization Conference 2017: 27th Asian Session (ADMETA2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 高濃度SbドーピングGe1-xSnxエピタキシャル層の熱的安定性2017

    • Author(s)
      J. Jeon, 鈴木陽洋, 髙橋恒太, 中塚理, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 新しいIV族多元混晶薄膜の結晶成長とデバイス応用2017

    • Author(s)
      黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      2017年真空・表面科学合同講演会(公益社団法人 日本表面科学会 第37回表面科学学術講演会ならびに一般社団法人 日本真空学会 第58回真空に関する連合講演会)
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 混晶組成および歪制御によるGe1-xSnx/Ge1-x-ySixSnyヘテロ構造のエネルギーバンド構造制御2017

    • Author(s)
      福田雅大, 坂下満男, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Geバッファ層導入によるSi(001)基板上への歪緩和Ge1-x-ySixSny層の形成2017

    • Author(s)
      渡邉千皓, 福田雅大, 坂下満男, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜
    • Year and Date
      2017-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of GeSn and related semiconductor thin films for next generation optoelectronic applications2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      2017 Global Conference on Polymer and Composite Materials (PCM 2017)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Developments of GeSn-related thin-film semiconductors for nanoelectronic and optoelectronic applications2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      Frontiers in Materials Processing Applications, Research and Technology (FiMPart)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Epitaxial growth of n+-Ge1-xSnxlayerswith in situ phosphorus doping using low-temperature metal-organic chemical vapor deposition method2017

    • Author(s)
      S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn and related group-IV alloy thin films for future Si nanoelectronics2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      The Tenth International Conference on High-Performance Ceramics (CICC-10)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 金属/SixGe1-x-ySny/Ge接合の電気伝導特性に対する電極材料の影響2017

    • Author(s)
      鈴木陽洋, 中塚理 , 坂下満男, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Characterization of Defects in Ge1-xSnx Gate Stack Structure2017

    • Author(s)
      Y. Kaneda, S. Ike, M. Kanematsu, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      2017 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY (2017 IWDTF)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Heavy n- and p-type doping for polycrystalline Ge1-xSnx layers using pulsed laser annealing in water2017

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      The 2nd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-2)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained Ge Transistors2017

    • Author(s)
      J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Organizer
      Electron Devices Technology and Manufacturing Conference (EDTM 2017)
    • Place of Presentation
      Toyama, Japan
    • Year and Date
      2017-02-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 低温プロセスに向けたマイクロ波加熱処理によるNiGe/Ge接合の形成2017

    • Author(s)
      中塚理, 渡部佳優, 鈴木陽洋, 西義雄, 財満鎭明
    • Organizer
      応用物理学会 シリコンテクノロジー分科会第198回研究集会
    • Place of Presentation
      東京, 日本
    • Year and Date
      2017-02-06
    • Invited
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Ge1-xSnxゲートスタック構造における欠陥の物性評価2017

    • Author(s)
      金田裕一, 池進一, 兼松正行, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Epitaxial Hf Germanide/Ge Contacts for Schottky Barrier Height Engineering2017

    • Author(s)
      O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
    • Organizer
      17th International Workshop on Junction Technology 2017 (IWJT2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 水中パルスレーザアニールを用いた多結晶Ge1-xSnx層中Sbの高活性化2017

    • Author(s)
      高橋恒太, 黒澤昌志, 池上浩, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2017-01-21
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長法を用いて作製したGe1-xSnxゲートスタック構造の欠陥物性評価2017

    • Author(s)
      金田裕一, 池進一, 兼松正行, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜
    • Year and Date
      2017-03-16
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of lattice constant of Ge1-x-ySixSny layer for energy band engineering in Ge1-xSnx/Ge1-x-ySixSny heterostructure2017

    • Author(s)
      M. Fukuda, K. Watanabe, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn and related group-IV alloy thin films for future Si nanoelectronics2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita and S. Zaima
    • Organizer
      The Tenth International Conference on High-Performance Ceramics (CICC-10)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 高濃度SbドーピングGe1-xSnxエピタキシャル層の熱的安定性2017

    • Author(s)
      J. Jeon, 鈴木陽洋, 髙橋恒太, 中塚理, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Thermal Stability Study of in-situ Sb-Doped n- Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained Ge Transistors2017

    • Author(s)
      J. Jeon, A. Suzuki, O. Nakatsuka and, S. Zaima
    • Organizer
      International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of GeSn and related semiconductor thin films for next generation optoelectronic applications2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      2017 Global Conference on Polymer and Composite Materials (PCM 2017)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 金属/Ge接合へのSixGe1-x-ySny界面層導入がショットキー障壁高さに及ぼす効果2017

    • Author(s)
      鈴木陽洋, 戸田祥太, 中塚理, 坂下満男, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第22回)
    • Place of Presentation
      三島, 日本
    • Year and Date
      2017-01-20
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Alleviation of Fermi level pinning at metal/Ge interface using lattice-matching group-IV ternary alloy interlayer2017

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Toda, M. Sakashita, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Control of Electrical Property at Metal/Ge Interface with Group-IV Alloy Interlayer2017

    • Author(s)
      A. Suzuki, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Organizer
      International Conference on Materials and Systems for Sustainability 2017 (ICMaSS2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Ge結晶中にCイオン注入により形成した電気的活性な欠陥の挙動2017

    • Author(s)
      中島啓佑, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第17回日本表面科学会中部支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of Electrical Property at Metal/Ge Interface with Group-IV Alloy Interlayer2017

    • Author(s)
      A. Suzuki, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Organizer
      International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 歪SOI基板上に形成したSi1-xSnx薄膜への高濃度p型ドーピング2017

    • Author(s)
      稲石優, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Characterization of energy band structure of Si1-x-ySnxCy ternary alloy layers prepared with solid-phase crystallization2017

    • Author(s)
      S. Yano, O. Nakatsuka, C. Lim, M. Sakashita, M. Kurosawa, and S. Zaima
    • Organizer
      29th International Conference on Defects in Semiconductors (ICDS 2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GaドープSi1-xSnx薄膜の結晶成長と電気特性評価2017

    • Author(s)
      稲石優, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜
    • Year and Date
      2017-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Alleviation of Fermi level pinning at metal/Ge interface using lattice-matching group-IV ternary alloy interlayer2017

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Toda, M. Sakashita, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained Ge Transistors2017

    • Author(s)
      J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Organizer
      Electron Devices Technology and Manufacturing Conference (EDTM 2017)
    • Place of Presentation
      Toyama, Japan
    • Year and Date
      2017-03-01
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 水中パルスレーザアニール法により形成した高濃度ドープp型/n型多結晶Ge1-xSnx薄膜の熱電特性2017

    • Author(s)
      高橋恒太, 池上浩, 坂下満男, 中塚理, 財満鎭明, 黒澤昌志
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn系IV族混晶薄膜の結晶成長および物性制御技術2017

    • Author(s)
      中塚理
    • Organizer
      (公財)科学技術交流財団 第5回「次世代デバイス実現に向けた先端二次元物質の物理と化学」研究会
    • Invited
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Dopants behavior in polycrystallization of heavily doped Ge1-xSnx layer using pulsed laser annealing in water2017

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      2017 International Conference on Solid State Devices and Materials (SSDM 2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 水中パルスレーザアニールを用いた多結晶Ge1-xSnxへの高濃度ドーピング2017

    • Author(s)
      高橋恒太, 黒澤昌志, 池上浩, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      パシフィコ横浜
    • Year and Date
      2017-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] In situ phosphorus doping of Ge and Ge1-xSnx epitaxial layers by low-temperature metal-organic chemical vapor deposition2017

    • Author(s)
      S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar Atomically Controlled Processing for Ultralarge Scale Integration
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2017-02-13
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Numerical calculation of energy band offset of Si1-xSnx by density functional calculation2017

    • Author(s)
      Y. Nagae, M. Kurosawa, M. Araidai, O. Nakatsuka, K. Shiraishi, and S. Zaima
    • Organizer
      The 2nd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-2)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystal growth of GeSn-based materials and its application for thin-film thermoelectric generators2017

    • Author(s)
      M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      The 2017 Global Research Efforts on Energy and Nanomaterials (GREEN 2017)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Solid phase crystallization of Ge0.98Sn0.02 layers on various insulating substrates2017

    • Author(s)
      I. Yoshikawa, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar Atomically Controlled Processing for Ultralarge Scale Integration
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2017-02-13
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Characterization of Crystallinity and Energy Band Alignment of Ge1-xSnx/Ge1-x-ySixSny Heterostructure2017

    • Author(s)
      M. Fukuda, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of heavily Sb and Ga doped poly-Ge1-xSnx layers on insulator using pulsed laser annealing in water2017

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長法を用いたパターンSiO2/Si基板上Ge1-xSnxエピタキシャル層の選択成長2017

    • Author(s)
      竹内和歌奈, 鷲津智也, 池進一, 中塚理, 財満鎭明
    • Organizer
      第17回日本表面科学会中部支部 学術講演会
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 金属/SixGe1-x-ySny/Ge接合の電気伝導特性に対する電極材料の影響2017

    • Author(s)
      鈴木陽洋, 中塚理 , 坂下満男, 財満鎭明
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Research and development of GeSn-related thin-film semiconductors for nanoelectronic and optoelectronic applications2017

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      Frontiers in Materials Processing Applications, Research and Technology (FiMPART 2017)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Solid phase epitaxy of Si1-xSnx layers on various substrates2017

    • Author(s)
      M. Kurosawa, M. Kato, K. Takahashi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of GeSn-Related Group-IV Semiconductor Thin Films for Future Si Nanoelectronic Applications2017

    • Author(s)
      S. Zaima, O. Nakatsuka, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Organizer
      the 4th International Symposium on Hybrid Materials and Processing (HyMaP 2017)
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Influence of atomic layer deposition temperature of GeO2 layer on electrical properties of Ge and Ge1-xSnx gate stack2017

    • Author(s)
      Y. Kaneda, M. Kanematsu, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar Atomically Controlled Processing for Ultralarge Scale Integration
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2017-02-13
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of GeSn layer sandwiched with strain-controlled GeSiSn layers2016

    • Author(s)
      M. Fukuda, T. Yamaha, T. Asano, S. Fujinami, Y. Shimura, M. Kurosawa, O. Nakatsuka and S. Zaima
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2016-01-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of GeSn thin film technology for electronic and optoelectronic applications2016

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, Y. Shimura, M. Sakashita, and S. Zaima
    • Organizer
      2016 Energy Materials Nanotechnology (EMN) Summer Meeting and Photodetectors Meeting
    • Place of Presentation
      Mexico
    • Year and Date
      2016-06-07
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Si1-xSnx半導体のエネルギーバンド構造に関する理論的および実験的分析2016

    • Author(s)
      長江祐樹, 柴山茂久, 黒澤昌志, 洗平昌晃, 中塚理, 白石賢二, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2016-01-22
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 金属/Ge界面へのIV 族混晶半導体層挿入によるショットキー障壁高さの低減2016

    • Author(s)
      鈴木陽洋, 中塚理, 戸田祥太, 坂下満男, 財満鎭明
    • Organizer
      2016年真空・表面科学合同講演会(公益社団法人 日本表面科学会 第36回表面科学学術講演会ならびに一般社団法人 日本真空学会 第57回真空に関する連合講演会)
    • Place of Presentation
      名古屋、日本
    • Year and Date
      2016-11-29
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Characterization of Deep-Level Defects in Ge1-xSnx Epitaxial Layers using Deep Level Transient Spectroscopy2016

    • Author(s)
      W. Takeuchi, Y. Inuzuka, N. Taoka, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      The 7th International Symposium on Advanced Science and Technology of Silicon Materials (7th JSPS Silicon Symposium)
    • Place of Presentation
      Hawaii, USA
    • Year and Date
      2016-11-22
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Heavy Sb-doping for poly-GeSn on insulator using pulsed laser annealing in water2016

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      2016 International Conference on Solid State Devices and Materials (SSDM 2016)
    • Place of Presentation
      Tsukuba, Japan
    • Year and Date
      2016-09-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Microwave Annealing for Low-Thermal Budget Process of Nickel Monogermanide/Germanium Contact Formation2016

    • Author(s)
      O. Nakatsuka, Y. Watanabe”, A. Suzuki, Y. Nishi, and S. Zaima
    • Organizer
      Advanced Metallization Conference 2016: 26th Asian Session (ADMETA Plus 2016)
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2016-10-19
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Impact of SixGe1-x-ySny interlayer on reduction in Schottky barrier height of metal/n-Ge contact2016

    • Author(s)
      A. Suzuki, S. Toda, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2016)
    • Place of Presentation
      Tsukuba, Japan
    • Year and Date
      2016-09-26
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Low Temperature Crystallization of SiSn Binary Alloys2016

    • Author(s)
      M. Kurosawa, M. Kato, O. Nakatsuka, and S. Zaima
    • Organizer
      The 1st International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-1)
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2016-10-17
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSiSn/GeSn/GeSiSn積層構造の形成および結晶物性の評価2016

    • Author(s)
      福田雅大, 山羽隆, 浅野孝典, 藤浪俊介, 志村洋介, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第16回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2016-12-17
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of Schottky barrier height of metal/Ge contact using group-IV alloy interlayers2016

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Toda, M. Sakashita, and S. Zaima
    • Organizer
      JSPS Meeting 2016: Workshop on "Atomically Controlled Processing for Ultra-large Scale Integration"
    • Place of Presentation
      Julich, Germany
    • Year and Date
      2016-11-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Growth of Si1-xSnx heteroepitaxial layers with very high Sn contents on InP(001) substrates2016

    • Author(s)
      M. Kurosawa, M. Kato, O. Nakatsuka, and S. Zaima
    • Organizer
      JSPS Meeting 2016 : Workshop on Atomically Controlled Processing for Ultra-large Scale Integration
    • Place of Presentation
      Forschungszentrum J&uuml;lich, Germany
    • Year and Date
      2016-11-24
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Low-Temperature Selective Epitaxial Growth of Ge on Si by using Metal Organic Chemical Vapor Deposition2016

    • Author(s)
      T. Washizu, S. Ike, Y. Inuzuka, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-08-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge基板上エピタキシャルGeSn膜の電気的活性な欠陥の評価2016

    • Author(s)
      金田裕一, 兼松正行, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      キャンパス・イノベーションセンター東京
    • Year and Date
      2016-06-29
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSiSn/GeSn/GeSiSn二重ヘテロ構造の結晶性に対するGeSiSn層の歪の影響2016

    • Author(s)
      福田雅大, 山羽隆, 浅野孝典, 藤浪俊介, 志村洋介, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Challenges in Engineering Materials Properties for GeSn Nanoelectronics2016

    • Author(s)
      S. Zaima, O. Nakatsuka, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Organizer
      The 2016 European Materials Research Society (E-MRS) Fall Meeting
    • Place of Presentation
      Warsaw, Poland
    • Year and Date
      2016-09-19
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of heavily Sb doped poly-Ge1-xSnx layer using pulsed laser annealing in water2016

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      JSPS Meeting 2016: Workshop on Atomically Controlled Processing for Ultra-large Scale Integration
    • Place of Presentation
      Forschungszentrum J&uuml;lich, Germany
    • Year and Date
      2016-11-25
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 界面エネルギー制御による絶縁膜上GeSn薄膜の低温結晶成長2016

    • Author(s)
      吉川勲, 黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2016-01-22
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phse Retrieval of Electron Rocking Curves2016

    • Author(s)
      M. Miura, S. Fujinami, K. Saitoh, N. Tanaka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 5th International Symposium on Advanced Microscopy and Theoretical Calculations
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-05-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Impact of Atomic Hydrogen Irradiation on Epitaxial Growth of Ge1-xSnx and its Crystalline Property2016

    • Author(s)
      S. Fujinami, T. Asano, T. Koyama, M. Kurosawa, M. Sakashita, O. Nakatsuka, H. Kishida, S. Zaima
    • Organizer
      ISPlasma 2016 / IC-PLANTS 2016
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-03-06
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 原子層堆積法を用いたGeO2/Ge界面形成および欠陥の堆積温度依存性2016

    • Author(s)
      兼松正行, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第21回)
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2016-01-22
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of the Fermi level pinning position at metal/Ge interface by using Ge1-xSnx interlayer2016

    • Author(s)
      A. Suzuki, O. Nakatsuka, M. Sakashita, and S. Zaima
    • Organizer
      7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-06-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] MOCVD法を用いたin situ PドープGe薄膜のエピタキシャル成長2016

    • Author(s)
      池進一, 志村洋介, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Analysis of Microscopic Strain and Crystalline Structure in Ge/Ge1-xSnx Fine Structures By Using Synchrotron X-Ray Microdiffraction2016

    • Author(s)
      S. Ike, O. Nakatsuka, Y. Inuzuka, T. Washizu, W. Takeuchi, Y. Imai, S. Kimura, and S. Zaima
    • Organizer
      Pacific Rim Meeting 2016 Joint The 230th Electrochemical Society Meeting (PRiME 2016/230th ECS Meeting)
    • Place of Presentation
      Hawaii, USA
    • Year and Date
      2016-10-06
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Si1-xSnx 価電子帯端オフセットの第一原理計算2016

    • Author(s)
      長江祐樹, 黒澤昌志, 洗平昌晃, 中塚理, 白石賢二, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟朱鷺メッセ
    • Year and Date
      2016-09-16
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Growth of Heavily Doped n-Ge Epitaxial Layer by In situ Phosphorus-doping with Low-temperature Metal-Organic Chemical Vapor Deposition2016

    • Author(s)
      S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      2016 International Conference on Solid State Devices and Materials (SSDM 2016)
    • Place of Presentation
      Tsukuba, Japan
    • Year and Date
      2016-09-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] MOCVD法を用いたin situ Pドーピングによる高濃度n型Geエピタキシャル成長2016

    • Author(s)
      池進一, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟朱鷺メッセ
    • Year and Date
      2016-09-16
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Growth and applications of GeSn-related group-IV semiconductor materials2016

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Asano, T. Yamaha, S. Ike, A. Suzuki, K. Takahashi, Y. Nagae, M. Kurosawa, W. Takeuchi, Y. Shimura, and M. Sakashita
    • Organizer
      IEEE 2016 Summer Topicals Meeting Series
    • Place of Presentation
      NewPort Beach, USA
    • Year and Date
      2016-07-11
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Effect of local and global strain on thermal stability of Sn in GeSn based film2016

    • Author(s)
      Y. Shimura, T. Asano, T. Yamaha, O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-06-09
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation and Characterization of GeSiSn/GeSn/GeSiSn Double-Heterostructure with Strain-controlled GeSiSn layer2016

    • Author(s)
      M. Fukuda, T. Yamaha, T. Asano, S. Fujinami, Y. Shimura, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-06-08
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves2016

    • Author(s)
      K. Saitoh, M. Miura, N, Tanaka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 16th European Microscopy Congress
    • Place of Presentation
      Lyon, France
    • Year and Date
      2016-08-28
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Direct Measurement of Anisotropic Local Strain in Ge Nanostructures Strained with MOCVD-grown Ge1-xSnx by using Microdiffraction2016

    • Author(s)
      S. Ike, Y. Inuzuka, T. Washizu, W. Takeuchi, Y. Shimura, Y. Imai, O. Nakatsuka, S. Kimura, and S. Zaima
    • Organizer
      7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-06-09
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystalline and Electrical Properties of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers2016

    • Author(s)
      J. Jeon, T. Asano, Y. Shimura, W. Takeuchi, M. Kurosawa, M. Sakashita, O. Nakatsuka and S. Zaima
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2016-01-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Growth and applications of GeSn-related group-IV semiconductor materials2016

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Asano, T. Yamaha, S. Ike, A. Suzuki, K. Takahashi, Y. Nagae, M. Kurosawa, W. Takeuchi, Y. Shimura, and M. Sakashita
    • Organizer
      IEEE 2016 Summer Topicals Meeting Series
    • Place of Presentation
      California, USA
    • Year and Date
      2016-07-11
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Investigation of effects of inner stress with Sn incorporation on energy band of Si1-xSnx using density functional theory and photoelectron spectroscopy2016

    • Author(s)
      Y. Nagae, M. Kurosawa, M. Araidai, O. Nakatsuka, K. Shiraishi, and S. Zaima
    • Organizer
      2016 International Conference on Solid State Devices and Materials (SSDM 2016)
    • Place of Presentation
      Tsukuba, Japan
    • Year and Date
      2016-09-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Sn系IV族半導体混晶薄膜の成長と物性評価2016

    • Author(s)
      志村洋介, 竹内和歌奈, 坂下満男, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会シリコン材料・デバイス研究会(SDM)有機エレクトロニクス研究会(OME)共催
    • Place of Presentation
      沖縄県立博物館・美術館
    • Year and Date
      2016-04-08
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of Schottky barrier height at metal/Ge interface by insertion of Ge1-xSnx layer2016

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2016-01-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Si(001)基板上におけるSi1-xSnx薄膜の固相エピタキシャル成長2016

    • Author(s)
      稲石優, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      2016年真空・表面科学合同講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2016-11-30
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 水中パルスレーザアニールを用いた多結晶GeSnへの高濃度n型ドーピング2016

    • Author(s)
      高橋恒太, 黒澤昌志, 池上浩, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟朱鷺メッセ
    • Year and Date
      2016-09-06
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Phosphorus doping into Ge with low electrical damage by liquid immersion laser doping2016

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, W. Takeuchi, O. Nakatsuka and S. Zaima
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2016-01-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn系IV族半導体薄膜におけるSn導入の制御と効果2016

    • Author(s)
      志村洋介, 池進一, Gencarelli Federica, 竹内和歌奈, 坂下満男, 黒澤昌志, Loo Roger, 中塚理, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟朱鷺メッセ
    • Year and Date
      2016-09-14
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 歪制御によるGeSn系混晶薄膜中Sn原子の熱的安定化2016

    • Author(s)
      志村洋介, 浅野孝典, 山羽隆, 中塚理, 財満鎭明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Interfacial Energy Control for Low-Temperature Crystallization of Ge-rich GeSn Layers on Insulating Substrate2016

    • Author(s)
      I. Yoshikawa, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2016-06-08
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] マイクロ回析法によるMOCVD-Ge1-xSnx/Ge細線構造内部の局所歪量評価2016

    • Author(s)
      犬塚雄貴, 池進一, 鷲津智也, 竹内和歌奈, 志村洋介 ,今井康彦, 木村滋, 中塚理, 財満鎭明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学 大岡山キャンパス
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystalline and Electrical Properties of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers2016

    • Author(s)
      J. Jeon, T. Asano, Y. Shimura, W. Takeuchi, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai, Japan
    • Year and Date
      2016-01-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 金属/n-Ge接合へのSixGe1-x-ySny層挿入によるショットキー障壁高さの低減2016

    • Author(s)
      鈴木陽洋, 戸田祥太, 中塚理, 坂下満男, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      朱鷺メッセ, 新潟, 日本
    • Year and Date
      2016-09-13
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] GeSiSn/GeSn/GeSiSn二重ヘテロ構造形成およびGeSiSn層の歪が結晶性へ与える影響2016

    • Author(s)
      福田雅大, 山羽隆, 浅野孝典, 藤浪俊介, 志村洋介, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第4回応用物理学会スチューデントチャプター東海地区学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2016-10-29
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長によるエピタキシャルGe1-xSnx薄膜の選択成長2016

    • Author(s)
      鷲津智也, 池進一, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟朱鷺メッセ
    • Year and Date
      2016-09-16
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 金属/Ge界面へのGe1-xSnx層挿入によるフェルミレベルピニング位置のシフト2016

    • Author(s)
      鈴木陽洋,中塚理, 坂下満男, 財満鎭明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京
    • Year and Date
      2016-03-19
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Development of polycrystalline Sn-related group-IV semiconductor thin films - Aiming for 3D-IC2015

    • Author(s)
      M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2015)
    • Place of Presentation
      Jeju island, Korea
    • Year and Date
      2015-06-29
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Thermophysical characterizations of Ge1-xSnx epitaxial layers aiming for thermoelectric devices2015

    • Author(s)
      M. Kurosawa, M. Fukuda, K. Takahashi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
    • Place of Presentation
      Montreal, Canada
    • Year and Date
      2015-05-17
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Si1-x-ySnxCy三元混晶薄膜のエピタキシャル成長および結晶性評価2015

    • Author(s)
      山羽隆, 矢野翔太, 髙橋恒太, 黒澤昌志, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Influence of Atomic Layer Deposition Temperature of GeO2 Layer on Electrical Properties of Ge Gate Stack2015

    • Author(s)
      M. Kanematsu, S. Shibayama, M. Sakashita, W. Takeuchi, O. Nakatsuka, S. Zaima
    • Organizer
      2015 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (2015 IWDTF)
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2015-11-02
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 原子層堆積法を用いたGeO2/Ge界面の低温形成と電気的特性評価2015

    • Author(s)
      兼松正行, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Characterization of electrically active defects in epitaxial GeSn/n-Ge junctions2015

    • Author(s)
      W. Takeuchi, Y. Inuzuka, T. Asano, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Si1-xSnx薄膜の固相エピタキシャル成長に与えるSn組成の効果2015

    • Author(s)
      加藤元太, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 超高Sn 組成SnxGe1-xエピタキシャル層の形成および金属/SnxGe1-x/Ge コンタクトの電気伝導特性の制御2015

    • Author(s)
      鈴木陽洋, 中塚理, 柴山茂久, 坂下満男, 竹内和歌奈,黒澤昌志, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会
    • Place of Presentation
      名古屋
    • Year and Date
      2015-11-14
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Influence of in-situ Sb-Doping on Crystalline and Electrical Characteristics of n-type Ge1-xSnx Epitaxial Layer2015

    • Author(s)
      J. Jeon, T. Asano, W. Takeuchi, M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2015)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2015-09-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Crystal growth and energy band engineering of group-IV semiconductor thin films for nanoelectronic applications2015

    • Author(s)
      O. Nakatsuka, M. Kurosawa, W. Takeuchi, Y. Shimura, M. Sakashita, and S. Zaima
    • Organizer
      International Workshop on Advanced Nanomaterials for Future Electron Devices 2015 (IWAN 2015)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystalline and Electrical Properties of Ge1-xSnx Epitaxial Layers with in-situ Sb-Doping2015

    • Author(s)
      全智禧, 浅野孝典, 志村洋介, 竹内和歌奈, 黒澤昌志, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2015(JSAP SCTS 2015)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2015-11-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Ge pn-junction diode by phosphorus doping with liquid immersion laser irradiation2015

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, W. Takeuchi, O. Nakatsuka, S. Zaima
    • Organizer
      15th International Workshop on Junction Technology 2015 (IWJT 2015)
    • Place of Presentation
      Kyoto, Japan
    • Year and Date
      2015-06-11
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystalline and Electrical Properties of Ge1-xSnx Epitaxial Layers with in-situ Sb-Doping2015

    • Author(s)
      全智禧, 浅野孝典, 志村洋介, 竹内和歌奈, 黒澤昌志, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会
    • Place of Presentation
      名古屋
    • Year and Date
      2015-11-14
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny二重ヘテロ接合の形成および結晶性評価2015

    • Author(s)
      福田雅大, 山羽隆, 浅野孝典, 藤浪俊介, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Characterization of Deep-level Defects in Epitaxial Ge1-xSnx/Ge structure2015

    • Author(s)
      W. Takeuchi, T. Asano, Y. Inuzuka, M. Sakashita, O. Nakatsuka and S. Zaima
    • Organizer
      JSPS International Core-to-Core Program Workshop Atomically Controlled Processing for Ultra-large Scale Integration
    • Place of Presentation
      Marseille, France
    • Year and Date
      2015-07-09
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of Schottky Barrier Height at Metal/Ge Interface by SnxGe1-x Interlayer2015

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Control of Electrically Active Defects in Ge1-xSnx Epitaxial Layers2015

    • Author(s)
      T. Asano, S. Shibayama, W. Takeuchi, M. Sakashita, O. Nakatsuka, S. Zaima
    • Organizer
      The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
    • Place of Presentation
      Montreal, Canada
    • Year and Date
      2015-05-17
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystal Growth of GeSn-related Group-IV Thin Films for Integrating on Si Nanoelectronics Platform2015

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Asano, T. Yamaha, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi and M. Sakashita
    • Organizer
      2015 International Conference on Solid State Devices and Materials (SSDM 2015)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2015-09-27
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Influence of in-situ Sb-Doping on Crystalline and Electrical Characteristics of n-type Ge1-xSnx Epitaxial Layer2015

    • Author(s)
      J. Jeon, T. Asano, W. Takeuchi, M. Kurosawa, O. Nakatsuka and S. Zaima
    • Organizer
      2015 International Conference on Solid State Devices and Materials (SSDM 2015)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2015-09-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Evaluation of Energy Band Structure of Si1-xSnx by Density Functional Theory Calculation and Photoelectron Spectroscopy2015

    • Author(s)
      Y. Nagae, S. Shibayama, M. Kurosawa, M. Araidai, M. Sakashita, O. Nakatsuka, K. Shiraishi, S. Zaima
    • Organizer
      2015 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (2015 IWDTF)
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2015-11-02
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Solid Phase Epitaxy of High Sn Content Si1-xSnx layer (x>0.2) on Ge Substrates for Optical Communication Applications2015

    • Author(s)
      M. Kato, M. Kurosawa, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
    • Place of Presentation
      Montreal, Canada
    • Year and Date
      2015-05-17
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Challenges of Energy Band Engineering with New Sn-Related Group IV Semiconductor Materials for Future Integrated Circuits2015

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Yamaha, T. Asano, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Organizer
      The 228th Electrochemical Society Meeting
    • Place of Presentation
      Phoenix, USA
    • Year and Date
      2015-10-11
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Schottky Barrier Engineering by Epitaxial Metal Germanide / Germanium Contacts2015

    • Author(s)
      O. Nakatsuka, Y. Deng, A. Suzuki, M. Sakashita, and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Recent Progress of Silicon Tin Alloys for Advanced Semiconductor Devices2015

    • Author(s)
      M. Kurosawa, O. Nakatsuka, and S. Zaima
    • Organizer
      International Workshop on Advanced Nanomaterials for Future Electron Devices 2015 (IWAN 2015)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-07
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Strain measurement of heteroepitaxial GeSn/Ge with a finFET structure2015

    • Author(s)
      K. Saitoh, K. Doi, N. Tanaka, S. Ike, O. Nakatsuka and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] ナノビーム電子回折法をもちいたGeSn/Ge微細構造の歪み分布解析2015

    • Author(s)
      齋藤晃, 土井健太郎, 池進一, 中塚理,財満鎭明
    • Organizer
      日本顕微鏡学会 第71回学術講演会
    • Place of Presentation
      国立京都国際会館
    • Year and Date
      2015-05-13
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge1-xSnxエピタキシャル層中における欠陥形成に対するSn組成の影響2015

    • Author(s)
      浅野孝典, 柴山茂久, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 高Sn組成SiSnの形成とバンド構造 ~ 直接遷移構造化を目指して ~2015

    • Author(s)
      黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 有機エレクトロニクス研究会(OME), シリコン材料・デバイス研究会(SDM) 共催
    • Place of Presentation
      大濱信泉記念館多目的ホール(沖縄)
    • Year and Date
      2015-04-29
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] X-ray Microdiffraction Characterization of Local Strain Distribution in GeSn/Ge Nanostructures2015

    • Author(s)
      S. Ike, O. Nakatsuka, Y. Moriyama, M. Kurosawa, N. Taoka, Y. Imai, S. Kimura, T. Tezuka and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 密度汎関数法によるSi1-xSnx価電子帯端準位の理論予測および実験的妥当性2015

    • Author(s)
      長江祐樹, 柴山茂久, 黒澤昌志, 洗平昌晃, 中塚理, 白石賢二, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2015(JSAP SCTS 2015)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2015-11-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Effects of in-situ Sb-Doping on Crystalline and Electrical Characteristics of Ge1-xSnx Epitaxial Layer2015

    • Author(s)
      J. Jeon, T. Asano, W. Takeuchi, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋
    • Year and Date
      2015-09-13
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] InP(001)基板上における高Sn組成Si1-xSnx層の固相エピタキシャル成長2015

    • Author(s)
      加藤元太, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第15回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋工業大学
    • Year and Date
      2015-12-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Challenges of Energy Band Engineering with New Sn-Related Group IV Semiconductor Materials for Future Integrated Circuits2015

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Yamaha, T. Asano, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Organizer
      The 228th Electrochemical Society Meeting
    • Place of Presentation
      Phoenix, USA
    • Year and Date
      2015-10-11
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] 有機金属化学気相成長法によるSiおよびSiO2基板上のGe選択成長機構の考察2015

    • Author(s)
      鷲津智也, 犬塚雄貴, 浅野孝典, 池進一, 竹内和歌奈, 志村洋介, 中塚理, 財満鎭明
    • Organizer
      第15回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋工業大学
    • Year and Date
      2015-12-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Electrical Characteristics of Ge pn-junction Diodes Prepared by Using Liquid Immersion Laser Doping2015

    • Author(s)
      K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge基板上への超高Sn組成Ge1-xSnxエピタキシャル層の形成およびGe1-xSnx界面層が金属/Geコンタクトのショットキー障壁高さに及ぼす影響2015

    • Author(s)
      鈴木陽洋, 中塚理, 柴山茂久, 坂下満男, 竹内和歌奈, 黒澤昌志, 財満鎭明
    • Organizer
      第4回結晶工学未来塾
    • Place of Presentation
      東京
    • Year and Date
      2015-10-29
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Calculation of Si1-xSnx Energy Band Structures by using Density Functional Theory Considering Atomic Configuration2015

    • Author(s)
      Y. Nagae, M. Kurosawa, S. Shibayama, O. Nakatsuka, S. Zaima
    • Organizer
      International Symposium on EcoTopia Science 2015 (ISETS '15)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2015-11-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長法を用いたGe薄膜選択成長2015

    • Author(s)
      鷲津智也, 犬塚雄貴, 浅野孝典, 池進一, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 金属/Ge界面への超高Sn組成SnxGe1-x層導入による界面電気伝導特性の制御2015

    • Author(s)
      鈴木陽洋, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      名古屋
    • Year and Date
      2015-06-19
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Characterization of Crystallinity of Ge1-xSnx Epitaxial Layers Grown by using Metal-Organic Chemical Vapor Deposition2015

    • Author(s)
      Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
    • Place of Presentation
      Montreal, Canada
    • Year and Date
      2015-05-17
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Reduction of Schottky barrier height with Sn/Ge contact2015

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Organizer
      JSPS International Workshop Core-to-Core Program Atomically Controlled Processing for Ultra-large Scale Integration
    • Place of Presentation
      Marseille, France
    • Year and Date
      2015-07-09
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] GeSn多結晶膜の移動度に与える下地絶縁膜の効果2015

    • Author(s)
      吉川勲, 黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2015-09-13
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge1-xSnxエピタキシャル層中の欠陥へ及ぼす熱処理の効果2015

    • Author(s)
      浅野孝典, 柴山茂久, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2015-06-19
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] エピタキシャル金属/ゲルマニウム接合の形成による界面電気伝導特性の制御2015

    • Author(s)
      中塚理, 鄧云生, 鈴木陽洋, 坂下満男, 田岡紀之, 財満鎭明
    • Organizer
      応用物理学会 シリコンテクノロジー分科会 第180回研究集会(多層配線システム研究委員会 研究
    • Place of Presentation
      機械技術振興会館
    • Year and Date
      2015-03-02
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystal Growth of GeSn-related Group-IV Thin Films for Integrating on Si Nanoelectronics Platform2015

    • Author(s)
      S. Zaima, O. Nakatsuka, T. Asano, T. Yamaha, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi, and M. Sakashita
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2015)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2015-09-27
    • Invited / Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Impact of ultra-high Sn content SnxGe1-x interlayer on reducing Schottky barrier height at metal/n-Ge interface2015

    • Author(s)
      A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2015)
    • Place of Presentation
      Sapporo, Japan
    • Year and Date
      2015-09-27
    • Int'l Joint Research
    • Data Source
      KAKENHI-PROJECT-15H03565
  • [Presentation] Ge1-x-ySixSnyエピタキシャル層の結晶性の歪構造依存性2014

    • Author(s)
      浅野孝典, 寺島辰也, 山羽隆, 田岡紀之, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Sn/Ge界面の結晶構造およびショットキー障壁高さのGe面方位依存性2014

    • Author(s)
      鈴木陽洋, Y. Deng, 柴山茂久, 黒澤昌志, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 熱酸化におけるGe (001)基板上Gel-xSnx層の表面Sn析出に対する熱安定性2014

    • Author(s)
      加藤公彦, 浅野孝典, 田岡紀之, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sbドープn型Ge中のSn関連欠陥の挙動2014

    • Author(s)
      竹内和歌奈, 田岡紀之, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第14回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-12-20
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 水中レーザ結晶化によるpoly-GeSnの大粒径成長とデバイス応用2014

    • Author(s)
      黒澤昌志, 池上浩, 鎌田善己, 田岡紀之, 中塚理, 手塚勉, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-19
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Si添加によるSnドット化抑制と層交換成長への応用2014

    • Author(s)
      黒澤昌志, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] MOCVD法により形成した極薄GeO2を用いたAl203/GeOx/Ge構造の電気的特性および構造評価2014

    • Author(s)
      吉田鉄兵, 加藤公彦, 柴山茂久, 坂下満男, 田岡紀之, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会薄膜・表面物理分科会、シリコンテクノロジー分科会 共催 特別研究会「ゲートスタック研究会―材料・プロセス・評価の物理―」(第19回)
    • Place of Presentation
      ニューウェルシティー湯河原
    • Year and Date
      2014-01-24
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge単結晶中の格子欠陥へのSnの効果2014

    • Author(s)
      竹内和歌奈, 田岡紀之, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-19
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] パルスMOCVD法を用いたGe(011)基板上における正方晶GeO2膜の形成2014

    • Author(s)
      柴山茂久, 吉田鉄兵, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属化学気相成長法によるGe1-xSnxエピタキシャル層形成2014

    • Author(s)
      犬塚雄貴, 池進一, 浅野孝典, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第14回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-12-20
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 低界面準位密度を有するGe MOS構造を実現するGe表面の酸化条件2014

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会薄膜・表面物理分科会、シリコンテクノロジー分科会 共催 特別研究会「ゲートスタック研究会―材料・プロセス・評価の物理―」(第19回)
    • Place of Presentation
      ニューウェルシティー湯河原
    • Year and Date
      2014-01-24
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] リン酸溶液中レーザドーピングにより低温形成したGe pnダイオードの電気的特性2014

    • Author(s)
      高橋恒太, 黒澤昌志, 池上浩, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 酸化プロセスにおけるゲート絶縁膜/Ge界面の界面準位密度を決定づける物理的要因2014

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 固相エピタキシャル成長法を用いた高Sn組成SiSn層の形成2014

    • Author(s)
      加藤元太, 黒澤昌志, 山羽隆, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 有機金属原料化学気相成長法によるGe1-xSnxエピタキシャル層の結晶性2014

    • Author(s)
      犬塚雄貴, 池進一, 浅野孝典, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2014(JSAP SCTS 2014)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2014-11-08
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 固溶限を超えるSn組成を有するGe1-xSnx層中におけるSn原子の熱安定性2014

    • Author(s)
      加藤公彦, 浅野孝典, 田岡紀之, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会薄膜・表面物理分科会、シリコンテクノロジー分科会 共催 特別研究会「ゲートスタック研究会―材料・プロセス・評価の物理―」(第19回)
    • Place of Presentation
      ニューウェルシティー湯河原
    • Year and Date
      2014-01-24
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 液相SnへのGe優先溶融を利用したSiGeSn薄膜の極低温エピタキシャル成長2014

    • Author(s)
      加藤元太, 黒澤昌志, 山羽隆, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第61回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2014-03-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Si (110)上Ge1-xSnxエピタキシャル薄膜の成長機構および転位構造2013

    • Author(s)
      木戸脇翔平, 浅野孝典, 黒澤昌志, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第13回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋工業大学
    • Year and Date
      2013-12-21
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 水中レーザーアニール法による多結晶Ge1-xSnx薄膜の低温形成2013

    • Author(s)
      黒澤昌志,田岡紀之,中塚理,池上浩,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al203/Ge構造の後熱酸化によるAlGeO形成にともなう界面特性の改善2013

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2013 (JSAP SCTS2013)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Interaction of Sn atoms with Defects Introduced by Ion Implantation in Ge Substrate2013

    • Author(s)
      T. Arahira, M. Fukudome, N. Taoka, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2013)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Stabilization for Higher-k Films with Meta-Stable Crystalline Structure2013

    • Author(s)
      K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      JSPS Core-to-Core Program workshop Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Frankfurt (Oder), Germany
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] テトラエトキシゲルマニウムを用いた極薄Ge酸化膜の形成2013

    • Author(s)
      吉田鉄兵, 加藤公彦, 柴山茂久, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会 ─材料・プロセス・評価の物理─(第18回研究会)
    • Place of Presentation
      湯河原
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造の熱酸化による界面構造変化と界面特性との相関関係2013

    • Author(s)
      柴山茂久,加藤公彦,坂下満男,竹内和歌奈,田岡紀之,中塚理,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Physical Factor of Other Element Incorporation for Tetragonal ZrO2 Formation2013

    • Author(s)
      K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      NIMS Conference 2013 Structure Control of Atomic / Molecular Thin Films and Their Applciations
    • Place of Presentation
      Tsukuba, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Quantitative Guideline for Formation of Ge MOS Interface with Low Interface State Density2013

    • Author(s)
      S. Shibayama, K. Kato, N. Taoka, M. Sakashita, O. Nakatsuka. and S. Zaima
    • Organizer
      2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES-SCIENCE AND TECHNOLOGY-
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Development of Gel-xSnx and Gel-x-ySixSny Thin Film Materials for Future Electronic Applications2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, K. Kato, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      International Conference on THERMEC' 2013
    • Place of Presentation
      Las Vegas, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Large grain growth of poly-GeSn on insulator by pulsed laser annealing in water2013

    • Author(s)
      M. Kurosawa, N. Taoka, H. Ikenoue, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2013)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Crystalline Phase Control of Pr-Oxide Films by Regulating Oxidant Partial Pressure and Si Diffusion2013

    • Author(s)
      K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 角度分解光電子X線分光法によるGeおよびGe1-xSnx表面電子状態の分析2013

    • Author(s)
      中塚理、池進一, 浅野孝典, 黒澤昌志, 田岡紀之, 財満鎭明
    • Organizer
      UVSORシンポジウム2013
    • Place of Presentation
      自然科学研究機構 岡崎コンファレンスセンター
    • Year and Date
      2013-12-07
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 準安定正方晶ZrO2構造の安定化機構の解明2013

    • Author(s)
      加藤公彦, 斉藤貴俊, 坂下満男, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-17
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pr酸化膜/Ge構造におけるゲート金属が界面反応に与える影響2013

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会 ─材料・プロセス・評価の物理─(第18回研究会)
    • Place of Presentation
      湯河原
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] A comparative study of metal germanide formation on Ge1-xSnx2013

    • Author(s)
      J. Demeulemeester, A. Schrauwen, K. Van Stiphout, O. Nakatsuka, M. Adachi, Y. Shimura, S. Zaima, C. M. Comrie, C. Detavernier, K. Temst, and A. Vantommea
    • Organizer
      Materials for Advanced Metallization
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn/n型Geコンタクトにおけるショットキー障壁高さの低減2013

    • Author(s)
      鈴木陽洋, 朝羽俊介, 横井淳, 中塚理, 黒澤昌志, 坂下満男, 田岡紀之, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-20
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn導入による非晶質SiGe混晶薄膜の低温結晶化2013

    • Author(s)
      山羽隆, 荒平貴光, 黒澤昌志, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Robustness of Sn Precipitation During Thermal Process of Gel-xSnx2013

    • Author(s)
      K. Kato, T. Asano, N. Taoka, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES-SCIENCE AND TECHNOLOGY-
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Reduction of Interface States Density Due to Post Oxidation with Formation of AlGeO Layer at Al203/Ge Interface2013

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      224th The Electrochemical Society (ECS) Meeting
    • Place of Presentation
      San Francisco, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn/n型Ge接合界面におけるフェルミレベルピニング変調2013

    • Author(s)
      鈴木陽洋, 朝羽俊介, 横井淳, 加藤公彦, 黒澤昌志, 坂下満男, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2013 (JSAP SCTS2013)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge1-xSnxエピタキシャル層の結晶性が発光特性に及ぼす影響2013

    • Author(s)
      保崎航也, 小山剛史, 黒澤昌志, 田岡紀之, 中塚理, 岸田英夫, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2013 (JSAP SCTS2013)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge1-xSnxヘテロエピタキシャル成長に与えるSn導入効果2013

    • Author(s)
      木戸脇翔平,浅野孝典,黒澤昌志,田岡紀之,中塚理,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 圧縮歪Ge1-xSnxエピタキシャル層の電気伝導特性2013

    • Author(s)
      浅野孝典,黒澤昌志,田岡紀之,坂下満男,中塚理,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Lateral Growth Enhancement of Poly-Gel-xSnx on SiO2 using a Eutectic Reaction2013

    • Author(s)
      M. Kurosawa, N. Taoka, M. Sakashita, O. Nakatsuka, M. Miyao, and S. Zaima
    • Organizer
      The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Feasibility of Ge Device Fabrication by Low Temperature Processes on ULSI Circuits2013

    • Author(s)
      N. Taoka, M. Kurosawa, K. Kato, S. Shibayama, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
    • Place of Presentation
      Sendai, Japan
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Formation of Tetragonal ZrO2 Thin Film by ALD Method2013

    • Author(s)
      K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
    • Organizer
      The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 低温固相成長GeへのSn導入による正孔移動度の向上2013

    • Author(s)
      竹内和歌奈, 田岡紀之, 黒澤昌志, 中塚理, 財満鎭明
    • Organizer
      第13回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋工業大学
    • Year and Date
      2013-12-21
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 酸化剤分圧およびSi拡散の制御によるPr酸化膜結晶構造制御2013

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭一
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      機械振興会館
    • Year and Date
      2013-06-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Impacts of AlGeO Formation by Post Thermal Oxidation of Al203/Ge Structure on Interface Properties2013

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Interface Properties of Al203/Ge MOS Structures with Thin Ge Oxide Interfacial Layer Formed by Pulsed MOCVD2013

    • Author(s)
      T. Yoshida, K. Kato, S. Shibayama, M. Sakashita, N. Taoka, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES-SCIENCE AND TECHNOLOGY-
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GOI基板上に形成したGe1-xSnxエピタキシャル層の電気特性評価2013

    • Author(s)
      大村拓磨, 浅野孝典, 黒澤昌志, 田岡紀之, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造に対する熱酸化機構の解明2013

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会 ─材料・プロセス・評価の物理─(第18回研究会)
    • Place of Presentation
      湯河原
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Development of Ge_<1-x>Sn_x and Ge_<1-x-y>Si_xSn_y Thin Film Materials for Future Electronic Applications2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, K. Kato, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      International Conference on THERMEC'2013
    • Place of Presentation
      Las Vegas, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 非晶質SiGe混晶薄膜の結晶化に対するSn導入効果2013

    • Author(s)
      山羽隆, 黒澤昌志, 荒平貴光, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会SC東海地区学術講演会2013 (JSAP SCTS2013)
    • Place of Presentation
      名古屋大学
    • Year and Date
      2013-11-16
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 高Sn組成Ge1-xSnxエピタキシャル層の光学特性2013

    • Author(s)
      保崎航也, 小山剛史, 黒澤昌志, 田岡紀之, 中塚理, 岸田英夫, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Interfacial Reactions in Al2O3/Ge Structures2013

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
    • Place of Presentation
      Sendai, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Heteroepitaxial Growth of Sn-Related Group-IV Materials on Si Platform for Microelectronic and Optoelectronic Applications : Challenges and Opportunities2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, M. Sakashita, S. Zaima
    • Organizer
      224th The Electrochemical Society (ECS) Meeting
    • Place of Presentation
      San Francisco, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Heteroepitaxial Growth of Sn-Related Group-IV Materials on Si Platform for Microelectronic and Optoelectronic Applications : Challenges and Opportunities2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, M. Sakashita, S. Zaima
    • Organizer
      224th The Electrochemical Society (ECS) Meeting
    • Place of Presentation
      San Francisco, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Interaction between Sn atoms and Defects Introduced by Ion Implantation in Ge Substrate2013

    • Author(s)
      N. Taoka, M. Fukudome, T. Arahira, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      JSPS Core-to-Core Program workshop Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Frankfurt (Oder), Germany
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Defects introduced in germanium substrate by reactive ion etching2013

    • Author(s)
      Kusumandari, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, S. Zaima
    • Organizer
      5th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Al2O3/Ge interfacial structures by post oxidation technique using oxygen radical2013

    • Author(s)
      K. Kato, S. Shibayama, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      5th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge (001)基板上に成長したGel-xSnxエピタキシャル層の結晶構造および光学特性2013

    • Author(s)
      保崎航也, 小山剛史, 黒澤昌志, 田岡紀之, 中塚理, 岸田英夫, 財満鎭明
    • Organizer
      第2回結晶工学未来塾
    • Place of Presentation
      学習院創立百周年記念会館(研究ポスター発表会)
    • Year and Date
      2013-11-07
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] テトラエトキシゲルマニウムによる極薄GeO2膜の形成2013

    • Author(s)
      吉田鉄兵, 加藤公彦, 柴山茂久, 坂下満男, 田岡紀之, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      機械振興会館
    • Year and Date
      2013-06-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Low temperature crystallization of group-IV semiconductors induced by eutectic metals (Al, Sn)2013

    • Author(s)
      M. Kurosawa, N. Taoka, M. Sakashita, O. Nakatsuka, M. Miyao, and S. Zaima
    • Organizer
      6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
    • Place of Presentation
      Sendai, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Reduction of Schottky Barrier Height for n-type Ge Contact by using Sn Electrode2013

    • Author(s)
      A. Suzuki, Shunsuke Asaba, J. Yokoi, O. Nakatsuka, M. Kurosawa, K. Kato, M. Sakashita, N. Taoka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2013)
    • Place of Presentation
      Fukuoka, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] H2O分圧によるPr価数およびPr酸化膜の結晶構造制御2013

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,田岡紀之,中塚理,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn-related Group-IV Semiconductor Materials for Electronic and Optoelectronic Applications2013

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
    • Organizer
      The 3rd International Conference on Nanoteck & Expo
    • Place of Presentation
      Las Vegas, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge1-xSnxヘテロエピタキシャル成長に与える基板面方位効果2013

    • Author(s)
      黒澤昌志,木戸脇翔平,浅野孝典,田岡紀之,中塚理,財満鎭明
    • Organizer
      第60回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 過飽和状態制御による多結晶Sil-xSnx/絶縁膜の大粒径成長2013

    • Author(s)
      黒澤昌志, 荒平貴光, 山羽隆, 田岡紀之, 中塚理, 財満鎮明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 界面反応機構に基づくAl203/Ge界面構造制御2013

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス
    • Year and Date
      2013-09-17
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al203/Ge構造における酸化機構の解明と界面反応がその特性に及ぼす影響2013

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      機械振興会館
    • Year and Date
      2013-06-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effect of Gate Metal Electrode on Chemical Bonding State in Metal/Pr-oxide/Ge Gate Stack Structure2012

    • Author(s)
      K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 6th International SiGe Technology and Device Meeting (ISTDM2012)
    • Place of Presentation
      Barkeley, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] ゲート金属の還元性に基づくPr酸化膜/Ge界面反応制御2012

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,田岡紀之,中塚理,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造へのN-O混合ラジカル処理による界面反応と電気的特性の制御2012

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Electrical Characterization of p-Ge1-xSnx/p-Ge and p-Ge1-xSnx/n-Ge Heterostructures by Numerical Simulation of Admittance Spectroscopy2012

    • Author(s)
      B. Baert, D. Y. N. Truonga, O. Nakatsuka, S. Zaima, and N. D. Nguyen
    • Organizer
      The 6th International SiGe Technology and Device Meeting (ISTDM2012)
    • Place of Presentation
      Barkeley, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Material properties and applications of Ge1-xSnx alloys for Ge Nanoelectronics2012

    • Author(s)
      O. Nakatsuka, Y. Shimura, W. Takeuchi, and S. Zaima
    • Organizer
      The 6th International SiGe Technology and Device Meeting (ISTDM2012)
    • Place of Presentation
      Barkeley, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Importance of Si Bandbending at Zero Bias Condition for Schottky Barrier Height Control at Metal/Si Interfaces with Ultra-thin Al2O3 Layer2012

    • Author(s)
      H. Matsushita, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka and S. Zaima
    • Organizer
      IUMRS International Conference on Electronic Materials (IUMRS-ICEM2012)
    • Place of Presentation
      Yokohama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effect of N Radical Process on Interfacial and Electrical Properties of Al2O3/Ge Structure2012

    • Author(s)
      K. Kato, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 5th International Conference on PLasma-NanoTechnology & Science (IC-PLANTZ2012)
    • Place of Presentation
      Inuyama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Thermal Oxidation Mechanism of Ge through Al2O3 Layer Formed on Ge Substrate2012

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      IUMRS International Conference on Electronic Materials (IUMRS-ICEM2012)
    • Place of Presentation
      Yokohama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Growth and Optical Properties of Ge_<1-x>Sn_x Alloy Thin Films with a High Sn Content2012

    • Author(s)
      S. Zaima, O. Nakatsuka, M. Nakamura, W. Takeuchi, Y. Shimura, and N. Taoka
    • Organizer
      The PRiME 2012 Joint International (222nd) ECS Meeting
    • Place of Presentation
      Honolulu, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 金属電極がPr酸化膜/Ge構造の化学結合状態に与える影響2012

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn触媒を用いた非晶質Ge薄膜/絶縁膜の低温成長2012

    • Author(s)
      黒澤昌志,田岡紀之,坂下満男,中塚理,宮尾正信,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Potential of GeSn Alloys for Application to Si Nanoelectronics2012

    • Author(s)
      S. Zaima, Y. Shimura, M. Nakamura, W. Takeuchi, M. Sakashita, O. Nakatsuka
    • Organizer
      2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD2012)
    • Place of Presentation
      Naha, Japan
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] In situ Sb doping in Ge1-xSnx Epitaxial Layers with High Sn Contents2012

    • Author(s)
      K. Hozaki, M. Nakamura, Y. Shimura, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      IUMRS International Conference on Electronic Materials (IUMRS-ICEM2012)
    • Place of Presentation
      Yokohama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Potential of GeSn Alloys for Application to Si Nanoelectronics2012

    • Author(s)
      S. Zaima, Y. Shimura, M. Nakamura, W. Takeuchi, M. Sakashita, O. Nakatsuka
    • Organizer
      2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD2012)
    • Place of Presentation
      Naha, Japan(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 低温固相結晶化による高移動度poly-GeSn層の形成2012

    • Author(s)
      竹内和歌奈,田岡紀之,黒澤昌志,福留誉司,坂下満男,中塚理,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge単結晶中の格子欠陥への熱処理雰囲気および他元素導入の影響2012

    • Author(s)
      福留誉司,竹内和歌奈,田岡紀之,坂下満男,中塚理,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造へのN-O混合ラジカル処理による界面反応と電気的特性の制御 Si(110)基板上におけるGeおよびGe1-xSnxヘテロエピタキシャル成長2012

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明 木戸脇翔平,浅野孝典,志村洋介,中塚理,財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造に対する酸素熱処理温度依存性およびその界面反応機構2012

    • Author(s)
      柴山茂久,加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Growth and Optical Properties of Ge1-xSnx Alloy Thin Films with a High Sn Content2012

    • Author(s)
      S. Zaima, O. Nakatsuka, M. Nakamura, W. Takeuchi, Y. Shimura, and N. Taoka
    • Organizer
      The PRiME 2012 Joint International (222nd) ECS Meeting
    • Place of Presentation
      Honolulu, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Impedance Spectroscopy of GeSn/Ge Heterostructures by a Numerical Method2012

    • Author(s)
      B. Baert, O. Nakatsuka, S. Zaima, and N. Nguyen
    • Organizer
      The PRiME 2012 Joint International (222nd) ECS Meeting
    • Place of Presentation
      Honolulu, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 高Sn組成Ge1-xSnx層へのin situ Sbドーピング2012

    • Author(s)
      保崎航也,中村茉里香,志村洋介,竹内和歌奈,田岡紀之,中塚理,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Epitaxial Growth of Ge1-xSnx Layers on (110)-oriented Si and Ge Substrates2012

    • Author(s)
      T. Asano, S. Kidowaki, Y. Shimura, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      IUMRS International Conference on Electronic Materials (IUMRS-ICEM2012)
    • Place of Presentation
      Yokohama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Impact of Sn corporation on Epitaxial Growth of Ge Layers on Si(110) Substrates2012

    • Author(s)
      S. Kidowaki, T. Asano, Y. Shimura, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2012)
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] ヘテロエピタキシャルGe1-xSnx中のGa活性化に及ぼすSnの効果2012

    • Author(s)
      志村洋介, 中塚理, B. Vincent, G. Federica, T. Clarysse, W. Vandervorst, M. Caymax, R. Loo, A. Jensen, D. Petersen, 財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Electrical Properties of Epitaxially Grown p+-Ge1-xSnx/n-Ge Diodes2012

    • Author(s)
      S. Asaba, J. Yokoi, H. Matsuhita, D. Yunsheng, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      IUMRS International Conference on Electronic Materials (IUMRS-ICEM2012)
    • Place of Presentation
      Yokohama, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Epitaxial Growth and Characterizations of Ge1-xSnx and Ge1-x-ySixSny Thin Layers for Nanoelectronic and Optoelectronic Applications2012

    • Author(s)
      O. Nakatsuka, N. Taoka, M. Sakashita, W. Takeuchi, S. Zaima
    • Organizer
      University of Vigo and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      Vigo, Spain
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] テトラエトキシゲルマニウムを用いた原子層堆積法によるGe酸化膜の形成2012

    • Author(s)
      吉田鉄兵,加藤公彦,柴山茂久,坂下満男,竹内和歌奈,田岡紀之,中塚理,財満鎭明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] ラジカルプロセスによるAl2O3/Ge界面特性の改善2012

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第17回研究会)
    • Place of Presentation
      三島
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 超高Sn組成Ge1-xSnx層の光学特性評価2012

    • Author(s)
      中村茉里香,志村洋介,竹内和歌菜,中塚理,財満鎭明
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] The effect of light exposure on the electrical properties of GeO2/Ge gate stack2012

    • Author(s)
      Kusumandari, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      4th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2012)
    • Place of Presentation
      Kasugai, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effects of Light and Air Exposures on Electrical Properties of GeO2/Ge and Al2O3/Ge Gate Stack Structures2012

    • Author(s)
      Kusumandari, W. Takeuchi, K. Kato, S. Shibayama, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD2012)
    • Place of Presentation
      Naha, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Optical Properties of Ge1-xSnx Epitaxial Layers with Very High Sn Contents2012

    • Author(s)
      M. Nakamura, Y. Shimura, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      The 6th International SiGe Technology and Device Meeting (ISTDM2012)
    • Place of Presentation
      Barkeley, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] High Mobility Poly-GeSn Layer Formed by Low Temperature Solid Phase Crystallization2012

    • Author(s)
      W. Takeuchi, N. Taoka, M. Kurosawa, M. Fukutome, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2012)
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Geに対する酸素熱処理が電気的特性および化学結合状態に与える効果2012

    • Author(s)
      柴山茂久,加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第17回研究会)
    • Place of Presentation
      三島
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Material properties and applications of Ge_<1-x>Sn_x alloys for Ge Nanoelectronics2012

    • Author(s)
      O. Nakatsuka, Y. Shimura, W. Takeuchi, and S. Zaima
    • Organizer
      The 6th International SiGe Technology and Device Meeting (ISTDM2012), No. 12.1
    • Place of Presentation
      Barkeley, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Interfacial Reaction Mechanism in Al2O3/Ge Structure by Oxygen Radical2012

    • Author(s)
      K. Kato, S. Shibayama, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2012)
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Characterization of Damages of Al_2O_3/Ge Gate Stacks Structure Induced with Light Radiation during Plasma Nitridation2011

    • Author(s)
      Kusumandari, W.Takeuchi, K.Kato, M.Sakashita, O.Nakatsuka, S.Zaima
    • Organizer
      The 3rd International Symposium on Advanced Plasma Science and its Application for Nitrides and Nanomaterials (ISPLasma2011)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al_2O_3界面層およびラジカル窒化法によるHigh-k/Ge界面構造2011

    • Author(s)
      加藤公彦, 京極真也, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)
    • Place of Presentation
      東京工業大学(東京都)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] InP基板上への超高Sn組成Ge_<1-x>Sn_xヘテロエピタキシャル層成長2011

    • Author(s)
      中村茉里香, 志村洋介, 竹内正太郎, 中塚理, 財満鎭明
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Materials Innovation in Si Nanoelectronics2011

    • Author(s)
      S. Zaima and O. Nakatsuka
    • Organizer
      2011 Tsukuba Nanotechnology Symposium (TNS'11)
    • Place of Presentation
      Tsukuba, Japan(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] ラジカル窒化法によるAl2O3/Ge構造の界面特性改善2011

    • Author(s)
      加藤公彦,坂下満男,竹内和歌奈,中塚理,財満鎭明
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Low Temperature Formation of Si1-x-yGexSny-on-Insulator Structures by Using Solid-Phase Mixing of Ge1-zSnz/Si-on-Insulator Substrates2011

    • Author(s)
      K. Mochizuki, T. Yamaha, Y. Shimura, O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Conference on Si Epitaxy and Heterostructures
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Surface and Interfacial Structure by Radical Nitridation Technique for Ge MOS Transistors2011

    • Author(s)
      K.Kato, H.Kondo, M.Sakashita, W.Takeuchi, O.Nakatsuka, S.Zaima
    • Organizer
      The 4th International Conference on PLAsma-Nano Technology & Science
    • Place of Presentation
      Gifu, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Influence of Light Radiation on Electrical Properties of Al_2O_3/Ge and GeO_2/Ge Gate Stacks in Nitrogen Plasma2011

    • Author(s)
      Kusumandari, W.Takeuchi, K.Kato, M.Sakashita, O.Nakatsuka, S.Zaima
    • Organizer
      2011 International Workshop on Dielectric Thin Films for Future Electron Devices : Science and Technology
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GeSn Technology: Impact of Sn on Ge CMOS Applications2011

    • Author(s)
      S. Zaima, O. Nakatsuka, Y. Shimura, S. Takeuchi, B. Vincent, F. Gencarelli, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, M. Caymax, and R. Loo
    • Organizer
      220th Electro Chemical Society Meeting
    • Place of Presentation
      Boston, USA
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pr酸化膜/Si構造へのAl導入による界面反応抑制効果2011

    • Author(s)
      古田和也, 竹内和歌奈, 加藤公彦, 坂下満男, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)
    • Place of Presentation
      東京工業大学(東京都)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GeSn Technology : Impact of Sn on Ge CMOS Applications2011

    • Author(s)
      S. Zaima, O. Nakatsuka, Y. Shimura, S. Takeuchi, B. Vincent, F. Gencarelli, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, M. Caymax, and R. Loo
    • Organizer
      220th Electro Chemical Society Meeting
    • Place of Presentation
      Boston, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 固相拡散法を用いたSi_<1-x-y>Ge_xSn_y on Insulator構造の形成2011

    • Author(s)
      望月健太, 山羽隆, 志村洋介, 中塚理, 財満鎭明
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 電流検出型原子間力顕微鏡を用いた欠陥に起因するPr酸化膜のリーク電流機構の解明2011

    • Author(s)
      足立正樹, 加藤雄三, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)
    • Place of Presentation
      東京工業大学(東京都)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 次世代ナノCMOSにおける物性制御と不純物2011

    • Author(s)
      財満鎭明, 中塚理, 竹内正太郎
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 熱処理によるAl_2O_3/Ge界面構造制御2011

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] In-situ Ga Doping to Fully Strained Ge1-xSnx Heteroepitaxial Layers Grown on Ge(001) Substrates2011

    • Author(s)
      Y. Shimura, S. Takeuchi, O. Nakatsuka, B. Vincent, F. Gencarelli, T. Clarysse, W. Vandervorst, M. Caymax, R. Loo, and S. Zaima
    • Organizer
      7th International Conference on Si Epitaxy and Heterostructures
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Growth of Ge1-xSnx heteroepitaxial layers with very high Sn contents on InP(001) substrates2011

    • Author(s)
      M. Nakamura, Y. Shimura, S. Takeuchi , O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Conference on Si Epitaxy and Heterostructures
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Materials Innovation in Si Nanoelectronics2011

    • Author(s)
      S. Zaima and O. Nakatsuka
    • Organizer
      2011 Tsukuba Nanotechnology Symposium (TNS'11)
    • Place of Presentation
      Tsukuba, Japan
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al_2O_3/Ge及びGeO_2/Geゲートスタック構造における窒素プラズマ中の光照射損傷のPAPE法による分析2011

    • Author(s)
      クスマンダリ, 竹内和歌奈, 加藤公彦, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)
    • Place of Presentation
      東京工業大学(東京都)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Sn添加および水素熱処理がGeエピタキシャル層中の欠陥に与える影響2011

    • Author(s)
      足立正樹,志村洋介,中塚理,財満鎭明
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Suppressive Effect of Interface Reaction and Water Absorption by Al Incorporation into Pr-oxide Film2011

    • Author(s)
      W. Takeuchi, K. Furuta, K. Kato, M. Sakashita, H. Kondo, O. Nakatsuka, and S. Zaima
    • Organizer
      The 15th International Conference on Thin Films (ICTF-15)
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Interfacial Properties of Al_2O_3/Ge Gate Stack Structure using Radical Nitridation Technique2011

    • Author(s)
      K.Kato, S.Kyogoku, M.Sakashita, W.Takeuchi, H.Kondo, O.Nakatsuka, S.Zaima
    • Organizer
      2011 International Workshop on Dielectric Thin Films for Future Electron Devices : Science and Technology
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Defect Properties in Ge Heteroepitaxial Layers by Sn Incorporation and H2-Annealing2011

    • Author(s)
      M. Adachi, Y. Shimura, O. Nakatsuka, and S. Zaima
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2011)
    • Place of Presentation
      Nagoya, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pr酸化膜/PrON/Ge構造におけるPrの化学結合状態が電気的特性に及ぼす影響2011

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-(第16回研究会)
    • Place of Presentation
      東京工業大学(東京都)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effect of Chemical Bonding State on Electrical Properties of Al2O3/Ge Structure2011

    • Author(s)
      K. Kato, M Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      The 15th International Conference on Thin Films (ICTF-15)
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Epitaxial Growth of Ge1-xSnx for Strained Ge CMOS Devices2011

    • Author(s)
      S. Zaima, Y. Shimura, S. Takeuchi, and O. Nakatsuka
    • Organizer
      THERMEC' 2011 (International Conference on Processing & Manufacturing of Advanced Materials
    • Place of Presentation
      Quebec, Canada
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Improvement of Al2O3 Interfacial Properties by O2 Annealing2011

    • Author(s)
      S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      7th International Conference on Si Epitaxy and Heterostructures
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Potential of Ge_<1-x>Sn_x alloys as high mobility channel materials and stressors2010

    • Author(s)
      Invited: S. Takeuchi, Y. Shimura, T. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
    • Organizer
      5th International WorkShop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai, Japan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Material Assessment for uni-axial strained Ge pMOS-1 : Characterization of GeSn(B) materials2010

    • Author(s)
      B.Vincent, Y.Shimura, S.Takeuchi, T.Nishimura, J.Demeulemeester, G.Eneman, T.Clarysse, W.Vandervorst, A.Vantomme, O.Nakatsuka, S.Zaima, J.Dekoster, M.Caymax, R.Loo
    • Organizer
      International Workshop of GeSn Developments and Future Applications
    • Place of Presentation
      Heverlee-Leuven, Belgium
    • Year and Date
      2010-05-28
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Strain Relaxation Behavior of Ge_<1-x>Sn_x Layers : Toward Tensile-Strained Ge Layers with Strain Value over 1%2010

    • Author(s)
      Y.Shimura, S.Takeuchi, N.Tsutsui, O.Nakatsuka, A.Sakai, S.Zaima
    • Organizer
      5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
    • Place of Presentation
      Stockholm, Sweden
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Strain Relaxation Behavior of Ge_<1-x>Sn_x Layers for Tensile Strained Ge Layers2010

    • Author(s)
      Y.Shimura, S.Takeuchi, O.Nakatsuka, S.Zaima
    • Organizer
      218th ECS Meeting
    • Place of Presentation
      Las Vegas, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 原子層堆積方により作製したPrAlOの結晶構造および電気的特性2010

    • Author(s)
      古田和也, 竹内和歌奈, 坂下満男, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      シリコンテクノロジー分科会・第125回シリコンテクノロジー研究会
    • Place of Presentation
      東京大学(東京都)
    • Year and Date
      2010-06-22
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Crystalline Orientation Dependence of Electrical Properties on Mn Germanide/Ge(111) and (001) Schottky Contacts2010

    • Author(s)
      T. Nishimura, O. Nakatsuka, S. Zaima
    • Organizer
      Materials for Advanced Metallization
    • Place of Presentation
      Mechelen, Belgium
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge_<1-x>Sn_xソース/ドレインストレッサーのためのNi(Ge_<1-y>Sn_y)/Ge_<1-x>Sn_x/Geコンタクト形成2010

    • Author(s)
      西村剛志, 中塚理, 志村洋介, 竹内正太郎, Benjamin Vincent, Andre Vantomme, Johan Dekoster, Matty Caymax, Roger Loo, 財満鎭明
    • Organizer
      第10回日本表面科学会中部支部学術講演会
    • Place of Presentation
      名古屋工業大学(愛知県)
    • Year and Date
      2010-12-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge_<1-x>Sn_x stressors for strained-Ge CMOS2010

    • Author(s)
      S.Takeuchi, Y.Shimura, T.Nishimura, B.Vincent, G.Eneman, T.Clarysse, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Organizer
      5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
    • Place of Presentation
      Stockholm, Sweden(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy2010

    • Author(s)
      M.Adachi, M.Sakashita, H.Kondo, W.Takeuchi, O.Nakatsuka, S.Zaima
    • Organizer
      2010 International Conference on Solid State Devices and Materials (SSDM 2010)
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pr酸化膜/Ge構造の界面特性に及ぼすPr酸化膜の価数の影響2010

    • Author(s)
      加藤公彦, 竹内和歌奈, 近藤博基, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Formation of Palladium Silicide Thin Layers on Si(110) Substrates2010

    • Author(s)
      R.Suryana, O.Nakatsuka, S.Zaima
    • Organizer
      Advanced Metallization Conference 2010 : 20th Asian Session, Tokyo, Japan, Oct.
    • Place of Presentation
      The University of Tokyo, Tokyo, Japan
    • Year and Date
      2010-10-21
    • Data Source
      KAKENHI-PROJECT-21246009
  • [Presentation] Ni(Ge_<1-y>Sn_y)/Ge_<1-x>Sn_x/Geコンタクトの形成と結晶構造評価2010

    • Author(s)
      西村剛志, 中塚理, 志村洋介, 竹内正太郎, Benjamin Vincent, Andre Vantomme, Johan Dekoster, Matty Caymax, Roger Loo, 財満鎭明
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Growth and Characterization of GeSn and Tensile-Strained Ge Layers for High Mobility Channels of CMOS Devices2010

    • Author(s)
      O.Nakatsuka, Y.Shimura, S.Takeuchi, S.Zaima
    • Organizer
      The 7th Pacific Rim International Conference on Advanced Materials and Processing
    • Place of Presentation
      Cairns, Australia
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effects of Al Incorporation into Pr-oxides Formed by Atomic Layer Deposition2010

    • Author(s)
      K.Furuta, W.Takeuchi, M.Sakashita, K.Kato, H.Kondo, O.Nakatsuka, S.Zaima
    • Organizer
      2010 International Conference on Solid State Devices and Materials (SSDM 2010)
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Formation of Ni(Ge_<1-x>Sn_x) Layers with Solid-Phase Reaction in Ni/Ge_<1-x>Sn_x/Ge Systems2010

    • Author(s)
      T.Nishimura, Y.Shimura, S.Takeuchi, B.Vincent, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Organizer
      5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
    • Place of Presentation
      Stockholm, Sweden
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] (Si)GeSn requirements for optical device applications and solar cells2010

    • Author(s)
      S.Takeuchi, B.Vincent, K.Temst, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Organizer
      International Workshop of GeSn Developments and Future Applications
    • Place of Presentation
      Heverlee-Leuven, Belgium
    • Year and Date
      2010-05-28
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 歪Ge_<1-x>Sn_xへの高濃度不純物ドーピング2010

    • Author(s)
      志村洋介, 竹内正太郎, Benjamin Vincent, Geert Eneman, Trudo Clarysse, Andre Vantomme, Johan Dekoster, Matty Caymax, Roger Loo, 中塚理, 財満鎭明
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Bi-axially strained Ge grown on GeSn SRBs2010

    • Author(s)
      O.Nakatsuka, S.Takeuchi, Y.Shimura, A.Sakai, S.Zaima
    • Organizer
      International Workshop of GeSn Developments and Future Applications
    • Place of Presentation
      Heverlee-Leuven, Belgium
    • Year and Date
      2010-05-28
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Control of Interfacial Properties of Pr-oxide/Ge Gate Stack Structure by Introduction of Nitrogen2010

    • Author(s)
      K.Kato, H.Kondo, M.Sakashita, O.Nakatsuka, S.Zaima
    • Organizer
      5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
    • Place of Presentation
      Stockholm, Sweden
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GeSn : future applications and strategy2010

    • Author(s)
      R.Loo, M.Caymax, B.Vincent, J.Dekoster, S.Takeuchi, O.Nakatsuka, S.Zaima, K.Temst, A.Vantomme
    • Organizer
      International Workshop of GeSn Developments and Future Applications
    • Place of Presentation
      Heverlee-Leuven, Belgium
    • Year and Date
      2010-05-28
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Study of Ge Surface Passivation using Radical Nitridation Technique for Ge Channel MOS Transistors2010

    • Author(s)
      K.Kato, H.Kondo, M.Sakashita, W.Takeuchi, O.Nakatsuka, S.Zaima
    • Organizer
      The 1st Korea-Japan Symposium on Surface Technology
    • Place of Presentation
      Incheon, Korea
    • Year and Date
      2010-11-26
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 電流検出型原子間力顕微鏡を用いたPr酸化膜中の欠陥に起因するリーク電流機構の解明2010

    • Author(s)
      足立正樹, 加藤雄三, 坂下満男, 近藤博基, 中塚理, 財満鎭明
    • Organizer
      第10回日本表面科学会中部支部学術講演会
    • Place of Presentation
      名古屋工業大学(愛知県)
    • Year and Date
      2010-12-18
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Assessment of Ge_<1-x>Sn_x Alloys for Strained Ge CMOS Devices2010

    • Author(s)
      S. Takeuchi, Y. Shimura, T. Nishimura, B. Vincent, G. Eneman, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, A. Sakai, and S. Zaima
    • Organizer
      218th ECS Meeting
    • Place of Presentation
      Las Vegas, USA(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Tensile-Strained Ge and Ge_<1-x>Sn_x Layers for High-Mobility Channels in Future CMOS Devices2010

    • Author(s)
      S.Zaima, O.Nakatsuka, Y.Shimura, S.Takeuchi
    • Organizer
      International Conference on Solid-state and Integrated Circuit Technology
    • Place of Presentation
      Shanghai, China(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] ラジカル窒化がGe-MOS特性に与える影響2010

    • Author(s)
      竹内和歌奈, クスマンダリ, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Material Assessment for uni-axial strained Ge pMOS-2 : Formation of Ni(GeSn) Layers with Solid-Phase Reactor2010

    • Author(s)
      T.Nishimura, Y.Shimura, S.Takeuchi, B.Vincent, A.Vantomme, J.Dekoster, M.Caymax, R.Loo, O.Nakatsuka, S.Zaima
    • Organizer
      International Workshop of GeSn Developments and Future Applications
    • Place of Presentation
      Heverlee-Leuven, Belgium
    • Year and Date
      2010-05-28
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Tensile-Strained Ge and Ge_<1-x.>Sn_x Layers for High-Mobility Channels in Future CMOS Devices2010

    • Author(s)
      S. Zaima, O. Nakatsuka, Y. Shimura, S. Takeuchi
    • Organizer
      International Conference on Solid-State and Integrated Circuit Technology
    • Place of Presentation
      Shanghai, China(招待講演)
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effect of Valence State of Pr on Interfacial Structure and Electrical Properties of Pr-oxide/PrON/Ge Gate Stack Structure2010

    • Author(s)
      K.Kato, M.Sakashita, W.Takeuchi, H.Kondo, O.Nakatsuka, S.Zaima
    • Organizer
      2010 International Conference on Solid State Devices and Materials (SSDM 2010)
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Formation of Palladium Silicide on Heavily Doped Si (001) Substrates Using Ti Intermediate Layer2009

    • Author(s)
      R.Suryana, O.Nakatsuka, S.Zaima
    • Organizer
      Advanced Metallization Conference 2009 (ADMETA) : 19th Asian Session
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-21246009
  • [Presentation] Effect of Atomic Deuterium Irradiation on Initial Growth of Sn and Ge_<1-x>Sn_x on Ge(001) Substrates2009

    • Author(s)
      T. Shinoda, O. Nakatsuka, and S. Zaima
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Study on Gate Stacks in Future Nano-Scaled CMOS using Hard X-Ray Photoelectron Spectroscopy2009

    • Author(s)
      Invited: S. Zaima, O. Nakatsuka, T. Hattori
    • Organizer
      International Workshop for New Opportunities in Hard X-ray Photoelectron Spectroscopy
    • Place of Presentation
      New York, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面上のSnおよびGe_<1-x>Sn_x初期成長に及ぼす原子状重水素照射の効果2009

    • Author(s)
      篠田竜也, 中塚理, 財満鎭明
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      筑波大学、筑波
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Formation and characterization of tensile-strained Ge layers on Ge_<1-X>Sn_x buffer layers2009

    • Author(s)
      S.Zaima, O.Nakatsuka, Y.Shimura, N.Tsutsui, A.Sakai
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA((招待講演))
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Effect of Atomic Deuterium Irradiation on Initial Growth of Sn and Ge_<1-x>Sn_x on Ge(OO1) Substrates2009

    • Author(s)
      T. Shinoda, O. Nakatsuka, S. Zaima
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA(採択決定)
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Low Temperature Growth of Ge_<1-x>Sn_x Buffer Layers for Tensile-strained Ge Layers2009

    • Author(s)
      Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Structural change of direct silicon bonding substrates by interfacial oxide out-diffusion annealing2009

    • Author(s)
      T. Kato, T. Ueda, Y. Ohara, J. Kikkawa, Y. Nakamura, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, Y. Imai, S. Kimura, O. Sakata
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Influence of Interfacial Structure on Electrical Properties of Metal/Ge Schottky Contacts2009

    • Author(s)
      O. Nakatsuka, S. Akimoto, T. Nishimura, and S. Zaima
    • Organizer
      The 9 th International Workshop on Junction Technology 2009
    • Place of Presentation
      Kyoto, Japan(採択決定)
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] Formation and characterization of tensile-strained Ge layers on Ge_<1-x>Sn_x buffer layers2009

    • Author(s)
      Invited: S. Zaima, O. Nakatsuka, Y. Shimura, N. Tsutsui, A. Sakai
    • Organizer
      The 6th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面上のSnおよびGe_<1-x>Sn_x初期成長に及ぼす原子状重水素照射の効果2009

    • Author(s)
      篠田竜也, 中塚理, 財満鎭明
    • Organizer
      第56回応用物理学関係連合講演会
    • Place of Presentation
      筑波大学
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Influence of Interfacial Structure on Electrical Properties of Metal/Ge Schottky Contacts2009

    • Author(s)
      O. Nakatsuka, S. Akimoto, T. Nishimura, and S. Zaima
    • Organizer
      The 9th International Workshop on Junction Technology 2009
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] 原子状水素照射によるGe(001)表面上SnおよびGe_<1-x>Sn_x初期成長構造の制御2008

    • Author(s)
      篠田竜也, 山崎理弘, 中塚理, 財満鎭明
    • Organizer
      第8回・日本表面科学会中部支部・学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2008-12-13
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Characterization and Analyses of Interface Structures in Directly Bonded Si(011)/Si(001) Substrates2008

    • Author(s)
      E. Toyoda, A. Sakai, O. Nakatsuka, S. Zaima, M. Ogawa, H. Isogai, T. Senda, K. Izunome, K. Omote
    • Organizer
      The fourth International SiGe Technology and Device Meeting
    • Place of Presentation
      HsinChu, Taiwan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面上のSnおよびGe_<1-x>Sn_x初期成長に及ぼす原子状水素照射の効果2008

    • Author(s)
      篠田竜也, 山崎理弘, 中塚理, 財満鎭明
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      中部大学
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] 金属シリサイド・ジャーマナイド/半導体コンタクトの界面構造および電子物性制御(招待講演)2008

    • Author(s)
      中塚理, 酒井朗, 財満鎭明
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      中部大学、名古屋
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] Characterization and analyses of interface structures in directly bonded Si(011)/Si(001) substrates2008

    • Author(s)
      Invited: E. Toyoda, A. Sakai, O. Nakatsuka, H. Isogai, T. Senda, K. Izunome, K. Omote, S. Zaima
    • Organizer
      The 5th International Symposium on Advanced Science and Technology of Silicon Materials
    • Place of Presentation
      Hawaii, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Effect of Hydrogen on Initial Growth of Sn and Ge_<1-x>Sn_x on Ge(001) substrates2008

    • Author(s)
      M. Yamazaki, O. Nakatsuka, T. Shinoda, A. Sakai, M. Ogawa, and S. Zaima
    • Organizer
      The fourth International SiGe Technology and Device Meeting (ISTDM)
    • Place of Presentation
      HsinChu, Taiwan
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Microstructures in Directly Bonded Si Substrates2008

    • Author(s)
      A. Sakai, Y. Ohara, T. Ueda, O. Nakatsuka, M. Ogawa, S. Zaima, E. Toyoda
    • Organizer
      The fourth International SiGe Technology and Device Meeting
    • Place of Presentation
      HsinChu, Taiwan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] 金属シリサイド・ジャーマナイド/半導体コンタクトの界面構造および電子物性制御(招待講演)2008

    • Author(s)
      中塚理, 酒井朗, 財満鎭明
    • Organizer
      第69回応用物理学会学術講演会, 4p-ZB-8
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] 原子状水素照射によるGe(001)表面上SnおよびGe_<1-x>Sn_x初期成長構造の制御2008

    • Author(s)
      篠田竜也, 山崎理弘, 中塚理, 財満鎭明
    • Organizer
      第8回・日本表面科学会中部支部・学術講演会
    • Place of Presentation
      名古屋大学、名古屋
    • Year and Date
      2008-12-13
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Control of Sn Precipitation and Strain relaxation in Compositionally Step-graded Ge_<1-x>Sn_x Buffer Layers for Tensile-strained Ge Layers2008

    • Author(s)
      Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
    • Organizer
      2008 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Tsukuba, Japan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面上のSnおよびGe_<1-x>Sn_x初期成長に及ぼす欣子状水素照射の効果2008

    • Author(s)
      篠田竜也, 山崎理弘, 中塚理, 財満鎭明
    • Organizer
      第69回応用物理学会学術講演会
    • Place of Presentation
      中部大学、名古屋
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Impact of Pt Incorporation on Thermal Stability of NiGe Layers on Ge (001) Substrates2007

    • Author(s)
      O. Nakatsuka, A. Suzuki, A. Sakai, M. Ogawa, and S. Zaima
    • Organizer
      7th International Workshop on Junction Technology 2007
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] Defect Control for Ge/Si and Ge_<1-x>Sn_x/Ge/Si Heterostructures2007

    • Author(s)
      Invited: A. Sakai, S. Takeuchi, O. Nakatsuka, M. Ogawa, S. Zaima
    • Organizer
      Fifth International Symposium on Control of Semiconductor Interfaces
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Tensile strained Ge layers on strain-relaxed Ge_<1-x>Sn_x/virtual Ge substrates2007

    • Author(s)
      S. Takeuchi, A. Sakai, O. Nakatsuka, M. Ogawa, S. Zaima
    • Organizer
      5th International Conference on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Marseille, France
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面の酸素エッチングおよび酸化過程の走査トンネル顕微鏡による観察評価2007

    • Author(s)
      山崎理弘, 若園恭伸, 酒井朗, 中塚理, 小川正毅, 財満鎭明
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Ge(001)基板上NiGe薄膜のPt添加による熱的安定性向上2007

    • Author(s)
      鈴木敦之, 中塚理, 酒井朗, 小川正毅, 財満鎭明
    • Organizer
      第54回応用物理学関係連合講演会, 29a-SM-5
    • Place of Presentation
      青山学院大学
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] Ge(001)表面の酸素エッチングおよび初期酸化過程の原子スケール評価2007

    • Author(s)
      山崎理弘, 若園恭伸, 酒井朗, 中塚理, 竹内正太郎, 小川正毅, 財満鎭明
    • Organizer
      応用物理学会薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「ゲートスタック研究会-材料・プロセス・評価の物理-」(第12回研究会)
    • Place of Presentation
      三島市
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] canning Tunneling Microscopy Observation of Initial Growth of Sn and Ge_<1-x>Sn_x Layers on Ge(001) Substrates2007

    • Author(s)
      M. Yamazaki, S. Takeuchi, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
    • Organizer
      Fifth International Symposium on Control of Semiconductor Interfaces
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Scanning Tunneling Microscopy Observation of Initial Growth of Sn and Ge_<1-x>Sn_x Layers on Ge(001) Substrates2007

    • Author(s)
      M. Yamazaki, S. Takeuchi, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
    • Organizer
      Fifth International Symposium on Control of Semiconductor Interfaces
    • Place of Presentation
      Tokyo, Japan
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Strain and dislocations in group IV semiconductor heterostructures(招待講演)2007

    • Author(s)
      A.Sakai, O.Nakatsuka, M.Ogawa, and S.Zaima
    • Organizer
      Materials Research Society 2007 Spring Meeting
    • Place of Presentation
      San Francisco, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Ge(001)表面の酸素エッチングおよび酸化過程の走査トンネル顕微鏡による観察評価2007

    • Author(s)
      山崎理弘, 若園恭伸, 酒井朗, 中塚理, 小川正毅, 財満鎭明
    • Organizer
      第6回・日本表面科学会中部支部・学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2007-04-14
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Defect Control for Ge/Si and Ge1-xSnx/Ge/Si Heterostructures (Invited)2007

    • Author(s)
      A. Sakai, S. Takeuchi, O. Nakatsuka, M. Ogawa, and S. Zaima
    • Organizer
      Fifth International Symposium on Control of Semiconductor Interfaces
    • Place of Presentation
      Tokyo, Japan.
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Growth and Characterization of Tensile- Strained Ge Layers on Strain Relaxed Ge_<1-x>Sn_x Buffer Layers2007

    • Author(s)
      Invited: O. Nakatsuka, S. Takeuchi, A. Sakai, M. Ogawa, S. Zaima
    • Organizer
      The 3nd international workshop on new group IV semiconductor nanoelectronics
    • Place of Presentation
      Sendai, Japan
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Strain and dislocations in group IV semiconductor heterostructures2007

    • Author(s)
      Invited: A. Sakai, O. Nakatsuka, M. Ogawa, S. Zaima
    • Organizer
      Materials Research Society 2007 Spring Meeting
    • Place of Presentation
      San Francisco, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Impact of Pt Incorporation on Thermal Stability of NiGe Layers on Ge(001) Substrates2007

    • Author(s)
      O. Nakatsuka, A. Suzuki, A. Sakai, M. Ogawa, and S. Zaima
    • Organizer
      7th International Workshop on Junction Technology 2007, pp. 87-88
    • Place of Presentation
      Kyoto, Japan
    • Data Source
      KAKENHI-PROJECT-18686005
  • [Presentation] Scanning Tunneling Microscopy Study on the Reaction of Oxygen with Clean Ge(001) Surfaces2006

    • Author(s)
      A. Sakai, Y. Wakazono, O. Nakatsuka, S. Zaima, and M. Ogawa
    • Organizer
      210th Meeting of The Electrochemical Society
    • Place of Presentation
      Cancun, Mexico
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Ge(001)表面の初期酸化およびエッチング過程の走査トンネル顕微鏡評価2006

    • Author(s)
      若園恭伸, 山崎理弘, 酒井朗, 中塚理, 竹内正太郎, 小川正毅, 財満鎭明
    • Organizer
      第67回応用物理学会学術講演会
    • Place of Presentation
      立命館大学
    • Data Source
      KAKENHI-PROJECT-18206005
  • [Presentation] Growth and structure evaluation of strain-relaxed Ge_<1-x>Sn_x buffer layers on virtual Ge(001) substrates2006

    • Author(s)
      S. Takeuchi, A. Sakai, K. Yamamoto, O. Nakatsuka, M. Ogawa, S. Zaima
    • Organizer
      The Third International SiGe Technology and Device Meeting
    • Place of Presentation
      Princeton, USA
    • Data Source
      KAKENHI-PROJECT-18063012
  • [Presentation] Poly & Epitaxial Crystallization of Silicon-tin Binary Alloys for Future Optoelectronics

    • Author(s)
      M. Kurosawa, M. Kato, K. Takahashi, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
    • Organizer
      16th International Conference on Thin Films (ICTF16)
    • Place of Presentation
      Croatia
    • Year and Date
      2014-10-13 – 2014-10-16
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 高Sn濃度SiSnの形成とバンド構造 ~ 直接遷移構造化を目指して ~

    • Author(s)
      黒澤昌志, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 有機エレクトロニクス研究会(OME), シリコン材料・デバイス研究会(SDM) 共催
    • Place of Presentation
      大濱信泉記念館多目的ホール(沖縄)
    • Year and Date
      2015-04-29 – 2015-04-30
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Evaluation of Light Induced Damages in Plasma Process on Electrical Properties of Al2O3/Ge Gate Stack Structure

    • Author(s)
      Evaluation of Light Induced Damages in Plasma Process on Electrical Properties of Al2O3/Ge Gate Stack Structure クスマンダリ,竹内和歌奈,加藤公彦,柴山茂久,坂下満男,中塚理,財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会 (SDM)
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Effects of Light Exposure during Plasma Process on Electrical Properties of Au/Al2O3/Ge MOS Capacitor

    • Author(s)
      Evaluation of Light Induced Damages in Plasma Process on Electrical Properties of Al2O3/Ge Gate Stack Structure クスマンダリ,竹内和歌奈,加藤公彦,柴山茂久,坂下満男,中塚理,財満鎭明
    • Organizer
      第11回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GeO2薄膜の正方晶形成による化学的安定性の向上

    • Author(s)
      柴山茂久, 吉田鉄兵, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会、シリコンテクノロジー分科会 共催 特別研究会「ゲートスタック研究会 ―材料・プロセス・評価の物理―」(第20回記念研究会)
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2015-01-30 – 2015-01-31
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Al2O3/Ge構造に対する熱酸化にともなうGe表面からのGe原子放出過程

    • Author(s)
      柴山茂久, 中嶋薫, 坂下満男, 中塚理, 木村健二, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Low Schottky barrier height contacts with Sn electrode for various orientation n-Ge substrates

    • Author(s)
      A. Suzuki, D. Yunsheng, S. Shibayama, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      Advanced Metallization Conference 2014: 24th Asian Session (ADMETA Plus 2014)
    • Place of Presentation
      Tokyo
    • Year and Date
      2014-10-22 – 2014-10-24
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Crystal growth of Si1-xSnx alloys with high Sn contents

    • Author(s)
      M. Kurosawa, M. Kato, Y. Nagae, T. Yamaha, O. Nakatsuka and S. Zaima
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai
    • Year and Date
      2015-01-29 – 2015-01-30
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Epitaxial Growth of Ge1-xSnx Thin Films by using Metal-Organic Chemical Vapor Deposition

    • Author(s)
      Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, O. Nakatsuka, and S. Zaima
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai
    • Year and Date
      2015-01-29 – 2015-01-30
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] 熱電素子応用を目指したGeSn単結晶薄膜の熱物性評価

    • Author(s)
      黒澤昌志, 福田雅大, 高橋恒太, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Sn/Geコンタクトにおけるフェルミレベルピニングの軽減およびショットキー障壁高さの低減

    • Author(s)
      鈴木陽洋, 柴山茂久, 黒澤昌志, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      応用物理学会 薄膜・表面物理分科会、シリコンテクノロジー分科会 共催 特別研究会「ゲートスタック研究会 ―材料・プロセス・評価の物理―」(第20回記念研究会)
    • Place of Presentation
      東レ研修センター
    • Year and Date
      2015-01-30 – 2015-01-31
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Study of Local Strain Distribution in Ge1-xSnx/Ge Fine Structure by using Synchrotron X-ray

    • Author(s)
      S. Ike, Y. Moriyama, M. Kurosawa, N. Taoka, O. Nakatsuka, Y. Imai, S. Kimura, T. Tezuka, and S. Zaima
    • Organizer
      JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Belgium
    • Year and Date
      2014-11-13 – 2014-11-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] ゲート電極の還元性がGe基板上Pr酸化膜のPr価数に与える影響

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会 (SDM)
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge結晶中の格子欠陥への水素及びSn導入の影響

    • Author(s)
      福留誉司、竹内和歌奈、坂下満男、田岡紀之、中塚理、財満鎭明
    • Organizer
      第12回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Pr酸化膜/Ge構造におけるPrの価数制御に基づく界面反応制御

    • Author(s)
      加藤公彦, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会 (SDM)
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Behaviors of tin related defects in Sb doped n-type germanium

    • Author(s)
      W. Takeuchi, N. Taoka, M. Sakashita, O. Nakatsuka and S. Zaima
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai
    • Year and Date
      2015-01-29 – 2015-01-30
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Hydrogen Surfactant Epitaxy of Ge1-xSnx Layers

    • Author(s)
      T. Asano, N. Taoka, K. Hozaki, W. Takeuchi,M. Sakashita, O. Nakatsuka, and S. Zaima
    • Organizer
      JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Belgium
    • Year and Date
      2014-11-13 – 2014-11-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Development of metal/Ge contacts for engineering Schottky barriers

    • Author(s)
      O. Nakatsuka, Y. Deng, A. Suzuki, S. Shibayama, M. Kurosawa, W. Takeuchi, M. Sakashita, N. Taoka, and S. Zaima
    • Organizer
      JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Belgium
    • Year and Date
      2014-11-13 – 2014-11-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GGA+U法によるSi1-xSnx材料物性の精密予測

    • Author(s)
      長江祐樹, 黒澤昌志, 加藤元太, 柴山茂久, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Challenges and Developments in GeSn Process Technology for Si Nanoelectronics

    • Author(s)
      S. Zaima, O. Nakatsuka, N. Taoka, K. Kato, W. Takeuchi, and M. Sakashita
    • Organizer
      226th ECS Meeting and SMEQ Joint International Meeting
    • Place of Presentation
      Mexico
    • Year and Date
      2014-10-05 – 2014-10-09
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Formation of Epitaxial NiGe Layer on Ge(001) Substrate and Influence of Interface Structure on Schottky Barrier Height

    • Author(s)
      O. Nakatsuka, Y. Deng, M. Sakashita, and S. Zaima
    • Organizer
      Advanced Metallization Conference 2014: 24th Asian Session (ADMETA Plus 2014)
    • Place of Presentation
      Tokyo
    • Year and Date
      2014-10-22 – 2014-10-24
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Electrically-Active Defects in Ge1-xSnx Epitaxtial Layer

    • Author(s)
      W. Takeuchi, T. Asano, M. Sakashita, O. Nakatsuka, S. Zaima
    • Organizer
      7th International Symposium on Advanced Plasma Science and Its Applications for Nitrides
    • Place of Presentation
      Nagoya
    • Year and Date
      2015-03-26 – 2015-03-31
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] GeSn Alloy for Nanoelectronic and Optoelectronic Devices

    • Author(s)
      O. Nakatsuka, Y. Shimura, W. Takeuchi, N. Taoka and S. Zaima
    • Organizer
      CNSE and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      Albany, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 次世代フレキシブルデバイス実現に向けた絶縁膜上GeSn薄膜の低温結晶成長

    • Author(s)
      黒澤昌志, 田岡紀之、坂下満男、中塚理、宮尾正信、財満鎭明
    • Organizer
      第1回結晶工学未来塾(研究ポスター発表会)
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造に対する酸素熱処理の界面特性に及ぼす効果

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 内和歌奈, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会 (SDM)
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 原子状水素供給がGe1−xSnxエピタキシャル層の結晶性に及ぼす効果

    • Author(s)
      藤浪俊介, 浅野孝典, 保崎航也, 小山剛史, 中塚理, 岸田英夫, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Sn 誘起横方向成長法によるGe1-xSnx/SiO2構造の低温形成

    • Author(s)
      黒澤昌志, 田岡紀之, 坂下満男, 中塚理 宮尾正信 財満鎭明
    • Organizer
      第12回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      東京
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Ge1-xSnxエピタキシャル層中の電気的活性な欠陥の挙動

    • Author(s)
      竹内和歌奈, 浅野孝典, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Control of Interfacial and Electrical Properties of Metal/Pr-oxide/Ge Gate Stack Structures

    • Author(s)
      K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
    • Organizer
      CNSE and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      Albany, USA
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Formation of strain-free Si1-x-yGexSny layers on Ge surfaces by using solid-liquid coexisting

    • Author(s)
      M. Kato, M. Kurosawa, T. Yamaha, N. Taoka, O. Nakatsuka and S. Zaima
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai
    • Year and Date
      2015-01-29 – 2015-01-30
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] リン酸溶液中レーザドーピングにおけるGe基板面方位の効果

    • Author(s)
      高橋恒太, 黒澤昌志, 池上浩, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] InP基板上への超高Sn組成Ge1-xSnx層のヘテロエピタキシャル成長

    • Author(s)
      中村茉里香, 志村洋介, 竹内正太郎, 中塚理, 財満鎭明
    • Organizer
      第11回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Technology of Ge1-xSnx Thin Films for Future Si Nanoelectronics

    • Author(s)
      O. Nakatsuka and S. Zaima
    • Organizer
      The 6th Kentingan Physics Forum: International Conference on Physics and Its Applications (ICOPIA)
    • Place of Presentation
      Solo, Indonesia
    • Invited
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Geゲートスタック構造に対する酸素熱処理の化学結合状態および界面特性に与える効果

    • Author(s)
      Al2O3/Geゲートスタック構造に対する酸素熱処理の化学結合状態および界面特性に与える効果 柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第11回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] 金属/Ge界面への高Sn組成Ge1−xSnx層挿入によるショットキー障壁高さの低減

    • Author(s)
      鈴木陽洋, 柴山茂久, 坂下満男, 竹内和歌奈, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Photoluminescence Property of Ge1-xSnx Epitaxial Layers Grown on Ge(001) substrates

    • Author(s)
      T. Asano, K. Hozaki, T. Koyama, N. Taoka, O. Nakatsuka, H. Kishida and S. Zaima
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      Sendai
    • Year and Date
      2015-01-29 – 2015-01-30
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Electrical and optical properties of GeSn alloys

    • Author(s)
      O. Nakatsuka, Y. Shimura, M. Adachi, M. Nakamura, and S. Zaima
    • Organizer
      2nd GeSnWorkshop: GeSn Development and Future Applications
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Al2O3/Ge構造への酸素熱処理および酸素ラジカル処理による界面反応機構の解明

    • Author(s)
      柴山茂久, 加藤公彦, 坂下満男, 竹内和歌奈, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      電子情報通信学会 シリコン材料・デバイス研究会 (SDM)
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Strain measurement of Heteroepitaxial GeSn/Ge microstructures by nano-beam electron diffraction

    • Author(s)
      K. Doi, K. Saitoh, N. Tanaka, S. Ike, O Nakatsuka and S. Zaima
    • Organizer
      The 58th Symposium of The Japanese Society of Microscopy
    • Place of Presentation
      Fukuoka
    • Year and Date
      2014-11-16 – 2014-11-17
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] MBE growth and crystalline properties of GeSn heteroepitaxial layers

    • Author(s)
      Y. Shimura, O. Nakatsuka, and S. Zaima
    • Organizer
      2nd GeSnWorkshop: GeSn Development and Future Applications
    • Place of Presentation
      Leuven, Belgium
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] Epitaxial Growth of GeSn Layers on (001), (110), and (111) Si and Ge Substrates

    • Author(s)
      O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, W. Takeuchi, and S. Zaima
    • Organizer
      226th ECS Meeting and SMEQ Joint International Meeting
    • Place of Presentation
      Mexico
    • Year and Date
      2014-10-05 – 2014-10-09
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Ge1−xSnxエピタキシャル層中の欠陥の電気的特性

    • Author(s)
      浅野孝典, 柴山茂久, 竹内和歌奈, 坂下満男, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Data Source
      KAKENHI-PROJECT-26220605
  • [Presentation] Sn 添加および水素熱処理を用いたGeヘテロエピタキシャル層の電気伝導特性制御

    • Author(s)
      足立正樹, 志村洋介, 中塚理, 財満鎭明
    • Organizer
      第11回日本表面科学会中部支部 学術講演会
    • Place of Presentation
      名古屋
    • Data Source
      KAKENHI-PROJECT-22000011
  • [Presentation] GeSn多結晶薄膜の進展 〜3D-ICを目指して〜

    • Author(s)
      黒澤昌志, 池上浩, 田岡紀之, 中塚理, 財満鎭明
    • Organizer
      第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2015-03-11 – 2015-03-14
    • Invited
    • Data Source
      KAKENHI-PROJECT-26220605
  • 1.  ZAIMA Shigeaki (70158947)
    # of Collaborated Projects: 10 results
    # of Collaborated Products: 535 results
  • 2.  SAKAI Akira (20314031)
    # of Collaborated Projects: 6 results
    # of Collaborated Products: 73 results
  • 3.  KONDO Hiroki (50345930)
    # of Collaborated Projects: 4 results
    # of Collaborated Products: 4 results
  • 4.  IKEDA Hiroya (00262882)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 5.  SAKASHITA Mitsuo (30225792)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 132 results
  • 6.  山本 秀和 (00581141)
    # of Collaborated Projects: 3 results
    # of Collaborated Products: 0 results
  • 7.  YASUDA Yukio (60126951)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 8.  TANAKA Nobuo (40126876)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 9.  OGAWA Masaki (10377773)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 37 results
  • 10.  TAKENAKA Mitsuru (20451792)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 11.  Sueoka Koji (30364095)
    # of Collaborated Projects: 2 results
    # of Collaborated Products: 0 results
  • 12.  WATANABE Heiji (90379115)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 13.  TAKEUCHI Wakana (90569386)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 157 results
  • 14.  TAKAGI Shinichi (30372402)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 1 results
  • 15.  Shiraishi Kenji (20334039)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 16.  KUROSAWA Masashi (40715439)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 136 results
  • 17.  畑 朋延 (50019767)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 18.  宮崎 誠一 (70190759)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 19.  中山 隆史 (70189075)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 20.  牧原 克則 (90553561)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 21.  初貝 安弘 (80218495)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 22.  洗平 昌晃 (20537427)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 0 results
  • 23.  齋藤 晃 (50292280)
    # of Collaborated Projects: 1 results
    # of Collaborated Products: 6 results
  • 24.  ASANO Takanori
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 1 results
  • 25.  IKE Shiniti
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 1 results
  • 26.  INUZUKA Yuki
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 1 results
  • 27.  加藤 公彦
    # of Collaborated Projects: 0 results
    # of Collaborated Products: 4 results

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